WO2002014924A1 - Systeme optique d'image a relais et dispositif optique d'eclairage, et systeme d'exposition dote de ce systeme optique - Google Patents
Systeme optique d'image a relais et dispositif optique d'eclairage, et systeme d'exposition dote de ce systeme optique Download PDFInfo
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- WO2002014924A1 WO2002014924A1 PCT/JP2001/006913 JP0106913W WO0214924A1 WO 2002014924 A1 WO2002014924 A1 WO 2002014924A1 JP 0106913 W JP0106913 W JP 0106913W WO 0214924 A1 WO0214924 A1 WO 0214924A1
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- optical system
- lens group
- imaging optical
- lens
- relay imaging
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70066—Size and form of the illuminated area in the mask plane, e.g. reticle masking blades or blinds
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/14—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation
- G02B13/143—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation for use with ultraviolet radiation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/24—Optical objectives specially designed for the purposes specified below for reproducing or copying at short object distances
Definitions
- the present invention relates to a relay imaging optical system, an illumination optical device including the optical system, and an exposure device.
- the present invention relates to an imaging optical system suitable for an illumination optical apparatus of an exposure apparatus for manufacturing a micro device such as a semiconductor device, an imaging device, a liquid crystal display device, and a thin film magnetic head in a lithography process.
- a light beam emitted from a light source is incident on an optical integrator such as a fly-eye lens, and then forms a secondary light source consisting of a number of light sources on a side focal plane.
- the light beam from the secondary light source is condensed by a condenser lens and then forms an illumination field on a predetermined surface conjugate with the mask.
- a mask blind as an illumination field stop is arranged near the predetermined surface.
- the luminous flux from the illuminated field formed on the predetermined surface is restricted via the illumination field stop, and then illuminates the mask on which the predetermined pattern is formed in a superimposed manner via the relay imaging optical system.
- an image of the opening of the illumination field stop is formed as an illumination area on the mask.
- the light transmitted through the mask pattern forms an image on a photosensitive substrate via a projection optical system. In this way, the pattern of the mask is projected and exposed (transferred) on the photosensitive substrate.
- the optical axis of the projection optical system is adjusted so that the effect of gravity on the mask and the photosensitive substrate is symmetric about the optical axis of the projection optical system with respect to the mask and the photosensitive substrate.
- the mask and photosensitive substrate are supported horizontally in the direction of gravity (vertical direction).
- a relay imaging optical system that optically couples the illumination field stop and the mask in an optically conjugate manner is arranged at the top of the exposure apparatus. Therefore, in order to make the exposure apparatus less susceptible to vibration, it is desirable to reduce the size and weight of the relay imaging optical system. In other words, the relay It is desirable to form the imaging optical system with a small number of lenses.
- the wavelength of 2 4 8 nm K r F excimer laser light source or a wavelength of 1 9 3 nm A r F Excimer laser light sources and the like are used as exposure light sources.
- the generation of harmful gas easily foggs the lens surface and that the light transmittance of the lens tends to decrease.
- the relay imaging optical system requires a small number of lenses. Is advantageous.
- a relay imaging optical system for forming an image on a first surface on a second surface, the optical system having an imaging magnification of less than three times.
- the total number of lenses constituting the optical system is 10 or less
- the optical system has at least two aspheric surfaces, and one of the at least two aspheric surfaces is the first surface.
- a relay imaging optical system wherein the relay imaging optical system is arranged near the first surface or the second surface.
- the optical system includes a first lens group, a second lens group, and a third lens group in this order from the first surface side, and the first lens group and the third lens group have a small number. Both preferably have one aspheric surface. It is preferable that the second lens unit has at least one aspheric surface.
- the first lens group includes a meniscus lens L1 having a concave surface facing the first surface side, and at least two positive lenses
- the second lens group and the third lens group include: It is preferable to have at least one positive lens respectively.
- the radius of curvature of the concave surface on the first surface side of the meniscus lens L1 is R1
- the focal length of the first lens group G1 is f1, 0. 1 ⁇ I ⁇ l / R l I ⁇ 1 0
- a relay imaging optical system for forming an image on a first surface on a second surface
- the optical system is arranged such that an image plane is located at a finite distance in order from the first surface side.
- a relay imaging optical system is provided, wherein the total number of lenses constituting the optical system is 10 or less.
- an aperture stop for blocking unnecessary light beams is arranged near the second lens group. It is preferable that the second lens group has a magnification of 110 to 100 times. Further, it is preferable that the second lens group has at least an aspheric surface.
- the optical system in a relay imaging optical system that forms an image on a first surface on a second surface, includes, in order from the first surface, a first lens group, A second lens group having a magnification and a third lens group, and at least two of the first to third lens groups each have at least one aspheric surface.
- a relay imaging optical system is provided, wherein the total number of lenses constituting the optical system is 10 or less.
- the second lens group has a magnification of 1/1000 to 100 times. Further, it is preferable that each of the first lens group and the third lens group has at least one aspheric surface. Further, it is preferable that the second lens group has at least one aspheric surface.
- the illumination optical device for illuminating a surface to be illuminated
- a light source for supplying a light beam
- an illumination field forming means for forming an illumination field on a predetermined surface based on the light beam from the light source
- the relay imaging optical system according to the first to third inventions for forming an image of an illumination field formed on the first surface as the predetermined surface on the second surface as a surface to be irradiated.
- a field stop for changing an illumination area on the irradiated surface be arranged on the predetermined surface.
- a projection optical system for projecting and exposing a mask pattern set on the surface to be irradiated onto a photosensitive substrate. An exposure apparatus is provided.
- the sixth invention of the present invention includes an exposure step of exposing a pattern of a mask on a photosensitive substrate by the exposure apparatus of the fifth invention, and a developing step of developing the photosensitive substrate exposed in the exposure step. And a method for manufacturing a microphone opening device.
- FIG. 1 is a diagram schematically showing a configuration of an exposure apparatus according to the present invention.
- FIG. 2 is a diagram illustrating a lens configuration of the relay imaging optical system according to the first example of the present invention.
- FIG. 3 is a diagram in which the relay imaging optical system according to the first example of the present invention is developed along one linear optical axis.
- FIG. 4 is a diagram in which the relay imaging optical system according to the second example of the present invention is developed along one linear optical axis.
- FIG. 5 is a diagram in which the relay imaging optical system according to the third example of the present invention is developed along one linear optical axis.
- FIG. 6 is a diagram in which the relay imaging optical system according to the fourth example of the present invention is developed along one linear optical axis.
- FIG. 7 is a diagram showing spherical aberration (transverse aberration display) in the first example of the present invention.
- FIG. 8 is a flowchart of a method for obtaining a semiconductor device as a micro device.
- FIG. 9 is a flowchart of a method for obtaining a liquid crystal display element as a micro device.
- spherical aberration of a pupil remains to some extent.
- subtle defocusing between the image plane of the projection optical system and the photosensitive substrate
- Displacement causes distortion. Therefore, in the relay imaging optical system that optically conjugates the illumination field stop and the mask in the illumination system of the exposure apparatus, it is necessary to compensate (correct) the spherical aberration of the pupil of the projection optical system.
- At least two aspherical surfaces are introduced into a relay imaging optical system having an imaging magnification of less than 3 times, and one of the aspherical surfaces is placed on an object surface (in the case of an exposure apparatus, an illumination field is used as an illumination field). In this case, it is arranged near the stop surface or near the image surface (the pattern surface of the mask in the case of an exposure apparatus).
- the relay imaging optical system is composed of, for example, the first lens group, the second lens group, and the third lens group, the first lens group close to the object plane or the third lens group close to the image plane.
- spherical aberration of the pupil of the projection optical system can be compensated without difficulty even though the configuration is simple with less than 10 lenses. Further, since the imaging magnification of the relay imaging optical system is less than three times, the spherical aberration of the relay imaging optical system itself can be reduced, so that it is easy to further reduce the number of lenses.
- the spherical aberration of the pupil of the projection optical system can be more comfortably compensated with a simpler configuration by introducing an aspheric surface to each of the first lens group and the third lens group.
- the first lens group is configured such that its image plane is located at a finite distance.
- the second lens group is configured to have a magnification of substantially 1/1000 to 100 times, for example. Since the image plane of the first lens group is located at a finite distance, and the second lens group has a magnification, the degree of freedom in design is increased, the number of lenses can be easily reduced, and the maximum diameter of the lens is reduced. be able to.
- the present invention by introducing an aspherical surface also in the second lens group, it is possible to satisfactorily correct spherical aberration as an imaging characteristic of the optical system. Further, according to the present invention, the occurrence of flare and the like can be avoided by disposing an aperture stop near the pupil plane of the optical system, that is, near the second lens group to block unnecessary light beams.
- the first lens group includes a meniscus lens L1 having a concave surface facing the object side, and at least two positive lenses.
- the second lens group and the third lens group each have at least one positive lens.
- R 1 is the radius of curvature of the concave surface on the object side of the meniscus lens L 1.
- F1 is the focal length of the first lens group G1.
- Exceeding the upper limit of conditional expression (1) is not preferable, because positive high-order spherical aberrations are large and cannot be corrected.
- the Pepper's sum increases, and the blur of the image of the object plane (image of the aperture of the illumination field stop) formed on the image plane (mask plane) increases. Is not preferred. Further, spherical aberration of the pupil of the projection optical system is not easily compensated for, which leads to an increase in the number of lenses, which is not preferable.
- the illumination optical apparatus and the exposure apparatus incorporating the relay imaging optical system of the present invention are not easily affected by fogging of the lens surface due to harmful gas even when an excimer laser single light source is used, for example. Is not easily affected by a decrease in light transmittance.
- the exposure apparatus has a structure that is less susceptible to vibration due to the reduction in size and weight of the relay imaging optical system.
- a favorable microdevice can be manufactured with high accuracy.
- FIG. 1 is a view schematically showing a configuration of an exposure apparatus according to an embodiment of the present invention.
- the Z axis is along the normal direction of the photosensitive substrate W
- the Y axis is in the direction parallel to the plane of FIG. 1 in the wafer plane
- the Y axis is perpendicular to the plane of FIG. 1 in the wafer plane.
- the X axis is set in different directions.
- the exposure apparatus shown in Fig. 1 supplies light with a wavelength of, for example, 2448 nm (KrF) or 1933 ⁇ m (ArF) as the light source 1 for supplying the exposure light (illumination light-).
- An excimer laser light source is provided.
- the nearly parallel light flux emitted from the light source 1 along the Y direction is elongated along the X direction. It has an elongated rectangular cross section.
- This light beam enters a beam expander 2 composed of a pair of lenses 2a and 2b.
- Each lens 2a and 2b has a negative power and a positive power, respectively, in FIG.
- at least one of the pair of lenses 2a and 2b is configured to be movable along the optical axis AX. Therefore, the light beam incident on the beam expander 2 is enlarged in the paper of FIG. 1 in accordance with the distance between the pair of lenses 2a and 2b, and shaped into a light beam having a desired rectangular cross section.
- a substantially parallel light beam passing through a beam expander 2 as a shaping optical system is incident on a micro fly's eye 3 after being deflected in the Z direction by a bending mirror.
- the microphone opening fly-eye 3 is an optical element composed of a large number of regular hexagonal microlenses having positive refractive power, which are arranged densely and vertically and horizontally.
- a micro fly's eye is formed by, for example, etching a parallel flat glass plate to form a group of minute lenses.
- each micro lens constituting the micro fly's eye is smaller than each lens element constituting the fly's eye lens.
- the micro fly's eye is different from the fly's eye lens which consists of lens elements isolated from each other, and a large number of micro lenses are integrally formed without being isolated from each other.
- the micro fly-eye is the same as the fly-eye lens in that the lens elements having positive refractive power are arranged vertically and horizontally. In FIG. 1, the number of microlenses constituting the micro fly's eye 3 is much smaller than the actual number for the sake of clarity.
- the light beam incident on the micro fly's eye 3 is two-dimensionally divided by a large number of microlenses, and one light source (light collecting point) is formed on the rear focal plane of each microlens.
- Light beams from a number of light sources formed on the rear focal plane of the micro fly's eye 3 are incident on a diffractive optical element (DOE) 5 for annular illumination through an afocal zoom lens 4.
- DOE diffractive optical element
- the afocal zoom lens 4 is configured so that the magnification can be continuously changed within a predetermined range while maintaining an afocal system (a non-focusing optical system).
- Micro fly eye 3 rear focal plane and rotation The diffraction surface of the folding optical element 5 is optically conjugated.
- the numerical aperture of the light beam condensed on one point on the diffraction surface of the diffractive optical element 5 changes depending on the magnification of the afocal zoom lens 4.
- a diffractive optical element is formed by forming a step having a pitch of about the wavelength of exposure light (illumination light) on a glass substrate, and has an action of diffracting an incident beam to a desired angle.
- the diffractive optical element 5 for annular illumination converts the incident rectangular light beam into an annular (annular) light beam.
- the light beam having passed through the diffractive optical element 5 enters a fly-eye lens 7 as an optical integrator via a zoom lens 6.
- the entrance surface of the fly-eye lens 7 is positioned near the rear focal plane of the zoom lens 6. Therefore, the light beam having passed through the diffractive optical element 5 forms an annular illumination field centered on the optical axis AX on the rear focal plane of the zoom lens 6 and thus on the entrance plane of the fly-eye lens 7.
- the size of this annular illumination field changes depending on the focal length of the zoom lens 6.
- the zoom lens 6 connects the diffractive optical element 5 and the entrance surface of the fly-eye lens 7 substantially in a Fourier transform relationship.
- the fly-eye lens 7 is constituted by arranging a large number of lens elements having a positive refractive power densely and longitudinally.
- Each lens element constituting the fly-eye lens 7 has a rectangular cross section similar to the shape of the illumination field to be formed on the mask (and, consequently, the shape of the exposure area to be formed on the wafer).
- the entrance surface of each lens element constituting the fly-eye lens 7 is formed in a spherical shape with a convex surface facing the entrance side, and the exit surface is formed in a spherical shape with a convex surface facing the exit side. I have.
- the light beam incident on the fly-eye lens 7 is two-dimensionally divided by a large number of lens elements, and a large number of light sources are formed on the rear focal plane of each lens element on which the light beam has entered.
- the rear focal plane of the fly-eye lens 7 has a ring-shaped surface light source (hereinafter referred to as “secondary light source”) having almost the same light intensity distribution as the illumination field formed by the light beam incident on the fly-eye lens 7. Is formed.
- the luminous flux from the annular secondary light source formed on the rear focal plane of the lens 7 is Is incident on an aperture stop 8 arranged near.
- the light from the secondary light source through the aperture stop 8 having a ring-shaped aperture (light transmitting portion) is subjected to the condensing action of the condenser optical system 9 and then illuminates the side focal plane in a superimposed manner.
- a rectangular illumination field similar to the shape of each lens element constituting the fly-eye lens 7 is formed on the rear focal plane of the condenser optical system 9, a rectangular illumination field similar to the shape of each lens element constituting the fly-eye lens 7 is formed.
- the micro fly's eye 3 to the condenser optical system 9 constitute an illumination field forming means for forming an illumination field on a predetermined surface (the rear focal plane of the condenser optical system 9) based on the light beam from the light source 1. are doing.
- a mask blind 10 as an illumination field stop is arranged on a predetermined surface on which the rectangular illumination field is formed.
- the light flux passing through the rectangular opening (light transmitting portion) of the mask blind 10 is subjected to the light condensing action of the relay imaging optical system 11 and then superimposed on the mask M on which a predetermined pattern is formed. Lighting.
- the relay imaging optical system 11 forms an image of the rectangular opening of the mask blind 10 on the mask M. The details of the relay imaging optical system 11 will be described later with reference to four embodiments.
- the light flux transmitted through the pattern of the mask M forms an image of the mask pattern on the wafer W as a photosensitive substrate via the projection optical system PL. Then, by performing batch exposure or scan exposure while driving and controlling the wafer W two-dimensionally in a plane (XY plane) orthogonal to the optical axis AX of the projection optical system PL, a mask is formed on each exposure area of the wafer W. M patterns are sequentially exposed.
- a mask pattern is collectively exposed to each exposure region of a wafer according to a so-called step 'and' repeat method.
- the shape of the illumination area on the mask M is a rectangular shape close to a square
- the cross-sectional shape of each lens element of the fly eye lens 7 is also a rectangular shape close to a square.
- scan exposure a mask pattern is scanned and exposed to each exposure region of a wafer while moving the mask and the wafer relative to a projection optical system according to a so-called step-and-scan method.
- the shape of the illumination area on the mask M is a rectangular shape having a ratio of the short side to the long side of, for example, 1: 3, and the cross-sectional shape of each lens element of the fly-eye lens 7 is similar to this.
- Shape In the present embodiment, by changing the magnification of the afocal zoom lens 4, both the outer diameter (size) and the annular ratio (shape) of the secondary light source having an annular shape can be changed. . In addition, by changing the focal length of the zoom lens 6, the outer diameter of the annular secondary light source can be changed without changing the annular ratio. As a result, by appropriately changing the magnification of the afocal zoom lens 4 and the focal length of the zoom lens 6, it is possible to change only the annular ratio without changing the outer diameter of the annular secondary light source. it can.
- the diffractive optical element 5 for annular illumination by switching the diffractive optical element 5 for annular illumination to, for example, a diffractive optical element for quadrupole illumination or a diffractive optical element for octupole illumination, the diffractive optical element 5 for quadrupole illumination or octupole illumination is changed.
- Various modified illuminations can be performed.
- the annular aperture stop 8 in conjunction with the switching of the diffractive optical element 5, the annular aperture stop 8 is switched to, for example, a 4-pole aperture stop or an 8-pole aperture stop.
- ordinary circular illumination can be performed by retracting the micro fly's eye 3 from the illumination optical path and switching the diffractive optical element 5 for annular illumination to a diffractive optical element for ordinary circular illumination. In this case, the annular aperture stop 8 is switched to the circular aperture stop in conjunction with the switching of the diffractive optical element 5.
- FIG. 2 is a diagram illustrating a lens configuration of the relay imaging optical system according to the first example of the present invention.
- FIG. 3 is a diagram in which the relay imaging optical system according to the first embodiment is developed along one linear optical axis.
- the relay imaging optical system of the first embodiment includes, in order from the object side (mask blind 10 side), a cover glass (parallel plane plate) CP, a first lens group G 1, an aperture stop S, and a second lens.
- the third lens group G3 includes a group G2 and a third lens group G3.
- the first lens group G 1 includes, in order from the object side, a negative meniscus lens L 1 having a concave surface facing the object side and an aspherical surface on the image side, and a positive meniscus lens having a concave surface facing the object side. It is composed of a positive meniscus lens having a concave surface facing the object side and a biconvex lens.
- the second lens group G2 includes a biconvex lens having an aspherical surface on the image side.
- the third lens group G3 is composed of a positive meniscus lens having a convex surface formed in an aspherical shape facing the object side.
- the six lenses and the cover glass CP and the mask M that constitute the relay imaging optical system of the first embodiment are all formed of quartz.
- the height of the aspheric surface in the direction perpendicular to the optical axis is defined as y, and the distance along the optical axis from the tangent plane at the vertex of the aspheric surface to a position on the aspheric surface at height y . If the sag amount is X, the vertex radius of curvature is r, the conic coefficient is /, and the nth-order aspherical coefficient is Cn, it is expressed by the following equation (a).
- the aspherical lens surface has * Marked.
- Table (1) below gives the values of the specifications of the relay imaging optical system of the first embodiment.
- 3 is the imaging magnification of the relay imaging optical system
- 32 is the magnification of the second lens group G2
- f1 is the focal length of the first lens group G1.
- the surface number is the order of the surfaces along the direction of the ray
- r is the radius of curvature of each surface (vertical radius of curvature: mm for an aspheric surface)
- d is the axial spacing of each surface, that is, the surface. The spacing (mm) is shown for each.
- FIG. 4 is a diagram in which the relay imaging optical system according to the second embodiment is developed along one linear optical axis.
- the relay imaging optical system of the second embodiment includes, in order from the object side (mask blind 10 side), a cover glass CP, a first lens group G1, a second lens group G2, and a third lens. Group G3. Although illustration of the aperture stop S is omitted in FIG. 4, the aperture stop S can be arranged in the second lens group G2.
- the first lens group G 1 includes, in order from the object side, a negative meniscus lens L 1 having a concave surface facing the object side and an aspherical surface on the image side, and a positive meniscus lens having a concave surface facing the object side.
- the second lens group G 2 includes, in order from the object side, a biconvex lens and a negative lens having a concave aspherical surface facing the object side.
- the third lens group G 3 includes, in order from the object side, a positive meniscus lens having a convex surface facing the object side, and a plano-convex lens having the aspherically formed convex surface facing the image side.
- the eight lenses and the cover glass CP and the mask M that constitute the relay imaging optical system of the second embodiment are all formed of quartz.
- Table 2 below summarizes the data values of the relay imaging optical system of the second embodiment.
- Table (2) In the equation,] 3 denotes the imaging magnification of the relay imaging optical system, j3 2 denotes the magnification of the second lens group G2, and f1 denotes the focal length of the first lens group G1, respectively.
- the surface number indicates the order of the surfaces along the direction in which the light beam travels, r indicates the radius of curvature of each surface (vertical radius of curvature: mm in the case of an aspheric surface), and d indicates the axial spacing of each surface, that is, the surface The spacing ( mm ) is shown for each.
- Table 2 In the equation,] 3 denotes the imaging magnification of the relay imaging optical system, j3 2 denotes the magnification of the second lens group G2, and f1 denotes the focal length of the first lens group G1, respectively.
- the surface number indicates the order of the surfaces along the direction in which the light beam travels, r indicates the
- FIG. 5 is a diagram in which the relay imaging optical system according to the third example is developed along one linear optical axis.
- the relay imaging optical system of the third embodiment includes, in order from the object side (mask blind 10 side), a cover glass CP, a first lens group G1, a second lens group G2, and a third lens. Group G3. Although illustration of the aperture stop S is omitted in FIG. 5, the aperture stop S can be arranged close to the object side of the second lens group G2.
- the first lens group G 1 includes, in order from the object side, a negative meniscus lens L 1 having a concave surface facing the object side and an aspheric surface on the image side, and a positive meniscus lens having a concave surface facing the object side. It comprises a lens, a positive meniscus lens having a concave surface facing the object side, and a positive meniscus lens having a concave surface facing the object side.
- the second lens group G 2 includes, in order from the object side, a biconvex lens having an aspherical surface on the image side, and a positive meniscus lens having a convex surface facing the object side.
- the third lens group G3 is composed of a plano-convex lens having a convex surface formed in an aspherical shape facing the image side.
- the 7 mm lens cover glass CP and the mask M which constitute the relay imaging optical system of the third embodiment are all formed of quartz.
- Table 3 summarizes the data values of the relay imaging optical system of the third embodiment.
- Table (3) indicates the imaging magnification of the relay imaging optical system
- 02 indicates the magnification of the second lens group G2
- f1 indicates the focal length of the first lens group G1.
- the surface number is the order of the surfaces along the direction of the ray
- r is the radius of curvature of each surface (vertical radius of curvature: mm for an aspheric surface)
- d is the axial spacing of each surface, that is, the surface. The spacing (mm) is shown for each.
- Table 3 indicates the imaging magnification of the relay imaging optical system
- 02 indicates the magnification of the second lens group G2
- f1 indicates the focal length of the first lens group G1.
- the surface number is the order of the surfaces along the direction of the ray
- r is the radius of curvature of each surface (vertical radius of curvature: mm for an aspheric surface)
- d is the axial spacing of each
- FIG. 6 is a diagram in which the relay imaging optical system according to the fourth embodiment is developed along one linear optical axis.
- the relay imaging optical system of the fourth embodiment includes, in order from the object side (mask blind 10 side), a cover glass CP, a first lens group G1, a second lens group G2, and a third lens. Group G3. Although illustration of the aperture stop S is omitted in FIG. 6, the aperture stop S can be arranged in the optical path between the second lens group G2 and the third lens group G3.
- the first lens group G1 includes, in order from the object side, a biconcave lens having an aspherical surface on the image side, and a concave surface facing the object side and an aspherical surface on the image side.
- Negative It is composed of a varnish lens LI, a positive meniscus lens having a concave surface facing the object side, and a biconvex lens.
- the second lens group G2 is composed of a biconvex lens having an aspherical surface on the image side.
- the third lens group G3 is composed of a positive meniscus lens having a convex surface facing the object side. Note that the six lenses and the cover glass CP and the mask M that constitute the relay imaging optical system of the fourth embodiment are all formed of quartz.
- Table ('4) shows values of the specifications of the relay imaging optical system of the fourth embodiment.
- Table (4) indicates the imaging magnification of the relay imaging optical system
- j32 indicates the magnification of the second lens group G2
- f1 indicates the focal length of the first lens group G1.
- the surface number indicates the order of the surfaces along the direction in which the light beam travels
- r indicates the radius of curvature of each surface (vertical radius of curvature: mm in the case of an aspheric surface)
- d indicates the axial spacing of each surface, that is, the surface The spacing (mm) is shown for each.
- Table 4 indicates the imaging magnification of the relay imaging optical system
- j32 indicates the magnification of the second lens group G2
- f1 indicates the focal length of the first lens group G1.
- the surface number indicates the order of the surfaces along the direction in which the light beam travels
- r indicates the radius of curvature of each surface (vertical radius of curvature: mm in the case of
- R 1 -1 2 8 .3 3 7 mm
- FIG. 7 shows a spherical aberration diagram (transverse aberration display) of the first embodiment as an example in which good imaging characteristics are secured. Since the imaging magnification of the relay imaging optical system of each embodiment is less than three times, the spherical aberration of the relay imaging optical system itself can be easily reduced in each embodiment.
- the image plane of the first lens group is located at a finite distance, and the second lens group has a magnification. This not only increases the freedom of design of the relay imaging optical system but also reduces the maximum diameter of the lens.
- the relay imaging optical system of the present embodiment miniaturization and weight reduction can be realized with a small number of lenses while securing required optical characteristics. Therefore, in the illumination optical apparatus and the exposure apparatus of the present embodiment, despite the use of an excimer laser light source, it is hardly affected by fogging of the lens surface due to harmful gas, and is not affected by a decrease in light transmittance of the lens. Hard to receive. In the exposure apparatus of the present embodiment, the size and weight of the relay imaging optical system make the exposure apparatus less susceptible to vibration.
- the mask is illuminated by the illumination optical device (illumination step), and the transfer pattern formed on the mask is scanned and exposed on the photosensitive substrate using the projection optical system (exposure step).
- illumination step the transfer pattern formed on the mask is scanned and exposed on the photosensitive substrate using the projection optical system (exposure step).
- exposure step This makes it possible to manufacture microdevices (semiconductor devices, imaging devices, liquid crystal display devices, thin-film magnetic heads, etc.).
- an example of a method for obtaining a semiconductor device as a micro device by forming a predetermined circuit pattern on a wafer or the like as a photosensitive substrate using the exposure apparatus of the embodiment shown in FIG. 1 is a flowchart of FIG. This will be described with reference to FIG.
- a metal film is deposited on one lot of wafers.
- a photoresist is applied on the metal film on the wafer in the lot.
- step 303 the implementation shown in FIG.
- an image of the pattern on the mask is sequentially exposed and transferred to each shot area on the wafer of the lot through the projection optical system (projection optical module).
- step 304 the photoresist on the wafer of the lot is developed, and in step 305, etching is performed on the wafer of the lot using the resist pattern as a mask.
- a circuit pattern corresponding to the pattern on the mask is formed in each shot area on each wafer.
- a device such as a semiconductor device is manufactured by forming a circuit pattern of an upper layer and the like. According to the above-described semiconductor device manufacturing method, a semiconductor device having an extremely fine circuit pattern can be obtained with good throughput.
- a liquid crystal display element as a microphone opening device can be obtained. It can.
- a predetermined pattern circuit pattern, electrode pattern, etc.
- a plate glass substrate
- a liquid crystal display element as a microphone opening device
- FIG. 9 an example of the technique at this time will be described with reference to the flowchart of FIG.
- a pattern forming step 401 so-called optical lithography in which a mask pattern is transferred and exposed to a photosensitive substrate (a glass substrate coated with a resist) using the exposure apparatus of each embodiment. -The process is performed.
- a predetermined pattern including a large number of electrodes and the like is formed on the photosensitive substrate.
- the exposed substrate is subjected to various processes such as an imaging process, an etching process, and a reticle peeling process, so that a predetermined pattern is formed on the substrate, and the process proceeds to the next color filter forming process 402. .
- a large number of sets of three dots corresponding to R (Red), G (Green), and B (Blue) are arranged in a matrix, or R, G, B
- a color filter is formed by arranging a plurality of sets of three stripe filters in the horizontal scanning line direction.
- a cell assembling step 403 is performed.
- a liquid crystal panel is formed by using the substrate having the predetermined pattern obtained in the pattern forming step 401, the color filter obtained in the color filter forming step 402, and the like. (Liquid crystal cell).
- the pattern shape Obtained in adult Step 4 0 1 manufactured by injecting a liquid crystal, a liquid crystal panel (liquid crystal cell) between the color filter obtained in the substrate and the color filter forming E about 4 0 2 having a predetermined pattern I do.
- a module assembling step 404 components such as an electric circuit and a pack light for performing a display operation of the assembled liquid crystal panel (liquid crystal cell) are attached to complete a liquid crystal display element.
- components such as an electric circuit and a pack light for performing a display operation of the assembled liquid crystal panel (liquid crystal cell) are attached to complete a liquid crystal display element.
- the fly-eye lens 7 is used as a wavefront splitting optical integrator.
- the mouth-shaped optical integrator is an internal reflection type glass rod made of a glass material such as quartz glass or fluorite.
- a number of light source images corresponding to the number of internal reflections are formed along a plane parallel to the rod incidence plane through the rod.
- most of the light source images formed are virtual images, but only the light source image at the center (collection point) is a real image.
- the light beam incident on the mouth-shaped optical integrator is split in the angular direction by internal reflection and passes through the converging point and is composed of a number of light source images along a plane parallel to the incident surface.
- a light source is formed.
- the first optical system is provided in the optical path between the zoom lens 6 and the rod-shaped optical integrator.
- a second optical system is installed in place of the condenser optical system 9.
- the first optical system arranges the entrance pupil of the zoom lens 6 and the entrance surface of the rod-shaped optical integrator so as to be optically conjugate with each other, and the rear focal plane of the zoom lens 6 and the aperture-shaped optical lens.
- the exit surface of the Greater is arranged optically conjugate with the exit surface.
- the second optical system arranges the exit surface of the rod-shaped optical integrator and the mask blind 10 optically conjugate.
- the present invention is applied to the relay imaging optical system in the illumination optical device in the exposure apparatus. It goes without saying that various application examples are possible. -As described above, the relay imaging optical system according to the present invention can realize miniaturization and weight reduction with a small number of lenses while securing required optical characteristics. Therefore, in the illumination optical apparatus and the exposure apparatus incorporating the relay imaging optical system of the present invention, even when, for example, an excimer laser light source is used, it is not affected by fogging of the lens surface due to harmful gas. And is not easily affected by a decrease in the light transmittance of the lens.
- the size and weight of the relay imaging optical system, an exposure apparatus that c becomes difficult structures affected by vibration result the present invention By performing projection exposure under favorable exposure conditions using the above exposure apparatus, a favorable microdevice can be manufactured with high accuracy.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Lenses (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2001277756A AU2001277756A1 (en) | 2000-08-11 | 2001-08-10 | Relay image optical system, and illuminating optical device and exposure system provided with the optical system |
US10/344,107 US6856377B2 (en) | 2000-08-11 | 2001-08-10 | Relay image optical system, and illuminating optical device and exposure system provided with the optical system |
EP01955665A EP1316832A4 (en) | 2000-08-11 | 2001-08-10 | OPTICAL RELAY IMAGE SYSTEM AND OPTICAL LIGHTING DEVICE, AND EXPOSURE SYSTEM HAVING THE OPTICAL SYSTEM |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000-243546 | 2000-08-11 | ||
JP2000243546A JP2002055277A (ja) | 2000-08-11 | 2000-08-11 | リレー結像光学系、および該光学系を備えた照明光学装置並びに露光装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2002014924A1 true WO2002014924A1 (fr) | 2002-02-21 |
Family
ID=18734380
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2001/006913 WO2002014924A1 (fr) | 2000-08-11 | 2001-08-10 | Systeme optique d'image a relais et dispositif optique d'eclairage, et systeme d'exposition dote de ce systeme optique |
Country Status (6)
Country | Link |
---|---|
US (1) | US6856377B2 (ja) |
EP (1) | EP1316832A4 (ja) |
JP (1) | JP2002055277A (ja) |
AU (1) | AU2001277756A1 (ja) |
TW (1) | TW508655B (ja) |
WO (1) | WO2002014924A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1380871A2 (en) * | 2002-07-09 | 2004-01-14 | ASML Holding, N.V. | Relay lens used in an illumination system of a lithography system |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7130129B2 (en) | 1996-12-21 | 2006-10-31 | Carl Zeiss Smt Ag | Reticle-masking objective with aspherical lenses |
WO2005033800A1 (de) | 2003-09-09 | 2005-04-14 | Carl Zeiss Smt Ag | Lithographie-objektiv und projektionsbelichtungsanlage mit mindestens einem solchen lithographie-objektiv |
JP2005301054A (ja) | 2004-04-14 | 2005-10-27 | Canon Inc | 照明光学系及びそれを用いた露光装置 |
US20070285644A1 (en) * | 2004-09-13 | 2007-12-13 | Carl Zeiss Smt Ag | Microlithographic Projection Exposure Apparatus |
JP5030944B2 (ja) * | 2005-04-26 | 2012-09-19 | カール・ツァイス・エスエムティー・ゲーエムベーハー | マイクロリソグラフィ露光装置のための照明システム |
EP2016455A2 (en) * | 2006-05-05 | 2009-01-21 | Corning Incorporated | Distortion tuning of a quasi-telecentric imaging lens |
GB0800677D0 (en) * | 2008-01-16 | 2008-02-20 | Zeiss Carl Smt Ag | Illumination system of a microlithographic projection exposure apparatus |
CN110178068B (zh) * | 2017-01-20 | 2022-02-01 | 松下知识产权经营株式会社 | 单焦点透镜系统及相机 |
US20230288330A1 (en) * | 2020-07-02 | 2023-09-14 | Konica Minolta, Inc. | Optical system for measuring optical characteristics and device for measuring optical characteristics |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4906080A (en) * | 1986-05-14 | 1990-03-06 | Canon Kabushiki Kaisha | Optical arrangement for projection exposure |
EP0500393A2 (en) * | 1991-02-22 | 1992-08-26 | Canon Kabushiki Kaisha | Imaging method for manufacture of microdevices |
EP0744664A2 (en) * | 1995-05-24 | 1996-11-27 | Svg Lithography Systems, Inc. | Hybrid illumination system for use in photolithography |
JPH0982631A (ja) * | 1995-09-14 | 1997-03-28 | Nikon Corp | 投影露光装置 |
EP0783137A2 (de) * | 1995-12-27 | 1997-07-09 | Carl Zeiss | REMA-Objektiv für Mikrolithographie-Projektionsbelichtungsanlagen |
EP0940722A2 (de) * | 1998-03-05 | 1999-09-08 | Carl Zeiss | Beleuchtungssystem und REMA- (Retikel-Maskierungs-) Objektiv mit Linsenverschiebung und Betriebsverfahren dafür |
JP2000098226A (ja) * | 1998-09-18 | 2000-04-07 | Olympus Optical Co Ltd | リレー光学系 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5673102A (en) * | 1991-02-22 | 1997-09-30 | Canon Kabushiki Kaisha | Image farming and microdevice manufacturing method and exposure apparatus in which a light source includes four quadrants of predetermined intensity |
JP2890892B2 (ja) | 1991-04-30 | 1999-05-17 | キヤノン株式会社 | 露光装置及びそれを用いた素子製造方法 |
KR960006686B1 (ko) | 1991-02-22 | 1996-05-22 | 캐논 가부시기가이샤 | 노광장치 및 디바이스 제조방법 |
US5585115A (en) * | 1995-01-09 | 1996-12-17 | Edward H. Mendell Co., Inc. | Pharmaceutical excipient having improved compressability |
DE19653983A1 (de) * | 1996-12-21 | 1998-06-25 | Zeiss Carl Fa | REMA-Objektiv für Mikrolithographie-Projektionsbelichtungsanlagen |
JP3234808B2 (ja) | 1998-03-13 | 2001-12-04 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 移動エージェント、移動エージェントが保有するオブジェクト、ネットワーク上のプレースに存在する移動エージェントを基に子エージェントを生成する方法、移動エージェントが同一プレースに存在する他の移動エージェントの種類を識別する方法 |
-
2000
- 2000-08-11 JP JP2000243546A patent/JP2002055277A/ja active Pending
-
2001
- 2001-08-10 US US10/344,107 patent/US6856377B2/en not_active Expired - Fee Related
- 2001-08-10 EP EP01955665A patent/EP1316832A4/en not_active Withdrawn
- 2001-08-10 AU AU2001277756A patent/AU2001277756A1/en not_active Abandoned
- 2001-08-10 TW TW090119575A patent/TW508655B/zh active
- 2001-08-10 WO PCT/JP2001/006913 patent/WO2002014924A1/ja not_active Application Discontinuation
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4906080A (en) * | 1986-05-14 | 1990-03-06 | Canon Kabushiki Kaisha | Optical arrangement for projection exposure |
EP0500393A2 (en) * | 1991-02-22 | 1992-08-26 | Canon Kabushiki Kaisha | Imaging method for manufacture of microdevices |
EP0744664A2 (en) * | 1995-05-24 | 1996-11-27 | Svg Lithography Systems, Inc. | Hybrid illumination system for use in photolithography |
JPH0982631A (ja) * | 1995-09-14 | 1997-03-28 | Nikon Corp | 投影露光装置 |
EP0783137A2 (de) * | 1995-12-27 | 1997-07-09 | Carl Zeiss | REMA-Objektiv für Mikrolithographie-Projektionsbelichtungsanlagen |
EP0940722A2 (de) * | 1998-03-05 | 1999-09-08 | Carl Zeiss | Beleuchtungssystem und REMA- (Retikel-Maskierungs-) Objektiv mit Linsenverschiebung und Betriebsverfahren dafür |
JP2000098226A (ja) * | 1998-09-18 | 2000-04-07 | Olympus Optical Co Ltd | リレー光学系 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1380871A2 (en) * | 2002-07-09 | 2004-01-14 | ASML Holding, N.V. | Relay lens used in an illumination system of a lithography system |
EP1380871A3 (en) * | 2002-07-09 | 2004-03-03 | ASML Holding, N.V. | Relay lens used in an illumination system of a lithography system |
CN1328608C (zh) * | 2002-07-09 | 2007-07-25 | Asml控股股份有限公司 | 光刻系统的照明系统中使用的中继透镜 |
US7289277B2 (en) | 2002-07-09 | 2007-10-30 | Asml Holding N.V. | Relay lens used in an illumination system of a lithography system |
Also Published As
Publication number | Publication date |
---|---|
EP1316832A4 (en) | 2006-08-09 |
US20040070742A1 (en) | 2004-04-15 |
AU2001277756A1 (en) | 2002-02-25 |
US6856377B2 (en) | 2005-02-15 |
EP1316832A1 (en) | 2003-06-04 |
JP2002055277A (ja) | 2002-02-20 |
TW508655B (en) | 2002-11-01 |
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