WO1998007505A1 - Procede et appareil perfectionnant l'analyse par electropulverisation - Google Patents
Procede et appareil perfectionnant l'analyse par electropulverisation Download PDFInfo
- Publication number
- WO1998007505A1 WO1998007505A1 PCT/US1996/013701 US9613701W WO9807505A1 WO 1998007505 A1 WO1998007505 A1 WO 1998007505A1 US 9613701 W US9613701 W US 9613701W WO 9807505 A1 WO9807505 A1 WO 9807505A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- chamber
- pressure
- jet
- liquid
- wall
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 35
- 238000004458 analytical method Methods 0.000 title claims abstract description 6
- 150000002500 ions Chemical class 0.000 claims abstract description 83
- 239000007788 liquid Substances 0.000 claims abstract description 63
- 230000008569 process Effects 0.000 claims abstract description 18
- 238000006243 chemical reaction Methods 0.000 claims abstract description 5
- 239000006193 liquid solution Substances 0.000 claims abstract description 4
- 239000007789 gas Substances 0.000 claims description 61
- 239000012491 analyte Substances 0.000 claims description 11
- 238000004949 mass spectrometry Methods 0.000 claims description 9
- 238000001704 evaporation Methods 0.000 claims description 8
- 230000008020 evaporation Effects 0.000 claims description 8
- 238000007710 freezing Methods 0.000 claims description 8
- 230000008014 freezing Effects 0.000 claims description 8
- 238000001514 detection method Methods 0.000 claims description 7
- 239000002904 solvent Substances 0.000 claims description 7
- 238000010438 heat treatment Methods 0.000 claims description 6
- 239000001307 helium Substances 0.000 claims description 3
- 229910052734 helium Inorganic materials 0.000 claims description 3
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 3
- 238000010183 spectrum analysis Methods 0.000 claims description 3
- 238000007787 electrohydrodynamic spraying Methods 0.000 claims description 2
- 238000010884 ion-beam technique Methods 0.000 claims 4
- 230000007935 neutral effect Effects 0.000 claims 4
- 230000000977 initiatory effect Effects 0.000 claims 2
- 238000000451 chemical ionisation Methods 0.000 claims 1
- 238000010894 electron beam technology Methods 0.000 claims 1
- 239000011261 inert gas Substances 0.000 claims 1
- 239000000376 reactant Substances 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 13
- 238000004895 liquid chromatography mass spectrometry Methods 0.000 abstract description 3
- 238000004807 desolvation Methods 0.000 abstract description 2
- 238000000132 electrospray ionisation Methods 0.000 abstract description 2
- 238000013467 fragmentation Methods 0.000 abstract description 2
- 238000006062 fragmentation reaction Methods 0.000 abstract description 2
- 239000000470 constituent Substances 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
- 239000000443 aerosol Substances 0.000 description 11
- 239000012212 insulator Substances 0.000 description 9
- 239000007921 spray Substances 0.000 description 9
- 238000005086 pumping Methods 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 238000005070 sampling Methods 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 5
- 238000009835 boiling Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000012777 electrically insulating material Substances 0.000 description 4
- 238000004811 liquid chromatography Methods 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 239000013626 chemical specie Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000006731 degradation reaction Methods 0.000 description 2
- 150000002605 large molecules Chemical class 0.000 description 2
- 229910001338 liquidmetal Inorganic materials 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 102000004196 processed proteins & peptides Human genes 0.000 description 2
- 108090000765 processed proteins & peptides Proteins 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- KHOITXIGCFIULA-UHFFFAOYSA-N Alophen Chemical compound C1=CC(OC(=O)C)=CC=C1C(C=1N=CC=CC=1)C1=CC=C(OC(C)=O)C=C1 KHOITXIGCFIULA-UHFFFAOYSA-N 0.000 description 1
- 229920004142 LEXAN™ Polymers 0.000 description 1
- 239000004418 Lexan Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 150000001793 charged compounds Chemical class 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 235000011187 glycerol Nutrition 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000005040 ion trap Methods 0.000 description 1
- 238000000752 ionisation method Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000001819 mass spectrum Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/165—Electrospray ionisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
- H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets
Definitions
- Electrospray-ion spray A comparison of mechanisms and performance.
- This invention relates to a method and apparatus for electrospraying solutions of chemical species for detection in gas phase ion detectors from liquid solutions, particularly chemical species that are separated and detected with liquid chromatography-mass spectrometry.
- Region D The highly charged droplets in Region D are generally evaporated with dry gas 5 or heat 9 to produce further breakup of the liquid and formation of gas phase ionic species.
- ions are emitted directly from the apex of the cone instead of a jet, particularly with liquid metal emittors.
- Cone-jet aerosol sources have been utilized for a number of applications; including, mass spectrometry sample introduction and ionization, 5 11 particle generation, 12 and thruster technology, 13 and liquid metal ion sources. 10 The operation of cone-jet source of aerosols has been demonstrated at atmospheric 1 17 and at reduced pressure. 10,18
- ES ion sources are operated at atmospheric pressure because of the efficient heat transfer at these pressures to the charged droplets which results in the evaporation of the primary droplets and concomitantly causes efficient ion production.
- atmospheric pressure only a fraction of the ions produced are actually sampled into the low pressure detectors because of the difficulty of focusing and sampling ions through small sampling apertures to reduced pressures. Larger apertures are sometimes used to improve sampling efficiencies; however, these require more costly and/or higher capacity pumping on the vacuum system to maintain acceptable detector operating pressures.
- Another limitation of atmospheric pressure ES operation is the threshold of electrical discharge across the gap between the high electrical potential capillary and the counterelectrode. This threshold is generally a function of capillary and counterelectrode spacing and geometry, surrounding gas composition, and pressure.
- the operating voltages are limited by the discharge threshold due to partial or complete degradation of the electrospray process during an electrical discharge. Discharges generally present a greater limitation while operating atmospheric pressure ES sources in the negative ion mode. 19,20
- Practioners of EHD minimize the problem of freezing and boiling by dissolving there analyte in a non-volatile solvent, such as glycerine, and introducing sample into a vacuum chamber at reduced flow rates (nanoliters/min).
- a non-volatile solvent such as glycerine
- Some low pressure ES devices included various lenses for controlling the ions (not droplets) downstream from ES needle. 346 18
- Prior related art can be divided into four (4) groups:
- low pressure electrospray with a focusing means for directing the aerosol into low pressure detectors (such as, references 3 and 6);
- Mahoney and coworkers 6 addresses declustering downstream from the spray but does not effectively deal with the evaporation of droplets produced at low pressure.
- Platzer 22 addresses the problem of solvent declustering and wide kinetic energy spread at low pressures by directly spraying from low pressures through a heated tube into a higher pressure ionization region.
- the art of Platzer fails to address the inherent instability of the primary electrospray process, freezing and boiling in a vacuum; and the wide angular and spatial dispersion of the spray.
- the primary outcome of failing to address the low pressure spray stability will result in significant losses of analyte and droplets on the walls of their first chamber and the heated transfer tube. Although, they may collect some of the spray through the tube by virtue of large cross sectional diameters, they will still have irreproducible and unstable signal resulting from the unstable spray processes.
- the object of the current invention is to overcome the aforementioned limitations of both atmospheric pressure and low pressure operations of electrospray.
- Electrospray-ion spray A comparison of mechanisms and performance.
- Luttgens U., Dulcks, T., Rollgen, F.W. Surface Science 1992, 266, 197-203. Field induced disintegration ofglycerol solutions under vacuum and atmospheric pressure conditions studied by optical microscopy and mass spectrometry.
- the current invention is intended to overcome many of the aforementioned limitations of conventional atmospheric pressure electrospray and low pressure electrohydrodynamic (EHD) devices by physically separating the primary aerosol generation process from the secondary aerosol and ion generation processes and discretely optimizing both.
- the primary process of cone-jet formation is controlled by thermal and electrostatic means to facilitate the formation of a directionally stable liquid cone-jet. Once a stable cone-jet is formed, the jet and resulting droplets are introduced into a evaporation region where the secondary aerosol is generated and the ion generating processes take place.
- a liquid solution is introduced through a needle, held at high electrical potential, into a first chamber maintained at reduced pressure to produce a stable electrospray cone-jet.
- the product of this primary process is intended to be a highly charged liquid jet and droplets from an electrospray source directed on the axis of a countereclectrode (see Figure 1).
- other devices used in low pressure ES systems are typically operated to produce ions directly from the primary cone. 43,46
- the pressure in the first chamber of the present device is maintained below the pressure at which electrical discharge occurs, typically less than 0.1 Torr. Ancillary heating of the tube may be required in the first chamber to prevent freezing of the liquid from evaporative cooling.
- the liquid cone-jet in the present device is stabilized by the electrostatic lens surrounding the capillary resulting in a constant (in time) conical geometry with a constant (in space) axial direction associated with the liquid jet.
- the liquid jet under influence of surface tension will break into droplets that will continue in the axial direction of the jet.
- the present invention takes advantage of the extremely small axial cross-section of the liquid jet and droplets and their high axial velocity, to sample all of this jet of liquid across a high pressure gradient through a small cross sectional aperture into a higher pressure region.
- the aperture size is selected for efficient transfer of liquid through the aperture and in order to maintain pressure requirements in both the first chamber (to prevent discharge) and the second chamber (to desolvate, breakup ion clusters, form ions, react species, and focus ions).
- a key aspect of the present method of ion generation is the precise alignment of the liquid jet with the sampling aperture located in the wall of the first chamber leading into the second chamber. This alignment allows virtually all analyte in solution to be introduced into the second chamber.
- the alignment of the jet may be accomplished with either mechanical translational adjustment, and/or electrostatic or magnetic steering.
- the stability of the cone- jet is also dependent upon the geometry and spatial relationship of the stabilizing electrode; and the stability of the liquid flow.
- the extent of evaporation in the second chamber is regulated by a controlled heat supply, the gas composition, gas pressure and the geometry of the region.
- the density of charges on the surface of the droplet increases, driving the highly charged droplets to the limit of charging, sometimes called the "Rayleigh limit". 25
- the primary droplets deform and emit secondary droplets, ion clusters, or ions.
- the secondary droplets undergo further evaporation and a subsequent emission of droplets, ion clusters and ions.
- the ions that leave the droplets may be highly solvated or clustered.
- ions and/or ion clusters with the residual background gas(es) or other ions in this higher pressure region will be sufficiently energetic to decluster the adducts and leave intact gas phase molecular ions formed from the electrospray process.
- These ions can then be focused, analyzed, and detected by conventional means, such as a mass spectrometer.
- mass spectrometers include, (but are not limited to) time-of-flight, ion traps, fourier transform, quadrupole, magnetic sector, and tandem instruments.
- the second chamber affords a degree of isolation of the ion generation processes from the primary droplet charging process, alternative operating conditions are compatible with the present device.
- the second chamber can be pressurized with helium (a highly conductive gas) to induce efficient desoivation.
- This gas results in a gas discharge when used with conventional electrospray devices, at atmospheric pressure.
- high energy sources such as, dc and rf discharges, to augment both desoivation, ionization processes, and fragmentation.
- the second chamber could also serve as a reaction chamber for a variety of processes, as a collector or trap of selected ions for storage and/or subsequent analyze (e.g. quadrupole trap, potential well trap).
- the restriction of the total mass flow into the vacuum system with the present devise significantly reduces the system pumping requirements when compared to conventional ES devices.
- the production of a stable cone-jet at reduced pressures minimizes the problems associated with gas discharge in atmospheric pressure modes of operation, particularly in negative ion mode.
- the collection of virtually the entire primary aerosol into a higher pressure region allows efficient ion production and declustering and eliminates problems associated with other low pressure ES devices, such as, spatial and directional instabilities and cluster formation. Since ion production occurs in close proximity to the mass analyzer or other gas phase ion detectors, the transport losses compared with atmospheric ES operation are not as significant. Description of the Preferred Embodiments.
- a preferred embodiment of the invention which may be [but is not limited to] the effluent from a liquid chromatograph, flows within tube 17 in the direction of the arrow and all or a portion of the liquid is caused to flow out of capillary tube 10. Excess liquid flows out of splitter tube 16 in a flow splitter configuration.
- Insulator tube 15 joins onto tee 14 and is composed of an electrically insulating material. Insulator tube 15 is of sufficient length, internal diameter, and total resistance to maintain an electrical potential difference between the high voltage power supply and the liquid chromatograph, which is at ground.
- Tee 14 is composed of electrically conducting material, usually stainless steel.
- Tee 14 is connected to a high voltage power supply which can be regulated in terms of voltage, current, a combination of current and voltage, and possibly modulated. Tee 14 may be kept at several thousand volts, but is not limited to this.
- the portion of the liquid that flows through capillary tube 10 also flows into vacuum chamber 1 , through a vacuum seal 13 composed of an electrically insulating material, such as glass, or lexan, which also provides mechanical support for capillary tube 10.
- Capillary tube 10 may be composed of an insulating or metallic material.
- Electrode 11 is located coaxially to the capillary tube 10.
- electrode 11 is a coaxial cylindrical tube but not limited to this specific geometry (e.g., plate(s), quadrupole, octopole).
- Coaxial cylindrical tube 11 is composed of electrically conducting material, usually stainless steel.
- Coaxial cylindrical tube 11 is also at a high electrical potential which is adjustable to maintain a stable axial spray.
- Adjuster 12 is affixed to both tubes 10 and 11 and allows mechanical alignment of these tubes relative to one another and relative to the entrance lens 21.
- FIG 3 is an expanded view of the cone-jet region of the preferred embodiment.
- Liquid cone 76 emerges from the tip 9 of the capillary tube 10 and forms a liquid jet 19 moving in the direction of entrance lens 21.
- the alignment of the liquid jet 19 with exit or pinhole aperture 28 is performed with adjuster 12 to ensure the liquid flows into chamber 2.
- the second chamber 2 is separated from chamber 1 by means of an entrance lens 21 and skimmer lens 22.
- an additional focusing lens 20 Inside chamber 2 is an additional focusing lens 20. All three lens are made of metal and serve as focusing lens for ions and charged particles.
- Entrance lens 21 is isolated from focusing lens 20 by insulator 23 and in turn, focusing lens 20 is isolated from chamber 2 by insulator 27.
- Skimmer lens 22 is isolated from chamber 2 by insulator 24.
- the housing of chamber 2 is made of metal and serves as a focusing lens for ions and charged particles contained in chamber 2. The volume, length and geometry is chosen to minimize surface losses of analyte and maximize transport of ions.
- a conductive gas such as nitrogen or helium but not limited to such gases, is added to chamber 2 through gas tube 52 from a gas supply source 50 in sufficient quantity to maintain chamber 2 at a pressure greater than either chambers 1 or 3.
- Gas tube 52 enters chamber 1 through vacuum feedthrough 53 and is electrically isolated from gas inlet tube 55 by means of an electrically insulating union 54.
- Electrically insulating union 54 is composed of a gas impermeable electrically insulating material such as glass, or ceramic but not limited to this specific material.
- Gas inlet tube 55 then joins chamber 2.
- Gas tube 52 and gas inlet tube 55 are made of a material impermeable to gas such as metal, but not limited to this specific material.
- Gas may be removed from chamber 2 through pump out line 72 .
- This pump out line 72 is pumped by a mechanical pump (not shown) to maintain an effective pressure in chamber 2 greater than either chambers 1 or 3.
- Pump out line 72 enters chamber 1 through vacuum feedthrough 73 and is electrically isolated from gas outlet tube 75 by an electrical insulating union 74.
- Electrically insulating union 74 is composed of a gas impermeable electrically insulating material such as glass, or ceramic but not limited to this specific material.
- Gas outlet tube 75 then joins chamber 2.
- Pump out line 72 and gas outlet tube 75 are made of a material impermeable to gas such as metal, but not limited to this specific material.
- the flow, pressure and composition of gas(es) into chamber 2 are controlled by a combination of the gas manifold (not shown), gas inlet valve 51 , gas outlet valve 71 , and sizes of apertures 28 and 29.
- Chamber 2 is heated by a heater cartridge 26 imbedded in the chamber wall 25, and a thermocouple (not shown) attached to the chamber indicates the temperature and couples to a temperature controller to adjust the heater power to maintain the desired temperature.
- Skimmer lens 22 is electrically isolated from the chamber 2 so that a potential can be applied to cause ions to drift toward lens 22 and thus increase the fraction of ions that exit through aperture or pinhole aperture 29 of said skimmer lens 22.
- the ions exit from chamber 2 into associated ion optics (planar lens 30, planar entrance lens 33, extractor lens 38) used for focusing ions into the mass analyzer 34.
- a quadrupole mass filter is shown to be the mass analyzer.
- the mass analyzer is located in vacuum chamber 3 which must be maintained at 10 5 torr or below for normal operation.
- An isolator wall 37 divides chambers 1 and 3 and contains a planar entrance lens 33. Planar entrance lens 33 is electrically isolated from isolator wall 37.
- Chamber 3 is evacuated through pumping port 61. In this differently pumped embodiment, higher pressures and associated gas loads can be accommodated in chamber 1 while still maintaining normal operating pressures in chamber 3.
- Figure 4 illustrates a second embodiment of the invention where chamber 2, mass analyzer 34 and associated ion optics (planar lens 30, extractor lens 38) all reside inside the same chamber, chamber 1.
- Chamber 1 is a region of high vacuum, evacuated through pumping port 60.
- a larger pump would be required to evacuate chamber 1 through pumping port 60 to maintain a normal operating pressure of 10 '5 torr or below if the same size apertures (28 and 29) for entrance lens 21 and skimmer lens 22 are used in this said second embodiment.
- a third embodiment of the invention is a variation of the second embodiment, where apertures 28 and 29 for entrance lens 21 and skimmer lens 22 are smaller than those used in either the first or second embodiments.
- the pressure in chamber 1 could be maintained at normal operating pressure for the mass analyzer with a similar pump use in said first embodiment (a differentially pumped system).
- the planar lens 30 focuses ions directly into the mass analyzer 34 rather than through planar entrance lens 33.
- FIGURE 1 is a schematic diagram of the regions (Region A: Needle, Region B: Cone, Region C: Jet, Region D: Plume) associated with electrospray aerosol generation and ionization.
- FIGURE 2 is a schematic cross-sectional diagram of the present invention with a differentially pumped vacuum system in a liquid chromatography mass spectrometer implementation.
- FIGURE 3 is a detailed cross-sectional diagram of a preferred embodiment of the invention showing an expanded view of the capillary tube, the cone-jet in chamber 1 being steered through an entrance lens into the higher pressure chamber, chamber 2.
- FIGURE 4 is a detailed cross-sectional diagram of an alternative vacuum configuration for the present device.
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
La présente invention concerne un perfectionnement de procédé d'ionisation par électropulvérisation et une source d'ions permettant de réduire la charge de gaz total sur le système de dépression et d'améliorer la production d'ions et les rendements d'obtention. La source d'ions, destinée à l'analyse des ions de phase gazeuse de constituants dissous dans une solution liquide, comporte une aiguille (10) tenue à un potentiel électrique élevé. Le flux de solution considérée, en passant par ce potentiel et en pénétrant dans une première chambre (1) maintenue à pression réduite, forme un jet conique de liquide à charge élevée. Dans la première chambre, ce jet de liquide à charge élevée est dirigé dans l'axe d'un orifice de façon à pénétrer dans une seconde chambre (2) maintenue à une pression supérieure à la celle de la première chambre. Pour faciliter la désolvatation des gouttelettes de solution issues de la fragmentation du jet à charge élevée, cette seconde chambre est chauffée et pressurisée, ce qui fait que le procédé d'ionisation par électropulvérisation aboutit à une production d'ions de phase gazeuse.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US1996/013701 WO1998007505A1 (fr) | 1996-08-21 | 1996-08-21 | Procede et appareil perfectionnant l'analyse par electropulverisation |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US1996/013701 WO1998007505A1 (fr) | 1996-08-21 | 1996-08-21 | Procede et appareil perfectionnant l'analyse par electropulverisation |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1998007505A1 true WO1998007505A1 (fr) | 1998-02-26 |
Family
ID=22255661
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1996/013701 WO1998007505A1 (fr) | 1996-08-21 | 1996-08-21 | Procede et appareil perfectionnant l'analyse par electropulverisation |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO1998007505A1 (fr) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000019193A1 (fr) * | 1998-09-28 | 2000-04-06 | Varian Inc | Dispositif d'electronebulisation a courant divergent pour spectrometrie de masse |
US6949740B1 (en) | 2002-09-13 | 2005-09-27 | Edward William Sheehan | Laminated lens for introducing gas-phase ions into the vacuum systems of mass spectrometers |
US7569812B1 (en) | 2003-05-30 | 2009-08-04 | Science Applications International Corporation | Remote reagent ion generator |
US7568401B1 (en) | 2005-06-20 | 2009-08-04 | Science Applications International Corporation | Sample tube holder |
US7576322B2 (en) | 2005-11-08 | 2009-08-18 | Science Applications International Corporation | Non-contact detector system with plasma ion source |
US7586092B1 (en) | 2005-05-05 | 2009-09-08 | Science Applications International Corporation | Method and device for non-contact sampling and detection |
US7671344B2 (en) | 2007-08-31 | 2010-03-02 | Battelle Memorial Institute | Low pressure electrospray ionization system and process for effective transmission of ions |
US7960711B1 (en) | 2007-01-22 | 2011-06-14 | Chem-Space Associates, Inc. | Field-free electrospray nebulizer |
US8173960B2 (en) | 2007-08-31 | 2012-05-08 | Battelle Memorial Institute | Low pressure electrospray ionization system and process for effective transmission of ions |
US8180203B2 (en) * | 2004-02-13 | 2012-05-15 | Gl Sciences Incorporated | Direct heating tube and method of heating fluid using same |
CN105097412A (zh) * | 2014-05-08 | 2015-11-25 | 岛津分析技术研发(上海)有限公司 | 一种质量校准物离子化与引入装置 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4607163A (en) * | 1983-12-19 | 1986-08-19 | Jeol Ltd. | Device for coupling a liquid chromatograph and a mass spectrometer |
US5015845A (en) * | 1990-06-01 | 1991-05-14 | Vestec Corporation | Electrospray method for mass spectrometry |
US5162650A (en) * | 1991-01-25 | 1992-11-10 | Finnigan Corporation | Method and apparatus for multi-stage particle separation with gas addition for a mass spectrometer |
US5245186A (en) * | 1991-11-18 | 1993-09-14 | The Rockefeller University | Electrospray ion source for mass spectrometry |
US5349186A (en) * | 1993-06-25 | 1994-09-20 | The Governors Of The University Of Alberta | Electrospray interface for mass spectrometer and method of supplying analyte to a mass spectrometer |
-
1996
- 1996-08-21 WO PCT/US1996/013701 patent/WO1998007505A1/fr active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4607163A (en) * | 1983-12-19 | 1986-08-19 | Jeol Ltd. | Device for coupling a liquid chromatograph and a mass spectrometer |
US5015845A (en) * | 1990-06-01 | 1991-05-14 | Vestec Corporation | Electrospray method for mass spectrometry |
US5162650A (en) * | 1991-01-25 | 1992-11-10 | Finnigan Corporation | Method and apparatus for multi-stage particle separation with gas addition for a mass spectrometer |
US5245186A (en) * | 1991-11-18 | 1993-09-14 | The Rockefeller University | Electrospray ion source for mass spectrometry |
US5349186A (en) * | 1993-06-25 | 1994-09-20 | The Governors Of The University Of Alberta | Electrospray interface for mass spectrometer and method of supplying analyte to a mass spectrometer |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000019193A1 (fr) * | 1998-09-28 | 2000-04-06 | Varian Inc | Dispositif d'electronebulisation a courant divergent pour spectrometrie de masse |
US6949740B1 (en) | 2002-09-13 | 2005-09-27 | Edward William Sheehan | Laminated lens for introducing gas-phase ions into the vacuum systems of mass spectrometers |
US7569812B1 (en) | 2003-05-30 | 2009-08-04 | Science Applications International Corporation | Remote reagent ion generator |
US8180203B2 (en) * | 2004-02-13 | 2012-05-15 | Gl Sciences Incorporated | Direct heating tube and method of heating fluid using same |
US7586092B1 (en) | 2005-05-05 | 2009-09-08 | Science Applications International Corporation | Method and device for non-contact sampling and detection |
US7568401B1 (en) | 2005-06-20 | 2009-08-04 | Science Applications International Corporation | Sample tube holder |
US7576322B2 (en) | 2005-11-08 | 2009-08-18 | Science Applications International Corporation | Non-contact detector system with plasma ion source |
US7960711B1 (en) | 2007-01-22 | 2011-06-14 | Chem-Space Associates, Inc. | Field-free electrospray nebulizer |
US7671344B2 (en) | 2007-08-31 | 2010-03-02 | Battelle Memorial Institute | Low pressure electrospray ionization system and process for effective transmission of ions |
US8173960B2 (en) | 2007-08-31 | 2012-05-08 | Battelle Memorial Institute | Low pressure electrospray ionization system and process for effective transmission of ions |
CN105097412A (zh) * | 2014-05-08 | 2015-11-25 | 岛津分析技术研发(上海)有限公司 | 一种质量校准物离子化与引入装置 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5838002A (en) | Method and apparatus for improved electrospray analysis | |
US6278111B1 (en) | Electrospray for chemical analysis | |
US4531056A (en) | Method and apparatus for the mass spectrometric analysis of solutions | |
US5756994A (en) | Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source | |
US4999493A (en) | Electrospray ionization interface and method for mass spectrometry | |
US7002146B2 (en) | Ion sampling for APPI mass spectrometry | |
EP1507282B1 (fr) | Source d' ions multimode. | |
JP4178110B2 (ja) | 質量分析装置 | |
EP0644796B1 (fr) | Interface ionique a pression atmospherique pour un analyseur de masses | |
US6646257B1 (en) | Multimode ionization source | |
EP0161744B1 (fr) | Spectromètre de masses | |
US6649907B2 (en) | Charge reduction electrospray ionization ion source | |
US6586731B1 (en) | High intensity ion source apparatus for mass spectrometry | |
US5663560A (en) | Method and apparatus for mass analysis of solution sample | |
JP2778689B2 (ja) | 放電イオン化質量分析計 | |
JPH07288099A (ja) | 電気噴霧形成のための絶縁された針装置 | |
JPH07239319A (ja) | 液体クロマトグラフィー/質量分析計装置 | |
US20030062474A1 (en) | Electrospray ion source for mass spectrometry with atmospheric pressure desolvating capabilities | |
WO1998007505A1 (fr) | Procede et appareil perfectionnant l'analyse par electropulverisation | |
US5633496A (en) | Mass spectrometry apparatus | |
US7365315B2 (en) | Method and apparatus for ionization via interaction with metastable species | |
JPH06215729A (ja) | 質量分析計 | |
JP2000100375A (ja) | 質量分析計及びその静電レンズ | |
JPH1164289A (ja) | 液体クロマトグラフ質量分析装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): AT BE CH DE DK ES FI FR GB GR IE IT LU MC NL PT SE |
|
DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) | ||
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
122 | Ep: pct application non-entry in european phase |