+

WO2003040738A1 - Generateur de synchronisation et appareil d'essai - Google Patents

Generateur de synchronisation et appareil d'essai Download PDF

Info

Publication number
WO2003040738A1
WO2003040738A1 PCT/JP2002/011610 JP0211610W WO03040738A1 WO 2003040738 A1 WO2003040738 A1 WO 2003040738A1 JP 0211610 W JP0211610 W JP 0211610W WO 03040738 A1 WO03040738 A1 WO 03040738A1
Authority
WO
WIPO (PCT)
Prior art keywords
delay
reference clock
circuit unit
delay circuit
timing generator
Prior art date
Application number
PCT/JP2002/011610
Other languages
English (en)
French (fr)
Inventor
Masaru Doi
Shinya Sato
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to DE2002197436 priority Critical patent/DE10297436T5/de
Priority to KR1020047006943A priority patent/KR100860647B1/ko
Publication of WO2003040738A1 publication Critical patent/WO2003040738A1/ja
Priority to US10/842,188 priority patent/US7010729B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/12015—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising clock generation or timing circuitry
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C29/50012—Marginal testing, e.g. race, voltage or current testing of timing

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Tests Of Electronic Circuits (AREA)
PCT/JP2002/011610 2001-11-08 2002-11-07 Generateur de synchronisation et appareil d'essai WO2003040738A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE2002197436 DE10297436T5 (de) 2001-11-08 2002-11-07 Zeitgenerator und Prüfvorrichtung
KR1020047006943A KR100860647B1 (ko) 2001-11-08 2002-11-07 타이밍 발생기 및 시험 장치
US10/842,188 US7010729B2 (en) 2001-11-08 2004-05-10 Timing generator and test apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001342955A JP4279489B2 (ja) 2001-11-08 2001-11-08 タイミング発生器、及び試験装置
JP2001-342955 2001-11-08

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US10/842,188 Continuation US7010729B2 (en) 2001-11-08 2004-05-10 Timing generator and test apparatus

Publications (1)

Publication Number Publication Date
WO2003040738A1 true WO2003040738A1 (fr) 2003-05-15

Family

ID=19156726

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2002/011610 WO2003040738A1 (fr) 2001-11-08 2002-11-07 Generateur de synchronisation et appareil d'essai

Country Status (5)

Country Link
US (1) US7010729B2 (ja)
JP (1) JP4279489B2 (ja)
KR (1) KR100860647B1 (ja)
DE (1) DE10297436T5 (ja)
WO (1) WO2003040738A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112004002615B4 (de) * 2004-01-09 2008-10-16 Advantest Corp. Verfahren zur Kalibrierung eines Zeitsteuertakts
CN107064652A (zh) * 2015-12-09 2017-08-18 致茂电子股份有限公司 可校正的脉波产生装置及其校正方法

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4251800B2 (ja) * 2001-11-08 2009-04-08 株式会社アドバンテスト 試験装置
KR100988486B1 (ko) 2002-03-08 2010-10-20 주식회사 아도반테스토 반도체 시험 장치 및 그 타이밍 측정 방법
JP4002811B2 (ja) 2002-10-04 2007-11-07 株式会社アドバンテスト マルチストローブ生成装置、試験装置、及び調整方法
US7240249B2 (en) * 2003-06-26 2007-07-03 International Business Machines Corporation Circuit for bit skew suppression in high speed multichannel data transmission
US7185239B2 (en) * 2003-09-29 2007-02-27 Stmicroelectronics Pvt. Ltd. On-chip timing characterizer
JP4564250B2 (ja) * 2003-10-09 2010-10-20 Ｏｋｉセミコンダクタ株式会社 半導体装置のファンクションテスト方法
JP4669258B2 (ja) * 2004-10-13 2011-04-13 株式会社アドバンテスト タイミング発生器、及び試験装置
US7583772B2 (en) * 2005-02-22 2009-09-01 Broadcom Corporation System for shifting data bits multiple times per clock cycle
JP4895551B2 (ja) * 2005-08-10 2012-03-14 株式会社アドバンテスト 試験装置および試験方法
KR100995812B1 (ko) 2005-12-28 2010-11-23 가부시키가이샤 어드밴티스트 시험 장치, 시험 방법, 및 프로그램
EP2026081A4 (en) * 2006-05-01 2010-10-06 Advantest Corp TEST DEVICE AND TESTING METHOD
DE112007003570T5 (de) * 2007-06-27 2010-08-26 Advantest Corp. Erfassungsgerät und Prüfgerät
JP5232913B2 (ja) * 2009-04-30 2013-07-10 株式会社アドバンテスト クロック生成装置、試験装置およびクロック生成方法
JP5211239B2 (ja) * 2009-05-11 2013-06-12 株式会社アドバンテスト 受信装置、試験装置、受信方法および試験方法
TWI461717B (zh) * 2012-11-05 2014-11-21 Realtek Semiconductor Corp 掃描時脈產生器以及掃描時脈產生方法
CN114199519B (zh) * 2021-10-31 2024-04-16 昆山丘钛光电科技有限公司 一种测试装置及系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06324118A (ja) * 1993-05-11 1994-11-25 Sharp Corp 半導体集積回路の試験装置
WO1996032654A1 (fr) * 1995-04-13 1996-10-17 Advantest Corporation Generateur de periodes pour dispositif d'essai de semi-conducteurs
JPH11352198A (ja) * 1998-06-04 1999-12-24 Mitsubishi Electric Corp タイミングパルス発生回路および半導体試験装置
US6058057A (en) * 1998-04-17 2000-05-02 Advantest Corp. Timing generator for semiconductor test system
WO2000040984A1 (fr) * 1999-01-08 2000-07-13 Advantest Corporation Dispositif de generation de forme d'onde

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2605300Y2 (ja) * 1993-11-01 2000-07-04 株式会社アドバンテスト 半導体試験装置用周期発生器
JP4118463B2 (ja) * 1999-07-23 2008-07-16 株式会社アドバンテスト タイミング保持機能を搭載したｉｃ試験装置
US6377065B1 (en) * 2000-04-13 2002-04-23 Advantest Corp. Glitch detection for semiconductor test system
JP4251800B2 (ja) * 2001-11-08 2009-04-08 株式会社アドバンテスト 試験装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06324118A (ja) * 1993-05-11 1994-11-25 Sharp Corp 半導体集積回路の試験装置
WO1996032654A1 (fr) * 1995-04-13 1996-10-17 Advantest Corporation Generateur de periodes pour dispositif d'essai de semi-conducteurs
US6058057A (en) * 1998-04-17 2000-05-02 Advantest Corp. Timing generator for semiconductor test system
JPH11352198A (ja) * 1998-06-04 1999-12-24 Mitsubishi Electric Corp タイミングパルス発生回路および半導体試験装置
WO2000040984A1 (fr) * 1999-01-08 2000-07-13 Advantest Corporation Dispositif de generation de forme d'onde

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112004002615B4 (de) * 2004-01-09 2008-10-16 Advantest Corp. Verfahren zur Kalibrierung eines Zeitsteuertakts
CN107064652A (zh) * 2015-12-09 2017-08-18 致茂电子股份有限公司 可校正的脉波产生装置及其校正方法

Also Published As

Publication number Publication date
US20040208048A1 (en) 2004-10-21
KR20040074983A (ko) 2004-08-26
JP4279489B2 (ja) 2009-06-17
JP2003149305A (ja) 2003-05-21
US7010729B2 (en) 2006-03-07
DE10297436T5 (de) 2005-01-13
KR100860647B1 (ko) 2008-09-26

Similar Documents

Publication Publication Date Title
WO2003040738A1 (fr) Generateur de synchronisation et appareil d'essai
TW429322B (en) Semiconductor test system
EP1139201A3 (en) Clock control circuit and clock control method
WO2002023358A3 (en) Digital system of adjusting delays on circuit boards
TW200610273A (en) Adjustable frequency delay-locked loop
TW200419910A (en) Method and device for generating a clock signal having predetermined clock signal properties
WO2005050842A3 (en) Apparatus and method for generating a delayed clock signal
TW353176B (en) A semiconductor device capable of holding signals independent of the pulse width of an external clock and a computer system including the semiconductor
WO2005011118A3 (en) A digital pulse width modulator
WO2008024659A3 (en) Circuits to delay a signal from a memory device
WO2003003577A3 (en) Random pulse width modulation method and device
EP1533906A4 (en) WAVEFORM GENERATION PROCESS, WAVEFORM GENERATION PROGRAM, WAVEFORM GENERATION CIRCUIT AND RADAR EQUIPMENT
TW200713330A (en) Delay locked loop circuit
AU2002238517A1 (en) Random number generator and method for generating a random number
TW200700758A (en) Delay circuit, test circuit, timing generation device, test module, and electronic device
WO2004111860A3 (en) Data processing circuit with multiplexed memory
TW200711316A (en) Clock generation circuit and clock generation method
WO2006115175A3 (ja) 試験装置、プログラム、及び記録媒体
WO2002069495A3 (en) Circuit and method for generating a varying frequency clock signal
TW200614678A (en) Method and apparatus for switching frequency of a system clock
TW200518021A (en) Apparatus and method for processing signals
GB2388979B (en) Delay phase-locked loop device and clock signal generating method
EP1260899A3 (en) Circuit and method for generating a delayed internal clock signal
TWI256539B (en) Apparatus and method for generating a clock signal
TWI318056B (en) Dll circuit having two input standard clocks, clock signal generation circuit having the dll circuit and clock signal generation method

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A1

Designated state(s): DE KR US

WWE Wipo information: entry into national phase

Ref document number: 1020047006943

Country of ref document: KR

WWE Wipo information: entry into national phase

Ref document number: 10842188

Country of ref document: US

REG Reference to national code

Ref country code: DE

Ref legal event code: 8607

点击 这是indexloc提供的php浏览器服务，不要输入任何密码和下载