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WO2024223644A1 - Mesure de déformations de surface sur des surfaces en verre - Google Patents

Mesure de déformations de surface sur des surfaces en verre Download PDF

Info

Publication number
WO2024223644A1
WO2024223644A1 PCT/EP2024/061228 EP2024061228W WO2024223644A1 WO 2024223644 A1 WO2024223644 A1 WO 2024223644A1 EP 2024061228 W EP2024061228 W EP 2024061228W WO 2024223644 A1 WO2024223644 A1 WO 2024223644A1
Authority
WO
WIPO (PCT)
Prior art keywords
light pattern
pane
camera
pattern features
measuring method
Prior art date
Application number
PCT/EP2024/061228
Other languages
German (de)
English (en)
Inventor
Kai Vogel
Andreas Sandner
Original Assignee
Viprotron Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Viprotron Gmbh filed Critical Viprotron Gmbh
Publication of WO2024223644A1 publication Critical patent/WO2024223644A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
    • G01N2021/8832—Structured background, e.g. for transparent objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features

Definitions

  • the invention relates to a measuring method and a measuring device for determining the flatness of a transparent pane, wherein the pane is displaced relative to a lighting device and a camera or the lighting device and the camera are displaced relative to the pane in a transport direction by means of a transport device, wherein a light pattern consisting of several two-dimensional light pattern features is projected onto the pane using the lighting device, wherein the several light pattern features are projected onto the pane next to one another in a transverse axis oriented perpendicular to the transport direction, wherein the light pattern reflected by the pane is at least partially recorded by the camera, wherein a geometric parameter of the light pattern features recorded by the camera is determined, and by evaluating several images recorded one after the other by the camera, a change in the geometric parameter of one or more light pattern features caused by the reflections on the pane is evaluated.
  • Optical distortions can be caused by reflection of light rays from surface deformations on the pane surface. These surface deformations are often caused by the tempering process during the finishing of the glass pane. If Before glass panes are to be toughened or annealed, they are transported by a conveyor system through a heated furnace in which they are heated to a critical temperature at which internal stresses are relieved. Evenly reaching the critical temperature without softening the glass pane, usually with large-area glass panes, is a challenge. Typically, the glass pane reaches a local softening point at which the glass is in a deformable state.
  • the glass pane usually rests on a large number of heat-resistant ceramic rollers on the conveyor system and is transported through the furnace in this way.
  • the locally softened glass pane deforms due to the force of gravity acting on the glass pane. This causes the glass pane to warp or deform due to the glass pane sagging in the space between two transport rollers.
  • the sag is more pronounced, which is reflected in the surface profile of the glass pane and in its reflection properties.
  • the sag on the glass pane along the transport direction is usually cyclical.
  • the period of high points versus low points is influenced by, among other things, the distance between adjacent transport rollers and the concentricity of the transport rollers.
  • the high and low points are periodically engraved into the glass pane.
  • These high and low points engraved into a glass pane are, for example, when using a glass pane under prestress clearly visible.
  • the deformations caused by the sag between the rollers or by an out-of-round roller tend to be cyclical in nature and produce a wave effect in the glass pane.
  • a local distortion can also be seen in the glass pane along a transverse axis parallel to the longitudinal direction.
  • the patent specification US 7,345,698 B2 discloses a measuring method and a measuring device for detecting and measuring optical distortion in glass panes.
  • an optical magnification of a reflected circular light pattern feature is recorded by means of a camera.
  • a large number of circular light pattern features are projected onto the glass and reflected as ellipses that depict the local surface contours. Distortions in the glass surface are measured as local magnification or reduction on the elliptical axis.
  • the angle and the size of the minor and major axes of the reflected ellipses provide data for depicting the surface profile of the glass.
  • This method is not suitable for measuring several different surfaces of a glass pane, since the images of light pattern features reflected on several surfaces overlap and it is therefore not possible to reliably distinguish which part of the reflection comes from which surface.
  • the reflected image does not contain a single shape of each individual surface, but a composite image of the combined multiple reflections on the surfaces. This makes it impossible to evaluate the distortion separately from the respective reflecting surfaces.
  • the patent specification US 10,161,879 B1 describes a further development of the device and method described above from the document US 7,345,698 B2.
  • the method and the device disclosed in the patent specification US 10,161,879 B1 are used to measure the surface profile and the optical reflection strength of one or more surfaces of transparent glass panes.
  • a large number of circular light pattern features are projected onto the glass surface, whereby the light pattern features are not projected onto the glass surface in a filled form, but rather consist of a border. This means that if the images reflected from the multiple glass surfaces overlap, the distortion can be evaluated separately, so that the determined distortion of a light pattern feature can be assigned to the respective glass surface.
  • the camera is positioned and aligned in such a way that the light pattern features projected onto the pane are completely captured by the camera. This is the only way to evaluate the enlargement or reduction of the major or minor axes of the reflected ellipses. This requires the use of area cameras to capture the area of the pane in which the light pattern features are projected. It is considered to be the object of the present invention to provide a measuring method with which a simple and accurate measurement of the distortion of the glass pane is possible during the manufacturing process of the glass pane.
  • a circumferential line of the light pattern features is formed by a polygonal line which has a plurality of straight-line polygonal sections, wherein polygonal sections of adjacent light pattern features which face one another are not aligned parallel to one another.
  • the geometric parameter(s) can be easily determined by projecting such light pattern features with known dimensions. Because the feature distances between two adjacent light pattern features differ from one another at least in sections over their entire extent in the transport direction, the geometric parameters can be reliably recorded from sections of the light pattern recorded with the camera, so that the entire light pattern does not have to be recorded or evaluated in the transport direction.
  • the pane is displaced relative to the lighting device and the camera or the lighting device and the camera relative to the pane in the transport direction, the several images captured one after the other by the camera are recorded according to the invention in different relative positions of the pane to the lighting device and the camera in order to determine the change in the geometric parameters.
  • a Distortion of the light pattern feature in the transport direction can be determined.
  • the invention provides that light pattern features projected directly next to one another onto the pane are designed and arranged in such a way that all feature distances determined perpendicular to the transport direction between mutually facing outer contours of the light pattern features projected directly next to one another differ from one another. Because the feature distances between two adjacent light pattern features differ from one another over their entire extent in the transport direction, the geometric parameters can also be reliably recorded from sections of the light pattern recorded with the camera, so that the entire light pattern does not have to be recorded or evaluated in the transport direction.
  • the light pattern can, for example, be formed from trapezoidal light pattern features. It is also possible and provided according to the invention for the light pattern to be formed from parallelogram-shaped light pattern features, wherein an angle of inclination of light pattern features projected directly adjacent to one another onto the pane differs from one another.
  • the light pattern is formed from triangular light pattern features.
  • the determination of a geometric parameter can be carried out particularly easily. For example, by a reference measurement and by evaluating an image recorded with the camera a length of a triangle side can be determined. The image position of the reflected light pattern feature hitting an image sensor of the camera can also be evaluated.
  • the light pattern features are projected onto the pane in such a way that one side of each light pattern feature, such as one side of a triangle, lies completely within the recording area recorded by the camera and is thus completely recorded.
  • the geometric parameter here as a length of a side of the light pattern feature recorded with the camera, such as the triangle
  • the extent of the surface deformation of the pane can be determined.
  • the surface deformation can be formed as a curvature of the pane or can be visible as a wave-shaped, cyclical wave structure in the transport direction of the pane caused by the manufacturing process.
  • the invention provides that the light pattern features are formed from a plurality of trapezoidal light pattern feature parts arranged one behind the other in the transport direction and adjacent to one another.
  • a minimum distance perpendicular to the transport direction can be opposite polygonal sections can be easily specified.
  • the minimum distance is advantageously adapted to a maximum thickness of the pane to be measured in order to be able to differentiate between the polygon sections in the camera image that are generated once by the reflection of the light pattern on the top side of the pane and once on the bottom side of the pane and are recorded by the camera.
  • the measuring range can be easily enlarged without impairing the spatial resolution.
  • the lighting device and the camera are aligned at the same angle to the pane, so that the light pattern features reflected on the pane enter the camera perpendicularly. This makes it particularly easy to evaluate the images recorded with the camera, since a complex correction of distorted images generated by the light pattern features entering the camera at an angle is not necessary.
  • different areas of the light pattern are observed due to the surface deformation, so that recorded dimensions of neighboring light pattern features differ from one another and individual recorded dimensions also differ from reference dimensions.
  • the surface deformation of the pane can be determined by evaluating the position of the reflected light pattern feature or the deviation of the dimensions of the light pattern features or the light pattern feature sections.
  • the light pattern feature is designed as an isosceles and acute-angled triangle.
  • a distance determined between the sides of the triangle can be determined on a displacement or a rotation of the pane when cutting through the triangular light pattern feature.
  • a distortion of the light pattern feature in the transport direction and along the transverse axis can be evaluated separately.
  • the distortion of the light pattern feature caused in the transport direction by the surface deformation of the pane can be evaluated by a cyclical and wave-like change in the width of the triangular light pattern feature.
  • the geometry parameter describes a distance between two intersection points, the intersection points being generated by an intersection of an intersection line with two sides of the light pattern feature. Because the dimensions of the light pattern features can be determined in a reference measurement on a reference surface, a change in the distance can be used to determine the surface deformation of the pane.
  • the intersection line corresponds to the strip-shaped recording area recorded by the camera.
  • an advantageous embodiment of the inventive concept provides that the light pattern features are designed to be filled.
  • a particularly high-contrast and thus sharp transition can be recorded between the light pattern feature projected onto the pane and an area adjacent to the light pattern feature. This allows the local surface deformation to be determined particularly well.
  • a particularly high contrast can be created between a bright area of the pane illuminated with the light pattern feature and an unlit area of the pane or between light pattern features arranged adjacent to each other and only dimly lit dark areas. This allows transitions between the light pattern feature and the unlit area can be determined particularly accurately and reproducibly.
  • the invention provides that a light band is projected onto the pane in front of and/or behind the light pattern in the transport direction. In this way, it can be automatically determined that the camera and the projector are aligned in such a way that the maximum measuring range has been exceeded.
  • the light band is directly adjacent to the light pattern, so that the light pattern features and the light band merge into one another.
  • the invention provides that dark areas between adjacent light pattern features of the light pattern are also illuminated by the lighting device, with the lighting intensity of the dark area being lower than the lighting intensity of bright areas of the light pattern.
  • the lighting intensity of the dark area being lower than the lighting intensity of bright areas of the light pattern.
  • the lighting device advantageously has a projection lamp and a light pattern element arranged in a projection area of the projection lamp.
  • the light pattern element can be, for example, a film that has translucent and non-translucent or slightly translucent areas.
  • the light pattern is created by illuminating the film arranged between the projection lamp and the screen with the projection lamp.
  • the dimly translucent areas can have a low level of transparency.
  • the invention provides that the illumination intensity of the dark areas is a maximum of 10%, advantageously a maximum of 5% and particularly advantageously a maximum of 2% of the illumination intensity of the bright areas.
  • the invention provides that the illumination intensities of the light pattern feature parts of a light pattern feature differ from one another. In this way, it is possible to determine which area of the light pattern is being viewed, even when using a line scan camera, for example.
  • an advantageous implementation of the inventive concept provides that a strip-shaped recording area of the pane is recorded in an image recorded with the camera, wherein the strip-shaped recording area is oriented parallel to the transverse axis and the pane is completely recorded along the transverse axis.
  • an advantageous embodiment of the invention provides that the triangular light pattern features are oriented such that tips of the light pattern features point in or against the transport direction. Furthermore, according to the invention it can also be provided that the base side of a light pattern feature designed as an isosceles triangle is oriented parallel to the transverse axis. Thus, the lighting generated by the lighting device can be aligned with the transverse axis and the recording area of the camera can be aligned particularly easily along the base side of the triangle projected onto the pane.
  • an advantageous embodiment of the invention provides that the light pattern features are oriented such that the tips of adjacent triangular light pattern features point alternately in or against the transport direction.
  • the number of triangular light pattern features along the transverse axis determines the resolution of the measuring method along the transverse axis and thus across the pane width.
  • the number of data points for determining geometric parameters is therefore particularly large in order to be able to determine local curvatures of the surface deformation in each strip-shaped recording area and thus per pixel line of the line scan camera.
  • an advantageous embodiment of the method according to the invention provides that adjacent light pattern features are projected onto the pane with different light intensities.
  • a particularly high contrast can be generated between two adjacent light pattern features. This means that, for example, the intersection points used to determine the geometry parameters can be determined particularly precisely.
  • light patterns with triangular light pattern features can be used, wherein the triangles of the light patterns projected one after the other onto the pane each have, for example, base sides of different lengths.
  • Different surface deformations have different effects on the light pattern features used in each case.
  • the Projection device and the pane are each aligned orthogonally to one another. It is therefore expedient to calibrate the measuring device before carrying out a measurement.
  • the invention provides that when evaluating the images captured with the camera, an alignment of a recording area of the camera in relation to the projected light pattern determined in a calibration step preceding the capture of the images is taken into account. Knowing the relative position of the light pattern on the pane in relation to the camera, the evaluation steps described above can be carried out very precisely.
  • the object set out at the outset is also achieved by a measuring device, wherein the measuring device has a transport device for displacing the pane relative to the lighting device and the camera or for displacing the lighting device and the camera relative to the pane in the transport direction, wherein the lighting device can project the light pattern consisting of several two-dimensional light pattern features onto the pane, wherein the camera is aligned in such a way that the light pattern reflected by the pane can be at least partially captured by the camera, wherein a geometric parameter of the light pattern features recorded by the camera can be determined by the evaluation device, wherein the camera is designed as a line camera.
  • the alignment of the camera relative to the pane can be carried out particularly easily and quickly, since for an alignment of the strip-shaped recording area on the pane, the strip-shaped recording area can be easily
  • the illumination of the pane produced by the lighting device can also be easily adjusted to the strip-shaped area.
  • the images recorded by the line scan camera can be evaluated quickly and easily by evaluating the image information pixel by pixel.
  • the evaluation of a pixel line of the camera can be carried out at a higher rate than the evaluation of flat image information recorded by an area scan camera. This means that the geometric parameters can be determined particularly quickly by evaluating the images.
  • the use of a line scan camera or the advantageous evaluation of just individual lines of the captured camera image of an area scan camera according to the invention advantageously allows a high spatial resolution of the camera image in the transport direction.
  • an advantageous embodiment of the inventive concept provides that the transport device is designed as a roller conveyor or belt conveyor, with which the pane is moved relative to the lighting device and the camera in the transport direction.
  • roller conveyors and belt conveyors are known from manufacturing plants for glass panes, so that they can be used to position the pane in the transport direction.
  • the lighting device and the camera can thus be attached particularly easily to easily implemented stationary profile constructions.
  • a complex and possibly expensive drive device for Movement of the lighting device and the camera is not necessary. This makes it particularly easy to preset and adjust the distance between the lighting device and/or the camera relative to the transport device.
  • an advantageous implementation of the inventive concept provides that the camera is arranged on a side of the pane facing away from the roller conveyor or the belt conveyor.
  • the lighting device and the camera can thus be aligned at the same angle to the pane.
  • the invention provides that the lighting device has a projection lamp and a light pattern element arranged in front of the projection lamp in a projection area of the projection lamp, the light pattern element having a plurality of translucent areas, the light pattern being formed by the translucent areas.
  • the light pattern element is arranged between the projection lamp and the pane.
  • the light pattern element can be, for example, a film which has translucent and non- or slightly translucent areas, by which the light pattern is formed.
  • Figure 1 is a schematic representation of the measuring device in a side view
  • Figure 2 is a schematic representation of the measuring device in a plan view
  • Figure 3 is a schematic representation of a light pattern projected onto the disc
  • Figure 4 is a schematic representation of a section of the light pattern shown in Figure 3,
  • Figure 5 is a schematic representation of individual images drawn and composed using the line scan camera and
  • Figure 6 is a schematic representation of a light pattern with light pattern features having multiple light pattern feature parts.
  • Figure 1 shows a schematic representation of the measuring device in a side view.
  • a transport device 1 is used to position a pane 2 relative to an illumination device 3 and to a camera 4 designed as a line camera.
  • the pane 2 lies flat and horizontally on a plurality of transport rollers 5 of the transport device 1 designed as a roller conveyor 6 and is positioned in a transport direction 7.
  • a light pattern 9 shown in Figure 3 is projected onto the pane by means of the illumination device 3.
  • the light pattern 9, which is made up of a plurality of light pattern features 10 shown in Figure 3, Existing light pattern 8 is along a line perpendicular to the
  • the light is projected onto the pane 2 along a transverse axis 11 oriented in the direction of transport 7, which is shown in Figure 2.
  • the light pattern 9 reflected by the pane is at least partially recorded by the camera 4.
  • the camera 4 which is designed as a line camera, records a strip-shaped recording area 12 aligned along the transverse axis.
  • An evaluation device 9 is used to determine geometric parameters of the light pattern features 10 recorded by the camera 4 and shown in Figure 3.
  • Figure 3 shows a schematic representation of the light pattern 8 projected onto the pane 2.
  • the light pattern 8 is formed from several light pattern features 10 arranged next to one another and in the form of triangular light pattern features 10.
  • the light pattern features 10 are oriented such that the tips of adjacent triangular light pattern features 10 point in the transport direction 7 shown in Figure 2.
  • Figure 4 shows a schematic representation of a section of the light pattern 8 shown in Figure 3.
  • Side edges of the dirty light pattern features 10 each form a polygonal section 15. Together, the polygonal sections 15 form the polygonal section 16 that encloses the entire triangular light pattern 10.
  • the geometry parameter used is a distance between two intersection points 13 that are generated by cutting an intersection line 14 through two sides of the light pattern feature 10.
  • the intersection line 14 is determined by the strip-shaped recording area 12 of the camera 4.
  • Figure 5 shows a schematic representation of individual images recorded and assembled using the camera 4 shown in Figure 1.
  • the surface deformation of the pane 2 can be determined by changing the width of the light pattern features 10 recorded with the camera 4 within the recording area 12.
  • the distortion of the light pattern feature 10 caused in the transport direction 7 by the surface deformation of the pane 2 can be seen in the form of a cyclical and long-wave-like change in the width of the triangular light pattern feature 10.
  • Figure 6 shows a section of a light pattern 8.
  • the light pattern features 10 of this light pattern 8 each consist of three trapezoidal light feature parts 17. With respect to the illustration below the light pattern 8, the light band 18 is projected onto the pane immediately adjacent to the light pattern 8.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'invention se rapporte à un procédé de mesure et à un dispositif de mesure permettant de déterminer la planéité d'une vitre transparente (2). Au moyen d'un dispositif de transport (1), la vitre (2) est déplacée par rapport à un dispositif d'éclairage (3) et à une caméra (4) ou le dispositif d'éclairage (3) et la caméra (4) sont déplacés par rapport à la vitre dans une direction de transport (7). Au moyen du dispositif d'éclairage (3), un motif lumineux (8) constitué d'une pluralité d'éléments de motif lumineux bidimensionnels est projeté sur la vitre (2). La pluralité d'éléments de motif lumineux sont projetés sur la vitre (2) les uns à côté des autres le long d'un axe transversal orienté perpendiculairement à la direction de transport (7). Le motif lumineux (8) réfléchi par la vitre (2) est au moins partiellement capturé au moyen de la caméra (4). Un paramètre géométrique des éléments de motif lumineux enregistrés par la caméra (4) est déterminé. Le changement du paramètre géométrique d'un ou plusieurs éléments de motif lumineux qui est provoqué par les réflexions au niveau de la vitre (2) est évalué en fonction d'une pluralité d'images capturées les unes après les autres par la caméra (4). La caméra (4) se présente sous la forme d'une caméra à balayage linéaire.
PCT/EP2024/061228 2023-04-24 2024-04-24 Mesure de déformations de surface sur des surfaces en verre WO2024223644A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
LU504045A LU504045B1 (de) 2023-04-24 2023-04-24 Messung von Oberflächenverformungen auf Glasoberflächen
LULU504045 2023-04-24

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WO2024223644A1 true WO2024223644A1 (fr) 2024-10-31

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040057046A1 (en) * 2000-09-01 2004-03-25 Abbott Mark M. Optical system for imaging distortions in moving reflective sheets
FR2974414A1 (fr) * 2011-04-22 2012-10-26 Saint Gobain Procede d'analyse de la qualite d'un vitrage
US20140152769A1 (en) * 2012-12-05 2014-06-05 Paul Atwell Three-dimensional scanner and method of operation
US10161879B1 (en) 2017-07-28 2018-12-25 Litesentry Corporation Measurement of thickness, surface profile, and optical power of a transparent sheet

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040057046A1 (en) * 2000-09-01 2004-03-25 Abbott Mark M. Optical system for imaging distortions in moving reflective sheets
US7345698B2 (en) 2000-09-01 2008-03-18 Litesentry Corporation Optical system for imaging distortions in moving reflective sheets
FR2974414A1 (fr) * 2011-04-22 2012-10-26 Saint Gobain Procede d'analyse de la qualite d'un vitrage
US20140152769A1 (en) * 2012-12-05 2014-06-05 Paul Atwell Three-dimensional scanner and method of operation
US10161879B1 (en) 2017-07-28 2018-12-25 Litesentry Corporation Measurement of thickness, surface profile, and optical power of a transparent sheet

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