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WO2005008195A3 - Quantification of optical properties in scattering media using fractal analysis of photon distribution measurements - Google Patents

Quantification of optical properties in scattering media using fractal analysis of photon distribution measurements Download PDF

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Publication number
WO2005008195A3
WO2005008195A3 PCT/IB2004/002303 IB2004002303W WO2005008195A3 WO 2005008195 A3 WO2005008195 A3 WO 2005008195A3 IB 2004002303 W IB2004002303 W IB 2004002303W WO 2005008195 A3 WO2005008195 A3 WO 2005008195A3
Authority
WO
WIPO (PCT)
Prior art keywords
optical property
medium
distribution
optical properties
quantification
Prior art date
Application number
PCT/IB2004/002303
Other languages
French (fr)
Other versions
WO2005008195A2 (en
Inventor
David H Burns
Claudia E W Gributs
Original Assignee
Univ Mcgill
David H Burns
Claudia E W Gributs
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Mcgill, David H Burns, Claudia E W Gributs filed Critical Univ Mcgill
Publication of WO2005008195A2 publication Critical patent/WO2005008195A2/en
Publication of WO2005008195A3 publication Critical patent/WO2005008195A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4707—Forward scatter; Low angle scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4709—Backscatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4792—Polarisation of scatter light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • G01N2021/4797—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium time resolved, e.g. analysis of ballistic photons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4785—Standardising light scatter apparatus; Standards therefor

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

An optical property of a turbid medium to be tested is determined. A light measurement device (15) is used to obtain photon distribution data regarding a parameter from light exiting from the medium (one example is the time-of-flight intensity distribution). A fractal element analyzer (16) receives the distribution data and produces a count of a number of points of the distribution in a partition element for each data point in the distribution, for each of the partition element sizes. An optical property estimator (18) receives the count and compares characteristics of a relationship of the optical property of the medium to be tested to characteristics of a relationship of the optical property obtained for a plurality of calibration media (having known optical properties) to output a value for the optical property of the medium.
PCT/IB2004/002303 2003-07-16 2004-07-15 Quantification of optical properties in scattering media using fractal analysis of photon distribution measurements WO2005008195A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US48725003P 2003-07-16 2003-07-16
US60/487,250 2003-07-16

Publications (2)

Publication Number Publication Date
WO2005008195A2 WO2005008195A2 (en) 2005-01-27
WO2005008195A3 true WO2005008195A3 (en) 2006-04-06

Family

ID=34079357

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2004/002303 WO2005008195A2 (en) 2003-07-16 2004-07-15 Quantification of optical properties in scattering media using fractal analysis of photon distribution measurements

Country Status (1)

Country Link
WO (1) WO2005008195A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7224769B2 (en) 2004-02-20 2007-05-29 Aribex, Inc. Digital x-ray camera
US7496178B2 (en) 2004-02-20 2009-02-24 Aribex, Inc. Portable x-ray device
CA2781393C (en) 2009-11-19 2017-08-08 Modulated Imaging, Inc. Method and apparatus for analysis of turbid media via single-element detection using structured illumination
AU2013341165B2 (en) 2012-11-07 2019-08-01 Modulated Imaging, Inc. Efficient modulated imaging

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5029475A (en) * 1989-05-22 1991-07-09 Agency Of Industrial Science And Technology Measuring spatial distribution of spacings between point scatterers
US5640247A (en) * 1993-12-01 1997-06-17 Hamamatsu Photonics K.K. Method for measuring internal information in a scattering medium and apparatus for the same
US5752519A (en) * 1993-02-26 1998-05-19 Benaron; David A. Device and method for detection, localization, and characterization of inhomogeneities in turbid media
US20020057433A1 (en) * 2000-09-20 2002-05-16 Menguc M. Pinar Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation
US6422998B1 (en) * 1999-09-20 2002-07-23 Ut-Battelle, Llc Fractal analysis of time varying data
US20040038264A1 (en) * 2002-05-14 2004-02-26 Souza Glauco R. Fractal dimension analysis of nanoparticle aggregates using angle dependent light scattering for the detection and characterization of nucleic acids and proteins
US20040181153A1 (en) * 2003-03-12 2004-09-16 Hall David Jonathan Method and apparatus for combining continuous wave and time domain optical imaging

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5029475A (en) * 1989-05-22 1991-07-09 Agency Of Industrial Science And Technology Measuring spatial distribution of spacings between point scatterers
US5752519A (en) * 1993-02-26 1998-05-19 Benaron; David A. Device and method for detection, localization, and characterization of inhomogeneities in turbid media
US5640247A (en) * 1993-12-01 1997-06-17 Hamamatsu Photonics K.K. Method for measuring internal information in a scattering medium and apparatus for the same
US6422998B1 (en) * 1999-09-20 2002-07-23 Ut-Battelle, Llc Fractal analysis of time varying data
US20020057433A1 (en) * 2000-09-20 2002-05-16 Menguc M. Pinar Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation
US20040038264A1 (en) * 2002-05-14 2004-02-26 Souza Glauco R. Fractal dimension analysis of nanoparticle aggregates using angle dependent light scattering for the detection and characterization of nucleic acids and proteins
US20040181153A1 (en) * 2003-03-12 2004-09-16 Hall David Jonathan Method and apparatus for combining continuous wave and time domain optical imaging

Also Published As

Publication number Publication date
WO2005008195A2 (en) 2005-01-27

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