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WO2008136058A1 - レーザ脱離イオン化用サンプルプレート及び該サンプルプレートを用いた質量分析装置 - Google Patents

レーザ脱離イオン化用サンプルプレート及び該サンプルプレートを用いた質量分析装置 Download PDF

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Publication number
WO2008136058A1
WO2008136058A1 PCT/JP2007/000456 JP2007000456W WO2008136058A1 WO 2008136058 A1 WO2008136058 A1 WO 2008136058A1 JP 2007000456 W JP2007000456 W JP 2007000456W WO 2008136058 A1 WO2008136058 A1 WO 2008136058A1
Authority
WO
WIPO (PCT)
Prior art keywords
sample plate
layer
laser desorption
pores
desorption ionization
Prior art date
Application number
PCT/JP2007/000456
Other languages
English (en)
French (fr)
Inventor
Kuniaki Kanamaru
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to PCT/JP2007/000456 priority Critical patent/WO2008136058A1/ja
Publication of WO2008136058A1 publication Critical patent/WO2008136058A1/ja

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H01J49/0418—Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/028—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having reaction cells in the form of microtitration plates

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

　Ａｌ板である基体（２１）の上に断熱層として径が２０～３０ｎｍ程度の細孔（２３）を多数有するＡｌ2Ｏ3層（２２）を形成し、その表面にＴｉ層（２４ａ）とＰｔ層（２４ｂ）とから成る２層金属薄膜（２４）を形成することにより、レーザ脱離イオン化のためのサンプルプレート（２０）を得る。Ｔｉ／Ｐｔの異種金属の組み合わせは高いＨ+付加触媒能を発揮するため、従来のように大きな径の細孔（２３）を設けなくても高いイオン化効率を得ることができる。これにより、Ａｌ2Ｏ3層（２２）を形成する際のアノーダイジング処理の時間は短くて済み、径の大きな細孔（２３）を形成するための特殊な処理も不要である。それにより、製造が容易であってコストを抑制することができる。
PCT/JP2007/000456 2007-04-25 2007-04-25 レーザ脱離イオン化用サンプルプレート及び該サンプルプレートを用いた質量分析装置 WO2008136058A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/000456 WO2008136058A1 (ja) 2007-04-25 2007-04-25 レーザ脱離イオン化用サンプルプレート及び該サンプルプレートを用いた質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/000456 WO2008136058A1 (ja) 2007-04-25 2007-04-25 レーザ脱離イオン化用サンプルプレート及び該サンプルプレートを用いた質量分析装置

Publications (1)

Publication Number Publication Date
WO2008136058A1 true WO2008136058A1 (ja) 2008-11-13

Family

ID=39943183

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/000456 WO2008136058A1 (ja) 2007-04-25 2007-04-25 レーザ脱離イオン化用サンプルプレート及び該サンプルプレートを用いた質量分析装置

Country Status (1)

Country Link
WO (1) WO2008136058A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109585254A (zh) * 2018-11-15 2019-04-05 复旦大学 一种基质辅助激光解析质谱大批量上样装置
EP3474310A1 (en) 2017-10-18 2019-04-24 Shimadzu Corporation Information management device for mass spectrometer

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003536073A (ja) * 2000-06-05 2003-12-02 カイロン コーポレイション プロテオミクス分析を実施するためのマイクロアレイ
WO2006046697A1 (ja) * 2004-10-29 2006-05-04 Japan Science And Technology Agency Maldi-tof ms用基板及びそれを用いた質量分析方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003536073A (ja) * 2000-06-05 2003-12-02 カイロン コーポレイション プロテオミクス分析を実施するためのマイクロアレイ
WO2006046697A1 (ja) * 2004-10-29 2006-05-04 Japan Science And Technology Agency Maldi-tof ms用基板及びそれを用いた質量分析方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
SHOJI OKUNO: "Requirements for Laser-Induced Desortion/Ionization on Submicrometer Structures", ANALYTICAL CHEMISTRY, vol. 77, no. 16, 2005, pages 5364 - 5369, XP003012113 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3474310A1 (en) 2017-10-18 2019-04-24 Shimadzu Corporation Information management device for mass spectrometer
US12176197B2 (en) 2017-10-18 2024-12-24 Shimadzu Corporation Information management device for mass spectrometer
CN109585254A (zh) * 2018-11-15 2019-04-05 复旦大学 一种基质辅助激光解析质谱大批量上样装置

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