WO2000016361A1 - Top emitting oled with refractory metal compounds as bottom cathode - Google Patents
Top emitting oled with refractory metal compounds as bottom cathode Download PDFInfo
- Publication number
- WO2000016361A1 WO2000016361A1 PCT/US1999/020650 US9920650W WO0016361A1 WO 2000016361 A1 WO2000016361 A1 WO 2000016361A1 US 9920650 W US9920650 W US 9920650W WO 0016361 A1 WO0016361 A1 WO 0016361A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- oled
- work function
- refractory metal
- substrate
- low work
- Prior art date
Links
- 239000003870 refractory metal Substances 0.000 title claims abstract description 50
- 150000002736 metal compounds Chemical class 0.000 title description 4
- 239000000758 substrate Substances 0.000 claims abstract description 55
- 239000004020 conductor Substances 0.000 claims abstract description 36
- 239000000463 material Substances 0.000 claims abstract description 28
- 229910052804 chromium Inorganic materials 0.000 claims abstract description 14
- 150000004767 nitrides Chemical class 0.000 claims abstract description 11
- 229910052735 hafnium Inorganic materials 0.000 claims abstract description 9
- 229910052750 molybdenum Inorganic materials 0.000 claims abstract description 9
- 229910052758 niobium Inorganic materials 0.000 claims abstract description 9
- 229910052715 tantalum Inorganic materials 0.000 claims abstract description 9
- 229910052719 titanium Inorganic materials 0.000 claims abstract description 9
- 229910052721 tungsten Inorganic materials 0.000 claims abstract description 9
- 229910052720 vanadium Inorganic materials 0.000 claims abstract description 9
- 229910052726 zirconium Inorganic materials 0.000 claims abstract description 9
- 239000011368 organic material Substances 0.000 claims description 33
- 239000012212 insulator Substances 0.000 claims description 16
- 238000004519 manufacturing process Methods 0.000 claims description 16
- 238000000034 method Methods 0.000 claims description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 8
- 150000001247 metal acetylides Chemical class 0.000 claims description 8
- 239000010703 silicon Substances 0.000 claims description 8
- 229910052710 silicon Inorganic materials 0.000 claims description 8
- 229910052782 aluminium Inorganic materials 0.000 claims description 6
- 239000011521 glass Substances 0.000 claims description 6
- 229910052709 silver Inorganic materials 0.000 claims description 6
- 229910052681 coesite Inorganic materials 0.000 claims description 4
- 229910052906 cristobalite Inorganic materials 0.000 claims description 4
- 239000000377 silicon dioxide Substances 0.000 claims description 4
- 229910052682 stishovite Inorganic materials 0.000 claims description 4
- 229910052905 tridymite Inorganic materials 0.000 claims description 4
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 239000000956 alloy Substances 0.000 claims description 2
- 229910052751 metal Inorganic materials 0.000 claims description 2
- 239000002184 metal Substances 0.000 claims description 2
- -1 borides Chemical class 0.000 claims 7
- 239000010410 layer Substances 0.000 description 74
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 11
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 238000010276 construction Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 238000005137 deposition process Methods 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000012044 organic layer Substances 0.000 description 2
- 238000003672 processing method Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 241001415858 Fulmarus glacialis Species 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 239000010406 cathode material Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 230000005525 hole transport Effects 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/805—Electrodes
- H10K59/8052—Cathodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2102/00—Constructional details relating to the organic devices covered by this subclass
- H10K2102/301—Details of OLEDs
- H10K2102/302—Details of OLEDs of OLED structures
- H10K2102/3023—Direction of light emission
- H10K2102/3026—Top emission
Definitions
- the present invention relates to an Organic Light Emitting Device ("OLED”) video display structure for a color video display or high brightness monochrome display and methods of making such. More specifically, the present invention relates to a top emitting OLED with a bottom cathode.
- OLED Organic Light Emitting Device
- OLEDs work on certain general principles.
- An OLED is typically a laminate formed on a substrate such as soda-lime glass or silicon.
- a light-emitting layer of a luminescent organic solid, as well as adjacent semiconductor layers, are sandwiched between a cathode and an anode.
- the semiconductor layers may be hole-injecting or electron-injecting layers.
- the light-emitting layer may be selected from any of a multitude of fluorescent organic solids.
- the light-emitting layer may consist of multiple sublayers or a single blended layer.
- the positive and negative charges meet in the layer(s) of organic material, they produce photons.
- the wave length — and consequently the color ⁇ of the photons depends on the material properties of the organic material in which the photons are generated.
- the color of light emitted from the OLED can be controlled by the selection of the organic material, or by the selection of dopants, or by other techniques known in the art. Different colored light may be generated by mixing the emitted light from different OLEDs. For example, white light is produced by mixing blue, red, and green light simultaneously.
- Either the OLED anode or the cathode (or both) should be transparent in order to allow the emitted light to pass through to the viewer.
- the cathode may be constructed of a low work function material and the holes may be injected from the anode, a high work function material, into the organic material via a hole transport layer.
- OLEDs operate with a DC bias in the range of 2 to 30 volts.
- the OLED brightness may be controlled by adjusting the voltage or current supplied to the anode and cathode.
- the relative amount of light generated is commonly referred to as the "gray level.”
- OLEDs may work better when operated in a current mode.
- the light output may be more stable for constant current drive than for a constant voltage drive. This is in contrast to many other display technologies, which are normally operated in a voltage mode.
- an active matrix display using OLED technology requires a specific pixel architecture to provide for a current mode of operation.
- a matrix-addressed OLED device numerous individual OLEDs may be formed on a single substrate and arranged in groups in a grid pattern. Several OLED groups forming a column of the grid may share a common cathode, or cathode line. Several OLED groups forming a row of the grid may share a common anode, or anode line. The individual OLEDs in a given group emit light when their cathode line and anode line are activated at the same time. A group of OLEDs within the matrix may form one pixel in a display, with each OLED usually serving as one subpixel or pixel cell.
- OLEDs have a number of beneficial characteristics. These include: a low activation voltage (about 5 volts); fast response when formed with a thin light-emitting layer; high brightness in proportion to the injected electric current; high visibility due to self-emission; superior impact resistance; and ease of handling of the solid state devices in which they are used.
- OLEDs have practical application in television, graphic display systems, and digital printing. Although substantial progress has been made in the development of OLEDs to date, additional challenges remain. For example, OLEDs continue to face a general series of problems associated with their long-term stability. In particular, there is a need to provide a stable low work function cathode that is both a good electron injector for OLEDs and compatible with standard semiconductor processing. It would be particularly beneficial to provide an OLED cathode structure that is stable in an air ambient, so that semiconductor processing methods that are carried out in air may be utilized. Low work function cathodes currently in use with OLEDs have not demonstrated the required stability.
- the present invention meets the needs set forth above and provides other benefits as well.
- OLED comprising: a substrate; a low work function refractory metal layer overlying said substrate; a stack of one or more layers of light emitting organic material overlying said low work function refractory metal layer; and an anode conductor layer overlying said organic material.
- Applicant has further developed an OLED comprising: a substrate; a c a t h o d e conductor layer overlying said substrate; a low work function refractory metal layer overlying said substrate; a stack of one or more layers of light emitting organic material overlying said low work function refractory layer; and an anode conductor layer overlying said organic material.
- Applicant has still further developed an OLED comprising: a substrate; a cathode conductor layer overlying said substrate; a low work function refractory metal layer overlying said substrate; an insulator layer overlying said low work function refractory metal layer; a stack of one or more layers of light emitting organic material overlying said insulator layer; and an anode conductor layer overlying said organic material.
- Applicant has also developed a method of making an OLED comprising the steps of: providing a substrate; forming a low work function refractory metal layer overlying said substrate; forming a stack of one or more organic materials overlying said low work function refractory metal layer; and forming an anode layer overlying said organic materials.
- Applicant has also developed a method of making an OLED comprising the steps of: providing a substrate; forming a cathode conductor layer overlying said substrate; forming a low work function refractory metal layer overlying said cathode conductor layer; forming a stack of one or more organic materials overlying said low work function refractory metal layer; and forming an anode layer overlying said organic materials.
- Applicant has also developed a method of making an OLED comprising the steps of: providing a substrate; forming a cathode conductor layer overlying said substrate; forming a low work function refractory metal layer overlying said cathode conductor layer; forming an insulator layer overlying said low work function refractory metal layer; forming a stack of one or more organic materials overlying said insulator layer; and forming an anode layer overlying said organic materials.
- Applicant has also developed a method of making a substrate and cathode structure adapted to be handled in an air ambient and for use in a top emitting OLED having a top anode, the method comprising the steps of: providing a planar substrate material selected from the group consisting of silicon and glass; forming a cathode conductor layer overlying said substrate; and forming a low work function refractory metal layer overlying said cathode conductor layer.
- Applicant has also developed a method of making a substrate and cathode structure adapted to be handled in an air ambient and for use in a top emitting OLED having a top anode, the method comprising the steps of: providing a planar substrate material selected from the group consisting of silicon and glass; and forming a low work function refractory metal layer overlying said substrate.
- Fig. 1 is a cross-section in elevation of an OLED according to a first embodiment of the present invention.
- Fig. 2 is a cross-section in elevation of an OLED according to a second embodiment of the present invention.
- Fig. 3 is a cross-section in elevation of an OLED according to a third embodiment of the present invention.
- Fig. 4 is a cross-section in elevation of an OLED according to a fourth embodiment of the present invention.
- the first embodiment of the present invention is illustrated by the OLED 10 shown in Fig. 1.
- the OLED 10 of the first embodiment of the present invention may include a substrate 300, a top anode layer
- transparent or semi-transparent 100, a stack of one or more light emitting organic materials 200, a cathode conductor layer 400, and a low work function refractory metal layer 450.
- Substrate 300 may be glass or part of a Si wafer which includes transistors and a plurality of pixels.
- the cathode conductor layer 400 may be a reflective metal or alloy, such as Ag, Al, or Cr.
- the reflective conductor layer 400 may enhance the brightness of the
- OLED by reflecting light generated in the organic material 200 through the anode layer 100 towards a viewer.
- the innovation provides a novel easy-to process (i.e., integration on Si-chip) and stable low work function bottom cathode.
- a range of refactory metal compounds may be used (such as nitrides, borides and/or carbides of, for example, Ti, Zr, Hf, Nb, W, Mo, Cr, Ta or V) in the refractory metal layer 450.
- the OLED 10 may include in particular a Si-chip substrate 300 with a built-in (pre-fabricated) pixelated TiN low work function refractory metal layer 450 as the OLED cathode.
- the desired work function for the refractory metal layer 450 is below about 4 eV. It is preferable that the work function be below about 3.5 eV, and in some cases below about
- the refractory metal compound selected be very stable in an air ambient.
- a study of these refractory metal materials is provided in "Field Emission Cold Cathode Devices Based on Eutactic Systems," by V.G. Rivlin and D. Stewart, European Office of Aerospace Research and Development, London, England and Fulmar Research Institute, Stoke Poges, Slough SL2 4QD, England (prepared for U.S. Airforce Scientific Research, Boiling AFB, D.C. 20332 under contract/grant number: AFOSR-77-3292), incorporated by reference herein.
- the preferred low work function material for the bottom cathode is TiN.
- TiN has a work function typically in the range of 2.5 to 3 eV.
- TiN may also provide a conductive plug in active matrix displays underlying an ITO (Indium Tin Oxide) layer to provide low resistance and highly stable (i.e. no oxidation) interconnects between the underlying electrodes and the ITO.
- ITO Indium Tin Oxide
- TiN is a good conductor with a resistivity of approximately 21.7 microohm-cm.
- the construction of the TiN layer 450 may be integrated into the Si-chip manufacturing process.
- the TiN layer 450 is environmentally stable allowing the Si substrate and the TiN layer to be handled in air, stored, shipped, cleaned, etc., without damage.
- Other low work function cathodes cannot be integrated with the Si substrate and then handled because the materials are not typically stable.
- the cathode conductor layer 400 may be eliminated if the low work function refractory metal layer 450 provides sufficient reflectivity to achieve the desired brightness for the OLED.
- the cathode conductor layer 400 and the low work function refractory metal layer 450 are provided on the planar upper surface of the substrate 300 instead of as a plug as shown in Fig. 1.
- an insulator layer of LiF, SiO, SiO 2 , or some other dielectric oxide, nitride, or oxi-nitride may be provided overlying the refractory metal layer 450 and below the organic material 200.
- the OLED 10 may function better with a thin insulator layer 500 between the refractory metal layer 450 and the organics 200.
- the thin insulator layer may be deposited in conjunction with the construction of the refractory metal layer 450 and the substrate 300.
- top-emitting OLEDs generally have been forced to employ a bottom-anode and top-cathode structure primarily due to the lack of stability of the cathode when on the bottom (i.e., on the Si wafer).
- This structure requires working with the top reactive cathode during the OLED deposition process.
- the use of a top cathode structure complicates the manufacturing process and limits the choice of cathode materials.
- Standard OLEDs may include bottom transparent anodes on glass and use top-opaque cathodes. TiN would be extremely difficult to use in this case because the deposition conditions for the TiN are likely to cause extensive damage to the underlying organic layer(s).
- the present innovation allows for top emitting OLEDs with transparent top-anode structures.
Landscapes
- Electroluminescent Light Sources (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP99969175A EP1029336A1 (en) | 1998-09-11 | 1999-09-10 | Top emitting oled with refractory metal compounds as bottom cathode |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US9993998P | 1998-09-11 | 1998-09-11 | |
US60/099,939 | 1998-09-11 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2000016361A1 true WO2000016361A1 (en) | 2000-03-23 |
Family
ID=22277323
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1999/020650 WO2000016361A1 (en) | 1998-09-11 | 1999-09-10 | Top emitting oled with refractory metal compounds as bottom cathode |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP1029336A1 (en) |
WO (1) | WO2000016361A1 (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002021557A1 (en) * | 2000-09-06 | 2002-03-14 | Osram Opto Semiconductors Gmbh | Encapsulation for oled devices |
US6911666B2 (en) | 2002-07-11 | 2005-06-28 | Sharp Laboratories Of America, Inc. | Flexible metal foil substrate display and method for forming same |
SG111968A1 (en) * | 2001-09-28 | 2005-06-29 | Semiconductor Energy Lab | Light emitting device and method of manufacturing the same |
US7166007B2 (en) | 1999-12-17 | 2007-01-23 | Osram Opto Semiconductors Gmbh | Encapsulation of electronic devices |
US8021204B2 (en) | 2002-04-23 | 2011-09-20 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
US8044580B2 (en) | 2002-04-26 | 2011-10-25 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and manufacturing method of the same |
US8344360B2 (en) | 1999-12-17 | 2013-01-01 | Osram Opto Semiconductor Gmbh | Organic electronic devices with an encapsulation |
US8704243B2 (en) | 2002-06-07 | 2014-04-22 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and manufacturing method thereof |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4099091A (en) * | 1976-07-28 | 1978-07-04 | Matsushita Electric Industrial Co., Ltd. | Electroluminescent panel including an electrically conductive layer between two electroluminescent layers |
US5164799A (en) * | 1990-04-26 | 1992-11-17 | Fuji Xerox Co., Ltd. | Thin-film electroluminescent device having a dual dielectric structure |
JPH10125469A (en) * | 1996-10-24 | 1998-05-15 | Tdk Corp | Organic EL device |
-
1999
- 1999-09-10 EP EP99969175A patent/EP1029336A1/en not_active Withdrawn
- 1999-09-10 WO PCT/US1999/020650 patent/WO2000016361A1/en not_active Application Discontinuation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4099091A (en) * | 1976-07-28 | 1978-07-04 | Matsushita Electric Industrial Co., Ltd. | Electroluminescent panel including an electrically conductive layer between two electroluminescent layers |
US5164799A (en) * | 1990-04-26 | 1992-11-17 | Fuji Xerox Co., Ltd. | Thin-film electroluminescent device having a dual dielectric structure |
JPH10125469A (en) * | 1996-10-24 | 1998-05-15 | Tdk Corp | Organic EL device |
US5969474A (en) * | 1996-10-24 | 1999-10-19 | Tdk Corporation | Organic light-emitting device with light transmissive anode and light transmissive cathode including zinc-doped indium oxide |
Cited By (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8344360B2 (en) | 1999-12-17 | 2013-01-01 | Osram Opto Semiconductor Gmbh | Organic electronic devices with an encapsulation |
US7166007B2 (en) | 1999-12-17 | 2007-01-23 | Osram Opto Semiconductors Gmbh | Encapsulation of electronic devices |
US7394153B2 (en) | 1999-12-17 | 2008-07-01 | Osram Opto Semiconductors Gmbh | Encapsulation of electronic devices |
US7419842B2 (en) | 1999-12-17 | 2008-09-02 | Osram Gmbh | Encapsulation of electroluminescent devices with shaped spacers |
US7432533B2 (en) | 1999-12-17 | 2008-10-07 | Osram Gmbh | Encapsulation of electronic devices with shaped spacers |
WO2002021557A1 (en) * | 2000-09-06 | 2002-03-14 | Osram Opto Semiconductors Gmbh | Encapsulation for oled devices |
US7255823B1 (en) | 2000-09-06 | 2007-08-14 | Institute Of Materials Research And Engineering | Encapsulation for oled devices |
SG111968A1 (en) * | 2001-09-28 | 2005-06-29 | Semiconductor Energy Lab | Light emitting device and method of manufacturing the same |
US7108574B2 (en) | 2001-09-28 | 2006-09-19 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
US7193359B2 (en) | 2001-09-28 | 2007-03-20 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
US8021204B2 (en) | 2002-04-23 | 2011-09-20 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
US8519619B2 (en) | 2002-04-23 | 2013-08-27 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
US9287330B2 (en) | 2002-04-23 | 2016-03-15 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
US9978811B2 (en) | 2002-04-23 | 2018-05-22 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
US8044580B2 (en) | 2002-04-26 | 2011-10-25 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and manufacturing method of the same |
US8497628B2 (en) | 2002-04-26 | 2013-07-30 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and manufacturing method of the same |
US8803418B2 (en) | 2002-04-26 | 2014-08-12 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and manufacturing method of the same |
US9412804B2 (en) | 2002-04-26 | 2016-08-09 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and manufacturing method of the same |
US9853098B2 (en) | 2002-04-26 | 2017-12-26 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and manufacturing method of the same |
US8704243B2 (en) | 2002-06-07 | 2014-04-22 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and manufacturing method thereof |
US9166202B2 (en) | 2002-06-07 | 2015-10-20 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and manufacturing method thereof |
US6911666B2 (en) | 2002-07-11 | 2005-06-28 | Sharp Laboratories Of America, Inc. | Flexible metal foil substrate display and method for forming same |
Also Published As
Publication number | Publication date |
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EP1029336A1 (en) | 2000-08-23 |
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