WO2006013387A3 - Utilisation de sondes de mesure de surface - Google Patents
Utilisation de sondes de mesure de surface Download PDFInfo
- Publication number
- WO2006013387A3 WO2006013387A3 PCT/GB2005/003095 GB2005003095W WO2006013387A3 WO 2006013387 A3 WO2006013387 A3 WO 2006013387A3 GB 2005003095 W GB2005003095 W GB 2005003095W WO 2006013387 A3 WO2006013387 A3 WO 2006013387A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- artefact
- probe
- measurements
- surface measurement
- measurement probes
- Prior art date
Links
- 239000000523 sample Substances 0.000 title abstract 5
- 238000004441 surface measurement Methods 0.000 title abstract 3
- 238000000034 method Methods 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Pens And Brushes (AREA)
- Prostheses (AREA)
- Dental Preparations (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE602005005839.7T DE602005005839T3 (de) | 2004-08-06 | 2005-08-05 | Verwendung von oberflächenmesssonden |
US11/658,162 US7526873B2 (en) | 2004-08-06 | 2005-08-05 | Use of surface measurement probes |
EP05772904.8A EP1792139B2 (fr) | 2004-08-06 | 2005-08-05 | Utilisation de sondes de mesure de surface |
JP2007524401A JP2008509386A (ja) | 2004-08-06 | 2005-08-05 | 表面測定用プローブの使用法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB0417536.0A GB0417536D0 (en) | 2004-08-06 | 2004-08-06 | The use of surface measurement probes |
GB0417536.0 | 2004-08-06 |
Publications (3)
Publication Number | Publication Date |
---|---|
WO2006013387A2 WO2006013387A2 (fr) | 2006-02-09 |
WO2006013387A3 true WO2006013387A3 (fr) | 2006-03-23 |
WO2006013387A9 WO2006013387A9 (fr) | 2007-03-15 |
Family
ID=32982635
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/GB2005/003095 WO2006013387A2 (fr) | 2004-08-06 | 2005-08-05 | Utilisation de sondes de mesure de surface |
Country Status (8)
Country | Link |
---|---|
US (1) | US7526873B2 (fr) |
EP (1) | EP1792139B2 (fr) |
JP (1) | JP2008509386A (fr) |
CN (1) | CN100460814C (fr) |
AT (1) | ATE391284T1 (fr) |
DE (1) | DE602005005839T3 (fr) |
GB (1) | GB0417536D0 (fr) |
WO (1) | WO2006013387A2 (fr) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0608235D0 (en) * | 2006-04-26 | 2006-06-07 | Renishaw Plc | Differential calibration |
GB0703423D0 (en) | 2007-02-22 | 2007-04-04 | Renishaw Plc | Calibration method and apparatus |
JP2008304332A (ja) * | 2007-06-07 | 2008-12-18 | Tokyo Seimitsu Co Ltd | 表面粗さ/形状測定装置及び表面粗さ/形状測定方法 |
US20110060542A1 (en) * | 2007-06-28 | 2011-03-10 | Hexagon Metrology S.P.A. | Method for determining dynamic errors in a measuring machine |
DE102009004982A1 (de) * | 2009-01-14 | 2010-07-22 | Höfler Maschinenbau GmbH | Messverfahren und Messvorrichtung |
GB0900878D0 (en) | 2009-01-20 | 2009-03-04 | Renishaw Plc | Method for optimising a measurement cycle |
CN102072701A (zh) * | 2010-11-23 | 2011-05-25 | 苏州江城数控精密机械有限公司 | 一种检测零件尺寸的方法及装置 |
JP6345171B2 (ja) | 2012-04-18 | 2018-06-20 | レニショウ パブリック リミテッド カンパニーRenishaw Public Limited Company | 工作機械における測定方法および対応する工作機械装置 |
WO2013156765A1 (fr) | 2012-04-18 | 2013-10-24 | Renishaw Plc | Procédé de balayage analogique de mesures sur une machine-outil et appareil de machine-outil correspondant |
WO2013156767A1 (fr) | 2012-04-18 | 2013-10-24 | Renishaw Plc | Procédé pour la recherche d'une caractéristique au moyen d'une machine-outil |
GB201316329D0 (en) * | 2013-09-13 | 2013-10-30 | Renishaw Plc | A Method of Using a scanning probe |
EP3077831B1 (fr) * | 2013-12-07 | 2021-08-25 | Bruker Nano, Inc. | Mesure de force avec détermination de ligne de base en temps réel |
DE102015006636A1 (de) * | 2015-05-22 | 2016-11-24 | Blum-Novotest Gmbh | Verfahren und System zur Erfassung einer Werkstückkontur und zur Korrektur eines SOLL-Pfades für die Bearbeitung eines Werkstücks in einer Werkzeugmaschine |
JP6608726B2 (ja) * | 2016-02-18 | 2019-11-20 | 株式会社東京精密 | 位置決め測定システム |
DE102019122650A1 (de) * | 2019-08-22 | 2021-02-25 | M & H Inprocess Messtechnik Gmbh | Messsystem |
US11644299B2 (en) * | 2020-12-31 | 2023-05-09 | Mitutoyo Corporation | Inductive position sensor signal gain control for coordinate measuring machine probe |
WO2025003771A1 (fr) * | 2023-06-29 | 2025-01-02 | Inziv Ltd. | Inspection rapide d'un dispositif sous test |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4991304A (en) * | 1987-06-11 | 1991-02-12 | Renishaw | Workpiece inspection method |
EP0599513A1 (fr) * | 1992-11-20 | 1994-06-01 | RENISHAW plc | Procédé de mesure pour pièces à usiner utilisant une sonde en contact avec la surface |
US20020029119A1 (en) * | 2000-05-23 | 2002-03-07 | Werner Lotze | Correction method for a coordinate measuring apparatus |
WO2004005849A1 (fr) * | 2002-07-04 | 2004-01-15 | Renishaw Plc | Procede d'etalonnage d'un systeme de balayage |
US20040055170A1 (en) * | 1999-04-08 | 2004-03-25 | Renishaw Plc | Use of surface measuring probes |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2242355C2 (de) | 1972-08-29 | 1974-10-17 | Fa. Carl Zeiss, 7920 Heidenheim | Elektronischer Mehrkoordinatentaster |
US4118871A (en) * | 1978-06-13 | 1978-10-10 | Kearney & Trecker Corporation | Binary inspection probe for numerically controlled machine tools |
GB8624191D0 (en) * | 1986-10-08 | 1986-11-12 | Renishaw Plc | Datuming of analogue measurement probes |
US5390424A (en) | 1990-01-25 | 1995-02-21 | Renishaw Metrology Limited | Analogue probe |
GB9110818D0 (en) * | 1991-05-21 | 1991-07-10 | Renishaw Metrology Ltd | A method of measuring workpieces using a surface contacting measuring probe |
DE4134371A1 (de) * | 1991-10-17 | 1993-04-22 | Zeiss Carl Fa | Verfahren zur messung der effektiven momentanposition eines von einem schlitten getragenen tastelementes bzw. werkzeugs |
EP0729005B1 (fr) * | 1995-02-23 | 1998-08-05 | Institut Für Fertigungstechnik Der Tu Graz | Dispositif de mesure pour la vérification de la précision géométrique et dynamique des machines-outil NC et des robots industriels |
DE29612861U1 (de) | 1996-07-24 | 1996-09-12 | Fa. Carl Zeiss, 89518 Heidenheim | Koordinatenmeßgerät mit Meßzeitoptimierung |
GB9907868D0 (en) * | 1999-04-08 | 1999-06-02 | Renishaw Plc | Method of calibrating a scanning system |
JP2002039743A (ja) * | 2000-07-28 | 2002-02-06 | Mori Seiki Co Ltd | 測定機 |
GB0228371D0 (en) * | 2002-12-05 | 2003-01-08 | Leland E C E | Workpiece inspection method |
GB0329098D0 (en) * | 2003-12-16 | 2004-01-21 | Renishaw Plc | Method of calibrating a scanning system |
DE102004007968B4 (de) | 2004-02-18 | 2006-02-09 | Carl Zeiss Industrielle Messtechnik Gmbh | Verfahren zum Antasten eines Werkstücks mit einem Koordinatenmessgerät |
DE102005003321A1 (de) * | 2005-01-18 | 2006-07-27 | Carl Zeiss Industrielle Messtechnik Gmbh | Verfahren zum Bestimmen einer Raumkoordinate eines Messpunktes an einem Messobjekt sowie entsprechendes Koordinatenmessgerät |
-
2004
- 2004-08-06 GB GBGB0417536.0A patent/GB0417536D0/en not_active Ceased
-
2005
- 2005-08-05 AT AT05772904T patent/ATE391284T1/de not_active IP Right Cessation
- 2005-08-05 US US11/658,162 patent/US7526873B2/en active Active
- 2005-08-05 WO PCT/GB2005/003095 patent/WO2006013387A2/fr active IP Right Grant
- 2005-08-05 EP EP05772904.8A patent/EP1792139B2/fr active Active
- 2005-08-05 CN CNB2005800267219A patent/CN100460814C/zh active Active
- 2005-08-05 DE DE602005005839.7T patent/DE602005005839T3/de active Active
- 2005-08-05 JP JP2007524401A patent/JP2008509386A/ja active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4991304A (en) * | 1987-06-11 | 1991-02-12 | Renishaw | Workpiece inspection method |
EP0599513A1 (fr) * | 1992-11-20 | 1994-06-01 | RENISHAW plc | Procédé de mesure pour pièces à usiner utilisant une sonde en contact avec la surface |
US20040055170A1 (en) * | 1999-04-08 | 2004-03-25 | Renishaw Plc | Use of surface measuring probes |
US20020029119A1 (en) * | 2000-05-23 | 2002-03-07 | Werner Lotze | Correction method for a coordinate measuring apparatus |
WO2004005849A1 (fr) * | 2002-07-04 | 2004-01-15 | Renishaw Plc | Procede d'etalonnage d'un systeme de balayage |
Also Published As
Publication number | Publication date |
---|---|
CN1993600A (zh) | 2007-07-04 |
US7526873B2 (en) | 2009-05-05 |
EP1792139A2 (fr) | 2007-06-06 |
EP1792139B1 (fr) | 2008-04-02 |
WO2006013387A2 (fr) | 2006-02-09 |
WO2006013387A9 (fr) | 2007-03-15 |
EP1792139B2 (fr) | 2014-02-19 |
DE602005005839T2 (de) | 2009-04-02 |
DE602005005839D1 (de) | 2008-05-15 |
US20080028626A1 (en) | 2008-02-07 |
ATE391284T1 (de) | 2008-04-15 |
JP2008509386A (ja) | 2008-03-27 |
DE602005005839T3 (de) | 2014-04-10 |
CN100460814C (zh) | 2009-02-11 |
GB0417536D0 (en) | 2004-09-08 |
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