US9449651B2 - System and method for offsetting the data buffer latency of a device implementing a JEDEC standard DDR-4 LRDIMM chipset - Google Patents
System and method for offsetting the data buffer latency of a device implementing a JEDEC standard DDR-4 LRDIMM chipset Download PDFInfo
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- US9449651B2 US9449651B2 US14/664,580 US201514664580A US9449651B2 US 9449651 B2 US9449651 B2 US 9449651B2 US 201514664580 A US201514664580 A US 201514664580A US 9449651 B2 US9449651 B2 US 9449651B2
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- 239000000872 buffer Substances 0.000 title claims abstract description 23
- 238000000034 method Methods 0.000 title abstract description 21
- 230000015654 memory Effects 0.000 claims description 41
- 240000007320 Pinus strobus Species 0.000 claims description 38
- 230000009977 dual effect Effects 0.000 claims description 9
- 238000003860 storage Methods 0.000 claims description 5
- 238000012545 processing Methods 0.000 claims description 4
- 230000011664 signaling Effects 0.000 claims 5
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 15
- 239000010931 gold Substances 0.000 description 15
- 229910052737 gold Inorganic materials 0.000 description 15
- 238000010586 diagram Methods 0.000 description 13
- 238000012549 training Methods 0.000 description 12
- 238000004519 manufacturing process Methods 0.000 description 5
- 230000001934 delay Effects 0.000 description 4
- 238000013461 design Methods 0.000 description 4
- 230000002123 temporal effect Effects 0.000 description 4
- 230000003139 buffering effect Effects 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000004590 computer program Methods 0.000 description 2
- 230000003111 delayed effect Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 238000010408 sweeping Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
- G06F13/16—Handling requests for interconnection or transfer for access to memory bus
- G06F13/1668—Details of memory controller
- G06F13/1673—Details of memory controller using buffers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
- G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1066—Output synchronization
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
- G11C7/1093—Input synchronization
Definitions
- the present application relates in general to the field of computers, and in particular, to the connecting co-processors and input/output (I/O) devices on a computer system's main memory as a load-reduction dual in-line memory module (LRDIMM).
- LDDIMM load-reduction dual in-line memory module
- a dual in-line memory module generally refers to a module that contains one or more Random Access Memory (RAM) or Dynamic RAM (DRAM) chips on a small circuit board outfitted with certain pins for connecting to a computer motherboard.
- RAM Random Access Memory
- DRAM Dynamic RAM
- Known configurations for a DIMM include a 240-pin connector or a 160-pin connector and may support 64/72-bit data transfer.
- the memory devices of performance enhanced DIMMs are generally Synchronous DRAMs (SDRAMs), the terms DRAM and SDRAM being used interchangeably here.
- An RDIMM exemplarily shown in FIG. 1
- An LRDIMM exemplarily shown in FIG. 2
- JEDEC Joint Electron Device Engineering Council
- the data buffer latency issue is not limited to LRDIMMs and also arises in co-processors and input/output devices (hereafter, “CPIO devices”) that utilize an LRDIMM interface/front end to connect to a computer's main memory system, such as those described in the now-allowed U.S. patent application Ser. No. 13/303,048.
- CPIO devices co-processors and input/output devices
- a CPIO device that connects to the computer's main memory via an LRDIMM front end also exhibits additional latency (compared to an RDIMM) due to the data buffering and is generally not compatible with RDIMMs already being used on the main memory.
- a CPIO ASIC provides variable timing control for its DDR-4 LRDIMM interface such that propagation delay of the data buffers can be offset by the CPIO ASIC, allowing the CPIO LRDIMM to be timing compatible with an RDIMM.
- FIG. 1 illustrates a typical DDR-4 RDIMM configured to communicate with a host computer system.
- FIG. 2 illustrates a DDR-4 JEDEC compliant LRDIMM configured to communicate with a host computer system.
- FIG. 3 illustrates a DDR-4 CPIO device implementing a DDR-4 JEDEC LRDIMM chipset, according to one embodiment.
- FIG. 4 illustrates an exemplary timing diagram for a read (or write) operation on an RDIMM.
- FIG. 5 illustrates an exemplary timing diagram for a read operation on an LRDIMM.
- FIG. 6 illustrates an exemplary timing diagram for a write operation on an LRDIMM.
- FIG. 7 illustrates an exemplary timing diagram for a read operation on a CPIO LRDIMM, according to one embodiment.
- FIG. 8 illustrates an exemplary timing diagram for a write operation on a CPIO LRDIMM, according to one embodiment.
- the present application also relates to an apparatus for performing the operations herein.
- This apparatus may be specially constructed for the required purposes, or it may comprise a general purpose computer selectively activated or reconfigured by a computer program stored in the computer.
- a computer program may be stored in a computer readable storage medium, such as, but not limited to, any type of disk, including floppy disks, optical disks, CD-ROMs, and magnetic-optical disks, read-only memories (ROMs), random access memories (RAMs), EPROMs, EEPROMs, magnetic or optical cards, or any type of media suitable for storing electronic instructions, and each coupled to a computer system bus.
- the present application describes a system and method for offsetting the data buffer latency in a CPIO LRDIMM such that the CPIO LRDIMM would be timing compatible with an RDIMM.
- the present application is related to and incorporates by reference U.S. Pat. No. 8,452,917, entitled “Load reduction dual in-line memory module (LRDIMM) and method for programming the same,” and now-allowed U.S. patent application Ser. No. 13/303,048, entitled “System and method of interfacing co-processors and input/output devices via a main memory system.”
- FIG. 1 shows a typical DDR-4 RDIMM configured to communicate with a host computer system.
- the host computer system (not shown) communicates instructions and data with the RDIMM 100 using two high speed buses—the clock/address/control bus 101 and the data bus 102 .
- the host computer system uses a lower-speed System Management Bus (SMBus) 103 to communicate with a Serial Presence Detect (SPD) EEPROM 104 to retrieve the module's configuration data (e.g., memory density, number of ranks, and latencies).
- SSD Serial Presence Detect
- the RDIMM includes a Register Control Device (RCD) 105 that is responsible for terminating the clock/address/control bus and retiming the signals to the DRAM devices 106 .
- RCD Register Control Device
- the RCD retimes the clock/address/control signals and drives these signals left and right with a delay.
- the delay of the address and control signals is specified as tPDM
- the delay of the clock signal is specified as tSTAOFF in the timing diagram shown in FIGS. 4 to 8 .
- Retiming the signals and the physical location of the DRAM devices across the DIMM creates a temporal distribution of the DRAM components with increasing delay outwards from the center of the DIMM to the ends. For example, DRAM devices “3” and “4” in FIG. 1 have the shortest delay while DRAM devices “0” and “8” have the longest delay.
- the nominal timing of the clock and data strobes should be co-incident at the DRAM, but the DRAM specifications generally allow for some uncertainty such that the strobes are valid within a window around this nominal timing point.
- FIG. 2 shows a DDR-4 JEDEC compliant LRDIMM configured to communicate with a host computer system.
- LRDIMM 200 has 4 ranks of DRAM devices, which are shown as dual die DRAM packages 206 and 207 .
- the LRDIMM 200 includes data buffers (DB) 208 . While the temporal distribution of the DRAMs is similar to that of the DRAMS in the RDIMM 100 , the addition of the DBs 208 causes the temporal distribution at the “gold fingers” (i.e., the pins of the DIMM for connecting to the host computer system) to be very different.
- DB data buffers
- the LRDIMM 200 has a different delay characteristic from that of the RDIMM shown in FIG. 1 .
- FIGS. 4 and 5 illustrate the different timing characteristics between the RDIMM 100 and LRDIMM 200 .
- FIG. 3 illustrates a DDR-4 CPIO device implementing a DDR-4 JEDEC LRDIMM chipset (CPIO LRDIMM), according to one embodiment.
- the CPIO device 300 does not have DRAM devices. Instead, the CPIO device includes a CPIO ASIC 306 , a solid-state drive (SSD) controller 307 , and non-volatile memory (NVM) devices 309 .
- the CPIO ASIC 306 is centralized and placed near the RCD 305 and receives a clock signal that is similar in time to the closest DRAM devices of an RDIMM design.
- the trace lengths from the CPIO ASIC 306 to the DBs 308 are also similar to those between the RCD 305 to DB 308 .
- the function of a CPIO LRDIMM is not restricted to any particular application, but for the purpose of illustration here, the CPIO LRDIMM is shown as a non-volatile storage DIMM (i.e. a solid state disk drive).
- FIG. 4 illustrates an exemplary timing diagram for a read (or write) operation on an RDIMM.
- the timing diagram is exemplary, and as such, the actual clock frequency is not given and the read and write delays are not necessarily representative of a DDR-4 DRAM. The concept, however, is still valid and generally does not change with larger delays, although the figure would require more space to fit in the longer timeframe.
- FIG. 4 shows the input clock (CK) and command/address signals (CMD/ADDR) received from the host computer system at the gold fingers of the RDIMM.
- the output clock (Y) and signals (Q) of the RCD device are shown for the left side of the RDIMM shown in FIG. 1 .
- the timing concept for the right side is similar but is omitted for brevity.
- the Data Strobes (DQS 3 , DQS 0 ) show the nominal placement of the strobes at the DRAM devices aligned to the local clock.
- the uncertainty windows U[ 0 ] and U[ 3 ] illustrate that the actual strobes can be offset from the clock and maintain proper operation.
- FIG. 5 illustrates an exemplary timing diagram for a read operation on an LRDIMM.
- the timing at the DRAM is the same as that for the RDIMM shown in FIG. 4 .
- the timing of the data strobes at the gold fingers (GF_DQS 0 and GF_DQS 3 ) are delayed relative to the DRAM due to the propagation delay of the DBs.
- the delays are indicated by P[ 0 ] and P[ 3 ].
- the LRDIMM outputs the data to the host computer system later than an RDIMM would.
- FIG. 6 illustrates an exemplary timing diagram for a write operation on an LRDIMM.
- the timing at the DRAM is the same as that for the RDIMM shown in FIG. 4 .
- the timing of the data strobes at the gold fingers is different from that shown in FIG. 5 because, during a write operation, data is driven by the host computer system.
- the data received by the DRAM is now delayed by amounts indicated by P[ 3 ] and P[ 0 ] and the host computer system must drive the data strobes earlier in order to have the data arrive at the DRAM at the nominal time.
- the present application discloses a system and method for offsetting the timing of a CPIO LRDIMM such that it becomes compatible with the timing of an RDIMM. If the nominal timing of the signals at the gold fingers are equivalent, then an RDIMM and an LRDIMM can co-exist in a system without issue.
- FIG. 7 illustrates an exemplary timing diagram for a read operation on a CPIO LRDIMM, according to one embodiment.
- the presently disclosed system and method offsets the timing of the data strobes at the gold fingers (GF_DQS 3 and GF_DQS 0 ) to match the timing of the data strobes (DQS 3 and DQS 0 ) shown in FIG. 4 for an RDIMM.
- the propagation delay from the DRAM to the gold finger and from the DB to the gold finger is assumed to be the same and not shown in the diagram. Any small difference in practice can be accounted for in the design by a person of ordinarily skill in the art.
- the CPIO ASIC in order to offset the delay incurred by the DBs such that the timing of data strobes at the gold fingers (GF_DQS 3 and GF_DQS 0 ) matches that of the data strobes (DQS 3 and DQS 0 ) shown in FIG. 4 , the CPIO ASIC must launch the data strobe earlier. By launching the data strobes an amount of time P[ 3 ] and P[ 0 ] earlier, it allows the data strobes to propagate to the DB and then through the DB to arrive at the gold finger at around the same time as the data strobes DQS 3 and DQS 0 .
- the propagation delay through the DB “ 0 ” is indicated as P[ 0 ] and the board delay from DB “ 0 ” to the CPIO ASIC is indicated as BD[ 0 ].
- FIG. 8 illustrates an exemplary timing diagram for a write operation on a CPIO LRDIMM, according to one embodiment. Similar to the discussion regarding FIG. 7 , the presently disclosed system and method offsets the timing of the data strobes at the gold fingers (GF_DQS 3 and GF_DQS 0 ) to match the timing of the data strobes (DQS 3 and DQS 0 ) shown in FIG. 4 for an RDIMM. For a write operation, the data arrives at the CPIO ASIC later due to the propagation delay through the DBs and the board delay from the DBs to the CPIO ASIC.
- a CPIO LRDIMM is configured to control the data launch time for read operations and the data enable time for write operations.
- a memory controller is configured to control the data launch time for write operations and data enable time for read operations.
- a CPIO LRDIMM that has a CPIO ASIC that has independent timing control of each data strobe can move the data by a sufficient amount either forward or back in time (relative to nominal timing of an RDIMM at the gold fingers) such that a CPIO LRDIMM and a standard RDIMM have the same data strobe timing at the gold fingers.
- a host computer system implements both a CPIO LRDIMM and an RDIMM by performing memory channel training with modified training code.
- the host computer system's BIOS/UEFI code for performing memory training (Memory Reference Code (MRC)) is modified such that when a CPIO LRDIMM is detected (e.g., via the SPD), the host computer system's BIOS performs the standard LRDIMM training for the CPIO and the standard RDIMM training for any RDIMMs.
- the standard LRDIMM training may be to adjust the timing of the DB-to-DRAM interface for both reads and writes. In the case of a CPIO LRDIMM, the training would adjust the timing between the DBs and the CPIO ASIC.
- the CPIO ASIC may have its timing control loaded from non-volatile memory before MRC execution begins and the RCD/DBs would train as they would for an RDIMM.
- the MRC trains the host-to-DB side of the LRDIMMs in a manner similar to RDIMMs (which is how it currently works for LRDIMMs).
- the CPIO timing values are determined at the manufacturing stage of the CPIO LRDIMM. Given that the external timing (i.e., at the gold finger) for the DIMMs are correct by construction, the computer memory system works without issue.
- a host computer system implements both a CPIO LRDIMM and an RDIMM without modifying the host computer system's training code.
- the CPIO LRDIMM is declared as an RDIMM in the SPD and is trained by the host computer system as a normal RDIMM. This declaration means that the MRC code would not perform the LRDIMM training. Therefore, the LRDIMM training is performed at some other point (e.g., during manufacturing) and the appropriate values are stored in a non-volatile memory and written into the RCD and DBs prior to RDIMM training.
- the CPIO LRDIMM monitors the RCD Register Control Words (RCW) and DRAM Mode Register Set (MRS) operations and rewrite the RCD control words as appropriate (i.e. return it to LRDIMM operation). Because the CPIO LRDIMM uses the DDR-4 bus for control/communications, it is hence is privy to all register configuration actions and can rewrite the RCD registers whenever it is necessary
- the present application discloses exemplary processes for determining the CPIO and RCD/DB timing parameters during manufacturing. Variants of these processes are possible and contemplated for LRDIMM chipsets from different manufacturers due to differences in the design of the devices. If the modified-MRC method described above is used, only the CPIO timing parameters are pre-determined (e.g., during manufacturing). If the unmodified-MRC method is used, then both the CPIO and RCD/DB timing parameters must be pre-determined. In normal MRC training of an LRDIMM, the DRAM memory devices have fixed timing parameters so the RCD/DB adjusts to match those parameters.
- a methodology for calibrating the RCD/DB to the DRAM involves sweeping the timing parameters of the RCD/DB through its timing/state space and testing the communications path between DB and DRAM and then finding the optimal point for each nibble/byte lane at a given operating speed and for both reads and writes.
- a method for calibrating the CPIO ASIC involves sweeping the timing parameters of the CPIO ASIC through its timing/state space (while keeping the RCD/DB fixed). Recall from above that the gold finger side of the DB should output data strobes coincident with the rising clock edge and have data strobes arrive from the host coincident with the rising edge.
- the timing parameters for the given DBs are based on the propagation delay through each DB.
- the actual delay through each DB should be determined first. Once the values are determined, the values are stored in a non-volatile memory on the CPIO LRDIMM so that the values can be programmed into the CPIO ASIC and RCD/DB as required during boot.
- a method for calibrating the CPIO ASIC involves using a two-dimensional shmoo of the RCD/DB timings and the CPIO timings.
- this effectively determines the DB delays and optimal timings for the CPIO ASIC.
- the values are stored in a non-volatile memory on the CPIO LRDIMM so that the values can be programmed into the CPIO ASIC and RCD/DB as required during boot.
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US14/664,580 US9449651B2 (en) | 2014-03-21 | 2015-03-20 | System and method for offsetting the data buffer latency of a device implementing a JEDEC standard DDR-4 LRDIMM chipset |
US15/251,147 US20160371204A1 (en) | 2014-03-21 | 2016-08-30 | System and method for offsetting the data buffer latency of a device implementing a jedec standard ddr-4 lrdimm chipset |
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US201461968998P | 2014-03-21 | 2014-03-21 | |
US14/664,580 US9449651B2 (en) | 2014-03-21 | 2015-03-20 | System and method for offsetting the data buffer latency of a device implementing a JEDEC standard DDR-4 LRDIMM chipset |
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US15/251,147 Continuation US20160371204A1 (en) | 2014-03-21 | 2016-08-30 | System and method for offsetting the data buffer latency of a device implementing a jedec standard ddr-4 lrdimm chipset |
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US15/251,147 Abandoned US20160371204A1 (en) | 2014-03-21 | 2016-08-30 | System and method for offsetting the data buffer latency of a device implementing a jedec standard ddr-4 lrdimm chipset |
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Cited By (2)
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US10698781B2 (en) | 2017-11-08 | 2020-06-30 | Samsung Electronics Co., Ltd. | Semiconductor memory module, semiconductor memory system, and method of accessing semiconductor memory module |
US11226823B2 (en) | 2019-09-18 | 2022-01-18 | Samsung Electronics Co., Ltd. | Memory module and operating method thereof |
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US9830086B2 (en) | 2016-03-03 | 2017-11-28 | Samsung Electronics Co., Ltd. | Hybrid memory controller for arbitrating access to volatile and non-volatile memories in a hybrid memory group |
US10824348B2 (en) * | 2016-08-02 | 2020-11-03 | Samsung Electronics Co., Ltd. | Method of executing conditional data scrubbing inside a smart storage device |
US10789185B2 (en) | 2016-09-21 | 2020-09-29 | Rambus Inc. | Memory modules and systems with variable-width data ranks and configurable data-rank timing |
KR20180127710A (en) | 2017-05-22 | 2018-11-30 | 에스케이하이닉스 주식회사 | Memory module and memory system including the same |
US10776293B2 (en) * | 2018-05-01 | 2020-09-15 | Integrated Device Technology, Inc. | DDR5 RCD interface protocol and operation |
US10769082B2 (en) * | 2018-05-01 | 2020-09-08 | Integrated Device Technology, Inc. | DDR5 PMIC interface protocol and operation |
CN111694772A (en) * | 2019-03-11 | 2020-09-22 | 澜起科技股份有限公司 | Memory controller |
CN111679783A (en) * | 2019-03-11 | 2020-09-18 | 澜起科技股份有限公司 | Memory controller |
US12164791B2 (en) * | 2021-07-23 | 2024-12-10 | Micron Technology, Inc. | Initializing memory systems |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100070690A1 (en) * | 2008-09-15 | 2010-03-18 | Maher Amer | load reduction dual in-line memory module (lrdimm) and method for programming the same |
US20120204079A1 (en) * | 2011-02-08 | 2012-08-09 | Diablo Technologies Inc. | System and method of interfacing co-processors and input/output devices via a main memory system |
-
2015
- 2015-03-20 US US14/664,580 patent/US9449651B2/en active Active
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100070690A1 (en) * | 2008-09-15 | 2010-03-18 | Maher Amer | load reduction dual in-line memory module (lrdimm) and method for programming the same |
US20120204079A1 (en) * | 2011-02-08 | 2012-08-09 | Diablo Technologies Inc. | System and method of interfacing co-processors and input/output devices via a main memory system |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10698781B2 (en) | 2017-11-08 | 2020-06-30 | Samsung Electronics Co., Ltd. | Semiconductor memory module, semiconductor memory system, and method of accessing semiconductor memory module |
US11226823B2 (en) | 2019-09-18 | 2022-01-18 | Samsung Electronics Co., Ltd. | Memory module and operating method thereof |
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