WO2006053062A2 - Tin alloy electroplating system - Google Patents
Tin alloy electroplating system Download PDFInfo
- Publication number
- WO2006053062A2 WO2006053062A2 PCT/US2005/040624 US2005040624W WO2006053062A2 WO 2006053062 A2 WO2006053062 A2 WO 2006053062A2 US 2005040624 W US2005040624 W US 2005040624W WO 2006053062 A2 WO2006053062 A2 WO 2006053062A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- tin
- substituted
- unsubstituted
- ionic
- anolyte
- Prior art date
Links
- 229910001128 Sn alloy Inorganic materials 0.000 title claims abstract description 100
- 238000009713 electroplating Methods 0.000 title claims abstract description 73
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims abstract description 81
- 238000007747 plating Methods 0.000 claims abstract description 46
- 229910002065 alloy metal Inorganic materials 0.000 claims abstract description 39
- 239000008139 complexing agent Substances 0.000 claims abstract description 38
- 239000002253 acid Substances 0.000 claims abstract description 31
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 29
- 238000000034 method Methods 0.000 claims abstract description 20
- 229910052718 tin Inorganic materials 0.000 claims description 76
- 239000012528 membrane Substances 0.000 claims description 66
- -1 alkane sulfonic acids Chemical class 0.000 claims description 36
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 11
- 239000010949 copper Substances 0.000 claims description 11
- 229910052802 copper Inorganic materials 0.000 claims description 11
- 229910052709 silver Inorganic materials 0.000 claims description 10
- 239000004332 silver Substances 0.000 claims description 10
- 229910052797 bismuth Inorganic materials 0.000 claims description 9
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 9
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 8
- 229910021645 metal ion Inorganic materials 0.000 claims description 8
- 239000011701 zinc Substances 0.000 claims description 8
- 229910052725 zinc Inorganic materials 0.000 claims description 8
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 7
- 229910052738 indium Inorganic materials 0.000 claims description 7
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 7
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 claims description 6
- 150000002460 imidazoles Chemical class 0.000 claims description 6
- 150000002475 indoles Chemical class 0.000 claims description 6
- 150000003216 pyrazines Chemical class 0.000 claims description 6
- 150000003217 pyrazoles Chemical class 0.000 claims description 6
- 150000003222 pyridines Chemical class 0.000 claims description 6
- 150000003248 quinolines Chemical class 0.000 claims description 6
- 150000003460 sulfonic acids Chemical class 0.000 claims description 5
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 claims description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 claims description 4
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 claims description 4
- DTQVDTLACAAQTR-UHFFFAOYSA-N Trifluoroacetic acid Chemical compound OC(=O)C(F)(F)F DTQVDTLACAAQTR-UHFFFAOYSA-N 0.000 claims description 4
- 229940111121 antirheumatic drug quinolines Drugs 0.000 claims description 4
- 150000001875 compounds Chemical class 0.000 claims description 3
- 229910000147 aluminium phosphate Inorganic materials 0.000 claims description 2
- 229920000137 polyphosphoric acid Polymers 0.000 claims description 2
- 239000011135 tin Substances 0.000 description 66
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical compound O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 20
- 229910052751 metal Inorganic materials 0.000 description 18
- 239000002184 metal Substances 0.000 description 18
- 239000011133 lead Substances 0.000 description 16
- 238000007654 immersion Methods 0.000 description 15
- 150000001768 cations Chemical class 0.000 description 12
- 125000000217 alkyl group Chemical group 0.000 description 10
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 9
- 229910001432 tin ion Inorganic materials 0.000 description 9
- 150000001450 anions Chemical class 0.000 description 8
- 125000004432 carbon atom Chemical group C* 0.000 description 8
- 230000008021 deposition Effects 0.000 description 8
- 229910052739 hydrogen Inorganic materials 0.000 description 8
- 239000001257 hydrogen Substances 0.000 description 8
- 239000000243 solution Substances 0.000 description 8
- 239000000654 additive Substances 0.000 description 7
- 239000000758 substrate Substances 0.000 description 7
- 239000004094 surface-active agent Substances 0.000 description 7
- 150000007513 acids Chemical class 0.000 description 6
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 6
- 239000000956 alloy Substances 0.000 description 5
- 238000005275 alloying Methods 0.000 description 5
- 125000004181 carboxyalkyl group Chemical group 0.000 description 5
- 125000002768 hydroxyalkyl group Chemical group 0.000 description 5
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 5
- PZOUSPYUWWUPPK-UHFFFAOYSA-N indole Natural products CC1=CC=CC2=C1C=CN2 PZOUSPYUWWUPPK-UHFFFAOYSA-N 0.000 description 5
- 230000005012 migration Effects 0.000 description 5
- 238000013508 migration Methods 0.000 description 5
- 239000000080 wetting agent Substances 0.000 description 5
- SIKJAQJRHWYJAI-UHFFFAOYSA-N Indole Chemical compound C1=CC=C2NC=CC2=C1 SIKJAQJRHWYJAI-UHFFFAOYSA-N 0.000 description 4
- 125000002252 acyl group Chemical group 0.000 description 4
- 238000007792 addition Methods 0.000 description 4
- 229910045601 alloy Inorganic materials 0.000 description 4
- 150000001413 amino acids Chemical class 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 4
- 229920002554 vinyl polymer Polymers 0.000 description 4
- DTBDAFLSBDGPEA-UHFFFAOYSA-N 3-methylquinoline Chemical compound C1=CC=CC2=CC(C)=CN=C21 DTBDAFLSBDGPEA-UHFFFAOYSA-N 0.000 description 3
- ONYNOPPOVKYGRS-UHFFFAOYSA-N 6-methylindole Natural products CC1=CC=C2C=CNC2=C1 ONYNOPPOVKYGRS-UHFFFAOYSA-N 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 3
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical compound CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- 229920000557 Nafion® Polymers 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- 150000007933 aliphatic carboxylic acids Chemical class 0.000 description 3
- 125000003368 amide group Chemical group 0.000 description 3
- 150000001412 amines Chemical class 0.000 description 3
- 125000004103 aminoalkyl group Chemical group 0.000 description 3
- SMWDFEZZVXVKRB-UHFFFAOYSA-N anhydrous quinoline Natural products N1=CC=CC2=CC=CC=C21 SMWDFEZZVXVKRB-UHFFFAOYSA-N 0.000 description 3
- 239000007864 aqueous solution Substances 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- 125000002091 cationic group Chemical group 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 230000007797 corrosion Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000007613 environmental effect Effects 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 230000036541 health Effects 0.000 description 3
- 235000014666 liquid concentrate Nutrition 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 150000003839 salts Chemical class 0.000 description 3
- ZTNANFDSJRRZRJ-UHFFFAOYSA-N 2,4-dimethylquinoline Chemical compound C1=CC=CC2=NC(C)=CC(C)=C21 ZTNANFDSJRRZRJ-UHFFFAOYSA-N 0.000 description 2
- LCZUOKDVTBMCMX-UHFFFAOYSA-N 2,5-Dimethylpyrazine Chemical compound CC1=CN=C(C)C=N1 LCZUOKDVTBMCMX-UHFFFAOYSA-N 0.000 description 2
- JJPSZKIOGBRMHK-UHFFFAOYSA-N 2,6-dimethylquinoline Chemical compound N1=C(C)C=CC2=CC(C)=CC=C21 JJPSZKIOGBRMHK-UHFFFAOYSA-N 0.000 description 2
- QXKPLNCZSFACPU-UHFFFAOYSA-N 2,7-dimethylquinoline Chemical compound C1=CC(C)=NC2=CC(C)=CC=C21 QXKPLNCZSFACPU-UHFFFAOYSA-N 0.000 description 2
- MBDOYVRWFFCFHM-UHFFFAOYSA-N 2-hexenal Chemical compound CCCC=CC=O MBDOYVRWFFCFHM-UHFFFAOYSA-N 0.000 description 2
- BHNHHSOHWZKFOX-UHFFFAOYSA-N 2-methyl-1H-indole Chemical compound C1=CC=C2NC(C)=CC2=C1 BHNHHSOHWZKFOX-UHFFFAOYSA-N 0.000 description 2
- ALHUXMDEZNLFTA-UHFFFAOYSA-N 2-methylquinoxaline Chemical compound C1=CC=CC2=NC(C)=CN=C21 ALHUXMDEZNLFTA-UHFFFAOYSA-N 0.000 description 2
- FVVXWRGARUACNW-UHFFFAOYSA-N 3-methylisoquinoline Chemical compound C1=CC=C2C=NC(C)=CC2=C1 FVVXWRGARUACNW-UHFFFAOYSA-N 0.000 description 2
- ITQTTZVARXURQS-UHFFFAOYSA-N 3-methylpyridine Chemical compound CC1=CC=CN=C1 ITQTTZVARXURQS-UHFFFAOYSA-N 0.000 description 2
- FKNQCJSGGFJEIZ-UHFFFAOYSA-N 4-methylpyridine Chemical compound CC1=CC=NC=C1 FKNQCJSGGFJEIZ-UHFFFAOYSA-N 0.000 description 2
- MUDSDYNRBDKLGK-UHFFFAOYSA-N 4-methylquinoline Chemical compound C1=CC=C2C(C)=CC=NC2=C1 MUDSDYNRBDKLGK-UHFFFAOYSA-N 0.000 description 2
- CQLOYHZZZCWHSG-UHFFFAOYSA-N 5-methylquinoxaline Chemical compound C1=CN=C2C(C)=CC=CC2=N1 CQLOYHZZZCWHSG-UHFFFAOYSA-N 0.000 description 2
- LUYISICIYVKBTA-UHFFFAOYSA-N 6-methylquinoline Chemical compound N1=CC=CC2=CC(C)=CC=C21 LUYISICIYVKBTA-UHFFFAOYSA-N 0.000 description 2
- KDYVCOSVYOSHOL-UHFFFAOYSA-N 7-methylquinoline Chemical compound C1=CC=NC2=CC(C)=CC=C21 KDYVCOSVYOSHOL-UHFFFAOYSA-N 0.000 description 2
- JRLTTZUODKEYDH-UHFFFAOYSA-N 8-methylquinoline Chemical compound C1=CN=C2C(C)=CC=CC2=C1 JRLTTZUODKEYDH-UHFFFAOYSA-N 0.000 description 2
- HGINCPLSRVDWNT-UHFFFAOYSA-N Acrolein Chemical compound C=CC=O HGINCPLSRVDWNT-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- AFVFQIVMOAPDHO-UHFFFAOYSA-N Methanesulfonic acid Chemical compound CS(O)(=O)=O AFVFQIVMOAPDHO-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- KYQCOXFCLRTKLS-UHFFFAOYSA-N Pyrazine Chemical compound C1=CN=CC=N1 KYQCOXFCLRTKLS-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- 239000004809 Teflon Substances 0.000 description 2
- 229920006362 Teflon® Polymers 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- 150000001299 aldehydes Chemical class 0.000 description 2
- 125000001931 aliphatic group Chemical group 0.000 description 2
- 125000003545 alkoxy group Chemical group 0.000 description 2
- 125000005233 alkylalcohol group Chemical group 0.000 description 2
- 125000000129 anionic group Chemical group 0.000 description 2
- 125000003118 aryl group Chemical group 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- PFKFTWBEEFSNDU-UHFFFAOYSA-N carbonyldiimidazole Chemical compound C1=CN=CN1C(=O)N1C=CN=C1 PFKFTWBEEFSNDU-UHFFFAOYSA-N 0.000 description 2
- 239000007795 chemical reaction product Substances 0.000 description 2
- 239000007859 condensation product Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 150000002334 glycols Chemical class 0.000 description 2
- 150000004677 hydrates Chemical class 0.000 description 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 2
- RKJUIXBNRJVNHR-UHFFFAOYSA-N indolenine Natural products C1=CC=C2CC=NC2=C1 RKJUIXBNRJVNHR-UHFFFAOYSA-N 0.000 description 2
- AWJUIBRHMBBTKR-UHFFFAOYSA-N isoquinoline Chemical compound C1=NC=CC2=CC=CC=C21 AWJUIBRHMBBTKR-UHFFFAOYSA-N 0.000 description 2
- 230000000116 mitigating effect Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 230000001737 promoting effect Effects 0.000 description 2
- 125000001453 quaternary ammonium group Chemical group 0.000 description 2
- SMUQFGGVLNAIOZ-UHFFFAOYSA-N quinaldine Chemical compound C1=CC=CC2=NC(C)=CC=C21 SMUQFGGVLNAIOZ-UHFFFAOYSA-N 0.000 description 2
- 239000011541 reaction mixture Substances 0.000 description 2
- 238000010992 reflux Methods 0.000 description 2
- SQGYOTSLMSWVJD-UHFFFAOYSA-N silver(1+) nitrate Chemical compound [Ag+].[O-]N(=O)=O SQGYOTSLMSWVJD-UHFFFAOYSA-N 0.000 description 2
- ZFRKQXVRDFCRJG-UHFFFAOYSA-N skatole Chemical compound C1=CC=C2C(C)=CNC2=C1 ZFRKQXVRDFCRJG-UHFFFAOYSA-N 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- UMGDCJDMYOKAJW-UHFFFAOYSA-N thiourea Chemical compound NC(N)=S UMGDCJDMYOKAJW-UHFFFAOYSA-N 0.000 description 2
- VNDYJBBGRKZCSX-UHFFFAOYSA-L zinc bromide Chemical compound Br[Zn]Br VNDYJBBGRKZCSX-UHFFFAOYSA-L 0.000 description 2
- JIAARYAFYJHUJI-UHFFFAOYSA-L zinc dichloride Chemical compound [Cl-].[Cl-].[Zn+2] JIAARYAFYJHUJI-UHFFFAOYSA-L 0.000 description 2
- BHHYHSUAOQUXJK-UHFFFAOYSA-L zinc fluoride Chemical compound F[Zn]F BHHYHSUAOQUXJK-UHFFFAOYSA-L 0.000 description 2
- ONDPHDOFVYQSGI-UHFFFAOYSA-N zinc nitrate Chemical compound [Zn+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O ONDPHDOFVYQSGI-UHFFFAOYSA-N 0.000 description 2
- GIWQSPITLQVMSG-UHFFFAOYSA-N 1,2-dimethylimidazole Chemical compound CC1=NC=CN1C GIWQSPITLQVMSG-UHFFFAOYSA-N 0.000 description 1
- BJMUOUXGBFNLSN-UHFFFAOYSA-N 1,2-dimethylindole Chemical compound C1=CC=C2N(C)C(C)=CC2=C1 BJMUOUXGBFNLSN-UHFFFAOYSA-N 0.000 description 1
- BGJSXRVXTHVRSN-UHFFFAOYSA-N 1,3,5-trioxane Chemical compound C1OCOCO1 BGJSXRVXTHVRSN-UHFFFAOYSA-N 0.000 description 1
- ZXSQEZNORDWBGZ-UHFFFAOYSA-N 1,3-dihydropyrrolo[2,3-b]pyridin-2-one Chemical compound C1=CN=C2NC(=O)CC2=C1 ZXSQEZNORDWBGZ-UHFFFAOYSA-N 0.000 description 1
- WGJCBBASTRWVJL-UHFFFAOYSA-N 1,3-thiazolidine-2-thione Chemical class SC1=NCCS1 WGJCBBASTRWVJL-UHFFFAOYSA-N 0.000 description 1
- QYIGOGBGVKONDY-UHFFFAOYSA-N 1-(2-bromo-5-chlorophenyl)-3-methylpyrazole Chemical compound N1=C(C)C=CN1C1=CC(Cl)=CC=C1Br QYIGOGBGVKONDY-UHFFFAOYSA-N 0.000 description 1
- RMSOEGBYNWXXBG-UHFFFAOYSA-N 1-chloronaphthalen-2-ol Chemical compound C1=CC=CC2=C(Cl)C(O)=CC=C21 RMSOEGBYNWXXBG-UHFFFAOYSA-N 0.000 description 1
- KVGOXGQSTGQXDD-UHFFFAOYSA-N 1-decane-sulfonic-acid Chemical compound CCCCCCCCCCS(O)(=O)=O KVGOXGQSTGQXDD-UHFFFAOYSA-N 0.000 description 1
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- OSSNTDFYBPYIEC-UHFFFAOYSA-N 1-ethenylimidazole Chemical compound C=CN1C=CN=C1 OSSNTDFYBPYIEC-UHFFFAOYSA-N 0.000 description 1
- IWDFHWZHHOSSGR-UHFFFAOYSA-N 1-ethylimidazole Chemical compound CCN1C=CN=C1 IWDFHWZHHOSSGR-UHFFFAOYSA-N 0.000 description 1
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- YDMVPJZBYSWOOP-UHFFFAOYSA-N 1h-pyrazole-3,5-dicarboxylic acid Chemical compound OC(=O)C=1C=C(C(O)=O)NN=1 YDMVPJZBYSWOOP-UHFFFAOYSA-N 0.000 description 1
- PYFVEIDRTLBMHG-UHFFFAOYSA-N 2,3-dimethyl-1h-indole Chemical compound C1=CC=C2C(C)=C(C)NC2=C1 PYFVEIDRTLBMHG-UHFFFAOYSA-N 0.000 description 1
- FKHNZQFCDGOQGV-UHFFFAOYSA-N 2,3-dimethylquinoxaline Chemical compound C1=CC=C2N=C(C)C(C)=NC2=C1 FKHNZQFCDGOQGV-UHFFFAOYSA-N 0.000 description 1
- ZFLFWZRPMDXJCW-UHFFFAOYSA-N 2,5-dimethyl-1h-indole Chemical compound CC1=CC=C2NC(C)=CC2=C1 ZFLFWZRPMDXJCW-UHFFFAOYSA-N 0.000 description 1
- 239000001934 2,5-dimethylpyrazine Substances 0.000 description 1
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- 229940093475 2-ethoxyethanol Drugs 0.000 description 1
- BOZRCGLDOHDZBP-UHFFFAOYSA-N 2-ethylhexanoic acid;tin Chemical compound [Sn].CCCCC(CC)C(O)=O BOZRCGLDOHDZBP-UHFFFAOYSA-N 0.000 description 1
- CSDSSGBPEUDDEE-UHFFFAOYSA-N 2-formylpyridine Chemical compound O=CC1=CC=CC=N1 CSDSSGBPEUDDEE-UHFFFAOYSA-N 0.000 description 1
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- BPSNETAIJADFTO-UHFFFAOYSA-N 2-pyridinylacetic acid Chemical compound OC(=O)CC1=CC=CC=N1 BPSNETAIJADFTO-UHFFFAOYSA-N 0.000 description 1
- RYKLZUPYJFFNRR-UHFFFAOYSA-N 3-hydroxypiperidin-2-one Chemical compound OC1CCCNC1=O RYKLZUPYJFFNRR-UHFFFAOYSA-N 0.000 description 1
- XKVUYEYANWFIJX-UHFFFAOYSA-N 5-methyl-1h-pyrazole Chemical compound CC1=CC=NN1 XKVUYEYANWFIJX-UHFFFAOYSA-N 0.000 description 1
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- 239000001640 5-methylquinoxaline Substances 0.000 description 1
- XHLKOHSAWQPOFO-UHFFFAOYSA-N 5-phenyl-1h-imidazole Chemical compound N1C=NC=C1C1=CC=CC=C1 XHLKOHSAWQPOFO-UHFFFAOYSA-N 0.000 description 1
- KGWPHCDTOLQQEP-UHFFFAOYSA-N 7-methylindole Chemical compound CC1=CC=CC2=C1NC=C2 KGWPHCDTOLQQEP-UHFFFAOYSA-N 0.000 description 1
- 229920013683 Celanese Polymers 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 description 1
- 239000005751 Copper oxide Substances 0.000 description 1
- 229910021594 Copper(II) fluoride Inorganic materials 0.000 description 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
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- YJGJRYWNNHUESM-UHFFFAOYSA-J triacetyloxystannyl acetate Chemical compound [Sn+4].CC([O-])=O.CC([O-])=O.CC([O-])=O.CC([O-])=O YJGJRYWNNHUESM-UHFFFAOYSA-J 0.000 description 1
- JKNHZOAONLKYQL-UHFFFAOYSA-K tribromoindigane Chemical compound Br[In](Br)Br JKNHZOAONLKYQL-UHFFFAOYSA-K 0.000 description 1
- ITMCEJHCFYSIIV-UHFFFAOYSA-M triflate Chemical compound [O-]S(=O)(=O)C(F)(F)F ITMCEJHCFYSIIV-UHFFFAOYSA-M 0.000 description 1
- QUTYHQJYVDNJJA-UHFFFAOYSA-K trisilver;2-hydroxypropane-1,2,3-tricarboxylate Chemical compound [Ag+].[Ag+].[Ag+].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O QUTYHQJYVDNJJA-UHFFFAOYSA-K 0.000 description 1
- WGIWBXUNRXCYRA-UHFFFAOYSA-H trizinc;2-hydroxypropane-1,2,3-tricarboxylate Chemical compound [Zn+2].[Zn+2].[Zn+2].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O.[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O WGIWBXUNRXCYRA-UHFFFAOYSA-H 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 150000003751 zinc Chemical class 0.000 description 1
- 239000004246 zinc acetate Substances 0.000 description 1
- 229960000314 zinc acetate Drugs 0.000 description 1
- 229940102001 zinc bromide Drugs 0.000 description 1
- 239000011592 zinc chloride Substances 0.000 description 1
- 235000005074 zinc chloride Nutrition 0.000 description 1
- 229960001939 zinc chloride Drugs 0.000 description 1
- 239000011746 zinc citrate Substances 0.000 description 1
- 235000006076 zinc citrate Nutrition 0.000 description 1
- 229940068475 zinc citrate Drugs 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
- NWONKYPBYAMBJT-UHFFFAOYSA-L zinc sulfate Chemical compound [Zn+2].[O-]S([O-])(=O)=O NWONKYPBYAMBJT-UHFFFAOYSA-L 0.000 description 1
- 229910000368 zinc sulfate Inorganic materials 0.000 description 1
- 229960001763 zinc sulfate Drugs 0.000 description 1
- CITILBVTAYEWKR-UHFFFAOYSA-L zinc trifluoromethanesulfonate Substances [Zn+2].[O-]S(=O)(=O)C(F)(F)F.[O-]S(=O)(=O)C(F)(F)F CITILBVTAYEWKR-UHFFFAOYSA-L 0.000 description 1
- ZMLPZCGHASSGEA-UHFFFAOYSA-M zinc trifluoromethanesulfonate Chemical compound [Zn+2].[O-]S(=O)(=O)C(F)(F)F ZMLPZCGHASSGEA-UHFFFAOYSA-M 0.000 description 1
- VCQWRGCXUWPSGY-UHFFFAOYSA-L zinc;2,2,2-trifluoroacetate Chemical compound [Zn+2].[O-]C(=O)C(F)(F)F.[O-]C(=O)C(F)(F)F VCQWRGCXUWPSGY-UHFFFAOYSA-L 0.000 description 1
- MKRZFOIRSLOYCE-UHFFFAOYSA-L zinc;methanesulfonate Chemical compound [Zn+2].CS([O-])(=O)=O.CS([O-])(=O)=O MKRZFOIRSLOYCE-UHFFFAOYSA-L 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
- C25D3/60—Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of tin
Definitions
- the subject invention generally relates to plating a tin alloy on a substrate while mitigating immersion plating of the alloying metal(s).
- the subject invention relates to systems and methods for electroplating tin alloys using a complexing agent to mitigate the immersion plating.
- Tin plating is known. Tin has many desirable attributes as a plated finish including solderability, lubricity, good electrical conductivity, and corrosion resistance. Tin is a silver-colored, ductile metal whose major application is to impart solderability to otherwise unsolderable base metals. Tin has generally good covering characteristics over a wide range of shapes. While tin does not tarnish easily, tin is a soft, ductile finish that can scratch or mar easily. Tin is reported to be non-toxic and non-carcinogenic and thus is approved for food container and food contact applications.
- whiskering involves the formation of thin, needle-like crystals after plating. Whiskers typically form from a few weeks to several years after plating. Common whiskers may measure up to 2.5 ⁇ m in diameter, and can grow to a length of 10 mm. Conditions that tend to promote the growth of whiskers are compressive stresses and uniform temperatures for long periods of time. In some applications using tin plating, whiskers are not functionally noticed and therefore harmless. However, in other applications, such as closely spaced electronic circuits, whiskers undermine the operational function of devices employing a tin plating product. For example, in electronic circuitry, whiskers are capable of carrying sufficient current at low voltages to cause short circuits or a corona discharge. Whiskers can have a current carrying capacity of as high as 10 mA.
- the subject invention involves plating tin alloys while mitigating immersion plating of the alloying metal(s) that consequently minimizes latent whiskering.
- the tin alloys alleviate disposal, environmental, and health concerns since they are lead free.
- the tin alloy plating system permits the employment of working tin anodes without the danger of immersion plating of the alloy material thereon.
- the tin alloy plating system permits the use of complexing agents that are not toxic further alleviating disposal, environmental, and health concerns associated with metal plating systems.
- tin anodes may be employed as a source of tin in the tin alloy plating systems, significant cost reductions are achieved compared to plating systems that use liquid based tin salts as a tin source.
- the resultant tin alloys formed in accordance with the subject invention have desirable characteristics including one or more of lack of latent whiskering, relatively high tin content, lead free alloys, excellent solderability, excellent lubricity, excellent electrical conductivity, corrosion resistance, excellent leveling, excellent ductility, lack of pinholes, and controllable thickness.
- the systems contain an electrochemical cell containing an anode, the cathode, and an electroplating bath.
- the electroplating bath contains water, an acid, at least one nitrogen-containing heterocyclic complexing agent, an ionic alloy metal, and ionic tin.
- an anolyte compartment and a catholyte compartment are separated by a selective membrane.
- the anolyte compartment contains an anode and anolyte containing water, an acid, and ionic tin.
- the catholyte compartment contains a cathode and catholyte containing water, acid, an ionic alloy metal, and ionic tin. At least one of the anolyte compartment and the catholyte compartment contains a nitrogen- containing heterocyclic complexing agent.
- Another aspect of the invention relates to methods of electroplating a tin alloy involving applying a current to the electroplating bath containing one, two, or more compartments so that a tin alloy forms on the cathode/substrate.
- Figure 1 illustrates a schematic diagram of a tin alloy electroplating system with one compartment in accordance with an aspect of the subject invention.
- Figure 2 illustrates a schematic diagram of a tin alloy electroplating system with multiple compartments in accordance with an aspect of the subject invention.
- Figure 3 illustrates a schematic diagram of another tin alloy electroplating system with multiple compartments in accordance with an aspect of the subject invention.
- the subject invention can be employed for tin alloy electroplating.
- electroplating involves metal in ionic form migrating in solution from a positive to a negative electrode.
- An electrical current passing through the solution causes substrates at the cathode to be coated by the metal (tin and alloy metal(s)) in solution. That is, in most embodiments, the substrate to be plated is the cathode.
- the electroplating bath or catholyte and anolyte are aqueous solutions.
- the electroplating bath contains water.
- the electroplating bath may optionally contain one or more co-solvents.
- co-solvents include water- miscible solvents such as alcohols, glycols, alkoxy alkanols, ketones, and various other aprotic solvents.
- co-solvents include methanol, ethanol, propanol, ethylene glycol, 2-ethoxy ethanol, acetone, dimethyl formamide, dimethyl sulfoxide, acetonitrile, and the like.
- tin is present in ionic form.
- Sources of ionic tin are typically the corresponding tin salts and/or a tin containing anode.
- tin salts include tin acetate, tin ethylhexanoate, tin sulfate, tin chloride, tin fluoride, tin iodide, tin bromide, tin methanesulfonate, tin oxide, tin tetrafluoroborate, tin trifluoromethanesulfonate, tin pyrophosphate, tin sulfide, and hydrates thereof.
- the electroplating bath contains an amount of ionic tin to facilitate plating a tin alloy in the catholyte compartment. In one embodiment, the electroplating bath contains about 1 g/l or more and about 300 g/l or less of ionic tin (as Sn 2+ ).
- the electroplating bath contains about 10 g/l or more and about 200 g/l or less of ionic tin. In yet another embodiment, the electroplating bath contains about 20 g/l or more and about 150 g/l or less of ionic tin.
- One or more alloy metals combine with tin to form the tin alloy plating.
- alloy metals include bismuth, copper, silver, zinc, and indium.
- the one or more alloy metals are more noble than tin.
- the alloy metals are in ionic form.
- the ionic form of alloy metals include Bi 3+ , Cu 2+ , Ag + , Zn 2+ , and In 3+ .
- Sources of ionic alloy metals are typically the corresponding salts, such as bismuth salts, copper salts, silver salts, zinc salts, and indium salts.
- bismuth chloride bismuth fluoride, bismuth nitrate, bismuth acetate, bismuth methanesulfonate, bismuth oxychloride, bismuth citrate, copper sulfate, copper polyphosphate, copper sulfamate, copper chloride, copper formate, copper fluoride, copper nitrate, copper oxide, copper tetrafluoroborate, copper methanesulfonate, copper .
- the electroplating bath or catholyte contains an amount of at least one ionic alloy metal to facilitate plating a tin alloy on a substrate, typically an electrode such as a cathode.
- the electroplating bath or catholyte contains about 0.1 g/l or more and about 200 g/l or less of at least one ionic alloy metal.
- the electroplating bath or catholyte contains about 1 g/l or more and about 150 g/l or less of at least one ionic alloy metal.
- the electroplating bath or catholyte contains about 5 g/l or more and about 100 g/l or less of at least one ionic alloy metal.
- the anolyte comprises substantially no ionic alloy metal therein, and preferably, no ionic alloy metal therein.
- the electroplating bath contains at least one acid.
- the anolyte and catholyte may contain the same or different acid(s), and the anolyte and catholyte may contain the same or different number of acid(s).
- the acids are relatively strong acids that are not oxidizing acids. Examples of acids include sulfuric acid, trifluoroacetic acid, phosphoric acid, polyphosphoric acid, fluoboric acid, hydrochloric acid, acetic acid, alkane sulfonic acids, and alkanol sulfonic acids.
- Alkane sulfonic acids are represented by Formula I:
- R is an alkyl group containing from about 1 to about 12 carbon atoms. In another embodiment, R is an alkyl group containing from about 1 to about 6 carbon atoms.
- alkane sulfonic acids include methane sulfonic acid, ethane sulfonic acid, propane sulfonic acid, 2-propane sulfonic acid, butane sulfonic acid, 2-butane sulfonic acid, pentane sulfonic acid, hexane sulfonic acid, decane sulfonic acid and dodecane sulfonic acid.
- Alkanol sulfonic acids are represented by Formula II:
- n is from about 0 to about 10
- m is from about 1 to about 11 and the sum of m+n is up to about 12.
- the hydroxy group may be a terminal or internal hydroxy group.
- alkanol sulfonic acids include 2-hydroxy ethyl-1 -sulfonic acid, 1 -hydroxy propyl-2-sulfonic acid, 2- hydroxy propyl- 1 -sulfonic acid, 3-hydroxy propyl-1 -sulfonic acid, 2-hydroxy butyl- 1 -sulfonic acid, 4-hydroxy-pentyl-1 -sulfonic acid, 2-hydroxy-hexyl-1 -sulfonic acid, 2-hydroxy decyl-1 -sulfonic acid, and 2-hydroxy dodecyl-1 -sulfonic acid.
- the alkane sulfonic acids and alkanol sulfonic acids are available commercially and can also be prepared by a variety of methods known in the art.
- the anolyte and catholyte individually contain amounts of at least one acid to facilitate the electroplating of tin alloy. That is, the pH of the electroplating bath is maintained to promote the efficient plating of tin alloy on the cathode.
- the pH of the anoltye and catholyte are individually about 3 or less.
- the pH of the anoltye and catholyte are individually about 2 or less.
- the pH of the anoltye and catholyte are individually about 1.5 or less.
- the pH of the electroplating bath may be adjusted using additions of the acid or a basic compound. For example, sodium hydroxide and/or one or more of the above- mentioned acids may be used to adjust the pH of the bath.
- the tin alloy electroplating bath contains one or more of complexing agents.
- the anolyte(s) and/or the catholyte(s) may contain the one or more of complexing agents.
- the presence of the complexing agent mitigates immersion plating of the alloy metal(s) that can in turn minimize latent whiskering.
- the complexing agent either binds or adequately associates with the typically more noble alloying metal sufficiently to minimize immersion deposition, but the binding is not so strong that a useful electro-deposited alloy is not possible or the complexing agent lays on the tin or tin alloy surface and thereby impedes access of the more noble metal to the surface which is the reducing medium.
- the complexing agents are reaction products of a nitrogen-containing heterocyclic compound with a mixture of formaldehyde, an unsaturated aliphatic aldehyde containing up to about eight carbon atoms, and, optionally, an aliphatic carboxylic acid containing up to about six carbon atoms.
- the nitrogen-containing heterocyclic compound may be an unsaturated nitrogen-containing heterocyclic compound, a partially unsaturated nitrogen-containing heterocyclic compound, or a saturated nitrogen-containing heterocyclic compound.
- the nitrogen-containing heterocyclic compound is dissolved in water, the solution is warmed to at least about 40° C, such as from about 50° C. to about 100° C. whereupon the formaldehyde is added and the resulting solution heated at the reflux temperature for at least about 15 minutes, often at least about 30 minutes. While maintaining the refluxing conditions, the optional aliphatic acid is added followed by the dropwise addition of the unsaturated aldehyde. After all of the aldehyde is added, the reaction mixture is refluxed for at least an additional 15 minutes, such as at least about 30 minutes to about two hours to ensure completion of the reaction. Upon cooling, the reaction product is ready for use or may be diluted further as desired.
- nitrogen-containing heterocyclic compounds which are useful in the preparation of the compositions of the subject invention include substituted or unsubstituted imidazoles, substituted or unsubstituted pyrazoles, substituted or unsubstituted pyrazines, substituted or unsubstituted pyridines, substituted or unsubstituted indoles, substituted or unsubstituted quinolines, and the like.
- the nitrogen-containing heterocyclic compounds may be monocyclic
- the nitrogen-containing heterocyclic compounds are generally represented by Formula III:
- the nitrogen-containing heterocyclic compounds of Formula III may be substituted or unsubstituted. Typically the nitrogen-containing heterocyclic compounds are substituted with a group containing at least one of, and often at least two of carbon atom(s), hydrogen atom(s), oxygen atom(s), nitrogen atom(s), and sulfur atom(s). Examples include alkyl, acyl, vinyl, amino acid, amide, aminoalkyl, alkoxy, hydroxyalkyl, carboxyalkyl, or carboxyl groups, each of which may contain from 1 to about 12 carbon atoms.
- the nitrogen-containing heterocyclic compounds of Formula III contain at least substantially carbon based ring, but may contain additional substantially carbon based rings attached thereto (such as represented by an indole based structure).
- the ring structure of Formula III may or may not contain double bonds (the structure may be aliphatic or aromatic).
- the imidazole compounds which are useful as complexing agents are generally represented by Formula IV:
- R 1 is hydrogen, alkyl, acyl, vinyl, amino acid, or a 1-carbonyl imidazole group
- each R 2 is independently hydrogen, alkyl, or an aryl group
- m is from 0 to about 3.
- imidazole compounds include imidazole, 1 -vinyl imidazole, 1 ,2-dimethyl imidazole, histidine, 4-phenyl imidazole, 1 -methyl imidazole, 1 -ethyl imidazole, 2-methyl imidazole, 1 -acetyl imidazole and
- R 3 is hydrogen or an alkyl group and each R 4 is independently hydrogen or an alkyl or one or more carboxyl groups, and m is from 0 to about 3.
- pyrazole compounds include pyrazole, 3-methyl pyrazole and 3,5-pyrazole dicarboxylic acid.
- each R 5 is independently hydrogen, alkyl, aminoalkyl, hydroxyalkyl, carboxyalkyl, or carboxyl groups, and n is from 0 to about 6.
- pyridine compounds include pyridine, 3-picoline, 4-picoline, 3-picolyl amine, 4-pycolyl amine, 2,6-pyridine dimethanol, 2-pyridineethanol, 2-pyridine carboxaldehyde, 2-pyridylacetic acid, 4-pyridine carboxaldehyde, 3-pyridine carboxylic acid (nicotinic acid), 3,5-pyridine dicarboxylic acid, the corresponding 2,3-, 2,4-, 2,5-, 2,6- and 3,4-dicarboxylic acids.
- each R 6 is independently hydrogen, alkyl, aminoalkyl, hydroxyalkyl, carboxyalkyl, carboxy or amide groups, and n is from 0 to about 6.
- pyrazine compounds include pyrazine, pyrazineamide, 2,5-dimethyl pyrazine, 2-pyrazine carboxylic acid, 2,3-pyrazinedicarboxamide and 2,3-pyrazinedicarboxylic acid.
- each R 7 is independently hydrogen, alkyl, acyl, vinyl, amino acid, hydroxyalkyl, carboxyalkyl, carboxy or amide groups, and p is from 0 to about 7.
- indole compounds include indole, 1-methylindole, 2-methylindole, 3- methylindole, 4-methylindole, 5-methylindole, 6-methylindole, 7-methylindole, 1 ,2-dimethylindole, 2,3-dimethylindole, 2,5-dimethylindole, and dimethyl-2,3- indoledicarboxylate.
- each R 8 is independently hydrogen, alky!, acyl, vinyl, amino acid, hydroxyalkyl, carboxyalkyl, carboxy or amide groups, and q is from 0 to about 8.
- quinoline compounds include quinoline, 2-methylquinoline, 3- methylquinoline, 4-methylquinoline, 6-methylquinoline, 7-methylquinoline, 8- methylquinoline, 2,4-dimethylquinoline, 2,6-dimethylquinoline, 2,7- dimethylquinoline, isoquinoline, 3-methylisoquinoline, and quinoxalines such as 2-methylquinoxaline, 2,3-dimethylquinoxaline and 5-methylquinoxaline.
- the formaldehyde used to form the complexing agent may be an organic solution or an aqueous solution containing, for example, from about 1 % to about 75% by volume formaldehyde.
- a specific example is an aqueous solution containing 37% formaldehyde which is available commercially as Formalin.
- formaldehyde generators such as paraformaldehyde, trioxane, etc. may be utilized in the process as a source of formaldehyde.
- the unsaturated aliphatic aldehydes which are useful in the invention contain from about two to about ten carbon atoms. In another embodiment, the unsaturated aliphatic aldehydes contain from about three to about seven carbon atoms. Examples of such unsaturated aliphatic aldehydes include acrolein, crotonaldehyde, and 2-hexenal.
- an aliphatic carboxylic acid containing from one to about eight carbon atoms also may be included in the reaction mixture.
- aliphatic carboxylic acids include formic, acetic, propionic, butyric, pentanoic, hexanoic, heptanoic, and octanoic acids.
- the relative amounts of the materials which are reacted to form the complexing agents may vary, and generally, the initial mixture comprises a mole ratio of nitrogen-containing heterocyclic compound, formaldehyde, unsaturated aliphatic aldehyde, and carboxylic acid of from about 1 :1 :0.5:0 to about 1 :4:2:4. In another embodiment, the initial mole ratio is about 1 :1 :0.5:0.5 to about 1 :4:2:4. In one embodiment, the tin alloy electroplating bath contains from about 1 g/l to about 300 g/l of one or more complexing agents. In another embodiment, the tin alloy electroplating bath contains from about 5 g/l to about 150 g/l of one or more complexing agents. In yet another embodiment, the tin alloy electroplating bath contains from about 10 g/l to about 75 g/l of one or more complexing agents.
- the tin alloy electroplating bath optionally contains one or more additives.
- Various additives either facilitate the electroplating process and/or improve the characteristics of the resultant tin alloy layer.
- Additives include brighteners, carriers, leveling agents, surfactants, wetting agents, reducing agents, promoters, antioxidants, and the like. In one embodiment, a brightener is not present in the tin alloy electroplating bath.
- the tin alloy electroplating bath contains about 10 ppb or more and about 50 g/l or less of one or more additives. In another embodiment, the tin alloy electroplating bath contains about 100 ppb or more and about 20 g/l or less of one or more additives. In yet another embodiment, the tin alloy electroplating bath contains about 300 ppb or more and about 10 g/l or less of one or more additives.
- Electroplating bath brighteners contribute to the ability of the tin alloy electroplating bath to provide bright tin alloy deposits on cathodes. Electroplating bath brighteners are generally described in U.S. Patents 5,433,840; 5,431 ,803; 5,417,841 ; 5,403,465;
- Leveling agents promote the formation of a smooth surface of the electroplated tin alloy layer, even if the cathode surface on which the tin alloy layer is formed is not smooth.
- Examples of leveling agents include the condensation products of thiourea and aliphatic aldehydes; thiazolidinethiones; quatemized polyamines; and the like.
- wetting agents promote leveling and brightening, as well as promoting bath stability.
- wetting agent include polyoxyalkylated naphthols; ethylene oxide/polyglycol compounds; sulfonated wetting agents; carbowax type wetting agents; and the like.
- Surfactants contribute to the overall stability of the bath and improve various properties in the resultant tin alloy layer.
- General examples of surfactants include one or more of a nonionic surfactant, cationic surfactant, anionic surfactant, and amphoteric surfactant.
- Specific examples of surfactants include nonionic polyoxyethylene surfactants; alkoxylated amine surfactants; ethylene oxide-fatty acid condensation products; polyalkoxylated glycols and phenols; betaines and sulfobetaines; amine ethoxylate surfactants; quaternary ammonium salts; sulfated alkyl alcohols; sulfated lower ethoxylated alkyl alcohols; and the like.
- the tin alloy plating system of the present invention does not contain a selective membrane, and essentially has one compartment. In another embodiment, the tin alloy plating system of the present invention contains at least one selective membrane, such as ionic and nonionic selective membranes, and essentially has at least two compartments.
- the dividers and/or bipolar membranes function as diffusion barriers.
- the selective membrane is positioned between the catholyte and anolyte.
- Selective membranes may permit the passage therethrough of certain ionic species while preventing the _
- Selective membranes alternatively may permit the passage therethrough of nonionic species while preventing the passage therethrough of ionic species.
- the selective membrane may permit the flow of water therethrough, for instance osmotically, while preventing the passage of metal ions therethrough.
- One function of the selective membrane of the present invention is to prevent substantial amounts of metal cations from migrating from the catholyte to the anolyte.
- the selective membranes which can be utilized in the present invention can be selected from a wide variety of microporous diffusion barriers, screens, filters, diaphragms, etc., which contain pores of the desired size allow anions and/or water to migrate therethrough.
- the microporous dividers can be prepared from various materials including plastics such as polyethylene, polypropylene and Teflon, ceramics, etc.
- Microporous selective membranes such as nonionic dividers and nanoporous membranes can be used.
- Specific examples of commercially available microporous separators include: Celanese Celgard and Norton Zitex.
- Size selective membranes such as a nanoporous and microporous membranes, and size selective anion selective membranes and size selective cation selective membranes, prevent substantial amounts of metal cations from passing therethrough but permit the passage therethrough of water.
- the selective membrane is ionic selective membrane such as an anion selective membrane or a cation selective membrane. Any anion selective membrane may be utilized including membranes used in processes for the desalination of brackish water.
- anion selective membranes are selective with respect to the particular anions present in the cell (e.g., acid anion and metal salt anion).
- cation selective membranes are size selective cation selective membranes that are selective with respect to the particular cations present in the cell based on relative size.
- the cation selective membranes used may be any of those which have been used in the electrochemical purification or recycling of chemical compounds.
- the cation selective membranes typically include fluorinated membranes containing cation selective groups such as perfluorosulfonic acid and perfluorosulfonic and/perfluorocarboxylic acid, perfluorocarbon polymer membranes.
- anionic membranes and cationic membranes are described in the chapter entitled "Membrane Technology” in Encyclopedia of Chemical Technology, Kirk-Othmer, Third Ed., Vol. 15, pp. 92-131 , Wiley & Sons, New York, 1985. These pages are hereby incorporated by reference for their disclosure of various anionic membranes which may be useful in the systems and methods of the present invention.
- Selective membranes are commercially available.
- General examples of selective membranes include those membranes under the trade designations SelemionTM from Asahi Glass; Nafion® from DuPont; UltrexTM from Membranes International Inc.; and lonac from Sybron Chemicals Inc.; and membranes from
- anion selective membranes which may be utilized and which are commercially available are the following: AMFLON, Series 310, based on fluorinated polymer substituted with quaternary ammonium groups produced by American Machine and Foundry Company; IONAC MA 3148, MA 3236 and MA 3475, based on polymer substituted with quaternary ammonium derived from heterogenous polyvinylchloride produced by Ritter-Pfaulder Corp., Permutit Division; Tosflex IE-SF 34 or IE-SA 48 made by Tosoh Corp.
- cation selective membranes which are a membrane designed to be stable in alkaline media
- NEOSEPTA AMH NEOSEPTA ACM
- NEOSEPTA AFN NEOSEPTA AFN
- SelemionTM AMV and SelemionTM AAV from Asahi Glass.
- cation selective membranes those sold by the DuPont under the general trade designation Nafion® such as DuPont's Cationic Nafion® 423 and
- the temperature of the electroplating bath is maintained to promote the efficient plating of tin alloy on the cathode.
- the temperature of the electroplating bath, during plating is about 5° C. or more and about 90° C. or less.
- the temperature of the electroplating bath is about 25° C. or more and about 70° C. or less.
- the temperature of the electroplating bath is about 30° C. or more and about 60° C. or less.
- Any anode, cathode, power source, bath container, agitator, etc. suitable for electroplating metal such as tin alloy on a cathode may be employed in the present invention.
- Any suitable source of power is connected to the electrodes, such as direct current, alternating current, pulsed current, periodic reverse current, or combinations thereof.
- a current density is imposed from an energy source through the electrodes causing tin ions and at least one other metal ion from the catholyte to migrate towards and attach to the cathode forming a layer of tin alloy thereon. Due, in part, to the system layout of present invention in the tin alloy electroplating bath, a wide range of current densities may be employed. In one embodiment, current densities of about 1 ASF or more and about 1 ,000 ASF or less are employed. In another embodiment, current densities of about 10 ASF or more and about 500 ASF or less are employed. In yet another embodiment, current densities of about 20 ASF or more and about 400 ASF or less are employed.
- the cathodes are any electrically conductive material that can accommodate tin alloy plating while resisting degradation by the acidic nature of the electroplating bath or catholyte.
- the cathode substrates include metal structures and non-metal structures. Metal structures, or structures with a metal surface contain surfaces of one or more of aluminum, bismuth, cadmium, chromium, copper, gallium, germanium, gold, indium, iridium, iron, lead, magnesium, nickel, palladium, platinum, silver, tin, titanium, tungsten, zinc, and the like.
- Non-metal structures include plastics, circuit board prepregs (including materials such as glass, epoxy resins, polyimide resins, Kevlar ® , Nylon ® , Teflon ® , etc.), metal oxides, and the like.
- the anodes are electrically conductive materials that deliver current to the system (electroplating bath or anolyte).
- the anode is a working tin anode.
- the anode is an inert anode (a non- working anode).
- An inert anode does not contain tin or any of the alloying metals. Examples of inert anodes include platinum containing electrodes, platinum-titanium electrodes, zirconium electrodes, iridium oxide anodes, and the like.
- the anode can deliver tin ions into solution, and in particular, into the electroplating bath or anolyte.
- the anode contains at least tin, and optionally other materials.
- the anode is a working tin anode.
- the cost of tin via an anode is a fraction of that from the liquid concentrate (such as about one-quarter of the cost or less including about one-eight of the cost).
- Solid working tin anodes are also advantageous in that they are markedly easier to handle, store, and transport, compared with liquid concentrates of tin salts.
- the length of time that the cathode is in contact with the electroplating bath or catholyte under a specified current density depends upon the desired thickness of the resultant tin alloy layer and the concentrations of the electroplating bath components.
- the cathode is in contact with the electroplating bath or catholyte (period of time from the when the tin alloy begins to form until the tin alloy is removed from the cathode) under a specified current density for a time of about 1 second or longer and about 60 minutes or shorter.
- the cathode is in contact with the electroplating bath or catholyte (under plating conditions) under a specified current density for a time of about 5 seconds or longer and about 30 minutes or shorter.
- a conduit permits the one way flow of anolyte into the catholyte compartment, without passing through the selective membrane. Consequently, every chemical species present in the anolyte is introduced into the catholyte.
- the conduit may be comprised of tubing, piping, an overflow trough, or an aperture in the anolyte compartment that permits the one way flow of anolyte into the catholyte compartment. If appropriate, the conduit can be optionally equipped with one way valves or other structures to prevent the flow of catholyte into the anolyte compartment.
- tin ions in the anolyte are provided by the tin containing anode. Since the conduit permits the flow of anolyte into the catholyte compartment, tin ions generated in situ by the anode are replenished or transferred to the catholyte. When a working tin containing anode is spent, a fresh tin containing anode may be provided to the anolyte compartment.
- the one way flow of anolyte into the catholyte compartment is induced by the passage of water from the catholyte compartment to anolyte compartment through the selective membrane thereby increasing the volume of anolyte in the anolyte compartment.
- the conduit can be optionally equipped with a pump or similar functioning device.
- the conduit or any other aspect of the plating system may be equipped with a flow meter and/or a flow controller to measure and control the amount of anoltye that flows into the catholyte compartment, or the flow of any component into, out of, and/or within different parts of the system.
- the flow meter and/or a flow controller may be connected to a computer/processor including a memory to facilitate measuring and controlling the amount of anoltye that flows into the catholyte compartment and/or for automated process control of the tin alloy plating method.
- the computer/processor may be further coupled to sensors in the electroplating bath, anolyte and catholyte compartments to measure one or more of pH, species concentration, volume, and the like.
- the computer/processor may be coupled to control valves that permit introduction of additional water, metal, acid, and/or base, into the electroplating bath either or both the anolyte and catholyte compartments.
- the selective membrane prevents the migration of metal ions into the anolyte, thereby preventing immersion deposition of alloy metals on the working tin containing anode, while the selective membrane permits water migration into the anolyte.
- the alloy metal is more noble than tin, a difference in standard potentials exists that can lead to immersion deposition of the alloy metal onto the working tin anode.
- selective membranes prevent the migration of metal ions into the anolyte, immersion deposition on the anode is mitigated.
- additives such as complexing agents and chelating agents are no longer required to prevent or mitigate immersion deposition.
- the electroplating bath is optionally equipped with a conduit permitting flow of anolyte into the catholyte compartment, the flow of anolyte increases the concentration of tin ions in the catholyte, promoting efficient deposition of tin on the cathode.
- the complexing agent still mitigates immersion deposition on the freshly plating substrate and/or cathode.
- a tin alloy plating system 100 includes a power source (not shown) for providing current to an electrochemical cell 102 containing an electroplating bath 104.
- the electroplating bath 104 contains an anode 108, a cathode 106, and an aqueous bath of water, an acid, at least one complexing agent, an ionic alloy metal, and ionic tin. Plating of a tin alloy occurs at the cathode 106 with minimal immersion plating.
- an embodiment of a tin alloy plating system 200 includes a power source (not shown) for providing current to an electrochemical cell 202 containing an anolyte compartment 206 and a catholyte compartment
- the anolyte compartment 206 contains an anode 212 and an aqueous anolyte and the catholyte compartment 204 contains a cathode 210 and an aqueous catholyte.
- the aqueous anolyte contains at least water, an acid, and ionic tin while the aqueous catholyte contains water, acid, an ionic alloy metal, and ionic tin.
- the electrochemical cell has a conduit 214 to permit the flow 218 of the aqueous anolyte into the catholyte compartment.
- Water may flow osmotically 216 from the aqueous catholyte into the anolyte compartment 206 through selective membrane 208.
- Plating of a tin alloy occurs at the cathode 210 with minimal immersion plating.
- another embodiment of a tin alloy plating system 300 includes an electrochemical cell 302 containing an anolyte compartment 306 and a catholyte compartment 304 separated by a selective membrane 308 (and this general arrangement may be repeated one or more times to provide electrochemical cells with a plurality of anolyte compartments 306, catholyte compartments 304, and selective membranes 308).
- a power source (not shown) may provide current to the electrochemical cell 302.
- the anolyte compartment 306 contains an anode 312 and an aqueous anolyte and the catholyte compartment 304 contains a cathode 310 and an aqueous catholyte.
- the aqueous anolyte contains at least water, an acid, at least one complexing agent, and ionic tin while the aqueous catholyte contains water, acid, one or more ionic alloy metals, at least one complexing agent, and ionic tin.
- the electrochemical cell has a conduit 314 to permit the one way flow 318 of the aqueous anolyte into the catholyte compartment 304.
- Water may flow 316 from the aqueous catholyte into the anolyte compartment 306 through selective membrane 308.
- the selective membrane 308 prevents metal ions in general, and alloy metal ions in particular, from migrating from the catholyte to the anolyte compartment 306. Plating of a tin alloy occurs at the cathode 310 with minimal immersion plating.
- water osmotically migrates through the selective membrane 308 from the side with lower ionic strength to the side with higher ionic strength (from the catholyte to the anolyte). In essence, the water migration is a natural attempt to bring the system to ionic equilibrium. As the tin ion concentration rises in the anolyte, the anolyte ionic strength increases. When the anolyte ionic strength is greater than the catholyte ionic strength, water migrates 316 through the selective membrane 308, increasing the solution volume of the anolyte in the anolyte compartment 306.
- the water migration can cause enough volume increase in the anolyte to overflow 318 the anolyte compartment 306 through the conduit 314 and into the catholyte compartment 304.
- the overflow can be controlled such that high concentration tin ion is returned to the catholyte compartment 304 through overflow to develop a steady state tin metal concentration within the catholyte. Tin is replenished in the catholyte by the working tin containing anode 312.
- the catholyte compartment 304 may retain a desirable ratio of ionic alloy metal to ionic tin in the catholyte to form the desired tin alloy.
- the side additions of one or more acids to the anolyte compartment 306 and/or the catholyte compartment 304 may also be made, especially to the anolyte to replenish what may be carried to the catholyte.
- the thickness of the resultant tin alloy layer electroplated, in accordance with the present invention is about 0.1 micron or more and about 5,000 microns or less. In another embodiment, the thickness of the resultant tin alloy layer electroplated, in accordance with the present invention, is about 1 micron or more and about 1 ,000 microns or less.
- tin alloys formed in accordance with the present invention may or may not be high tin alloys.
- tin alloys contain at least about 1 % by weight tin and about 99% by weight or less of one or more alloy metals.
- High tin alloys contain at least about 70% by weight tin and about 30% by weight or less of one or more alloy metals. In another embodiment, high tin alloys formed in accordance with the present invention contain at least about 90% by weight tin and about 5% by weight or less of one or more alloy metals. In yet another embodiment, high tin alloys formed in accordance with the present invention contain at least about 95% by weight tin and about 3% by weight or less of one or more alloy metals. In still yet another embodiment, tin alloys formed in accordance with the present invention contain at least about 99% by weight tin and about 1% by weight or less of one or more alloy metals.
- the tin alloys formed in accordance with the present invention do not contain substantial amounts of lead.
- the tin alloys formed in accordance with the present invention contain less than about 0.1% by weight lead.
- the tin alloys formed in accordance with the present invention contain less than about 0.01% by weight lead.
- the tin alloys formed in accordance with the present invention contain less than about 0.001 % by weight lead.
- the tin alloys formed in accordance with the present invention contain no detectable amounts of lead. Lead present in the tin alloys is likely attributable to impurities in the anode material and/or the metal salts.
- high tin alloys that may be formed in accordance with the present invention include: a tin alloy containing from about 95% to about 99% by weight tin and from about 1 % to about 5% by weight silver; a tin alloy containing from about 90% to about 99.9% by weight tin and from about 0.1% to about 10% by weight bismuth; a tin alloy containing from about 95% to about 99.9% by weight tin and from about 0.1% to about 5% by weight copper; a tin alloy containing from about 70% to about 90% by weight tin and from about 10% to about 30% by weight zinc; a tin alloy containing from about 94% to about
- the resultant tin alloy layer electroplated in accordance with the present invention has many desirable characteristics including one or more of lack of latent whiskering, relatively high tin content, lead free alloys, excellent solderability, excellent lubricity, excellent electrical conductivity, corrosion resistance, uniform thickness, excellent leveling, excellent ductility, lack of pinholes, environmentally friendly processing, and controllable thickness.
- Uniform thickness means uniform in two senses.
- a uniformly thick tin alloy layer results when electroplating a smooth or curvilinear surface cathode and the tin alloy layer has substantially the same thickness in any location after removal from the surface of the cathode.
- This uniformly thick tin alloy layer is smooth and flat when the surface of the cathode is smooth while the uniformly thick tin alloy layer may have an uneven surface mimicking the uneven contours of the underlying cathode surface.
- a uniformly thick tin alloy layer results when electroplating an uneven cathode surface so that the resultant tin alloy layer appears smooth and the tin alloy layer has substantially the same thickness within locally smooth regions on the surface of the cathode. This second sense also refers to excellent leveling.
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Abstract
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Application Number | Priority Date | Filing Date | Title |
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US10/985,194 US20060096867A1 (en) | 2004-11-10 | 2004-11-10 | Tin alloy electroplating system |
US10/985,194 | 2004-11-10 |
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WO2006053062A2 true WO2006053062A2 (en) | 2006-05-18 |
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PCT/US2005/040624 WO2006053062A2 (en) | 2004-11-10 | 2005-11-09 | Tin alloy electroplating system |
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US9730333B2 (en) * | 2008-05-15 | 2017-08-08 | Applied Nanotech Holdings, Inc. | Photo-curing process for metallic inks |
US20100000762A1 (en) * | 2008-07-02 | 2010-01-07 | Applied Nanotech Holdings, Inc. | Metallic pastes and inks |
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JP2011179085A (en) * | 2010-03-02 | 2011-09-15 | C Uyemura & Co Ltd | Electroplating pretreatment agent, electroplating pretreatment method and electroplating method |
JP6060972B2 (en) * | 2012-07-05 | 2017-01-18 | 株式会社ニコン | Method for producing zinc oxide thin film, method for producing thin film transistor, and method for producing transparent oxide wiring |
EP2871260B1 (en) * | 2012-07-09 | 2019-03-06 | Shikoku Chemicals Corporation | Copper film-forming agent and method for forming copper film |
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JP6022922B2 (en) * | 2012-12-13 | 2016-11-09 | 株式会社荏原製作所 | Sn alloy plating apparatus and method |
US10260159B2 (en) * | 2013-07-05 | 2019-04-16 | The Boeing Company | Methods and apparatuses for mitigating tin whisker growth on tin and tin-plated surfaces by doping tin with gold |
US10633754B2 (en) * | 2013-07-05 | 2020-04-28 | The Boeing Company | Methods and apparatuses for mitigating tin whisker growth on tin and tin-plated surfaces by doping tin with germanium |
US9918389B2 (en) * | 2013-09-04 | 2018-03-13 | Rohm And Haas Electronic Materials Llc | Electroless metallization of dielectrics with alkaline stable pyrazine derivative containing catalysts |
JP5938426B2 (en) * | 2014-02-04 | 2016-06-22 | 株式会社豊田中央研究所 | Electroplating cell and metal film manufacturing method |
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US20210156043A1 (en) * | 2019-11-25 | 2021-05-27 | The Boeing Company | Method for plating a metallic material onto a titanium substrate |
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US20060096867A1 (en) | 2006-05-11 |
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