WO2006016544A1 - デュプレクサ及び通信装置 - Google Patents
デュプレクサ及び通信装置 Download PDFInfo
- Publication number
- WO2006016544A1 WO2006016544A1 PCT/JP2005/014500 JP2005014500W WO2006016544A1 WO 2006016544 A1 WO2006016544 A1 WO 2006016544A1 JP 2005014500 W JP2005014500 W JP 2005014500W WO 2006016544 A1 WO2006016544 A1 WO 2006016544A1
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- WIPO (PCT)
- Prior art keywords
- duplexer
- inductance
- electrode layer
- band filter
- side band
- Prior art date
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- 238000004891 communication Methods 0.000 title claims description 10
- 239000000758 substrate Substances 0.000 claims abstract description 74
- 238000010897 surface acoustic wave method Methods 0.000 claims abstract description 37
- 230000005540 biological transmission Effects 0.000 claims description 21
- 239000003990 capacitor Substances 0.000 claims description 15
- 238000002955 isolation Methods 0.000 abstract description 27
- 229910003327 LiNbO3 Inorganic materials 0.000 abstract 3
- 238000010586 diagram Methods 0.000 description 17
- 239000000463 material Substances 0.000 description 5
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 235000008331 Pinus X rigitaeda Nutrition 0.000 description 1
- 235000011613 Pinus brutia Nutrition 0.000 description 1
- 241000018646 Pinus brutia Species 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000407 epitaxy Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02559—Characteristics of substrate, e.g. cutting angles of lithium niobate or lithium-tantalate substrates
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders or supports
- H03H9/0538—Constructional combinations of supports or holders with electromechanical or other electronic elements
- H03H9/0566—Constructional combinations of supports or holders with electromechanical or other electronic elements for duplexers
- H03H9/0576—Constructional combinations of supports or holders with electromechanical or other electronic elements for duplexers including surface acoustic wave [SAW] devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
- H03H9/14538—Formation
- H03H9/14541—Multilayer finger or busbar electrode
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/70—Multiple-port networks for connecting several sources or loads, working on different frequencies or frequency bands, to a common load or source
- H03H9/72—Networks using surface acoustic waves
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/70—Multiple-port networks for connecting several sources or loads, working on different frequencies or frequency bands, to a common load or source
- H03H9/72—Networks using surface acoustic waves
- H03H9/725—Duplexers
Definitions
- the present invention relates to a duplexer and a communication device used in communication equipment, and more specifically.
- the present invention relates to a duplexer and a communication device including a band filter formed by connecting a plurality of surface acoustic wave resonators so as to constitute a ladder circuit.
- an interdigital electrode having a plurality of electrode fingers on a piezoelectric substrate
- IDT electrode IDT electrode
- IDT electrode fingers are thin and the electrode finger pitch is very small. Therefore, when large electric power is applied, the electrode fingers may be short-circuited or the electrode fingers may be disconnected. Accordingly, surface acoustic wave elements are strongly required to improve power durability.
- Patent Document 1 discloses a surface acoustic wave element with improved power durability. Here, it is formed by epitaxial growth on a 64 ° Y-X cut LiNbO substrate.
- An IDT electrode is formed by laminating the Ti base electrode layer and the A1 electrode layer formed by epitaxial growth on the Ti base electrode layer.
- a reception side band filter and a transmission side band filter are configured by connecting a plurality of surface acoustic wave elements.
- FIG. 20 An example of such a conventional duplexer circuit is shown in FIG. In FIG. 20, a portion surrounded by a broken line constitutes a duplexer 201.
- the duplexer 201 has an antenna terminal 201a.
- the antenna terminal 201a is connected to the antenna 202.
- an external inductance 203 and a capacitor 204 are connected between the antenna terminal 201 a and the antenna 202.
- the inductance 203 is inserted between the antenna terminal 201a and the antenna 202, and the capacitor 204 is connected between the connection point between the antenna 202 and the inductance 203 and the ground potential. ing.
- the duplexer 201 includes a transmission-side band filter 201A and a reception-side band filter 201B.
- a transmission side band filter 201A a plurality of series arm resonators Sa to Sc and parallel arm resonators Pa and Pb are connected so as to constitute a ladder type circuit.
- an inductance element 205 is connected in parallel to the final-stage series arm resonator Sc.
- the plurality of series arm resonators Sd to Sf and the plurality of parallel arm resonators Pc and Pd are connected so as to realize a ladder circuit.
- an inductance 206 is connected in parallel with the central series arm resonator Se.
- Inductance elements 207 and 208 are externally attached between the parallel arm resonators Pa and Pb of the transmission-side bandpass filter and the ground potential, respectively.
- Patent Document 1 Japanese Patent Laid-Open No. 2002-353768
- the surface acoustic wave device having the electrode structure described in Patent Document 1 can improve the power resistance.
- the serial arm resonators Sa to Sc, the parallel arm resonators Pa and Pb, the serial arm resonators Sd to Sf, and the parallel arm resonators Pc and Pd of the duplexer 201 shown in FIG. 20 are described in Patent Document 1.
- the power durability is improved, but the out-of-band attenuation is not sufficient and the isolation characteristics are not good. This will be described with reference to FIGS.
- a surface acoustic wave element having an electrode structure described in Patent Document 1 is used as the series arm resonators Sa to Sc, Sd to Sf and parallel arm resonators Pa to Pd, and a 64 ° rotation Y-cut LiNbO
- FIG. 21 shows the frequency characteristic of the transmission side band filter 201A
- FIG. 22 shows the frequency characteristic of the reception side band filter 201B.
- the curves shown below in FIGS. 21 and 22 are frequency characteristics obtained by enlarging the frequency characteristics in the passband.
- FIG. 23 shows the isolation characteristics of the duplexer 201.
- the attenuation in the vicinity of the passband of the high-frequency side of 1920 MHz to 1980 MHz that is the passband of the transmit-side bandpass filter, that is, the passband of the receive-side bandpass filter is at least 40 dB or more is required. It has been. Therefore, in the transmission-side bandpass filter 201A shown in FIG. 20, by connecting the inductance 205 to the series arm resonator Sc, an attenuation pole is provided outside the high band of the passband at the expense of insertion loss, thereby increasing the amount of attenuation. Is planned. However, as is clear from Fig. 21, even if the attenuation pole is formed, the attenuation amount outside the high band of the passband is only strong enough to satisfy 40 dB.
- the attenuation amount is only about 40 dB in the reception side pass band of 2110 MHz to 2170 MHz.
- the characteristics of the duplexer 201 vary with temperature. Therefore, it can be seen that the attenuation in the reception-side passband cannot be surely set to 40 dB or more over the temperature range in which the duplexer 201 is used.
- An object of the present invention is to provide out-of-band attenuation and isolation characteristics that can be achieved by simply increasing power durability in a duplexer configured using a plurality of surface acoustic wave elements in view of the above-described state of the art. It is an object of the present invention to provide a duplexer that can be sufficiently large and a communication apparatus using the duplexer.
- the present invention is a duplexer including a transmission-side band filter and a reception-side band filter in which a plurality of surface acoustic wave resonators are connected so as to constitute a ladder circuit, and the surface acoustic wave resonator 47 ° -58 ° rotation Y-cut X-propagation LiNbO substrate and the LiN
- the Ti base electrode layer is epitaxially grown on the LiN bO substrate, and the A1 electrode layer is under the Ti.
- At least one series arm connected to the series arm of the ladder circuit among the plurality of surface acoustic wave resonators in the reception side band filter.
- a first inductance is inserted in parallel with the resonator, and in the transmission side band filter, among the plurality of surface acoustic wave resonators, the parallel arm of the ladder-type circuit is provided.
- a second inductance is inserted between the connected parallel arm resonator and the ground potential.
- wire bonding used for electrical connection in the first inductance and the second inductance capacitor, a line built in the duplexer, and It is characterized by comprising at least one of the external coil parts.
- a communication device includes a duplexer configured according to the present invention, the duplexer includes an antenna terminal, and a third inductance element is inserted between the antenna terminal and the antenna.
- a capacitor is connected between the connection point between the third inductance and the antenna and the Darnd potential.
- the duplexer according to the present invention includes transmission-side and reception-side band filters in which a plurality of surface acoustic wave resonators are connected to form a ladder circuit.
- Each surface acoustic wave resonator is formed on a Ti base electrode layer formed on a LiNbO substrate, and on the Ti base electrode layer.
- the (111) plane of the A1 electrode layer, the (001) plane or (100) plane of the Ti base electrode layer, and the (001) plane of the LiNbO substrate are parallel to each other. Because each elastic table
- the surface wave resonator has sufficient power durability. Therefore, the power durability of the duplexer can be improved.
- the force is also 47 ° to 58 ° rotated Y-cut X-propagation LiNbO substrate is used.
- a duplexer that is preferably used as a duplexer of, for example, a W-CDMA mobile phone, has excellent power durability, and has a large attenuation and isolation characteristics. Is possible.
- the Ti base electrode layer and the A1 electrode layer are formed by epitaxial growth.
- the (111) plane of the A1 electrode layer and the (001) of the Ti base electrode layer It is easy to make the plane or (100) plane parallel to the (001) plane of LiNbO.
- reception-side bandpass filter a plurality of surface acoustic wave resonances connected in a ladder shape
- a first inductance is inserted in parallel with at least one series arm resonator connected to the series arm, and a parallel connection connected to the parallel arm of the ladder circuit in the transmission-side bandpass filter.
- the second inductance is inserted between the arm resonator and the ground potential, the out-of-band attenuation can be further increased.
- Is used for electrical connection and is composed of at least one of wire bonding, an inductance line built in the duplexer, and an external coil component.
- the first and second inductances can be configured without the need for other parts or other parts. Therefore, the duplexer of the present invention can be provided without increasing the number of parts of the duplexer.
- a communication device includes a duplexer configured according to the present invention, and a third inductance is inserted between the antenna terminal and the antenna, and the third inductance and the antenna A capacitor is connected between the connection point between and the ground potential. Therefore, it is possible to further effectively improve the attenuation outside the passband and the isolation characteristics.
- FIG. 1 is a circuit diagram for explaining a circuit configuration of a duplexer according to a first embodiment of the present invention.
- FIG. 1B is a partially cutaway front view showing a structure of an IDT electrode. It is sectional drawing.
- FIG. 2 is a schematic plan view showing a specific structure of the duplexer of the first embodiment.
- FIG. 3 is a schematic plan sectional view showing the structure of the intermediate height position of the duplexer package shown in FIG. 2.
- FIG. 4 is a schematic plan sectional view of the duplexer of the first embodiment.
- FIG. 5 (a) is a plan view of the surface acoustic wave element chip used in the first embodiment
- FIGS. 5 (b) and (c) show the electrode structures of the series arm resonator and the parallel arm resonator. It is each schematic top view shown.
- FIG. 6 is a diagram showing the frequency characteristics of the transmission-side band filter of the duplexer of the first embodiment.
- FIG. 7 is a diagram showing the frequency characteristics of the reception-side band filter of the duplexer of the first embodiment.
- FIG. 8 is a diagram showing isolation characteristics of the duplexer according to the first embodiment.
- Fig. 9 shows a diagram using a LiNbO substrate with a cut angle of 45 ° prepared for comparison.
- Fig. 10 shows a device using a LiNbO substrate with a cut angular force of 5 ° prepared for comparison.
- Figure 11 shows a duplexer for comparison using a LiNbO substrate with a cut angle of 45 °.
- FIG. 12 is a diagram showing the relationship between the cut angle of the LiNbO substrate and the electromechanical coupling coefficient.
- FIG. 13 is a circuit diagram for explaining a circuit configuration of a duplexer according to a second embodiment.
- FIG. 14 is a diagram showing the frequency characteristics of the transmission-side band filter of the duplexer of the second embodiment.
- FIG. 15 is a diagram showing frequency characteristics of the reception-side band filter of the duplexer of the second exemplary embodiment.
- FIG. 16 is a diagram showing isolation characteristics of the duplexer of the second exemplary embodiment.
- FIG. 17 is a schematic plan view for explaining a specific structure of the duplexer of the second embodiment.
- FIG. 18 is a circuit diagram for explaining a modification of the duplexer of the second embodiment.
- FIG. 19 is a schematic front sectional view for explaining a duplexer according to a modification of the first embodiment.
- FIG. 20 is a circuit diagram for explaining an example of a conventional duplexer.
- FIG. 21 is a diagram showing frequency characteristics of a transmission-side band filter of a conventional duplexer.
- FIG. 22 is a diagram showing frequency characteristics of a reception-side band filter of a conventional duplexer.
- FIG. 23 is a diagram showing isolation characteristics of a conventional duplexer.
- FIG. 1 is a circuit diagram for explaining a circuit configuration of a duplexer according to the first embodiment of the present invention.
- a portion surrounded by a broken line is a duplexer portion of the present embodiment.
- the duplexer 1 has an antenna terminal la.
- a transmitting side band filter 1A and a receiving side band filter 1B are connected to the antenna terminal la.
- the transmission-side band filter 1A is connected to the transmission terminal 3, and the reception-side band filter 1B is connected to the reception terminal 4.
- the transmission-side bandpass filter 1A a plurality of surface acoustic wave resonators realize a ladder-type circuit. Connected so that. That is, the transmission-side bandpass filter 1A includes a plurality of series arm resonators S1 to S3 and parallel arm resonators PI and P2 each of which is a surface wave resonator. Inductances 5 and 6 are connected between the parallel arm resonators PI and P2 and the ground potential. The inductances 5 and 6 constitute a second inductance in the present invention. In this embodiment, the inductances 5 and 6 are constituted by wire bonding or lines arranged in the duplexer 1.
- the reception-side bandpass filter 1B has a structure in which a plurality of surface acoustic wave resonators are connected so as to constitute a ladder circuit.
- a plurality of series arm resonators S4 to S6 and a plurality of parallel arm resonators P3 and P4 are provided.
- a first inductance 7 is connected in parallel with the final-stage series arm resonator S6. By connecting the first inductance 7, an attenuation pole is formed on the low pass band side in the reception side band filter, thereby increasing the attenuation on the low pass band side of the reception band filter 1B. ing.
- the first and second inductances 5 to 7 may be configured by external coil components.
- the first and second inductances 5, 6, and 7 are preferably configured by at least one of a wire bonding and a line in the duplexer. In that case, no external parts such as coil parts are required. Therefore, the first and second inductances 5 to 7 can be configured without increasing the number of parts.
- a third inductance 8 is connected between the antenna terminal la and the antenna 2.
- a capacitor 9 is connected between the connection point between the third inductance 8 and the antenna 2 and the ground potential.
- the third inductance 8 and the capacitor 9 are composed of parts external to the duplexer 1. Examples of such external parts include a chip-type coil and a chip-type capacitor.
- the first and second inductances 5 to 7 are configured by wire bonding and Z or lines in the duplexer.
- the area was reduced to 90.25% and the mounting area was reduced to 80%.
- FIG. 1 (b) is a schematic front sectional view showing the electrode structure in the duplexer 1, and schematically shows a part of the electrodes of the series arm resonator S1 as a representative example of the electrode structure.
- Series arm resonator S1 is 47 ° to 58 ° rotated Y-cut X-propagation LiNbO substrate 11 and LiNbO substrate IDT electrode 12 formed on 11.
- the IDT electrode 12 is on the LiNbO substrate.
- the Ti base electrode layer 12a epitaxially grown and an A1 electrode layer 12b epitaxially grown on the Ti base electrode layer 12a. Also, the (111) plane of the A1 electrode layer 12b, the Ti underlying electrode layer (001) plane or (100) plane, and the (001) plane of the LiNbO substrate are parallel to each other.
- the IDT electrode 12 has the same structure as the IDT electrode of the surface acoustic wave element described in Patent Document 1 described above, it has excellent power durability.
- FIG. 1 (b) the electrode structure of the series arm resonator S1 is schematically shown, but the other series arm resonators S2, S3, S4 to S6 and the parallel arm resonators P1 to P4 are also shown. It is constructed using IDT electrodes with a similar crystal structure. Therefore, the duplexer 1 is excellent in power resistance.
- duplexer 1 of the present embodiment Next, a specific structure of the duplexer 1 of the present embodiment will be described.
- FIG. 2 is a specific plan view of the duplexer according to the first embodiment
- FIG. 3 is a plan sectional view of the intermediate height position.
- the duplexer 1 has a package 31.
- the package 31 is composed of a multilayer package substrate made of insulating ceramics such as alumina. That is, as shown in a schematic cross-sectional view in FIG. 4, the package 31 is a multi-layered knock board in which a plurality of insulating ceramic layers are laminated.
- the nozzle / cage 31 has an opening 31a opened upward. As shown in FIG. 4, the recess 31 a is closed by a lid member 32. In FIG. 2, the lid member 32 is not shown. As shown in FIG. 2, a surface acoustic wave element chip 33 is accommodated in the recess 31a.
- the surface acoustic wave element chip 33 is shown in a plan view in FIG.
- the surface acoustic wave element chip 33 is configured using a rectangular LiNbO substrate 11. As mentioned earlier, the first implementation
- an IDT electrode having a cross-sectional structure shown in Fig. 1 (b) is formed on the LiNbO substrate 11.
- Fig. 5 (a) is a schematic plan view of the electrode structure of the series arm resonator S6. Shown in the figure. That is, the series arm resonator S6 has the IDT electrode 35 and the surface wave propagation of the IDT electrode 35 as shown in FIG. This is a one-terminal-pair surface acoustic wave resonator having reflectors 36 and 37 on both sides in the direction.
- the other series arm resonators S3 and S5 and the parallel arm resonators P1 to P4 are similarly formed by a one-terminal pair surface acoustic wave resonator in which reflectors are arranged on both sides of the IDT electrode in the surface wave propagation direction. It is configured.
- 39, 40 the series arm resonator S2 has a structure in which two series arm resonators S2a and S2b are connected.
- the series arm resonator S1 and the series arm resonator S4 have a structure in which the series arm resonators Sla, Sib and S4a, S4b are connected.
- the series arm resonator or the parallel arm resonator constituting the ladder circuit may be composed of a surface acoustic wave resonator having a single stage configuration or a multistage configuration having an arbitrary number of stages.
- the series arm resonator S1 is formed on the LiNbO substrate 11.
- the second inductances 5 and 6 are more specifically shown in FIG. 3 because of the force constituted by the coil pattern and the bonding wire formed in the knocker.
- the inductances 5 and 6 are constituted by the coil patterns 5a and 6a formed at the intermediate height position of the package 31 and the bonding wires 41 and 42 shown in FIG.
- the first inductance 7 is composed of a coil pattern 7a shown in FIG. 2 and a bonding wire in the package. In this way, by using the coil patterns 5a, 6a, 7a and bonding wires 41, 42, etc. provided in the knocker, the first and second inductances 5, 6, 7 can be obtained without increasing the number of components. Can be configured.
- the duplexer 1 of the present embodiment is configured using a 47 ° to 58 ° rotated Y-cut X-propagation LiNbO substrate 11 that is not only excellent in power durability.
- the above-described series arm resonators S1 to S6 and parallel arm resonators P1 to P4 are converted into surface acoustic wave resonators formed by forming IDT electrodes having the above structure on a 55 ° rotated Y-cut X-propagating LiNbO substrate 11.
- the thickness of the Ti base electrode layer was 10 nm, and the thickness of the A1 electrode layer was 92 nm.
- Tables 1 and 2 show the specifications of the series arm resonators S1 to S6 and the parallel arm resonators P1 to P4.
- Tables 1 and 2 below show the number of electrode fingers of the reflector, the duty ratio of the IDT electrode, the size of the gap between the IDT and the reflector, the crossing width of the IDT electrode, the number of electrode fingers, and the wavelength. ⁇ is shown.
- the transmission-side band filter 1A and the reception-side band filter 1B were prepared so that the center frequency of the transmission-side band filter 1A was 1945 ⁇ and the center frequency of the reception-side band filter 1 ⁇ was 2140MHz.
- a coil pattern with an inductance of 2.7 nH is formed as a coil pattern, and the second inductances 5 and 6 are configured to have an inductance of 3.3 nH by the coil pattern and a bonding wire with an inductance of 0.6 nH. did.
- the inductance value of the coin pattern is set to 0.8 nH
- the inductance value due to the bonding wire is set to 1.2 nH. Therefore, the inductance value of the first inductance 7 is 1. 9nH.
- the value of the third inductance 8 was 3.3 nH, and the capacitance of the capacitor 9 was 1.3 pF.
- the frequency characteristic of the duplexer 1 of this embodiment manufactured in this way was measured. The results are shown in Figs.
- the pass band of the transmission side band filter 1A is 1920 to 1980 MHz, and the pass band of the reception side band filter 1B is 2110 to 2170 MHz.
- FIG. 6 shows the frequency characteristic of the transmission side band filter 1 A
- FIG. 7 shows the frequency characteristic of the reception side band filter 1 B
- FIG. 8 shows the isolation characteristic of the duplexer 1.
- the lower characteristics of FIGS. 6 and 7 are characteristics obtained by expanding the frequency characteristics of the passband according to the scale on the right side of FIGS.
- the attenuation power on the high pass band side is 7 dB, which is much higher than the required characteristic of 40 dB.
- the reception side band filter 1B pass band!
- the attenuation of the isolation characteristic is 48dB or more! That is, as apparent from FIGS. 6 to 8, the duplexer 1 has an out-of-band attenuation that is not only improved in power durability, particularly on the high-pass side of the passband of the transmission-side bandpass filter 1A. It can be seen that the amount of attenuation can be greatly improved, and the isolation characteristics can be greatly improved.
- the out-of-band attenuation and the isolation characteristics are greatly improved as the LiNbO substrate 11 is cut within a range of 47 ° to 58 °.
- the characteristics of the conventional products shown in Fig. 21 to Fig. 23 are that the cut angle of the LiNbO substrate is 64 °.
- a duplexer configured in the same manner as in the above embodiment was produced, and its frequency characteristics were measured. The results are shown in Figs.
- FIG. 9 shows the frequency characteristic of the transmission side band filter of the duplexer of the comparative example
- FIG. 10 shows the frequency characteristic of the reception side band filter
- FIG. 11 shows the isolation characteristic.
- the lower frequency characteristics in Figs. 9 and 10 are the characteristics obtained by expanding the frequency characteristics in the passband according to the scale on the right.
- the attenuation force on the high-pass side of the filter is slightly over 0 dB, and it can be seen that the attenuation is small compared to the duplexer 1 of the above embodiment.
- the isolation characteristics of the reception-side bandpass filter are just over 40dB, which is not sufficient.
- FIG. 9 to FIG. 11 show the results of a comparative example using a LiNbO substrate with a cut angular force of 5 °
- the LiNbO substrate with a cut angle of 64 ° described with reference to FIGS. 20 to 23 was used.
- the duplexer 1 can effectively improve the out-of-band attenuation and the isolation characteristics.
- the cut angle of the LiNbO substrate is in the range of 47 ° to 58 °.
- the cutting angle is reduced, the angle between the axis and the normal of the substrate is reduced, and it is difficult to make an epitaxial growth of the electrode film. Therefore, it is difficult to form an electrode with high power durability.
- the lower limit of the cut angle at which an electrode film can be formed by epitaxy growth was around 47 ° in the experiment by the present inventor. In other words, when a LiNbO substrate with a cut angle of less than 47 ° was used, an electrode film could not be formed by epitaxial growth.
- the lower limit of the cut angle of the LiNbO substrate is 47 °.
- the upper limit of the cut angle that can satisfy the attenuation and the isolation characteristics is 58 °. LiNbO substrate with cut angle exceeding 58 °
- the out-of-band attenuation cannot be made sufficiently large. Therefore, for example, in the transmission-side bandpass filter, the inductance element connected in parallel to the series arm resonator cannot be omitted.
- Figure 12 shows the cut angle of a rotating Y-cut LiNbO substrate and the electromechanical connection of surface waves.
- the electromechanical coupling coefficient ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ decreases as the cut angular force exceeds 0 ° to 60 ° and increases further. Therefore, in order to increase the out-of-band attenuation near the band, it is considered desirable to increase the cut angle and reduce the bandwidth. It was. In other words, conventionally, when expanding the out-of-band attenuation, a rotating Y-cut LiNbO substrate is used.
- the present invention is characterized by the fact that the cut angle is set to 58 ° or less.
- the cut angle is set to 58 ° or less.
- a sufficient out-of-band attenuation amount can be obtained, so that the number of inductance elements used to secure the attenuation amount can be reduced. That is, in the conventional duplexer shown in FIG. 20, in the transmission-side bandpass filter 201A, it is possible to omit the force 205 in which the inductance 205 is connected in parallel to the series arm resonator Sc. Become. Therefore, it is possible to reduce the size of the duplexer.
- the first inductance 7 may be connected in parallel to the series arm resonator S6, thereby further increasing the out-of-band attenuation. Even if a LiNbO substrate with a cut angle of 60 ° or more has been used in the past, in practice, a sufficient out-of-band reduction
- the inductance 205 could not be omitted because the amount of attenuation could not be obtained.
- FIG. 13 is a circuit diagram for explaining a duplexer according to the second embodiment of the present invention.
- the portion surrounded by a broken line is the duplexer component of the present embodiment.
- the duplexer 21 has an antenna terminal 21a.
- a transmitting side band filter 21A and a receiving side band filter 21B are connected to the antenna terminal 21a.
- Transmitter side band filter 21 A is connected to transmit terminal 3;
- receive side bandpass filter 21B is connected to receive terminal 4 Has been.
- Each of the transmission-side band filter 21A and the reception-side band filter 21B has five surface acoustic wave resonators in a ladder-type circuit, similarly to the transmission-side band filter 1A and the reception-side band filter 1B in the first embodiment. It has a structure connected so as to realize. Therefore, the same reference numerals are assigned to the same parts, and the description of the first embodiment is incorporated.
- the second inductance 25 is connected between the parallel arm resonators PI and P2 and the ground potential.
- the second inductance 25 is configured in the duplexer 21! RU
- the second inductance 25 may be configured by wire bonding or a line used in the duplexer 21. However, the second inductance 25 may be configured by a coil component or the like as an external component to the duplexer 21.
- a first inductance 27 is connected in parallel with the final-stage series arm resonator S6. With the connection of the first inductance 27, an attenuation pole is formed on the low pass band side in the reception side band filter 21B. As a result, the attenuation on the low band side of the pass band of the reception side band filter 21B is increased.
- the first inductance 27 may be constituted by a coil component, or may be constituted by wire bonding or a line in a duplexer.
- the third inductance 8 and the capacitor 9 are connected between the antenna terminal 21a and the antenna 2 in the same manner as in the first embodiment.
- the first and second inductances 25 and 27 are configured by at least one of the wire bonding and the line in the duplexer, other coil components are separately provided. do not need. Therefore, the first and second inductances 25 and 27 can be configured without increasing the number of parts.
- the duplexer 21 is a 50 ° rotated Y-cut X-propagating LiNbO substrate.
- the three arm plates are used, and the series arm resonators S1 to S6 and the parallel arm resonators P1 to P4 are configured in the same manner as in the first embodiment.
- Each of the series arm resonators S1 to S6 and the parallel arm resonators P1 to P4 is configured by an IDT electrode having an electrode structure in which a Ti base electrode layer and an A1 electrode layer are stacked. Therefore, for the IDT electrode structure, refer to Fig. 1 (b). The description of the electrode structure in the first embodiment is omitted here.
- the duplexer 21 of the second embodiment was manufactured in the following manner, and the frequency characteristics were measured.
- the series arm resonators SI, S2, and S4 have a two-stage structure of the series arm resonators Sla, Slb, S2a, S2b, and S4a, S4b.
- the second inductance 25 is composed of a bonding wire in the duplexer 21 and the inductance value is 0.6 ⁇ .
- the first inductance 27 is constituted by a coil pattern formed in the duplexer 21 and a bonding wire.
- the inductance value of the coil pattern is 0.8 ⁇
- the resistance value was 1.2 nH.
- the inductance 27 is configured to have an inductance value of 2. OnH.
- FIGS. 14 and 15 show the frequency characteristics of duplexer 21 configured as described above.
- FIG. 14 shows the frequency characteristics of the transmission side band filter of the duplexer 21
- FIG. 15 shows the frequency characteristics of the reception side band filter
- FIG. 16 shows the isolation characteristics.
- the lower frequency characteristics in FIGS. 14 and 15 are characteristics obtained by enlarging the frequency characteristics in the passband according to the scale on the right side.
- the first case is also obtained when a LiNbO substrate with a cut angle of 50 ° is used.
- the amount of attenuation on the high pass band side (reception side band) of the transmission side band filter can be made to exceed 40 dB. Also, from Fig. 15 and Fig. 16, it is clear that the isolation characteristics in the receiving side band greatly exceed 40 dB.
- FIG. 17 is a schematic plan view of the duplexer of the second embodiment.
- the second inductance 27 can be formed by forming the coil pattern 27 a in the package 31 as in the case of the first embodiment.
- the first inductance 25 can be configured using the bonding wire 25a. In this way, the duplexer 21 can be reduced in size without increasing the number of parts by configuring the second and first inductances 25 and 27 with the coil patterns and bonding wires in the package that configures the duplexer 21. Can do.
- the first inductance 27 is a force connected in parallel to the final series arm resonator S6 of the reception-side bandpass filter, as shown in FIG.
- the first inductance 27A may be connected in parallel to the arm resonator S5.
- an inductance is connected between the antenna terminal and the antenna, and A matching circuit with a capacitor connected between the antenna and ground is used.
- a matching circuit in which a capacitor is connected between the antenna terminal and the antenna and an inductance is connected between the antenna and the ground, or a matching circuit in which an inductance is simply connected between the antenna and the ground may be used.
- the same package structure as that of the duplexer 1 is employed.
- the multilayer substrate 42 is used as the substrate / cage material.
- Electrode lands 43, 44 are formed on the upper surface of the multilayer substrate 42.
- the electrode lands 43, 44 are internal electrodes 45, 46 [Kohi, Honore] for inductance configuration arranged in the multilayer substrate 42.
- Electrodes 47a, 47b are more electrically connected than this!
- the inner electrode 45, 46 force S and the via hole electrodes 48a, 48b are connected to the inner electrodes 49, 50 for inductance configuration.
- Internal electrodes 49, 50 are connected to terminal electrodes 52, 53 by via Honoré electrodes 51a, 51b.
- the inductance is configured in the multilayer substrate 42, and the multilayer substrate 42 is configured using the LiNbO substrate 54 by the flip chip bonding method.
- a frame material 55 having the same material force is provided on the upper surface of the multilayer substrate 42 as a whole.
- a lid member 56 is joined to the upper surface of the frame member 55 so as to seal the upper opening of the frame member 55.
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- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/595,235 US20070030094A1 (en) | 2004-08-11 | 2005-08-08 | Duplexer and communication apparatus |
JP2006531615A JPWO2006016544A1 (ja) | 2004-08-11 | 2005-08-08 | デュプレクサ及び通信装置 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2004234547 | 2004-08-11 | ||
JP2004-234547 | 2004-08-11 |
Publications (1)
Publication Number | Publication Date |
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WO2006016544A1 true WO2006016544A1 (ja) | 2006-02-16 |
Family
ID=35839313
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PCT/JP2005/014500 WO2006016544A1 (ja) | 2004-08-11 | 2005-08-08 | デュプレクサ及び通信装置 |
Country Status (3)
Country | Link |
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US (1) | US20070030094A1 (ja) |
JP (1) | JPWO2006016544A1 (ja) |
WO (1) | WO2006016544A1 (ja) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
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US7629863B2 (en) | 2006-05-18 | 2009-12-08 | Fujitsu Media Devices Limited | Filter and duplexer |
EP1988630A4 (en) * | 2006-02-20 | 2010-03-24 | Murata Manufacturing Co | ELASTIC SURFACE WAVING DEVICE |
EP2228904A1 (en) | 2009-03-09 | 2010-09-15 | Nihon Dempa Kogyo Co., Ltd. | Low band side filter of duplexer, high band side filter of duplexer, and duplexer |
WO2011089746A1 (ja) * | 2010-01-20 | 2011-07-28 | 株式会社村田製作所 | 分波器 |
WO2014045726A1 (ja) * | 2012-09-19 | 2014-03-27 | 株式会社村田製作所 | フィルタ装置 |
JPWO2018117231A1 (ja) * | 2016-12-22 | 2019-07-18 | 株式会社村田製作所 | 弾性表面波共振子、弾性表面波フィルタおよびデュプレクサ |
WO2022173039A1 (ja) * | 2021-02-15 | 2022-08-18 | 株式会社村田製作所 | 弾性波装置 |
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WO2006046545A1 (ja) * | 2004-10-26 | 2006-05-04 | Kyocera Corporation | 弾性表面波素子及び通信装置 |
WO2007094139A1 (ja) * | 2006-02-13 | 2007-08-23 | Murata Manufacturing Co., Ltd. | Sawフィルタ装置 |
DE102007046728B4 (de) * | 2007-09-28 | 2013-08-22 | Epcos Ag | Elektrisches Bauelement |
US10284178B2 (en) * | 2016-03-03 | 2019-05-07 | Qorvo Us, Inc. | BAW/SAW-assisted LC filters and multiplexers |
JP6949552B2 (ja) * | 2017-05-18 | 2021-10-13 | 太陽誘電株式会社 | 弾性波フィルタおよびマルチプレクサ |
US11626891B2 (en) | 2020-06-23 | 2023-04-11 | Qorvo Us, Inc. | Multiplexing circuits with BAW resonators as network elements for higher performance |
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EP2228904A1 (en) | 2009-03-09 | 2010-09-15 | Nihon Dempa Kogyo Co., Ltd. | Low band side filter of duplexer, high band side filter of duplexer, and duplexer |
US8339217B2 (en) | 2009-03-09 | 2012-12-25 | Nihon Dempa Kogyo Co., Ltd. | Low band side filter of duplexer, high band side filter of duplexer, and duplexer |
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JPWO2018117231A1 (ja) * | 2016-12-22 | 2019-07-18 | 株式会社村田製作所 | 弾性表面波共振子、弾性表面波フィルタおよびデュプレクサ |
WO2022173039A1 (ja) * | 2021-02-15 | 2022-08-18 | 株式会社村田製作所 | 弾性波装置 |
Also Published As
Publication number | Publication date |
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US20070030094A1 (en) | 2007-02-08 |
JPWO2006016544A1 (ja) | 2008-05-01 |
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