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BibTeX records: Mahmut Yilmaz

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

> Home > Persons > Mahmut Yilmaz

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@inproceedings{DBLP:conf/itc/MangilalYASN24,
  author       = {Kunal Jain Mangilal and
                  Mahmut Yilmaz and
                  Vishal Agarwal and
                  Shantanu Sarangi and
                  Kaushik Narayanun},
  title        = {A Scalable {\&} Cost Efficient Next-Gen Scan Architecture: Streaming
                  Scan Test via {NVIDIA} {MATHS}},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2024, San Diego, CA, USA,
                  November 3-8, 2024},
  pages        = {400--406},
  year         = {2024},
  crossref     = {DBLP:conf/itc/2024},
  url          = {https://doi.org/10.1109/ITC51657.2024.00062},
  doi          = {10.1109/ITC51657.2024.00062},
  timestamp    = {Tue, 10 Dec 2024 14:23:44 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MangilalYASN24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/dt/YilmazJNSSS23,
  author       = {Mahmut Yilmaz and
                  Pavan Kumar Datla Jagannadha and
                  Kaushik Narayanun and
                  Shantanu Sarangi and
                  Francisco Da Silva and
                  Joe Sarmiento},
  title        = {{NVIDIA} {MATHS:} Mechanism to Access Test-Data Over High-Speed Links},
  journal      = {{IEEE} Des. Test},
  volume       = {40},
  number       = {4},
  pages        = {25--33},
  year         = {2023},
  url          = {https://doi.org/10.1109/MDAT.2023.3269391},
  doi          = {10.1109/MDAT.2023.3269391},
  timestamp    = {Fri, 07 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/YilmazJNSSS23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/MozaffariBSSFVM22,
  author       = {Seyed Nima Mozaffari and
                  Bonita Bhaskaran and
                  Shantanu Sarangi and
                  Suhas M. Satheesh and
                  Kuo Lin Fu and
                  Nithin Valentine and
                  P. Manikandan and
                  Mahmut Yilmaz},
  title        = {On-Die Noise Measurement During Automatic Test Equipment {(ATE)} Testing
                  and In-System-Test {(IST)}},
  booktitle    = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
                  April 25-27, 2022},
  pages        = {1--6},
  year         = {2022},
  crossref     = {DBLP:conf/vts/2022},
  url          = {https://doi.org/10.1109/VTS52500.2021.9794251},
  doi          = {10.1109/VTS52500.2021.9794251},
  timestamp    = {Thu, 12 Jun 2025 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/MozaffariBSSFVM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/YilmazJNSSSTCKS22,
  author       = {Mahmut Yilmaz and
                  Pavan Kumar Datla Jagannadha and
                  Kaushik Narayanun and
                  Shantanu Sarangi and
                  Francisco Da Silva and
                  Joe Sarmiento and
                  Smbat Tonoyan and
                  Ashwin Chintaluri and
                  Animesh Khare and
                  Milind Sonawane and
                  Ashish Kumar and
                  Anitha Kalva and
                  Alex Hsu and
                  Jayesh Pandey},
  title        = {{NVIDIA} {MATHS:} Mechanism to Access Test-Data over High-Speed Links},
  booktitle    = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
                  April 25-27, 2022},
  pages        = {1--7},
  year         = {2022},
  crossref     = {DBLP:conf/vts/2022},
  url          = {https://doi.org/10.1109/VTS52500.2021.9794146},
  doi          = {10.1109/VTS52500.2021.9794146},
  timestamp    = {Thu, 12 Jun 2025 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/YilmazJNSSSTCKS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/JagannadhaYSCSB19,
  author       = {Pavan Kumar Datla Jagannadha and
                  Mahmut Yilmaz and
                  Milind Sonawane and
                  Sailendra Chadalavada and
                  Shantanu Sarangi and
                  Bonita Bhaskaran and
                  Shashank Bajpai and
                  Venkat Abilash Reddy Nerallapally and
                  Jayesh Pandey and
                  Sam Jiang},
  title        = {Special Session: In-System-Test {(IST)} Architecture for {NVIDIA}
                  Drive-AGX Platforms},
  booktitle    = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
                  April 23-25, 2019},
  pages        = {1--8},
  year         = {2019},
  crossref     = {DBLP:conf/vts/2019},
  url          = {https://doi.org/10.1109/VTS.2019.8758636},
  doi          = {10.1109/VTS.2019.8758636},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/JagannadhaYSCSB19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/JagannadhaYSCSB16,
  author       = {Pavan Kumar Datla Jagannadha and
                  Mahmut Yilmaz and
                  Milind Sonawane and
                  Sailendra Chadalavada and
                  Shantanu Sarangi and
                  Bonita Bhaskaran and
                  Ayub Abdollahian},
  title        = {Advanced test methodology for complex SoCs},
  booktitle    = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
                  TX, USA, November 15-17, 2016},
  pages        = {1--10},
  year         = {2016},
  crossref     = {DBLP:conf/itc/2016},
  url          = {https://doi.org/10.1109/TEST.2016.7805857},
  doi          = {10.1109/TEST.2016.7805857},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/JagannadhaYSCSB16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/SonawaneCSSYJC16,
  author       = {Milind Sonawane and
                  Sailendra Chadalavada and
                  Shantanu Sarangi and
                  Amit Sanghani and
                  Mahmut Yilmaz and
                  Pavan Kumar Datla Jagannadha and
                  Jonathon E. Colburn},
  title        = {Flexible scan interface architecture for complex SoCs},
  booktitle    = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA,
                  April 25-27, 2016},
  pages        = {1--6},
  year         = {2016},
  crossref     = {DBLP:conf/vts/2016},
  url          = {https://doi.org/10.1109/VTS.2016.7477308},
  doi          = {10.1109/VTS.2016.7477308},
  timestamp    = {Sun, 06 Oct 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/SonawaneCSSYJC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/SonawaneJCSYSNC16,
  author       = {Milind Sonawane and
                  Pavan Kumar Datla Jagannadha and
                  Sailendra Chadalavada and
                  Shantanu Sarangi and
                  Mahmut Yilmaz and
                  Amit Sanghani and
                  Karthikeyan Natarajan and
                  Jonathon E. Colburn and
                  Anubhav Sinha},
  title        = {Dynamic docking architecture for concurrent testing and peak power
                  reduction},
  booktitle    = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA,
                  April 25-27, 2016},
  pages        = {1--6},
  year         = {2016},
  crossref     = {DBLP:conf/vts/2016},
  url          = {https://doi.org/10.1109/VTS.2016.7477290},
  doi          = {10.1109/VTS.2016.7477290},
  timestamp    = {Sun, 06 Oct 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/SonawaneJCSYSNC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@incollection{DBLP:books/crc/14/PengYT14,
  author       = {Ke Peng and
                  Mahmut Yilmaz and
                  Mohammad Tehranipoor},
  title        = {Circuit Path Grading Considering Layout, Process Variations, and Cross
                  Talk},
  booktitle    = {Testing for Small-Delay Defects in Nanoscale {CMOS} Integrated Circuits},
  pages        = {95--118},
  year         = {2014},
  crossref     = {DBLP:books/crc/14/GC2014},
  timestamp    = {Fri, 05 Jun 2020 14:24:01 +0200},
  biburl       = {https://dblp.org/rec/books/crc/14/PengYT14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@incollection{DBLP:books/crc/14/Yilmaz14,
  author       = {Mahmut Yilmaz},
  title        = {Output Deviations-Based {SDD} Testing},
  booktitle    = {Testing for Small-Delay Defects in Nanoscale {CMOS} Integrated Circuits},
  pages        = {119--146},
  year         = {2014},
  crossref     = {DBLP:books/crc/14/GC2014},
  timestamp    = {Fri, 05 Jun 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/books/crc/14/Yilmaz14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/BaoPYCWT13,
  author       = {Fang Bao and
                  Ke Peng and
                  Mahmut Yilmaz and
                  Krishnendu Chakrabarty and
                  LeRoy Winemberg and
                  Mohammad Tehranipoor},
  title        = {Efficient Pattern Generation for Small-Delay Defects Using Selection
                  of Critical Faults},
  journal      = {J. Electron. Test.},
  volume       = {29},
  number       = {1},
  pages        = {35--48},
  year         = {2013},
  url          = {https://doi.org/10.1007/s10836-012-5345-9},
  doi          = {10.1007/S10836-012-5345-9},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/BaoPYCWT13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tvlsi/PengYCT13,
  author       = {Ke Peng and
                  Mahmut Yilmaz and
                  Krishnendu Chakrabarty and
                  Mohammad Tehranipoor},
  title        = {Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay
                  Defects},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {21},
  number       = {6},
  pages        = {1129--1142},
  year         = {2013},
  url          = {https://doi.org/10.1109/TVLSI.2012.2205026},
  doi          = {10.1109/TVLSI.2012.2205026},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/PengYCT13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/EggersglussYC12,
  author       = {Stephan Eggersgl{\"{u}}{\ss} and
                  Mahmut Yilmaz and
                  Krishnendu Chakrabarty},
  title        = {Robust Timing-Aware Test Generation Using Pseudo-Boolean Optimization},
  booktitle    = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
                  19-22, 2012},
  pages        = {290--295},
  year         = {2012},
  crossref     = {DBLP:conf/ats/2012},
  url          = {https://doi.org/10.1109/ATS.2012.35},
  doi          = {10.1109/ATS.2012.35},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/EggersglussYC12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/dt/YilmazTC11,
  author       = {Mahmut Yilmaz and
                  Mohammad Tehranipoor and
                  Krishnendu Chakrabarty},
  title        = {A Metric to Target Small-Delay Defects in Industrial Circuits},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {28},
  number       = {2},
  pages        = {52--61},
  year         = {2011},
  url          = {https://doi.org/10.1109/MDT.2011.26},
  doi          = {10.1109/MDT.2011.26},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/YilmazTC11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/BaoPYCWT11,
  author       = {Fang Bao and
                  Ke Peng and
                  Mahmut Yilmaz and
                  Krishnendu Chakrabarty and
                  LeRoy Winemberg and
                  Mohammad Tehranipoor},
  title        = {Critical Fault-Based Pattern Generation for Screening SDDs},
  booktitle    = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
                  2011},
  pages        = {177--182},
  year         = {2011},
  crossref     = {DBLP:conf/ets/2011},
  url          = {https://doi.org/10.1109/ETS.2011.26},
  doi          = {10.1109/ETS.2011.26},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/BaoPYCWT11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcad/YilmazCT10,
  author       = {Mahmut Yilmaz and
                  Krishnendu Chakrabarty and
                  Mohammad Tehranipoor},
  title        = {Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep
                  Submicrometer Integrated Circuits},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {29},
  number       = {5},
  pages        = {760--773},
  year         = {2010},
  url          = {https://doi.org/10.1109/TCAD.2010.2043591},
  doi          = {10.1109/TCAD.2010.2043591},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tcad/YilmazCT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/GoelCYPT10,
  author       = {Sandeep Kumar Goel and
                  Krishnendu Chakrabarty and
                  Mahmut Yilmaz and
                  Ke Peng and
                  Mohammad Tehranipoor},
  title        = {Circuit Topology-Based Test Pattern Generation for Small-Delay Defects},
  booktitle    = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
                  December 2010, Shanghai, China},
  pages        = {307--312},
  year         = {2010},
  crossref     = {DBLP:conf/ats/2010},
  url          = {https://doi.org/10.1109/ATS.2010.59},
  doi          = {10.1109/ATS.2010.59},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/GoelCYPT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/PengYCT10,
  author       = {Ke Peng and
                  Mahmut Yilmaz and
                  Krishnendu Chakrabarty and
                  Mohammad Tehranipoor},
  title        = {A Noise-Aware Hybrid Method for {SDD} Pattern Grading and Selection},
  booktitle    = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
                  December 2010, Shanghai, China},
  pages        = {331--336},
  year         = {2010},
  crossref     = {DBLP:conf/ats/2010},
  url          = {https://doi.org/10.1109/ATS.2010.63},
  doi          = {10.1109/ATS.2010.63},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/PengYCT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/PengYTC10,
  author       = {Ke Peng and
                  Mahmut Yilmaz and
                  Mohammad Tehranipoor and
                  Krishnendu Chakrabarty},
  title        = {High-quality pattern selection for screening small-delay defects considering
                  process variations and crosstalk},
  booktitle    = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
                  March 8-12, 2010},
  pages        = {1426--1431},
  year         = {2010},
  crossref     = {DBLP:conf/date/2010},
  url          = {https://doi.org/10.1109/DATE.2010.5457036},
  doi          = {10.1109/DATE.2010.5457036},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/date/PengYTC10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/YilmazWROSEFGC10,
  author       = {Mahmut Yilmaz and
                  Baosheng Wang and
                  Jayalakshmi Rajaraman and
                  Tom Olsen and
                  Kanwaldeep Sobti and
                  Dwight Elvey and
                  Jeff Fitzgerald and
                  Grady Giles and
                  Wei{-}Yu Chen},
  title        = {The scan-DFT features of AMD's next-generation microprocessor core},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
                  USA, November 2-4, 2010},
  pages        = {39--48},
  year         = {2010},
  crossref     = {DBLP:conf/itc/2010},
  url          = {https://doi.org/10.1109/TEST.2010.5699203},
  doi          = {10.1109/TEST.2010.5699203},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/YilmazWROSEFGC10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/SanyalCYF10,
  author       = {Alodeep Sanyal and
                  Krishnendu Chakrabarty and
                  Mahmut Yilmaz and
                  Hideo Fujiwara},
  title        = {RT-level design-for-testability and expansion of functional test sequences
                  for enhanced defect coverage},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
                  USA, November 2-4, 2010},
  pages        = {625--634},
  year         = {2010},
  crossref     = {DBLP:conf/itc/2010},
  url          = {https://doi.org/10.1109/TEST.2010.5699266},
  doi          = {10.1109/TEST.2010.5699266},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SanyalCYF10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/PengTYCT10,
  author       = {Ke Peng and
                  Jason Thibodeau and
                  Mahmut Yilmaz and
                  Krishnendu Chakrabarty and
                  Mohammad Tehranipoor},
  title        = {A novel hybrid method for {SDD} pattern grading and selection},
  booktitle    = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
                  Santa Cruz, California, {USA}},
  pages        = {45--50},
  year         = {2010},
  crossref     = {DBLP:conf/vts/2010},
  url          = {https://doi.org/10.1109/VTS.2010.5469619},
  doi          = {10.1109/VTS.2010.5469619},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/PengTYCT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@phdthesis{DBLP:phd/basesearch/Yilmaz09,
  author       = {Mahmut Yilmaz},
  title        = {Automated Test Grading and Pattern Selection for Small-Delay Defects},
  school       = {Duke University, Durham, NC, {USA}},
  year         = {2009},
  url          = {https://www.base-search.net/Record/889c5803c765d5de1af29d28b90969c3748c67e559f73fd44599d294b2e49861},
  timestamp    = {Wed, 04 May 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/phd/basesearch/Yilmaz09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/YilmazC09,
  author       = {Mahmut Yilmaz and
                  Krishnendu Chakrabarty},
  title        = {Seed selection in LFSR-reseeding-based test compression for the detection
                  of small-delay defects},
  booktitle    = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
                  April 20-24, 2009},
  pages        = {1488--1493},
  year         = {2009},
  crossref     = {DBLP:conf/date/2009},
  url          = {https://doi.org/10.1109/DATE.2009.5090898},
  doi          = {10.1109/DATE.2009.5090898},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/YilmazC09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/YilmazCT08,
  author       = {Mahmut Yilmaz and
                  Krishnendu Chakrabarty and
                  Mohammad Tehranipoor},
  title        = {Interconnect-Aware and Layout-Oriented Test-Pattern Selection for
                  Small-Delay Defects},
  booktitle    = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
                  California, USA, October 26-31, 2008},
  pages        = {1--10},
  year         = {2008},
  crossref     = {DBLP:conf/itc/2008},
  url          = {https://doi.org/10.1109/TEST.2008.4700627},
  doi          = {10.1109/TEST.2008.4700627},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/YilmazCT08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/YilmazCT08,
  author       = {Mahmut Yilmaz and
                  Krishnendu Chakrabarty and
                  Mohammad Tehranipoor},
  title        = {Test-Pattern Grading and Pattern Selection for Small-Delay Defects},
  booktitle    = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
                  2008, San Diego, California, {USA}},
  pages        = {233--239},
  year         = {2008},
  crossref     = {DBLP:conf/vts/2008},
  url          = {https://doi.org/10.1109/VTS.2008.32},
  doi          = {10.1109/VTS.2008.32},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/YilmazCT08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/YilmazMOS07,
  author       = {Mahmut Yilmaz and
                  Albert Meixner and
                  Sule Ozev and
                  Daniel J. Sorin},
  title        = {Lazy Error Detection for Microprocessor Functional Units},
  booktitle    = {22nd {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2007), 26-28 September 2007, Rome, Italy},
  pages        = {361--369},
  year         = {2007},
  crossref     = {DBLP:conf/dft/2007},
  url          = {https://doi.org/10.1109/DFT.2007.16},
  doi          = {10.1109/DFT.2007.16},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/YilmazMOS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iccd/OzevSY07,
  author       = {Sule Ozev and
                  Daniel J. Sorin and
                  Mahmut Yilmaz},
  title        = {Low-cost run-time diagnosis of hard delay faults in the functional
                  units of a microprocessor},
  booktitle    = {25th International Conference on Computer Design, {ICCD} 2007, 7-10
                  October 2007, Lake Tahoe, CA, USA, Proceedings},
  pages        = {317--324},
  year         = {2007},
  crossref     = {DBLP:conf/iccd/2007},
  url          = {https://doi.org/10.1109/ICCD.2007.4601919},
  doi          = {10.1109/ICCD.2007.4601919},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/OzevSY07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/YilmazHOS06,
  author       = {Mahmut Yilmaz and
                  Derek Hower and
                  Sule Ozev and
                  Daniel J. Sorin},
  title        = {Self-Checking and Self-Diagnosing 32-bit Microprocessor Multiplier},
  booktitle    = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  pages        = {1--10},
  year         = {2006},
  crossref     = {DBLP:conf/itc/2006},
  url          = {https://doi.org/10.1109/TEST.2006.297634},
  doi          = {10.1109/TEST.2006.297634},
  timestamp    = {Tue, 12 Dec 2023 09:46:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/YilmazHOS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/sigmetrics/BowerHYSO06,
  author       = {Fred A. Bower and
                  Derek Hower and
                  Mahmut Yilmaz and
                  Daniel J. Sorin and
                  Sule Ozev},
  title        = {Applying architectural vulnerability Analysis to hard faults in the
                  microprocessor},
  booktitle    = {Proceedings of the Joint International Conference on Measurement and
                  Modeling of Computer Systems, SIGMETRICS/Performance 2006, Saint Malo,
                  France, June 26-30, 2006},
  pages        = {375--376},
  year         = {2006},
  crossref     = {DBLP:conf/sigmetrics/2006},
  url          = {https://doi.org/10.1145/1140277.1140327},
  doi          = {10.1145/1140277.1140327},
  timestamp    = {Sun, 19 Jan 2025 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/sigmetrics/BowerHYSO06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/itc/2024,
  title        = {{IEEE} International Test Conference, {ITC} 2024, San Diego, CA, USA,
                  November 3-8, 2024},
  publisher    = {{IEEE}},
  year         = {2024},
  url          = {https://doi.org/10.1109/ITC51657.2024},
  doi          = {10.1109/ITC51657.2024},
  isbn         = {979-8-3315-2013-7},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/2024.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/vts/2022,
  title        = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
                  April 25-27, 2022},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/VTS52500.2022},
  doi          = {10.1109/VTS52500.2022},
  isbn         = {978-1-6654-1060-1},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/2022.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/vts/2019,
  title        = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
                  April 23-25, 2019},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/8753115/proceeding},
  isbn         = {978-1-7281-1170-4},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/2019.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/itc/2016,
  title        = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
                  TX, USA, November 15-17, 2016},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/7794484/proceeding},
  isbn         = {978-1-4673-8773-6},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/2016.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/vts/2016,
  title        = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA,
                  April 25-27, 2016},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/7469602/proceeding},
  isbn         = {978-1-4673-8454-4},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/2016.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@book{DBLP:books/crc/14/GC2014,
  editor       = {Sandeep Kumar Goel and
                  Krishnendu Chakrabarty},
  title        = {Testing for Small-Delay Defects in Nanoscale {CMOS} Integrated Circuits},
  publisher    = {{CRC} Press},
  year         = {2014},
  url          = {http://www.crcpress.com/product/isbn/9781439829417},
  isbn         = {978-1-439-82941-7},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/books/crc/14/GC2014.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/ats/2012,
  title        = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
                  19-22, 2012},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/6392591/proceeding},
  isbn         = {978-1-4673-4555-2},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/2012.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/ets/2011,
  title        = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
                  2011},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/5955410/proceeding},
  isbn         = {978-0-7695-4433-5},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/2011.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/ats/2010,
  title        = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
                  December 2010, Shanghai, China},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/5689827/proceeding},
  isbn         = {978-0-7695-4248-5},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/2010.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/date/2010,
  editor       = {Giovanni De Micheli and
                  Bashir M. Al{-}Hashimi and
                  Wolfgang M{\"{u}}ller and
                  Enrico Macii},
  title        = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
                  March 8-12, 2010},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/5450668/proceeding},
  isbn         = {978-1-4244-7054-9},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/date/2010.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/itc/2010,
  editor       = {Ron Press and
                  Erik H. Volkerink},
  title        = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
                  USA, November 2-4, 2010},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/5684496/proceeding},
  isbn         = {978-1-4244-7206-2},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/2010.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/vts/2010,
  title        = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
                  Santa Cruz, California, {USA}},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/5464131/proceeding},
  isbn         = {978-1-4244-6648-1},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/2010.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/date/2009,
  editor       = {Luca Benini and
                  Giovanni De Micheli and
                  Bashir M. Al{-}Hashimi and
                  Wolfgang M{\"{u}}ller},
  title        = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
                  April 20-24, 2009},
  publisher    = {{IEEE}},
  year         = {2009},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/4926138/proceeding},
  isbn         = {978-1-4244-3781-8},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/date/2009.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/itc/2008,
  editor       = {Douglas Young and
                  Nur A. Touba},
  title        = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
                  California, USA, October 26-31, 2008},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/4690905/proceeding},
  isbn         = {978-1-4244-2403-0},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/2008.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/vts/2008,
  title        = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
                  2008, San Diego, California, {USA}},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/4511672/proceeding},
  isbn         = {978-0-7695-3123-6},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/2008.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/dft/2007,
  editor       = {Cristiana Bolchini and
                  Yong{-}Bin Kim and
                  Adelio Salsano and
                  Nur A. Touba},
  title        = {22nd {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2007), 26-28 September 2007, Rome, Italy},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/4358358/proceeding},
  isbn         = {0-7695-2885-6},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/2007.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/iccd/2007,
  title        = {25th International Conference on Computer Design, {ICCD} 2007, 7-10
                  October 2007, Lake Tahoe, CA, USA, Proceedings},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/4591423/proceeding},
  isbn         = {1-4244-1258-7},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/2007.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/itc/2006,
  editor       = {Scott Davidson and
                  Anne Gattiker},
  title        = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/4079296/proceeding},
  isbn         = {1-4244-0292-1},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/2006.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/sigmetrics/2006,
  editor       = {Raymond A. Marie and
                  Peter B. Key and
                  Evgenia Smirni},
  title        = {Proceedings of the Joint International Conference on Measurement and
                  Modeling of Computer Systems, SIGMETRICS/Performance 2006, Saint Malo,
                  France, June 26-30, 2006},
  publisher    = {{ACM}},
  year         = {2006},
  url          = {https://doi.org/10.1145/1140277},
  doi          = {10.1145/1140277},
  isbn         = {1-59593-319-0},
  timestamp    = {Tue, 18 Nov 2025 18:05:10 +0100},
  biburl       = {https://dblp.org/rec/conf/sigmetrics/2006.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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