AU2003256029A1 - A monitoring apparatus - Google Patents

A monitoring apparatus

Info

Publication number: AU2003256029A1
Authority: AU; Australia
Prior art keywords: monitoring apparatus; monitoring
Prior art date: 2002-07-31
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Abandoned

Application number

AU2003256029A

Other languages

English (en)

Inventor

Liam Kehoe

Patrick Vincent Kelly

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Optical Metrology Patents Ltd

Original Assignee

Optical Metrology Patents Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2002-07-31

Filing date

2003-07-31

Publication date

2004-02-25

2003-07-31 Application filed by Optical Metrology Patents Ltd filed Critical Optical Metrology Patents Ltd

2004-02-25 Publication of AU2003256029A1 publication Critical patent/AU2003256029A1/en

Status Abandoned legal-status Critical Current

Links

238000012544 monitoring process Methods 0.000 title 1

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Length Measuring Devices By Optical Means (AREA)
Image Processing (AREA)

AU2003256029A 2002-07-31 2003-07-31 A monitoring apparatus Abandoned AU2003256029A1 (en)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
US39941302P	2002-07-31	2002-07-31
US60/399,413		2002-07-31
PCT/IE2003/000109 WO2004015368A1 (fr)	2002-07-31	2003-07-31	Appareil de controle

Publications (1)

Publication Number	Publication Date
AU2003256029A1 true AU2003256029A1 (en)	2004-02-25

Family

ID=31715682

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
AU2003256029A Abandoned AU2003256029A1 (en)	2002-07-31	2003-07-31	A monitoring apparatus

Country Status (4)

Country	Link
EP (1)	EP1540277A1 (fr)
JP (1)	JP2005534934A (fr)
AU (1)	AU2003256029A1 (fr)
WO (1)	WO2004015368A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
FR2870935A1 (fr) *	2004-05-25	2005-12-02	Insidix Sarl	Dispositif de mesure de deformations de surface
RU2445572C1 (ru) *	2010-11-09	2012-03-20	Государственное образовательное учреждение высшего профессионального образования "Санкт-Петербургский государственный университет информационных технологий, механики и оптики"	Устройство для контроля деформаций протяженного объекта
ITBA20120040A1 (it) *	2012-06-25	2013-12-26	Cenms Srl	Dispositivo ottico per la misura contemporanea di deformazioni nel piano e fuori dal piano
CN103149087B (zh) *	2013-02-07	2015-05-20	湘潭大学	一种基于随动视窗与数字图像的非接触式实时应变测量方法
CN106595522B (zh)	2016-12-15	2018-11-09	东南大学	一种光栅投影三维测量系统的误差校正方法
CN109029279B (zh) *	2018-07-23	2020-01-10	清华大学	变形测量方法及装置
CN110207606B (zh) *	2019-06-27	2021-04-20	航天神舟飞行器有限公司	基于数字图像关联性的面外应变测量方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5898486A (en) *	1994-03-25	1999-04-27	International Business Machines Corporation	Portable moire interferometer and corresponding moire interferometric method
DE19614896B4 (de) *	1996-04-16	2005-04-07	Chemnitzer Werkstoffmechanik Gmbh	Verfahren zur feldmäßigen Bestimmung von Deformationszuständen in mikroskopisch dimensionierten Prüflingsbereichen und Verwendung des Verfahrens

2003
- 2003-07-31 WO PCT/IE2003/000109 patent/WO2004015368A1/fr not_active Application Discontinuation
- 2003-07-31 AU AU2003256029A patent/AU2003256029A1/en not_active Abandoned
- 2003-07-31 EP EP03784445A patent/EP1540277A1/fr not_active Withdrawn
- 2003-07-31 JP JP2004527258A patent/JP2005534934A/ja active Pending

Also Published As

Publication number	Publication date
JP2005534934A (ja)	2005-11-17
WO2004015368A1 (fr)	2004-02-19
EP1540277A1 (fr)	2005-06-15

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Legal Events

Date	Code	Title	Description
2005-05-12	MK6	Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase