WO1997001742A1 - Systeme de mesure bidimensionnelle d'objets plans - Google Patents
Systeme de mesure bidimensionnelle d'objets plans Download PDFInfo
- Publication number
- WO1997001742A1 WO1997001742A1 PCT/EP1996/002774 EP9602774W WO9701742A1 WO 1997001742 A1 WO1997001742 A1 WO 1997001742A1 EP 9602774 W EP9602774 W EP 9602774W WO 9701742 A1 WO9701742 A1 WO 9701742A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- measured
- measurement
- image recording
- contour
- measuring
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title claims description 49
- 238000000034 method Methods 0.000 claims abstract description 27
- 238000005286 illumination Methods 0.000 claims abstract description 10
- 238000011156 evaluation Methods 0.000 claims description 6
- 238000012545 processing Methods 0.000 claims description 6
- 230000003287 optical effect Effects 0.000 claims description 5
- 238000012937 correction Methods 0.000 claims description 4
- 238000001514 detection method Methods 0.000 claims description 3
- 238000007599 discharging Methods 0.000 claims 1
- 238000012546 transfer Methods 0.000 claims 1
- 238000003860 storage Methods 0.000 abstract description 3
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 2
- 230000005693 optoelectronics Effects 0.000 description 2
- 238000003908 quality control method Methods 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000003698 laser cutting Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
Definitions
- Flat objects in the sense of the present invention are understood to mean all three-dimensional objects with at least one sufficiently flat surface.
- the lighting is chosen in particular in such a way that the overall contour (projection contour) of the object to be measured is measured.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Farming Of Fish And Shellfish (AREA)
Abstract
L'invention concerne un procédé et un dispositif de mesure optique du contour bidimensionnel d'objets en 3D. Le dispositif comprend au moins une unité de prise de vue, une unité de commande et d'évaluation, une unité de mémorisation et une unité d'éclairage. La mesure peut être réalisée aussi bien avec de la lumière transmise qu'avec de la lumière incidente. Il est possible de procéder à une mesure du contour tourné vers l'unité de prise de vue et du contour de projection.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE29510334U DE29510334U1 (de) | 1995-06-26 | 1995-06-26 | System zur zweidimensionalen Vermessung planer Objekte |
DE29510334.5 | 1995-06-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1997001742A1 true WO1997001742A1 (fr) | 1997-01-16 |
Family
ID=8009760
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP1996/002774 WO1997001742A1 (fr) | 1995-06-26 | 1996-06-25 | Systeme de mesure bidimensionnelle d'objets plans |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE29510334U1 (fr) |
WO (1) | WO1997001742A1 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2377440A (en) * | 2001-05-11 | 2003-01-15 | Portela & Ca Sa | Method for preparation of (S)-(+)- and (R)-(-)-10,11-dihydro-10-hydroxy-5H-dibenz/b,f/azepine-5-carboxamide |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE202012004144U1 (de) | 2012-04-25 | 2012-07-11 | Simon Ibv Gmbh | Bildverarbeitungssystem für Mess- und Prüfaufgaben |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4158507A (en) * | 1977-07-27 | 1979-06-19 | Recognition Equipment Incorporated | Laser measuring system for inspection |
EP0335559A2 (fr) * | 1988-03-24 | 1989-10-04 | Orbotech Ltd | Système télécentrique formant une image |
GB2272515A (en) * | 1992-11-16 | 1994-05-18 | Ona Electro Erosion | Two-dimensional analysis by image processing |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1568216A (en) * | 1975-10-20 | 1980-05-29 | Sangamo Weston | Apparatus and method for parts inspection |
EP0054596B1 (fr) * | 1980-12-18 | 1985-05-29 | International Business Machines Corporation | Procédé d'inspection et de tri automatique d'objets présentant des configurations avec des tolérances dimensionnelles et des critères de rejet variables selon l'emplacement, équipement et circuits de mise en oeuvre |
US4441205A (en) * | 1981-05-18 | 1984-04-03 | Kulicke & Soffa Industries, Inc. | Pattern recognition system |
JPS60122304A (ja) * | 1983-11-09 | 1985-06-29 | Shinetsu Eng Kk | 自動寸法測定装置 |
DE4115793C2 (de) * | 1991-05-10 | 1993-09-30 | Rheinmetall Jenoptik Optical M | Anordnung zur hochgenauen videogrammetrischen Meßwerterfassung |
JP2624054B2 (ja) * | 1991-09-19 | 1997-06-25 | 住友電装株式会社 | 電線皮剥ぎ状態検査方法 |
-
1995
- 1995-06-26 DE DE29510334U patent/DE29510334U1/de not_active Expired - Lifetime
-
1996
- 1996-06-25 WO PCT/EP1996/002774 patent/WO1997001742A1/fr active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4158507A (en) * | 1977-07-27 | 1979-06-19 | Recognition Equipment Incorporated | Laser measuring system for inspection |
EP0335559A2 (fr) * | 1988-03-24 | 1989-10-04 | Orbotech Ltd | Système télécentrique formant une image |
GB2272515A (en) * | 1992-11-16 | 1994-05-18 | Ona Electro Erosion | Two-dimensional analysis by image processing |
Non-Patent Citations (1)
Title |
---|
RICHARD C. DORF ET AL.: "International Encyclopedia of Robotics:Applications and automati on", 1988, JOHN WILEY & SONS, New York, pages: 1915 - 1947 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2377440A (en) * | 2001-05-11 | 2003-01-15 | Portela & Ca Sa | Method for preparation of (S)-(+)- and (R)-(-)-10,11-dihydro-10-hydroxy-5H-dibenz/b,f/azepine-5-carboxamide |
US7119197B2 (en) | 2001-05-11 | 2006-10-10 | Portela & C.A., S.A. | Method for preparation of (s)-(+)-and(r)-(-)10,11-dihydro-10-hydrodoxy-5h-dibenz/b,f/azephine-5-carboxamide |
US7820813B2 (en) | 2001-05-11 | 2010-10-26 | Portela & C.A., S.A. | Method for preparation of (S)-(+)- and (R)-(−)-10,11-dihydro-10-hydroxy-5H-dibenz/b,f/azepine-5-carboxamide |
Also Published As
Publication number | Publication date |
---|---|
DE29510334U1 (de) | 1995-10-26 |
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