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WO2002016953A2 - Dispositif et procede pour detecter au moins une grandeur caracteristique d'un mouvement d'elements mobiles les uns par rapport aux autres, notamment pour mecanismes de commande d'automobiles - Google Patents

Dispositif et procede pour detecter au moins une grandeur caracteristique d'un mouvement d'elements mobiles les uns par rapport aux autres, notamment pour mecanismes de commande d'automobiles Download PDF

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Publication number
WO2002016953A2
WO2002016953A2 PCT/DE2001/002788 DE0102788W WO0216953A2 WO 2002016953 A2 WO2002016953 A2 WO 2002016953A2 DE 0102788 W DE0102788 W DE 0102788W WO 0216953 A2 WO0216953 A2 WO 0216953A2
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WO
WIPO (PCT)
Prior art keywords
sensor
test mode
switching
threshold value
control device
Prior art date
Application number
PCT/DE2001/002788
Other languages
German (de)
English (en)
Inventor
Gerhard Juerjens
Original Assignee
Brose Fahrzeugteile Gmbh & Co. Kg, Coburg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Brose Fahrzeugteile Gmbh & Co. Kg, Coburg filed Critical Brose Fahrzeugteile Gmbh & Co. Kg, Coburg
Publication of WO2002016953A2 publication Critical patent/WO2002016953A2/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
    • G01D5/24457—Failure detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/08—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for safeguarding the apparatus, e.g. against abnormal operation, against breakdown
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P21/00—Testing or calibrating of apparatus or devices covered by the preceding groups
    • G01P21/02—Testing or calibrating of apparatus or devices covered by the preceding groups of speedometers

Definitions

  • the invention relates to a device and a method for detecting a movement of parts that are movable relative to one another, in particular for adjusting drives in motor vehicles with a sensor with a sensor element and evaluation electronics and a measuring transducer that is relatively movable in its position or its position relative to the sensor element.
  • a window regulator with a drive for lifting and lowering a window pane and with an anti-trap device is known, with a Hall sensor the speed of the drive and thus the opening and closing speed of the window pane as well as the direction and position of the window pane are detected. Since when the window pane enters the door seal before the window pane closes completely due to the increased resistance, the drive speed drops until the drive comes to a standstill, the pane position must be recorded as accurately as possible. Also, when a body part or object is jammed between the upper edge of the window pane and the door frame, a load on the drive increases and leads to a change in the speed, which has to be determined.
  • Hall sensors are used to record parameters of the movement, that is to say the time-dependent location, the speed or the acceleration
  • DE 25 56 257 A1, DE 23 37 018 A1 and DE32 01 811 A1 disclose devices for detecting the speed, angle or position, in which magnetic or electrical discontinuities are arranged in the direction of movement on one of two objects which are movable relative to one another the other object is provided with sensors which respond to the discontinuities in the distance. The amplitude of the signals from the sensors is monitored using threshold values.
  • the invention is based on the object of specifying a method and a device for detecting a parameter of a movement which increases the reliability of the device without increasing the sensitivity of the device or compensating larger tolerance sums by constructive measures.
  • a sensor of a device for detecting at least one parameter of a movement has means for switching a sensitivity of the device for at least one test mode.
  • Suitable sensors are all those that enable the detection of the parameters of the movement. These sensors respond in particular to a sensor.
  • a magnet attached to an axis of rotation is used as the measuring transducer, the magnetic field of which changes as a result of the rotation of the axis excites a Hall plate of the sensor.
  • An optical or capacitive system serves as an alternative example.
  • a perforated disk attached to an axis of rotation temporarily releases light rays shining through the perforated disk onto a photocell or photodiode depending on the rotational speed.
  • the analogue of the capacitive system has a capacitor arrangement, the capacitance of which varies as a function of the speed of rotation.
  • linear movements or all other types of movements can also be detected.
  • one or more test modes are controlled, by means of which a functionality, a quality, a lack of reliability and / or a defect in the device are determined.
  • an auxiliary sensor variable of the sensor element and / or at least one threshold value of the evaluation electronics can be switched.
  • An auxiliary sensor variable is a Hall current or a photo voltage, or any other variable or controllable variable influencing the sensor or the sensor signals, for example also an analog or digital amplification of the sensor signals.
  • a threshold value is, for example, a comparison value for the Hall voltage or the photocurrent, which is compared by an analog or digital comparator.
  • a sensitivity of the device is characterized by an amplitude of a measured variable of the sensor element and the threshold value of the evaluation electronics.
  • the amplitude is dependent, among other things, on environmental influences, for example the temperature, on the properties of the sensor or the sensor element, for example its geometric dimensions, on the auxiliary sensor size and on properties of the distance between the sensor and the sensor element, for example the geometric distance or the magnetic or optical conductivity of the route.
  • the sensitivity is reduced by switching for test purposes in test mode, deviating from an operating mode.
  • a switching element in particular a semiconductor switch, serves as the means for switching the auxiliary sensor variable and / or the threshold value.
  • a switching transistor switches the strength of the Hall current of the Hall sensor as an auxiliary sensor variable.
  • the measured variable is scanned by means of an analog / digital converter and converted into, for example, binary measured numerical values, which are evaluated by digital evaluation electronics, for example an ASIC or a (further) microcontroller.
  • digital evaluation electronics for example an ASIC or a (further) microcontroller.
  • the measured numerical values are numerically compared in a program with reference numerical values as threshold values.
  • the measured numerical values are compared with test reference numerical values switched by means of the program in a comparison register and the test result of the respective test specimen is determined on the basis of the comparison.
  • the reference number values of the measurement number values changed due to the long-term behavior are adapted and optimized continuously or at certain time intervals.
  • the sensor element has a Hall plate.
  • a change in a Hall current as an auxiliary sensor variable can be switched as a switching element by a switchable current source connected to the Hall plate. For example, one of two current sources connected in parallel is switched off for the test mode.
  • the Hall current thus reduced reduces the sensitivity of the device.
  • Another advantage of this solution is that the Hall current is largely independent of interference on a supply line of the sensor, so that the interference does not propagate to the Hall voltage.
  • the switching element is connected to a control device of the evaluation electronics, which controls the switching element.
  • the control device consists of individual, integrated elements, for example a zener diode or a circuit comprising several integrated and also programmable components.
  • control device is not integrated in the evaluation electronics of the sensor, the switching elements are controlled directly via an external connection, for example a copper track of a printed circuit board. This is particularly advantageous if additional circuits are soldered to a printed circuit board together with the evaluation electronics.
  • the switching element for control is connected to a memory output of a memory as a control device.
  • Non-volatile or volatile memories with one or more memory cells are suitable as memories.
  • Switching values for different threshold values are advantageously stored in a plurality of memory cells in order to adapt the respective threshold values to changed operating or test conditions.
  • several Memory cells are required in particular for several test modes.
  • a flip-flop as a single memory is set via a command and reset via a new command for switching the test mode on and off.
  • a flip-flop with a preferred position is used, which ends the test mode after a supply voltage has been switched off.
  • the switching element for control is connected to a zener diode as a control device.
  • the zener diode is connected, for example, to a supply line, a ground line or a data connection. If the voltage drop across the zener diode exceeds the zener voltage, the zener diode conducts and the switching element is controlled, for example, to the conductive state.
  • any other voltage-detecting component can be used, in particular a comparator that compares the supply voltage, or a part thereof, with a switching reference voltage that characterizes the test mode.
  • the evaluation electronics have one or more burnable electrical elements as switching elements.
  • the burnable electrical elements are energized by a power stage as part of the control device until the element fails (zener zapping, diode zapping or MOS latching).
  • the threshold value is set in the test mode by blowing through the burnable electrical elements by setting the threshold values to the greatest hysteresis in a test mode. If the hysteresis is not sufficient, the device under test is sorted out. If the result of the test is positive, the threshold value is set to an operating threshold value for an operating mode by further blowing through burnable electrical elements of the evaluation electronics. The sensitivity is reduced due to the greater hysteresis in at least one of the test modes. In addition, another test mode for testing the susceptibility to failure can also provide a smaller hysteresis than in the operating mode.
  • the control device can in principle be controlled via one of the connections of the sensor to an external control device, in most cases a microcontroller. All supply lines, data connections or all other optical, acoustic or radio systems are suitable as a connection.
  • a first variant has a data connection via which the control device of the sensor can be controlled.
  • the data connection can be short-circuited to ground by an external control device (MCU).
  • MCU external control device
  • This data connection is advantageously also used to transmit the movement signals, which are evaluated by the control device for controlling the electric motor.
  • the short circuit in turn can be evaluated by an evaluation circuit of the control device for controlling the switching elements connected to the data connection. After the short circuit has been evaluated, a switching state of the switching element for the test mode is stored in a volatile memory.
  • a protocol about the initialization of the test mode is transmitted between the control device and the sensor for switching to the test mode. For example, after a “reset”, a bit sequence is transmitted by the sensor via the following mode. If the test is present, the control device sends a bit sequence that characterizes the test. For important safety aspects, the transmission of this bit sequence is verified between the sensor and the control device. The transmission takes place via a data connection or by means of modulation via a supply line or another optical or radio connection.
  • Fig. 2 is a schematic representation of an intelligent Hall sensor with a
  • FIG. 3 shows a schematic circuit diagram of an intelligent Hall sensor that can be controlled by a microcontroller
  • FIG. 5 shows a schematic circuit diagram of a further embodiment of an intelligent Hall sensor which can be controlled by a microcontroller
  • FIG. 6 shows a schematic circuit diagram of a further embodiment of one of
  • FIG. 8 shows a schematic representation of the time profile of the Hall voltage and the threshold values of the evaluation electronics.
  • FIG. 1 A schematic representation of a motion sensor HS connected to a microcontroller MCU according to the prior art is shown in FIG.
  • the sensor HS consists of a Hall sensor HS, which is excited by a magnetic field B, for example a permanent magnet.
  • the Hall sensor HS has only three connections, for the supply voltage U, the ground connection GND and the signal connection Datal to the microcontroller MCU. Analog or digital data for recording a parameter of a rotary or translatory movement are transmitted exclusively from the Hall sensor HS to the microcontroller MCU.
  • the signal connection Datal is connected to the supply voltage U b via a pull-up resistor R up .
  • the magnetic field B which excites the sensor HS is essentially constant over time when the drive device, in particular the electric motor, is at a standstill. If the electric motor of the drive device is energized, the revolutions of the two-pole or multi-pole permanent magnet generate a change in the magnetic field B which is dependent on the rotational speed of the electric motor and which is imaged by the Hall sensor HS on the change in the Hall voltage. The change in the Hall voltage is transmitted to the MCU microcontroller as an analog or digital signal via the Datal signal connection.
  • the microcontroller MCU evaluates the signal and, using the results of the evaluation, controls one or more power drivers, for example a relay or a power semiconductor, to energize the electric motor (not shown in FIG. 1).
  • power drivers for example a relay or a power semiconductor
  • FIG. 8 shows the time profile of two Hall voltages U H ⁇ (t) and U H2 (t), as well as threshold values S PH , S H , S PL , S L of a threshold switch (Schmitt trigger) or window comparator.
  • the signal width and period of the Hall voltages U H - ⁇ (t) and U H2 (t) depends on the speed of rotation of the electric motor and is shown here as an example for a speed of rotation.
  • the two Hall voltages U H ⁇ (t) and U H2 (t) are intended to represent the output signals of two Hall sensors with production-related tolerances, for example.
  • the threshold values S H and S of the threshold switch are the threshold values valid for an operating mode. Only when these threshold values S H and S L fall below and are exceeded, so that the Hall voltage U H ⁇ (t) or U ⁇ 2 (t) falls below or exceeds the hysteresis between the lower threshold value S ⁇ _ and the upper threshold value SH is at the output of the threshold switch an evaluable digital signal is available. Both signal curves of the Hall voltages U H ⁇ (t) and U H2 (t) shown in FIG. 8 meet this criterion. However, it can be seen from FIG. 8 that the signal curve of the Hall voltage U H2 (t) only slightly exceeds the upper threshold value S H.
  • the Hall sensor - threshold switch - device is functional at the start of operation, but the long-term behavior of the device can lead to an only a slight drop in the maximum Hall voltage U H2 (t). Such a drop is caused, for example, by a change in the distance between the permanent magnet and the sensor or changes in the sensor or the magnetic field strength of the permanent magnet, which is indicated by a block arrow in FIG. Another cause is possibly a noticeable, for example temperature-dependent drift of the threshold values S H or S.
  • test thresholds S PH , S P L are set for a test of the device to be carried out before the operating phase, which reduce the sensitivity of the device by increasing the hysteresis by a certain amount.
  • the device with the Hall voltage U H ⁇ (t) would accordingly pass the test, the other device with the Hall voltage U H2 (t) would be sorted out accordingly.
  • the circuit arrangements shown in FIGS. 2 to 5 and 7 are suitable for such a test, for example.
  • FIG. 2 shows a schematic circuit diagram of an intelligent Hall sensor iHS1.
  • a Hall plate HP is excited by the magnetic field B as a function of the speed of rotation.
  • the intelligence of the iHS1 sensor consists of the evaluation electronics, which are integrated with the Hall plate HP on a semiconductor chip.
  • the iHS1 sensor can have additional intelligence, for example for controlling switches SW1, SW2 or the analog or digital filtering of interference.
  • the Hall voltage U H which is dependent on the magnetic field, is evaluated in the operating mode by a threshold switch consisting of a comparator OP1 and the resistors R1, R2, R5, R6 and fed to the microcontroller MCU for evaluation via an output driver BUF.
  • a threshold switch consisting of a comparator OP1 and the resistors R1, R2, R5, R6 and fed to the microcontroller MCU for evaluation via an output driver BUF.
  • the resistors R5 and R6 and the comparator OP1 alternatively also an operational amplifier OP1, a corresponding loop gain and the resistors R1 and R2 the reference voltage U ref ⁇ .
  • resistor R2 With switches SW1 and SW2, resistor R2, resistor R3, or resistor R6, resistor R4 are connected in parallel to achieve the threshold to change values S H or S L of the threshold switch for the test mode.
  • the resistors R4 and R3 can also be connected in series with the resistors R6 and R2.
  • FIG 2 has only one of many possibilities for the construction of a threshold switch. Another variant is shown in FIG. 7, for example.
  • the resistors R1 to R6 arranged as an example in FIG. 2 enable the sensitivity of the intelligent Hall sensor iHS1 to be reduced with respect to the received magnetic field B by switching the switches SW1 and SW2.
  • Ohmic resistors can only be integrated with active components with greater effort and greater spread of the parameters on-chip.
  • the resistors R1 to R6 are therefore shown in the figures only for the sake of simplicity as ohmic resistors. Diodes or active resistors, for example correspondingly connected transistors, are advantageously used as resistors R1 to R6 for the voltage dividers R1, R2, R3 or R4, R5, R6.
  • the switches SW1 and SW2 can also be integrated as switching transistors SW1 and SW2 on chip, so that all the elements shown in FIG. 2 are integrated together with the Hall plate HP on a semiconductor chip.
  • a preferred embodiment of the invention is shown schematically in FIG. To simplify the illustration, only a parallel connection from the resistor R3 to the resistor R2 can be switched by the switching transistor T1 as an example. Analogously, all other series or parallel connections for reducing the sensitivity are also possible.
  • the switching transistor T1 is controlled by a memory FF, a flip-flop FF.
  • the flip-flop FF has a preferred position, so that after the supply voltage U b is switched on, the flip-flop FF in the preferred position does not control the switching transistor T1 and thus blocks the switching transistor T1. Further inputs and outputs of the flip-flop FF are not shown in order to emphasize the functional context. However, additional functions can be controlled or evaluated with the inverting input and output.
  • the short circuit of the data connection Data2 is determined for a high level at the input of the output driver BUF by the exclusive or gate EXOR and the flip-flop FF is set.
  • the intelligent Hall sensor iHS2 has now switched to test mode.
  • the microcontroller MCU then removes the short circuit of the data connection Data2 to ground GND and evaluates the movement signals transmitted via the data connection Data2 from the intelligent Hall sensor iHS2 to the microcontroller MCU when the electric motor is rotating.
  • the Hall voltage UH does not exceed or fall below the test threshold values S PH , S P, so no output signals of the comparator OP1 are transmitted via the data connection Data2.
  • the device is recognized as defective by the microcontroller MCU and, for example, transmitted to a service device.
  • the short-circuit current can not be shown in FIG. 3 by the microcontroller MCU.
  • the microcontroller recognizes the functionality of the device. After an operating voltage interruption, the flip-flop FF is again in the preferred position and the intelligent Hall sensor iHS2 is in operating mode. The test can be repeated by the MCU microcontroller at any time and, for example, activated by a service specialist.
  • FIG. 4 shows a schematic circuit diagram of a further embodiment of the invention.
  • the intelligent Hall sensor iHS3 is already in test mode before start-up.
  • the microcontroller MCU can also (not necessarily) check the test mode. No additional signaling on the part of the Microcontroller MCU necessary. Rather, the bipolar transistor T2, which is significant for the test mode, is energized via the resistor R7 and the fuse SU.
  • the fuse SH is, for example, a thin aluminum sheet or alternatively a diode.
  • the voltage stabilizer ST serves to stabilize the variable supply voltage U var of the intelligent Hall sensor iHS3, which is loaded with disturbances, to the voltage U stab , for example 5V.
  • the microcontroller MCU increases the supply voltage U var .
  • the Zener diode ZD1 becomes conductive and drives the thyristor TY1.
  • the thyristor TY1 fires and the fuse SH blows.
  • the bipolar transistor T2 can no longer be controlled and the intelligent Hall sensor iHS3 is permanently in operating mode.
  • the motion signals are transmitted from the intelligent Hall sensor iHS3 to the microcontroller MCU via the data connection data3, so that the connection I of the microcontroller MCU connected to the Hall sensor iHS3 is only an input in this case.
  • the supply voltage U var of the intelligent hall sensor iHS4 is increased by a corresponding control of the microcontroller MCU or another control element.
  • the Zener diode ZD2 connected to the supply line becomes conductive due to the voltage increase and controls the bipolar transistor T3 via the resistor R8.
  • the supply voltage U var is sufficiently lowered so that the Zener diode ZD2 blocks.
  • FIG. 6 shows a schematic circuit diagram of a further embodiment of the invention.
  • the Zener diode ZD3 conducts a voltage increase in the supply voltage U var .
  • the Zener current of the Zener diode ZD3 controls a switchable current source IST for the Hall current I Ha ⁇ of the Hall plate HP.
  • the Hall current l Ha ⁇ is reduced in the test mode by the switchable current source IST by switching the current source IST.
  • By reducing the Hall current I Ha ⁇ the sensitivity of the intelligent Hall sensor iHS5 is reduced.
  • 7 shows a schematic circuit diagram of a further development of the invention.
  • the microcontroller MCU is connected via a bidirectional data connection Data6 to a control device CON of the intelligent Hall sensor iHS6.
  • the connections I / O or I / 0 Ha ⁇ both the control device CON of the intelligent Hall sensor iHS6 and the microcontroller MCU have an input and output function for communication.
  • the microcontroller MCU After switching on the supply voltage U, the microcontroller MCU sends a test signal to the control device CON for initializing the test mode.
  • the electric motor is energized simultaneously or subsequently.
  • the Hall voltage U H is compared by two comparators OP2 and OP3 with the reference voltages U ref2 and U ref 3 as threshold values.
  • the reference voltages U r ⁇ f2 and U ref3 correspond to the upper and lower threshold values S PH , S, S P , S of the threshold switch.
  • the two reference voltages U ref2 and U ref3 are varied by setting a resistance network NET which has a plurality of voltage dividers which can be set by switches.
  • the resistor network NET which has, for example, ohmic, active or diode resistors, is connected to the control device CON via one or more control connections D ab .
  • the individual resistors of the resistor network NET are advantageously connected to a binary counter which is clocked by the control device.
  • the clocking changes the respective voltage divider and thus the respective reference voltage U r ⁇ f2 and U r ⁇ f 3 incrementally until the digital information of the threshold switch can be evaluated.
  • the count value of the counter is stored, for example, in a non-volatile memory, an EEPROM.
  • the control device reduces the hysterical window, which is determined by the respective reference voltage U ref2 or U ref3 , by switching the voltage dividers of the resistor network NET until the control device CON detects the movement signals of the Hall voltage U H at the output of the respective comparator OP2 or OP3 recognizes. This can also be carried out in succession, separately for both threshold values S PH and S PL .
  • the CON control device signals the microcontroller MCU via the Data6 data connection that the intelligent Hall sensor iHS6 is working.
  • the two reference voltages U ref2 and U ref 3 are then used for the operating mode in the installed state of the intelligent hall sors iHS6 optimized by determining a possible drift of the Hall voltage U H or the reference voltages U ref2 or U ref3 and the interference immunity required according to the requirements by the size of the hysteresis window .
  • the reference voltages U r ⁇ f2 and U ref3 are set appropriately optimized for the operating mode.
  • the function groups that is to say a drive device with an electric motor and built-in intelligent hall sensor iHS6, are divided into different quality classes on the basis of the sensitivity.
  • step 1 the test mode is signaled to the intelligent Hall sensor iHS2 by the microcontroller MCU by the microcontroller MCU shorting its input / output I / O to ground GND for 100ms.
  • step 2 the electric motor is energized for 100 ms at the same time.
  • step 3 the exclusive-OR gate EXOR detects the voltage difference that is at least temporarily present due to the short circuit between the input and output of the output driver BUF.
  • step 4 the flip-flop FF is set in the sensor iHS2 and the switching transistor T1 is activated, thus reducing the sensitivity of the evaluation electronics.
  • step 5 the microcontroller MCU switches the output I / O to the input I / O and evaluates motion signals transmitted via the data connection Data2.
  • step 6 the microcontroller MCU uses the evaluation to decide whether the test object is functional in the sense of the test.
  • the flip-flop FF only remains set until an operating voltage interruption and returns to the preferred position when the operating voltage is switched on again.
  • step 7 the functional device under test works with normal sensitivity.
  • R1 to R8 R up resistors (ohmic, active, diodic etc.)
  • SW1.SW2 switches semiconductor switches, transistors
  • T2 T3 bipolar transistor, switching transistor

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Abstract

L'invention concerne le détecteur d'un dispositif permettant de détecter un mouvement, qui comprend des moyens pour coupler une sensibilité du dispositif pour au moins un mode de vérification. Le détecteur répond en particulier à un générateur de mesure. Le générateur de mesure utilisé est par exemple un aimant fixé sur un pivot, dont le champ magnétique qui varie excite une plaque Hall sous l'effet de la rotation du pivot. Dans le mode de vérification, une grandeur auxiliaire de détection de l'élément de détection et/ou au moins une valeur-seuil de l'unité électronique d'évaluation peuvent être couplées. Une grandeur auxiliaire de détection est par exemple un courant de Hall. Une valeur-seuil est comparée avec un signal de mesure par un comparateur analogique ou numérique. Une sensibilité du dispositif est caractérisée par une amplitude d'une grandeur de mesure d'un élément de détection et la valeur-seuil de l'unité électronique d'évaluation. La sensibilité est réduite à des fins de vérification, en mode de vérification, s'écartant d'un mode de fonctionnement.
PCT/DE2001/002788 2000-08-25 2001-07-17 Dispositif et procede pour detecter au moins une grandeur caracteristique d'un mouvement d'elements mobiles les uns par rapport aux autres, notamment pour mecanismes de commande d'automobiles WO2002016953A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10041736.1 2000-08-25
DE10041736A DE10041736C1 (de) 2000-08-25 2000-08-25 Vorrichtung und Verfahren zum Erfassen mindestens einer Kenngröße einer Bewegung von zueinander beweglichen Teilen, insbesondere für Verstellantriebe in Kraftfahrzeugen

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TWI612765B (zh) * 2016-03-31 2018-01-21 高田工業所股份有限公司 決定三相感應馬達之固有特徵量的方法
JP2018141656A (ja) * 2017-02-27 2018-09-13 日産自動車株式会社 回転角度検出装置

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007014945A1 (fr) * 2005-08-01 2007-02-08 Robert Bosch Gmbh Procede et systeme pour controler une premiere valeur de tension
JP2009504044A (ja) * 2005-08-01 2009-01-29 ローベルト ボッシュ ゲゼルシャフト ミット ベシュレンクテル ハフツング 第１の電圧値を検査する方法及び装置
TWI612765B (zh) * 2016-03-31 2018-01-21 高田工業所股份有限公司 決定三相感應馬達之固有特徵量的方法
JP2018141656A (ja) * 2017-02-27 2018-09-13 日産自動車株式会社 回転角度検出装置

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