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WO2003044571A3 - Coating of optical device facets at the wafer-level - Google Patents

Coating of optical device facets at the wafer-level Download PDF

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Publication number
WO2003044571A3
WO2003044571A3 PCT/GB2002/005205 GB0205205W WO03044571A3 WO 2003044571 A3 WO2003044571 A3 WO 2003044571A3 GB 0205205 W GB0205205 W GB 0205205W WO 03044571 A3 WO03044571 A3 WO 03044571A3
Authority
WO
WIPO (PCT)
Prior art keywords
wafer
facets
optical device
coating
optical devices
Prior art date
Application number
PCT/GB2002/005205
Other languages
French (fr)
Other versions
WO2003044571A2 (en
Inventor
Yee Loy Lam
Hwi Siong Lim
Original Assignee
Denselight Semiconductors Pte
Yee Loy Lam
Hwi Siong Lim
Finnie Peter John
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denselight Semiconductors Pte, Yee Loy Lam, Hwi Siong Lim, Finnie Peter John filed Critical Denselight Semiconductors Pte
Priority to AU2002339189A priority Critical patent/AU2002339189A1/en
Publication of WO2003044571A2 publication Critical patent/WO2003044571A2/en
Publication of WO2003044571A3 publication Critical patent/WO2003044571A3/en

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10Optical coatings produced by application to, or surface treatment of, optical elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/11Anti-reflection coatings

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Semiconductor Lasers (AREA)

Abstract

In the present invention, the or each facet of an optical device is defined on a wafer and then optically coated, prior to separation of the device from the rest of the wafer, which may contain other optical devices whose facets have been processed in the same manner. Thus, the facets of many optical devices may simultaneously be defined by an etching process and then optically coated, whilst the devices form part of the wafer. This approach provides for ease of multiple device manufacture at a lower cost. Furthermore, the etching and coating processes can be performed in the same controlled environment, preferably a vacuum, before the wafer is removed to be diced up into individual optical devices.
PCT/GB2002/005205 2001-11-19 2002-11-18 Coating of optical device facets at the wafer-level WO2003044571A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2002339189A AU2002339189A1 (en) 2001-11-19 2002-11-18 Coating of optical device facets at the wafer-level

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0127690.6A GB0127690D0 (en) 2001-11-19 2001-11-19 Coating of optical device facets at the wafer-level
GB0127690.6 2001-11-19

Publications (2)

Publication Number Publication Date
WO2003044571A2 WO2003044571A2 (en) 2003-05-30
WO2003044571A3 true WO2003044571A3 (en) 2004-04-01

Family

ID=9926024

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/GB2002/005205 WO2003044571A2 (en) 2001-11-19 2002-11-18 Coating of optical device facets at the wafer-level

Country Status (3)

Country Link
AU (1) AU2002339189A1 (en)
GB (1) GB0127690D0 (en)
WO (1) WO2003044571A2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2439973A (en) * 2006-07-13 2008-01-16 Sharp Kk Modifying the optical properties of a nitride optoelectronic device
DE102011054954A1 (en) 2011-10-31 2013-05-02 Osram Opto Semiconductors Gmbh Process for producing an optoelectronic semiconductor component and optoelectronic semiconductor laser
DE102012215265B4 (en) 2012-08-28 2022-09-22 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung METHOD OF MAKING A LASER DIODE, HOLDER AND LASER DIODE
CN108886236B (en) * 2016-02-08 2022-02-25 斯考皮欧技术有限公司 Broadband rearview mirror for III-V chip in silicon photonics
US10732349B2 (en) 2016-02-08 2020-08-04 Skorpios Technologies, Inc. Broadband back mirror for a III-V chip in silicon photonics
DE102020130017A1 (en) 2020-11-13 2022-05-19 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung PROCESSES FOR MANUFACTURING A VARIETY OF SEMICONDUCTOR LASERS AND SEMICONDUCTOR LASERS
GB202113618D0 (en) 2021-09-23 2021-11-10 Sivers Photonics Ltd Etched-facet photonic devices with improved anti-refelction coating

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5185290A (en) * 1989-08-17 1993-02-09 Mitsubishi Denki Kabushiki Kaisha Method of coating facet of semiconductor optical element
EP0684671A1 (en) * 1994-05-04 1995-11-29 Alcatel N.V. Method for the preparation and passivation of the end mirrors of a high emissive power semiconductor laser and related laser device
EP0834489A1 (en) * 1996-10-04 1998-04-08 Dow Corning Corporation Thick opaque ceramic coatings
WO2000021168A1 (en) * 1998-10-08 2000-04-13 Adc Telecommunications, Inc. Semiconductor lasers having single crystal mirror layers grown directly on facet
US6289030B1 (en) * 1997-01-31 2001-09-11 Hewlett-Packard Company Fabrication of semiconductor devices

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5185290A (en) * 1989-08-17 1993-02-09 Mitsubishi Denki Kabushiki Kaisha Method of coating facet of semiconductor optical element
EP0684671A1 (en) * 1994-05-04 1995-11-29 Alcatel N.V. Method for the preparation and passivation of the end mirrors of a high emissive power semiconductor laser and related laser device
EP0834489A1 (en) * 1996-10-04 1998-04-08 Dow Corning Corporation Thick opaque ceramic coatings
US6289030B1 (en) * 1997-01-31 2001-09-11 Hewlett-Packard Company Fabrication of semiconductor devices
WO2000021168A1 (en) * 1998-10-08 2000-04-13 Adc Telecommunications, Inc. Semiconductor lasers having single crystal mirror layers grown directly on facet

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
MAMORU UCHIDA ET AL: "AN ALGAAS LASER WITH HIGH-QUALITY DRY ETCHED MIRRORS FABRICATED USING AN ULTRAHIGH VACUUM IN SITU DRY ETCHING AND DEPOSITION PROCESSING SYSTEM", IEEE JOURNAL OF QUANTUM ELECTRONICS, IEEE INC. NEW YORK, US, vol. 24, no. 11, 1 November 1988 (1988-11-01), pages 2170 - 2177, XP000119041, ISSN: 0018-9197 *
VETTIGER P ET AL: "FULL-WAFER TECHNOLOGY-A NEW APPROACH TO LARGE-SCALE LASER FABRICATION AND INTEGRATION", IEEE JOURNAL OF QUANTUM ELECTRONICS, IEEE INC. NEW YORK, US, vol. 27, no. 6, 1 June 1991 (1991-06-01), pages 1319 - 1331, XP000229827, ISSN: 0018-9197 *

Also Published As

Publication number Publication date
AU2002339189A8 (en) 2003-06-10
WO2003044571A2 (en) 2003-05-30
GB0127690D0 (en) 2002-01-09
AU2002339189A1 (en) 2003-06-10

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