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WO2009113250A1 - Électrode à film mince, et cellule de mesure et dispositif d'inspection ayant l'électrode - Google Patents

Électrode à film mince, et cellule de mesure et dispositif d'inspection ayant l'électrode Download PDF

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Publication number
WO2009113250A1
WO2009113250A1 PCT/JP2009/000755 JP2009000755W WO2009113250A1 WO 2009113250 A1 WO2009113250 A1 WO 2009113250A1 JP 2009000755 W JP2009000755 W JP 2009000755W WO 2009113250 A1 WO2009113250 A1 WO 2009113250A1
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WO
WIPO (PCT)
Prior art keywords
thin film
film electrode
electrode
bacteria
comb
Prior art date
Application number
PCT/JP2009/000755
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English (en)
Japanese (ja)
Inventor
葛岡篤史
大内一文
Original Assignee
パナソニック株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2008062702A external-priority patent/JP2011106813A/ja
Priority claimed from JP2008062703A external-priority patent/JP2011106814A/ja
Application filed by パナソニック株式会社 filed Critical パナソニック株式会社
Publication of WO2009113250A1 publication Critical patent/WO2009113250A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/28—Electrolytic cell components
    • G01N27/30—Electrodes, e.g. test electrodes; Half-cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/483—Physical analysis of biological material
    • G01N33/487—Physical analysis of biological material of liquid biological material
    • G01N33/48707—Physical analysis of biological material of liquid biological material by electrical means
    • G01N33/48735—Investigating suspensions of cells, e.g. measuring microbe concentration

Definitions

  • the present invention relates to a thin film electrode for collecting an inspection object in a solution in order to quantitatively measure the inspection object, and a measurement cell and an inspection apparatus for quantitatively measuring the collected inspection object.
  • an inspection apparatus that uses a thin film electrode to quantitatively measure an object to be inspected in a solution.
  • a thin film electrode a plurality of conductive portions are arranged on a sheet substrate.
  • the inspection object is collected on the electrode by the dielectrophoretic force. Then, after collecting the object to be inspected, or measuring the impedance of the collecting electrode. In this way, the inspection object is quantitatively measured.
  • an electrode for measurement is provided inside, a measurement cell that can hold a sample containing microorganisms, a power supply unit that applies a voltage for performing dielectrophoresis on the electrode, and a sample solution
  • a microorganism count measuring apparatus including a measurement unit that calculates the number of microorganisms and a control unit that controls the power supply unit and the measurement unit (Patent Document 1).
  • the microorganism count measuring apparatus collects microorganisms in the sample solution on the electrode by the dielectrophoretic force when a voltage is applied to the electrode.
  • the microorganism count measuring apparatus quantitatively measures the number of microorganisms in the sample solution by measuring the impedance between the electrodes after collecting or collecting the microorganisms.
  • the conventional inspection apparatus has the following problems. That is, in a highly conductive solution, a phenomenon (drift) in which the electrode impedance changes occurs. And in the method of quantitatively measuring the test object from the change of the electrode impedance caused by the test object (bacteria), the change of the electrode impedance due to this drift lowers the accuracy of measuring the test object quantitatively. I will let you.
  • An object of the present invention is to provide a thin film electrode, a measurement cell including the thin film electrode, and an inspection apparatus.
  • the thin film electrode according to the first invention is a thin film electrode for collecting the test object in a solution by an electrophoretic force in an inspection apparatus for measuring the electrode impedance and quantitatively measuring the state of the test object. And it is provided with an electrode substrate, a conductive portion, a first surface portion, and a second surface portion.
  • the conductive portion is formed on the electrode substrate.
  • the first surface portion is on one surface of the thin film electrode and is disposed so as to be in contact with the solution.
  • the second surface portion is on the other surface of the thin film electrode and is covered.
  • the first surface portion that is a surface in contact with the solution in the thin film electrode is not limited to a single surface, and the other surface opposed to the first surface portion, that is, a surface excluding the second surface portion (for example, a side surface). May include.
  • the second surface portion is a surface (the other surface) opposite to the first surface portion, and is covered with a covering portion such as a resin, for example.
  • the thin film electrode here shall also include a resin plate, when arrange
  • an electrode for collecting an object to be inspected by electrophoretic force is used, and the electrode collects the object to be inspected or measures the electrode impedance after collection, thereby quantitatively analyzing the object to be inspected. It has been done to measure.
  • a phenomenon in which the electrode impedance changes occurs.
  • the change in the electrode impedance due to this drift lowers the accuracy of quantitatively measuring the object to be inspected.
  • the second surface portion on the surface facing the first surface portion which is the surface in contact with the solution in the thin film electrode is covered. This reduces the area of contact with the highly conductive solution on the surface of the thin film electrode that detects changes in electrode impedance due to drift. Thereby, the electric current which flows into a thin film electrode can be reduced. That is, in the change in the electrical characteristics of the thin film electrode, the ratio of the change in the electrical characteristics other than the part to collect the inspection object is reduced so that the influence of the highly conductive solution is minimized. .
  • the thin-film electrode according to the second invention is the thin-film electrode according to the first invention, wherein the conductive portion has a comb-tooth portion at least partly arranged facing the comb-tooth shape, The surface portion has a covering portion coated with a region excluding the comb tooth portion.
  • the peripheral area excluding the comb tooth portion is covered on the first surface portion of the thin film electrode.
  • the contact area between the surface other than the comb teeth portion for detecting a change in electrode impedance due to drift and the highly conductive solution can be reduced, and the current flowing through the thin film electrode can be reduced. That is, in the electrical property change in the thin film electrode, the ratio of the electrical property change of the comb tooth portion that collects the object to be inspected is increased so that the influence of the highly conductive solution is minimized.
  • a thin film electrode is a thin film electrode for collecting an inspection object in a solution by an electrophoretic force in an inspection apparatus for measuring an electrode impedance and quantitatively measuring the state of the inspection object.
  • an electrode substrate a conductive portion, a first surface portion, and a second surface portion.
  • the conductive portion is formed on the electrode substrate and has a comb-tooth portion at least a part of which is disposed facing the comb-tooth shape.
  • the first surface portion is on one surface of the thin film electrode, and is disposed so as to be in contact with the solution, and has a covering portion that covers a region excluding the comb tooth portion.
  • the second surface portion is on the other surface of the thin film electrode.
  • the first surface portion that is a surface in contact with the solution in the thin film electrode is not limited to a single surface, and the other surface opposite to the first surface portion, that is, the surface excluding the second surface portion (for example, a side surface). May include.
  • positioned facing the comb-tooth shape is covered with the electroconductive part.
  • an electrode for collecting an object to be inspected by electrophoretic force is used, and the electrode collects the object to be inspected or measures the electrode impedance after collection, thereby quantitatively analyzing the object to be inspected. It has been done to measure.
  • a phenomenon (drift) in which the electrode impedance changes occurs.
  • the change in the electrode impedance due to this drift lowers the accuracy of quantitatively measuring the object to be inspected.
  • the conductive portion covers the surface of the peripheral region excluding the comb tooth portion arranged so as to face the comb tooth shape. That is, the thin film electrode of the present invention includes a covering portion that covers the surface around the comb tooth portion and an uncovered comb tooth portion.
  • the thin film electrode according to the fourth invention is the thin film electrode according to the second or third invention, and the covering portion is covered with an insulating film.
  • the surface of the peripheral area excluding the comb teeth is covered with an insulating film.
  • the thin film electrode according to the fifth invention is the thin film electrode according to the fourth invention, and the insulating coating is an epoxy resin.
  • the surface of the peripheral region excluding the comb teeth is covered with an epoxy resin.
  • an electrode having excellent heat resistance can be formed.
  • the thin film is formed by the molding pressure when the surface is dissolved or the mold resin is poured. Problems such as electrode peeling can be avoided.
  • a thin film electrode according to a sixth invention is the thin film electrode according to the first or third invention, and the second surface portion has a resin plate on the upper surface.
  • the thin film electrode is deposited on, for example, a thin resin plate.
  • the thin film electrode is vulnerable to heat or the like.
  • the thin film electrode in the case where the thin film electrode is integrally formed with the case portion, there is a possibility of causing a problem due to heat generated when the mold resin is poured. Therefore, in the thin film electrode of the present invention, for example, a thin resin plate is disposed on the second surface portion of the thin film electrode.
  • the surface of the thin film electrode can be protected, and a thin film electrode having excellent heat resistance can be provided.
  • the effect increases as the thickness of the resin plate increases.
  • a thin film electrode according to a seventh aspect is the thin film electrode according to the sixth aspect, wherein the resin plate is made of PET.
  • the resin plate disposed on the thin film electrode is formed of PET (Polyethylene Terephthalate).
  • the thin film electrode according to the eighth invention is the thin film electrode according to the first or third invention, and the conductive portion further includes a terminal portion connected to a power source and exposed to the outside.
  • the surface of the terminal portion is not covered with a film or the like and is exposed. As a result, it is possible to apply the voltage from the power source to the conductive portion without lowering the voltage.
  • the thin film electrode according to the ninth invention is the thin film electrode according to any one of the first to eighth inventions, and the object to be inspected is a specimen obtained in the oral cavity.
  • An inspection apparatus includes the thin film electrode according to any one of the first to ninth aspects, a case portion, a power source portion, and a measurement portion.
  • the case portion is provided with a thin film electrode and holds a solution containing the inspection object.
  • the power supply unit applies a voltage to the thin film electrode.
  • the measurement unit measures the impedance of the inspection object.
  • the inspection apparatus that measures the electrode impedance and quantitatively measures the state of the inspected object includes the thin film electrode according to any one of the first to ninth inventions.
  • the ratio of the electrical property change of the comb tooth portion that collects the object to be inspected is increased so that the influence of the highly conductive solution is minimized. .
  • An inspection apparatus is the inspection apparatus according to the tenth aspect of the invention, wherein the second surface portion is integrally formed with the case portion.
  • the second surface portion is formed as a part of the case portion.
  • a measurement cell includes a thin film electrode according to any one of the first to ninth aspects, a main body, and a measurement space.
  • the main body has a bottomed cylindrical shape having an opening at the top.
  • the measurement space is a space formed inside the main body for measuring the state of the inspection object.
  • a thin film electrode is provided in the measurement space.
  • the invention's effect According to the thin-film electrode according to the present invention, the measurement cell and the inspection apparatus including the thin-film electrode, the accuracy of quantitatively measuring the object to be inspected is avoided even when the highly conductive solution is inspected. Can be improved.
  • FIG. 1 is a schematic diagram of a bacteria testing apparatus according to a first embodiment of the present invention.
  • FIG. 2 is an enlarged cross-sectional view around a thin film electrode included in the bacteria testing apparatus of FIG. 1.
  • FIG. 2 is a plan view of the periphery of a thin film electrode included in the bacteria testing apparatus of FIG. 1.
  • FIG. 5 is a perspective view around a comb tooth portion included in the thin film electrode of FIG. 4.
  • (B) is explanatory drawing showing the phase difference of an electric current and a voltage.
  • FIG. 5 is an explanatory diagram showing an electrical state of the thin film electrode in FIG.
  • the graph which shows the result of having calculated the electrostatic capacitance of the sample liquid of different electric conductivity, using the thin film electrode which coat
  • inspection apparatus of FIG. The graph which shows the result of having calculated the electrostatic capacitance of the sample liquid of different electrical conductivity using the thin film electrode which performed the resist process, and the thin film electrode which has not performed the resist process, respectively.
  • the bacteria testing apparatus 9 mainly includes a measurement cell (case part) 1, a thin film electrode 2, a rotor 3, a stirrer 4, a power supply part 5, a measurement part 6, a control part 7, and a display part 8. I have.
  • the measurement cell 1 is a cylindrical glass container.
  • the measurement cell 1 is provided with an opening for introducing / discharging the sample solution (solution) S.
  • the measuring cell 1 is made of glass. Therefore, when the rotor 3 for stirring the sample liquid S described later is rotated by the magnetic force of the stirrer 4 disposed adjacent to the measurement cell 1, the measurement cell 1 does not block the magnetic force.
  • the material of the measurement cell 1 can also use a plastic etc. besides glass.
  • the thin film electrode 2 includes an electrode substrate 10 and a conductive portion 11 as shown in FIG.
  • the thin film electrode 2 is formed by coating a conductor on the electrode substrate 10 by a method such as sputtering, vapor deposition, or plating.
  • a method such as sputtering, vapor deposition, or plating.
  • the electric field in the vicinity of the gap 12 (FIG. 5) becomes the strongest.
  • the bacteria (inspection object) S ′ migrate toward the gap 12 where the electric field is most concentrated.
  • the thin film electrode 2 will be described in detail later.
  • the rotor 3 and the stirrer 4 stir the sample solution S to change the relative position between the sample solution S and the electrode.
  • other flow promoting means for changing the relative position by causing the sample liquid S to flow on the electrodes may be used.
  • a water flow may be generated in the measurement cell 1 using a pump or the like, or an electrode may be attached on a movable mechanism to rotate, vibrate, or translate the electrode itself.
  • the rotor 3 can be selected from various forms, but in this embodiment, a cylindrical one is used.
  • the power supply unit 5 supplies an AC voltage for causing dielectrophoresis to the thin film electrode 2.
  • the alternating current here means a sine wave or a voltage that changes the direction of flow at a substantially constant cycle, and an average value of bidirectional current is equal.
  • a frequency of 100 kHz and a peak-to-peak voltage (hereinafter referred to as pp) of 5 V are applied as an alternating voltage for dielectrophoresis.
  • pp peak-to-peak voltage
  • the frequency and voltage value of the alternating voltage for dielectrophoresis are not limited to the values described above, and can be selected from a wide range.
  • the control unit 7 includes a microprocessor (not shown), a memory for storing a preset program, a timer, and operation buttons such as a measurement start button for the user to instruct measurement. Then, the control unit 7 controls the power supply unit 5 according to a preset program and applies a voltage for dielectrophoresis to the thin film electrode 2. Further, the control unit 7 transmits and receives signals to and from the measurement unit 6. The control unit 7 manages the overall flow of the measurement operation by appropriately controlling. Further, the control unit 7 displays the measurement result, the operation state, and the like on the display unit 8.
  • the measurement unit 6 includes a microprocessor (not shown), a memory for temporarily storing measurement data and calculation results, a voltage applied to the electrodes, a current flowing between the electrodes, and a voltage and a current.
  • the circuit includes a circuit for measuring a phase difference (hereinafter referred to as a phase angle).
  • the measurement unit 6 performs a calculation for performing an impedance analysis of the electrode. Then, the number of bacteria in the sample solution S can be calculated from the electrode impedance analysis result. For this calculation, a known calculation method is used. Further, the microprocessor and memory of the measurement unit 6 can be shared with the microprocessor and memory of the control unit 7.
  • the display unit 8 is a display such as an LCD, a printer, a speaker, etc., and outputs the number of bacteria in the solution.
  • the display unit 8 displays the number of bacteria in the sample liquid S as to the sanitary condition in the oral cavity.
  • a display method for example, a semi-quantitative expression using a bar graph or the like, a more abstract XX display, a voice display in addition to (or instead of) a visual display, etc.
  • Other transmission means can also be used. What is necessary is just to select the optimal one among these many display methods according to the objective.
  • the thin film electrode 2 is disposed on the back surface of the measurement cell 1.
  • One surface (first surface portion) 18 of the thin film electrode 2 is in contact with the sample solution S filled in the measurement cell 1.
  • the thin film electrode 2 has the comb-tooth part 13 and the resin board 17, as shown in FIG.
  • the comb-tooth portion 13 has two conductive portions 11 opposed to each other arranged in a nested manner with a small gap 12.
  • the gap 12 is set to 5 ⁇ m.
  • the gap 12 is preferably adjusted in the range of 0.2 to 300 ⁇ m according to the type and concentration of the bacteria S ′ in the sample liquid S to be measured.
  • the resin plate 17 is a thin plate member formed of PET (Polyethylene Terephthalate), and is deposited on the thin film electrode 2.
  • the resin plate 17 is mainly disposed to protect the thin film electrode 2 from damage or the like.
  • the thin film electrode 2 is formed integrally with the measurement cell 1 as shown in FIGS. Specifically, the resin plate 17 and the thin film electrode 2 are set in an injection mold and are integrally formed with the measurement cell 1 by filling with a mold resin. As a result, the surface opposite to the surface in contact with the sample solution S in the thin film electrode 2 (hereinafter referred to as the surface 18 of the thin film electrode 2) (second surface portion, hereinafter referred to as the back surface 19 of the thin film electrode 2) is molded. The back surface covering portion 14 is formed by being completely covered with the resin. As a result, at least on the back surface 19 of the thin film electrode 2, it is possible to completely block the contact between the sample liquid S and the thin film electrode 2.
  • the resin plate 17 is formed of heat-resistant PET, it also has an effect of protecting the thin-film electrode 2 from heat when filling with the mold resin.
  • the thin film electrode 2 is connected to a terminal portion 15 arranged so as to protrude outside the measurement cell 1 in order to supply a voltage to the conductive portion 11 formed on the electrode substrate 10.
  • a voltage is applied to the thin film electrode 2
  • the electric field near the gap 12 becomes the strongest, and the bacteria S ′ migrate toward the gap 12 where the electric field is most concentrated.
  • the bacteria S ′ in the measurement cell 1 migrate to a portion where the electric field is strongest and uneven.
  • the gap 12 of the thin film electrode 2 corresponds to a non-uniform portion having the strongest electric field.
  • the dielectrophoretic force F and the electric field E have the relationship of Formula 1.
  • the relative permittivity of the cytoplasm of the bacteria S ′ is ⁇ 2
  • the relative permittivity of the liquid containing the bacteria S ′ is ⁇ 1
  • the radius when the bacteria S ′ is regarded as a sphere is a
  • the circumference is ⁇ .
  • Equation 2 shows that the force due to dielectrophoresis is affected by a potential gradient, a difference in relative permittivity of bacteria S ′ as a medium and dielectric fine particles, and the like.
  • the gap 12 shown in FIG. 5 is a portion where the comb-like conductive portions 11 are formed to face each other.
  • the bacteria S ′ floating in the vicinity of the gap 12 are attracted to the gap 12 by the electric field effect generated between the gaps 12 and aligned along the lines of electric force.
  • the alignment state of the bacteria S ′ in the vicinity of the gap 12 depends on the distance between the number of bacteria existing in the sample liquid S body and the gap 12. When the number of bacteria is sufficiently large, the bacteria S ′ are linked in a chain form in the gap 12 and crosslinked.
  • the bacteria S ′ floating in the vicinity of the gap 12 from the beginning immediately move to the gap 12 portion, and the bacteria S ′ floating in the position away from the gap 12 are changed to the gap after a predetermined time according to the distance. Reach 12 parts. For this reason, the number of bacteria S ′ gathering in a predetermined area near the gap 12 after a predetermined time is proportional to the number of bacteria in the measurement cell 1. Then, the bacteria testing device 9 calculates the number of bacteria in the sample based on this proportional relationship.
  • the control unit 7 applies an AC voltage having a predetermined frequency and voltage value to the thin film electrode 2.
  • the measurement unit 6 starts measuring the current and the phase angle.
  • measurement data is collected every 0.5 seconds, and the result calculated each time is stored in a memory (not shown) in the measurement unit 6.
  • the time interval for collecting measurement data is not limited to the above.
  • the measurement unit 6 collects three data of applied voltage, current, and phase angle.
  • the measurement unit 6 calculates the impedance at a predetermined frequency of an equivalent circuit assumed in the thin film electrode 2 (a parallel circuit of CR composed of a resistance and a capacitance described later) from these measurement results, and finally The capacitance C of the thin film electrode 2 is calculated.
  • the impedance of the thin film electrode 2 is obtained, and a calculation taking into account the later-described phase angle is performed on this impedance.
  • the impedance can be obtained by dividing the applied voltage and current.
  • Capacitance C is calculated by expressing polar coordinates on a complex plane using a value (hereinafter referred to as phase angle) representing a phase difference between voltage and current for measuring impedance as an angular frequency difference. This is done by analyzing Hereinafter, the impedance is Z, the capacitance is C, the reactance is x, and the resistance is r, and this will be described in detail with reference to FIGS. 6 (a), 6 (b), 7 and equations 3-7.
  • Equation 3 represents the combined impedance of the CR parallel equivalent circuit.
  • Equation 4 represents the resistance of the CR parallel equivalent circuit.
  • Equation 5 represents the reactance of the CR parallel equivalent circuit.
  • Equation 6 represents the resistance value of the CR parallel equivalent circuit.
  • Equation 7 represents the capacitance value of the CR parallel equivalent circuit.
  • FIG. 6A shows the electrical state of the thin film electrode 2 in an equivalent circuit.
  • the equivalent circuit is indicated by one pole 50 in the thin film electrode 2, the other pole 51 in the thin film electrode, a capacitance C52 representing an equivalent capacitance component in the equivalent circuit, and a resistor R53 representing a resistance component in the equivalent circuit.
  • FIG. 6B shows a voltage waveform 56 to be applied and a current waveform 57 flowing through the circuit, with the horizontal axis representing the time axis 54 and the vertical axis representing the amplitude 55 of the waveform.
  • a sample solution S containing bacteria S ′ exists between the gaps 12 immediately after the start of measurement.
  • the capacitance C52 configured with the sample solution S as the interelectrode dielectric and the resistance R53 due to the sample solution S are in parallel with the electrode 50. 51.
  • the absolute values of the capacitance C52 and the resistance R53 change because the bacteria S ′ behave as dielectric fine particles as will be described later. The form does not change.
  • this equivalent circuit is referred to as a CR parallel circuit.
  • the value of the capacitance C52 obtained by performing such a calculation is recorded in the memory together with a value indicating the time when the measurement was performed or the order in which the measurement was performed. Thereafter, the data number of a predetermined number of times programmed in advance is collected.
  • the measurement unit 6 performs data analysis on the accumulated capacitance C52. In the data analysis of the capacitance C52, the value of the slope of the change in the capacitance C52 with the passage of time is obtained.
  • the number of bacteria is calculated from the gradient of the capacitance C52 with time.
  • the reason why the number of bacteria can be calculated by measuring the slope of the change in capacitance with time will be described.
  • Bacteria are ion-rich and consist of cell walls with relatively high electrical conductivity and phospholipids, and are surrounded by cell membranes with low electrical conductivity. That is, bacteria can be regarded as minute dielectric particles.
  • the dielectric constant of the bacteria seen as dielectric fine particles has a large value compared with the water which has a higher dielectric constant as a liquid compared with a general liquid. Therefore, the apparent dielectric constant near the gap 12 increases as the number of bacteria that move to the gap 12 by dielectrophoresis increases.
  • FIG. 14 shows an example of such a change in the capacitance C over time. As can be seen from FIG. 14, it can be seen that the slope (gradient) of the change in the capacitance C at the beginning of the measurement also increases corresponding to the number of bacteria, similarly to the change in the capacitance C over time.
  • the number of bacteria When calculating the number of bacteria by changing the capacitance C with time, it is more accurate to measure after passing the transient state. However, when the number of bacteria is calculated based on the slope (gradient) of the change in capacitance at the beginning of measurement, the number of bacteria can be calculated in a relatively short time.
  • this conversion equation is obtained by measuring a calibration sample with a clear bacterial count in advance using a measurement system of a predetermined bacterial count measuring apparatus, and the variation from the correlation between the bacterial count and the capacitance C at that time. It uses a function that represents a curve obtained by regression analysis.
  • the conversion formula is stored in the memory of the control unit 7 and a sample with an unknown number of bacteria is measured, the number of bacteria in the sample solution S is calculated by substituting the value of the change in capacitance C within a predetermined time. It can be calculated. In the case of using the conversion table, the calculation result based on the conversion formula is stored in advance.
  • the number of bacteria in the sample solution S is quantitatively calculated by measuring the impedance between the electrodes and deriving the capacitance C52 from the result.
  • the electrical state of the electrode in the presence of the highly conductive sample solution S can be regarded as an equivalent circuit as shown in FIG. That is, it is composed of one pole 50 in the thin film electrode 2, the other pole 51 in the thin film electrode 2, a capacitance C52 representing an equivalent capacitance component in the equivalent circuit, and resistors R53 and 58 representing resistance components in the equivalent circuit. Can be considered.
  • the resistor R53 represents a resistor that is regarded as being formed in the comb tooth portion 13
  • the resistor R58 represents a resistor that is regarded as being formed on the back surface 19 side of the thin film electrode 2. That is, the resistor R58, which is a portion where the impedance is changed by the highly conductive sample solution S, is included.
  • the back surface covering portion 14 that covers the back surface 19 of the thin film electrode 2 with a mold resin is formed.
  • the contact area between the highly conductive sample solution S and the back surface 19 of the thin film electrode 2 is reduced, and the current flowing through the thin film electrode 2 is reduced.
  • the comb tooth portion 13 that collects the bacteria S ′ a conventional impedance change can be acquired. In other words, when acquiring the change in impedance, the adverse effect of the highly conductive sample liquid S acquired on the back surface 19 of the thin film electrode 2 is minimized.
  • the bacterium S ′ is contained in the highly conductive sample solution S, it is possible to avoid the influence of drift and improve the accuracy of quantitatively measuring the bacterium S ′. .
  • the back surface 19 opposite to the surface 18 in contact with the sample solution S in the thin film electrode 2 forms a back surface covering portion 14 that is completely covered with a mold resin as shown in FIG. ing.
  • the contact area between the back surface 19 of the thin film electrode 2 that detects a change in impedance due to drift and the highly conductive sample liquid S can be reduced, and the current flowing through the thin film electrode 2 can be reduced. That is, in the electrical property change in the thin film electrode 2, the ratio of the electrical property change in the portion other than the bacteria S ′ is reduced to reduce the influence of the highly conductive sample solution S as much as possible. I have to. As a result, even when the bacteria contained in the highly conductive sample solution S are inspected, it is possible to avoid the influence of drift and improve the accuracy of quantitatively measuring the bacteria S ′.
  • the back surface 19 side of the thin film electrode 2 is formed integrally with the measurement cell 1 as shown in FIGS.
  • the thin film electrode 2 is vapor-deposited on the thin resin plate 17.
  • the thin film electrode 2 is disposed on a thin resin plate 17 formed of PET.
  • the resin plate 17 and the thin film electrode 2 are set in an injection mold, and the mold resin is filled and formed integrally.
  • the resin plate 17 is formed of heat-resistant PET, it is possible to protect the thin film electrode 2 from the heat when filling the mold resin.
  • the bacteria testing apparatus 9 includes the thin film electrode 2 whose back surface 19 side is covered with a mold resin.
  • a bacteria test apparatus (test apparatus) 109 according to an embodiment of the present invention will be described with reference to FIGS.
  • the components that are different from the inspection apparatus 9 according to the above-described embodiment will be described, and the description of the same components will be omitted.
  • the method for measuring the number of bacteria in the bacteria testing apparatus 109 is the same as in the above embodiment.
  • the bacteria testing apparatus 109 is on one surface of the thin film electrode 102, and the surface (first surface portion) 118 that is in contact with the sample liquid S is disposed so that the conductive portion 111 faces the comb teeth.
  • a resist process using an insulating epoxy resin is performed except for the comb-tooth portion 113.
  • the thin film electrode 102 further includes a surface covering portion (belly portion) 116 in which the surface 118 in contact with the sample solution S is covered with a resist film, and a comb tooth portion 113 not covered with the resist film.
  • coated part 116 may also coat
  • the contact area between the highly conductive sample solution S and the region other than the comb tooth portion 113, that is, the non-comb tooth portion region can be reduced, and the current flowing through the thin film electrode 102 can be reduced.
  • the comb-tooth portion 113 that collects the bacteria S ′ it is possible to acquire a change in impedance as usual. In other words, in obtaining the impedance change, the ratio of the impedance change of the comb tooth portion 113 that collects the bacteria S ′ is increased, and the adverse effect of the highly conductive sample liquid S in the non-comb tooth region is affected. We try to make it as small as possible.
  • the bacteria testing apparatus 109 avoids the influence of drift even when the highly conductive sample liquid S contains bacteria S ′, and further increases the accuracy of quantitatively measuring the bacteria S ′. It becomes possible to improve.
  • sample solutions S1 to S3 (S1: 2.7 ⁇ S / cm, S2: 100 ⁇ S / cm, S3: 250 ⁇ S / cm) having three types of electrical conductivity not containing bacteria S ′ were used. These sample liquids S1 to S3 are filled in the measurement cell 101 of the bacteria test apparatus 109, respectively.
  • the thin film electrode 102 is coated with a mold resin coating (back surface coating portion 114) and an epoxy resin resist treatment (surface coating portion 116) as shown in the above embodiment, and with a mold resin coating. It is not used, and the one subjected only to resist treatment with an epoxy resin is used.
  • the respective capacitances C were calculated based on the above calculation method. In the experiment of this example, the change amount of the capacitance C per unit time was graphed based on the value recorded in the memory for the change for 20 seconds.
  • the calculated electrostatic capacitance is between the one with the back surface 119 coated with the mold resin and the one without the coating treatment. There was almost no difference in the capacity C.
  • FIG. 10 shows a case where an AC voltage having a frequency of 100 kHz and 5 Vpp is applied to the thin film electrode 102. From the above experimental results, the following could be confirmed. That is, even when the bacteria S ′ contained in the highly conductive sample solution S is measured by using the bacteria testing apparatus 109 having the thin film electrode 102 whose back surface 119 is covered with the mold resin, The change in impedance due to drift can be eliminated. Thereby, the capacitance C can be calculated with higher accuracy, and the accuracy of quantitatively measuring the bacteria S ′ can be further improved.
  • the surface covering portion may be formed by covering a region other than the comb tooth portion of the surface 118 in contact with the sample solution S in the thin film electrode with a mold resin.
  • the surface covering portion 116 covered with an epoxy resin or the like may be further covered with a mold resin.
  • coated part 116 may be integrally molded with mold resin via binder ink, in order to improve affinity with an epoxy resin etc. and mold resin. Even if it is such a structure, the effect similar to said bacteria test
  • a bacteria test apparatus (test apparatus) 209 according to an embodiment of the present invention will be described with reference to FIGS.
  • inspection apparatus 9 and 109 which concerns on the said embodiment is demonstrated, and the description about the same component is abbreviate
  • the method for measuring the number of bacteria in the bacteria testing apparatus 209 is also the same as in the above embodiment.
  • the thin film electrode 202 of the bacteria test apparatus 209 has an electrode substrate 210 and a conductive portion 211 as shown in FIG.
  • the thin film electrode 202 is formed by coating a conductive material on the electrode substrate 210 by a method such as sputtering, vapor deposition, or plating.
  • a method such as sputtering, vapor deposition, or plating.
  • the thin film electrode 202 is disposed on the back surface of the measurement cell 201.
  • the thin film electrode 202 is attached so that one surface (first surface portion) thereof is in contact with the sample liquid S filled in the measurement cell 201 and the back surface (second surface portion) on the other surface is in contact with the measurement cell 201.
  • the thin film electrode 202 has a comb tooth portion 213, a resist processing portion (covering portion) 214, and a terminal portion 215.
  • the comb-tooth portion 213 includes two opposing conductive portions 211 arranged in a nested manner with a small gap 12 (FIG. 5). Further, the comb tooth portion 213 is characterized in that a resist (coating) process described later is not performed.
  • the gap 12 is set to 5 ⁇ m. It is desirable that the gap 12 is appropriately adjusted in the range of 0.2 to 300 ⁇ m according to the kind and concentration of the bacteria S ′ in the sample liquid S to be measured.
  • the resist processing unit 214 is a surface of the electrode substrate 210 on the side in contact with the sample solution S, and is a region around the comb teeth 213 (hereinafter referred to as a non-comb tooth region 214 ′). It is.
  • the region is subjected to a resist treatment with an epoxy resin having excellent heat resistance, and a film having a thickness of 10 ⁇ m is formed.
  • the terminal part 215 is a connection part with the power supply part 5 (FIG. 1) for supplying a voltage to the conductive part 211 formed on the electrode substrate 210 as in the first embodiment.
  • the terminal portion 215 is disposed so as to protrude outside the measurement cell 201.
  • the terminal part 215 is characterized by not performing the resist process like the comb-tooth part 213.
  • the non-comb portion region 214 ′ excluding the comb portion 213 and the terminal portion 215 is covered with an epoxy resin.
  • the electric field near the gap 12 becomes the strongest, and the bacteria S ′ migrate toward the gap 12 where the electric field is most concentrated.
  • the electrical state of the electrode in the presence of the highly conductive sample solution S can be regarded as an equivalent circuit as shown in FIG. That is, it is composed of one pole 50 in the thin film electrode 2, the other pole 51 in the thin film electrode 2, a capacitance C52 representing an equivalent capacitance component in the equivalent circuit, and resistors R53 and 58 representing resistance components in the equivalent circuit.
  • the resistor R53 is a resistor regarded as being formed in the comb tooth portion 213
  • the resistor R58 is a resistor regarded as being formed in the lead portion of the conductive portion 211 and the terminal portion 215. That is, the resistor R58, which is a portion where the impedance is changed by the highly conductive sample solution S, is included.
  • the surface of the thin film electrode 202 is made epoxy with the exception of the comb portion 213 in which the conductive portion 211 is arranged facing the comb shape. Covered with resin. That is, the thin film electrode 202 includes a resist processing unit 214 whose surface is covered with an epoxy resin, and a comb tooth portion 213 whose surface is not covered with an epoxy resin.
  • the contact area between the highly conductive sample solution S and the region other than the comb tooth portion 213, that is, the non-comb tooth portion region 214 ' is reduced, and the current flowing through the thin film electrode 202 is reduced.
  • the comb-tooth portion 213 that collects the bacteria S ′ can acquire a conventional impedance change.
  • the ratio of the impedance change of the comb tooth portion 213 that collects the bacteria S ′ is increased, and the non-comb tooth region 214 ′ is caused by the highly conductive sample liquid S.
  • the adverse effects are made as small as possible. As a result, even when the bacterium S ′ is contained in the highly conductive sample solution S, it is possible to avoid the influence of drift and improve the accuracy of quantitatively measuring the bacterium S ′. .
  • sample solutions S1 to S3 (S1: 2.7 ⁇ S / cm, S2: 100 ⁇ S / cm, S3: 250 ⁇ S / cm) having three types of electrical conductivity not containing bacteria S ′ were used. These sample liquids S1 to S3 are filled in the measurement cell 1 of the bacterial test apparatus 209, respectively.
  • the thin film electrode 202 the one using the thin film electrode 2 subjected to the resist treatment as shown in the above embodiment and the one using the thin film electrode not subjected to the resist treatment (conventional technology) are used.
  • the respective capacitances C52 were calculated based on the calculation method described in the first embodiment. In the experiment of this example, the amount of change in the capacitance C52 per unit time was graphed based on the value recorded in the memory for 20 seconds.
  • a highly conductive sample solution is obtained by using a bacterial test apparatus 209 provided with a thin film electrode 202 in which the surface of the thin film electrode 202 is covered with an epoxy resin except for the comb tooth portion 213.
  • the bacteria S ′ contained in S was measured, it was confirmed that the change in impedance due to drift could be eliminated and the capacitance C52 could be calculated with high accuracy. Thereby, it becomes possible to improve the precision which measures bacteria S 'quantitatively.
  • the thin film electrode 202 has a surface of the thin film electrode 202 except for the comb tooth portion 213 in which the conductive portion 211 is arranged facing the comb tooth shape. Is covered with an insulating epoxy resin. That is, the thin film electrode 202 includes a resist processing unit 214 whose surface is covered with an epoxy resin, and a comb tooth portion 213 whose surface is not covered with an epoxy resin.
  • the contact area between the highly conductive sample solution S and the surface other than the comb tooth portion 213 (non-comb tooth region 214 ′) is reduced, and the current flowing through the thin film electrode 202 is reduced. That is, in the electrical property change in the thin film electrode 202, the ratio of the electrical property change of the comb tooth portion 213 that collects the bacteria S ′ is increased so that the influence of the highly conductive sample solution S is minimized. I have to. As a result, even when the bacteria S ′ contained in the highly conductive sample solution S are inspected, it is possible to avoid the influence of drift and improve the accuracy of quantitatively measuring the bacteria S ′. .
  • this embodiment is characterized in that resist processing is performed on parts other than the comb teeth 213 and resist processing is not performed on the comb teeth 213 in order to improve measurement accuracy in the inspection apparatus.
  • the purpose is different from the conventional technique in which the comb teeth portion is subjected to resist processing.
  • an epoxy resin is employed as a resist that covers the surface of the resist processing unit 214.
  • the thin film electrode 202 having a surface excellent in heat resistance can be formed.
  • the surface of the terminal portion 215 is not covered with the epoxy resin and is exposed.
  • the bacteria test apparatus 209 is provided with a thin film electrode 202 covered with an epoxy resin except for the comb tooth portion 213 in which the conductive portion 211 is arranged facing the comb tooth shape.
  • the back side that was not coated in this embodiment may be coated with a resist.
  • the influence of drift due to the highly conductive sample solution can be avoided, and the accuracy of quantitatively measuring the bacteria S ′ can be improved.
  • the film thickness in the resist processing section may be 10 ⁇ m or less, or 10 ⁇ m or more as long as the influence of the highly conductive sample liquid can be blocked.
  • a phenolic resin that is a thermosetting resin may be used, and even if resist processing is performed with a resin that does not have heat resistance, the influence of drift due to a highly conductive sample solution is avoided. The accuracy of quantitatively measuring the bacteria S ′ can be improved.
  • the thin film electrode of the present invention can also be applied to various inspection apparatuses for inspecting microorganisms that can be collected on a thin film electrode by a mechanism of electrophoresis, polymers such as DNA and protein, and the like.
  • various inspection apparatuses for inspecting microorganisms that can be collected on a thin film electrode by a mechanism of electrophoresis, polymers such as DNA and protein, and the like.
  • the same effect as that of the bacteria testing apparatus 209 according to the above embodiment can be obtained.
  • the thin film electrode 202 has been described as an example disposed on the back side of the measurement cell 201.
  • the present invention is not limited to this.
  • the thin film electrode may be arranged at the center of the measurement cell.
  • the effect on the back surface side can be enhanced by covering the portions other than the comb tooth portions with a resist in the same manner as described above.
  • the measurement cell 21 includes a main body 22, a first thin film 23, and a second thin film 24.
  • the main body 22 has a bottomed cylindrical shape with an open upper surface, and includes a measurement space 25 below and a solution storage space 26 that stores the sample liquid S, which is a liquid for measurement, above.
  • the solution storage space 26 has a larger diameter than the measurement space 25.
  • the thin film electrode 2 (102, 202) according to the above embodiment is provided.
  • the first thin film 23 partitions the inside of the main body portion 22 and forms a measurement space 25 and a solution storage space 26.
  • the second thin film 24 is formed so as to cover the opening of the main body 22.
  • the sample liquid S placed in the measurement space 25 is agitated by rotating the rotor 27 by the magnetic force of a stirrer (not shown).
  • a test object (specimen) is placed in the solution S.
  • a voltage is applied to the thin film electrode 2 (102, 202) as in the above embodiment. Measurement of electrode impedance and calculation of the number of bacteria are as described in the above embodiment.
  • the back side covering part in which the back side is coated with resin or the like is formed. That's fine. Also in this case, the same effect as that of the bacterial test apparatus 9 according to the above embodiment can be obtained.
  • the bacteria test apparatus can avoid the influence of drift and improve the accuracy of quantitatively measuring the bacteria S ′. The same effect can be obtained.
  • the thin film electrode of the present invention can also be applied to various inspection apparatuses for inspecting microorganisms that can be collected on the thin film electrode by the mechanism of electrophoresis, polymers such as DNA and protein, and the like. Also in this case, the same effect as that of the bacterial test apparatus 9 according to the above embodiment can be obtained.
  • an object to be inspected contained in a highly conductive solution can be inspected accurately and quantitatively, so that a substance that can be collected on an electrode by an electrophoretic mechanism is inspected. It can be widely applied to various inspection devices.

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Abstract

L'invention porte sur un dispositif d'inspection qui peut éviter les influences d'une dérive même lorsqu'une solution d'une conductivité élevée doit être inspectée, pour ainsi améliorer la précision de mesure d'un objet à inspecter de manière quantitative. Dans un dispositif d'inspection (9) pour mesurer une impédance d'électrode, pour ainsi mesurer l'état de l'objet à inspecter de manière quantitative, une électrode à film mince (2) piège l'objet à inspecter dans une solution avec une force électrophorétique. L'électrode à film mince (2) comprend un substrat d'électrode (10), une partie conductrice (11) formée sur le substrat d'électrode (10), une première partie de surface (18) et une seconde partie de surface (19). La première partie de surface (18) est présente sur une face de l'électrode à film mince (2), et est agencée pour entrer en contact avec une solution. La seconde partie de surface (19) est présente sur l'autre face de l'électrode à film mince (2), et est recouverte.
PCT/JP2009/000755 2008-03-12 2009-02-23 Électrode à film mince, et cellule de mesure et dispositif d'inspection ayant l'électrode WO2009113250A1 (fr)

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JP2008-062703 2008-03-12
JP2008062702A JP2011106813A (ja) 2008-03-12 2008-03-12 薄膜電極およびこれを備えた検査装置
JP2008-062702 2008-03-12
JP2008062703A JP2011106814A (ja) 2008-03-12 2008-03-12 検査装置

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WO2011074190A1 (fr) * 2009-12-15 2011-06-23 パナソニック株式会社 Dispositif de mesure de nombre de microbes
WO2012053169A1 (fr) * 2010-10-20 2012-04-26 パナソニック株式会社 Dispositif de numération de micro-organismes
WO2018141881A1 (fr) * 2017-02-02 2018-08-09 Ika-Werke Gmbh & Co. Kg Fermeture pour un récipient électrochimique, récipient électrochimique et dispositif de laboratoire

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JPH0631423Y2 (ja) * 1987-10-12 1994-08-22 日本特殊陶業株式会社 空燃比センサ
JPH10507521A (ja) * 1994-10-18 1998-07-21 インスティテュート ファー ヒェモ−ウント ビオゼンゾリック ミュンスター エー．ファー． アナライト選択センサ
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WO2011074190A1 (fr) * 2009-12-15 2011-06-23 パナソニック株式会社 Dispositif de mesure de nombre de microbes
JP5659360B2 (ja) * 2009-12-15 2015-01-28 パナソニックヘルスケアホールディングス株式会社 微生物数測定装置
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EP2381250A4 (fr) * 2009-12-15 2017-11-08 Panasonic Healthcare Holdings Co., Ltd. Dispositif de mesure de nombre de microbes
WO2012053169A1 (fr) * 2010-10-20 2012-04-26 パナソニック株式会社 Dispositif de numération de micro-organismes
US8717045B2 (en) 2010-10-20 2014-05-06 Panasonic Healthcare Co., Ltd. Microorganism number measurement device
JP5894925B2 (ja) * 2010-10-20 2016-03-30 パナソニックヘルスケアホールディングス株式会社 微生物数測定装置
WO2018141881A1 (fr) * 2017-02-02 2018-08-09 Ika-Werke Gmbh & Co. Kg Fermeture pour un récipient électrochimique, récipient électrochimique et dispositif de laboratoire
US11035824B2 (en) 2017-02-02 2021-06-15 Ika-Werke Gmbh & Co. Kg Closure for an electrochemical vessel, electrochemical vessel and laboratory device

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