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WO1994008229A1 - Detection de defauts dans le verre - Google Patents

Detection de defauts dans le verre Download PDF

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Publication number
WO1994008229A1
WO1994008229A1 PCT/AU1993/000498 AU9300498W WO9408229A1 WO 1994008229 A1 WO1994008229 A1 WO 1994008229A1 AU 9300498 W AU9300498 W AU 9300498W WO 9408229 A1 WO9408229 A1 WO 9408229A1
Authority
WO
WIPO (PCT)
Prior art keywords
glass
microscope
light
window
plate glass
Prior art date
Application number
PCT/AU1993/000498
Other languages
English (en)
Inventor
John Barry
Ross Miller
Original Assignee
The University Of Queensland
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by The University Of Queensland filed Critical The University Of Queensland
Priority to AU61361/94A priority Critical patent/AU6136194A/en
Publication of WO1994008229A1 publication Critical patent/WO1994008229A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/38—Concrete; Lime; Mortar; Gypsum; Bricks; Ceramics; Glass
    • G01N33/386—Glass

Definitions

  • BACKGROUND ART In many modern buildings, most of the external surface is composed of glass panels.
  • the panels are usually double-glazed units, about 1.5 x 2 metres in size.
  • a large multi-storey office building may typically have between 5000 and 10000 such panels.
  • the glass is thermally tempered for reasons of safety and strength. Tempered glass is 3 to 5 times stronger than annealed glass and, if fractured, tempered glass shatters into small fragments with blunt edges.
  • Tempered glass has been known to undergo spontaneous fracture.
  • the spontaneous fracture though relative rare, is common enough to constitute a serious problem in applications (such as multi-storey office buildings) where large areas of glass are used. It is believed that about 0.8% of glass panels fail by spontaneous fracture. In a large multi-storey building this translates as a failure of between 50 and 100 panels. The failure of even one panel has the potential to cause serious injury to life and property. If defective glass panels can be identified, they can be replaced before failure.
  • the spontaneous fracture of tempered glass can be attributed to inclusions in the glass. In most cases, the inclusions are nickel sulphide "stones". The nickel sulphide stones are metallic in appearance, polycrystalline, roughly spherical in shape, and range in diameter from 0.1 to 0.6mm.
  • Nickel sulphide, NiS is known to undergo a phase transformation at 379°C.
  • the transformation from the high temperature ⁇ -NiS to the low temperature ⁇ -NiS is accompanied by a volumetric expansion of 4.0%. It has been postulated that the volumetric expansion in NiS inclusions (of dimensions 0.1-0.6mm) located at the interior portion of tempered glass (which is in tension), could cause spontaneous breakage.
  • U.S. patent no. 4,026,656 describes a device for detection of stones in the sidewalls of blown glass containers. These stones cause stress patterns to be formed in the glass, and the patterns are detected when the glass container is illuminated with infrared radiation and viewed through crossed polarising filters. Stress patterns are detected automatically using a television camera having an electronic analysis circuit connected to the output thereof.
  • Tempered window-glass has a great deal of internal stress caused by its method of manufacture. Tempered glass therefore displays a considerable amount of detail when viewed in crossed- polarised light. Since the nickel sulphide stones are responsible for the glass breakage, these stones must cause extra internal pressure in the tempered glass but such internal stress is localised and may be much less than the inherent stresses found throughout the tempered plate glass. Hitherto, it had been generally believed that the polarised light stress-patterns in tempered glass would be so strong or dominant as to render any stress-patterns arising from NiS stones undetectable by eye or camera.
  • the present invention provides a method of detecting small stress-inducing inclusions in tempered glass, comprising the steps of illuminating the glass with polarised light; viewing the illuminated glass through a polarising medium whose plane of polarisation is orientated orthogonally to the plane of polarisation of the illumination; and detecting localised stress patterns in the glass characteristic of the small inclusions.
  • the cross-polarised light may be light transmitted through the glass, or reflected from the back surface of the glass.
  • a light source is placed on one side of the glass and polarised through a polarising sheet before transmission through the glass.
  • the transmitted light is viewed from the other side of the glass through a second polarising sheet (or analyser) whose plane of polarisation is orientated at 90° to the first polarising sheet.
  • the light source is placed inside a window in a building, and the transmitted cross-polarised light is viewed from outside the window.
  • the light source and the observer are located on the same side of the window glass.
  • Light from the source is polarised, reflected from the back surface of the glass, and viewed by the observer through an analyser.
  • the light may be ordinary light from the visible portion of the spectrum, and the method is carried out in a darkened environment, e.g. at night or in a darkened enclosure to exclude ambient light.
  • the present invention provides a method for detecting inclusions in tempered plate glass, comprising the step of illuminating one side of the plate glass with light, and viewing the light reflected from the glass boundary on the other side of the plate glass to detect inclusions in the glass.
  • This invention also provides apparatus for performing the abovedescribed methods.
  • the present invention provides apparatus for inspection of stress-inducing inclusions and other defects in plate glass, comprising optical magnification means; and mounting means adapted to be releasably affixed to the glass, the optical magnification means being adjustably mounted on the mounting means so as to be moveable over at least a portion of the plate glass.
  • the optical magnification means comprises a zoom stereo microscope which is fitted with a light source.
  • the mounting means comprises a bar having suction pads at its end for releasably attachment to the glass.
  • the microscope is mounted on the bar and slidable therealong to provide movement in a first direction.
  • the microscope is also adjustably mounted on the bar to permit movement in a second direction, orthogonal to the first direction.
  • the first and second directions define a plane parallel to the plane of the plate glass. In this manner, the microscope can be centred on the defect to be inspected.
  • the depth of the defect in the glass can be measured by the difference in the focal planes of the microscope when focussed alternatively on the glass surface and the defect, with adjustment for the refractive index.
  • a digital Vernier scale may suitably be fitted to the focussing method to allow for accurate measurement.
  • a cross-hair is also fitted to the viewing eye piece of the microscope to achieve better accuracy in measuremen .
  • a camera is fitted to a projector lens on the microscope to enable a photographic print to be obtained of the magnified image of the defect, for further analysis and measurement.
  • the apparatus is able to be used for on site inspection and investigation of defects in window glass by fixing the mounting means to the window such that the microscope is orientated perpendicularly to the plane of the window.
  • the defect can be further inspected, measured and/or photographed with the aid of optical magnification provided by the microscope.
  • Fig. 1 is a schematic diagram illustrating apparatus for detecting defects in window glass using transmitted cross-polarised light
  • Fig. 2 is a schematic diagram illustrating apparatus for detecting defects in window glass using reflected cross-polarised light
  • Fig. 3 is a schematic side elevation of a microscope and camera assembly
  • Fig. 4 is a schematic end elevation of a mounting arrangement for the microscope and camera assembly of Fig. 3;
  • Fig. 5 is a diagram illustrating image distortion due to the refractive index effect. DESCRIPTION OF PREFERRED EMBODIMENTS The inventors have found that, unexpectedly, small inclusions such as impurity stones and air bubbles in tempered glass are visible in cross-polarised light even though the tempered glass has a great amount of internal stress resulting from the manufacture. Stones and air bubbles in the approximate range of 0.1 to 0.6mm in size can be detected by the eye. Particles less than 0.1mm in size are unlikely to cause spontaneous fracture, while particles greater than 0.6mm should be detectable without the aid of special techniques.
  • the cross polarised light is ordinarily light i.e. from the visible part of the spectrum.
  • the small impurities manifest a characteristic "butterfly" pattern when viewed in cross polarised light.
  • the glass may be inspected using either reflected or transmitted cross-polarised light. Applications of both techniques to the detection of defects in window glass of a building will now be described with reference to Figs. 1 and 2, respectively.
  • the light distribution across the sheet 11 should be as uniform as possible.
  • the light box is placed on the inside of a window 12 while the observer 13 views the window from the outside of the building.
  • the observer may be transported and supported at the desired position by the window cleaner's gondola or building maintenance unit (BMU).
  • BMU building maintenance unit
  • the observer 13 views the light transmitted from light box 10 through a second polariser sheet or "analyser" 14 whose angle of polarisation is orientated 90° to that of polariser 11.
  • the observer 13 may wear goggles fitted with the polarising sheet of the analyser 14.
  • the inspection procedure is carried out in a darkened environment, typically at night.
  • opaque enclosures may be provided on either side of the window 12 to exclude ambient light.
  • the characteristic butterfly patterns of NiS stones as small as 100 microns can be detected by the eye using the illustrated technique.
  • a light box 20 and associated polariser 21 are placed above the head of the observer 23. That is, both the light box and observer are on the same side of the window.
  • the light box may be mounted to the BMU frame above the observer's head.
  • the observer 23 views light reflected from the window 22 through analyser 24.
  • polarised light in reflected mode reveals strain in the glass in a manner equal to, if not better than, the transmitted mode.
  • the incident polarised light is reflected from the back surface of the glass.
  • the plane of polarisation does not change significantly at the reflection surface, but the light passes through the glass twice, which magnifies the strain contrast as seen by the observer.
  • the transmitted cross-polarised light method is suitable for use on transparent or viewing window glass only
  • the reflected cross-polarised light method is suitable for use with both viewing and non- viewing windows, such as spandrel windows.
  • the reflected light method is performed in a darkened environment, e.g. at night, or within a space surrounded by opaque screens to exclude ambient light.
  • the visibility of a defect is " enhanced as the image of an object inside the glass is magnified by a factor equivalent to the refractive index. Therefore, in glass having a refractive index of 1.518 an object of 70 microns in size appears to be 106 microns to the naked eye.
  • window glass can be detected using reflected light which is not polarised.
  • the window glass is viewed in a manner similar to that illustrated in Figure 2, but the analyser polarising sheet 24 is not used. With uniform illumination from the light box, the light reflected from the window displays a uniform white background. against this background, the small stones or defects cast a dark shadow. Stones as small as 70 microns are visible to the naked eye.
  • This invention also provides apparatus for optical analysis of a particular defect in the glass, and an embodiment of this apparatus is illustrated in Figs. 3 and 4.
  • the apparatus can be used to: (i) photograph the defect,
  • FIGs. 3 and 4 measure the distance of the defect from the front surface of the glass.
  • the apparatus illustrated in Figs. 3 and 4 can be constructed simply and economically using an off-the- shelf stereo optical microscope and camera.
  • a zoom stereo microscope 30 having a magnification range of typically 9 to 60 times, is provided with a fluorescent ring illuminator 31 as its light source.
  • a filter 35 is preferably added to correct for the colour of the fluorescent light source 31, and a cross-hair is fitted to the microscope eye piece 36 to ensure accuracy in focussing.
  • a 3.3x projector lens 32 is fitted to the microscope 30 to project the image onto ' the back of a camera 33.
  • a digital Vernier scale 34 is fitted to enable measurement of variation of the focal plane.
  • the digital Vernier scale 35 is suitably connected to a rack-and-pinion type microscope focussing assembly 37. Magnification is controlled by microscope zoom control 38.
  • the microscope 30 is normally orientated vertically for conventional use. However, when used in this application to vertical window glass, the microscope 30 is mounted to a mounting device 40 (Fig. 4) to operate in a generally horizontal orientation.
  • the microscope assembly 30 is fixed in a cradle portion 41 of a cradle and slide assembly.
  • the cradle portion 41 is attached to a slide portion 47 which slides on a horizontal bar 43.
  • Vacuum pads 44 are mounted to both ends of the horizontal bar 43. These vacuum pads 44 are used to releasably attach the mounting device 40 to a window, and the vacuum pads 44 may be of the type used as suction lifting-units for plate glass. To attach the mounting device 40 to a window, the vacuum pads 44 are placed against a window, and a vacuum is created by turning handles 45 on the pads.
  • the cradle and slide assembly allows the microscope 30 to move in the X and Y directions.
  • the slide portion 47 is a sleeve-like assembly which surrounds the horizontal bar 43. Fixed Teflon-capped screws in the front and back sides of the sleeve-like portion of the slide 47 maintain torsional rigidity of the cradle and slide assembly relative to the horizontal bar 43.
  • the slide 47 is supported on the bar 43 by two screws 46 which are tipped by Teflon (Trade Mark) plugs.
  • the two screws 46 are rotated simultaneously to move the cradle and slide assembly vertically (in the Y direction). Because of the low friction contact between the Teflon plugs and the top of the horizontal bar 43, the cradle and slide assembly is able to be translated smoothly in the horizontal (or X) direction.
  • the microscope is focussed (and thereby moved in the Z direction) using the rack and pinion focussing device 37 on the microscope 30 itself.
  • the cradle and slide assembly, and the horizontal bar 43, are suitably made of aluminium, or other strong lightweight material.
  • the microscope and camera assembly are mounted onto the window using mounting device 40, and the microscope is centred onto the defect.
  • the defect is able to be photographed through the microscope.
  • a ruled scale is also photographed in order to calibrate the magnification onto the camera.
  • a 10 x 15cm photographic print corresponds to a field view of 1.2 x 1.8mm on the window glass.
  • the size of the defect in the glass can be measured from the photographic print.
  • the view through the stereo microscope 30 is off-centre, i.e. the optic axis is not perpendicular to the window glass surface.
  • off-centre optics provides an advantage in that, except for an object on the back surface of glass, it is possible to photograph the front of the object directly, and photograph the back of the object by viewing its reflection from the back surface of the glass.
  • the depth of the defect within the glass is measured by placing a mark on the glass surface, e.g. by using a marker pen.
  • the microscope is focussed on the glass surface, and the digital Vernier scale is set at 0.
  • the microscope is then focussed on the defect itself, and the depth of the defect can be read off the digital scale 34.
  • the digital scale is accurate to 0.01mm.
  • the accuracy of focus with the eye piece is typically only 0.1mm.
  • the cross-hair in the microscope eye piece is therefore very advantageous in obtaining accuracy in the focus position.
  • the thickness of the glass is " measured in a similar manner, i.e. by focussing on the mark on the front surface, resetting the digital scale to 0, then focussing on the reflection in the back surface of the front-surface mark.
  • the thickness of glass is half the distance measured by the digital scale 34.
  • the ability to measure the position of the defect within the glass is highly advantageous.
  • approximately 20% of the glass thickness at both surfaces is under high pressure (the compression zone), whereas the middle 60% of the glass thickness is under high tensile force (the tension zone) .
  • a defect in the compression zone will generally be harmless.
  • a defect in the tension zone may cause the glass to shatter spontaneously.
  • the defects which are dangerous in tempered glass are found to range in size from typically 0.1mm to 0.6mm. The abovedescribed focussing method enables these defects to be depth-located in the glass with an accuracy of 0.1mm, which is quite adequate.
  • the refractive index of glass has an appreciable effect on the perceived size and position of a defect within the glass.
  • Fig. 5 shows that light entering the glass is bent at the surface due to the change in refractive index at the boundary, and the apparent position of the stone is closer to the observer than the actual position. Further, the apparent image is magnified relative to the actual object. It is well known, that because of this effect, the defect will appear to be closer to the front surface by a factor of the refractive index, and is magnified by a factor of the refractive index. That is, for normally tempered window glass, the true distance equals the apparent distance multiplied by 1.52 (the refractive index of the glass), and the true size equals the apparent size divided by 1.52. In measuring the defect size and position, the effect of the refractive index is taken into account.
  • the glass can also be inspected at manufacturing stage and not only after installation.
  • the abovedescribed inspection methods can be automated using a computer-controlled scanning mechanism, a video camera, and a computer and/or other data storage means.

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
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  • Engineering & Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Les inclusions et d'autres défauts induisant des sollicitations dans les panneaux de verre trempé destinés à des fenêtres sont détectés sur place par l'examen du verre dans une lumière polarisée par des prismes croisés. Une fenêtre (12) est éclairée par une source de lumière (10) à travers un polariseur (11) et on examine la fenêtre (12) à l'aide d'un analyseur (14) en utilisant soit la lumière transmise, soit la lumière réfléchie. En dépit des motifs de lumières produits par les sollicitations et qui sont inévitables dans le verre trempé, de petites inclusions peuvent être détectées par des motifs de sollicitations qui leur sont propres. Les défauts dans les verres des fenêtres (12) peuvent être examinés en détail sur place à l'aide d'un microscope (30) monté sur un moyen de support (40) fixé d'une manière amovible à la fenêtre par des ventouses (44). Une inclusion peut être inspectée et photographiée à l'aide d'une caméra (33) adaptée à une lentille de projecteur (32) sur le microscope (30). On peut mesurer la profondeur de l'inclusion dans le verre en utilisant une échelle de vernier (34) sur le mécanisme de focalisation du microscope (37).
PCT/AU1993/000498 1992-09-29 1993-09-29 Detection de defauts dans le verre WO1994008229A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU61361/94A AU6136194A (en) 1992-09-29 1993-09-29 Detection of defects in glass

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AUPL499792 1992-09-29
AUPL4997 1992-09-29

Publications (1)

Publication Number Publication Date
WO1994008229A1 true WO1994008229A1 (fr) 1994-04-14

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Application Number Title Priority Date Filing Date
PCT/AU1993/000498 WO1994008229A1 (fr) 1992-09-29 1993-09-29 Detection de defauts dans le verre

Country Status (2)

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CN (1) CN1087424A (fr)
WO (1) WO1994008229A1 (fr)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2338309A (en) * 1998-06-13 1999-12-15 Neil Colin Hamilton Recognition apparatus for toughened glass
US6236734B1 (en) 1996-05-31 2001-05-22 The University Of Queensland Detection of defects in glass
FR2828880A1 (fr) * 2001-08-27 2003-02-28 Glaverbel Dispositif et procede de marquage d'un element en verre
WO2011007047A1 (fr) * 2009-07-16 2011-01-20 Oy Sparklike Ab Procédé, appareil, et dispositif de détection de propriétés d'un objet transparent réfléchissant
WO2011157815A1 (fr) * 2010-06-17 2011-12-22 Agc Glass Europe Analyse des marques de trempe
US8730465B2 (en) 2006-08-02 2014-05-20 Nikon Corporation Polarized light defect detection in pupil images
DE102015004109A1 (de) 2014-04-07 2015-10-08 Hans Höllwart Forschungszentrum Für Integrales Bauwesen Ag Verfahren und Vorrichtung zur Charakterisierung von Spannungen in einem flächigen, transparenten Gegenstand
WO2015162303A1 (fr) * 2014-04-25 2015-10-29 Boraident Gmbh Procédé et dispositif permettant de détecter des inclusions de sulfure de nickel dans une plaque de verre
CN105259174A (zh) * 2015-10-24 2016-01-20 宁波申山新材料科技有限公司 一种功能贴膜纹路测试仪及其测试方法
CN108709859A (zh) * 2018-06-26 2018-10-26 华南理工大学 用于曲面玻璃视觉检测的通用型夹具及检测方法
EP2714321B1 (fr) * 2011-05-27 2019-02-06 Sage Electrochromics, Inc. Appareil et procédé pour réparer des défauts dans un dispositif de commande d'énergie électronique ou d'affichage
CN110455826A (zh) * 2019-09-27 2019-11-15 中国建筑科学研究院有限公司 一种便携式钢化玻璃杂质检测装置及方法
CN110530882A (zh) * 2019-09-27 2019-12-03 北京奥博泰科技有限公司 一种用于检测钢化玻璃杂质的便携式装置及方法
US11480532B2 (en) * 2018-06-07 2022-10-25 LiteSentry LLC Inspection, analysis, classification, and grading of transparent sheets using segmented datasets of photoelasticity measurements

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JP5007979B2 (ja) * 2008-05-22 2012-08-22 独立行政法人産業技術総合研究所 欠陥を検査する方法及び欠陥検査装置
CN101672803B (zh) * 2008-09-08 2011-12-07 中国建筑材料科学研究总院 一种检测钢化玻璃幕墙杂质和缺陷的方法与装置
KR20140132773A (ko) * 2012-04-23 2014-11-18 쌩-고벵 글래스 프랑스 프리스트레스트 판유리의 블로잉 구조를 측정하는 방법 및 장치
CN103644990A (zh) * 2013-12-13 2014-03-19 苏州精创光学仪器有限公司 紧凑型玻璃表面应力测量仪
CN108061736B (zh) * 2017-11-14 2020-11-13 东旭光电科技股份有限公司 使用反射电子探针对玻璃缺陷进行分析的方法
CN107957424B (zh) * 2017-11-17 2020-08-11 南京大学 一种利用显微镜鉴别超薄透明板表面瑕疵的检测方法
US20200049619A1 (en) * 2018-08-08 2020-02-13 GM Global Technology Operations LLC Polarized light filter vision system to detect level of temper in glass
CN113167561B (zh) * 2018-09-19 2023-12-22 康宁股份有限公司 使用边缘缺陷量规测量玻璃片的边缘缺陷尺寸的方法及相应的边缘缺陷量规
CN112964731B (zh) * 2021-02-18 2024-07-05 日月光半导体制造股份有限公司 玻璃检测机台

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3124637A (en) * 1964-03-10 Apparatus for examining prestressed glass
US3520608A (en) * 1966-09-13 1970-07-14 Triplex Safety Glass Co Testing toughened glass for internal stresses
US3799679A (en) * 1972-06-27 1974-03-26 Ppg Industries Inc Glass distortion scanning system
DD221277A1 (de) * 1983-09-09 1985-04-17 Univ Schiller Jena Polarisationsoptische durchlichtanordnung mit gekreuzter polarisatoreinstellung
US4584476A (en) * 1982-09-21 1986-04-22 Societa Italiana Vetro Siv S.P.A. Device for the non-destructive testing of the internal stress state of heat tempered plate glass
AU8698091A (en) * 1990-11-06 1992-05-14 Flachglas Aktiengesellschaft Method and apparatus for determining the optical quality of a transparent plate

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3124637A (en) * 1964-03-10 Apparatus for examining prestressed glass
US3520608A (en) * 1966-09-13 1970-07-14 Triplex Safety Glass Co Testing toughened glass for internal stresses
US3799679A (en) * 1972-06-27 1974-03-26 Ppg Industries Inc Glass distortion scanning system
US4584476A (en) * 1982-09-21 1986-04-22 Societa Italiana Vetro Siv S.P.A. Device for the non-destructive testing of the internal stress state of heat tempered plate glass
DD221277A1 (de) * 1983-09-09 1985-04-17 Univ Schiller Jena Polarisationsoptische durchlichtanordnung mit gekreuzter polarisatoreinstellung
AU8698091A (en) * 1990-11-06 1992-05-14 Flachglas Aktiengesellschaft Method and apparatus for determining the optical quality of a transparent plate

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
DERWENT ABSTRACT, Accession No. 85-197187/33, Class S03; & DD,A,221 277 (FR-SCHILLER-UNIV JENA), 17 April 1985. *

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6236734B1 (en) 1996-05-31 2001-05-22 The University Of Queensland Detection of defects in glass
GB2338309B (en) * 1998-06-13 2002-05-08 Neil Colin Hamilton Recognition apparatus for toughened glass
GB2338309A (en) * 1998-06-13 1999-12-15 Neil Colin Hamilton Recognition apparatus for toughened glass
FR2828880A1 (fr) * 2001-08-27 2003-02-28 Glaverbel Dispositif et procede de marquage d'un element en verre
US8730465B2 (en) 2006-08-02 2014-05-20 Nikon Corporation Polarized light defect detection in pupil images
WO2011007047A1 (fr) * 2009-07-16 2011-01-20 Oy Sparklike Ab Procédé, appareil, et dispositif de détection de propriétés d'un objet transparent réfléchissant
WO2011157815A1 (fr) * 2010-06-17 2011-12-22 Agc Glass Europe Analyse des marques de trempe
BE1019378A3 (fr) * 2010-06-17 2012-06-05 Agc Glass Europe Analyse des marques de trempe.
EP2714321B1 (fr) * 2011-05-27 2019-02-06 Sage Electrochromics, Inc. Appareil et procédé pour réparer des défauts dans un dispositif de commande d'énergie électronique ou d'affichage
DE102015004109A1 (de) 2014-04-07 2015-10-08 Hans Höllwart Forschungszentrum Für Integrales Bauwesen Ag Verfahren und Vorrichtung zur Charakterisierung von Spannungen in einem flächigen, transparenten Gegenstand
WO2015162303A1 (fr) * 2014-04-25 2015-10-29 Boraident Gmbh Procédé et dispositif permettant de détecter des inclusions de sulfure de nickel dans une plaque de verre
CN105259174A (zh) * 2015-10-24 2016-01-20 宁波申山新材料科技有限公司 一种功能贴膜纹路测试仪及其测试方法
CN105259174B (zh) * 2015-10-24 2017-12-22 宁波申山新材料科技有限公司 一种功能贴膜纹路测试仪及其测试方法
US11480532B2 (en) * 2018-06-07 2022-10-25 LiteSentry LLC Inspection, analysis, classification, and grading of transparent sheets using segmented datasets of photoelasticity measurements
CN108709859A (zh) * 2018-06-26 2018-10-26 华南理工大学 用于曲面玻璃视觉检测的通用型夹具及检测方法
CN108709859B (zh) * 2018-06-26 2023-11-07 华南理工大学 用于曲面玻璃视觉检测的通用型夹具及检测方法
CN110455826A (zh) * 2019-09-27 2019-11-15 中国建筑科学研究院有限公司 一种便携式钢化玻璃杂质检测装置及方法
CN110530882A (zh) * 2019-09-27 2019-12-03 北京奥博泰科技有限公司 一种用于检测钢化玻璃杂质的便携式装置及方法

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