WO2013010864A3 - Device and method for determining the vapour pressure of a starting substance vaporized in a carrier gas stream - Google Patents
Device and method for determining the vapour pressure of a starting substance vaporized in a carrier gas stream Download PDFInfo
- Publication number
- WO2013010864A3 WO2013010864A3 PCT/EP2012/063539 EP2012063539W WO2013010864A3 WO 2013010864 A3 WO2013010864 A3 WO 2013010864A3 EP 2012063539 W EP2012063539 W EP 2012063539W WO 2013010864 A3 WO2013010864 A3 WO 2013010864A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- gas stream
- carrier gas
- starting substance
- determining
- vapour
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4486—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by producing an aerosol and subsequent evaporation of the droplets or particles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
- G01F1/68—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
- G01F1/684—Structural arrangements; Mounting of elements, e.g. in relation to fluid flow
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
- G01F1/68—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
- G01F1/696—Circuits therefor, e.g. constant-current flow meters
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Fluid Mechanics (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Dispersion Chemistry (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Chemical Vapour Deposition (AREA)
- Feeding, Discharge, Calcimining, Fusing, And Gas-Generation Devices (AREA)
Abstract
The invention relates to a method for producing a vapour, transported in a carrier gas, of a solid or liquid starting substance, comprising the steps of: heating a vaporizer (8), having an inlet opening (7) and an outlet opening (9); feeding an input gas stream, comprising a carrier gas, through the inlet opening (7) into the vaporizer (8); vaporizing the solid or liquid starting substance within the vaporizer (8); transporting the vapour produced in this way together with the carrier gas as an output gas stream through the outlet opening (9); determining a first value, assigned to the mass flow of the carrier gas in the input gas stream, by means of a first sensor (2); determining a second value, influenced both by the mass flow or partial pressure of the carrier gas and by the mass flow or partial pressure of the vapour in the output gas stream, by a second sensor (10); calculating the value corresponding to the partial pressure of the vapour transported in the output gas stream by establishing a relationship between the values determined by means of the two sensors (2, 10). The invention additionally relates to a device for vaporizing a liquid or solid starting substance in a heatable vaporizer.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102011051931A DE102011051931A1 (en) | 2011-07-19 | 2011-07-19 | Apparatus and method for determining the vapor pressure of a starting material vaporized in a carrier gas stream |
DE102011051931.9 | 2011-07-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2013010864A2 WO2013010864A2 (en) | 2013-01-24 |
WO2013010864A3 true WO2013010864A3 (en) | 2013-11-07 |
Family
ID=46513756
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2012/063539 WO2013010864A2 (en) | 2011-07-19 | 2012-07-11 | Device and method for determining the vapour pressure of a starting substance vaporized in a carrier gas stream |
Country Status (3)
Country | Link |
---|---|
DE (1) | DE102011051931A1 (en) |
TW (1) | TW201307606A (en) |
WO (1) | WO2013010864A2 (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6142629B2 (en) * | 2013-03-29 | 2017-06-07 | 東京エレクトロン株式会社 | Source gas supply apparatus, film forming apparatus, and source gas supply method |
DE102013106863A1 (en) | 2013-07-01 | 2015-01-08 | Aixtron Se | Device for determining the mass flow of a vapor transported in a carrier gas |
CN103528630B (en) * | 2013-10-16 | 2016-06-08 | 国家电网公司 | The method of calculation of high pressure reject steam spillage and attemperation water flow |
DE102014101792A1 (en) | 2014-02-13 | 2015-08-13 | Aixtron Se | Device for determining the mass flow of a gas or gas mixture with nested tubular filament arrangements |
DE102014101971A1 (en) * | 2014-02-17 | 2015-08-20 | Aixtron Se | Magnetic method for determining a vapor concentration and apparatus for carrying out the method |
DE102014102484A1 (en) | 2014-02-26 | 2015-08-27 | Aixtron Se | Use of a QCM sensor to determine the vapor concentration in the OVPD process or in an OVPD coating system |
DE102015104240A1 (en) | 2015-03-20 | 2016-09-22 | Aixtron Se | By heating to be cleaned QCM sensor and its use in an OVPD coating system |
DE102015105404A1 (en) | 2015-04-09 | 2016-10-27 | Aixtron Se | Apparatus and method for determining the concentration or partial pressure of a vapor having magnetic properties |
US9960009B2 (en) * | 2015-07-17 | 2018-05-01 | Lam Research Corporation | Methods and systems for determining a fault in a gas heater channel |
DE102017123233A1 (en) | 2017-10-06 | 2019-04-11 | Aixtron Se | Apparatus and method for generating a vapor transported in a carrier gas |
DE102017126126A1 (en) * | 2017-11-08 | 2019-05-09 | Aixtron Se | Method and device for generating a vapor by the use of control data obtained in a control mode |
US10914717B2 (en) * | 2018-05-09 | 2021-02-09 | Mks Instruments, Inc. | Method and apparatus for partial pressure detection |
Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3650151A (en) * | 1970-11-18 | 1972-03-21 | Tylan Corp | Fluid flow measuring system |
US4341107A (en) * | 1980-10-14 | 1982-07-27 | Tylan Corporation | Calibratable system for measuring fluid flow |
US4363238A (en) * | 1979-08-16 | 1982-12-14 | Franz Willam | Device for measuring the breath of patients |
EP0370311A2 (en) * | 1988-11-23 | 1990-05-30 | Applied Materials, Inc. | Chemical vapor deposition system and reactant delivery section therefor |
US4996876A (en) * | 1988-12-16 | 1991-03-05 | Leybold Aktiengesellschaft | Microrheoscopic detector for gas flows |
US5000039A (en) * | 1989-11-21 | 1991-03-19 | Siemens-Bendix Automotive Electronics L.P. | Mass air flow integrator |
US5820678A (en) * | 1997-05-30 | 1998-10-13 | The Regents Of The University Of California | Solid source MOCVD system |
US20050147749A1 (en) * | 2004-01-05 | 2005-07-07 | Msp Corporation | High-performance vaporizer for liquid-precursor and multi-liquid-precursor vaporization in semiconductor thin film deposition |
US20060115589A1 (en) * | 2004-11-29 | 2006-06-01 | Tokyo Electron Limited | Method and system for measuring a flow rate in a solid precursor delivery system |
US7238389B2 (en) * | 2004-03-22 | 2007-07-03 | Eastman Kodak Company | Vaporizing fluidized organic materials |
DE102006026576A1 (en) * | 2006-06-06 | 2008-01-10 | Aixtron Ag | Apparatus and method for evaporating a powdery organic starting material |
US7322248B1 (en) * | 2006-08-29 | 2008-01-29 | Eastman Kodak Company | Pressure gauge for organic materials |
EP2034047A1 (en) * | 2006-06-27 | 2009-03-11 | Fujikin Incorporated | Vaporizer/supplier of material and automatic pressure regulator for use therein |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3680377A (en) | 1970-08-17 | 1972-08-01 | Hewlett Packard Co | Fluid flow meter |
US4885211A (en) | 1987-02-11 | 1989-12-05 | Eastman Kodak Company | Electroluminescent device with improved cathode |
US4769292A (en) | 1987-03-02 | 1988-09-06 | Eastman Kodak Company | Electroluminescent device with modified thin film luminescent zone |
US4961348A (en) * | 1988-12-16 | 1990-10-09 | Ulrich Bonne | Flowmeter fluid composition correction |
GB8903744D0 (en) * | 1989-02-18 | 1989-04-05 | Endress & Hauser Ltd | Flowmeter |
JPH0795527B2 (en) * | 1991-02-05 | 1995-10-11 | 株式会社リンテック | Vaporizer for liquid raw materials |
US5288325A (en) * | 1991-03-29 | 1994-02-22 | Nec Corporation | Chemical vapor deposition apparatus |
US7501152B2 (en) | 2004-09-21 | 2009-03-10 | Eastman Kodak Company | Delivering particulate material to a vaporization zone |
US7000463B1 (en) | 2004-11-12 | 2006-02-21 | Mks Instruments, Inc. | Reynolds number correction function for mass flow rate sensor |
US8027574B2 (en) | 2007-08-06 | 2011-09-27 | Global Oled Technology Llc | Vaporization of thermally sensitive materials |
DE102007062977B4 (en) * | 2007-12-21 | 2018-07-19 | Schott Ag | Process for the production of process gases for the vapor phase separation |
-
2011
- 2011-07-19 DE DE102011051931A patent/DE102011051931A1/en not_active Withdrawn
-
2012
- 2012-07-11 WO PCT/EP2012/063539 patent/WO2013010864A2/en active Application Filing
- 2012-07-17 TW TW101125676A patent/TW201307606A/en unknown
Patent Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3650151A (en) * | 1970-11-18 | 1972-03-21 | Tylan Corp | Fluid flow measuring system |
US4363238A (en) * | 1979-08-16 | 1982-12-14 | Franz Willam | Device for measuring the breath of patients |
US4341107A (en) * | 1980-10-14 | 1982-07-27 | Tylan Corporation | Calibratable system for measuring fluid flow |
EP0370311A2 (en) * | 1988-11-23 | 1990-05-30 | Applied Materials, Inc. | Chemical vapor deposition system and reactant delivery section therefor |
US4996876A (en) * | 1988-12-16 | 1991-03-05 | Leybold Aktiengesellschaft | Microrheoscopic detector for gas flows |
US5000039A (en) * | 1989-11-21 | 1991-03-19 | Siemens-Bendix Automotive Electronics L.P. | Mass air flow integrator |
US5820678A (en) * | 1997-05-30 | 1998-10-13 | The Regents Of The University Of California | Solid source MOCVD system |
US20050147749A1 (en) * | 2004-01-05 | 2005-07-07 | Msp Corporation | High-performance vaporizer for liquid-precursor and multi-liquid-precursor vaporization in semiconductor thin film deposition |
US7238389B2 (en) * | 2004-03-22 | 2007-07-03 | Eastman Kodak Company | Vaporizing fluidized organic materials |
US20060115589A1 (en) * | 2004-11-29 | 2006-06-01 | Tokyo Electron Limited | Method and system for measuring a flow rate in a solid precursor delivery system |
DE102006026576A1 (en) * | 2006-06-06 | 2008-01-10 | Aixtron Ag | Apparatus and method for evaporating a powdery organic starting material |
EP2034047A1 (en) * | 2006-06-27 | 2009-03-11 | Fujikin Incorporated | Vaporizer/supplier of material and automatic pressure regulator for use therein |
US7322248B1 (en) * | 2006-08-29 | 2008-01-29 | Eastman Kodak Company | Pressure gauge for organic materials |
Also Published As
Publication number | Publication date |
---|---|
WO2013010864A2 (en) | 2013-01-24 |
TW201307606A (en) | 2013-02-16 |
DE102011051931A1 (en) | 2013-01-24 |
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