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WO2003081205A3 - Ionization apparatus and method for mass spectrometer system - Google Patents

Ionization apparatus and method for mass spectrometer system Download PDF

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Publication number
WO2003081205A3
WO2003081205A3 PCT/US2003/008041 US0308041W WO03081205A3 WO 2003081205 A3 WO2003081205 A3 WO 2003081205A3 US 0308041 W US0308041 W US 0308041W WO 03081205 A3 WO03081205 A3 WO 03081205A3
Authority
WO
WIPO (PCT)
Prior art keywords
region
sample spots
ionization apparatus
pressure
sample
Prior art date
Application number
PCT/US2003/008041
Other languages
French (fr)
Other versions
WO2003081205A2 (en
Inventor
Alexander A Makarov
Pavel V Bondarnko
Original Assignee
Thermo Finnigan Llc
Alexander A Makarov
Pavel V Bondarnko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/105,172 external-priority patent/US6707036B2/en
Application filed by Thermo Finnigan Llc, Alexander A Makarov, Pavel V Bondarnko filed Critical Thermo Finnigan Llc
Priority to EP03716618A priority Critical patent/EP1492613A4/en
Priority to CA002479872A priority patent/CA2479872C/en
Priority to CN03806617.3A priority patent/CN1703267B/en
Priority to AU2003220320A priority patent/AU2003220320A1/en
Publication of WO2003081205A2 publication Critical patent/WO2003081205A2/en
Publication of WO2003081205A3 publication Critical patent/WO2003081205A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H01J49/0418—Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

An ionization apparatus (10) for connection to a mass analyzer (103) is provided. The ionization apparatus (10) comprises a sample slide (101) having at least two sample spots (100) containing analytes to be analyzed by a mass analyzer (103), means for delivering energy (104) to one of the sample spots to release and ionize the analytes to form ions, and an interface (15) connecting the one of the sample spots (100) to the analyzer. The interface (15) comprises a chamber (118) having an orifice (102) in close proximity to the one of the sample spots (100) and defining a first region encompassing the one of the sample spots, and an ion guide (106) disposed in the chamber (118) and leading to the mass analyzer (103) in a second region. Means for sustaining a pressure substantially lower than atmospheric within the first region is provided for capturing the ions while other sample spots (100) are maintained at atmospheric pressure. Means for sustaining a pressure within the second region substantially lower than the pressure within the first region is provided.
PCT/US2003/008041 2002-03-21 2003-03-14 Ionization apparatus and method for mass spectrometer system WO2003081205A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP03716618A EP1492613A4 (en) 2002-03-21 2003-03-14 Ionization apparatus and method for mass spectrometer system
CA002479872A CA2479872C (en) 2002-03-21 2003-03-14 Ionization apparatus and method for mass spectrometer system
CN03806617.3A CN1703267B (en) 2002-03-21 2003-03-14 Ionization apparatus and method for mass spectrometer system, interface apparatus thereof and mass spectrum system thereof
AU2003220320A AU2003220320A1 (en) 2002-03-21 2003-03-14 Ionization apparatus and method for mass spectrometer system

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US10/105,172 2002-03-21
US10/105,172 US6707036B2 (en) 2002-03-21 2002-03-21 Ionization apparatus and method for mass spectrometer system
US10/341,621 2003-01-13
US10/341,621 US6707040B2 (en) 2002-03-21 2003-01-13 Ionization apparatus and method for mass spectrometer system

Publications (2)

Publication Number Publication Date
WO2003081205A2 WO2003081205A2 (en) 2003-10-02
WO2003081205A3 true WO2003081205A3 (en) 2003-12-18

Family

ID=29738740

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/008041 WO2003081205A2 (en) 2002-03-21 2003-03-14 Ionization apparatus and method for mass spectrometer system

Country Status (4)

Country Link
EP (1) EP1492613A4 (en)
AU (1) AU2003220320A1 (en)
CA (1) CA2479872C (en)
WO (1) WO2003081205A2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8895916B2 (en) 2009-05-08 2014-11-25 Ionsense, Inc. Apparatus and method for sampling of confined spaces
US8901488B1 (en) 2011-04-18 2014-12-02 Ionsense, Inc. Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system
US8963101B2 (en) 2011-02-05 2015-02-24 Ionsense, Inc. Apparatus and method for thermal assisted desorption ionization systems
US9337007B2 (en) 2014-06-15 2016-05-10 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7217921B2 (en) * 2004-01-22 2007-05-15 Thermo Finnigan Llc Method and apparatus for FAIMS for in-line analysis of multiple samples
US7700913B2 (en) * 2006-03-03 2010-04-20 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
US7777181B2 (en) 2006-05-26 2010-08-17 Ionsense, Inc. High resolution sampling system for use with surface ionization technology
CA2726072A1 (en) * 2008-05-29 2009-12-23 Universitaetsklinikum Muenster Ion source means for desorption / ionisation of analyte substances an d method of desorbing / ionising of analyte substances
JP2014524121A (en) * 2011-07-14 2014-09-18 ザ・ジョージ・ワシントン・ユニバーシティ Plume collimation for laser ablation and electrospray ionization mass spectrometry
GB2493179B (en) 2011-07-26 2018-09-05 Kratos Analytical Ltd MALDI sample preparation methods and targets
US9899196B1 (en) 2016-01-12 2018-02-20 Jeol Usa, Inc. Dopant-assisted direct analysis in real time mass spectrometry
GB201705981D0 (en) 2017-04-13 2017-05-31 Micromass Ltd MALDI target plate
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
US10825673B2 (en) 2018-06-01 2020-11-03 Ionsense Inc. Apparatus and method for reducing matrix effects
GB201815676D0 (en) 2018-09-26 2018-11-07 Micromass Ltd MALDI nozzle
WO2021086778A1 (en) 2019-10-28 2021-05-06 Ionsense Inc. Pulsatile flow atmospheric real time ionization
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5106583A (en) * 1989-03-08 1992-04-21 Applied Biosystems, Inc. Automated protein hydrolysis system
US5965884A (en) * 1998-06-04 1999-10-12 The Regents Of The University Of California Atmospheric pressure matrix assisted laser desorption
US20020072096A1 (en) * 2000-02-18 2002-06-13 O'keefe Matthew Apparatus and methods for parallel processing of micro-volume liquid reactions
US6423966B2 (en) * 1996-09-19 2002-07-23 Sequenom, Inc. Method and apparatus for maldi analysis
US20020175278A1 (en) * 2001-05-25 2002-11-28 Whitehouse Craig M. Atmospheric and vacuum pressure MALDI ion source
US20030052268A1 (en) * 2001-09-17 2003-03-20 Science & Engineering Services, Inc. Method and apparatus for mass spectrometry analysis of common analyte solutions

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3796872A (en) * 1970-12-18 1974-03-12 Ass Elect Ind Mass spectrometry
DE69806415T2 (en) * 1997-12-05 2003-02-20 The University Of British Columbia, Vancouver METHOD FOR THE EXAMINATION OF IONS IN AN APPARATUS WITH A FLIGHT-TIME SPECTROMETER AND A LINEAR QUADRUPOL ION TRAP
US6331702B1 (en) * 1999-01-25 2001-12-18 University Of Manitoba Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
CA2227806C (en) 1998-01-23 2006-07-18 University Of Manitoba Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
US6849847B1 (en) 1998-06-12 2005-02-01 Agilent Technologies, Inc. Ambient pressure matrix-assisted laser desorption ionization (MALDI) apparatus and method of analysis
EP1181707B8 (en) * 1999-06-11 2011-04-27 DH Technologies Development Pte. Ltd. Maldi ion source with a pulse of gas, apparatus and method for determining molecular weight of labile molecules
JP2002175770A (en) * 2000-12-08 2002-06-21 Hitachi Ltd Gas exhaust sample chamber and circuit pattern forming apparatus using the same
JP4772212B2 (en) 2001-05-31 2011-09-14 浜松ホトニクス株式会社 X-ray generator

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5106583A (en) * 1989-03-08 1992-04-21 Applied Biosystems, Inc. Automated protein hydrolysis system
US6423966B2 (en) * 1996-09-19 2002-07-23 Sequenom, Inc. Method and apparatus for maldi analysis
US5965884A (en) * 1998-06-04 1999-10-12 The Regents Of The University Of California Atmospheric pressure matrix assisted laser desorption
US20020072096A1 (en) * 2000-02-18 2002-06-13 O'keefe Matthew Apparatus and methods for parallel processing of micro-volume liquid reactions
US20020175278A1 (en) * 2001-05-25 2002-11-28 Whitehouse Craig M. Atmospheric and vacuum pressure MALDI ion source
US20030052268A1 (en) * 2001-09-17 2003-03-20 Science & Engineering Services, Inc. Method and apparatus for mass spectrometry analysis of common analyte solutions

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP1492613A4 *

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8895916B2 (en) 2009-05-08 2014-11-25 Ionsense, Inc. Apparatus and method for sampling of confined spaces
US9390899B2 (en) 2009-05-08 2016-07-12 Ionsense, Inc. Apparatus and method for sampling of confined spaces
US8963101B2 (en) 2011-02-05 2015-02-24 Ionsense, Inc. Apparatus and method for thermal assisted desorption ionization systems
US9224587B2 (en) 2011-02-05 2015-12-29 Ionsense, Inc. Apparatus and method for thermal assisted desorption ionization systems
US9514923B2 (en) 2011-02-05 2016-12-06 Ionsense Inc. Apparatus and method for thermal assisted desorption ionization systems
US8901488B1 (en) 2011-04-18 2014-12-02 Ionsense, Inc. Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system
US9105435B1 (en) 2011-04-18 2015-08-11 Ionsense Inc. Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system
US9337007B2 (en) 2014-06-15 2016-05-10 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US9558926B2 (en) 2014-06-15 2017-01-31 Ionsense, Inc. Apparatus and method for rapid chemical analysis using differential desorption

Also Published As

Publication number Publication date
AU2003220320A1 (en) 2003-10-08
EP1492613A4 (en) 2009-12-16
EP1492613A2 (en) 2005-01-05
AU2003220320A8 (en) 2003-10-08
CA2479872C (en) 2009-06-23
WO2003081205A2 (en) 2003-10-02
CA2479872A1 (en) 2003-10-02

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