WO2018223268A1

WO2018223268A1 - Chip testing probe, chip testing device, and testing method

Info

Publication number: WO2018223268A1
Application number: PCT/CN2017/087211
Authority: WO
Inventors: 刘浩; 李亮; 肖裕权
Original assignee: 深圳市汇顶科技股份有限公司
Priority date: 2017-06-05
Filing date: 2017-06-05
Publication date: 2018-12-13
Also published as: CN107454938A; CN107454938B

Abstract

A chip testing probe, chip testing device, and testing method. The chip testing probe comprises an opaque housing (1) and an opaque conductive pressing head (3). The housing (1) is provided with a hollow channel (2) passing through a lower end of the housing (1). The conductive pressing head (3) is arranged in the hollow channel (2) and in tight contact with an inner wall (4) of the housing (1). When pressed, the conductive pressing head (3) moves along the hollow channel (2) toward the lower end to test a chip arranged at the lower end. The chip testing probe combines an optical property test and fingerprint detection performance test of a fingerprint chip (5), thus simplifying a testing process during manufacturing of fingerprint chips (5), improving testing efficiency of the manufacturing of the fingerprint chips (5), and lowering costs.

Description

Chip test head, chip test device and test method

Technical field

The present application relates to the field of chip testing, and in particular to a chip test head, a chip test device, and a test method.

Background technique

The traditional fingerprint chip mass production test only needs to collect data in two scenarios, that is, the sensor data of the fingerprint chip sensing area when the conductive material is pressed, and the sensor data of the fingerprint chip sensing area without any substance pressing. For the fingerprint chip with optical function (ie, the optical fingerprint chip), it is not only necessary to collect the above two kinds of data to analyze the fingerprint detection performance, but also to test the optical performance. Among them, the optical performance test usually needs to collect optical data of the fingerprint chip in the case of isolating ambient light for optical performance analysis. On this basis, some optical fingerprint chips also need to collect optical data when the ambient light is isolated while blocking the light of the chip itself.

For mass production testing of optical fingerprint chips, it is conventional practice to divide the above two tests into two separate stations, namely, testing of the fingerprint detection performance and testing of the optical performance. This test method adds a work station, which increases the link between the upper and lower films, which not only increases the cumbersomeness and cost of the test, but also reduces the test efficiency.

Summary of the invention

The purpose of some embodiments of the present application is to provide a chip test head, a chip test device, and a test method, which integrate the optical performance test and the fingerprint test performance test of the fingerprint chip, thereby simplifying The process of fingerprint chip mass production testing improves the efficiency of mass production testing and reduces costs.

An embodiment of the present application provides a chip test head including an opaque housing and an opaque pilot voltage; the housing is provided with a hollow passage through the bottom end of the housing, and the pilot head is disposed In the hollow passage, and in close contact with the inner wall of the casing; the voltage guiding head moves along the hollow passage toward the bottom end when being pressed to test the chip located at the bottom end.

The embodiment of the present application further provides a chip testing device, including the chip test head as described above, a first driving mechanism connected to the housing of the chip test head and used to push the chip test head to move, and the A pilot of the chip test head is coupled to the second drive mechanism for urging movement of the pilot.

The embodiment of the present application further provides a testing method of a fingerprint chip, which is applied to the chip testing device as described above, wherein the testing method includes: driving the chip test head to move in the direction of the fingerprint chip to be tested by the first driving device, until the The chip test head is placed on the fingerprint chip to be tested; wherein the optical sensing area of the fingerprint chip to be tested is located in the hollow channel, and there is a gap with the voltage guiding head; An optical data and first fingerprint data; driving the voltage guiding head to a surface of the fingerprint chip to be tested by a second driving device; collecting second optical data and second fingerprint data of the fingerprint chip to be tested; Determining the optical performance of the fingerprint chip to be tested by analyzing the first optical data and the second optical data; analyzing the first fingerprint data and the second fingerprint data to obtain fingerprint detection performance of the fingerprint chip to be tested.

Compared with the prior art, the embodiment of the present application provides a fingerprint chip test head, and a pilot voltage head that can move along the hollow channel when subjected to an external force is disposed in the fingerprint chip test head. When testing the fingerprint chip, the chip test head is placed on the fingerprint chip to be tested, and when the voltage guiding head is not pressed, the inner wall of the shell of the chip test head, the voltage guiding head and the fingerprint chip to be tested itself are formed. A sealed space that isolates ambient light, and the light of the fingerprint chip itself can form an independent loop in the sealed space. At this time, the fingerprint data when the fingerprint chip to be tested is not pressed and the optical data in the case of isolating ambient light can be collected. When the voltage guiding head is pressed to the surface of the fingerprint chip to be tested, the light of the fingerprint chip to be tested is completely covered. At this time, the fingerprint data when the fingerprint chip to be tested is pressed and the ambient light are isolated. Optical data with self-light conditions. It can be seen that through the chip test head, the fingerprint detection performance test and the optical performance measurement of the fingerprint chip can be integrated, which not only helps simplify the process of mass production test, improves the efficiency of mass production test, but also helps to reduce cost.

In addition, the pilot voltage head is an elastomer. The flexibility of the elastomer is good. When the voltage guiding head is pressed to the surface of the fingerprint chip to be tested, the degree of conformity with the surface of the fingerprint chip to be tested is tighter and the light blocking property is better.

In addition, the elastomer is a conductive rubber. A type of pilot voltage head is provided.

In addition, the conductive voltage head faces the chip and the inner wall of the casing is a rough surface. This design causes the light source of the fingerprint chip itself to be diffusely reflected in the sealed space formed by the inner wall of the chip of the chip test head, the voltage guiding head and the fingerprint chip to be tested. Multiple diffuse reflection loops are superimposed to achieve a uniform light effect, which is beneficial to improve the accuracy of optical performance testing.

In addition, a diffuse reflection film is attached to one surface of the voltage guiding head toward the chip and the inner wall of the housing. Another structure is provided which allows the light of the fingerprint chip to be tested to be diffusely reflected.

In addition, a top end of the housing extends a skirt; the skirt is provided with a plurality of mounting holes. A fixing structure of a housing is provided.

DRAWINGS

The one or more embodiments are exemplified by the accompanying drawings in the accompanying drawings. The figures are shown as similar elements, and the figures in the drawings do not constitute a scale limitation unless otherwise stated.

1 is a schematic structural view of a chip test head according to a first embodiment of the present application;

2 is a cross-sectional view of a front and rear chip test head for pressing a pilot voltage electrode according to a first embodiment of the present application;

3 is a cross-sectional view of the chip test head according to the first embodiment of the present application placed on the fingerprint chip to be tested and the pilot voltage head is not pressed;

4 is a schematic structural diagram of a chip testing device according to a third embodiment of the present application;

FIG. 5 is a schematic structural diagram of a method for testing a fingerprint chip according to a fourth embodiment of the present application.

detailed description

In order to make the objects, the technical solutions and the advantages of the present application more clear, some embodiments of the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It is understood that the specific embodiments described herein are merely illustrative of the application and are not intended to be limiting.

The first embodiment of the present application relates to a chip test head. The chip test head can be applied to the mass production test of the fingerprint chip. As shown in FIG. 1, the chip test head includes an opaque casing 1, a hollow passage 2 penetrating the bottom end of the casing 1, and a pilot voltage head 3 disposed in the hollow passage 2.

Specifically, the housing 1 can be made of an opaque material such as metal to achieve opacity. However, it is not limited thereto, and the opaque film can also be achieved by applying a opaque film on the surface thereof. The top end of the housing 1 extends outwardly from a skirt having a plurality of mounting holes 6 therein. When the chip test is performed, the chip test head can be fixed to the corresponding control device through the mounting hole 6.

The voltage guiding head 3 placed in the hollow passage 2 is provided with electrical conductivity and light blocking property, and is in close contact with the inner wall of the casing 1. When the external force is not applied, the pilot voltage head 3 can be fixed in the hollow channel 2, as shown in Fig. 2(a). As shown, the pilot voltage head 3 can move along the hollow passage 2 when subjected to an external force. If subjected to a downward pressing force, the pilot voltage head 3 can move along the hollow passage 2 toward the bottom end of the housing 1, as shown in Fig. 2(b).

The following will specifically explain how to apply the chip test head to the test of the fingerprint chip:

As shown in FIG. 3, when testing the fingerprint chip, the chip test head can be placed on the fingerprint chip 5 to be tested, and the optical sensing area (including the light emitting portion and the light receiving portion) of the fingerprint chip to be tested is to be placed. In the hollow channel 2 of the chip test head. When the pilot voltage head 3 is not pressed, there is a gap between the voltage guiding head 3 and the fingerprint chip 5 to be tested. At this time, an isolation environment is formed between the voltage guiding head 3, the inner wall 4 of the casing and the fingerprint chip 5 to be tested. The sealed space of light. The light emitted by the fingerprint chip 5 to be tested can form an independent optical path in the sealed space. At this time, the optical data corresponding to the fingerprint chip is the optical data in the case of isolating the ambient light, and the corresponding fingerprint data is the fingerprint data when the fingerprint chip is not pressed.

It is worth mentioning that, in order to achieve a better shading effect, the embodiment can also design the inner diameter of the hollow channel 2 according to the size of the fingerprint chip, so that the fingerprint chip to be tested can be entirely placed in the hollow channel 2, thereby better Avoid interference from ambient light.

In addition, it should be noted that in actual production, due to the limitation of the manufacturing process, the relative positional deviation within the tolerance range exists in each part of the chip test head. This relative positional deviation affects the direction of the light. For specular reflection, any change in the path of light caused by a slight relative positional deviation may cause a large deviation between the intensity of the received light and the intensity of the emitted light, thereby affecting the test results. However, diffuse reflection is not the same, it is not sensitive to the position of the light source, and multiple diffuse reflection circuits are superimposed to achieve a light-like effect similar to the uniform light, thereby reducing the influence of the relative positional deviation within the tolerance range on the test effect. For this reason, the present embodiment preferentially causes the light emitted by the fingerprint chip 5 to be tested to be diffusely reflected on the inner wall 4 of the casing and the side of the voltage guiding head 3 facing the fingerprint chip 5 to be tested.

In order to diffusely reflect the light emitted by the fingerprint chip 5 to be tested, the embodiment may be pre-aligned with the housing. The inner wall 4 and the voltage guiding head 3 are roughened toward one side of the fingerprint chip 5 to be tested, and the surface thereof is roughened. However, in practice, the diffused reflective film may be attached to the inner wall 4 of the casing and the conductive head 3 toward the side of the fingerprint chip 5 to be tested, so that the light emitted by the fingerprint chip 5 to be tested is diffused. reflection.

After obtaining the optical data in the case of isolating the ambient light and the fingerprint data when the fingerprint chip is not pressed, the pilot voltage head 3 can be pressed toward the fingerprint chip 5 to be tested. When the conductive voltage head 3 is attached to the surface of the fingerprint chip 5 to be tested, the light of the fingerprint chip 5 itself to be tested is blocked by the voltage guiding head 3. At this time, the optical data corresponding to the fingerprint chip is the optical data of the fingerprint chip to be tested in the case of isolating the ambient light and the self-light, and the corresponding fingerprint data is the fingerprint data when the fingerprint chip to be tested is pressed.

This embodiment provides a chip test head for fingerprint chip testing relative to the prior art. The chip test head can integrate the optical performance test and the fingerprint detection performance test of the fingerprint chip, which helps to simplify the process of the mass production test of the fingerprint chip, improve the efficiency of the mass production test, and reduce the cost.

A second embodiment of the present application relates to a chip test head. This embodiment further improves the pilot voltage of the chip test head on the basis of the first embodiment. The main improvement is that in the embodiment, the voltage guiding head is set as an elastic body.

The elastic body has a certain degree of softness, and when it is pressed to the fingerprint chip to be tested, the combination with the fingerprint chip to be tested is more tight, and the shielding effect on the light is better. At the same time, the pilot voltage is modeled on the human finger. Therefore, the pilot is set to an elastomer with a certain degree of softness, and the simulation is stronger, and the measurement result is more reliable.

In view of the high degree of similarity between the conductive rubber and the fingers, the present embodiment preferably uses a conductive rubber as a pilot voltage. In practical applications, other elastomers that do not have electrical conductivity itself can be selected as the pilot voltage. Head, in this case, the purpose of conduction can be achieved by plating a layer of metal on the surface. For example, a layer of copper can be applied to the surface of ordinary rubber.

Compared with the first embodiment, the guiding voltage head of the chip test head is an elastic body, which enhances the bonding effect between the voltage guiding head and the fingerprint chip to be tested, and helps to further improve the shading effect and make the measurement result. More reliable.

A third embodiment of the present application relates to a chip test apparatus. As shown in FIG. 4, the chip testing device includes the chip test head described in the above embodiment, the first driving mechanism 7 connected to the casing 1 of the chip test head and used to push the chip test head to move, and the guide of the chip test head. The voltage head 3 is connected and used to drive the second drive mechanism 8 that moves the voltage head 3.

Specifically, the first drive mechanism 7 includes a crossbar 71 and a first driver 72 connected to the crossbar 71. The chip test head is fixed to the crossbar 71 by a positioning post or a screw passing through a mounting hole in the skirt of the top end of the housing 1. During the chip test, the first driver 72 can be activated to push the whole of the crossbar 71 and the chip test head toward the fingerprint chip 5 to be tested until the bottom end of the chip test head is in contact with the fingerprint chip 5 to be tested.

It is worth mentioning that, when the fingerprint chip 5 to be tested is placed, the optical sensing area of the fingerprint chip 5 to be tested can be kept opposite to the hollow channel 2. When the bottom end of the chip test head is in contact with the fingerprint chip 5 to be tested, the optical sensing area can be placed in the hollow channel 2. At this time, a sealed space for isolating ambient light is formed between the conductive head 3, the inner wall 4 of the casing, and the fingerprint chip 5 to be tested, and the fingerprint chip 5 to be tested is formed in an independent optical path. This situation satisfies both the testing requirements of optical performance and the testing requirements of the case where the fingerprint chip to be tested is not pressed.

After collecting the current optical data and fingerprint data, the second driving mechanism 8 can be activated to push The voltage guiding head 3 is moved in the direction of the fingerprint chip 5 to be tested until the voltage guiding head 3 is attached to the surface of the fingerprint chip 5 to be tested. At this time, the optical sensing area of the fingerprint chip 5 to be tested is blocked by the voltage guiding head 3, and the light source of the fingerprint chip 5 to be tested is isolated. This situation can be tested both for fingerprint compression and for optical shading (which also blocks the chip's own light on the basis of isolated ambient light).

After the current optical data and the fingerprint data are collected, the first test mechanism 7 can drive the chip test head to move away from the fingerprint chip 5 .

In this embodiment, the first driver 72 and the second driving mechanism 8 may be motors or cylinders.

Compared with the prior art, the present embodiment provides a chip testing device, which can integrate the fingerprint detecting performance test and the optical performance measurement of the fingerprint chip, thereby facilitating the simplified mass production test of the fingerprint chip. Process, improve the efficiency of mass production testing, and reduce costs.

A fourth embodiment of the present application relates to a test method for a fingerprint chip. This test method uses the chip test apparatus of the third embodiment. The specific process is shown in Figure 5:

Step 501: Push the chip test head to move in the direction of the fingerprint chip to be tested by the first driving device until the chip test head is placed on the fingerprint chip to be tested.

In this embodiment, the position of each fingerprint chip to be tested may be set in advance according to the position of each chip test head, so that the optical sensing area of each fingerprint chip to be tested faces the hollow channel of the chip test head. In this way, when the chip test head moves to the fingerprint chip to be tested, the optical sensing area of the fingerprint chip to be tested falls within the range of the hollow channel package, thereby achieving the purpose of isolating the ambient light.

It is worth mentioning that during the process of pushing the chip test head by the first driving device, it is also ensured that the pilot voltage head located in the hollow channel is not pushed by the external force, and the bottom end of the housing of the chip test head There is a gap. In this way, when the chip test head moves to the fingerprint chip to be tested, that is, the chip test When the bottom end of the test case is in contact with the surface of the fingerprint chip, there is a gap between the conductive voltage head and the optical sensing area of the fingerprint chip to be tested, and a gap between the voltage guiding head, the inner wall of the housing and the fingerprint chip to be tested is formed. The sealed space of the ambient light is isolated, and the fingerprint chip to be tested should be shaped in an independent optical path in the sealed space to meet the requirements of optical performance testing.

Step 502: Collect first optical data and first fingerprint data of the fingerprint chip to be tested.

The first optical data is the optical data corresponding to the fingerprint chip to be tested in the case of isolating ambient light. The first fingerprint data is the fingerprint data corresponding to the fingerprint chip to be tested that is not pressed.

Step 503: Push the voltage guiding head to the surface of the fingerprint chip to be tested by the second driving device.

When the optical sensing area of the fingerprint chip to be tested is placed in the hollow channel, the voltage guiding head is moved in the direction of the fingerprint chip to be tested until the voltage guiding head is attached to the surface of the fingerprint chip to be tested. At this time, the optical sensing area of the fingerprint chip to be tested is blocked by the guiding voltage head, thereby achieving the purpose of shielding the light of the fingerprint chip to be tested, and satisfying the test of shading (which also blocks the chip itself based on the isolation of ambient light). It also satisfies the fingerprint press test.

Step 504: Collect second optical data and second fingerprint data of the fingerprint chip to be tested.

The second optical data is the optical data corresponding to the fingerprint chip to be tested in the case of isolating the ambient light and the self light. The second fingerprint data is the fingerprint data corresponding to when the fingerprint chip to be tested is pressed.

Step 505: Analyze the first optical data and the second optical data to obtain optical performance of the fingerprint chip to be tested; analyze the first fingerprint data and the second fingerprint data to obtain fingerprint detection performance of the fingerprint chip to be tested.

It is worth mentioning that after obtaining the first optical data, the second optical data, and the first fingerprint data and the second fingerprint data, the chip test head placed on the fingerprint chip can be removed by the first driving device.

Compared with the prior art, the present embodiment completes the optical performance test and the fingerprint detection performance test of the fingerprint chip at one station, thereby simplifying the flow of the fingerprint chip mass production test, and is beneficial to improving the efficiency of the mass production test. cut costs.

A person skilled in the art can understand that the above embodiments are specific embodiments of the present application, and various changes can be made in the form and details without departing from the spirit and scope of the application. range.

Claims

A chip test head, comprising: an opaque casing and an opaque pilot;

The casing is provided with a hollow passage through the bottom end of the casing, and the voltage guiding head is disposed in the hollow passage and is in close contact with the inner wall of the casing;

The pilot head moves toward the bottom end along the hollow passage when pressed to test the chip at the bottom end.
The chip test head of claim 1 wherein said pilot voltage head is an elastomer.
The chip test head according to claim 2, wherein the elastomer is a conductive rubber.
The chip test head according to claim 1, wherein the one of the conductive head toward the chip and the inner wall of the case are rough surfaces.
The chip test head according to claim 1, wherein a diffuse reflection film is attached to one side of the voltage guiding head toward the chip and the inner wall of the casing.
The chip test head according to claim 1, wherein a top end of the housing extends a skirt; and the skirt is provided with a plurality of mounting holes.
A chip testing device, comprising the chip test head according to any one of claims 1 to 6, a first driving mechanism connected to the housing of the chip test head and used to push the chip test head to move And a second driving mechanism connected to the voltage guiding head of the chip test head and used to push the guiding voltage head to move.
The chip testing device according to claim 7, wherein the first driving mechanism comprises a cross bar and a first driver connected to the cross bar;

The housing of the chip test head is fixed to the crossbar.
The chip test apparatus according to claim 8, wherein said first driver is a cylinder or a motor.
A method for testing a fingerprint chip, characterized in that the chip testing device of claim 7 is applied, the testing method comprising:

Pushing the chip test head in the direction of the fingerprint chip to be tested by the first driving device until the chip test head is placed on the fingerprint chip to be tested; wherein the optical sensing area of the fingerprint chip to be tested is located in the hollow channel And having a gap with the pilot voltage head;

Collecting first optical data and first fingerprint data of the fingerprint chip to be tested;

Pushing the voltage guiding head to the surface of the fingerprint chip to be tested by a second driving device;

Collecting second optical data and second fingerprint data of the fingerprint chip to be tested;

Analyzing the first optical data and the second optical data to obtain optical performance of the fingerprint chip to be tested; analyzing the first fingerprint data and the second fingerprint data to obtain fingerprint detection performance of the fingerprint chip to be tested .