WO2011078350A1 - 撮像装置 - Google Patents
撮像装置 Download PDFInfo
- Publication number
- WO2011078350A1 WO2011078350A1 PCT/JP2010/073404 JP2010073404W WO2011078350A1 WO 2011078350 A1 WO2011078350 A1 WO 2011078350A1 JP 2010073404 W JP2010073404 W JP 2010073404W WO 2011078350 A1 WO2011078350 A1 WO 2011078350A1
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- WIPO (PCT)
- Prior art keywords
- frame body
- circuit board
- frame
- imaging device
- imaging
- Prior art date
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/50—Constructional details
- H04N23/54—Mounting of pick-up tubes, electronic image sensors, deviation or focusing coils
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/50—Constructional details
- H04N23/55—Optical parts specially adapted for electronic image sensors; Mounting thereof
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/57—Mechanical or electrical details of cameras or camera modules specially adapted for being embedded in other devices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/804—Containers or encapsulations
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0555—Shape
- H01L2224/05552—Shape in top view
- H01L2224/05554—Shape in top view being square
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49175—Parallel arrangements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
Definitions
- the present invention relates to an imaging apparatus using an imaging element such as a CCD (Charge Coupled Device) type or a CMOS (Complementary Metal Oxide Semiconductor) type.
- an imaging element such as a CCD (Charge Coupled Device) type or a CMOS (Complementary Metal Oxide Semiconductor) type.
- an imaging apparatus that is applied to a digital camera, an optical sensor, or the like in which an imaging element such as a CCD type or a CMOS type is mounted on a wiring board is known.
- an imaging element is mounted on a wiring board, a lens is disposed on the imaging element by a lens fixing member, and the imaging element is sealed by the lens and the lens fixing member.
- Electronic components such as capacitors and resistors are mounted around the image sensor.
- an imaging device converts the light (image) input into the light-receiving part of the image pick-up element mounted in the wiring board into an electrical signal with an image pick-up element, and connects a connection member, such as a bonding wire, and the wiring conductor of a wiring board And it outputs to the external circuit etc. in a digital camera via an external terminal.
- the imaging device is disposed so as to close the recess on the upper surface of the wiring substrate, and the recess is formed on the upper surface of the wiring substrate.
- a device having a plurality of electronic components such as an IC, a capacitor, a coil, and a resistor for processing an electric signal from the image sensor on the bottom surface is known (for example, see Patent Document 1).
- an imaging device in which a concave portion is provided on the lower surface of the wiring board and a plurality of electronic components such as an IC, a capacitor, a coil, and a resistor are mounted in the concave portion to process an electrical signal from the imaging element for example, , See Patent Document 2.
- Such a wiring board in an imaging device is manufactured using an insulator such as ceramics or resin.
- an insulator such as ceramics or resin.
- a plurality of ceramic green sheets formed in a predetermined shape are laminated.
- the laminate is formed and fired.
- the thickness of the bottom surface of the recess provided on the wiring board is about 0.3 mm to 0.4 mm, and the depth of the recess is about 0.3 mm to 0.4 mm, which is very useful as a ceramic green sheet It is getting thinner.
- the distance between the light receiving unit of the imaging element and the lens is determined by the focal length of the lens, for example, the height of the lens barrel is reduced to reduce the distance between the lens and the light receiving unit of the imaging element. It has been difficult to reduce the thickness of the imaging device by shortening the length.
- the present invention has been devised in view of the above-described problems of the prior art, and an object of the present invention is to provide an imaging device and an electronic component, which can be reduced in thickness and size, and can provide high-quality images.
- An object of the present invention is to provide an imaging apparatus capable of outputting a signal.
- An image pickup apparatus includes a circuit board having wiring formed on the upper surface, an electronic component mounted on the circuit board, and a plurality of connections on the upper surface that are mounted on the circuit board so as to surround the electronic component.
- An electrode is formed, a frame body in which a plurality of external terminals are formed on at least one of a side surface or a lower surface that is electrically connected to the connection electrode, and a light receiving portion is disposed at a central portion of the upper surface, and the opening of the frame body
- An image pickup device mounted on the upper surface of the frame body so as to cover the frame, and a lens barrel having a lens that is joined to the outer peripheral portion of the upper surface of the frame body and covers the image pickup device. It is a feature.
- the imaging device of the present invention has a circuit board having wiring formed on the upper surface, an electronic component mounted on the circuit board, and a plurality of connection electrodes formed on the circuit board so as to surround the electronic component.
- a conventional imaging device because it has an imaging device mounted on the upper surface of the body and a lens barrel that is bonded to the outer periphery of the upper surface of the frame and covers the imaging device.
- the imaging device Since there is no portion corresponding to the bottom of the concave portion of the wiring board, the bottom of the concave portion is not damaged as in the prior art, and the entire imaging device can be made thinner by the thickness of the bottom of the concave portion.
- the imaging device is mounted on the upper surface of the frame body and the electronic component is mounted on the circuit board so as to be surrounded by the frame body, a frame is provided to secure a space for mounting the electronic component on the upper surface of the frame body. There is no need to increase the area of the body or the area of the circuit board, and the imaging apparatus can be prevented from becoming large in plan view. Therefore, the imaging apparatus can be reduced in thickness and size.
- the imaging device can output an image signal with high image quality without mounting the imaging element tilted due to the influence of deformation and without causing defective mounting of electronic components.
- FIG. 2A is a top view showing an example of an embodiment of an imaging apparatus of the present invention, with a lens barrel provided with a lens removed
- FIG. 2B is a cross-sectional view taken along line AA in FIG.
- FIG. 2A is a top view showing an example of an embodiment of an imaging apparatus of the present invention, with a lens barrel provided with a lens removed
- FIG. 2B is a cross-sectional view taken along line AA in FIG.
- 1 is a circuit board
- 2 is wiring
- 3 is an electronic component
- 4 is a frame
- 4a is a wall
- 5 is a connection electrode
- 6 is an external terminal
- 7 is a wiring conductor
- 8 is an image sensor
- 8a is a light receiving portion
- 8b is a signal processing circuit
- 8c is an electrode
- 9 is a lens
- 10 is a lens barrel
- 11 is a connecting member
- 12 is a joining member
- 13 is a translucent plate.
- the imaging device of the present invention includes a circuit board 1 having wiring 2 formed on the upper surface, an electronic component 3 mounted on the circuit board 1, and a circuit board 1.
- a frame 4 having a plurality of connection electrodes 5 formed on the upper surface and surrounded by the electronic component 3, and a plurality of external terminals 6 formed on at least one of the side surface or the lower surface electrically connected to the connection electrode 5.
- the light receiving portion 8a is disposed at the center of the upper surface, and is joined to the imaging element 8 mounted on the upper surface of the frame body 4 so as to close the opening of the frame body 4, and joined to the outer peripheral portion of the upper surface of the frame body 4.
- a lens barrel 10 having a lens 9 covering the element 8 is provided.
- the image pickup device 8 is mounted on the upper surface of the frame body 4 by a bonding member 12 made of resin or the like provided over the entire periphery of the opening of the frame body 4 so as to close the opening of the frame body 4. Yes. And the connection terminal of the image pick-up element 8 and the some connection electrode 5 formed in the upper surface of the frame 4 are connected via the connection member 11 which consists of a bonding wire.
- the imaging apparatus of the present invention since there is no portion corresponding to the bottom of the concave portion of the wiring board as compared with the conventional imaging apparatus, the entire imaging apparatus is thinned by the thickness of the concave portion of the wiring board. can do. Further, since the image pickup device 8 is mounted on the upper surface of the frame body 4 and the electronic component 3 is mounted on the circuit board 1 so as to be surrounded by the frame body 4, the electronic component 3 is mounted on the upper surface of the frame body 4. In order to secure the space, it is not necessary to increase the area of the frame body 4 or the area of the circuit board 1, and it is possible to prevent the imaging apparatus from becoming large in plan view. Therefore, the imaging apparatus can be reduced in thickness and size.
- the imaging device 8 is tilted and mounted under the influence of the deformation of the bottom surface of the recess, and the electronic component 3 does not cause mounting failure, and can capture a high-quality image signal. It can be a device.
- the opening of the frame body 4 is formed in a rectangular shape, and the imaging element 8 formed in the rectangular shape is formed of the frame body 4. It arrange
- the image pickup device 8 is mounted on the frame body 4 by electrically connecting the image pickup device 8 and the connection electrode 5 formed on the upper surface of the frame body 4 by a connection member 11 made of a bonding wire.
- the electronic component 3 is arranged on the circuit board 1 so as to be positioned in the opening of the frame body 4 and is electrically connected to the wiring 2 on the circuit board, so that the electronic component 3 is mounted on the circuit board 1. Has been.
- an imaging device in the example shown in FIG. 2, includes a lens barrel 10 having a lens 9 on the upper surface of the frame 4 in the example shown in FIGS. 1 (a) and 1 (b).
- the upper surface of the frame body 4 is provided in a stepped shape that becomes lower toward the opening side having a height of about 0.2 mm to 0.3 mm, for example.
- the imaging element 8 may be disposed on the opening side of the stepped upper surface of the frame body 4 and bonded to the upper surface of the frame body 4 via the bonding material 14.
- a plurality of connection electrodes 5 provided on a surface higher than the surface where the image sensor 8 and the image sensor 8 on the upper surface of the frame 4 are joined are electrically connected by a connection member 11 made of a bonding wire.
- the image pickup device 8 is mounted on the frame body 4 by being connected to the lens body 4, and the lens barrel 10 having the lens 9 is disposed on and joined to the outer peripheral side of the upper surface of the frame body 4 to form an image pickup apparatus.
- the height of the surface on which the imaging element 8 is bonded and the surface on which the connection electrode 5 is provided are different, and the surface on which the connection electrode 5 is provided is higher. Therefore, it is possible to prevent the electrical connection between the imaging element 8 and the connection electrode 5 from being hindered by the flow of the bonding member 12 before being cured and reaching the connection electrode 5. Accordingly, the joining member 12 and the connection electrode 5 can be easily placed close to each other, which is effective for downsizing the imaging device. Further, for example, even when a conductive material such as solder is used as the bonding member 12, a short circuit between the connection electrodes 5 due to the bonding member 12 can be prevented.
- the upper surface of the frame body 4 is provided in a stepped shape with a height of about 0.2 mm to 0.3 mm and lowering toward the opening side.
- the image sensor 8 is disposed on the opening side of the stepped upper surface of the frame body 4 and is bonded to the upper surface of the frame body 4 via the bonding material 14, and the image sensor 8 on the upper surface of the frame body 4 is
- the translucent plate 13 may be disposed on a surface that is higher than the bonded surfaces.
- the imaging element 8 and the plurality of connection electrodes 5 provided on the outer peripheral side of the surface where the imaging element 8 on the upper surface of the frame 4 is joined are electrically connected by the connection member 11 made of a bonding wire.
- the image sensor 8 is mounted on the frame 4.
- the light receiving portion 8a of the image sensor 8 is sealed with the translucent plate material 13, and the lens barrel 10 including the lens 9 is disposed so that the lens 9 is positioned above the light-transmitting plate material 13.
- An imaging apparatus is obtained in which the lens barrel 10 is joined around. In such a case, a low-pass filter or an IR cut filter as described later can be formed on the translucent plate 13.
- the light receiving portion 8a of the image pickup device 8 is sealed by the translucent plate material 13 and the joining member 12, the light receiving portion 8a of the image pickup device 8 can be protected, and the atmospheric pressure can be changed by the temperature change of the external environment. Is changed, the volume of the sealing space on the image pickup device 8 side sealed by the translucent plate 13 is the sealing space when only the lens barrel 10 provided with the lens 9 is sealed. Since the volume is smaller than the volume, the imaging device 8 is sealed only by the lens barrel 10 provided with the lens 9 even when pressure is applied to the imaging device 8 when a difference occurs in the pressure between the sealed space and the outside space. Compared with the case where it is stopped, it is possible to suppress deformation of the image sensor 8.
- a bonding wire is used as the connection member 11 for electrically connecting the image pickup device 8 and the connection electrode 5;
- the imaging element 8 and the connection electrode 5 may be electrically connected by sonic bonding or bonding with an anisotropic conductive resin.
- the imaging element 8 and the connection electrode 5 are provided at a position where they overlap each other in plan view, it is more effective to reduce the area of the image pickup apparatus in plan view and reduce the size.
- the imaging apparatus of the present invention has a wall 4a that divides the opening through the center of the opening of the frame body 4 in plan view as in the examples shown in FIGS. Even if thermal stress or mechanical stress is applied to the frame body 4, the deformation of the frame body 4 can be suppressed, and the deformation of the image sensor 8 mounted on the upper surface of the frame body 4 can be suppressed.
- the central portion of the opening is a range having a length of about a quarter of the length of the opening from the center of the opening toward the opening edge in a plan view.
- the imaging device of the present invention when the upper surface of the wall 4a is in contact with the lower surface of the image sensor 8, as in the example shown in FIG. 7A, the image sensor 8 mounted on the upper surface of the frame body 4. Can be prevented from being deformed so as to be convex toward the opening side, and heat generated by the image sensor 8 can be easily transmitted to the frame body 4, and the light receiving portion 8a of the image sensor 8 can be prevented from being distorted by heat.
- the upper surface of the wall 4a and the lower surface of the image sensor 8 may be in contact with each other via the bonding member 12. In such a case, the image sensor 8 is deformed so as to be convex on the side opposite to the opening. This can be suppressed.
- the imaging apparatus of the present invention has wiring on the side surface of the electronic component 3 and the upper surface of the circuit board 1 at a position where the wall 4 a does not overlap the electronic component 3 in plan view. 2, the wall 4 a is disposed above the connection member 11, and the adjacent electronic components 3 are joined in plan view. Since the distance between the formed wirings 2 can be shortened, the size of the imaging device can be reduced in plan view. When the wall 4 a is located between the connection members 11, the width of the portion located between the connection members 11 may be narrowed so as not to contact the connection member 11, or corresponds to the connection member 11. A cutout may be provided at the position. With such a configuration, the size of the imaging device can be reduced in plan view without reducing the area of the upper surface of the wall 4a.
- each of the openings divided into a plurality of walls 4a has a circular shape, an elliptical shape, or a circular arc shape in a plan view, as in the examples shown in FIGS.
- a polygonal shape there is no corner where the force tends to concentrate, so that it is possible to suppress the cracks starting from the corner and causing the wall 4a and the frame 4 to be damaged.
- the imaging device 8 when the imaging device 8 includes the signal processing circuit 8b and the signal processing circuit 8b is disposed on the frame body 4 as in the example shown in FIG. Since heat generated in 8b is easily transmitted to the frame 4 and heat is hardly transmitted to the light receiving unit 8a side, the light receiving unit 8a of the image sensor 8 can be prevented from being distorted by heat.
- the signal processing circuit 8b for example, a DSP (Digital Signal Processor) for filtering a signal from the image sensor 8 to remove noise or compensating for distortion of the optical system is provided.
- DSP Digital Signal Processor
- the imaging device of the present invention is arranged such that the electrode 8c of the imaging element 8 overlaps the frame 4 in a plan view of the upper surface of the imaging element 8, and 8 and the connection electrode 5 formed on the frame 4 are electrically connected by a bonding wire, the electrode 8c of the image sensor 8 is bonded when the bonding wire is joined to the electrode 8c of the image sensor 8. Since there is the frame body 4 below, it is easy to apply a force to the joint portion.
- the imaging apparatus of the present invention when the light receiving portion 8a of the imaging element 8 is arranged at a position overlapping the opening of the frame body 4 in plan view, as in the example shown in FIG. Since it does not overlap with the joining member 12 in a plan view, it is possible to suppress the light receiving portion 8a from being distorted due to stress applied to the imaging element 8 when the joining member 12 is solidified.
- the imaging device of the present invention is manufactured as follows. First, the circuit board 1 as described above is prepared.
- the circuit board 1 is obtained by forming wirings 2 on an insulating substrate made of an insulator such as ceramics or resin.
- an insulator such as ceramics or resin.
- an aluminum oxide sintered body alumina ceramics
- an aluminum nitride sintered body a mullite sintered body
- a glass ceramic sintered body a glass ceramic sintered body, and the like
- resin for example, fluorine resins such as epoxy resin, polyimide resin, acrylic resin, phenol resin, polyester resin, and tetrafluoroethylene resin can be used.
- impregnated resin to the base material which consists of glass fibers like glass epoxy resin is mentioned.
- the circuit board 1 is made of, for example, an aluminum oxide sintered body, an organic solvent suitable for raw material powders such as alumina (Al 2 O 3 ), silica (SiO 2 ), calcia (CaO), and magnesia (MgO).
- a ceramic green sheet is obtained by forming a sheet by using a doctor blade method, a calender roll method, or the like, and then forming a ceramic green sheet. Appropriate stamping is performed, and a plurality of sheets are laminated as necessary and fired at a high temperature (about 1500 ° C. to 1800 ° C.).
- the circuit board 1 when the circuit board 1 is made of, for example, a resin, it can be formed by molding by a transfer molding method, an injection molding method or the like using a mold that can be molded into a predetermined shape.
- a transfer molding method an injection molding method or the like using a mold that can be molded into a predetermined shape.
- what impregnated resin to the base material which consists of glass fiber like glass epoxy resin for example may be used. In this case, it can be formed by impregnating a substrate made of glass fiber with an epoxy resin precursor and thermally curing the epoxy resin precursor at a predetermined temperature.
- the wiring 2 is made of metal powder metallization such as tungsten (W), molybdenum (Mo), manganese (Mn), silver (Ag), copper (Cu), etc.
- a conductive paste for wiring 2 is printed in a predetermined shape on a ceramic green sheet for an insulating substrate of the substrate 1 by a screen printing method or the like, and is fired simultaneously with the ceramic green sheet to be formed at a predetermined position on the circuit board 1. .
- the through conductor that penetrates the ceramic green sheet in the thickness direction may be filled with a through hole formed in the ceramic green sheet by printing a conductor paste.
- Such a conductor paste can be appropriately obtained by adding an appropriate solvent and a binder to a metal powder such as tungsten (W), molybdenum (Mo), manganese (Mn), silver (Ag), copper (Cu), and kneading them. It is produced by adjusting to a proper viscosity.
- a metal powder such as tungsten (W), molybdenum (Mo), manganese (Mn), silver (Ag), copper (Cu), and kneading them. It is produced by adjusting to a proper viscosity.
- glass or ceramics may be included.
- the wiring 2 is made of a metal material such as copper, gold, aluminum, nickel, chromium, molybdenum, titanium, and alloys thereof when the circuit board 1 is made of resin.
- the copper foil processed into the shape of the wiring 2 is transferred onto a resin sheet made of glass epoxy resin, and the resin sheet to which the copper foil is transferred is laminated and bonded with an adhesive.
- the through conductors that penetrate the resin sheet in the thickness direction can be deposited on the inner surface of the through holes formed in the resin sheet by conductor paste printing or plating, or by filling the through holes. Good.
- it is formed by integrating a metal foil or a metal column with an insulating substrate made of resin, or by depositing the insulating substrate of the circuit board 1 using a sputtering method, a vapor deposition method, a plating method or the like.
- the electronic component 3 composed of an IC, a capacitor, a coil, a resistor and the like for processing an electric signal is connected to and mounted on the wiring 2 of the circuit board 1 by a conductive connecting member 11 such as solder.
- the mounting of the electronic component 3 on the circuit board 1 may be performed after the frame body 4 described later is mounted on the circuit board 1 or before the mounting.
- the frame body 4 is made of an insulating material such as ceramics or resin, like the insulating substrate of the circuit board 1 described above.
- the material of the frame body 4 include ceramics sintered bodies (alumina ceramics), aluminum nitride sintered bodies, mullite sintered bodies, and glass ceramic sintered bodies when made of ceramics.
- a resin for example, a fluorine-based resin such as an epoxy resin, a polyimide resin, an acrylic resin, a phenol resin, a polyester resin, and an ethylene tetrafluoride resin can be used.
- a fluorine-based resin such as an epoxy resin, a polyimide resin, an acrylic resin, a phenol resin, a polyester resin, and an ethylene tetrafluoride resin.
- impregnated resin to the base material which consists of glass fibers like glass epoxy resin is mentioned.
- the frame 4 When the frame 4 is made of, for example, an aluminum oxide sintered body, it can be manufactured by the same material and method as the circuit board 1 described above.
- the opening of the frame body 4 is formed by forming a through-hole to be an opening in a ceramic green sheet for the frame body 4 by a punching method using a die or punching, a laser processing method, or the like, and firing it. Can be formed.
- the size of each of the plurality of ceramic green sheets is large.
- the ceramic green sheet laminate may be formed by forming through-holes different from each other and arranging and laminating these ceramic green sheets so as to form a desired stepped step.
- the frame 4 is made of, for example, resin, it can be manufactured by the same method as the circuit board 1 described above.
- the wall 4 a is formed by punching the ceramic green sheet with an appropriate die or cutting the ceramic green sheet using a laser or the like. Can be formed.
- the punching process may be performed before or after lamination.
- it is not affected by the position shift at the time of stacking, so that it is possible to reduce the occurrence of unevenness due to the position shift at the time of stacking on the cross section of the wall 4a.
- the wall 4a is likely to be deformed during the punching process, and therefore it is preferable to perform the punching process before stacking.
- the wall 4a is made of resin, it may be formed using a mold that can obtain a desired shape.
- a ceramic paste made of the same material as the wall 4a is applied to the upper surface, or the upper surface has the same shape as the wall 4a in plan view.
- the ceramic green sheets may be laminated so that the thickness of the wall 4a is increased so as to be in contact with the lower surface of the image sensor 8.
- a metal paste made of a material having high thermal conductivity such as a metal such as tungsten, molybdenum, or copper may be used.
- heat generated in the image sensor 8 is easily transmitted to the frame body 4 through the wall 4a, so that it is possible to suppress the light receiving portion 8a of the image sensor 8 from being distorted by heat.
- the wall 4a connects the side surface of the electronic component 3 and the wiring 2 on the circuit board 1 at a position not overlapping the electronic component 3 in plan view. It is arranged not to touch.
- the lowermost ceramic green sheet of the ceramic green sheet laminate body is made to be a region corresponding to the frame body 4 only. You only need to punch it out.
- the wall 4a may be formed by removing the ceramic green sheet from the ceramic green sheet with a laser or the like when there is a cutout at a position corresponding to the connecting member 11.
- the opening divided into a plurality by the wall 4a has a circular arc shape in a plan view.
- Such an opening can be formed by punching using an appropriate mold or by cutting using a laser or the like.
- the wiring conductor 7, the connection electrode 5, and the external terminal 6 can be formed by the same material and method as the wiring 2 used when the circuit board 1 is made of ceramics. Moreover, the wiring conductor 7 can be formed in three dimensions within the frame body 4 by combining the through conductor and the conductor paste printed on the ceramic green sheet as required, and the connection electrode 5 and the external terminal can be formed. 6 can be in a desired positional relationship.
- the wiring conductor 7, the connection electrode 5, and the external terminal 6 can be formed by the same material and method as the wiring 2 used when the circuit board 1 is made of resin. it can. Even in this case, the connection electrode 5 and the external terminal 6 can be in a desired positional relationship by using the same method as in the case where the frame 4 is made of ceramics.
- the plating layer is deposited on the exposed surfaces of the wiring 2, the connection electrode 5, the external terminal 6 and the wiring conductor 7 by a plating method such as an electrolytic plating method or an electroless plating method.
- the plating layer is made of a metal having excellent corrosion resistance, such as nickel and gold, and the connectivity of the connecting member 11, for example, a nickel plating layer having a thickness of about 1 ⁇ m to 10 ⁇ m and a thickness of about 0.1 ⁇ m to 3 ⁇ m.
- a gold plating layer is sequentially deposited.
- connection electrode 5 As a result, corrosion of the wiring 2, the connection electrode 5, the external terminal 6 and the wiring conductor 7 can be effectively suppressed, and the connection between the wiring 2 of the circuit board 1 and the external terminal 6 of the frame body 4, The bonding between the wiring 2 of the circuit board 1 and the electronic component 3 and the bonding between the connection terminal of the imaging element 8 and the connection electrode 5 can be strengthened.
- a CCD-type or CMOS-type image sensor 8 is disposed on the upper surface of the frame body 4 so as to close the opening of the frame body 4 and is fixed to the frame body 4 using the joining member 12.
- the connection terminal 11 and the connection electrode 5 of the frame 4 are electrically connected using the connection member 11 so as to be electrically connected.
- the joining member 12 is preferably a non-conductive resin.
- solder or conductive resin may be used as the bonding member 12.
- connection electrode of the image sensor 8 when the connection electrode of the image sensor 8 is provided on the lower surface, solder bonding, ultrasonic bonding using Au bumps, or flip chip bonding using anisotropic conductive resin may be performed. Absent.
- an underfill material (not shown) is used to reinforce the bonding between the connection terminal of the image sensor 8 and the connection electrode 5 and protect the light receiving portion 8a. It is preferable to seal the light receiving portion 8a by filling the liquid.
- a lens barrel 10 provided with a lens 9 is prepared, and is joined to the outer peripheral portion of the upper surface of the frame body 4 so as to cover the imaging element 8.
- the lens 9 is made of a resin such as glass or epoxy resin, and is attached to the lens fixing member 12 so that light transmitted through the lens 9 through the opening of the lens fixing member 12 is incident on the light receiving portion 8 a of the image sensor 8. can do.
- the lens fixing member 12 is made of resin, metal, or the like, and is fixed to the upper surface of the frame 4 with an adhesive such as epoxy resin or solder, as in the examples shown in FIGS. Alternatively, the lens fixing member 12 is fixed to the frame body 4 by a collar or the like (not shown) provided in advance.
- the translucent plate 13 is made of a resin such as crystal, glass, or epoxy resin, and is joined to the frame 4 by an adhesive such as thermosetting or ultraviolet curable epoxy resin or glass.
- an ultraviolet curable epoxy resin is applied to the upper surface of the frame body 4 or the outer edge of the translucent plate material 13 by a dispensing method, and the translucent plate material 13 is placed on the upper surface of the frame body 4 and irradiated with ultraviolet rays. As a result, the adhesive is cured and sealed.
- a filter may be formed on the translucent plate 13.
- the translucent plate 13 As a filter formed on the translucent plate 13, two to three crystal plates with different crystal orientation angles are overlapped, and generated on the image captured by the image sensor 8 using the birefringence characteristics of the crystal plate. There is a low-pass filter that prevents the moire phenomenon.
- the translucent plate 13 can be used as a single quartz plate for the low-pass filter.
- the image pickup device 8 generally having a sensitivity tendency higher in sensitivity from red to infrared than human vision is used as the color sensitivity of the human eye.
- an IR cut filter for cutting light in the red to infrared wavelength range.
- the IR cut filter can be produced by alternately forming several tens of dielectric multilayer films on the surface of the translucent plate 13.
- the dielectric multilayer film is generally formed by a high refractive index dielectric layer made of a dielectric material having a refractive index of 1.7 or more and a low refractive index dielectric layer made of a dielectric material having a refractive index of 1.6 or less by an evaporation method or the like.
- dielectric material having a refractive index of 1.7 or more examples include tantalum pentoxide, titanium oxide, niobium pentoxide, lanthanum oxide, zirconium oxide, and the like.
- dielectric material having a refractive index of 1.6 or less examples include silicon oxide and Aluminum oxide, lanthanum fluoride, magnesium fluoride, etc. are used.
- An imaging device including a lens barrel 10 having a lens 9 is mounted on the circuit board 1.
- each of the openings divided into walls as in the examples shown in FIGS. 5, 8, and 9 may have a honeycomb structure.
- the strength of the wall 4a is improved while increasing the ratio of the opening area per unit area when viewed in a plan view, which is effective in increasing the strength while reducing the size of the imaging device. .
- Circuit board 1 2 ... Wiring 3 ... Electronic component 4 ... Frame 4a ... Wall 5 ... Connecting electrode 6 ... External Terminal 7 ⁇ Wiring conductor 8 ⁇ Image sensor 8a ⁇ Light receiving portion 8b ⁇ Signal processing circuit 8c ⁇ Electrode 9 ⁇ lens 10 ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ Tube 11 ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ Connection material 12 ⁇ ⁇ ⁇ ⁇ ⁇ Joint material 13 ... Translucent plate
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- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Studio Devices (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
2・・・・・・配線
3・・・・・・電子部品
4・・・・・・枠体
4a・・・・・壁
5・・・・・・接続電極
6・・・・・・外部端子
7・・・・・・配線導体
8・・・・・・撮像素子
8a・・・・・受光部
8b・・・・・信号処理回路
8c・・・・・電極
9・・・・・・レンズ
10・・・・・・鏡筒
11・・・・・・接続部材
12・・・・・・接合部材
13・・・・・・透光性板材
Claims (8)
- 上面に配線が形成された回路基板1と、該回路基板1上に実装された電子部品と、前記回路基板1上に前記電子部品を取り囲んで実装された、上面に複数の接続電極が形成され、前記接続電極に電気的に接続された側面または下面の少なくとも一方に複数の外部端子が形成された枠体と、上面の中央部に受光部が配置され、前記枠体の開口を塞ぐように前記枠体の上面に実装された撮像素子と、前記枠体の上面の外周部に接合され、前記撮像素子を覆っている、レンズを備えた鏡筒とを備えていることを特徴とする撮像装置。
- 平面視で、前記枠体の開口の中央部を通って前記開口を分割している壁を有することを特徴とする請求項1に記載の撮像装置。
- 前記壁の上面は、前記撮像素子の下面に接していることを特徴とする請求項2に記載の撮像装置。
- 前記壁は、平面視で前記電子部品と重ならない位置に、前記電子部品の側面と前記回路基板1の上面の前記配線とを接続している接続部材と接しないように配置されていることを特徴とする請求項2または請求項3に記載の撮像装置。
- 前記壁で複数に分割された前記開口のそれぞれは、平面視で、円形状または角部が円弧状の多角形状であることを特徴とする請求項2乃至請求項4のいずれかに記載の撮像装置。
- 前記撮像素子が信号処理回路を備えており、該信号処理回路が前記枠体上に配置されていることを特徴とする請求項1乃至請求項5のいずれかに記載の撮像装置。
- 前記撮像素子の電極が、前記撮像素子の上面の平面視で前記枠体と重なる位置に配置され、前記撮像素子の電極と前記枠体に形成された前記接続電極とがボンディングワイヤーで電気的に接続されていることを特徴とする請求項1乃至請求項6のいずれかに記載の撮像装置。
- 前記撮像素子の受光部は、平面視で前記枠体の開口部と重なる位置に配置されていることを特徴とする請求項1乃至請求項7のいずれかに記載の撮像装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP10839579.9A EP2518999B1 (en) | 2009-12-24 | 2010-12-24 | Imaging device |
US13/375,458 US8866067B2 (en) | 2009-12-24 | 2010-12-24 | Imaging device with an imaging element and an electronic component |
CN201080023957.8A CN102449995B (zh) | 2009-12-24 | 2010-12-24 | 摄像装置 |
JP2011547661A JP5324667B2 (ja) | 2009-12-24 | 2010-12-24 | 撮像装置 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009292206 | 2009-12-24 | ||
JP2009-292206 | 2009-12-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2011078350A1 true WO2011078350A1 (ja) | 2011-06-30 |
Family
ID=44195875
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2010/073404 WO2011078350A1 (ja) | 2009-12-24 | 2010-12-24 | 撮像装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8866067B2 (ja) |
EP (1) | EP2518999B1 (ja) |
JP (1) | JP5324667B2 (ja) |
CN (1) | CN102449995B (ja) |
WO (1) | WO2011078350A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2022009109A (ja) * | 2016-02-25 | 2022-01-14 | 株式会社ニコン | 撮像装置及び半導体装置 |
US20220278150A1 (en) * | 2019-08-01 | 2022-09-01 | Ningbo Sunny Opotech Co., Ltd. | Photosensitive assembly, camera module and manufacturing methods therefor |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9094592B2 (en) * | 2011-11-15 | 2015-07-28 | Lg Innotek Co., Ltd. | Camera module with foreign objects inhibiting structure |
WO2015199134A1 (ja) * | 2014-06-25 | 2015-12-30 | 京セラ株式会社 | 撮像素子実装用基板および撮像装置 |
US10631371B2 (en) * | 2015-01-30 | 2020-04-21 | Rohm Co., Ltd. | Heater |
JP2016161743A (ja) * | 2015-03-02 | 2016-09-05 | ソニー株式会社 | 表示装置および撮像装置 |
US10769772B2 (en) * | 2015-05-21 | 2020-09-08 | Corning Incorporated | Methods for inspecting cellular articles |
US10580811B2 (en) * | 2015-11-24 | 2020-03-03 | Sony Corporation | Image pickup element package having a supporting resin frame with a thermally conductive portion including electronic components, and associated image pickup apparatus |
CN108243298B (zh) * | 2016-12-23 | 2022-10-14 | 宁波舜宇光电信息有限公司 | 摄像模组及其模塑电路板组件和制造方法以及带有摄像模组的电子设备 |
EP3734653A4 (en) * | 2017-12-28 | 2021-11-10 | Kyocera Corporation | Wiring board, electronic device, and electronic module |
CN111684673B (zh) * | 2018-02-16 | 2023-04-18 | 京瓷株式会社 | 多连片式元件收纳用封装件以及多连片式光半导体装置 |
JP7304946B2 (ja) * | 2019-06-25 | 2023-07-07 | アルプスアルパイン株式会社 | レンズ駆動装置、カメラモジュール、及びレンズ駆動装置の製造方法 |
CN117672872A (zh) * | 2022-09-08 | 2024-03-08 | 三赢科技(深圳)有限公司 | 相机模组的制造方法及相机模组 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0271982U (ja) * | 1988-11-22 | 1990-05-31 | ||
JP2002299592A (ja) * | 2001-03-29 | 2002-10-11 | Sony Corp | 半導体装置 |
JP2004335533A (ja) | 2003-04-30 | 2004-11-25 | Canon Inc | マルチチップパッケージ |
JP2008258793A (ja) | 2007-04-03 | 2008-10-23 | Alps Electric Co Ltd | カメラモジュール |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4170968B2 (ja) * | 2004-02-02 | 2008-10-22 | 松下電器産業株式会社 | 光学デバイス |
TW200701774A (en) * | 2005-06-28 | 2007-01-01 | Visera Technologies Co Ltd | Stack-type image sensor module |
JP4950542B2 (ja) * | 2006-04-07 | 2012-06-13 | 岩手東芝エレクトロニクス株式会社 | 固体撮像装置およびその製造方法 |
JP4923967B2 (ja) | 2006-11-14 | 2012-04-25 | 凸版印刷株式会社 | 固体撮像装置及び電子機器 |
JP2009008758A (ja) * | 2007-06-26 | 2009-01-15 | Fujinon Corp | 撮像デバイス、およびカメラモジュールならびに携帯端末機器 |
JP5175620B2 (ja) | 2008-05-29 | 2013-04-03 | シャープ株式会社 | 電子素子ウェハモジュールおよびその製造方法、電子素子モジュール、電子情報機器 |
-
2010
- 2010-12-24 CN CN201080023957.8A patent/CN102449995B/zh active Active
- 2010-12-24 EP EP10839579.9A patent/EP2518999B1/en not_active Not-in-force
- 2010-12-24 US US13/375,458 patent/US8866067B2/en active Active
- 2010-12-24 WO PCT/JP2010/073404 patent/WO2011078350A1/ja active Application Filing
- 2010-12-24 JP JP2011547661A patent/JP5324667B2/ja active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0271982U (ja) * | 1988-11-22 | 1990-05-31 | ||
JP2002299592A (ja) * | 2001-03-29 | 2002-10-11 | Sony Corp | 半導体装置 |
JP2004335533A (ja) | 2003-04-30 | 2004-11-25 | Canon Inc | マルチチップパッケージ |
JP2008258793A (ja) | 2007-04-03 | 2008-10-23 | Alps Electric Co Ltd | カメラモジュール |
Non-Patent Citations (1)
Title |
---|
See also references of EP2518999A4 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2022009109A (ja) * | 2016-02-25 | 2022-01-14 | 株式会社ニコン | 撮像装置及び半導体装置 |
US20220278150A1 (en) * | 2019-08-01 | 2022-09-01 | Ningbo Sunny Opotech Co., Ltd. | Photosensitive assembly, camera module and manufacturing methods therefor |
Also Published As
Publication number | Publication date |
---|---|
JP5324667B2 (ja) | 2013-10-23 |
US20120248294A1 (en) | 2012-10-04 |
EP2518999A4 (en) | 2014-01-01 |
EP2518999A1 (en) | 2012-10-31 |
US8866067B2 (en) | 2014-10-21 |
EP2518999B1 (en) | 2016-08-31 |
CN102449995A (zh) | 2012-05-09 |
JPWO2011078350A1 (ja) | 2013-05-09 |
CN102449995B (zh) | 2015-03-11 |
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