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WO1999033089A3 - Procede et dispositif pour detecter la presence de molecules d'echantillons dans un gaz porteur - Google Patents

Procede et dispositif pour detecter la presence de molecules d'echantillons dans un gaz porteur Download PDF

Info

Publication number
WO1999033089A3
WO1999033089A3 PCT/EP1998/008069 EP9808069W WO9933089A3 WO 1999033089 A3 WO1999033089 A3 WO 1999033089A3 EP 9808069 W EP9808069 W EP 9808069W WO 9933089 A3 WO9933089 A3 WO 9933089A3
Authority
WO
WIPO (PCT)
Prior art keywords
carrier gas
sample molecules
detecting sample
jet
nozzle
Prior art date
Application number
PCT/EP1998/008069
Other languages
German (de)
English (en)
Other versions
WO1999033089A2 (fr
Inventor
Horst-Henning Grotheer
Harald Oser
Reinhold Thanner
Original Assignee
Deutsch Zentr Luft & Raumfahrt
Grotheer Horst Henning
Harald Oser
Reinhold Thanner
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Deutsch Zentr Luft & Raumfahrt, Grotheer Horst Henning, Harald Oser, Reinhold Thanner filed Critical Deutsch Zentr Luft & Raumfahrt
Publication of WO1999033089A2 publication Critical patent/WO1999033089A2/fr
Publication of WO1999033089A3 publication Critical patent/WO1999033089A3/fr

Links

Classifications

    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16K—VALVES; TAPS; COCKS; ACTUATING-FLOATS; DEVICES FOR VENTING OR AERATING
    • F16K31/00—Actuating devices; Operating means; Releasing devices
    • F16K31/02—Actuating devices; Operating means; Releasing devices electric; magnetic
    • F16K31/06—Actuating devices; Operating means; Releasing devices electric; magnetic using a magnet, e.g. diaphragm valves, cutting off by means of a liquid
    • F16K31/0644—One-way valve
    • F16K31/0655—Lift valves
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16K—VALVES; TAPS; COCKS; ACTUATING-FLOATS; DEVICES FOR VENTING OR AERATING
    • F16K15/00—Check valves
    • F16K15/18—Check valves with actuating mechanism; Combined check valves and actuated valves
    • F16K15/182—Check valves with actuating mechanism; Combined check valves and actuated valves with actuating mechanism
    • F16K15/1823—Check valves with actuating mechanism; Combined check valves and actuated valves with actuating mechanism for ball check valves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/162—Direct photo-ionisation, e.g. single photon or multi-photon ionisation

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

L'invention concerne un procédé pour détecter la présence de molécules d'échantillons dans un gaz porteur. Selon ce procédé, un jet divergent de gaz porteur est produit sous vide par expansion du gaz porteur à travers un ajutage, les molécules d'échantillons sont ionisées dans une zone d'ionisation du jet de gaz porteur par absorption de photons pour donner des ions de molécules d'échantillons. Ces derniers traversent ensuite un champ électrique clarificateur dans un spectromètre de masse où ils sont détectés. L'invention vise à améliorer ledit procédé de sorte que la distance entre l'ouverture de sortie de l'ajutage et la zone d'ionisation puisse être sélectionnée librement. A cet effet, les ions de molécules d'échantillons passent dans le spectromètre de masse essentiellement le long de la direction axiale du jet de gaz porteur.
PCT/EP1998/008069 1997-12-18 1998-12-10 Procede et dispositif pour detecter la presence de molecules d'echantillons dans un gaz porteur WO1999033089A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19756444A DE19756444C1 (de) 1997-12-18 1997-12-18 Verfahren und Vorrichtung zum Nachweis von Probenmolekülen in einem Trägergas
DE19756444.5 1997-12-18

Publications (2)

Publication Number Publication Date
WO1999033089A2 WO1999033089A2 (fr) 1999-07-01
WO1999033089A3 true WO1999033089A3 (fr) 1999-09-30

Family

ID=7852474

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP1998/008069 WO1999033089A2 (fr) 1997-12-18 1998-12-10 Procede et dispositif pour detecter la presence de molecules d'echantillons dans un gaz porteur

Country Status (2)

Country Link
DE (1) DE19756444C1 (fr)
WO (1) WO1999033089A2 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19957256A1 (de) * 1999-11-27 2001-06-28 Deutsch Zentr Luft & Raumfahrt Verfahren und Vorrichtung zur Steuerung der Zusammensetzung eines Produktstromes
DE10014847A1 (de) * 2000-03-24 2001-10-04 Gsf Forschungszentrum Umwelt Verfahren und Vorrichtung zum Nachweis von Verbindungen in einem Gasstrom
DE10247272B4 (de) * 2002-10-10 2011-11-17 Eads Deutschland Gmbh Spektrometer zur Gasanalyse

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5037062A (en) * 1988-10-20 1991-08-06 Deutsche Forschungsanstalt Fur Luft- Und Raumfahrt E.V Quick acting ball valve
US5206594A (en) * 1990-05-11 1993-04-27 Mine Safety Appliances Company Apparatus and process for improved photoionization and detection
US5629518A (en) * 1994-11-25 1997-05-13 Deutsche Forschungsanstalt Fuer Luft-Und Raumfahrt E.V. Process and apparatus for detecting sample molecules in a carrier gas

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5037062A (en) * 1988-10-20 1991-08-06 Deutsche Forschungsanstalt Fur Luft- Und Raumfahrt E.V Quick acting ball valve
US5206594A (en) * 1990-05-11 1993-04-27 Mine Safety Appliances Company Apparatus and process for improved photoionization and detection
US5629518A (en) * 1994-11-25 1997-05-13 Deutsche Forschungsanstalt Fuer Luft-Und Raumfahrt E.V. Process and apparatus for detecting sample molecules in a carrier gas

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
BOESL U ET AL: "LASER ION SOURCES FOR TIME-OF-FLIGHT MASS SPECTROMETRY", INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, vol. 131, 1 January 1994 (1994-01-01), pages 87 - 124, XP000446266, ISSN: 0168-1176 *
NEUSSER H J ET AL: "DECAY ENERGETICS OF MOLECULAR CLUSTERS STUDIED BY MULTIPHOTON MASS SPECTROMETRY AND PULSED FIELD THRESHOLD IONIZATION", INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, vol. 131, no. 1/03, 24 February 1994 (1994-02-24), pages 211 - 232, XP000446270, ISSN: 0168-1176 *

Also Published As

Publication number Publication date
WO1999033089A2 (fr) 1999-07-01
DE19756444C1 (de) 1999-07-08

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