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WO2008068721A1 - Dispositif de détecteur semi-conducteur, instrument de diagnostic comprenant un tel dispositif et procédé de fabrication d'un tel dispositif - Google Patents

Dispositif de détecteur semi-conducteur, instrument de diagnostic comprenant un tel dispositif et procédé de fabrication d'un tel dispositif Download PDF

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Publication number
WO2008068721A1
WO2008068721A1 PCT/IB2007/054937 IB2007054937W WO2008068721A1 WO 2008068721 A1 WO2008068721 A1 WO 2008068721A1 IB 2007054937 W IB2007054937 W IB 2007054937W WO 2008068721 A1 WO2008068721 A1 WO 2008068721A1
Authority
WO
WIPO (PCT)
Prior art keywords
semiconductor
sensor device
subregion
mesa
substance
Prior art date
Application number
PCT/IB2007/054937
Other languages
English (en)
Inventor
Neriman N. Kahya
Erik P. A. M. Bakkers
Thomas Steffen
Lars M. Borgstrom
Original Assignee
Koninklijke Philips Electronics N.V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics N.V. filed Critical Koninklijke Philips Electronics N.V.
Priority to JP2009539862A priority Critical patent/JP2010511886A/ja
Priority to EP07849347A priority patent/EP2092307A1/fr
Publication of WO2008068721A1 publication Critical patent/WO2008068721A1/fr

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y30/00Nanotechnology for materials or surface science, e.g. nanocomposites

Definitions

  • the invention also relates to a diagnostic instrument comprising such a sensor device and to a method of manufacturing such a semiconductor sensor device.
  • a diagnostic instrument comprising such a sensor device and to a method of manufacturing such a semiconductor sensor device.
  • Such a device is very suitable for detecting chemical and/or biochemical substances. In the latter case it can e.g. be used for detecting biomolecules like antigen/antibody bindings, biomolecules and others with a high sensitivity and reproducibility, and thus it can be used advantageously in protein and gene analysis, disease diagnostics and the like.
  • the mesa-shaped semiconductor region may comprise a nano-wire.
  • a nano-wire a body is intended having at least one lateral dimension between 1 and 100 nm and more in particular between 10 and 50 nm.
  • a nano-wire has dimensions in two lateral directions that are in the said ranges.
  • Another attractive way of using a semiconductor sensor device according to the invention is to use an external radiation source, e.g. a laser or a LED of which the emitted radiation is directed towards the second subregion.
  • an external radiation source e.g. a laser or a LED of which the emitted radiation is directed towards the second subregion.
  • the sensor device should be formed such that said radiation can reach the second subregion. This can be realized if the mesa- shaped semiconductor region is freely admissible (e.g. open) at the side where the radiation source is positioned. If the semiconductor sensor device forms a closed space in which the mesa-shaped semiconductor region is locked, this can be obtained by closing the sensor device at the side where the radiation source is to be positioned by means of a radiation transparent substrate.
  • the III-V compound has an effective bandgap in the visible part of the spectrum.
  • suitable materials for the second subregion may be a material having a bandgap which is just outside the visible spectrum a the IR side thereof.
  • suitable materials are GaP, GaAs or InP and more preferably materials having a lower (bulk) bandgap like InAs and mixed crystals like InGaAs or InAsP.
  • Mixed crystals offer the additional advantage that the structure of the semiconductor region can be made such that the strain induced in case of passive regions of silicon is made minimal.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Composite Materials (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Materials Engineering (AREA)
  • Biophysics (AREA)
  • Optics & Photonics (AREA)
  • Light Receiving Elements (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

L'invention concerne un dispositif (10) de détecteur semi-conducteur destiné à détecter une substance (30) comprenant une région (11, 11') semi-conductrice à structure mesa qui est formée sur une surface d'un corps semi-conducteur (12) tandis qu'un fluide (20) comprenant la substance (30) devant être détectée peut s'écouler le long de la région (11) semi-conductrice à structure mesa, la région (11) semi-conductrice à structure mesa comprenant, observée ultérieurement dans une direction longitudinale, une première sous-région semi-conductrice (1) comprenant un premier matériau semi-conducteur, une seconde sous-région semi-conductrice (2) comprenant un second matériau semi-conducteur différent du premier matériau semi-conducteur et une troisième sous-région (3) comprenant un troisième matériau semi-conducteur différent du second matériau semi-conducteur. Selon l'invention, les premier et troisième matériaux semi-conducteurs comprennent un matériau optiquement passif et le second matériau semi-conducteur comprend un matériau optiquement actif, la substance (30) devant être détectée peut changer une propriété de rayonnement électromagnétique (E) provenant de la seconde sous-région (2) et le dispositif (10) de détecteur semi-conducteur est formé de telle sorte que le rayonnement électromagnétique (E) dont la propriété a été changée puisse atteindre un détecteur (50). Le dispositif de détecteur (10) selon l'invention peut être très sensible, relativement compact et facile à fabriquer. Le rayonnement (E) peut provenir d'une source externe (40) ou peut être généré dans le dispositif (10).
PCT/IB2007/054937 2006-12-08 2007-12-06 Dispositif de détecteur semi-conducteur, instrument de diagnostic comprenant un tel dispositif et procédé de fabrication d'un tel dispositif WO2008068721A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009539862A JP2010511886A (ja) 2006-12-08 2007-12-06 半導体センサ装置、そのような装置を有する診断機器、およびそのような装置を製造する方法
EP07849347A EP2092307A1 (fr) 2006-12-08 2007-12-06 Dispositif de détecteur semi-conducteur, instrument de diagnostic comprenant un tel dispositif et procédé de fabrication d'un tel dispositif

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP06125723.4 2006-12-08
EP06125723 2006-12-08

Publications (1)

Publication Number Publication Date
WO2008068721A1 true WO2008068721A1 (fr) 2008-06-12

Family

ID=39126175

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2007/054937 WO2008068721A1 (fr) 2006-12-08 2007-12-06 Dispositif de détecteur semi-conducteur, instrument de diagnostic comprenant un tel dispositif et procédé de fabrication d'un tel dispositif

Country Status (4)

Country Link
EP (1) EP2092307A1 (fr)
JP (1) JP2010511886A (fr)
CN (1) CN101558290A (fr)
WO (1) WO2008068721A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102018125050A1 (de) * 2018-10-10 2020-04-16 Osram Opto Semiconductors Gmbh Optoelektronischer Sensor

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030089899A1 (en) * 2000-08-22 2003-05-15 Lieber Charles M. Nanoscale wires and related devices
US20050032100A1 (en) * 2003-06-24 2005-02-10 California Institute Of Technology Electrochemical method and resulting structures for attaching molecular and biomolecular structures to semiconductor micro and nanostructures
WO2005064664A1 (fr) * 2003-12-23 2005-07-14 Koninklijke Philips Electronics N.V. Composant a semi-conducteur comportant une heterojonction

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030089899A1 (en) * 2000-08-22 2003-05-15 Lieber Charles M. Nanoscale wires and related devices
US20050032100A1 (en) * 2003-06-24 2005-02-10 California Institute Of Technology Electrochemical method and resulting structures for attaching molecular and biomolecular structures to semiconductor micro and nanostructures
WO2005064664A1 (fr) * 2003-12-23 2005-07-14 Koninklijke Philips Electronics N.V. Composant a semi-conducteur comportant une heterojonction

Also Published As

Publication number Publication date
CN101558290A (zh) 2009-10-14
EP2092307A1 (fr) 2009-08-26
JP2010511886A (ja) 2010-04-15

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