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WO1996017971B1 - Sputtering apparatus having an on board service module - Google Patents

Sputtering apparatus having an on board service module

Info

Publication number
WO1996017971B1
WO1996017971B1 PCT/US1995/014436 US9514436W WO9617971B1 WO 1996017971 B1 WO1996017971 B1 WO 1996017971B1 US 9514436 W US9514436 W US 9514436W WO 9617971 B1 WO9617971 B1 WO 9617971B1
Authority
WO
WIPO (PCT)
Prior art keywords
module
service module
service
process module
vacuum
Prior art date
Application number
PCT/US1995/014436
Other languages
French (fr)
Other versions
WO1996017971A1 (en
Filing date
Publication date
Application filed filed Critical
Priority to DE69525372T priority Critical patent/DE69525372T2/en
Priority to EP95941368A priority patent/EP0796354B1/en
Priority to AU42814/96A priority patent/AU4281496A/en
Priority to JP8517586A priority patent/JPH11504386A/en
Publication of WO1996017971A1 publication Critical patent/WO1996017971A1/en
Publication of WO1996017971B1 publication Critical patent/WO1996017971B1/en

Links

Abstract

A system (50) for sputtering a substrate (42) is disclosed. The system includes a central housing (12) having at least one process module (20, 22, 24) for forming the layer, wherein the process module is in fluid communication with the central housing (12) and includes a first device used in conjunction with forming the layer on the substrate (42). In addition, the system (50) includes at least one service module (52) in fluid communication with the central housing (12), wherein the service module (52) includes at least one replacement device suitable for replacing the first device. The central housing (12) includes a robotic element (40) for transporting the first device from the process module (20, 22, 24) to the service module (52) and for transporting the replacement device from the service module (52) to the process module (20, 22, 24) in order to replace the first device. In addition, the service module (52) includes a dedicated pump (60) for evacuating the service module (52) to a high vacuum in order to reduce surface outgassing of the replacement device to a desired level before use.

Claims

-25-AMENDED CLAIMS[received by the International Bureau on 21 June 1996 (21.06.96); original claims 5-7 and 12-14 cancelled; original claims 1, 2, 8, 9, 15 and 16 amended; remaining claims unchanged (5 pages)]
1. A system for forming a layer on a substrate, comprising: at least one process module for forming said layer, said process module including a first device used in conjunction with forming said layer on said substrate; at least one service module removably affixed to said process module, said service module having at least one replacement device suitable for replacing said first device; a valve for isolating said service module from said process module; evacuation means for providing evacuation of said process and service modules to a desired vacuum, wherein when said valve is opened said evacuation of said process and service modules is sufficient for maintaining said vacuum thereby minimizing time needed for evacuation; and a robotic element for transporting said first device from said process module to said service module and for transporting said replacement device from said service module to said process module for replacing said first device.
2. The system according to claim 1 , wherein said service module is maintained under a vacuum suitable for reducing outgassing of said replacement device to a desired level.
3. The system according to claim 1 further including a rack having at least one shelf for storing said replacement device and for receiving said first device.
4. The system according to claim 3 further including a drive mechanism for moving said shelf to enable alignment with said robotic element.
5. The system according to claim 1 wherein said service module is removably affixed to said process module.
6. The system according to claim 1 wherein said service module is unistructurally formed with said process module.
7. The system according to claim 1 further including a valve for isolating said service module from said process module.
8. The system according to claim 1 wherein said service module includes a pump for evacuating said service module to a vacuum level suitable for outgassing.
-27-
9. A system for forming a layer on a substrate, comprising: at least one process module for forming said layer, said process module including a first device used in conjunction with forming said layer on said substrate; at least one service module having at least one replacement device suitable for replacing said first device wherein said service module is maintained at a vacuum suitable for reducing outgassing of said replacement device to a desired level; a central housing removably affixed between said process module and said service module; a valve for isolating said service module from said central housing and said process module; evacuation means for providing evacuation of said process and service modules and said central housing to said vacuum, wherein when said valve is opened said evacuation of said process and service modules and said central housing is sufficient for maintaining said vacuum thereby minimizing time needed for evacuation; and at least one robotic element located in said central housing, wherein said robotic element is adapted for transporting said first device from said process module to said service module and for transporting said replacement device from said service module to said process module for replacing said first device under said vacuum.
10. The system according to claim 9 further including a rack having at least one shelf for storing said replacement device and for receiving said first device.
1 1 . The system according to claim 10 further including a drive mechanism for moving said shelf to enable alignment with said robotic element. -28-
12. The system according to claim 9 wherein said service module is removeably affixed to said central housing.
13. The system according to claim 9 wherein said service module is removeably affixed to said process module.
14. The system according to claim 9 further including a valve for isolating said service module from said process module.
15. The system according to claim 9 wherein said service module includes a pump for evacuating said service module to a vacuum level suitable for outgassing.
-29-
16. A system for forming a layer on a substrate, comprising: at least one process module for forming said layer, said process module including a first device used in conjunction with forming said layer on said substrate; at least one service module having at least one replacement device suitable for replacing said first device wherein said service module is maintained at a vacuum suitable for reducing outgassing of said replacement device to a desired level; a central housing removably affixed in fluid communication between said process module and said service module; a valve for isolating said service module from said central housing and said process module; evacuation means for providing evacuation of said process and service modules and said central housing to said vacuum, wherein when said valve is opened said evacuation of said process and service modules and said central housing is sufficient for maintaining said vacuum thereby minimizing time needed for evacuation; at least one robotic element located in said central housing, wherein said robotic element is adapted for transporting said first device from said process module to said service module and for transporting said replacement device from said service module to said process module for replacing said first device under said high vacuum; a storage element for storing said replacement device in said service module; and a drive mechanism for moving said storage element within said service module to enable said robotic arm to place said first fixture in said storage element and to transport said replacement device from said storage element to said process module under said vacuum.
PCT/US1995/014436 1994-12-08 1995-11-09 Sputtering apparatus having an on board service module WO1996017971A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE69525372T DE69525372T2 (en) 1994-12-08 1995-11-09 SPUTTER SYSTEM WITH BUILT-IN MAINTENANCE MODULE
EP95941368A EP0796354B1 (en) 1994-12-08 1995-11-09 Sputtering apparatus having an on board service module
AU42814/96A AU4281496A (en) 1994-12-08 1995-11-09 Sputtering apparatus having an on board service module
JP8517586A JPH11504386A (en) 1994-12-08 1995-11-09 Sputtering apparatus having on-board service module

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US35200094A 1994-12-08 1994-12-08
US08/352,000 1994-12-08

Publications (2)

Publication Number Publication Date
WO1996017971A1 WO1996017971A1 (en) 1996-06-13
WO1996017971B1 true WO1996017971B1 (en) 1996-08-08

Family

ID=23383365

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1995/014436 WO1996017971A1 (en) 1994-12-08 1995-11-09 Sputtering apparatus having an on board service module

Country Status (9)

Country Link
US (1) US5620578A (en)
EP (1) EP0796354B1 (en)
JP (1) JPH11504386A (en)
KR (1) KR100372500B1 (en)
AU (1) AU4281496A (en)
CA (1) CA2206109A1 (en)
DE (1) DE69525372T2 (en)
TW (1) TW359849B (en)
WO (1) WO1996017971A1 (en)

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US5944857A (en) * 1997-05-08 1999-08-31 Tokyo Electron Limited Multiple single-wafer loadlock wafer processing apparatus and loading and unloading method therefor
US6312525B1 (en) 1997-07-11 2001-11-06 Applied Materials, Inc. Modular architecture for semiconductor wafer fabrication equipment
US6688375B1 (en) * 1997-10-14 2004-02-10 Applied Materials, Inc. Vacuum processing system having improved substrate heating and cooling
US6042623A (en) * 1998-01-12 2000-03-28 Tokyo Electron Limited Two-wafer loadlock wafer processing apparatus and loading and unloading method therefor
US6558509B2 (en) * 1999-11-30 2003-05-06 Applied Materials, Inc. Dual wafer load lock
US6953392B2 (en) * 2001-01-05 2005-10-11 Asm Nutool, Inc. Integrated system for processing semiconductor wafers
US7172497B2 (en) * 2001-01-05 2007-02-06 Asm Nutool, Inc. Fabrication of semiconductor interconnect structures
TWI222154B (en) * 2001-02-27 2004-10-11 Asm Nutool Inc Integrated system for processing semiconductor wafers
US20040259348A1 (en) * 2001-02-27 2004-12-23 Basol Bulent M. Method of reducing post-CMP defectivity
US20040089421A1 (en) * 2002-02-15 2004-05-13 Komandur Srinivasan M. Distributed control system for semiconductor manufacturing equipment
US20050205209A1 (en) * 2004-03-18 2005-09-22 Aelan Mosden Replacing chamber components in a vacuum environment
US7867904B2 (en) * 2006-07-19 2011-01-11 Intermolecular, Inc. Method and system for isolated and discretized process sequence integration
WO2008141106A1 (en) * 2007-05-09 2008-11-20 Applied Materials, Inc. Transfer chamber with vacuum extension for shutter disks
US20080276867A1 (en) * 2007-05-09 2008-11-13 Jason Schaller Transfer chamber with vacuum extension for shutter disks
CN102284307A (en) * 2011-06-08 2011-12-21 大连海事大学 Modularized integrated large-scale vacuum device available for partitioning operation
US9746678B2 (en) * 2014-04-11 2017-08-29 Applied Materials Light wave separation lattices and methods of forming light wave separation lattices
US9666461B1 (en) * 2016-02-05 2017-05-30 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor process and semiconductor processing device using the same
TWI742201B (en) * 2016-12-02 2021-10-11 美商應用材料股份有限公司 Integrated atomic layer deposition tool

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US3516386A (en) * 1965-07-16 1970-06-23 Boeing Co Thin film deposition fixture
US4909695A (en) * 1986-04-04 1990-03-20 Materials Research Corporation Method and apparatus for handling and processing wafer-like materials
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US5076205A (en) * 1989-01-06 1991-12-31 General Signal Corporation Modular vapor processor system
JPH0733576B2 (en) * 1989-11-29 1995-04-12 株式会社日立製作所 Sputter device, target exchanging device, and exchanging method thereof
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