WO2003016590A3 - Dispositif destine a alimenter un reacteur de depot chimique en phase vapeur en melanges gazeux - Google Patents
Dispositif destine a alimenter un reacteur de depot chimique en phase vapeur en melanges gazeux Download PDFInfo
- Publication number
- WO2003016590A3 WO2003016590A3 PCT/DE2002/002592 DE0202592W WO03016590A3 WO 2003016590 A3 WO2003016590 A3 WO 2003016590A3 DE 0202592 W DE0202592 W DE 0202592W WO 03016590 A3 WO03016590 A3 WO 03016590A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- supply line
- cvd reactor
- supplying gas
- gas mixtures
- carrier gas
- Prior art date
Links
- 239000000203 mixture Substances 0.000 title abstract 2
- 239000012159 carrier gas Substances 0.000 abstract 3
- 239000007788 liquid Substances 0.000 abstract 2
- 101000608734 Helianthus annuus 11 kDa late embryogenesis abundant protein Proteins 0.000 abstract 1
- 239000007789 gas Substances 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4408—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber by purging residual gases from the reaction chamber or gas lines
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45561—Gas plumbing upstream of the reaction chamber
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Feeding, Discharge, Calcimining, Fusing, And Gas-Generation Devices (AREA)
Abstract
La présente invention concerne un dispositif comprenant une branche d'alimentation (Z1) destinée à un mélange gazeux composé d'une substance vaporisée (M1) et d'un gaz vecteur (T) et alimentant un réacteur de dépôt chimique en phase vapeur (CVD) (R). La branche d'alimentation (Z1) comprend une conduite d'alimentation destinée à la substance liquide (M1), une conduite d'alimentation destinée au gaz vecteur (T) et une unité de préparation dans laquelle débouchent les conduites et destinée à l'alimentation en substance liquide (M1) au moyen d'une soupape d'injection (EV1) à l'état gazeux, et au mélange de la substance (M1) avec le gaz vecteur (T). les conduites présentent respectivement une unité de régulation de flux (DS11, DS12).
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10137673.1 | 2001-08-01 | ||
DE2001137673 DE10137673A1 (de) | 2001-08-01 | 2001-08-01 | Vorrichtung zur Zufuhr von Gasgemischen zu einem CVD-Reaktor |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003016590A2 WO2003016590A2 (fr) | 2003-02-27 |
WO2003016590A3 true WO2003016590A3 (fr) | 2003-05-30 |
Family
ID=7693981
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE2002/002592 WO2003016590A2 (fr) | 2001-08-01 | 2002-07-15 | Dispositif destine a alimenter un reacteur de depot chimique en phase vapeur en melanges gazeux |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE10137673A1 (fr) |
WO (1) | WO2003016590A2 (fr) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10337568A1 (de) * | 2003-08-14 | 2005-03-17 | Infineon Technologies Ag | Gasversorgungsanordnung, insbesondere für einen CVD-Prozessreaktor zum Aufwachsen einer Epitaxieschicht |
DE10345824A1 (de) * | 2003-09-30 | 2005-05-04 | Infineon Technologies Ag | Anordnung zur Abscheidung von atomaren Schichten auf Substraten |
US20090214777A1 (en) * | 2008-02-22 | 2009-08-27 | Demetrius Sarigiannis | Multiple ampoule delivery systems |
CN110016657B (zh) * | 2018-01-08 | 2020-06-19 | 北京北方华创微电子装备有限公司 | 流量控制方法及装置、反应腔室 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5968588A (en) * | 1997-03-17 | 1999-10-19 | Applied Materials, Inc. | In-situ liquid flow rate estimation and verification by sonic flow method |
US6110531A (en) * | 1991-02-25 | 2000-08-29 | Symetrix Corporation | Method and apparatus for preparing integrated circuit thin films by chemical vapor deposition |
US6176930B1 (en) * | 1999-03-04 | 2001-01-23 | Applied Materials, Inc. | Apparatus and method for controlling a flow of process material to a deposition chamber |
US6179925B1 (en) * | 1999-05-14 | 2001-01-30 | Applied Materials, Inc. | Method and apparatus for improved control of process and purge material in substrate processing system |
US6244575B1 (en) * | 1996-10-02 | 2001-06-12 | Micron Technology, Inc. | Method and apparatus for vaporizing liquid precursors and system for using same |
EP1113089A1 (fr) * | 1999-12-30 | 2001-07-04 | Applied Materials, Inc. | OMCVD de films de zirconate titanate de plomb |
EP1122335A1 (fr) * | 2000-02-01 | 2001-08-08 | Applied Materials, Inc. | Procédé et dispositif de vaporisation de liquides |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06291040A (ja) * | 1992-03-03 | 1994-10-18 | Rintetsuku:Kk | 液体気化供給方法と液体気化供給器 |
JP3122311B2 (ja) * | 1994-06-29 | 2001-01-09 | 東京エレクトロン株式会社 | 成膜処理室への液体材料供給装置及びその使用方法 |
WO1999016929A1 (fr) * | 1997-09-26 | 1999-04-08 | Advanced Technology Materials, Inc. | Systeme de distribution de reactif liquide |
KR100273474B1 (ko) * | 1998-09-14 | 2000-12-15 | 이경수 | 화학기상 증착장치의 가스 공급장치와 그 제어방법 |
JP4230596B2 (ja) * | 1999-03-12 | 2009-02-25 | 東京エレクトロン株式会社 | 薄膜形成方法 |
-
2001
- 2001-08-01 DE DE2001137673 patent/DE10137673A1/de not_active Withdrawn
-
2002
- 2002-07-15 WO PCT/DE2002/002592 patent/WO2003016590A2/fr active Application Filing
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6110531A (en) * | 1991-02-25 | 2000-08-29 | Symetrix Corporation | Method and apparatus for preparing integrated circuit thin films by chemical vapor deposition |
US6244575B1 (en) * | 1996-10-02 | 2001-06-12 | Micron Technology, Inc. | Method and apparatus for vaporizing liquid precursors and system for using same |
US5968588A (en) * | 1997-03-17 | 1999-10-19 | Applied Materials, Inc. | In-situ liquid flow rate estimation and verification by sonic flow method |
US6176930B1 (en) * | 1999-03-04 | 2001-01-23 | Applied Materials, Inc. | Apparatus and method for controlling a flow of process material to a deposition chamber |
US6179925B1 (en) * | 1999-05-14 | 2001-01-30 | Applied Materials, Inc. | Method and apparatus for improved control of process and purge material in substrate processing system |
EP1113089A1 (fr) * | 1999-12-30 | 2001-07-04 | Applied Materials, Inc. | OMCVD de films de zirconate titanate de plomb |
EP1122335A1 (fr) * | 2000-02-01 | 2001-08-08 | Applied Materials, Inc. | Procédé et dispositif de vaporisation de liquides |
Also Published As
Publication number | Publication date |
---|---|
DE10137673A1 (de) | 2003-02-27 |
WO2003016590A2 (fr) | 2003-02-27 |
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