WO2014065843A2

WO2014065843A2 - Quick connection of multiple interfaces using multi-pin cable and connectors to support high-volume testing of devices with a plurality of interfaces

Info

Publication number: WO2014065843A2
Application number: PCT/US2013/000244
Authority: WO
Original assignee: Promptlink Communications, Inc.
Priority date: 2012-10-27
Filing date: 2013-10-26
Publication date: 2014-05-01
Also published as: WO2014065843A3

Abstract

A variety of device interfaces may be connected to a test platform in a fast and efficient manner using multi-pin cables and connectors to support high-volume processing of devices to be tested. The multi-pin cables and connectors may aggregate a plurality of specific device interfaces into a single cable that can be connected via a connector to a test shelf and via a connector to a test platform, reducing the time to setup for device testing and facilitating high-volume processing of devices to be tested.

Description

QUICK CONNECTION OF MULTIPLE INTERFACES USING MULTI-PIN CABLE AND CONNECTORS TO SUPPORT HIGH-VOLUME TESTING OF DEVICES WITH A PLURALITY

OF INTERFACES

TECHNICAL FIELD

[0001] This disclosure relates generally to electronic device testing. More particularly, the disclosure relates to interfaces for electronic device testing. The present application also claims priority from U.S. Provisional Patent Application Serial No. 61/795,857 filed on 10/27/2012, entitled "Quick Connection of Multiple Interfaces using Multi-Pin Cable and Connectors to Support High- Volume Testing of Devices with a Plurality of Interfaces," the entire disclosure of which is herein incorporated by reference.

BACKGROUND

[0002] Service providers, such as communications, connectivity, and content service providers, provide multimedia services, such as video, audio, telephony, data

communications, wireless networking and related services to their subscribers by deploying devices at their customers' premises, and then connecting this equipment to the service provider's network and infrastructure. The deployed devices are generally called Customer Premise Equipment (CPE). For example, cable companies, more commonly known as multiple system operators (MSOs), deliver their service to customers by connecting a device, such as a set-top box or a cable modem, to their network, and this CPE device acts as the service delivery mechanism for the subscriber.

[0003] Service providers purchase millions of CPE devices each year to use for delivering their subscription services to their customers. The devices can be TV set-top boxes, cable modems, Embedded Multimedia Terminal Adapters (EMTAs), wireless gateways, DSL modems, or devices that combine any of these and other capabilities in an integrated package. These and other devices are growing more complex as service providers aim to deliver more valuable services.

[0004] Service providers face an operational issue of managing their stock of new and used CPE devices and maximizing the investment in these CPE devices. Thousands of

l CPE devices must be tested on a daily basis. This issue is referred to as a High-Volume Device Testing [HVDT] issue.

[0005] To cost-effectively perform thousands of CPE device testing processes, the testing platform may limit the amount of time needed to connect multiple device interfaces to the test system. The testing platform is assumed to be a scarce or limited resource, while a high volume of devices will be processed in a workflow that connects a single device or small number of devices, then tests the connected device(s), then disconnects them, and finally directs the device(s) to their final disposition, such as return to service usage, delivery to a repair facility, or disposal. While this tested-device final disposition is occurring, the test platform may be reused for testing the next device(s). Test harnesses and test platforms that can reduce the time of these repeated processes will perform better, and cost less.

[0006] Thus, there is a need for connecting a variety of device interfaces to a test platform in a fast and easy manner in order to support high-volume processing of devices to be tested, to maximize the use of the limited test system.

[0007] In addition, considering that test systems perform thousands of connections and disconnections, which is far from the standard design or use-case of physical interface connectors, there is a need for making the connection and disconnection process reliable and maintainable over the course of hundreds of thousands of cycles of connection and disconnection, so that test systems with overused interfaces do not lose their accuracy and generate false test results that relate to faulty interfaces.

SUMMARY OF THE DISCLOSURE

[0008] According to the disclosed subject matter, a variety of device interfaces may be connected to a test platform in a fast and efficient manner using multi-pin cables and connectors to support high-volume processing of devices to be tested. The multi-pin cables and connectors may aggregate a plurality of specific device interfaces into a single cable that can be connected via a single connector to a test shelf and via a single connector to a test platform, reducing the time to setup for device testing and facilitating high-volume processing of devices to be tested. [0009] A method of connecting a plurality of wiring interfaces to a test platform for conducting operational testing of a customer premise equipment (CPE) device may involve connecting the plurality of wiring interfaces to a first connector interface and using a cable to connect the first connector interface to a corresponding second connector interface of the test platform.

[0010] A method of testing a plurality of CPE devices having respective wiring interfaces may involve connecting the respective wiring interfaces of the plurality of CPE devices to corresponding first connector interfaces of a testing apparatus and using cables to connect the first connector interfaces of the testing apparatus to corresponding second connector interfaces of a plurality of test platforms.

[0011] A testing apparatus may comprise a rolling rack comprising a test shelf. This helps leverages the quick connect single connector and incorporates connectors embedded in a test shelf, or a plurality of test shelves.

BRIEF DESCRIPTION OF THE DRAWINGS

[0012] A more detailed understanding may be had from the following description, given by way of example in conjunction with the accompanying drawings, in which:

[0013] Figure 1 is a diagram depicting an example of HDMI cable and connectors for connecting multiple interfaces according to the disclosed subject matter;

[0014] Figure 2 is a block diagram illustrating connection of a device to a test system; and

[0015] Figure 3 is a diagram illustrating connection of a device to a rolling rack.

[0016] Figure 4 is a diagram illustrating the quick connect cables for connecting the

CPE devices to the test shelf and a quick connect cable to connect the test shelf to the test system.

DETAILED DESCRIPTION

[0017] The disclosed subject matter is described with specificity to meet statutory requirements. However, the description itself is not intended to limit the scope of this patent Rather, it is contemplated that the claimed subject matter might also be embodied in other ways, to include different steps or combinations of steps similar to the ones described in this document, in conjunction with other present or future technologies.

[0018] According to the disclosed subject matter, a variety of device interfaces may be connected to a test platform in a fast an efficient manner using multi-pin cables and connectors to support high-volume processing of devices to be tested.

[0019] The multi-pin cables and connectors, such as High-Definition Multimedia Interface (HDMI), military specification (mil-spec), or telecommunications company (Telco) cables and connectors, may aggregate a plurality of specific device interfaces into a single cable that can be connected via one connector to a test shelf and via one connector to a test platform, thereby reducing the time needed to setup for device testing. This may facilitate high-volume processing of devices to be tested.

[0020] The multi-pin cables and connectors may be capable of passing a variety of analog and/or digital signals between a test platform and devices to be tested. These analog and/or digital signals, including, but not limited to, audio, video, telephony, radio frequency (RF), direct current (DC) power, Ethernet digital electrical and infrared controller electrical signals, and/or other signals, may be carried by the multi-pin cable and connector in parallel, such that a single connection at each end of the cable may complete the circuit and may allow the test platform to test the device.

[0021] In addition to reducing the time involved in connecting devices, the quick- connect connectors disclosed herein may use significantly less manual effort to make a connection, potentially leading to higher operational life of the interface connectors, and a better operational stage profile for the life cycle of hundreds of thousands of connections with a test system and devices.

[0022] The quick-connect connectors disclosed herein may reduce or eliminate idle time of the scarce resource test platform by supporting connection of a number of interfaces into one aggregate quick-connect interface with all of the manual work performed away from the test platform. Once connected in this manner, the device can be connected to the test platform rapidly using two quick-connect interface connections.

[0023] Referring now to the drawings, Figure 1 illustrates a multi-pin cable 100 that can be used to interconnect multiple audio, video, and other interfaces. An HDMI cable 102 having an HDMI connector 104 may interconnect a test platform (not shown in Figure 1) with an S-Video interface, a component video interface, a composite video interface, two separate stereo analog audio interfaces, two digital audio interfaces, an infrared control interface, and/or an interface for an RJ-11 phone interface for a Telco return. Another HDMI cable 106 having an HDMI connector 108 may connect a device to be tested (not shown in Figure 1) with similar or different interfaces as the interfaces in the HDMI cable 102. The multi-pin cable 100 may have HDMI connectors 110 and 112 that may be used to connect to the connectors 104 and 108 of the cables 102 and 106, respectively. In this way, a connection can be established between the HDMI cable 102 and the HDMI cable 106, and thus between the test platform and the device to be tested.

[002 ] Figure 2 is a block diagram illustrating the connection of a Customer Premise

Equipment (CPE) device 200 to a test system 202. The CPE device 200 may include a number of interfaces 204, including, but not limited to, an S-Video interface, a component video interface, a composite video interface, two separate stereo analog audio interfaces, two digital audio interfaces, an infrared control interface, and/or an interface for an RJ-11 phone interface for a Telco return. These interfaces 204 may be aggregated at a single interface 206, such as an HDMI interface. It will be appreciated that other interface types may be used to aggregate the interfaces 204.

[0025] The test system 202 may also include a number of interfaces (not shown in Figure 2), including, but not limited to, an S-Video interface, a component video interface, a composite video interface, two separate stereo analog audio interfaces, two digital audio interfaces, an infrared control interface, and/or an interface for an RJ-11 phone interface for a Telco return. These interfaces may be aggregated at a single interface 208, such as an HDMI interface. It will be appreciated that other interface types may be used to aggregate the interfaces of the test system 202.

[0026] As shown in Figure 2, a quick-connect cable 210 may terminate in connectors

212 and 214 that are compatible with the interfaces 206 and 208. For example, the quick- connect cable 210 may terminate in HDMI connectors. It will be appreciated that the quick- connect cable 210 may terminate in a connector of a different type at either or both ends for compatibility with other types of interfaces 206 and 208. The use of HDMI cables and connectors may promote reduction of signal interference and may promote compatibility with a wide variety of interfaces. The use of HDMI cables and connectors may also promote reduced manufacturing costs relative to proprietary connector types.

[0027] Using the quick-connect cable 210 to connect content CPE devices 200, such as TV set-top boxes, cable modems, Embedded Multimedia Terminal Adapters (EMTAs), wireless gateways, DSL modems, or devices that combine any of these and other

capabilities in an integrated package, each of which may make use of a plurality of interfaces, to the test system 202, may be significantly easier and faster than using individual connections of the individual interfaces. For example, considering a CPE device that employs a component video interface, the number of connections that are to be made manually may be reduced from five to one.

[0028] The quick-connect cable 210 is easy to insert, high quality, robust, and designed for multiple or repeated insertion. Accordingly, insertion of the quick-connect cable 210 involves less manual effort to establish a connection relative to some

conventional cables. The interface connectors may have a higher operational life than some conventional connectors and may have a better operational usage profile for the life cycle of hundreds of thousands of connections with the test system 202 and CPE devices.

[0029] HDMI cables and connectors may be readily replaced when they wear out, promoting a longer operational life for high-volume device testing systems.

[0030] The multi-pin quick-connect cables and connectors disclosed herein support a process that may reduce or eliminate idle time of the scarce resource test platform. The quick-connect cables and connectors may support connection of multiple interfaces into a single aggregate quick-connect cable. The quick-connect cables and connectors disclosed herein may support performing the manual work of connecting device interfaces to the quick-connect cable away from the test platform. When the device interfaces are connected to the quick-connect cable, to begin testing, the quick-connect cable may be rapidly connected to the test platform. This quick connection may significantly reduce the idle time of the test platform.

[0031] Figure 3 illustrates an example rolling rack 300 according to the disclosed subject matter. The rolling rack 300 includes a number of test shelves 302, each of which can support a Customer Premise Equipment (CPE) device 304, one of which is depicted in Figure 3. The test shelves 302 may have interfaces along respective first edges 306 for connecting to interfaces of the CPE device 304. Respective cables, such as the HDMI cable 102 or the HDMI cable 106 of Figure 1, may run, for example, inside or underneath each test shelf 302 and terminate in respective HDMI connectors 308 along respective second edges 310 of each test shelf 302. Quick-connect cables 312 may be used to connect the HDMI connectors 308 to corresponding HDMI connectors 314 on a test system 316.

[0032] The connections from the CPE device 304 to the rolling rack 300 can be made away from the test system 316. HDMI cables and connectors can be used to connect the CPE device 304 installed on the rolling rack 300 to the high-volume device testing system 316 easily.

[0033] Figure 4 illustrates an example of a test shelf 402 according to the disclosed subject matter. Each test shelf is connected to a quick connect cable 401 to a CPE device to be tested 400. The test shelf 402 is also connected to the test system 404 with a second quick connect cable 403. The overall quick connection system will significantly reduce the idle time of the test platform(s).

[0034] As demonstrated by the foregoing discussion, the disclosed subject matter may provide certain advantages, particularly in the context of high-volume testing. The multi-pin cables and connectors disclosed herein may aggregate a plurality of specific device interfaces into a single cable that can be connected via one connector to a test shelf and via one connector to a test platform. This may reduce the time needed to setup for device testing and facilitate high-volume processing of devices to be tested.

[0035] It will be understood by those who practice the disclosed subject matter and those skilled in the art that various modifications and improvements may be made without departing from the spirit and scope of the disclosed subject matter. The scope of protection afforded is to be determined solely by the claims and by the breadth of interpretation allowed by law.

Claims

Claims What is claimed is:

1. A method of connecting a plurality of wiring interfaces to a test platform for conducting operational testing of a customer premise equipment (CPE) device, the method comprising:

connecting the plurality of wiring interfaces to a first connector interface; and using a cable to connect the first connector interface to a corresponding second connector interface of the test platform.

2. The method of claim 1, wherein the first connector interface comprises a High Definition Multimedia Interface (HDMI).

3. The method of claim 1, wherein the plurality of wiring interfaces comprises at least one of an S-Video interface, a component video interface, a composite video interface, a stereo analog audio interface, a digital audio interface, an infrared control interface, or an RJ-11 phone interface.

4. A method of testing a plurality of customer premise equipment (CPE) devices having respective wiring interfaces, the method comprising:

connecting the respective wiring interfaces of the plurality of CPE devices to corresponding first connector interfaces of a testing apparatus;

using cables to connect the first connector interfaces of the testing apparatus to corresponding second connector interfaces of a plurality of test platforms.

5. The method of claim 4, wherein the first connector interface comprises a High Definition Multimedia Interface (HDMI).

6. The method of claim 4, wherein the plurality of wiring interfaces comprises at least one of an S-Video interface, a component video interface, a composite video interface, a stereo analog audio interface, a digital audio interface, an infrared control interface, or an RJ-11 phone interface.

7. The method of claim 4, further comprising:

disconnecting the first connector interfaces of the testing apparatus from the corresponding second connector interfaces;

disconnecting the respective wiring interfaces of the plurality of CPE devices from the first connector interfaces;

connecting respective wiring interfaces of a plurality of second CPE devices to the first connector interfaces; and

connecting the first connector interfaces of the testing apparatus to the

corresponding second connector interfaces.

8. A testing apparatus comprising:

a rack comprising a shelf;

a plurality of first connector interfaces located on a first edge of the shelf;

a second connector interface located on a second edge of the shelf; and

a cable electrically connecting the plurality of first connector interfaces with the second connector interface.

9. The testing apparatus of claim 8, wherein the second connector interface comprises a High Definition Multimedia Interface (HDMI).

10. The testing apparatus of claim 8, wherein the plurality of first connector interfaces comprises at least one of an S-Video interface, a component video interface, a composite video interface, a stereo analog audio interface, a digital audio interface, an infrared control interface, or an RJ-11 phone interface.

11. The testing apparatus of claim 8, the rack further comprising a plurality of shelves.