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WO2008149940A1 - 分光モジュール - Google Patents

分光モジュール Download PDF

Info

Publication number
WO2008149940A1
WO2008149940A1 PCT/JP2008/060378 JP2008060378W WO2008149940A1 WO 2008149940 A1 WO2008149940 A1 WO 2008149940A1 JP 2008060378 W JP2008060378 W JP 2008060378W WO 2008149940 A1 WO2008149940 A1 WO 2008149940A1
Authority
WO
WIPO (PCT)
Prior art keywords
light
section
body section
spectroscopic
detecting element
Prior art date
Application number
PCT/JP2008/060378
Other languages
English (en)
French (fr)
Inventor
Tomofumi Suzuki
Katsumi Shibayama
Takafumi Yokino
Masashi Ito
Helmut Teichmann
Dietmar Hiller
Ulrich Starker
Original Assignee
Hamamatsu Photonics K.K.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2007153019A external-priority patent/JP4891841B2/ja
Priority claimed from JP2007152966A external-priority patent/JP4891840B2/ja
Priority claimed from JP2007153014A external-priority patent/JP4887221B2/ja
Priority claimed from JP2007238291A external-priority patent/JP4887250B2/ja
Application filed by Hamamatsu Photonics K.K. filed Critical Hamamatsu Photonics K.K.
Priority to US12/377,343 priority Critical patent/US8045155B2/en
Priority to EP08765191.5A priority patent/EP2063239A4/en
Publication of WO2008149940A1 publication Critical patent/WO2008149940A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0243—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows having a through-hole enabling the optical element to fulfil an additional optical function, e.g. a mirror or grating having a throughhole for a light collecting or light injecting optical fiber
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0256—Compact construction
    • G01J3/0259—Monolithic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/04—Slit arrangements slit adjustment

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Led Device Packages (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

　分光モジュール１は、光Ｌ１，Ｌ２を透過させる本体部２と、本体部２の前面２ａから本体部２に入射した光Ｌ１を分光して前面２ａ側に反射する分光部３と、分光部３によって分光されて反射された光Ｌ２を検出する光検出部４１を有し、本体部２の前面２ａに形成された配線９にフェースダウンボンディングによって電気的に接続された光検出素子４と、光検出素子４の本体部２側に充填され、光Ｌ１，Ｌ２を透過させるアンダーフィル材１２と、を備えている。光検出素子４は、分光部３に進行する光Ｌ１が通過する光通過孔４２を有しており、光検出素子４における本体部２側の後面４ａには、光通過孔４２の光出射開口４２ｂを囲むように溜部４３が形成されている。
PCT/JP2008/060378 2007-06-08 2008-06-05 分光モジュール WO2008149940A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US12/377,343 US8045155B2 (en) 2007-06-08 2008-06-05 Spectroscopic module
EP08765191.5A EP2063239A4 (en) 2007-06-08 2008-06-05 SPECTROSCOPIC MODULE

Applications Claiming Priority (12)

Application Number Priority Date Filing Date Title
JP2007-153029 2007-06-08
JP2007-152966 2007-06-08
JP2007-153014 2007-06-08
JP2007-153039 2007-06-08
JP2007-153019 2007-06-08
JP2007153019A JP4891841B2 (ja) 2007-06-08 2007-06-08 分光モジュール
JP2007152966A JP4891840B2 (ja) 2007-06-08 2007-06-08 分光モジュール
JP2007153039 2007-06-08
JP2007153014A JP4887221B2 (ja) 2007-06-08 2007-06-08 分光モジュール
JP2007153029 2007-06-08
JP2007238291A JP4887250B2 (ja) 2007-09-13 2007-09-13 分光モジュール
JP2007-238291 2007-09-13

Publications (1)

Publication Number Publication Date
WO2008149940A1 true WO2008149940A1 (ja) 2008-12-11

Family

ID=40093750

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/060378 WO2008149940A1 (ja) 2007-06-08 2008-06-05 分光モジュール

Country Status (5)

Country Link
US (1) US8045155B2 (ja)
EP (1) EP2063239A4 (ja)
KR (1) KR20100017086A (ja)
TW (1) TW200916738A (ja)
WO (1) WO2008149940A1 (ja)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009139322A1 (ja) * 2008-05-15 2009-11-19 浜松ホトニクス株式会社 分光モジュール及び分光モジュールの製造方法
WO2009139315A1 (ja) * 2008-05-15 2009-11-19 浜松ホトニクス株式会社 分光モジュール
WO2009139320A1 (ja) * 2008-05-15 2009-11-19 浜松ホトニクス株式会社 分光モジュール
JP2009300415A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール
JP2009300416A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュールの製造方法及び分光モジュール
JP2009300413A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール
JP2009300418A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール
US8040507B2 (en) 2008-05-15 2011-10-18 Hamamatsu Photonics K.K. Spectrometer
US8139214B2 (en) 2008-05-15 2012-03-20 Hamamatsu Photonics K.K. Spectroscopy module, and method for manufacturing the same
JP2013033067A (ja) * 2008-05-15 2013-02-14 Hamamatsu Photonics Kk 分光モジュール及び分光モジュールの製造方法

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2063238B1 (en) 2007-06-08 2018-08-22 Hamamatsu Photonics K.K. Spectroscope
JP4887221B2 (ja) * 2007-06-08 2012-02-29 浜松ホトニクス株式会社 分光モジュール
EP2075555A4 (en) * 2007-06-08 2014-01-01 Hamamatsu Photonics Kk SPECTROSCOPIC MODULE
JP4891840B2 (ja) * 2007-06-08 2012-03-07 浜松ホトニクス株式会社 分光モジュール
JP4891841B2 (ja) * 2007-06-08 2012-03-07 浜松ホトニクス株式会社 分光モジュール
KR20100017083A (ko) * 2007-06-08 2010-02-16 하마마츠 포토닉스 가부시키가이샤 분광 모듈
JP5325829B2 (ja) 2010-04-01 2013-10-23 浜松ホトニクス株式会社 分光モジュール
JP5335729B2 (ja) 2010-04-01 2013-11-06 浜松ホトニクス株式会社 分光モジュール
GB2508376A (en) 2012-11-29 2014-06-04 Ibm Optical spectrometer comprising an adjustably strained photodiode
JP6251073B2 (ja) * 2014-02-05 2017-12-20 浜松ホトニクス株式会社 分光器、及び分光器の製造方法
EP3372966B1 (en) * 2017-03-10 2021-09-01 Hitachi High-Tech Analytical Science Limited A portable analyzer using optical emission spectoscopy

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63229765A (ja) * 1987-03-18 1988-09-26 Fujitsu Ltd 赤外線検知器
JPH04294223A (ja) 1990-12-04 1992-10-19 Carl Zeiss:Fa ダイオード列型分光分析器
JPH06129908A (ja) * 1992-10-15 1994-05-13 Hamamatsu Photonics Kk 分光イメージングセンサ
JPH06229829A (ja) * 1993-02-04 1994-08-19 Olympus Optical Co Ltd 受光素子アレイ
JP2003139611A (ja) * 2001-11-06 2003-05-14 Olympus Optical Co Ltd 分光光度計
JP2003243444A (ja) 2002-02-20 2003-08-29 Nippon Telegr & Teleph Corp <Ntt> 基板実装構造及び半導体装置
JP2004191246A (ja) * 2002-12-12 2004-07-08 Matsushita Electric Ind Co Ltd 凹凸検出センサ
JP2004354176A (ja) 2003-05-28 2004-12-16 Hamamatsu Photonics Kk 光検出器及びそれを用いた分光器
JP2005308495A (ja) * 2004-04-20 2005-11-04 Hamamatsu Photonics Kk 分光器及びそれを用いた測定装置

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54143685A (en) 1978-04-29 1979-11-09 Ritsuo Hasumi Compact spectroscope for digital light wavemeter
JPS626126A (ja) 1985-07-03 1987-01-13 Shimadzu Corp 光スペクトル分析用センサ
DE3611246A1 (de) * 1986-04-04 1987-10-15 Kernforschungsz Karlsruhe Verfahren zum herstellen eines passiven optischen bauelements mit einem oder mehreren echelette-gittern und nach diesem verfahren hergestelltes bauelement
JPH03119917A (ja) 1989-09-30 1991-05-22 Iseki & Co Ltd 草刈機の刈草装置
US5026160A (en) * 1989-10-04 1991-06-25 The United States Of America As Represented By The Secretary Of The Navy Monolithic optical programmable spectrograph (MOPS)
JP3375147B2 (ja) 1992-05-26 2003-02-10 浜松ホトニクス株式会社 半導体光検出装置
JPH08145794A (ja) 1994-11-17 1996-06-07 Shimadzu Corp 分光器
US6224912B1 (en) 1996-04-03 2001-05-01 The Rogo Institute Cancer-cell proliferation-suppressing material produced by cancer cells restricted by entrapment
GB9614071D0 (en) * 1996-07-04 1996-09-04 Spectrasense Ltd Spectrometer
US5995221A (en) * 1997-02-28 1999-11-30 Instruments S.A., Inc. Modified concentric spectrograph
US6303934B1 (en) 1997-04-10 2001-10-16 James T. Daly Monolithic infrared spectrometer apparatus and methods
DE19717015A1 (de) 1997-04-23 1998-10-29 Inst Mikrotechnik Mainz Gmbh Miniaturisiertes optisches Bauelement sowie Verfahren zu seiner Herstellung
EP0942267B1 (de) * 1998-03-11 2006-08-30 Gretag-Macbeth AG Spektrometer
US6181418B1 (en) * 1998-03-12 2001-01-30 Gretag Macbeth Llc Concentric spectrometer
ATE283472T1 (de) * 1999-01-08 2004-12-15 Ibsen Photonics As Spektrometer
EP1041372B1 (de) 1999-04-01 2006-03-01 Gretag-Macbeth AG Spektrometer
US6538736B1 (en) * 1999-12-01 2003-03-25 Hach Company Concentric spectrometer with mitigation of internal specular reflections
US6657723B2 (en) * 2000-12-13 2003-12-02 International Business Machines Corporation Multimode planar spectrographs for wavelength demultiplexing and methods of fabrication
JP4236418B2 (ja) 2001-05-09 2009-03-11 日本板硝子株式会社 樹脂正立レンズアレイおよびその製造方法
KR20040035708A (ko) 2001-08-02 2004-04-29 이지스 세미컨덕터 가변형 광학기기
JP3912111B2 (ja) 2002-01-09 2007-05-09 富士通株式会社 波長多重双方向光伝送モジュール
JP2003318478A (ja) 2002-04-26 2003-11-07 Sumitomo Electric Ind Ltd 光通信装置
DE10304312A1 (de) * 2003-02-04 2004-08-12 Carl Zeiss Jena Gmbh Kompakt-Spektrometer
JP2004309146A (ja) * 2003-04-02 2004-11-04 Olympus Corp 分光光度計
JP4473665B2 (ja) 2004-07-16 2010-06-02 浜松ホトニクス株式会社 分光器
CN1800941B (zh) 2005-01-06 2010-05-12 群康科技(深圳)有限公司 背光模组
US7697137B2 (en) * 2006-04-28 2010-04-13 Corning Incorporated Monolithic Offner spectrometer
JP4891840B2 (ja) * 2007-06-08 2012-03-07 浜松ホトニクス株式会社 分光モジュール
EP2063238B1 (en) * 2007-06-08 2018-08-22 Hamamatsu Photonics K.K. Spectroscope
KR20100017083A (ko) * 2007-06-08 2010-02-16 하마마츠 포토닉스 가부시키가이샤 분광 모듈
JP4891841B2 (ja) * 2007-06-08 2012-03-07 浜松ホトニクス株式会社 分光モジュール
EP2075555A4 (en) * 2007-06-08 2014-01-01 Hamamatsu Photonics Kk SPECTROSCOPIC MODULE
JP4887221B2 (ja) * 2007-06-08 2012-02-29 浜松ホトニクス株式会社 分光モジュール
JP5205238B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光モジュール
JP5415060B2 (ja) * 2008-05-15 2014-02-12 浜松ホトニクス株式会社 分光モジュール

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63229765A (ja) * 1987-03-18 1988-09-26 Fujitsu Ltd 赤外線検知器
JPH04294223A (ja) 1990-12-04 1992-10-19 Carl Zeiss:Fa ダイオード列型分光分析器
JPH06129908A (ja) * 1992-10-15 1994-05-13 Hamamatsu Photonics Kk 分光イメージングセンサ
JPH06229829A (ja) * 1993-02-04 1994-08-19 Olympus Optical Co Ltd 受光素子アレイ
JP2003139611A (ja) * 2001-11-06 2003-05-14 Olympus Optical Co Ltd 分光光度計
JP2003243444A (ja) 2002-02-20 2003-08-29 Nippon Telegr & Teleph Corp <Ntt> 基板実装構造及び半導体装置
JP2004191246A (ja) * 2002-12-12 2004-07-08 Matsushita Electric Ind Co Ltd 凹凸検出センサ
JP2004354176A (ja) 2003-05-28 2004-12-16 Hamamatsu Photonics Kk 光検出器及びそれを用いた分光器
JP2005308495A (ja) * 2004-04-20 2005-11-04 Hamamatsu Photonics Kk 分光器及びそれを用いた測定装置

Cited By (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009139322A1 (ja) * 2008-05-15 2009-11-19 浜松ホトニクス株式会社 分光モジュール及び分光モジュールの製造方法
WO2009139315A1 (ja) * 2008-05-15 2009-11-19 浜松ホトニクス株式会社 分光モジュール
WO2009139320A1 (ja) * 2008-05-15 2009-11-19 浜松ホトニクス株式会社 分光モジュール
JP2009300422A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール
JP2009300415A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール
JP2009300419A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール
JP2009300416A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュールの製造方法及び分光モジュール
JP2009300413A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール
JP2009300424A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール及び分光モジュールの製造方法
JP2009300418A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール
US8013993B2 (en) 2008-05-15 2011-09-06 Hamamatsu Photonics K.K. Spectroscopy module
US8018591B2 (en) 2008-05-15 2011-09-13 Hamamatsu Photonics K.K. Spectroscopy module
US8027034B2 (en) 2008-05-15 2011-09-27 Hamamatsu Photonics K.K. Method for manufacturing spectroscopy module, and spectroscopy module
US8035814B2 (en) 2008-05-15 2011-10-11 Hamamatsu Photonics K.K. Spectroscopy module
US8040507B2 (en) 2008-05-15 2011-10-18 Hamamatsu Photonics K.K. Spectrometer
US8139214B2 (en) 2008-05-15 2012-03-20 Hamamatsu Photonics K.K. Spectroscopy module, and method for manufacturing the same
JP2013033067A (ja) * 2008-05-15 2013-02-14 Hamamatsu Photonics Kk 分光モジュール及び分光モジュールの製造方法
JP2013092541A (ja) * 2008-05-15 2013-05-16 Hamamatsu Photonics Kk 分光モジュール
US8564773B2 (en) 2008-05-15 2013-10-22 Hamamatsu Photonics K.K. Spectroscopy module
US8604412B2 (en) 2008-05-15 2013-12-10 Hamamatsu Photonics K.K. Spectral module and method for manufacturing spectral module
US8742320B2 (en) 2008-05-15 2014-06-03 Hamamatsu Photonics K.K. Spectral module and method for manufacturing spectral module
US8804118B2 (en) 2008-05-15 2014-08-12 Hamamatsu Photonics K.K. Spectral module

Also Published As

Publication number Publication date
EP2063239A1 (en) 2009-05-27
EP2063239A4 (en) 2013-12-25
US8045155B2 (en) 2011-10-25
TW200916738A (en) 2009-04-16
KR20100017086A (ko) 2010-02-16
US20100214563A1 (en) 2010-08-26

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