WO2018018847A1 - Module de puissance intelligent et son procédé de fabrication - Google Patents
Module de puissance intelligent et son procédé de fabrication Download PDFInfo
- Publication number
- WO2018018847A1 WO2018018847A1 PCT/CN2016/113966 CN2016113966W WO2018018847A1 WO 2018018847 A1 WO2018018847 A1 WO 2018018847A1 CN 2016113966 W CN2016113966 W CN 2016113966W WO 2018018847 A1 WO2018018847 A1 WO 2018018847A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- layer
- circuit
- power module
- intelligent power
- insulating layer
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 37
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 30
- 239000000758 substrate Substances 0.000 claims abstract description 34
- 238000007789 sealing Methods 0.000 claims abstract description 31
- 229920005989 resin Polymers 0.000 claims abstract description 21
- 239000011347 resin Substances 0.000 claims abstract description 21
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 21
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 18
- 229910052802 copper Inorganic materials 0.000 claims description 15
- 239000010949 copper Substances 0.000 claims description 15
- 229910052759 nickel Inorganic materials 0.000 claims description 10
- 238000007747 plating Methods 0.000 claims description 8
- 229920001187 thermosetting polymer Polymers 0.000 claims description 7
- 238000005530 etching Methods 0.000 claims description 5
- CLDVQCMGOSGNIW-UHFFFAOYSA-N nickel tin Chemical compound [Ni].[Sn] CLDVQCMGOSGNIW-UHFFFAOYSA-N 0.000 claims description 4
- 229910001128 Sn alloy Inorganic materials 0.000 claims description 3
- 238000005476 soldering Methods 0.000 claims description 3
- 229920005992 thermoplastic resin Polymers 0.000 claims description 3
- 230000004907 flux Effects 0.000 claims description 2
- 238000004080 punching Methods 0.000 claims description 2
- 230000003014 reinforcing effect Effects 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 abstract description 14
- 239000002184 metal Substances 0.000 abstract description 14
- 229910052782 aluminium Inorganic materials 0.000 abstract description 13
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract description 13
- 230000007797 corrosion Effects 0.000 abstract description 6
- 238000005260 corrosion Methods 0.000 abstract description 6
- 230000000694 effects Effects 0.000 abstract description 3
- 230000008569 process Effects 0.000 description 24
- 239000000463 material Substances 0.000 description 12
- 238000012360 testing method Methods 0.000 description 8
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 5
- 239000010931 gold Substances 0.000 description 5
- 229910052737 gold Inorganic materials 0.000 description 5
- 229910000679 solder Inorganic materials 0.000 description 5
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 4
- 229910052709 silver Inorganic materials 0.000 description 4
- 239000004332 silver Substances 0.000 description 4
- 239000002585 base Substances 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 3
- 239000011889 copper foil Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000009713 electroplating Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000017525 heat dissipation Effects 0.000 description 3
- 238000000465 moulding Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000007772 electroless plating Methods 0.000 description 2
- 238000005538 encapsulation Methods 0.000 description 2
- 230000005496 eutectics Effects 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 238000004886 process control Methods 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 238000001721 transfer moulding Methods 0.000 description 2
- KWSLGOVYXMQPPX-UHFFFAOYSA-N 5-[3-(trifluoromethyl)phenyl]-2h-tetrazole Chemical compound FC(F)(F)C1=CC=CC(C2=NNN=N2)=C1 KWSLGOVYXMQPPX-UHFFFAOYSA-N 0.000 description 1
- CPELXLSAUQHCOX-UHFFFAOYSA-M Bromide Chemical compound [Br-] CPELXLSAUQHCOX-UHFFFAOYSA-M 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- 229910000997 High-speed steel Inorganic materials 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- QAOWNCQODCNURD-UHFFFAOYSA-L Sulfate Chemical compound [O-]S([O-])(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-L 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 238000002048 anodisation reaction Methods 0.000 description 1
- 230000003064 anti-oxidating effect Effects 0.000 description 1
- 239000002969 artificial stone Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000008139 complexing agent Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000004880 explosion Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 238000001746 injection moulding Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 229910001379 sodium hypophosphite Inorganic materials 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000009885 systemic effect Effects 0.000 description 1
- 229910001432 tin ion Inorganic materials 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/563—Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3157—Partial encapsulation or coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/367—Cooling facilitated by shape of device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19105—Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate
Definitions
- the power component is a planar power device.
- the manufacturing method of the above intelligent power module has the beneficial effects that the metal is exposed at the top and the bottom of the module, which reduces the difficulty of positioning due to the thickness control of the upper and lower surfaces when the full-encapsulation technology is injected;
- the line bonding and cleaning process saves equipment investment, improves production efficiency, reduces process control requirements, greatly reduces the manufacturing difficulty of intelligent power modules, improves manufacturing yield, and further reduces the cost of intelligent power modules.
- 6(A) and 6(B) are schematic side and top plan views of the assembled circuit components and leads, respectively;
- the substrate 16 acts as a carrier for the smart power module 10 and has a first surface and a second surface opposite the first surface.
- the insulating layer 17 is disposed on the first surface of the substrate.
- a circuit wiring layer 18 is formed on the surface of the insulating layer; the circuit component 14 is inverted and soldered to a predetermined position on the upper surface of the circuit wiring layer 18; a power component mounted on the circuit component 14 by the heat sink 15; a sealing layer 12 is coated on the surface of the insulating layer 17, covering the circuit wiring layer 18 and the circuit component 14, and the surface of the heat sink 15 is exposed.
- the aluminum substrate of a suitable size is formed by directly processing a 1 m ⁇ 1 m aluminum material, and the file is made of high-speed steel, and the motor is rotated at 5000 rpm, and the boring tool and the aluminum material are used.
- the plane is cut at a right angle to make the edge of the 1100 aluminum material at right angles, and the burr is less than 10 ⁇ m. It can also be etched into a specific shape by chemical reaction through an etching tool. Referring to the X-X' line cross-sectional view 3(B) of the extension 3(A) and the Y-Y' line cross-sectional view 3(C) of the extension 3(A).
- a gold layer may be formed on the surface of the circuit wiring 18 by means of electroplating gold or chemical immersion gold.
- the pin 11 of the present invention is a single pin, which is different from the entire row of pins of the prior art, because the circuit wiring 18 to which the pin 11 is fixed is only wrapped by a resin portion.
- the impact strength is limited, and the separate pins avoid the process of cutting the ribs, and the systemic impact on the smart power module 10 of the present invention can be reduced.
- the fourth step 908 of the present invention is a step of the present invention. This step is a step of flip-chip bonding the circuit element 14 on the surface of the circuit wiring 18 and arranging the lead pins 11.
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Abstract
L'invention concerne un module de puissance intelligent et son procédé de fabrication. Le module de puissance intelligent comprend : un substrat (16) servant de support et ayant une première surface et une seconde surface opposée à la première surface; une couche isolante (17) disposée sur une première surface du substrat (16); une couche de câblage de circuit (18) formée à la surface de la couche isolante (17); des éléments de circuit (14) montés en sens inverse et soudés en des endroits prédéterminés sur une surface supérieure de la couche de câblage de circuit (18); un radiateur (15) monté en surface sur un élément de puissance dans les éléments de circuit (14); et une couche d'étanchéité (12) revêtu à la surface de la couche isolante (17), recouvrant la couche de câblage de circuit (18) et les éléments de circuit (14), et exposant une partie de la surface du radiateur (15). Les éléments de circuit sont connectés électriquement dans un mode de montage inversé, aucun fil métallique n'est nécessaire, et le coût est réduit. Une ailette de rayonnement et un substrat en aluminium sont totalement exposés à l'extérieur de la résine, et l'effet de rayonnement est maximisé. Même si l'humidité extérieure pénètre, il est difficile de provoquer la corrosion parce qu'il n'y a pas de fil métallique.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610624890.2 | 2016-07-29 | ||
CN201610624890.2A CN106158801A (zh) | 2016-07-29 | 2016-07-29 | 一种智能功率模块及其制造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2018018847A1 true WO2018018847A1 (fr) | 2018-02-01 |
Family
ID=57328763
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/CN2016/113966 WO2018018847A1 (fr) | 2016-07-29 | 2016-12-30 | Module de puissance intelligent et son procédé de fabrication |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN106158801A (fr) |
WO (1) | WO2018018847A1 (fr) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113079651A (zh) * | 2021-03-10 | 2021-07-06 | 京信网络系统股份有限公司 | Pcb板上实现自动焊接的方法及pcb板印刷用钢网 |
CN113314515A (zh) * | 2021-06-09 | 2021-08-27 | 广东汇芯半导体有限公司 | 半导体电路和半导体电路的制备方法 |
US20210385937A1 (en) * | 2018-10-09 | 2021-12-09 | Covestro Llc | Insert-molded electronic modules using thermally conductive polycarbonate and molded interlocking features |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106158801A (zh) * | 2016-07-29 | 2016-11-23 | 广东美的制冷设备有限公司 | 一种智能功率模块及其制造方法 |
CN113643987A (zh) * | 2021-07-30 | 2021-11-12 | 南京长峰航天电子科技有限公司 | 一种载体裸片共晶工艺 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20130055358A (ko) * | 2011-11-18 | 2013-05-28 | 삼성전기주식회사 | 전력 모듈 패키지 및 그 제조방법 |
CN105070695A (zh) * | 2015-08-14 | 2015-11-18 | 株洲南车时代电气股份有限公司 | 双面散热电动汽车功率模块 |
CN106158801A (zh) * | 2016-07-29 | 2016-11-23 | 广东美的制冷设备有限公司 | 一种智能功率模块及其制造方法 |
CN205845942U (zh) * | 2016-07-29 | 2016-12-28 | 广东美的制冷设备有限公司 | 智能功率模块 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101101880A (zh) * | 2006-07-03 | 2008-01-09 | 矽品精密工业股份有限公司 | 散热型封装结构及其制法 |
KR20100008460A (ko) * | 2008-07-16 | 2010-01-26 | 주식회사 케이이씨 | 전력용 반도체 장치 및 그 제조 방법 |
KR101321282B1 (ko) * | 2011-06-17 | 2013-10-28 | 삼성전기주식회사 | 전력 모듈 패키지 및 이를 구비한 시스템 모듈 |
CN104112730A (zh) * | 2013-06-09 | 2014-10-22 | 广东美的制冷设备有限公司 | 智能功率模块及其制造方法 |
CN104332453A (zh) * | 2013-07-22 | 2015-02-04 | 西安永电电气有限责任公司 | 基于塑封式ipm引线框架的双边固定散热结构 |
-
2016
- 2016-07-29 CN CN201610624890.2A patent/CN106158801A/zh active Pending
- 2016-12-30 WO PCT/CN2016/113966 patent/WO2018018847A1/fr active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20130055358A (ko) * | 2011-11-18 | 2013-05-28 | 삼성전기주식회사 | 전력 모듈 패키지 및 그 제조방법 |
CN105070695A (zh) * | 2015-08-14 | 2015-11-18 | 株洲南车时代电气股份有限公司 | 双面散热电动汽车功率模块 |
CN106158801A (zh) * | 2016-07-29 | 2016-11-23 | 广东美的制冷设备有限公司 | 一种智能功率模块及其制造方法 |
CN205845942U (zh) * | 2016-07-29 | 2016-12-28 | 广东美的制冷设备有限公司 | 智能功率模块 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20210385937A1 (en) * | 2018-10-09 | 2021-12-09 | Covestro Llc | Insert-molded electronic modules using thermally conductive polycarbonate and molded interlocking features |
CN113079651A (zh) * | 2021-03-10 | 2021-07-06 | 京信网络系统股份有限公司 | Pcb板上实现自动焊接的方法及pcb板印刷用钢网 |
CN113314515A (zh) * | 2021-06-09 | 2021-08-27 | 广东汇芯半导体有限公司 | 半导体电路和半导体电路的制备方法 |
Also Published As
Publication number | Publication date |
---|---|
CN106158801A (zh) | 2016-11-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2018018847A1 (fr) | Module de puissance intelligent et son procédé de fabrication | |
US8860196B2 (en) | Semiconductor package and method of fabricating the same | |
WO2018018848A1 (fr) | Module de puissance intelligent et son procédé de fabrication | |
JP7483955B2 (ja) | パワーモジュール用基板およびパワーモジュール | |
JP3664045B2 (ja) | 半導体装置の製造方法 | |
JP2019176034A (ja) | 半導体装置および半導体装置の製造方法 | |
CN113113401B (zh) | 半导体电路和半导体电路的制造方法 | |
CN113113400A (zh) | 半导体电路和半导体电路的制造方法 | |
JP7221401B2 (ja) | 電気回路基板及びパワーモジュール | |
KR101994727B1 (ko) | 전력 모듈 패키지 및 그 제조방법 | |
CN216413057U (zh) | 半导体电路 | |
KR101204564B1 (ko) | 전력 모듈 패키지 및 그 제조 방법 | |
CN214848624U (zh) | 半导体电路 | |
WO2018090470A1 (fr) | Module de puissance intelligent et son procédé de fabrication | |
CN106024652A (zh) | 一种智能功率模块及其制造方法 | |
US20130285223A1 (en) | Method for manufacturing electronic devices | |
JP2009164240A (ja) | 半導体装置 | |
CN111739872A (zh) | 一种智能功率模块及其制造方法 | |
JP2013118416A (ja) | 回路部材、回路部材の製造方法、半導体装置、及び回路部材の表面積層構造 | |
CN206163481U (zh) | 智能功率模块 | |
CN114220806B (zh) | 具有整流电路的半导体电路和半导体电路的制备方法 | |
CN213692043U (zh) | 一种智能功率模块 | |
CN214848625U (zh) | 半导体电路 | |
CN112018058B (zh) | 一种电力逆变器模块及其制造方法 | |
CN110416180A (zh) | 一种功率模块、功率模块的制造方法及装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 16910425 Country of ref document: EP Kind code of ref document: A1 |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 16910425 Country of ref document: EP Kind code of ref document: A1 |