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WO1993003352A1 - Procede de determination de la conductivite thermique de films plastiques anisotropiques et son utilisation - Google Patents

Procede de determination de la conductivite thermique de films plastiques anisotropiques et son utilisation Download PDF

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Publication number
WO1993003352A1
WO1993003352A1 PCT/FI1992/000226 FI9200226W WO9303352A1 WO 1993003352 A1 WO1993003352 A1 WO 1993003352A1 FI 9200226 W FI9200226 W FI 9200226W WO 9303352 A1 WO9303352 A1 WO 9303352A1
Authority
WO
WIPO (PCT)
Prior art keywords
plastic film
thermic
diffusivity
thermal conductivity
film sample
Prior art date
Application number
PCT/FI1992/000226
Other languages
English (en)
Inventor
Jussi Jaarinen
Bert Skagerberg
Jukka Rantala
Original Assignee
Neste Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Neste Oy filed Critical Neste Oy
Publication of WO1993003352A1 publication Critical patent/WO1993003352A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/44—Resins; Plastics; Rubber; Leather
    • G01N33/442—Resins; Plastics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity

Definitions

  • the invention relates to a method for determining the thermal conductivity of anisotropic plastic films.
  • the thermic diffusivity is obtained from the equation (1)
  • p C is independent of the orientation degree of the plastic film.
  • Plastic films generally obtain orientation e.g. by stretching. It is a known fact that an orientated plastic film has in the values of the thermal conductivity in different directions considerable differences. The thermal conductivity is even 2-20-fold in certain directions. In the literature of the art is presented even such a fact that the difference in the thermal conductivity could be even 100-fold.
  • the control and determination of the thermic diffusivity of polymers is extremely important when preparing high-class polymers.
  • the thermic diffusivity is import ⁇ ant also in the sense that the structural properties of the polymer depend on the thermic diffusivity. In this sense, the orientation of polymers is also of import- ance with respect to the mechanical properties of the final product.
  • the object of the invention is to provide a method, by means of which the thermal conductivity of anisotropic plastic films may be determined sufficiently reliably.
  • an optical beam deflection known per se.
  • This method has been used for determining the thermal conductivity of metals and ceramics, but this method cannot as such be applied to the determination of the thermal conductivity of anisotropic plastic films.
  • OBD optical beam deflection
  • the data analysis is performed by means of a chemometric analysis method. In this analysis method is used a so- called projection method.
  • a certain especially applicable method is a method of partial least squares regression (PLS), in which the measured thermic wave represents in the analysis a matrix X and the thermic diffusivity is contained as one factor in a matrix Y.
  • PLS partial least squares regression
  • the inventive method may be applied to the determination of the orientation degree of plastic films. As a result of this determination, the mechanical prop ⁇ erties of the plastic film may be adjusted and controlled for achieving the desired mechanical properties.
  • Fig. 1 shows as an axonometric view the principle of the OBD method.
  • Fig. 2A shows graphically the phase and magnitude curves obtained by means of the OBD method for the vertical deviation signals.
  • Fig.2B shows graphically the phase and magnitude curves obtained by means of the OBD method for the horizontal deviation signals.
  • Fig. 3 shows a PLS model in a matrix form.
  • Fig. 1 shows the principle of the OBD method.
  • the method is also called a Mirage method.
  • a laser 11 is a focused and modulated thermal beam, by means of which a plastic film sample 10 is heated.
  • a laser 12 is a measuring beam.
  • the reference number 13 denotes a diagrammatical representation of a thermal profile of the sample 10 and a medium surrounding it, which medium is gen ⁇ erally gas, generally air.
  • a transversal offset 14 is a perpendicular distance of the measuring beam 12 from the central point of the thermal beam 11.
  • a normal offset 15 is a height of the measuring beam 12 from a surface of the sample 10.
  • ⁇ (normal) and ⁇ t (transverse) represent the deviations in the vertical and horizontal direction caused by the deflection of the measuring beam 12.
  • Fig. 2A and 2B show the phase and magnitude curves as a function of the transversal offset 14 both for the vertical and horizontal deviations. Said curves are typical for a polyethylene sample.
  • the temperature profile 13 shown in Fig. 1 is a cyclical temperature distribution according to an equation (3)
  • n index of refraction of a medium, e.g a gas (generally air) at a tempera ⁇ ture T Q
  • T Q average temperature of the medium
  • the projection method refers to methods, in which a math ⁇ ematical projection is made of one or more data blocks for a couple of latent variables (LV).
  • the latent variable is essentially a linear combination of the initial variables.
  • the latent variables indicate the systematic information included in the data.
  • the PLS method partial least squares regression or projections to latent structures
  • two data blocks X and Y are projected, with the intention to simultaneously model X and to predict Y at as high an accuracy as possible.
  • the PLS corresponds to the PCR (principal component regression) and to the PCA (principal component analysis).
  • the PCA in turn resembles an SVD method (singular value decomposition), an eigenvector analysis, and a factor analysis (FA).
  • a particularly applicable method is based on the method of partial least squares regression (PLS).
  • Fig. 3 shows the PLS model in a matrix form.
  • the matrixes T and P model the- X block similar to the actual PC model.
  • the matrixes U and Q model the Y block.
  • connection between the block is modelled as a ratio between the matrixes U and T by means of diagonal matrix B.
  • the remainder matrixes of the block are E and F and the vector describing the internal dependencies is h.
  • the measured thermic wave represents the matrix X and the thermic diffusivity ⁇ is contained as one factor in the matrix Y (cf. Fig. 3).
  • a predictive model PLS
  • the functionability of the model is tested with known test sets, the values of the Y matrix of which are tended to be predicted.
  • the model may be applied to real samples.
  • the PLS model is formed of known samples. The reliability of the PLS model is tested by means of some new samples, whose thermic diffusivity ⁇ is known.

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Abstract

Un faisceau chauffant focalisé et modulé (11) est dirigé sur un échantillon de film plastique (10), ce qui permet d'obtenir un profil thermique (13) pour l'échantillon de film plastique (10) et le milieu qui l'entoure. Le profil thermique (13) est inspecté à l'aide d'un faisceau de mesure (12), et des informations relatives à la phase et à l'ordre de grandeur (Ζn, Ζt) sont obtenues pour le profil thermique (13) en fonction du décalage transversal (14) pour les écarts vertical et horizontal. Les signaux d'écarts vertical et horizontal des informations relatives à la phase et à l'ordre de grandeur (Ζn, Ζt) sont analysés à l'aide d'une méthode de projection, telle qu'une méthode de régression partielle des plus petits carrés PLS, dans laquelle ladite onde thermique représente dans l'analyse une certaine matrice (X) et la diffusivité thermique (α) de l'échantillon de film plastique (10) est contenue sous forme d'un facteur dans une autre matrice (Y). En utilisant des échantillons connus ou un ensemble d'apprentissage simulé, on forme un modèle PLS (modèle prédictif), à l'aide duquel on détermine la diffusivité thermique (α) d'échantillons de films plastiques inconnus et la conductivité thermique (K) en fonction des formules (1) α = K / (ςC) et (2) K = α . ςC.
PCT/FI1992/000226 1991-08-09 1992-08-07 Procede de determination de la conductivite thermique de films plastiques anisotropiques et son utilisation WO1993003352A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI913780A FI89633C (fi) 1991-08-09 1991-08-09 Foerfarande foer bestaemning av vaermeledningsfoermaogan hos anisotropa plastfilmer och anvaendning av detta
FI913780 1991-08-09

Publications (1)

Publication Number Publication Date
WO1993003352A1 true WO1993003352A1 (fr) 1993-02-18

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PCT/FI1992/000226 WO1993003352A1 (fr) 1991-08-09 1992-08-07 Procede de determination de la conductivite thermique de films plastiques anisotropiques et son utilisation

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FI (1) FI89633C (fr)
WO (1) WO1993003352A1 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5586824A (en) * 1994-06-14 1996-12-24 The United States Of America As Represented By The Secretary Of The Navy Method of measuring the thermal conductivity of microscopic graphite fibers
WO2005066875A1 (fr) * 2002-09-20 2005-07-21 General Electric Company Systemes et des procedes: de developpement d'un espace de produits previsionnel continu a partir d'un espace de produits existant discontinu

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4468136A (en) * 1982-02-12 1984-08-28 The Johns Hopkins University Optical beam deflection thermal imaging
US4521118A (en) * 1982-07-26 1985-06-04 Therma-Wave, Inc. Method for detection of thermal waves with a laser probe
US4589783A (en) * 1984-04-04 1986-05-20 Wayne State University Thermal wave imaging apparatus

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4468136A (en) * 1982-02-12 1984-08-28 The Johns Hopkins University Optical beam deflection thermal imaging
US4521118A (en) * 1982-07-26 1985-06-04 Therma-Wave, Inc. Method for detection of thermal waves with a laser probe
US4589783A (en) * 1984-04-04 1986-05-20 Wayne State University Thermal wave imaging apparatus

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
DERWENT'S ABSTRACT, No. 86-318 020/48; & SU,A,1 226 235, publ. week 8648. *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5586824A (en) * 1994-06-14 1996-12-24 The United States Of America As Represented By The Secretary Of The Navy Method of measuring the thermal conductivity of microscopic graphite fibers
WO2005066875A1 (fr) * 2002-09-20 2005-07-21 General Electric Company Systemes et des procedes: de developpement d'un espace de produits previsionnel continu a partir d'un espace de produits existant discontinu

Also Published As

Publication number Publication date
FI89633B (fi) 1993-07-15
FI89633C (fi) 1993-10-25
FI913780A0 (fi) 1991-08-09
FI913780A7 (fi) 1993-02-10

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