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WO2009031420A1 - 透明板体内部の微小異物を検出する方法及びその装置 - Google Patents

透明板体内部の微小異物を検出する方法及びその装置 Download PDF

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Publication number
WO2009031420A1
WO2009031420A1 PCT/JP2008/065041 JP2008065041W WO2009031420A1 WO 2009031420 A1 WO2009031420 A1 WO 2009031420A1 JP 2008065041 W JP2008065041 W JP 2008065041W WO 2009031420 A1 WO2009031420 A1 WO 2009031420A1
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WO
WIPO (PCT)
Prior art keywords
transparent plate
foreign matter
light beam
micro foreign
produced
Prior art date
Application number
PCT/JP2008/065041
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English (en)
French (fr)
Inventor
Kimiaki Oto
Original Assignee
Asahi Glass Company, Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Company, Limited filed Critical Asahi Glass Company, Limited
Priority to CN200880104499.3A priority Critical patent/CN101790679B/zh
Priority to JP2009531186A priority patent/JPWO2009031420A1/ja
Publication of WO2009031420A1 publication Critical patent/WO2009031420A1/ja

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N2021/8905—Directional selective optics, e.g. slits, spatial filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G01N2021/8967—Discriminating defects on opposite sides or at different depths of sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

　透明板体内部の遮光性の微小異物を安定的に検出し、かつ微小異物の深さの情報を得る。 　均一な屈折率を有する一定厚さの透明板体１の内部に存在する微小異物４を照射した光ビーム２の散乱等により生じる輝点Ｅ、Ｆの測定により検出する方法であって、光ビーム２を透明板体の厚さ方向に対して所定の傾斜角度で透明板体内部に進入させて、進入した内部光ビームＩと該内部光ビームＩが透明板体の表面で反射した内部光ビームIIとを透明板体内部に形成し、前記光ビームの進入角度を変えることなく透明板体と光ビーム２とを相対的に移動（Ｇ方向）させて、同一微小異物４が前記内部光ビームＩにより照射されて生じた輝点Ｅと前記内部光ビームIIにより照射されて生じた輝点Ｆを透明板体の厚さ方向からそれぞれ測定して前記微小異物の透明板体中における位置を判定することを特徴とする透明板体内部の微小異物を検出する。
PCT/JP2008/065041 2007-09-04 2008-08-22 透明板体内部の微小異物を検出する方法及びその装置 WO2009031420A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN200880104499.3A CN101790679B (zh) 2007-09-04 2008-08-22 检测透明板体内部的微小异物的方法及其装置
JP2009531186A JPWO2009031420A1 (ja) 2007-09-04 2008-08-22 透明板体内部の微小異物を検出する方法及びその装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-229468 2007-09-04
JP2007229468 2007-09-04

Publications (1)

Publication Number Publication Date
WO2009031420A1 true WO2009031420A1 (ja) 2009-03-12

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/065041 WO2009031420A1 (ja) 2007-09-04 2008-08-22 透明板体内部の微小異物を検出する方法及びその装置

Country Status (3)

Country Link
JP (3) JPWO2009031420A1 (ja)
CN (1) CN101790679B (ja)
WO (1) WO2009031420A1 (ja)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010249552A (ja) * 2009-04-13 2010-11-04 Central Glass Co Ltd ガラス板の欠陥識別方法および装置
WO2012077683A1 (ja) * 2010-12-09 2012-06-14 旭硝子株式会社 ガラスリボン内欠陥測定方法およびガラスリボン内欠陥測定システム
WO2012077542A1 (ja) * 2010-12-09 2012-06-14 旭硝子株式会社 ガラス基板
JP2015135266A (ja) * 2014-01-17 2015-07-27 旭硝子株式会社 ガラス板内部の微小異物を検出する方法及びその装置
WO2015162303A1 (de) * 2014-04-25 2015-10-29 Boraident Gmbh Verfahren und vorrichtung zum erkennen von nickelsulfid-einschlüssen in einer glasplatte
EP2895847A4 (en) * 2012-09-14 2016-05-25 Luoyang Landglass Tech Co Ltd DETECTION SYSTEM BASED ON MODULATION OF A GLASS IMAGE PRODUCED BY STRUCTURED LASER LIGHT IN LINE
CN111487191A (zh) * 2020-04-26 2020-08-04 山东创策电气科技有限公司 基于图像处理的钢化玻璃自爆隐患检测方法及装置
CN111721774A (zh) * 2020-06-23 2020-09-29 湖南正中制药机械有限公司 一种用于自动灯检机的灯检检测方法

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5791101B2 (ja) * 2011-05-16 2015-10-07 芝浦メカトロニクス株式会社 貼り合せ板状体検査装置及び方法
CN104634789A (zh) * 2014-04-24 2015-05-20 东旭集团有限公司 一种对超薄玻璃基板的上表面进行异物检查的系统及方法
CN105699400A (zh) * 2014-11-28 2016-06-22 中电电气(上海)太阳能科技有限公司 一种钢化玻璃外观检验装置
CN106770315A (zh) * 2016-11-30 2017-05-31 浙江宜佳新材料股份有限公司 一种胶膜纸的胶膜层激光监测装置
CN106932406A (zh) * 2017-04-28 2017-07-07 许迪 一种检测透明物体缺陷的装置
WO2019041087A1 (zh) * 2017-08-28 2019-03-07 深圳市兴华炜科技有限公司 透明物体的测试方法及相关产品
US10053059B1 (en) * 2017-10-04 2018-08-21 Ford Global Technologies, Llc Detection and identification of opaqueness of vehicle windows
RU2764903C1 (ru) * 2018-03-07 2022-01-24 ГАРДИАН ГЛАСС, ЭлЭлСи Способ и система для обнаружения включений в термополированном стекле на основе анализа длин волн
CN109632828B (zh) * 2018-10-29 2021-11-09 彩虹显示器件股份有限公司 一种平板玻璃缺陷复检系统及复检方法
CN110082361B (zh) * 2019-05-27 2024-04-30 成都领益科技有限公司 一种物体外观与裂纹检测装置与检测方法
CN111451188A (zh) * 2020-04-13 2020-07-28 徐洪 用于镜头的除尘装置及其使用方法
JP7077523B2 (ja) * 2020-06-03 2022-05-31 株式会社東京精密 亀裂検出装置及び亀裂検出方法
CN113310993B (zh) * 2021-06-24 2024-10-22 宗子凯 一种透明板材点状缺陷检测系统及方法
CN116282869B (zh) * 2023-03-24 2023-09-29 南京我乐家居股份有限公司 钢化玻璃的智能生产控制方法与系统

Citations (4)

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JPH11242001A (ja) * 1997-07-17 1999-09-07 Hoya Corp 透光性物質の不均一性検査方法及びその装置並びに透明基板の選別方法
JPH11316197A (ja) * 1998-05-06 1999-11-16 Matsushita Electric Works Ltd 平板材の内部検査方法及び装置
JP2005300275A (ja) * 2004-04-08 2005-10-27 Central Glass Co Ltd 透明板の欠陥検出方法およびその装置
JP2006071284A (ja) * 2004-08-31 2006-03-16 Central Glass Co Ltd ガラス基板欠陥の表裏識別方法

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JPS54106289A (en) * 1978-02-07 1979-08-21 Nippon Sheet Glass Co Ltd Defect detector for glass sheet
FR2681429B1 (fr) * 1991-09-13 1995-05-24 Thomson Csf Procede et dispositif d'inspection du verre.
JPH0882602A (ja) * 1994-09-13 1996-03-26 Nippon Electric Glass Co Ltd 板ガラスの欠点検査方法及び装置
JP2769797B2 (ja) * 1995-03-15 1998-06-25 東洋ガラス株式会社 透明物体中の微小欠陥検出方法
AUPQ262299A0 (en) * 1999-09-02 1999-09-23 Resolve Engineering Pty Ltd Detection of inclusions in glass

Patent Citations (4)

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JPH11242001A (ja) * 1997-07-17 1999-09-07 Hoya Corp 透光性物質の不均一性検査方法及びその装置並びに透明基板の選別方法
JPH11316197A (ja) * 1998-05-06 1999-11-16 Matsushita Electric Works Ltd 平板材の内部検査方法及び装置
JP2005300275A (ja) * 2004-04-08 2005-10-27 Central Glass Co Ltd 透明板の欠陥検出方法およびその装置
JP2006071284A (ja) * 2004-08-31 2006-03-16 Central Glass Co Ltd ガラス基板欠陥の表裏識別方法

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010249552A (ja) * 2009-04-13 2010-11-04 Central Glass Co Ltd ガラス板の欠陥識別方法および装置
WO2012077683A1 (ja) * 2010-12-09 2012-06-14 旭硝子株式会社 ガラスリボン内欠陥測定方法およびガラスリボン内欠陥測定システム
WO2012077542A1 (ja) * 2010-12-09 2012-06-14 旭硝子株式会社 ガラス基板
EP2895847A4 (en) * 2012-09-14 2016-05-25 Luoyang Landglass Tech Co Ltd DETECTION SYSTEM BASED ON MODULATION OF A GLASS IMAGE PRODUCED BY STRUCTURED LASER LIGHT IN LINE
JP2015135266A (ja) * 2014-01-17 2015-07-27 旭硝子株式会社 ガラス板内部の微小異物を検出する方法及びその装置
WO2015162303A1 (de) * 2014-04-25 2015-10-29 Boraident Gmbh Verfahren und vorrichtung zum erkennen von nickelsulfid-einschlüssen in einer glasplatte
CN111487191A (zh) * 2020-04-26 2020-08-04 山东创策电气科技有限公司 基于图像处理的钢化玻璃自爆隐患检测方法及装置
CN111721774A (zh) * 2020-06-23 2020-09-29 湖南正中制药机械有限公司 一种用于自动灯检机的灯检检测方法

Also Published As

Publication number Publication date
JP5696984B2 (ja) 2015-04-08
JP2014006271A (ja) 2014-01-16
CN101790679A (zh) 2010-07-28
CN101790679B (zh) 2012-05-09
JPWO2009031420A1 (ja) 2010-12-09
JP2014044209A (ja) 2014-03-13

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