WO1993009552A1 - Electrolytic double layer capacitor - Google Patents
Electrolytic double layer capacitor Download PDFInfo
- Publication number
- WO1993009552A1 WO1993009552A1 PCT/US1992/009244 US9209244W WO9309552A1 WO 1993009552 A1 WO1993009552 A1 WO 1993009552A1 US 9209244 W US9209244 W US 9209244W WO 9309552 A1 WO9309552 A1 WO 9309552A1
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- WIPO (PCT)
- Prior art keywords
- capacitor
- electrolyte
- electrodes
- channels
- voltage
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 title claims abstract description 91
- 239000003792 electrolyte Substances 0.000 claims abstract description 60
- 239000002178 crystalline material Substances 0.000 claims abstract description 14
- 238000000034 method Methods 0.000 claims description 39
- -1 bismuth chalcogenide Chemical class 0.000 claims description 22
- 229910052797 bismuth Inorganic materials 0.000 claims description 19
- 238000009830 intercalation Methods 0.000 claims description 18
- 230000002687 intercalation Effects 0.000 claims description 17
- 239000002245 particle Substances 0.000 claims description 16
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 claims description 9
- 239000007864 aqueous solution Substances 0.000 claims description 8
- 239000011230 binding agent Substances 0.000 claims description 8
- RUOJZAUFBMNUDX-UHFFFAOYSA-N propylene carbonate Chemical compound CC1COC(=O)O1 RUOJZAUFBMNUDX-UHFFFAOYSA-N 0.000 claims description 7
- 239000000203 mixture Substances 0.000 claims description 6
- 230000035515 penetration Effects 0.000 claims description 6
- 239000000843 powder Substances 0.000 claims description 6
- 239000000243 solution Substances 0.000 claims description 6
- XTHFKEDIFFGKHM-UHFFFAOYSA-N Dimethoxyethane Chemical compound COCCOC XTHFKEDIFFGKHM-UHFFFAOYSA-N 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 150000002892 organic cations Chemical class 0.000 claims description 3
- VLTRZXGMWDSKGL-UHFFFAOYSA-M perchlorate Inorganic materials [O-]Cl(=O)(=O)=O VLTRZXGMWDSKGL-UHFFFAOYSA-M 0.000 claims description 3
- VLTRZXGMWDSKGL-UHFFFAOYSA-N perchloric acid Chemical compound OCl(=O)(=O)=O VLTRZXGMWDSKGL-UHFFFAOYSA-N 0.000 claims description 3
- 229920002134 Carboxymethyl cellulose Polymers 0.000 claims description 2
- 239000004698 Polyethylene Substances 0.000 claims description 2
- 235000010948 carboxy methyl cellulose Nutrition 0.000 claims description 2
- 239000001768 carboxy methyl cellulose Substances 0.000 claims description 2
- 239000008112 carboxymethyl-cellulose Substances 0.000 claims description 2
- 239000011244 liquid electrolyte Substances 0.000 claims description 2
- 229920000573 polyethylene Polymers 0.000 claims description 2
- 150000003467 sulfuric acid derivatives Chemical class 0.000 claims description 2
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 claims 2
- 239000006104 solid solution Substances 0.000 claims 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims 1
- 239000000463 material Substances 0.000 abstract description 35
- 239000013078 crystal Substances 0.000 description 34
- 150000001875 compounds Chemical class 0.000 description 13
- 239000007772 electrode material Substances 0.000 description 13
- 229910001416 lithium ion Inorganic materials 0.000 description 12
- 239000003708 ampul Substances 0.000 description 11
- 150000002500 ions Chemical class 0.000 description 9
- 238000004146 energy storage Methods 0.000 description 8
- 229910013462 LiC104 Inorganic materials 0.000 description 7
- 230000007547 defect Effects 0.000 description 6
- 238000002844 melting Methods 0.000 description 6
- 230000008018 melting Effects 0.000 description 6
- 229910002899 Bi2Te3 Inorganic materials 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 150000004770 chalcogenides Chemical class 0.000 description 4
- 239000008151 electrolyte solution Substances 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 238000000227 grinding Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 239000004743 Polypropylene Substances 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000006731 degradation reaction Methods 0.000 description 2
- 230000000593 degrading effect Effects 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 238000001465 metallisation Methods 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 230000035484 reaction time Effects 0.000 description 2
- 238000005204 segregation Methods 0.000 description 2
- 229910052714 tellurium Inorganic materials 0.000 description 2
- 238000001691 Bridgeman technique Methods 0.000 description 1
- 238000005411 Van der Waals force Methods 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000000498 ball milling Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 239000012611 container material Substances 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- MHCFAGZWMAWTNR-UHFFFAOYSA-M lithium perchlorate Chemical compound [Li+].[O-]Cl(=O)(=O)=O MHCFAGZWMAWTNR-UHFFFAOYSA-M 0.000 description 1
- 229910001486 lithium perchlorate Inorganic materials 0.000 description 1
- 238000011068 loading method Methods 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 239000012254 powdered material Substances 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000001953 recrystallisation Methods 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G11/00—Hybrid capacitors, i.e. capacitors having different positive and negative electrodes; Electric double-layer [EDL] capacitors; Processes for the manufacture thereof or of parts thereof
- H01G11/22—Electrodes
- H01G11/24—Electrodes characterised by structural features of the materials making up or comprised in the electrodes, e.g. form, surface area or porosity; characterised by the structural features of powders or particles used therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G11/00—Hybrid capacitors, i.e. capacitors having different positive and negative electrodes; Electric double-layer [EDL] capacitors; Processes for the manufacture thereof or of parts thereof
- H01G11/22—Electrodes
- H01G11/30—Electrodes characterised by their material
- H01G11/48—Conductive polymers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G11/00—Hybrid capacitors, i.e. capacitors having different positive and negative electrodes; Electric double-layer [EDL] capacitors; Processes for the manufacture thereof or of parts thereof
- H01G11/54—Electrolytes
- H01G11/58—Liquid electrolytes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G11/00—Hybrid capacitors, i.e. capacitors having different positive and negative electrodes; Electric double-layer [EDL] capacitors; Processes for the manufacture thereof or of parts thereof
- H01G11/54—Electrolytes
- H01G11/58—Liquid electrolytes
- H01G11/64—Liquid electrolytes characterised by additives
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M4/00—Electrodes
- H01M4/02—Electrodes composed of, or comprising, active material
- H01M4/36—Selection of substances as active materials, active masses, active liquids
- H01M4/58—Selection of substances as active materials, active masses, active liquids of inorganic compounds other than oxides or hydroxides, e.g. sulfides, selenides, tellurides, halogenides or LiCoFy; of polyanionic structures, e.g. phosphates, silicates or borates
- H01M4/581—Chalcogenides or intercalation compounds thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G11/00—Hybrid capacitors, i.e. capacitors having different positive and negative electrodes; Electric double-layer [EDL] capacitors; Processes for the manufacture thereof or of parts thereof
- H01G11/54—Electrolytes
- H01G11/58—Liquid electrolytes
- H01G11/60—Liquid electrolytes characterised by the solvent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G11/00—Hybrid capacitors, i.e. capacitors having different positive and negative electrodes; Electric double-layer [EDL] capacitors; Processes for the manufacture thereof or of parts thereof
- H01G11/54—Electrolytes
- H01G11/58—Liquid electrolytes
- H01G11/62—Liquid electrolytes characterised by the solute, e.g. salts, anions or cations therein
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Definitions
- This invention relates to double layer capacitors, and more particularly relates to high-energy, high-power electrolytic capacitors.
- Electrolytic capacitors store energy by accommodating a so-called double layer of charge at the interface of each capacitor electrode surface and the electrolytic solution between the electrodes.
- the electrode surface area thus limits the energy storage capacity of such capacitors; the larger the electrode surface area, the larger the double layer of charge which may be generated, and hence the greater the energy storage of the capacitor.
- Typical applications restrict the practical limit of a capacitor's physical size, however, and thereby limit the achievable energy storage capacity provided by the macroscopic surfaces of the capacitor.
- One double layer capacitor design which overcomes the macroscopic capacitor surface area limitation employs powdered electrode materials, e.g., high-area, activated carbon particles, to microscopically increase the surface area of the capacitor electrodes.
- the carbon particles are bound together to form a porous electrode structure in which the exposed surfaces of the particles contribute to the overall electrode surface area.
- the internal resistance and capacitance of the porous electrode structure is a complicated function of the carbon particles' structure and configuration.
- the invention provides a double layer electrolytic capacitor of two electrodes each in contact with a common liquid electrolyte.
- At least one of the electrodes comprises a crystalline material characterized by the presence of van der Waals channels in the material.
- These van der Waals channels are adapted to accommodate the electrolyte within the channels, such that a double layer of charge is formed at interfaces of the van der Waals channels and the electrolyte when a voltage is applied between the two electrodes.
- This ability to utilize the van der Waals channels as extensions of the electrode's macroscopic surface provides a dramatic increase in capacitance over conventional double layer capacitors.
- one of the electrodes comprises the crystalline material and the other electrode is an electrically conducting container in which the electrolyte and the crystalline electrode are positioned; more preferably, both electrodes of the capacitor are composed of the crystalline material.
- the electrodes are each composed of a monocrystal of the crystalline material.
- the two electrodes each are composed of monocrystalline powder particles of the crystalline material, the particles being approximately 70 microns in a longest dimension.
- the crystalline material is a bismuth chalcogenide, of Bi y Ch,., where Ch is selected from the group consisting of Te and Se, y is 1 or 2, and z is in the range of 1 to 3.
- the electrolyte is a 1.0 M LiC10 4 solution in propylene carbonate; in other embodiments, the electrolyte is a 1.2 M solution of organic cation of perchlorate in a mixture of propylene carbonate which is dissolved in dimethoxyethane, or an aqueous solution of potassium hydroxide.
- the electrodes' van der Waals channels are adapted to accommodate the electrolyte by a training process comprisingintercalation of ions fro the electrolyte into the van der Waals channels, the voltage being sufficiently high to achieve electrolyte penetration of the channels.
- the voltage is periodically reversed in polarity between the electrodes during the intercalation process. Most preferably, the voltage is applied to the electrodes for approximately 600 minutes, and the voltage polarity is reversed approximately every 30 minutes.
- This training process allows the electrolyte to penetrate the electrodes' van der Waals channels and form a double layer of charge at the channel surfaces, thereby dramatically increasing the total surface area of the electrode.
- Fig. 1A is a schematic illustration of one embodiment of the capacitor of the invention.
- Fig. IB is a schematic illustration of a second embodiment of the capacitor of the invention
- Fig. 2A is a schematic illustration of the capacitor of Fig. IB at a first stage of training
- Fig. 2B is a schematic illustration of the capacitor of Fig. 2A at a later stage of training
- Fig. 2C is a schematic illustration of the capacitor of Fig. 2A at a final stage of training
- Fig. 2D is a schematic illustration of the capacitor of Fig. 2A including the formation of a double layer of charge
- Fig. 3 is a diagram of an equivalent circuit for representing the capacitors of Figs. 1A and IB.
- the capacitance of a typical parallel plate capacitor is given by:
- capacitance for a double layer capacitor is further specified by the structure of the charged double layer and its geometry.
- This double layer comprises charge accumulation on the electrode surface and accumulation of ions at the electrode surface-electrolyte interface.
- the width d in the capacitance equation is given by the d stance between the centers of the two regions constituting the double layer.
- the capacitor of the invention provides a dramatic increase in capacitance and energy storage by providing a corresponding increase in surface area of the capacitor electrodes and through proper selection of the electrodes and the electrolyte.
- Most notable of the invention's advantages is that the increased surface area does not rely on increasing the macroscopic dimensions of the electrodes, and further, does not rely on particle surface areas, as in typical carbon electrodes. Rather, the increased electrode surface area is obtained using a particular class of materials, namely intercalation compounds, which are characterized by a layered crystalline structure.
- the crystal layers of intercalation compounds comprise planes of molecules or atoms which are weakly bound together and separated from each other by van der Waals regions.
- the van der Waals regions of the electrode material are manipulated such that the surfaces of the crystal lattice channels, although internal to the electrode material, contribute to the overall electrode surface area, and thereby increase the effective electrode surface area beyond that of its macroscopic surface.
- surfaces of the van der Waals channels of the electrode material are capable of forming a double layer with an electrolyte in exactly the same manner as the electrode macroscopic surface forms a double layer. Recognition and exploitation of this physical process has enabled the inventors herein to achieve the dramatic energy storage capability of the capacitor of the invention.
- the inventors herein have recognized that a particular type of intercalation compound, namely bismuth chalcongenides, including Bi 2 Te 3 and Bi 2 Se 3 , are particularly well-suited for providing van der Waals channels as an extension of electrode surface area. Electrodes composed of these materials, when used in combination with a suitable electrolyte, generate a highly uniform double layer of a desirable structure. As is well-known to those skilled in the art, bismuth chalcongenides exhibit a layered crystalline lattice which is layered at the molecular level, each layer being separated by a van der Waals channel having a width on the order of 3-4 A.
- the ability to manipulate the bismuth chalcogenides, and indeed any layered intercalation material, for employing their van der Waals channels to increase electrode surface area, is dramatically impacted by the purity and defect density of the chosen material. Impurities and crystal lattice defects distort the geometry of the van der Waals channels, rendering them less accessible to intercalating species, degrading the channel surface structure and thus degrading the electrical and mechanical properties of the channels. Accordingly, it is ideally preferred that the material chosen for the capacitor electrodes be prepared using unique processes, developed by the inventors herein, yielding a highly pure and as defect-free as possible monocrystalline material. To that end, the following single crystal growth process is preferred for bismuth chalcogenide materials. Alternative processes, providing less than ideally pure and defect-free material, may nonetheless be acceptable for particular capacitor applications. Those skilled in the art will recognize critical material parameters and corresponding performance results.
- stoichiometric quantities of highly purified (99.9999% pure) bismuth and tellurium (or other selected chalcogenide) are first charged into a quartz ampoule. If necessary, the materials are zone refined before use. Off- stoichiometry results in an n- or p-doped material with the resultant degradation of the lattice structure and the associated performance.
- the ampoule is evacuated to 10 "7 m Hg and backfilled to a pressure of 10 "3 mmHg with a small amount of inert gas, such as argon, or a reducing gas, such as hydrogen (3-10 cycles), and then sealed.
- Hydrogen is particularly preferred because it reacts with oxygen during processing to prevent oxidation and decrease the segregation of chalcogenide by reducing its vapor pressure.
- a highly homogeneous polycrystalline material is prepared in a first processing step. The sealed ampoule is placed in a furnace at room temperature and heated to a temperature 5-10°C above its melting point. The ramp rate, temperature and reaction time are dependent upon the final compound. The reaction conditions are listed in Table I for the preparation of polycrystalline Bi 2 S 3 , Bi 2 Se 3 , and Bi 2 Te 3 . The temperature of the furnace over the entire length of the ampoule is controlled to within ⁇ 0.5°C. Careful and accurate control of the temperature is important because of the high volatility of chalcogenides.
- the ampoule is agitated or vibrated to insure complete mixing of the ampoule components.
- the ampoule vibration is in the range of 25-100 Hz and is accomplished by fixing one end of the ampoule to an oscillation source. Any conventional vibration means is contemplated by the present invention.
- the ampoule is cooled at a slow controlled rate.
- a homogeneous polycrystalline material Once a homogeneous polycrystalline material is obtained, it can be further processed into a highly defect-free bismuth chalcogenide single crystal.
- Any known method of growing single crystals can be used, such as Bridgeman techniques, Czolchralski process and zone refinement (recrystallization). In particular zone refinement has proved to be highly effective in obtaining high purity single crystals.
- Zone refinement is preferably carried out in a quartz boat containing a seed crystal of the desired lattice structure, e.g., the hexagonal lattice structure.. It is recommended that clean rooms levels of Class 100 be maintained.
- the seed crystal is oriented in the boat such that crystal layers are horizontal.
- the entire apparatus should be shock- mounted to insulate against environmental vibrations.
- the boule of polycrystalline material is positioned in surface contact with the seed crystal.
- the furnace comprises two parts, an outer furnace for maintaining an elevated temperature along the entire boule length and a narrow zone movable in a direction for heating a small portion of the polycrystalline material.
- the outer furnace is maintained at 35°C below the melting point and the zone, which is 2-3 cm in length, is held at 10°C above the melting point of the polycrystalline material.
- the boule can be rapidly heated to the operating temperature.
- the zone is initially positioned at the seed crystal/boule interface and this region is heated to the melting point of the material.
- the zone is moved slowly down the length of the boule.
- Zone travel rate varies with composition, and exemplary rates are shown, along with other processing parameters, in Table II. Zone travel rate is an important processing parameter. If it is too great, crystallization is incomplete and defects are formed. If it is too slow, layer distortions result.
- the lower portion of the heat-treated boule in contact with the quartz boat is preferably removed before use. Table IL Processing conditions for hexagonal single crystal growth.
- the above process can be modified slightly to produce crystals of rhombohedral structure, in which case a rhombohedral seed crystal is used in the zone refinement process.
- the furnace temperature is held at 30°C below the melting point and the zone is maintained at the melting point of the polycrystalline material.
- a monocrystalline intercalation compound, and most preferably, bismuth chalcogenide is grown using the process described above to produce monocrystalline electrode structures.
- monocrystalline bismuth chalcogenide electrodes are produced having a rectangular geometry with sides of 4 millimeters-long and 5 millimeters-long, and having a thickness of between 0.5-1 millimeters. It is preferable to metalize one of the faces of the monocrystalline material which is perpendicular to the plane of the van der Waals channels within the crystal. This metalization may consist of, for example, a nickel paste, which is spread on the crystal to form a 10- 20 micron-thick metal layer. The metalization provides both a good electrical contact to the crystalline piece and enhances the rigidity of the crystalline piece.
- the monocrystalline bismuth chalcogenide material may be ground into a powder for forming the electrodes; such a powdered material is more easily manipulated than the single crystal material.
- the crystal grinding process may be carried out using, for example, a ball milling device, or other grinding device, to produce single crystal particles each having a diameter of preferably approximately 70 microns. Other particle diameters may be more preferable in specific instances.
- the crystal particles are then mixed with an appropriate compound to bind them together. While the binder acts, in effect, to "glue" the particles together, it must not completely electrically insulate the particles from each other.
- the binder material is selected according to the electrolyte.
- the binder When an aprotic electrolyte solvent is used, the binder preferably consists of a 3% aqueous solution of carboxymethylcellulose, in which the particles are mixed; for other electrolytes, alternative binding agents, e.g., a 5% polyethylene dispersion in normal hexane, may be used.
- the resulting powder-binder mixture is placed into an electrode mold and then dried at roo temperature.
- the electrode geometry, as determined by the mold may be, for example, disc-shaped, as is conventional for capacitors, with an electrode thickness of between 0.3-1 millimeters. Alternative electrode geometries are also feasible.
- a capacitor 10 including a bismuth chalcogenide electrode 20 is constructed as follows.
- the capacitor electrode 20, whether consisting of a monocrystalline piece or a molded crystal powder, is located in contact with a selected electrolyte 30, supported by an electrically conducting container 35.
- this conducting container is composed of an ideally nonpolarizable material.
- a power supply 40 such as a battery, is electrically connected to the electrode 20 via a conductor 45, such as a wire, and correspondingly is connected to the conducting container 35 via a similar conductor 50.
- the electrolyte 30 suitably consists of an aqueous solution of, e.g., alkali, or preferably, 1.0 M of IiC10 4 in propylene carbonate.
- a separator consisting of 2 layers of non woven polypropylene, each layer 100 um- thick, and saturated with the electrolyte, provides mechanical support of the electrolyte.
- the electrolyte may comprises a 1.2 M solution of organic cation of perchlorate in a mixture of propylene carbonate in dimethoxyethane, an aqueous solution of potassium hydroxide, an aqueous solution of single valence metal sulphates, or other aqueous solution.
- a second capacitor configuration 60 in a second capacitor configuration 60, two identical bismuth chalcogenide electrodes 20 are separated by the electrolyte 30.
- a polypropylene separator is suitably impregnated with the electrolyte solution and is positioned between the electrodes 20.
- the electrodes, held apart by the separator, are then inserted into a supporting frame (not shown) and sealed in a pressing form.
- the power supply 40 is electrically connected to each of the electrodes 20 via similar conductors 45, e.g., good conducting wires.
- the bismuth chalcogenide van der Waals channels must be manipulated, or "trained", to provide the extended surfaces.
- the van der Waals channel surfaces after being trained, can form a double layer with the electrolyte in a manner similar to that in which the electrode macroscopic surface forms a double layer. Accordingly, "training” is a process, described below, whereby electrolyte (and ions) are driven within the van der Waals channels to facilitate flow of electrolyte into and out of the channels.
- a capacitor 60 having two bismuth chalcogenide electrodes 20a, 20b at the start of the training process.
- the dimensions of the electrodes' van der Waals channels 70a, 70b are greatly exaggerated for clarity, and it must be recalled that each electrode is comprised of on the order of 10 6 -10 7 such channels.
- a LiC10 4 -based electrolyte 30 Between the two electrodes is positioned a LiC10 4 -based electrolyte 30.
- the power supply 40 is set to provide a voltage which is greater than the faraday potential for cation intercalation, and thus the voltage depends directly on the particular combination of capacitor electrode material and electrolyte employed. Given a particularly chosen electrode-electrolyte combination, those skilled in the art will recognize that the corresponding faraday potential may be determined in a standard table of material systems and faraday voltages.
- the electrode 20b connected to the positive terminal of the power supply accumulates a positive surface charge.
- the surfaces of the van der Waals channels 70b of the electrode likewise accumulate this positive surface charge.
- both the macroscopic surface and the surfaces of the van der Waals channels 70a of the electrode 20a connected to the negative terminal of the power supply accumulate a negative surface charge.
- free Li + ions 72 readily intercalate the negatively charged electrode 20a, because of the favorable charge and energy configuration, and because their ionic radius is relatively smaller than the width of the van der Waals channels.
- solvated Ii + complexes 74 move toward the negatively charged electrode surface and solvated C10 4 " complexes 76 move toward the positively charged electrode surface.
- the positively charged electrode's van der Waals channels 70b being 3-4 A-wide (as occurring before the training process) are too small for the C10 4 " complexes to penetrate within them; the solvated Li + complexes, however, do to a small degree penetrate the 3-4 A-wide channels 70a of the negatively charged electrode 20a, effectively being transported along with the free Ii + ions to the electrode surface and within the electrode channels. As a result, the solvated Ii + complexes slightly widen the channels that they partially enter in the negatively charged electrode.
- the polarity of the power supply is reversed. Then, the accumulated surface charge distribution reverses; the previously positively charged electrode now accumulates negative surface charge, and attracts the free Li + ions 72 and solvated complexes 74.
- the free Li + ions 72 readily intercalate the channels and the solvated complexes 74 again partially enter the corresponding van der Waals channels, and thereby slightly widen the channels.
- both the solvated C10 4 " complexes 76 and the solvated Li + complexes 74 are able to completely penetrate the van der Waals channels 70a, 70b, of both electrodes, 20a, 20b.
- electrically neutral electrolyte (including both C10 4 ' complexes 76 and Li + complexes 74) is thereby able to completely penetrate the van der Waals channels and create an electric double layer of charge 80, 82 and 84, 86 at the electrode- electrolyte interface throughout the van der Waals channels of each electrode, in a manner similar to that which occurs at the macroscopic surface of the electrodes.
- This penetration of electrolyte throughout the crystal channels forms the basis for achieving the significant capacitance and energy storage increases provided by the invention.
- the extent of training required to achieve penetration of the electrolyte and its solvated ionic species within the electrodes' van der Waals channels is critically dependent on the particular combination of electrode material and electrolyte employed.
- the width of the electrode van der Waals channels before undergoing any training process and the radius of the solvated complexes in the electrolyte determine the training required; the larger the radius of the complexes and the smaller the van der Waals channels' width, the longer the training time requirement.
- the training preferably consists of about 20 training cycles of approximately 30 minutes each, where the polarity of the power supply is reversed with each cycle. For specific capacitance requirements, this training may be adjusted, however.
- the training should be maximized.
- a preferable training procedure may be empirically determined for a given electrode- electrolyte combination and capacitance goal.
- Alternative training processes are within the intended scope of the invention.
- the voltage polarity may be maintained constant in the above process, or a charge-discharge process may be employed to widen the van der Waals channels.
- a voltage above the faraday potential is applied between the electrodes, in the manner discussed above, for a period of time, and then the capacitor is discharged across an appropriate load. If the voltage polarity is maintained constant during this process, or if the voltage polarity is not switched during the training process first described, one of the electrodes may not achieve widened channels, depending on the electrode material and electrolyte composition.
- the electrode having tile negative polarity will be intercalated with free and solvated Li + ions (and thereby accommodate electrolyte), but the electrode of positive polarity will not have the benefit of free and solvated Li* ions beginning to open its lattice channels, and thus the solvated C10 4 " ions will not widen those channels to accommodate electrolyte; as a result, the electrode of positive polarity will not provide the extended van der Waals surfaces.
- a capacitor of the design using a single intercalation compound-electrode (Fig. 1A) is also trained using the techniques described above. A process of voltage application and voltage polarity reversal will intercalate free and solvated Li + ions and solvated C10 4 ions in the electrode, thereby providing the ability to accommodate electrolyte within the electrode and achieve the desired electrode surface extension.
- the training process does not deform or distort the crystal planes of the layered crystalline electrode material to any significant extent.
- the extent of crystal plane deformation is related to the starting purity and defect density of the electrode material, as well as other properties resulting from the growth process; fewer initial defects in the crystal result in fewer crystal plane deformation sites caused by the training.
- the electrodes' van der Waals channels retain the ability to be easily penetrated by the electrolyte ions, and can correspondingly develop a double layer in a short time period.
- the training process widens the van der Waals channels beyond their elastic limit; the channels thus do not later shrink to a smaller dimension.
- the capacitors described above are electrically modelled as a circuit 90 with the applied voltage 40, including a first capacitor 92 and a second capacitor 94, separated by a resistance 96.
- the resistance 96 is that of the electrolyte, and is typically about 0.003 ⁇ .
- the first capacitor 92 corresponds to the double layer capacitance of that electrode 20
- the second capacitor 94 corresponds to the capacitance of the electrically conducting container 35.
- this capacitance is many orders of magnitude lower than that of the electrode 20.
- the series capacitance of the two capacitors is swamped by the smaller capacitor 94.
- the double intercalation compound capacitor (Fig. IB) is the more preferable scheme; here the two capacitors 92, 94 represent the double layer capacitances of the two electrodes 20. If each electrode is identically constructed, thereby exhibiting the same capacitance, the overall series capacitance of the capacitor is maximized.
- Double electrode capacitors of the design and materials described above have been made and exhibit between 30-100 farads per cubic centimeter and an internal resistance of approximately 0.02 ⁇ /cm 2 . This extremely low internal resistance provides the ability to achieve high power in the capacitor discharge. Theoretically, a monocrystalline capacitor structure of pure and defect-free bismuth chalcogenide would exhibit 1000 farads per cubic centimeter. Double layer capacitors having
- Bi 2 Te 3 electrodes have been charged to 2.6 volts and observed to exhibit no specific energy degradation for up to 1000 cycles.
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- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Materials Engineering (AREA)
- Inorganic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Electric Double-Layer Capacitors Or The Like (AREA)
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Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5508567A JPH07503578A (en) | 1991-10-29 | 1992-10-29 | electrolytic double layer capacitor |
EP92923421A EP0610395A1 (en) | 1991-10-29 | 1992-10-29 | Electrolytic double layer capacitor |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US78385091A | 1991-10-29 | 1991-10-29 | |
US783,850 | 1991-10-29 |
Publications (1)
Publication Number | Publication Date |
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WO1993009552A1 true WO1993009552A1 (en) | 1993-05-13 |
Family
ID=25130588
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1992/009244 WO1993009552A1 (en) | 1991-10-29 | 1992-10-29 | Electrolytic double layer capacitor |
Country Status (9)
Country | Link |
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EP (1) | EP0610395A1 (en) |
JP (1) | JPH07503578A (en) |
CN (1) | CN1074781A (en) |
AU (1) | AU2926692A (en) |
CA (1) | CA2122355A1 (en) |
IL (1) | IL103582A0 (en) |
MX (1) | MX9206262A (en) |
MY (1) | MY129976A (en) |
WO (1) | WO1993009552A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6631074B2 (en) | 2000-05-12 | 2003-10-07 | Maxwell Technologies, Inc. | Electrochemical double layer capacitor having carbon powder electrodes |
US6946007B2 (en) | 2001-11-02 | 2005-09-20 | Sony Corporation | Electrochemical double layer capacitor having carbon powder electrodes |
US20230238596A1 (en) * | 2022-01-27 | 2023-07-27 | GM Global Technology Operations LLC | Battery management system including capacitance measurement for monitoring battery cell health |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016225397A (en) * | 2015-05-28 | 2016-12-28 | パナソニックIpマネジメント株式会社 | Electricity storage device and manufacturing method thereof |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0176692A1 (en) * | 1984-08-13 | 1986-04-09 | Siemens Aktiengesellschaft | Method of producing vitreous carbon |
-
1992
- 1992-10-28 MY MYPI92001945A patent/MY129976A/en unknown
- 1992-10-28 IL IL103582A patent/IL103582A0/en unknown
- 1992-10-29 EP EP92923421A patent/EP0610395A1/en not_active Withdrawn
- 1992-10-29 AU AU29266/92A patent/AU2926692A/en not_active Abandoned
- 1992-10-29 MX MX9206262A patent/MX9206262A/en unknown
- 1992-10-29 CN CN92113775A patent/CN1074781A/en active Pending
- 1992-10-29 WO PCT/US1992/009244 patent/WO1993009552A1/en not_active Application Discontinuation
- 1992-10-29 JP JP5508567A patent/JPH07503578A/en active Pending
- 1992-10-29 CA CA002122355A patent/CA2122355A1/en not_active Abandoned
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0176692A1 (en) * | 1984-08-13 | 1986-04-09 | Siemens Aktiengesellschaft | Method of producing vitreous carbon |
Non-Patent Citations (2)
Title |
---|
M. BALKANSKI 'Microionics - Solid State Batteries' 1991 , ELSEVIER SCIENCE PUBLISHERS MB.V. , ECSC,EEC,EAEC, BRUSSELS AND LUXEMBOURG "Study of Lithium intercalation in Bismuth Diselenide" K.M. PARASKEVOPOULOS ET AL. * |
SOLID STATE IONICS vol. 36, no. 1/2, October 1989, AMSTERDAM, NE pages 113 - 120 C.JULIEN ET AL. 'Studies of lithium insertion in bismuth chalcogenide compounds' * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6631074B2 (en) | 2000-05-12 | 2003-10-07 | Maxwell Technologies, Inc. | Electrochemical double layer capacitor having carbon powder electrodes |
US6955694B2 (en) | 2000-05-12 | 2005-10-18 | Maxwell Technologies, Inc. | Electrochemical double layer capacitor having carbon powder electrodes |
US6946007B2 (en) | 2001-11-02 | 2005-09-20 | Sony Corporation | Electrochemical double layer capacitor having carbon powder electrodes |
US20230238596A1 (en) * | 2022-01-27 | 2023-07-27 | GM Global Technology Operations LLC | Battery management system including capacitance measurement for monitoring battery cell health |
Also Published As
Publication number | Publication date |
---|---|
JPH07503578A (en) | 1995-04-13 |
IL103582A0 (en) | 1993-03-15 |
AU2926692A (en) | 1993-06-07 |
MX9206262A (en) | 1993-12-01 |
EP0610395A1 (en) | 1994-08-17 |
CN1074781A (en) | 1993-07-28 |
MY129976A (en) | 2007-05-31 |
CA2122355A1 (en) | 1993-05-13 |
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