WO2006033102A1 - Systeme et procede de localisation tridimensionnelle d'inclusions dans une gemme - Google Patents
Systeme et procede de localisation tridimensionnelle d'inclusions dans une gemme Download PDFInfo
- Publication number
- WO2006033102A1 WO2006033102A1 PCT/IL2005/001006 IL2005001006W WO2006033102A1 WO 2006033102 A1 WO2006033102 A1 WO 2006033102A1 IL 2005001006 W IL2005001006 W IL 2005001006W WO 2006033102 A1 WO2006033102 A1 WO 2006033102A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- gemstone
- dimensional
- detector
- emitter
- radiation
- Prior art date
Links
- 239000010437 gem Substances 0.000 title claims abstract description 159
- 229910001751 gemstone Inorganic materials 0.000 title claims abstract description 159
- 238000000034 method Methods 0.000 title claims abstract description 51
- 230000005855 radiation Effects 0.000 claims abstract description 43
- 238000001514 detection method Methods 0.000 claims abstract description 16
- 230000001066 destructive effect Effects 0.000 claims abstract description 13
- 238000012545 processing Methods 0.000 claims abstract description 13
- 238000006073 displacement reaction Methods 0.000 claims abstract description 11
- 230000001360 synchronised effect Effects 0.000 claims abstract description 11
- 238000003384 imaging method Methods 0.000 claims description 18
- 239000010432 diamond Substances 0.000 claims description 9
- 238000005498 polishing Methods 0.000 claims description 3
- 238000002360 preparation method Methods 0.000 claims description 3
- 239000004575 stone Substances 0.000 description 24
- 238000001444 catalytic combustion detection Methods 0.000 description 4
- 229910003460 diamond Inorganic materials 0.000 description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 3
- 238000013507 mapping Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 230000000007 visual effect Effects 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000003796 beauty Effects 0.000 description 1
- 238000003776 cleavage reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000003292 diminished effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000012510 hollow fiber Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 230000001404 mediated effect Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
- 238000011897 real-time detection Methods 0.000 description 1
- 238000007670 refining Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000007017 scission Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
- 238000002604 ultrasonography Methods 0.000 description 1
- 238000004846 x-ray emission Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/87—Investigating jewels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/389—Precious stones; Pearls
Definitions
- the present invention generally relates to a non-destructive analyzing system and to a method of three-dimensional location of inclusions in a gemstone.
- Natural gemstones and diamonds are rare and require skill and tedious processing efforts to draw out the full beauty from the rough stone.
- Various different shapes of polished gemstones may be obtained from the rough stone; thus that the cut, which utilize most of the stone in terms of weight, shape and clarity, is the most profitable one.
- the scanned gemstone is maneuvered to a 360 degrees circle by means of a rotating gemstone holder.
- the images provided by those techniques are obtained separately and only one half of the gemstone is usually photographed at one session.
- the gemstone is photographed approximately at 5-degrees intervals, resulting in about 36 to 90 images for both halves of a gemstone, a relatively long procedure talcing up to 30 seconds.
- the images are used to create a three dimensional picture of the gemstone.
- the system works by use of sequential repeat commands such as (1) take a picture; (2) rotate 5 degrees; and (3) stop; and by repeating these commands until the gemstone has rotated 180 degrees.
- a number of computerized scanning systems have been adapted to examine gemstones and diamonds and to compare the shape of the stone with a variety of predetermined shapes in order to establish the best fit.
- the stone is lit from the rear, providing a silhouette thereof, which is analyzed by the computer and compared with a number of silhouettes of finished stones.
- the stone is scanned perpendicular to the axis, so as to permit the computer to provide a three-dimensional image of the stone.
- Both types of scanning systems discussed above may be advantageous in detecting protrusions but useless or ineffective in case of reentrants or recesses in the stone, which remain invisible; this may result in incorrect decisions regarding the proper working of the stones.
- a thin beam of light is projected onto the stone and moved relative to it.
- the point where the beam strikes the stone as viewed in a direction different from that from which the beam is projected.
- this method may suffer from inaccuracies in the reentrants measurements.
- US Pat 6,567,156 discloses a fourth type of examining method comprising coating the gemstone with a removable diffusing coating and determining the silhouette of the gemstone in three dimensions.
- the method further includes structured light triangulation performed by using laser light to obtain an image of the surface of the gemstone.
- Gemstone clarity is a measure of a gemstone 's lack of internal flaws and impurities.
- a gemstone that is virtually free of interior or exterior inclusions is of the highest quality, for nothing interferes with the passage of light through the gemstone.
- inclusions gravely degrade the finished stone's value, it is desirable to take them into account when optimizing the cut.
- these inclusions are not visible or locatable until late stages of the polishing process, and thus cannot be avoided in advanced refining stages.
- a manual method for determining inner inclusions is only partially provided by means of carving a small picking hole or window into the stone and probing through it, using an optical fiber or a stent, in the search for such inclusions.
- This method cannot map all inclusions potentially residing in the stone and further risks damaging the stone, in part or in whole
- a method and apparatus for locating inclusions in a diamond wherein said diamond is fixed on a holder and observed under a predetermined angle to obtain an image.
- a second measurement is carried out to obtain data to be calculated in a computer, either by a depth measurement, or by changing the direction of observation, in order to localize the inclusion with respect to the outer surface of said diamond.
- This rapid and cost effective method comprises the steps of (a) placing the gemstone on a holder such that the gemstone to be scanned is located in a radiation path comprising inter alia at least one emitter and at least one detector synchronized by a processor; (b) radiating said gemstone by means of said emitter; (c) detecting the emitted irradiation by means of said detector; (d) processing said detection such that a two-dimensional in-scan of said gemstone is obtained by means of said processor; (e) displacing the gemstone in respect to said emitter and said detector. Steps (b) through (e) are repeated for a plurality of predetermined displacements, and the obtained multiple two-dimensional in-scans are integrated into a three-dimensional model of the gemstone.
- the displacement is preferably provided by rotating the scanned gemstone by circulating the holder along a predetermined XY, XZ, YZ, and/or XYZ planes to a predetermined angle.
- the gemstone is rotated in an overall rotation angle of about 45° to about 360° or more wherein images are taken in intervals of about 1° to about 10° or more.
- the gemstone is rotated in an overall rotation angle of about 45° to about 360° or more, wherein images are taken either in relatively large intervals, e.g., 3 to 8 images per overall rotation angle (e.g., intervals of 45° to 120°), in any predetermined intervals as function of the inclusion specific geometry or in small intervals, of about 1° to about 10° or more.
- This method integrates the multiple two-dimensional in-scans obtained into a comprehensive three-dimensional model of the inclusions and the outer contour of the gemstone.
- Also provided hereinafter is an effective and retrievable method for identifying, analyzing and/or commercially evaluating a gemstone, by obtaining a three- dimensional coordinated model of the inclusions in respect to the outer contour of the gemstone, by one or more of the methods defined above.
- This cost effective system comprises inter alia a holder adapted to carry the scanned diamond; at least one emitter adapted to radiate said gemstone; at least one detector adapted to detect the emitted irradiation targeted at the gemstone; a displacing means adapted to repeatedly displace said gemstone both in respect to said emitter and said detector, to a predetermined location; a processor adapted to process said detection such that a two-dimensional in-scan of said gemstone is obtained; and subsequently to integrate the obtained multiple two-dimensional in-scans into a three-dimensional model of the gemstone, wherein the obtained three-dimensional coordinated model is selected from the group consisting of the gemstone' s outer contour; a model of either the inner or outer inclusions of the gemstone, if any; a comprehensive model of said inclusions in respect to said outer contour or any combination thereof.
- Figure 1 schematically presents an imaging system for three-dimensional location of inclusions in a gemstone comprising a single set of emitter and detector;
- Figures 2A-2C schematically present a scanned rough gemstone comprising a single tubular flaw made possible by means of the method defined in the present invention, wherein Fig. 2A and 2B are two dimensional diffractions of the stone at 0 and 90 degrees, and Fig. 2C is the corresponding calculated three dimensional image of the same, characterized by well defined XYZ coordinates of the external contour and inner inclusion; and,
- Figure 3 schematically presents an imaging system for location of inclusions in a gemstone comprising a multiple sets of emitters and detectors; here, one set is adapted to provide a 3D imaging the outer contour of the gemstone and a second set is adapted to provide either 2D or 3D mapping of the inclusions.
- the term 'gemstone' refers hereinafter to any rough stones or half-processed stones before processing, e.g., such as for determining the rough gemstone value before purchasing it or for planning the subsequent process stages; in the gemstone processing stages, e.g., following the cleaving, sawing, bruting, and/or polishing stages; or after these preparation processes such as for evaluating the quality and value of the product produce thereof.
- the term specifically refers to rough stones, which provide diamonds and other precious or semi-precious gemstones.
- inclusion' refers to internal and/or external features, which are wholly or partially surrounded by the stone, for instance, crystalline and solid inclusions, dot- like inclusions, flaws, clouds, clarity affecting phenomena, cracks, cleavage, fracture, tension, feather-like structural phenomena, or any combination thereof.
- the term 'emitter' in the context of the present invention generally relates to any irradiation delivery device, including inter alia light source or a plurality of light sources emitting either visible light, white or monochromatic beam; and/or invisible light, including infra-red emission (IR), either in the near range or far range, and ultra ⁇ violet emission (UV) either in the near range or far range.
- IR infra-red emission
- UV ultra ⁇ violet emission
- the term also refers hereinafter to an X-ray radiation source and/or collimator of the same; a nucleic magnetic resonance (NMR), NQR, CT and/or MRI scatter; beta radiation emission devices; gamma radiation emission devices; laser beam cannons; photons cannons; microwave or RF emitters, etc.
- This term further refers to ultra-sound emitters, sonic or ultrasonic emitters or any combination thereof
- the term 'detector' in the context of the present invention refers to any sensor device adapted to detect the radiation delivered by the aforesaid emitter.
- the detector is adapted to detect said emitted radiation, a mixture thereof or a plurality of emissions, either directly or indirectly, e.g., through an interpreter.
- Such an interpreter may be selected from phosphorescent surface or the like.
- the detection according to the present invention is performed either on a single plane or a plurality of tangent planes, such as those assembled in a polygonal, hive-like, convex and/or concave configuration.
- the detection may be qualitative e.g., indicating in 0/1 fashion hit or miss of a predetermined measure of radiation on a predefined detecting pixel; or quantitative, e.g., fractional indication of the irradiation percentage detected in a given area or a particular detecting pixel.
- the aforesaid emission may be amplified prior to detection or filtered, for instance through a filter adapted to lower noise-to-signal ratio, such as any standard Fourier Transform (FT) module and/or by a means of either a stationary or rotating grid adapted to screen back-scattered radiation.
- FT Fourier Transform
- the present invention generally relates to a non-destructive method of scanning the contour of a gemstone, while coordinating a well-defined three-dimensional (3D) position of one or more inclusions inside said gemstone.
- This novel method comprises inter alia the step of placing the gemstone to be examined on a rotatable holder, rotating it to a predetermined angle while emitting irradiation on said scanned gemstone.
- at least one detector is used for detecting the emitted irradiation after scattering thereof, such that a two-dimensional in-scan of the gemstone is obtained.
- This process is repeated for a plurality of predetermined angles.
- a processor integrates the obtained multiple two-dimensional in-scans into a comprehensive three dimensional model of the gemstone 's inner and/or outer portions, positioning the exact three dimensional location of inclusions therein.
- the displacement is preferably provided by rotating the scanned gemstone by circulating the holder along a predetermined plane to a predetermined angle.
- the gemstone is rotated in an overall rotation angle of about 45° to about 360° or more wherein images are taken in intervals of about 1° to about 10° or more.
- the gemstone is rotated in an overall rotation angle of about 45° to about 360° or more, wherein images are taken either in relatively large intervals, e.g., 3 to 8 images per overall rotation angle (e.g., intervals of 45° to 120°), in any predetermined intervals as function of the inclusion specific geometry or in small intervals, of about 1° to about 10° or more.
- the system comprises a rotatable holder (1), sxich as a carrying dop or circular plate adapted for synchronized rotation (e.g., direction IB) of a gemstone (6) to be scanned when placed thereon.
- Gemstone (6) is characterized by a boundary portion (e.g., the left rim of contour 6A), and potentially at least one internal or external inclusion (6B).
- a processor (2) activates a rotation mechanism (IA) of holder (1), such that it circulates it to a predetermined measure (e.g., 1 to 5 degrees), or activates it in a given time to a predetermined location.
- At least one emitter (3) provides an effective emission targeted towards the gemstone (6).
- Emitter (3) is also coupled with the processor (2), such that at any time its emission is triggered, regulated, or at least recorded.
- At least one detector (5) is designed for recording the emitted radiation after striking gemstone (6) at its inner and/or external portions. Detector (5) is also in online or offline communication with the processor (2).
- at least one grid (4) is positioned between the gemstone and the detector to eliminate scattering and thus increase detection selectivity.
- Such a grid is either static or activated by a striking movement.
- Such a rotating grid is selected in a non-limiting manner from bucky grid actuators, rotating grids, cell-like grids, active grids adapted to emit visible or other invisible light etc.
- the system further comprises an output projecting means (7) such as a screen, data file etc., adapted to project the processed and stored 3D coordinated gemstone diagram.
- the holder (1) rotation is synchronized by the processor (2) with the activation of the emitter (3), wherein the emission is provided.
- Detector (5) is further adapted to provide with the time t 1 of the emission detection at a given point, in reference to a time frame t 0 when the emission was emitted, thus allowing processor (2) efficiently to integrate the two-dimensional in-scans into a three-dimensional model.
- emitter (3) radiates either a focused or unfocused beam onto the gemstone, here for example, via a commercially available collimator of X-rays.
- a focused or unfocused beam onto the gemstone, here for example, via a commercially available collimator of X-rays.
- Such an emission is either provided in a series of pulses, in processed intervals or lasts continuously.
- an X-ray beam targets both the perimeter of the gemstone, such as its left edge (6A), and any internal inclusion (such as flaw 6B).
- the radiation is at l&ast partially diffracted towards the detector (5), in this example, a single commercially available X-ray detector.
- the radiation emitted towards the external perimeter (6A) is directed to the grid (4) (see dashed arrow 8A) and then to the detector (8Cl).
- Radiation emitted towards the inclusion (6B) is either emitted directly to the grid (4) and then to the detector (8C2), or scattered (see dashed arrow 8D) to the grid (4), and subsequently blocked thereof from reaching the detector (see dashed arrow SE).
- 'CCD' or 'visual detectors' thus refer hereinafter to a video camera, an electronic camera, a digital camera, a digital video camera, hollow fibers and/or any other imaging device, possessing in a non-limiting manner concave, convex, non-zoom, zoom lenses or any combination thereof.
- grid (4) is designed according to one particulate enibodiment of the present invention such that it emits phosphorus light in those pixels that a sufficient radiation is provided thereon.
- X- rays 8 A or 8B are translated into visible or other light beams 8Cl or 8C2, respectively, wherein said light beams are detected by means of a CCD or any other visual detector 0).
- the detector is thus comprised of an array of pixels or has a continuous detecting surface.
- such a process of rotating while emitting and detecting may be at least partially continuous or discontinuous, and may be provided either manually or automatically, e.g. by a computer-mediated means.
- FIG. 2A presents a scanned lateral view (20) of the gemstone underlined in respect to non-scattered area (23), in an axis of 0 degrees (i.e., any initial point of view).
- the gemstone is found to comprise an irregular external contour (21A) and a substantially rectangular inner inclusion (22A).
- Fig. 2B presents the scanned gemstone in its extreme face view, at 90 degrees view, showing said cloud-like gemstone (21B) containing only one flaw with a circular cross-section.
- Fig. 2C presents the calculated 3D inner and outer gemstone view (21C) comprising a tubular inclusion (22C) presented at well-defined XYZ coordinates.
- FIG. 1 schematically presenting a top view of an imaging system according to yet another embodiment of the present invention, especially adapted for the location of inclusions in a gemstone.
- This system comprising inter alia a multiple sets of emitters and detectors.
- one set is adapted to provide a 3D imaging the outer contour of the gemstone and a second set is adapted to provide either 2D or 3D mapping of the inclusions.
- imaging assemblies comprising X-ray means for radiating the gemstone such that a phosphorescent radiation interpreter radiates a invisible light; means for emitting a laser radiation towards said towards the interpreter or detector such that a visible image is detectable; wherein the laser-means and/or detectors thereof are adapted for particulate (e.g., pixel like) detection, or an overall real time detection of the laser- radiated surface.
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Abstract
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/944,898 US7755072B2 (en) | 2004-09-21 | 2004-09-21 | System and method for three-dimensional location of inclusions in a gemstone |
IL164190 | 2004-09-21 | ||
US10/944,898 | 2004-09-21 | ||
IL164190A IL164190A (en) | 2004-09-21 | 2004-09-21 | A system and method for three-dimensional positioning of internal impurities in a gemstone |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2006033102A1 true WO2006033102A1 (fr) | 2006-03-30 |
Family
ID=35448255
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IL2005/001006 WO2006033102A1 (fr) | 2004-09-21 | 2005-09-20 | Systeme et procede de localisation tridimensionnelle d'inclusions dans une gemme |
Country Status (1)
Country | Link |
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WO (1) | WO2006033102A1 (fr) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009133393A1 (fr) * | 2008-04-30 | 2009-11-05 | De Beers Uk Limited | Localisation d'inclusions dans un diamant |
WO2011054822A1 (fr) * | 2009-11-03 | 2011-05-12 | De Beers Centenary AG | Détection d'inclusions dans des gemmes polies |
WO2016092300A1 (fr) * | 2014-12-09 | 2016-06-16 | Peter Reischig | Procédé de génération d'une empreinte digitale pour une pierre précieuse au moyen de l'imagerie par rayons x |
WO2017015956A1 (fr) * | 2015-07-30 | 2017-02-02 | 深圳大学 | Procédé d'identification de l'authenticité d'un bijou naturel et système basé sur une technique d'imagerie microscopique tridimensionnelle |
CN114935574A (zh) * | 2022-05-17 | 2022-08-23 | 河北同光半导体股份有限公司 | 高纯碳化硅晶体包裹的检测方法及装置 |
WO2024249473A1 (fr) * | 2023-05-29 | 2024-12-05 | EllansaLabs Inc. | Système et procédé de gravure interne de surfaces de matériaux transparents avec des informations pour vérifier une authenticité |
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US4152069A (en) * | 1976-02-05 | 1979-05-01 | Dihaco/Diamanten Handels Compagnie | Process and apparatus for ascertainment of the valuation data of gems |
GB2017468A (en) * | 1978-02-14 | 1979-10-03 | De Beers Cons Mines Ltd | Improvements in radiography |
US4417564A (en) * | 1980-06-04 | 1983-11-29 | Lawrence John C | Centering and working gemstones |
US4900147A (en) * | 1987-03-18 | 1990-02-13 | The British Petroleum Company, P.L.C. | Diamond mapping |
US6020954A (en) * | 1997-12-18 | 2000-02-01 | Imagestatistics, Inc. | Method and associated apparatus for the standardized grading of gemstones |
US6069361A (en) * | 1997-10-31 | 2000-05-30 | Eastman Kodak Company | Imaging resolution of X-ray digital sensors |
WO2004028288A2 (fr) * | 2002-09-27 | 2004-04-08 | Dialit Ltd. | Systeme de formation d'images tridimensionnelles de pierres precieuses et procede d'utilisation correspondant |
-
2005
- 2005-09-20 WO PCT/IL2005/001006 patent/WO2006033102A1/fr active Application Filing
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
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US4152069A (en) * | 1976-02-05 | 1979-05-01 | Dihaco/Diamanten Handels Compagnie | Process and apparatus for ascertainment of the valuation data of gems |
GB2017468A (en) * | 1978-02-14 | 1979-10-03 | De Beers Cons Mines Ltd | Improvements in radiography |
US4417564A (en) * | 1980-06-04 | 1983-11-29 | Lawrence John C | Centering and working gemstones |
US4900147A (en) * | 1987-03-18 | 1990-02-13 | The British Petroleum Company, P.L.C. | Diamond mapping |
US6069361A (en) * | 1997-10-31 | 2000-05-30 | Eastman Kodak Company | Imaging resolution of X-ray digital sensors |
US6020954A (en) * | 1997-12-18 | 2000-02-01 | Imagestatistics, Inc. | Method and associated apparatus for the standardized grading of gemstones |
WO2004028288A2 (fr) * | 2002-09-27 | 2004-04-08 | Dialit Ltd. | Systeme de formation d'images tridimensionnelles de pierres precieuses et procede d'utilisation correspondant |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009133393A1 (fr) * | 2008-04-30 | 2009-11-05 | De Beers Uk Limited | Localisation d'inclusions dans un diamant |
WO2011054822A1 (fr) * | 2009-11-03 | 2011-05-12 | De Beers Centenary AG | Détection d'inclusions dans des gemmes polies |
JP2013510302A (ja) * | 2009-11-03 | 2013-03-21 | デ ビアーズ センテナリー アーゲー | 研磨された原石のインクルージョンの検出 |
US9322785B2 (en) | 2009-11-03 | 2016-04-26 | De Beers Uk Ltd. | Inclusion detection in polished gemstones |
WO2016092300A1 (fr) * | 2014-12-09 | 2016-06-16 | Peter Reischig | Procédé de génération d'une empreinte digitale pour une pierre précieuse au moyen de l'imagerie par rayons x |
US11073488B2 (en) * | 2014-12-09 | 2021-07-27 | Peter Reischig | Method of generating a fingerprint for a gemstone using x-ray imaging |
WO2017015956A1 (fr) * | 2015-07-30 | 2017-02-02 | 深圳大学 | Procédé d'identification de l'authenticité d'un bijou naturel et système basé sur une technique d'imagerie microscopique tridimensionnelle |
CN114935574A (zh) * | 2022-05-17 | 2022-08-23 | 河北同光半导体股份有限公司 | 高纯碳化硅晶体包裹的检测方法及装置 |
CN114935574B (zh) * | 2022-05-17 | 2024-09-06 | 河北同光半导体股份有限公司 | 高纯碳化硅晶体包裹的检测方法及装置 |
WO2024249473A1 (fr) * | 2023-05-29 | 2024-12-05 | EllansaLabs Inc. | Système et procédé de gravure interne de surfaces de matériaux transparents avec des informations pour vérifier une authenticité |
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