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WO2018174904A1 - Procédés rf pulsés pour l'optimisation de mesures à onde entretenue (cw) - Google Patents

Procédés rf pulsés pour l'optimisation de mesures à onde entretenue (cw) Download PDF

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Publication number
WO2018174904A1
WO2018174904A1 PCT/US2017/024165 US2017024165W WO2018174904A1 WO 2018174904 A1 WO2018174904 A1 WO 2018174904A1 US 2017024165 W US2017024165 W US 2017024165W WO 2018174904 A1 WO2018174904 A1 WO 2018174904A1
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WO
WIPO (PCT)
Prior art keywords
optical
excitation
period
magneto
pulsed
Prior art date
Application number
PCT/US2017/024165
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English (en)
Inventor
Gregory Scott Bruce
Peter G. Kaup
Arul Manickam
Original Assignee
Lockheed Martin Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Priority to PCT/US2017/024165 priority Critical patent/WO2018174904A1/fr
Publication of WO2018174904A1 publication Critical patent/WO2018174904A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
    • G01R33/1284—Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/032—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
    • G01R33/323—Detection of MR without the use of RF or microwaves, e.g. force-detected MR, thermally detected MR, MR detection via electrical conductivity, optically detected MR

Definitions

  • the present disclosure generally relates to magnetic detection systems, and more particularly, to a magnetic detection system with pulsed RF methods for optimization of CW measurements.
  • Diamond Nitrogen Vacancies can be used to measure very small changes in magnetic fields when properly excited by radio frequency (RF) and optical fields.
  • Continuous wave (CW) excitation schemes require a delicate balance between the RF energy used to excite the DNVs and the laser power required to reset the diamond quantum state. This balance constrains the magnetometer sample bandwidth and sensitivity.
  • Traditional CW laser/CW RF excitation limits the bandwidth of the sensor to respond to changing RF and associated intensity levels, particularly for vector applications (e.g., magnetometry or communication) involving excitation of nitrogen vacancies (NVs) across multiple diamond lattice vectors and resonance states.
  • laser/pulsed RF excitation schemes if the timing jitter of the laser excitation after RF excitation is not sufficiently controlled or if the laser excitation ramp-up is not sufficiently consistent.
  • laser pulsing in a pure pulsed excitation scheme may create a more dynamic thermal equilibrium than continuous laser excitation which can introduce additional noise into system measurements.
  • AOM acousto-optic modulators
  • a fundamental challenge for both pulsed and CW common excitation schemes is the time imbalance of dimming (measurement contrast due to non-fluorescent inter-system crossing of [NV-] for resonant RF frequencies) versus brightening (re-polarization of [NV-] quantum states) of the excited diamond. Brightening is often in excess of 100 times slower a process than dimming.
  • dimming measured contrast due to non-fluorescent inter-system crossing of [NV-] for resonant RF frequencies
  • brightening re-polarization of [NV-] quantum states
  • a method for magnetic detection comprises (a) providing optical excitation to a magneto-optical defect center material using an optical light source, (b) providing pulsed radio frequency (RF) excitation to the magneto-optical defect center material using a pulsed RF excitation source, and (c) receiving an optical signal emitted by the magneto-optical defect center material using an optical detector, wherein the magneto-optical defect center material comprises a plurality of magneto-optical defect centers, and wherein (a) and (c) occur during (b).
  • RF radio frequency
  • the step of providing pulsed RF excitation comprises at least one pulse sequence, the at least one pulse sequence including at least one period of idle time followed by at least one period of RF pulse.
  • the at least one period of idle time comprises at least one period of reference collection time. According to some embodiments, the at least one period of reference collection time occurs during (a) and (c), but not during (b). According to some embodiments, the at least one period of RF pulse comprises at least one period of settling time and at least one period of collection time. According to some embodiments, the at least one pulse sequence is for a time ranging between 100 and 2000 ⁇ .
  • the at least one period of idle time is shorter than the at least one period of RF pulse.
  • the pulsed RF excitation occurs at a single frequency.
  • the at least one period of idle time is longer than the at least one period of RF pulse.
  • the pulsed RF excitation frequency is swept.
  • the method further comprises, following the step of receiving an optical signal, suppressing the optical detector and the pulsed RF source. According to some embodiments, the method further comprises repolarizing the optical light source to set the magneto-optical defect center material for subsequent measurement. According to some embodiments, the optical light source is continuously applied throughout the method for magnetic detection.
  • a system for magnetic detection comprises a controller configured to (a) provide optical excitation to a magneto-optical defect center material using an optical light source, (b) provide pulsed radio frequency (RF) excitation to the magneto- optical defect center material using a pulsed RF excitation source, and (c) receive an optical signal emitted by the magneto-optical defect center material using an optical detector, wherein the magneto-optical defect center material comprises a plurality of magneto-optical defect centers, and wherein (a) and (c) occur during (b).
  • RF radio frequency
  • FIG. 1 illustrates one orientation of a Nitrogen- Vacancy (NV) center in a diamond lattice.
  • NV Nitrogen- Vacancy
  • FIG. 2 illustrates an energy level diagram showing energy levels of spin states for the NV center.
  • FIG. 3 is a schematic diagram illustrating a NV center magnetic sensor system.
  • FIG. 4 is a graph illustrating the fluorescence as a function of an applied RF frequency of an NV center along a given direction for a zero magnetic field, and also for a magnetic field having a non-zero component along the NV axis.
  • FIG. 5A is a schematic illustrating a traditional Ramsey sequence of optical excitation pulses and RF excitation pulses.
  • FIG. 5B is a graph illustrating the fluorescence as a function of an applied RF frequency for four different NV center orientations for a non-zero magnetic field.
  • FIG. 6 is a schematic diagram illustrating some embodiments of a magnetic field detection system.
  • FIG. 7 illustrates a magneto-optical defect center material excitation scheme operating in CW Sit mode using a CW laser functioning throughout and a pulsed RF excitation source operating at a single frequency having a pulse repetition period of approximately 110 ⁇ .
  • FIG. 8 illustrates a magneto-optical defect center material excitation scheme operating in CW Sweep mode using a CW laser functioning throughout and a pulsed RF excitation source swept at different frequencies having a pulse repetition period of approximately
  • laser/optical excitation is applied for an extended period of time with no RF excitation to polarize (i.e. reset) the quantum state of the ensemble DNV system.
  • AOM acousto-optic modulator
  • a series of RF excitation pulses are applied to the diamond for a predetermined duration and having predetermined power and frequency to optimize DNV sensitivity.
  • the laser/optical excitation is restarted and a fluorescence measurement is captured to estimate magnetic field.
  • the laser polarization pulse and laser/optical excitation pulse (which leads to fluorescence measurement) are combined as a single, longer duration pulse between RF pulse sequences.
  • Common DNV Pulse techniques include Ramsey and Hahn Echo excitations.
  • the present disclosure describes a magnetic detection system having a laser operated in CW mode throughout and a pulsed RF excitation source operating only during fluorescence measurement periods. Pulsing the RF only during fluorescence measurement periods rather than maintaining a CW RF excitation source allows for RF-free laser time for faster quantum reset and thus, higher bandwidth measurements; higher RF peak power during bandwidth measurements to meet sensitivity objectives; and, an improved sensor C-SWAP by reducing RF duty cycle and supporting efficient implementation of a two-stage optical excitation scheme. Moreover, the RF pulsing methods disclosed herein also allow for shortening of the RF pulse width to optimize and balance the overall DNV system response.
  • a pulsed RF excitation source is described with respect to a diamond material with NV centers, or other magneto-optical defect center material.
  • the intensity of the RF field applied to the diamond material by the RF excitation source will depend on the power of the system circuit. Specifically, the power is proportional to the square of the intensity of the RF field applied. It is desirable to reduce the power of the system circuit while maintaining the RF field. By pulsing the RF excitation, the total RF energy required by the sensor system may be reduced, thus producing a more efficient sensor (having a lower power and thermal loading) while maintaining the high RF power during excitation and readout required for overall sensitivity.
  • the NV center in a diamond comprises a substitutional nitrogen atom in a lattice site adjacent a carbon vacancy as shown in FIG. 1.
  • the NV center may have four orientations, each corresponding to a different crystallographic orientation of the diamond lattice.
  • the NV center may exist in a neutral charge state or a negative charge state.
  • the neutral charge state uses the nomenclature NV°, while the negative charge state uses the nomenclature NV, which is adopted in this description.
  • the NV center has a number of electrons, including three unpaired electrons, each one from the vacancy to a respective of the three carbon atoms adjacent to the vacancy, and a pair of electrons between the nitrogen and the vacancy.
  • the NV center which is in the negatively charged state, also includes an extra electron.
  • the optical transitions between the ground state 3 A 2 and the excited triplet 3 E are predominantly spin conserving, meaning that the optical transitions are between initial and final states that have the same spin.
  • a photon of red light is emitted with a photon energy corresponding to the energy difference between the energy levels of the transitions.
  • NV Center or Magneto-Optical Defect Center, Magnetic Sensor System
  • the system 300 includes an optical excitation source 310, which directs optical excitation to an NV diamond material 320 with NV centers.
  • the system further includes an RF excitation source 330, which provides RF radiation to the NV diamond material 320. Light from the NV diamond may be directed through an optical filter 350 to an optical detector 340.
  • the RF excitation source 330 may be a microwave coil, for example.
  • the optical excitation source 310 may be a laser or a light emitting diode, for example, which emits light in the green (light having a wavelength such that the color is green), for example.
  • the optical excitation source 310 induces fluorescence in the red, which corresponds to an electronic transition from the excited state to the ground state.
  • Light from the NV diamond material 320 is directed through the optical filter 350 to filter out light in the excitation band (in the green, for example), and to pass light in the red fluorescence band, which in turn is detected by the detector 340.
  • the component Bz may be determined.
  • Optical excitation schemes other than continuous wave excitation are contemplated, such as excitation schemes involving pulsed optical excitation, and pulsed RF excitation.
  • pulsed excitation schemes include Ramsey pulse sequence, and spin echo pulse sequence.
  • the Ramsey pulse sequence is a pulsed RF-pulsed laser scheme that measures the free precession of the magnetic moment in the diamond material 320 with NV centers, and is a technique that quantum mechanically prepares and samples the electron spin state.
  • a first RF excitation pulse 520 (in the form of, for example, a microwave (MW) ⁇ /2 pulse) during a period 1.
  • the system is allowed to freely precess (and dephase) over a time period referred to as tau ( ⁇ ).
  • tau ( ⁇ ) During this free precession time period, the system measures the local magnetic field and serves as a coherent integration.
  • a second optical pulse 530 is applied to optically sample the system and a measurement basis is obtained by detecting the fluorescence intensity of the system.
  • the RF excitation pulses applied are provided at a given RF frequency, which correspond to a given NV center orientation.
  • the diamond material 320 will have NV centers aligned along directions of four different orientation classes.
  • FIG. 5B illustrates fluorescence as a function of RF frequency for the case where the diamond material 320 has NV centers aligned along directions of four different orientation classes.
  • the component Bz along each of the different orientations may be determined.
  • FIG. 3 illustrates an NV center magnetic sensor system 300 with NV diamond material 320 with a plurality of NV centers
  • the magnetic sensor system may instead employ a different magneto-optical defect center material, with a plurality of magneto- optical defect centers.
  • the electronic spin state energies of the magneto-optical defect centers shift with magnetic field, and the optical response, such as fluorescence, for the different spin states is not the same for all of the different spin states.
  • the magnetic field may be determined based on optical excitation, and possibly RF excitation, in a corresponding way to that described above with NV diamond material.
  • Magneto-optical defect center materials include but are not limited to diamonds, Silicon Carbide (SiC) and other materials with nitrogen, boron, or other chemical defect centers. Our references to diamond-nitrogen vacancies and diamonds are applicable to magneto-optical defect materials and variations thereof.
  • FIG. 6 is a schematic diagram of a system 600 for a magnetic field detection system according to some embodiments.
  • the system 600 includes an optical light source 610, which directs optical light to an NV diamond material 620 with NV centers, or another magneto-optical defect center material with magneto-optical defect centers.
  • An RF excitation source 630 provides RF radiation to the NV diamond material 620.
  • the system 600 may include a magnetic field generator 670 which generates a magnetic field, which may be detected at the NV diamond material 620, or the magnetic field generator 670 may be external to the system 600.
  • the magnetic field generator 670 may provide a biasing magnetic field.
  • the system 600 further includes a controller 680 arranged to receive a light detection signal from the optical detector 640 and to control the optical light source 610, the RF excitation source 630, and the magnetic field generator 670.
  • the controller may be a single controller, or multiple controllers. For a controller including multiple controllers, each of the controllers may perform different functions, such as controlling different components of the system 600.
  • the magnetic field generator 670 may be controlled by the controller 680 via an amplifier 660, for example.
  • the controller 680 is arranged to receive a light detection signal from the optical detector 640 and to control the optical light source 610, the RF excitation source 630, and the magnetic field generator 670.
  • the controller 680 may include a processor 682 and a memory 684, in order to control the operation of the optical light source 610, the RF excitation source 630, and the magnetic field generator 670.
  • the memory 684 which may include a nontransitory computer readable medium, may store instructions to allow the operation of the optical light source 610, the RF excitation source 630, and the magnetic field generator 670 to be controlled. That is, the controller 680 may be programmed to provide control.
  • a laser is operated in CW mode throughout.
  • an RF pulse at the relevant resonant frequency is applied to a diamond and the resulting fluorescence is measured by one or more photo detectors.
  • a short but sufficient time is provided to allow the RF pulse to interact with the relevant [NV-] electron spin state and affect the corresponding level of diamond fluorescence dimming.
  • both the RF excitation source and photo detector are suppressed, and the laser begins repolarization of the [NV-] quantum states to set the diamond system for the next measurement.
  • the normally competing RF/laser quantum drivers are simplified to allow only the laser repolarization, with a subsequent decrease in required time for full repolarization and, therefore, greater DNV CW magnetometry sample bandwidth.
  • FIG. 7 illustrates a magneto-optical defect center material excitation scheme operating in CW Sit mode using a CW laser functioning throughout and a pulsed RF excitation source operating at a single frequency having a pulse repetition period (i.e. pulse sequence) of approximately 110 ⁇ .
  • the CW Sit mode of collection at a fixed frequency does not preclude shifts between the different lattices, each of which would have a fixed RF excitation frequency.
  • a baseline CW Sweep was conducted prior to the CW Sit excitation scheme operation to select resonance frequencies and establish the relationship between fluorescence intensity and magnetic field for each diamond lattice and ⁇ 1 spin state. This relationship captures how a CW Sit excitation scheme-measured fluorescence intensity change for each lattice and spin state indicates a shift in the local baseline CW Sweep which, to first order, is proportional to a change in the external magnetic field.
  • the pulse sequence includes a period of idle time followed by a period of time for an RF pulse.
  • the idle time allows for repolarization of [NV-] electron spin states by light from the laser before the RF pulse.
  • the period of time for the RF pulse is greater than the period of idle time.
  • the period of time for the RF pulse may vary between approximately 56 and 109 ⁇ , or 60 and 105 ⁇ , or 65 ⁇ and 100 ⁇ , or 70 ⁇ and 95 ⁇ , or 75 ⁇ and 90 ⁇ , or 80 ⁇ and 85 ⁇ .
  • the period of time for the RF pulse may be about 80 ⁇ .
  • the period of idle time may vary between approximately 1 and 54 ⁇ , or 5 and 50 ⁇ , or 10 ⁇ and 45 ⁇ , or 15 ⁇ and 40 ⁇ , or 20 ⁇ and 35 ⁇ , or 25 ⁇ and 30 ⁇ . In some embodiments, the period of idle time may be about 30 ⁇ .
  • the period of idle time includes an optional period of time for reference collection with the RF pulse off.
  • a reference fluorescence may be measured prior to applying the RF pulse to the diamond at the relevant resonant frequency.
  • the reference collection measures the baseline intensity of fluorescence prior to RF excitation such that the net additional dimming due to the RF may be estimated by comparison with this reference (i.e. subtraction of the baseline fluorescence).
  • the reference collection allows measurement of the additional dimming caused by excitation of the new set of [NV] along the next diamond lattice.
  • the period of time for reference collection may vary between 1 ⁇ and 20 ⁇ . In some embodiments, the period of time for reference collection may be about 5 ⁇ . In some embodiments, the period of time for reference collection may vary proportionally with the period of idle time (i.e. longer periods of idle time having longer periods of time for reference collection).
  • the period of time for the RF pulse includes a period of settling time followed by a period of time for fluorescence measurement (i.e. collection time).
  • a period of time for fluorescence measurement i.e. collection time.
  • This period of time for fluorescence measurement may vary between 56 ⁇ and 95 ⁇ , or 60 ⁇ and 90 ⁇ , or 65 ⁇ and 85 ⁇ , or 70 ⁇ and 80 ⁇ . In some embodiments, the period of time for fluorescence measurement may be about 60 ⁇ .
  • FIG. 8 illustrates a magneto-optical defect center material excitation scheme operating in CW Sweep mode using a CW laser functioning throughout and a pulsed RF excitation source swept at different frequencies having a pulse repetition period of approximately 1100 ⁇ .
  • the pulse sequence includes a period of idle time followed by a period of time for an RF pulse.
  • the period of idle time is greater than the period of time for the RF pulse.
  • the period of time for the RF pulse may vary between approximately 1 and 549 ⁇ , or 25 and 525 ⁇ , or 50 ⁇ and 500 ⁇ , or 75 ⁇ and 475 ⁇ , or 100 ⁇ and 450 ⁇ , or 125 ⁇ and 425 ⁇ , or 150 ⁇ and 400 ⁇ , or 175 ⁇ and 375 ⁇ , or 200 ⁇ and 350 ⁇ , or 225 ⁇ and 325 ⁇ , or 250 ⁇ and 300 ⁇ . In some embodiments, the period of time for the RF pulse may be about 100 ⁇ .
  • the period of idle time may vary between approximately 551 ⁇ and 1099 ⁇ , or 575 ⁇ and 1075 ⁇ , or 600 ⁇ and 1050 ⁇ , or 625 ⁇ and 1025 ⁇ , or 650 ⁇ and 1000 ⁇ , or 675 ⁇ and 975 ⁇ , or 700 ⁇ and 950 ⁇ , or 725 ⁇ and 925 ⁇ , or 750 ⁇ and 900 ⁇ , or 775 ⁇ and 875 ⁇ , or 800 ⁇ and 850 ⁇ . In some embodiments, the period of idle time may be about
  • the period of idle time includes an optional period of time for reference collection with the RF pulse off. In some embodiments, this period of time for reference collection may vary between 1 ⁇ and 20 ⁇ . In some embodiments, the period of time for reference collection may be about 5 ⁇ . In some embodiments, the period of time for reference collection may vary proportionally with the period of idle time (i.e. longer periods of idle time having longer periods of time for reference collection). In some embodiments, the period of time for the RF pulse includes a period of settling time followed by a period of time for fluorescence measurement (i.e. collection time). This period of time for fluorescence
  • the period of time for fluorescence measurement may be about 60 ⁇ .
  • the pulsed RF method together with CW laser excitation, provides improved sample bandwidth over traditional CW DNV excitation while maintaining the sensitivity of the traditional methods.
  • the reduction in RF duty cycle requires less power and creates less thermal drive on the diamond sensor. This reduction in duty cycle offers greater flexibility for practical sensor design trades.
  • the pulsed CW method allows for increasing bandwidth without increasing both the RF and laser power. In combination with reduced power usage, these trade spaces support an improved overall sensor C-SWAP. This improved C-SWAP increases implementation of efficient DNV magnetometry sensors.
  • the proposed solution is also compatible with high power-low duty cycle laser repolarization techniques to support faster sampling and increased sample bandwidth for vector magnetometry and/or thermally compensated multi-lattice excitation techniques.

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

L'invention concerne un procédé de détection magnétique comprenant (a) l'excitation optique d'un matériau à centres de défaut magnéto-optique à l'aide d'une source de lumière optique, (b) l'excitation radiofréquence (RF) pulsée du matériau à centres de défaut magnéto-optique à l'aide d'une source d'excitation RF pulsée et (c) la réception d'un signal optique émis par le matériau à centres de défaut magnéto-optique à l'aide d'un détecteur optique, de telle sorte que le matériau à centres de défaut magnéto-optique comprend une pluralité de centres de défaut magnéto-optique et que (a) et (c) se produisent pendant (b).
PCT/US2017/024165 2017-03-24 2017-03-24 Procédés rf pulsés pour l'optimisation de mesures à onde entretenue (cw) WO2018174904A1 (fr)

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Application Number Priority Date Filing Date Title
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160146904A1 (en) * 2014-09-25 2016-05-26 Lockheed Martin Corporation Micro-dnv device
US20160216341A1 (en) * 2015-01-23 2016-07-28 Lockheed Martin Corporation Dnv magnetic field detector
US20160231394A1 (en) * 2015-02-04 2016-08-11 Lockheed Martin Corporation Apparatus and method for estimating absolute axes' orientations for a magnetic detection system
US9557391B2 (en) * 2015-01-23 2017-01-31 Lockheed Martin Corporation Apparatus and method for high sensitivity magnetometry measurement and signal processing in a magnetic detection system

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160146904A1 (en) * 2014-09-25 2016-05-26 Lockheed Martin Corporation Micro-dnv device
US20160216341A1 (en) * 2015-01-23 2016-07-28 Lockheed Martin Corporation Dnv magnetic field detector
US9557391B2 (en) * 2015-01-23 2017-01-31 Lockheed Martin Corporation Apparatus and method for high sensitivity magnetometry measurement and signal processing in a magnetic detection system
US20160231394A1 (en) * 2015-02-04 2016-08-11 Lockheed Martin Corporation Apparatus and method for estimating absolute axes' orientations for a magnetic detection system

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