WO1998013880A1

WO1998013880A1 - POLY-Si/POLY-SiGe GATE FOR CMOS DEVICES

Info

Publication number: WO1998013880A1
Application number: PCT/US1997/004987
Authority: WO
Inventors: Deepak Kumar Nayak
Original assignee: Advanced Micro Devices, Inc.
Priority date: 1996-09-25
Filing date: 1997-03-25
Publication date: 1998-04-02

Abstract

A structure and a method of manufacturing the structure in which boron diffusion into a gate oxide layer is suppressed. The structure is formed on a semiconductor substrate and includes a gate oxide layer formed on the semiconductor substrate, a layer of doped or undoped poly-SiGe formed on the gate oxide layer. A polysilicon layer formed on the poly-SiGe layer. The polysilicon layer may be doped or undoped. If undoped, boron dopant ions are implanted in the polysilicon and heat diffused into the polysilicon layer and into the undoped poly-SiGe layer.

Description

POLY-Si/POLY-SiGe GATE FOR CMOS DEVICES

BACKGROUND OF THE INVENTION

1. Field of the Invention

This invention relates generally to the manufacture of high performance semiconductor devices and, more particularly, to the manufacture of high performance sub-micron semiconductor devices and, even more particularly, to a gate structure to suppress boron penetration into thin gate oxides.

2. Discussion of the Related Art

The semiconductor industry is increasingly characterized by a growing trend toward fabricating larger and more complex circuits on a given semiconductor chip. This is being achieved by reducing the size of individual devices within the circuits and spacing the devices closer together. The reduction of the size of individual devices and the closer spacing brings about improved electrical performance.

For example, there is increasing interest in MOS integrated circuits in which the component devices have gate dimensions as small as 0.35 microns or less. Devices having such small dimensions suffer from certain problems that are not of serious concern when the gate dimensions are greater than about 1 micron. For example, the scaling rules that apply to these small devices call for very thin gate oxide layers, typically equivalent to 30 - 80 Angstroms of silicon dioxide. Conventional gate oxide layers, which consist of thermally grown silicon dioxide, may be inadequate in several respects when they are made this thin. For example, such thin oxide layers tend to exhibit a high density of pinholes. These layers are also very permeable to boron which is used as a dopant for the polysilicon used as a gate material. As a result, for example, boron from a p⁺ doped polysilicon gate electrode can readily penetrate the thin oxide layer and contaminate the underlying channel during subsequent, high-temperature processing.

Early MOS integrated circuits were built using PMOS technology, primarily because enhancement-mode MOSFETs with suitable V, (threshold voltage) values could only be fabricated as p-channel devices using aluminum or n^*-doped polysilicon gates and uniform lightly doped n-substrates. This is because, at that time it was not possible to produce enhancement-mode n- channel MOSFETs using n^{^}-poly or Al gates on a uniform, lightly doped p-substrate because such structures exhibit a negative threshold voltage. However, with the advent of ion implantation it became possible to build NMOSFETs with positive V_ts by adjusting channel doping profiles. After this, enhancement-mode and depletion-mode NMOSFETs could then be fabricated with little extra difficulty. Since n-channel transistors have greater drive current and hence speed, NMOS replaced PMOS as the dominant digital IC technology. However, when CMOS became the main technology for VLSI in the late 1980s, the need for enhancement-mode p- channel MOSFETs returned.

However, the fabrication of p-channel devices with short channels in CMOS present unique problems which arise from having to build both NMOS and PMOS devices on the same chip. The problems revolve around the choice of a doping type for the polysilicon gate electrode and the impact that this choice has on the threshold voltage and other characteristics of PMOS devices. To achieve high drive current it is necessary to make the threshold voltage of a MOSFET as close to 0V as possible. When MOS IC technologies were initially being developed V. values with a magnitude of about IV were acceptable. However, in n-well CMOS technology, as well as in twin-well CMOS technology, the situation changes because in n-well CMOS technology the doping in the n-well is about lOx the doping in the substrate, making it at least 10 '/cm³. Twin-well CMOS technology has become the well-architecture technology of choice as the gate lengths decrease below about 1 micron. For 1 micron MOS devices, both p-channel and n-channel, the substrate doping density must be 2-3xl0^lc/cm³. Therefore, the V, values of PMOS devices made with n⁺- poly gates in either n-well or twin-well CMOS technology will be at least -1.5V which is too large in magnitude. In addition, in PMOΞFETs with a channel length less than 1 micron, punchthrough effects are more severe than in comparably sized NMOSFETs. This is primarily due to the inability to make p' source/drain junctions as shallow as n⁺ junctions. To suppress such punchthrough current it is necessary to increase the n- doping in the substrate. This makes short-channel PMOS devices even more strongly enhancement mode, i.e., V_t is increased even more.

For optimal logic-gate performance the threshold voltages of the n-channel and p-channel devices in CMOS circuits should also have comparable magnitudes. In addition, to allow for maximum current-driving capability, they should be as small as possible. For example, for 5V CMOS technology, desirable threshold voltages are 0.6 to 0.8V for V_lπ and -0.6 to -0.8V for V_Tp.

The most common choice for the gate material has been heavily doped n-type polysilicon. For long- channel devices it has been possible to adjust both V_Tn and V_Tμ with implants of boron into the channel. However, when n^* poly is the gate electrode in a PMOS device, adjustment of V₁₍ to -0.7V is not simple, especially when the channel is shrunk below about 1 microns. In addition, further shrinkage of the device requires the gate oxide to be thinner which makes the use of boron to adjust V_Tp in this type of device even less feasible since larger doses of boron are needed. An alternative is to use p⁺ polysilicon as the gate material for PMOS devices. This appears to be mandatory when the channel length becomes smaller than 0.5 μm.

In advanced CMOS technology having channel lengths below 0.50 μm, enhancement-mode surface-channel devices are desirable due to improved short-channel effect of these devices. The dual-poly (n"-poly gate for NMOS and p⁺-poly gate for PMOS) technology has been the trend in recent years, which produces surface-channel CMOS devices.

A major problem with p^{^} polysilicon gates when a thin gate oxide is used is poor V_τ process control in the PMOS devices, due to penetration of the boron into the gate oxide and, ever worse, into the silicon substrate. It has been shown that boron will penetrate gate oxides that are less than or equal to 12.5 nm thick during a 900 degree Centigrade, 30 minute post- implant anneal in N_:, . This would imply that a lower process temperature needs to be used, however, if the process temperature is too low the boron implanted into the polysilicon will not be sufficiently redistributed and the polysilicon dopant concentration at the polysilicon gate/gate-oxide interface could be less than the desired mid-lO^/cm³ concentration level which would create V_τ control problems in MOS devices. This produces the poly-depletion effect. On the other hand, if the process temperature is too high or the anneal time is for too long a time, there will be boron penetration through the gate oxide. Boron penetration through thin gate oxide from the p⁺ polysilicon in a dual gate (also known as twin gate) CMOS technology logic device results in threshold voltage V_r instability, a shift in the flat-band voltage V_F[j, a degradation of channel mobility and subthreshold slope, a lower charge-to-breakdown Q_B[) value, and an increase in oxide trapping centers for p-channel devices. Because of all these effects, boron penetration into the gate-oxide has become a major reliability concern for sub-halfmicron CMOS transistors due to the scaling of gate oxide.

The problem that is presented to process engineers in specifying process parameters is that for the p⁺ polysilicon gate to act as a good conductor, so that drive currents are high, for example, it is necessary to have a uniformly heavily doped polysilicon gate. The gate is doped by first ion implanting the dopant ions into the gate at a selected implant energy and then annealing at a selected temperature for a selected period of time to drive the dopant ions into the polysilicon gate. Ideally, the dopant ions would be driven only until there is a uniform concentration profile across the polysilicon gate to the p⁺- polysilicon/gate-oxide interface and nothing beyond. However, the extent of the penetration of the dopant ions depends upon the process parameters, namely, the implant energy and dosage level at which the ions are implanted, the anneal temperature at which the ions are driven into the gate, and the period of time at which the anneal step is conducted. If one of these parameters is incorrect, the dopant ions will be driven either too far or not far enough. If the dopant ions are driven too far the problems, as discussed above occur. If the dopant ions are not driven far enough there is an area above the p'-polysilicon/gate-oxide interface that has a deficiency of dopant ions. This deficiency of dopant ions exhibits an effect known as the poly-depletion effect. Poly depletion decreases the effective gate capacitance of the device and degrades device current drive.

What is needed is a gate structure that will allow greater latitude for process engineers to specify process parameters such as heat treatment temperature and time, and that will decrease the extent of boron penetration at the gate/gate oxide interface in order to improve the reliability of the device and, at the same time, not decrease the performance of the device. SUMMARY OF THE INVENTION

A gate structure and a method of manufacturing the structure in which boron diffusion into a gate oxide layer is suppressed. The structure includes a semiconductor substrate on which a gate oxide is formed. A boron diffusion suppression layer is formed on the gate oxide and can be either doped or undoped poly-SiGe. A doped or undoped polysilicon layer is formed on the poly-SiGe layer. The undoped polysilicon layer is implanted with dopant ions and heat treated to diffuse the dopant ions into the polysilicon layer and the poly-SiGe layer.

The present invention is better understood upon consideration of the detailed description below, in conjunction with the accompanying drawings. As will become readily apparent from the following description to those skilled in this art there is shown and described preferred embodiments of this invention simply by way of illustration of the mode best suited to carry out the invention. As it will be realized, the invention is capable of other different embodiments, and its several details are capable of modifications in various, obvious aspects all without departing from the scope of the invention. Accordingly, the drawings and descriptions will be regarded as illustrative in nature and not as restrictive. BRIEF DESCRIPTION OF THE DRAWING

The accompanying drawings incorporated in and forming a part of the specification, illustrate the present invention, and together with the detailed description serve to explain the principles of the invention. In the drawings:

Figure 1 is a diagram showing the structure as taught by the present invention in nmos.

Figure 2 is a diagram showing the structure as taught by the present invention in pmos.

Figure 3 shows boron concentration profiles in a polysilicon gate structure.

DETAILED DESCRIPTION Referring now to Figure l, there is shown an nmos semiconductor device 10 incorporating the present invention. The device 10 is formed on a p-silicon conductivity type substrate 12 which has two n+ regions 14 and 16 which are the drain and source regions, respectively, in the device 10. A gate oxide region 18 is formed on the substrate 12 between the drain region 14 and the source region 16. The thickness of the gate oxide region 18 is in the range of 20 - 70 Angstroms and the thickness selected depends on the dimensions of the overall device. For example, for 0.25 micron or smaller devices, a gate oxide thickness less than 60 Angstroms is necessary. For 0.1 micron devices, the gate oxide thickness is required to be in the range of 20 - 40 Angstroms. The gate oxide is typically silicon dioxide, Si0₂. On the gate oxide region 18 there is a layer of poly-SiGe 20. The poly-SiGe material is an alloy of silicon and germanium with the percentage of germanium in the range of 30-70%. The thickness of the poly-SiGe layer 20 is in the range of 10 - 200 Angstroms. The poly-SiGe layer 20 can be undoped or in-situ doped while being deposited. In one embodiment of the invention, undoped poly-SiGe is deposited on the gate oxide layer 18 and the polysilicon layer 22 is deposited on poly-SiGe layer 20. The thickness of the polysilicon layer 22 is in the range of 500 - 3000 Angstroms. In the case in which the poly-SiGe layer 20 is deposited undoped the polysilicon layer 22 can be deposited undoped and boron implanted into the surface of the polysilicon layer 22 followed by a heat treatment to diffuse the boron ions into the polysilicon layer 22 and into the poly-SiGe layer 20. In the case in which the poly-SiGe layer 20 is doped in-situ followed by the deposition of the polysilicon layer 22, the polysilicon layer 22 can be deposited either in-situ doped or undoped as discussed above, that is, doped by implantation. Referring now to Figure 2 there is shown a pmos semiconductor device 24 incorporating the present invention. The device 24 is formed on an n- silicon conductivity type substrate 26 which has two p+ regions 28 and 30 which are the drain and source regions, respectively, in the device 24. A gate oxide region 32 is formed on the substrate 26 between the drain region 28 and 30. The thickness of the gate oxide region 32 is in the range of 20 - 70 Angstroms and the thickness selected depends on dimensions of the overall device. For example, for 0.25 micron or smaller devices, a gate oxide thickness of less than 60 Angstroms is necessary. For 0.1 micron devices, the gate oxide thickness is required to be in the range of 30 - 40 Angstroms. The gate oxide is typically silicon dioxide, Si0₂.

On the gate oxide region 32 there is a layer of poly-SiGe 34. The poly-SiGe 34 material is an alloy of silicon and germanium with the percentage of germanium in the range of 30-70%. The thickness of poly-SiGe layer 34 is in the range of 10 - 200 Angstroms. The poly-SiGe layer 34 can be undoped or in-situ doped while being deposited. In one embodiment of the invention, undoped poly-SiGe is deposited on the gate oxide layer 32 and the polysilicon layer 36 is deposited on the poly-SiGe layer 34. The thickness of the polysilicon layer 36 is in the range of 500 - 3000 Angstroms. In the case in which the poly-SiGe layer 34 is deposited undoped, the polysilicon layer 36 can be deposited undoped and boron implanted into the surface of the polysilicon layer 36 followed by a heat treatment to diffuse the boron ions into the polysilicon layer 36 and into the poly-SiGe layer 20. In the case where the poly-SiGe layer 34 is doped in situ followed by the deposition of the polysilicon layer 36, the polysilicon layer 36 can be deposited either in-situ doped or undoped as discussed above, that is, doped by implantation.

Referring now to Figure 3 there is shown boron concentration profiles at various stages of the manufacturing process. The boron concentration profiles are superimposed over a typical semiconductor device at 38. The relative concentration is given along the axis 40 and the depth into the structure coincides with the structure as shown along the axis

42. The typical structure 38, as taught by the present invention, is formed on a silicon substrate 44 of a selected conductivity type, a gate oxide layer 46, typically made of Si0_, a poly-SiGe layer 48, and a polysilicon layer 50. The curve 52 represents the boron ion concentration profile as implanted. As can be appreciated, the highest boron ion concentration immediately after implant is in the polysilicon layer 50 with decreasing concentration in the poly-SiGe layer 48. Ideally, there is no boron ion penetration into the SiO, layer 46 through the interface 54. The curve 56 represents the boron ion concentration profile after heat treatment which is done to drive a higher concentration of boron ions into the poly-SiGe layer 48. The ideal concentration profile is for the curve 56 to be uniform across the polysilicon layer 50 and the poly-SiGe layer 48 with no boron ion concentration indicated across the interface 54 into the gate oxide layer 46. However, there is penetration of boron ion into the gate oxide layer 46 as indicated by the portion of curve 56 indicated at 58 which represents the situation when there is no poly-SiGe layer 48, that is, if polysilicon layer 50 extends to the gate oxide layer 46. In contrast, with the poly-SiGe layer 48 in the device, the boron ion concentration profile curve 56 follows the curve 60 which shows a decreased concentration in the poly-SiGe layer 48 and a much less concentration beyond the interface 54 indicated by 61. The decreased concentration of boron ions in the oxide layer 46 improves oxide reliability, and the suppressed diffusion into the gate oxide layer 46 prevents the boron ions from reaching the substrate 44 which improves pmos threshold stability.

The advantages of using the poly-SiGe layer 20 in the nmos device shown in Figure 1 and the poly-SiGe layer 34 in the pmos device shown in Figure 2 are as follows:

1. Boron doped poly-SiGe provides a symmetric V_t for nmos and pmos. This provides for single polysilicon devices which have similar surface channel characteristics .

2. No V, implant is required. Low surface doping leads to high mobility and high current drive. 3. Since poly-SiGe is a better barrier to boron diffusion than conventional polysilicon process engineers have greater latitude in developing processes to suppress boron penetration to the gate oxide.

4. Because conventional polysilicon is stacked onto the poly-SiGe layer which is very thin compared to polysilicon, all of the process parameters developed for polysilicon can be used in the remaining process steps. These process parameters include standard etching, lithography, silicidation, and oxidation properties, etc.

5. Both implanted boron polysilicon and in-situ boron doped polysilicon can be used.

6. Both undoped and in-situ doped poly-SiGe can be used. The foregoing description of the preferred embodiments of the present invention has been presented for purposes of illustration and description. It is not intended to be exhaustive or to limit the invention to the precise form disclosed. Obvious modifications or variations are possible in light of the above teachings. The embodiments were chosen and described to provide the best illustration of the principles of the invention and its practical application to thereby enable one of ordinary skill in the art to utilize the invention in various embodiments and with various modifications suited to the particular use contemplated. All such modifications and variations are within the scope of the invention as determined by the appended claims when interpreted in accordance with the breadth to which they are fairly, legally, and equitably entitled.

Claims

C AIMSWhat I claim is:

1. A semiconductor device, comprising: a semiconductor substrate of a first conductivity type ; a gate oxide layer formed on said semiconductor substrate; and a boron diffusion suppression layer formed on said gate oxide layer.

2. The semiconductor device of Claim 1, wherein said boron diffusion suppression layer comprises a layer of poly-SiGe.

3. The semiconductor device of Claim 2, wherein said layer of poly-SiGe is doped.

4. The semiconductor device of Claim 2, wherein said layer of poly-SiGe is undoped.

5. The semiconductor device of Claim 3, further comprising a polysilicon layer formed on said boron diffusion suppression layer.

6. The semiconductor device of Claim 4, further comprising a polysilicon layer formed on said boron diffusion suppression layer.

7. The semiconductor device of Claim 6, further comprising a doped polysilicon layer.

8. The semiconductor device of Claim 7, further comprising heat diffused dopant ions in said polysilicon layer.

9. The semiconductor device of Claim 8, further comprising heat diffused dopant ions in said boron diffusion suppression layer.

10. The semiconductor device of Claim 5, wherein said polysilicon layer is doped.

11. A method of manufacturing a semiconductor device, comprising the steps of: forming a gate oxide layer on a semiconductor substrate of a first conductivity type; and forming a boron diffusion suppression layer on said gate oxide layer.

12. The method of Claim 11, wherein said step of forming a boron diffusion suppression layer on said gate oxide layer is accomplished by a step of forming a layer of poly-SiGe on said gate oxide layer.

13. The method of Claim 12, wherein said step of forming a layer of poly-SiGe on said gate oxide layer is accomplished by the step of forming a layer of doped poly-SiGe on said gate oxide layer.

14. The method of Claim 12, wherein said step of forming a layer of poly-SiGe on said gate oxide layer is accomplished by the step of forming a layer of undoped poly-SiGe on said oxide layer.

15. The method of Claim 13, further comprising the step of forming a polysilicon layer on said boron diffusion suppression layer.

16. The method of Claim 14, further comprising the step of forming a polysilicon layer on said boron diffusion suppression layer.

17. The method of Claim 16, further comprising the step of doping the polysilicon layer.

18. The method of Claim 17, further comprising the step of heat diffusing said implanted dopant ions into said polysilicon layer.

19. The method of Claim 18, further comprising the step of heat diffusing said dopant ions into said boron diffusion suppression layer.

20. The method of Claim 15, wherein said step of forming a polysilicon layer on said boron diffusion suppression layer is accomplished by forming a layer of doped polysilicon on said gate oxide layer.