WO2003038905A3 - Dispositif lateral silicium sur oxyde a film mince - Google Patents
Dispositif lateral silicium sur oxyde a film mince Download PDFInfo
- Publication number
- WO2003038905A3 WO2003038905A3 PCT/IB2002/004412 IB0204412W WO03038905A3 WO 2003038905 A3 WO2003038905 A3 WO 2003038905A3 IB 0204412 W IB0204412 W IB 0204412W WO 03038905 A3 WO03038905 A3 WO 03038905A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- thickness
- dielectric layer
- layer
- silicon region
- silicon
- Prior art date
Links
- 230000005669 field effect Effects 0.000 title 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 13
- 229910052710 silicon Inorganic materials 0.000 abstract 13
- 239000010703 silicon Substances 0.000 abstract 13
- 239000000758 substrate Substances 0.000 abstract 2
- 239000010409 thin film Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/64—Double-diffused metal-oxide semiconductor [DMOS] FETs
- H10D30/65—Lateral DMOS [LDMOS] FETs
- H10D30/657—Lateral DMOS [LDMOS] FETs having substrates comprising insulating layers, e.g. SOI-LDMOS transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/13—Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
- H10D62/149—Source or drain regions of field-effect devices
- H10D62/151—Source or drain regions of field-effect devices of IGFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/13—Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
- H10D62/149—Source or drain regions of field-effect devices
- H10D62/151—Source or drain regions of field-effect devices of IGFETs
- H10D62/152—Source regions of DMOS transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/111—Field plates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/111—Field plates
- H10D64/112—Field plates comprising multiple field plate segments
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/20—Electrodes characterised by their shapes, relative sizes or dispositions
- H10D64/23—Electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. sources, drains, anodes or cathodes
- H10D64/251—Source or drain electrodes for field-effect devices
- H10D64/258—Source or drain electrodes for field-effect devices characterised by the relative positions of the source or drain electrodes with respect to the gate electrode
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/20—Electrodes characterised by their shapes, relative sizes or dispositions
- H10D64/27—Electrodes not carrying the current to be rectified, amplified, oscillated or switched, e.g. gates
- H10D64/311—Gate electrodes for field-effect devices
- H10D64/411—Gate electrodes for field-effect devices for FETs
- H10D64/511—Gate electrodes for field-effect devices for FETs for IGFETs
- H10D64/514—Gate electrodes for field-effect devices for FETs for IGFETs characterised by the insulating layers
- H10D64/516—Gate electrodes for field-effect devices for FETs for IGFETs characterised by the insulating layers the thicknesses being non-uniform
Landscapes
- Thin Film Transistor (AREA)
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2002339582A AU2002339582A1 (en) | 2001-11-01 | 2002-10-22 | Lateral soi field-effect transistor |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01204203 | 2001-11-01 | ||
EP01204203.2 | 2001-11-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003038905A2 WO2003038905A2 (fr) | 2003-05-08 |
WO2003038905A3 true WO2003038905A3 (fr) | 2003-10-23 |
Family
ID=8181182
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IB2002/004412 WO2003038905A2 (fr) | 2001-11-01 | 2002-10-22 | Dispositif lateral silicium sur oxyde a film mince |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU2002339582A1 (fr) |
TW (1) | TW200406924A (fr) |
WO (1) | WO2003038905A2 (fr) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7501669B2 (en) | 2003-09-09 | 2009-03-10 | Cree, Inc. | Wide bandgap transistor devices with field plates |
US7573078B2 (en) | 2004-05-11 | 2009-08-11 | Cree, Inc. | Wide bandgap transistors with multiple field plates |
US7550783B2 (en) | 2004-05-11 | 2009-06-23 | Cree, Inc. | Wide bandgap HEMTs with source connected field plates |
US9773877B2 (en) | 2004-05-13 | 2017-09-26 | Cree, Inc. | Wide bandgap field effect transistors with source connected field plates |
US11791385B2 (en) | 2005-03-11 | 2023-10-17 | Wolfspeed, Inc. | Wide bandgap transistors with gate-source field plates |
TW200735361A (en) * | 2005-12-14 | 2007-09-16 | Koninkl Philips Electronics Nv | MOS transistor and a method of manufacturing a MOS transistor |
US7709269B2 (en) | 2006-01-17 | 2010-05-04 | Cree, Inc. | Methods of fabricating transistors including dielectrically-supported gate electrodes |
US7592211B2 (en) | 2006-01-17 | 2009-09-22 | Cree, Inc. | Methods of fabricating transistors including supported gate electrodes |
US8823057B2 (en) | 2006-11-06 | 2014-09-02 | Cree, Inc. | Semiconductor devices including implanted regions for providing low-resistance contact to buried layers and related devices |
EP1921669B1 (fr) | 2006-11-13 | 2015-09-02 | Cree, Inc. | HEMTs à base de GaN dotés de plaques de champ enterrées |
US7692263B2 (en) | 2006-11-21 | 2010-04-06 | Cree, Inc. | High voltage GaN transistors |
GB2451122A (en) * | 2007-07-20 | 2009-01-21 | X Fab Uk Ltd | Low threshold voltage transistor with non-uniform thickness gate dielectric |
CN103633136B (zh) * | 2012-08-20 | 2016-02-10 | 上海华虹宏力半导体制造有限公司 | Ldmos器件及其制造方法 |
US9679981B2 (en) | 2013-06-09 | 2017-06-13 | Cree, Inc. | Cascode structures for GaN HEMTs |
US9847411B2 (en) | 2013-06-09 | 2017-12-19 | Cree, Inc. | Recessed field plate transistor structures |
TWI584473B (zh) * | 2016-08-10 | 2017-05-21 | 亞洲大學 | 高壓半橋電位移轉器及其製造方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999034449A2 (fr) * | 1997-12-24 | 1999-07-08 | Koninklijke Philips Electronics N.V. | Transistor en couche mince a haute tension a caracteristiques d'etat passant ameliorees et son procede de production |
WO1999035695A1 (fr) * | 1998-01-09 | 1999-07-15 | Infineon Technologies Ag | Interrupteur a haute tension a silicium sur isolant |
WO2000031776A2 (fr) * | 1998-11-25 | 2000-06-02 | Koninklijke Philips Electronics N.V. | Dispositif lateral a film mince silicium sur isolant presentant plusieurs pentes de profil de dopage dans la region de derive |
WO2001003201A1 (fr) * | 1999-06-30 | 2001-01-11 | Koninklijke Philips Electronics N.V. | Dispositif lateral de silicium sur isolant (soi) a film mince comprenant une electrode de grille et une electrode de plaque de champ |
-
2002
- 2002-10-22 WO PCT/IB2002/004412 patent/WO2003038905A2/fr not_active Application Discontinuation
- 2002-10-22 AU AU2002339582A patent/AU2002339582A1/en not_active Abandoned
- 2002-10-31 TW TW091132261A patent/TW200406924A/zh unknown
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999034449A2 (fr) * | 1997-12-24 | 1999-07-08 | Koninklijke Philips Electronics N.V. | Transistor en couche mince a haute tension a caracteristiques d'etat passant ameliorees et son procede de production |
WO1999035695A1 (fr) * | 1998-01-09 | 1999-07-15 | Infineon Technologies Ag | Interrupteur a haute tension a silicium sur isolant |
WO2000031776A2 (fr) * | 1998-11-25 | 2000-06-02 | Koninklijke Philips Electronics N.V. | Dispositif lateral a film mince silicium sur isolant presentant plusieurs pentes de profil de dopage dans la region de derive |
WO2001003201A1 (fr) * | 1999-06-30 | 2001-01-11 | Koninklijke Philips Electronics N.V. | Dispositif lateral de silicium sur isolant (soi) a film mince comprenant une electrode de grille et une electrode de plaque de champ |
Also Published As
Publication number | Publication date |
---|---|
AU2002339582A1 (en) | 2003-05-12 |
TW200406924A (en) | 2004-05-01 |
WO2003038905A2 (fr) | 2003-05-08 |
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