+

WO2008132995A1 - 粒子計測装置、及び粒径計測装置 - Google Patents

粒子計測装置、及び粒径計測装置 Download PDF

Info

Publication number
WO2008132995A1
WO2008132995A1 PCT/JP2008/056939 JP2008056939W WO2008132995A1 WO 2008132995 A1 WO2008132995 A1 WO 2008132995A1 JP 2008056939 W JP2008056939 W JP 2008056939W WO 2008132995 A1 WO2008132995 A1 WO 2008132995A1
Authority
WO
WIPO (PCT)
Prior art keywords
particle
measuring device
particles
size
particle size
Prior art date
Application number
PCT/JP2008/056939
Other languages
English (en)
French (fr)
Inventor
Yukio Yamada
Shinpei Okawa
Taisuke Hirono
Original Assignee
The University Of Electro-Communications
Kowa Company, Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2007104931A external-priority patent/JP4982697B2/ja
Priority claimed from JP2007104901A external-priority patent/JP4863083B2/ja
Application filed by The University Of Electro-Communications, Kowa Company, Ltd. filed Critical The University Of Electro-Communications
Priority to US12/595,348 priority Critical patent/US8218132B2/en
Publication of WO2008132995A1 publication Critical patent/WO2008132995A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1429—Signal processing
    • G01N15/1433—Signal processing using image recognition
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1484—Optical investigation techniques, e.g. flow cytometry microstructural devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N2015/1027—Determining speed or velocity of a particle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N2015/1486—Counting the particles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N2015/1493—Particle size

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Signal Processing (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)

Abstract

　　微小流路を流下される粒子を撮影手段により撮影し、その画像データに基づいて粒子速度計測手段は粒子速度を計測し、粒子数計測手段は所定時間内に流下される粒子の数を計測し、粒径計測手段は粒子の径を計測する。そして、それらの計測は、データ関連付け手段によって管理され、所定のタイミングで流下される粒子に対して行なわれる。これにより、微小流路を流下される粒子の速度と数と径とを同時に計測することができ、関連付けられたデータを得ることができる。
PCT/JP2008/056939 2007-04-12 2008-04-08 粒子計測装置、及び粒径計測装置 WO2008132995A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US12/595,348 US8218132B2 (en) 2007-04-12 2008-04-08 Particle measuring device and particle size measure device

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007104931A JP4982697B2 (ja) 2007-04-12 2007-04-12 粒子計測装置
JP2007-104931 2007-04-12
JP2007-104901 2007-04-12
JP2007104901A JP4863083B2 (ja) 2007-04-12 2007-04-12 粒径計測装置

Publications (1)

Publication Number Publication Date
WO2008132995A1 true WO2008132995A1 (ja) 2008-11-06

Family

ID=39925454

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/056939 WO2008132995A1 (ja) 2007-04-12 2008-04-08 粒子計測装置、及び粒径計測装置

Country Status (2)

Country Link
US (1) US8218132B2 (ja)
WO (1) WO2008132995A1 (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010185691A (ja) * 2009-02-10 2010-08-26 Doshisha 噴霧粒子撮像解析システムおよび解析方法
JP2012112721A (ja) * 2010-11-22 2012-06-14 Sumco Corp 浮遊粒子の測定方法及びその装置
JP2013029423A (ja) * 2011-07-28 2013-02-07 Toshiba Corp 流速及び粒径計測方法、ならびにそのシステム
JPWO2015108023A1 (ja) * 2014-01-17 2017-03-23 株式会社ニコン 微粒子分析装置、観察装置、微粒子分析プログラムおよび微粒子分析方法
WO2018052137A1 (ja) * 2016-09-16 2018-03-22 株式会社オンチップ・バイオテクノロジーズ 微粒子分注装置、微粒子解析装置、及び反応検出装置、並びにそれらを用いる方法

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI708052B (zh) * 2011-08-29 2020-10-21 美商安美基公司 用於非破壞性檢測-流體中未溶解粒子之方法及裝置
JP5611493B1 (ja) 2012-12-03 2014-10-22 富士電機株式会社 粒子線成形装置
DE102013210952B4 (de) * 2013-06-12 2020-03-19 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Bestimmung von ungelösten Teilchen in einem Fluid
WO2016063912A1 (ja) 2014-10-24 2016-04-28 国立大学法人東京大学 粒子検出方法、粒子検出装置および粒子検出システム
WO2016094459A2 (en) 2014-12-09 2016-06-16 Berkeley Lights, Inc. Automated detection and repositioning of micro-objects in microfluidic devices
EP3040705A1 (de) * 2014-12-30 2016-07-06 Grundfos Holding A/S Verfahren zum Bestimmen von Partikeln
WO2018102748A1 (en) 2016-12-01 2018-06-07 Berkeley Lights, Inc. Automated detection and repositioning of micro-objects in microfluidic devices
FR3061297B1 (fr) * 2016-12-28 2019-05-24 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede de comptage et de caracterisation de particules dans un fluide en mouvement
WO2019232473A2 (en) 2018-05-31 2019-12-05 Berkeley Lights, Inc. Automated detection and characterization of micro-objects in microfluidic devices
US11415500B2 (en) 2018-09-12 2022-08-16 National Institute Of Advanced Industrial Science And Technology Particulate observation device and particulate observation method
JP7535760B2 (ja) 2019-10-25 2024-08-19 パナソニックＩｐマネジメント株式会社 計数方法、計数装置、及びプログラム
CN113049455B (zh) * 2019-12-26 2023-04-14 中核北方核燃料元件有限公司 一种包覆燃料颗粒及核芯溯源性直径辅助测量装置
DE102021123506A1 (de) * 2021-09-10 2023-03-16 Axel Wilde Verfahren zur Analyse von Partikeln in Fluid-Gemischen und Gas-Gemischen

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0545274A (ja) * 1991-08-13 1993-02-23 Res Dev Corp Of Japan 粒子測定装置
JPH0643090A (ja) * 1992-04-01 1994-02-18 Toa Medical Electronics Co Ltd 粒子分析装置
JPH0989753A (ja) * 1995-09-25 1997-04-04 Hitachi Ltd 粒子分析装置
JP2007010524A (ja) * 2005-06-30 2007-01-18 Univ Of Tokyo 微小流路内速度分布計測装置及び方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6653651B1 (en) * 1998-12-09 2003-11-25 Carl D. Meinhart Micron resolution particle image velocimeter

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0545274A (ja) * 1991-08-13 1993-02-23 Res Dev Corp Of Japan 粒子測定装置
JPH0643090A (ja) * 1992-04-01 1994-02-18 Toa Medical Electronics Co Ltd 粒子分析装置
JPH0989753A (ja) * 1995-09-25 1997-04-04 Hitachi Ltd 粒子分析装置
JP2007010524A (ja) * 2005-06-30 2007-01-18 Univ Of Tokyo 微小流路内速度分布計測装置及び方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
OTAKI J.: "Bisho Ryurochu o Nagareru Hakkekkyu Keisu Hoho no Kaihatsu", SPECTROSCOPICAL SOCIETY OF JAPAN KOEN YOSHISHU, 8 November 2006 (2006-11-08), pages 124 - 125 *

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010185691A (ja) * 2009-02-10 2010-08-26 Doshisha 噴霧粒子撮像解析システムおよび解析方法
JP2012112721A (ja) * 2010-11-22 2012-06-14 Sumco Corp 浮遊粒子の測定方法及びその装置
JP2013029423A (ja) * 2011-07-28 2013-02-07 Toshiba Corp 流速及び粒径計測方法、ならびにそのシステム
JPWO2015108023A1 (ja) * 2014-01-17 2017-03-23 株式会社ニコン 微粒子分析装置、観察装置、微粒子分析プログラムおよび微粒子分析方法
WO2018052137A1 (ja) * 2016-09-16 2018-03-22 株式会社オンチップ・バイオテクノロジーズ 微粒子分注装置、微粒子解析装置、及び反応検出装置、並びにそれらを用いる方法
JPWO2018052137A1 (ja) * 2016-09-16 2019-08-08 株式会社オンチップ・バイオテクノロジーズ 微粒子分注装置、微粒子解析装置、及び反応検出装置、並びにそれらを用いる方法
JP7020689B2 (ja) 2016-09-16 2022-02-16 株式会社オンチップ・バイオテクノロジーズ 微粒子分注装置、微粒子解析装置、及び反応検出装置、並びにそれらを用いる方法
US12105007B2 (en) 2016-09-16 2024-10-01 On-Chip Biotechnologies Co., Ltd. Fine particle dispensing device, fine particle analysis device, reaction detection device, and method using said devices

Also Published As

Publication number Publication date
US20100110177A1 (en) 2010-05-06
US8218132B2 (en) 2012-07-10

Similar Documents

Publication Publication Date Title
WO2008132995A1 (ja) 粒子計測装置、及び粒径計測装置
Aaij et al. Measurements of prompt charm production cross-sections in pp collisions at $$\sqrt {s}= 5$$ TeV
EP2977735A3 (en) Particulate matter impact sensor
EP2538664A3 (en) Imaging apparatus and method of driving the same
EP2508921A3 (en) Systems and methods for characterizing turbulence regions
EP2728840A3 (en) Electronic device and method for recognizing voice
EP3113434A3 (en) Dual interpretation of a length field of a signal unit
EP2750375A4 (en) SEMICONDUCTOR ELEMENT, SOLID BODY IMAGING DEVICE AND CAMERA SYSTEM
EP2758994A4 (en) INTERPOSER PICTURE GENERATION SENSOR FOR HIGH-SPEED IMAGE RECORDING AND INSPECTION SYSTEMS
HUE059811T2 (hu) Interleukin-6 receptor (IL-6R) ellenes antitesteket tartalmazó stabilizált készítmények
EP2314988A4 (en) PICTURE RECORDING DEVICE, DISTANCE CALCULATION METHOD AND METHOD FOR DETECTING FOCUSED PICTURES
GB2469958B (en) Focal plane shutter,photographing apparatus including the same,and photographing method for the photographing apparatus
EP2741252B8 (en) Tdi sensor, image capturing apparatus, component mounting apparatus, component testing apparatus, and substrate inspection apparatus
WO2008111403A1 (ja) 粒子状物質検出装置
EP2749963A3 (en) Image forming apparatus
EP2577728A4 (en) SEMICONDUCTOR ELEMENT, SOLID BODY IMAGING DEVICE AND CAMERA SYSTEM
EP2967488A4 (en) SYSTEM AND METHOD FOR PRODUCING AN IMAGE FROM A ROTATING INTRAVASCULAR ULTRASOUND DEVICE
EP2522644A4 (en) SINTERED CERAMIC, CERAMIC BALL AND DEVICE FOR INSPECTION OF THE CERAMIC BALL
WO2011044308A3 (en) Fluid rheology measurement using a funnel apparatus
EP2472274A3 (en) Apparatus and method for evaluating health of a tap changer
EP2657791A3 (en) Image forming apparatus
EP2605076A3 (en) Image forming apparatus
WO2012012168A3 (en) Apparatus, system, and method for increasing measurement accuracy in a particle imaging device using light distribution
EP2573624A3 (en) Image forming apparatus
WO2014039794A3 (en) Compositions, apparatus and methods for monitoring biomarkers

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08740042

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 12595348

Country of ref document: US

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 08740042

Country of ref document: EP

Kind code of ref document: A1

点击 这是indexloc提供的php浏览器服务，不要输入任何密码和下载