US9201123B2 - Magnetic sensor device and a method for fabricating the same - Google Patents
Magnetic sensor device and a method for fabricating the same Download PDFInfo
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- US9201123B2 US9201123B2 US13/289,735 US201113289735A US9201123B2 US 9201123 B2 US9201123 B2 US 9201123B2 US 201113289735 A US201113289735 A US 201113289735A US 9201123 B2 US9201123 B2 US 9201123B2
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- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0047—Housings or packaging of magnetic sensors ; Holders
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- H—ELECTRICITY
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- H01F1/01—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials
- H01F1/03—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity
- H01F1/032—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials
- H01F1/04—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials metals or alloys
- H01F1/06—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials metals or alloys in the form of particles, e.g. powder
- H01F1/08—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials metals or alloys in the form of particles, e.g. powder pressed, sintered, or bound together
- H01F1/083—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials metals or alloys in the form of particles, e.g. powder pressed, sintered, or bound together in a bonding agent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
- H01F1/01—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials
- H01F1/03—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity
- H01F1/032—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials
- H01F1/10—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials non-metallic substances, e.g. ferrites, e.g. [(Ba,Sr)O(Fe2O3)6] ferrites with hexagonal structure
- H01F1/11—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials non-metallic substances, e.g. ferrites, e.g. [(Ba,Sr)O(Fe2O3)6] ferrites with hexagonal structure in the form of particles
- H01F1/113—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials non-metallic substances, e.g. ferrites, e.g. [(Ba,Sr)O(Fe2O3)6] ferrites with hexagonal structure in the form of particles in a bonding agent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
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- Y10T29/49002—Electrical device making
- Y10T29/49227—Insulator making
Definitions
- the present invention relates to a magnetic sensor device and a method for fabricating the same.
- Magnetic sensor devices can detect the motion of magnetic metal pieces and they can, for example, be configured to measure the speed of a magnetic tooth wheel.
- Such magnetic speed sensors typically include an integrated circuit with a plurality of magnetic sensor elements, such as Hall sensor elements or Magneto Resistive Sensors (XMR sensors) as, for example, AMR (anisotrope magneto resistive) sensors or giant magneto resistive (GMR) sensors.
- XMR sensors Magneto Resistive Sensors
- AMR anisotrope magneto resistive
- GMR giant magneto resistive
- a permanent magnet provides a bias magnetic field to the sensor elements.
- the teeth of the wheel pass in front of the sensor and generate a small field variation, which is detected by the sensor and processed by the integrated circuit.
- the detected field contains information about the angular position and rotational speed of the wheel.
- FIG. 1 shows a schematic cross-sectional side view representation of a magnetic sensor device according to an embodiment
- FIG. 2 shows a schematic cross-sectional side view representation of a magnetic sensor device according to an embodiment
- FIGS. 3A-3C show schematic cross-sectional side view representations of magnetic sensor devices according to embodiments
- FIGS. 4A-4C show schematic cross-sectional side view representations of magnetic sensor devices according to embodiments
- FIGS. 5A-5C show schematic cross-sectional side view representations of magnetic sensor devices according to embodiments
- FIG. 6 shows a schematic perspective representation of a magnetic sensor device according to an embodiment
- FIG. 7 shows a flow diagram for illustrating a method for fabricating a magnetic sensor device according to an embodiment
- FIG. 8 shows a flow diagram for illustrating a method for fabricating a magnetic sensor device according to an embodiment
- FIGS. 9A-9D show schematic top view and side view representations for illustrating a method for fabricating a magnetic sensor device according to an embodiment
- FIGS. 10A-10C show schematic cross-sectional side view representations of a method step for obtaining an intermediate product as shown in FIG. 10C according to an embodiment.
- layers or layer stacks are applied to one another or materials are applied or deposited onto layers or other substrates.
- any such terms as “applied” or “deposited” are meant to cover literally all kinds and techniques of applying layers or materials onto substrates. In particular, they are meant to cover techniques in which layers or materials are applied at once as a whole like, for example, laminating techniques as well as techniques in which layers or materials are deposited in a sequential manner like, for example, sputtering, plating, molding, CVD, etc.
- Embodiments as described herein comprise magnetic sensor chips.
- the magnetic sensor chips may comprise contact elements or contact pads on one or more of their outer surfaces wherein the contact elements serve for electrically contacting the magnetic sensor chips.
- the contact elements may have any desired form or shape. They can, for example, have the form of lands, i.e., flat contact layers on an outer surface of the semiconductor package.
- the contact elements or contact pads may be made from any electrically conducting material, e.g., from a metal as aluminum, gold, or copper, for example, or a metal alloy, or an electrically conducting organic material, or an electrically conducting semiconductor material.
- a magnetic sensor chip is used and intended for sensing a static or dynamic magnetic field.
- the magnetic sensor chip can be constructed in different ways and can work along different measurement principles.
- the magnetic sensor chip can, for example, comprise a Hall sensor element.
- the magnetic sensor chip can comprise a magneto resistive (XMR) element.
- XMR magneto resistive
- other implementations of a magnetic sensor chip can be employed by the skilled person.
- the magnetic sensor device 10 comprises a plurality of electrical wires 2 , a magnetic sensor chip 3 , and a magnet 1 , the magnet 1 being comprised of a material composition of a polymer and magnetic particles, the material composition being attached to at least one of the electrical wires 2 , in particular to all of the electrical wires 2 as shown in the embodiment of FIG. 1 .
- the material composition can be configured such that magnetic particles are coated with a polymer or polymer-based material, in particular with a thermoset polymer material and in particular such that the filling degree of magnetic particles is >>90%.
- the material composition can be configured such that a polymer or polymer-based material, in particular a thermoplast material, is filled with magnetic particles, in particular such that the filling degree of magnetic particles is ⁇ 90%, in particular 80-90%.
- the material composition is attached to the at least one of the electrical wires 2 in such a way that the at least one of the electrical wires extends through the material composition.
- the material composition is attached to the at least one of the electrical wires 2 in such a way that the at least one of the electrical wires 2 is completely embedded within the material composition along a line section of the at least one electrical wire 2 .
- the material composition is attached to the electrical wires 2 , in particular all electrical wires 2 of the plurality of electrical wires 2 are completely embedded within the material composition along respective line sections of the electrical wires 2 .
- the three electrical wires are completely embedded within the material composition along parallel respective line sections of the electrical wires 2 .
- Those line sections are indicated by dashed lines.
- the electrical wires 2 are embedded within the material composition in a different manner, i.e., the line sections may have different lengths or extensions which may be caused by a special shape of the magnet 1 . Embodiments thereof will be shown later.
- the magnetic sensor device 10 those electrical wires 2 , to which the material composition is attached, are covered by an electrically insulating layer along respective line sections thereof.
- the insulating layer comprises one or more of zinc-oxide, chromium-oxide, or a dielectric material or a tape material or the oxidized surface of the wire metal itself. An embodiment thereof will be shown and explained later.
- the zinc-oxide or chromium-oxide can be galvanically deposited.
- the magnetic sensor chip 3 is attached to one or more of the electrical wires 2 , in particular to a center electrical wire 2 . According to an embodiment thereof, it can be attached to an end face of one of the electrical wires 2 . According to an embodiment thereof, the end face can be part of an end portion of the electrical wire which is formed by one or more of forging or bending.
- the magnet 1 comprises a shape of a cube or cuboid.
- the magnet 1 comprises a shape which deviates from the shape of a cube or cuboid insofar as in a surface adjacent to the magnetic sensor chip 3 a depression is formed. With such a depression it is possible to provide a particular desired field distribution of the magnetic field generated by the magnet 1 . According to an embodiment thereof, the depression has a rectangular or a triangular cross-section. Respective embodiments will be shown later.
- the electrical wires 2 are fabricated out of a leadframe, in particular of a copper based leadframe.
- the electrical wires 2 can be part of a contiguous major leadframe which contains a plurality of single leadframes with electrical wires 2 and which is singulated during the fabrication process into single leadframes each one comprising one magnetic sensor device.
- the magnetic sensor chip 3 comprises a Hall sensor element or a magneto resistive (XMR) sensor element.
- the material composition of the magnet 1 comprises or consists of an epoxy resin or any other material which can be formed by molding or casting into any desired shape.
- the device further comprises one or more capacitors each one connected between two electrical wires 2 , respectively, or between a terminal of the magnetic sensor chip 3 and one electrical wire 2 , respectively.
- the capacitors are configured to provide an adequate protection against electrostatic discharge (ESD).
- the capacitors each comprise capacitance values within a range from 0.5 nF to 100 nF, more specifically 1 nF to 50 nF. Embodiments of a magnetic sensor device comprising such capacitors will be shown and explained later.
- the magnetic sensor chip 3 can be comprised of a silicon chip or silicon die.
- the magnetic sensor chip 3 can also be comprised of a package as, for example, a PSSO package which encloses the silicon chip or silicon die.
- FIG. 2 there is shown a schematic cross-sectional side view representation of a magnetic sensor device according to an embodiment.
- the magnetic sensor device 20 comprises a structure which is similar to the magnetic sensor device 10 of FIG. 1 .
- the same reference signs as were used in FIG. 1 for the several structural elements are also used in FIG. 2 , the description thereof will not be repeated here.
- the description thereof will not be repeated here. In the following only those structural elements of the magnetic sensor device 20 are described which were added to the embodiment of a magnetic sensor device as shown in FIG. 1 .
- the magnetic sensor device 20 of FIG. 2 further comprises an encapsulation material 4 which encapsulates the magnetic sensor chip 3 and covers end faces of electrical wires 2 other than the center electrical wire 2 and an upper surface of the magnet 1 .
- the encapsulation material 4 comprises or consists of one or more of a resin material, in particular an epoxy resin material, any sort of a material composition, or any sort of an UV curable material.
- the encapsulation material 4 can, for example, be applied by dip-coating.
- the encapsulation material 4 is applied only to an upper surface of the magnet 1 thereby embedding the magnetic sensor chip 3 and covering the end faces of the electrical wires 2 other than the center electrical wire 2 as shown in the embodiment of FIG. 2 .
- the encapsulation material 4 also completely encapsulates the magnet 1 according to an embodiment which will be shown and explained later.
- the magnetic sensor chip 3 is attached to the center electrical wire 2 and also electrically connected to one or more of the other electrical wires 2 by bond wires 5 .
- the bond wires 5 are also embedded within the encapsulation material 4 .
- the magnetic sensor chip 3 is itself comprised of a silicon chip. If, however, the magnetic sensor chip 3 is comprised of a package, the package may comprise external electrical contact areas and the package may be situated on all three electrical wires 2 thereby making electrical contact between the electrical wires 2 and the electrical contact areas of the package.
- the electrical wires 2 are coated or covered by an electrically insulating material along respective line sections (shown as hatched areas) within the magnet 1 in order to prevent an electrical short-circuit due to a possible electrical conductivity of the magnetic particles embedded within the polymer-based magnet 1 .
- the electrically insulating material can, for example, comprise one or more of zinc-oxide or chromium-oxide which can be galvanically deposited onto the surfaces of the electrical wires 2 along the mentioned line sections.
- the electrically insulating material can be comprised of any electrically insulating polymer-based material like any sort of resin, in particular, epoxy resin, or any sort of dielectric insulating material.
- the electrically insulating material can be provided by an electrically insulating tape material which is wound around the electrical wires 2 along the mentioned line sections within the magnet 1 .
- the electrically insulating material can be provided by an oxidized surface of the electrical wires.
- FIG. 2 Further embodiments of the magnetic sensor device 20 of FIG. 2 can be formed together with any one of the features and embodiments as described above in connection with the magnetic sensor device 10 of FIG. 1 .
- FIGS. 3A-3C there are shown schematic cross-sectional side view representations of further embodiments of magnetic sensor devices. Again only additions and alterations as compared to the magnetic sensor devices shown in FIGS. 1 and 2 , will be outlined in the following.
- FIG. 3A shows a magnetic sensor device 30 . 1 in which, as compared with the magnetic sensor device 20 of FIG. 2 , the encapsulation material 4 is disposed in such a way that the whole magnet 1 together with the magnetic sensor chip 3 and the upper end faces of the electrical wires 2 are embedded within the encapsulation material 4 .
- FIG. 3B shows a magnetic sensor device 30 . 2 having electrical wires 2 bent in a right corner at a position just before they penetrate into the magnet 1 .
- the electrical wires 2 are shown in a side view on a row of the electrical wires 2 so that only one of the electrical wires 2 is to be seen.
- FIG. 3C shows a magnetic sensor device 30 . 3 in which the electrical wires 2 penetrate the magnet 1 from a side wall so that the electrical wires 2 are bent inside the magnet 1 in a right angle towards the magnetic sensor chip 3 and the encapsulation material 4 .
- FIGS. 4A-4C show schematic cross-sectional side view representations of further embodiments of magnetic sensor devices. These further embodiments are intended to illustrate the various possibilities of shaping the permanent magnetic field generated by the magnet 1 .
- FIG. 4A shows a magnetic sensor device 40 . 1 formed in the same way as the magnetic sensor device 20 of FIG. 2 .
- the dotted lines show the field lines of the magnetic field generated by the magnet 1 .
- the magnet 1 has the shape of a cuboid having a rectangular cross-section with side faces a and b and a height c which is perpendicular to the plane of the sheet.
- FIG. 4B shows a magnetic sensor device 40 . 2 in which the magnet 1 is in principle formed in the same manner as in FIG.
- FIG. 4A shows a magnetic sensor device 40 . 3 in which the magnet 1 is also formed in principle in the same way as in FIG. 4A but wherein a depression is formed from the upper surface into the magnet 1 , the depression having a triangular cross-section.
- the field lines of the magnetic field are different from those of the embodiments of FIGS. 4A and 4B .
- FIGS. 5A-5C there are shown schematic cross-sectional side view representations of further embodiments of magnetic sensor devices. These further embodiments are intended to show how electro-static discharge (ESD) can be efficiently prevented within a magnetic sensor device.
- ESD electro-static discharge
- FIG. 5A shows a magnetic sensor device 50 . 1 comprising two capacitors 6 , each one connected between two electrical wires 2 .
- the capacitors 6 can, for example, be comprised of ceramic capacitors such as those of type X8R known by the skilled person.
- capacitors are typically constructed as SMD (Surface Mounted Device) devices which can, for example, be mounted to the electrical wires 2 by means of an electrically conductive adhesive.
- the capacitance values of the capacitors 6 are typically in a range from 0.5 nF and 100 nF, more specifically 1 nF-50 nF.
- one of the two capacitors 6 is connected between the center electrical wire 2 and the left-sided electrical wire 2 and the second one of the capacitors 6 is connected between the center electrical wire 2 and the right-sided electrical wire 2 .
- the capacitors 6 are connected to the electrical wires 2 at a position so that the magnet 1 is situated between the magnetic sensor chip 3 and the capacitors 6 .
- FIG. 5B shows a magnetic sensor device 50 .
- FIG. 5C shows a magnetic sensor device 50 . 3 in which the capacitors 6 are each one connected between an electrical terminal of the magnetic sensor chip 3 and one of the left-sided or right-sided electrical wires 2 . Each one of the capacitors 6 is also attached on an upper surface of one of the left-sided or right-sided electrical wires 2 .
- the magnetic sensor device 60 of FIG. 6 comprises three electrical wires 2 .
- the center electrical wire 2 comprises an end portion 2 . 11 which is formed by bending as will be shown later.
- the end portion 2 . 11 comprises an upper flat surface 2 . 11 A on which a magnetic sensor chip 3 is mounted.
- the upper surface 2 . 11 A of the end portion 2 . 11 comprises a surface area which is sufficiently large so that the magnetic sensor chip 3 can be safely placed there upon, which means that in practice the surface area of the surface 2 . 11 A is slightly larger than the lower surface of the magnetic sensor chip 3 .
- the magnetic sensor chip 3 comprises at its upper surface electrical contact pads each of which is connected by means of a bond wire 5 with one of the other electrical wires 2 .
- FIG. 7 there is shown a flow diagram for illustrating a method for fabricating a magnetic sensor device according to an embodiment.
- the method 70 of FIG. 7 comprises providing a plurality of the electrical wires ( 71 ), providing a magnetic sensor chip ( 72 ), and attaching a magnet to at least one of the electrical wires, the magnet comprising a material composition of a polymer and magnetic particles ( 73 ).
- the method further comprises molding a material composition of a polymer and magnetic or magnetizable particles to the at least one of the electrical wires, in particular molding it on or around the at least one of the electrical wires or more than one or all of the electrical wires.
- the material composition is molded in such a way to the electrical wires that the electrical wires are completely embedded within the material composition along the pre-determined line sections of the wires.
- the magnetizable particles of the material composition can be magnetized by means known in the art.
- the method further comprises covering those of the electrical wires to which the material composition is to be attached, with an electrically insulating layer along respective line sections thereof.
- the covering with an electrically insulating layer can, for example, be performed by galvanically depositing a zinc-oxide or a chromium-oxide layer onto the respective line sections of the electrical wires or oxidizing the respective line sections.
- the method further comprises providing the magnet with a shape of a cube or cuboid or with a shape deviating from a shape of a cube or cuboid insofar as in a surface adjacent to the magnetic sensor chip a depression is formed.
- the depression may comprise a rectangular or a triangular cross-section.
- the magnetic sensor chip is attached to an end face of at least one of the electrical wires.
- the method further comprises encapsulating the magnetic sensor chip with an encapsulation material.
- encapsulating with an encapsulation material can be performed by dipping the arrangement containing the magnetic sensor chip into a bath containing the encapsulation material in a liquid form.
- the encapsulation material can be made of an UV curable material so that in a following step the encapsulation material is exposed to UV radiation in order to be cured.
- the plurality of electrical wires is provided in the form of a leadframe.
- FIG. 7 Further embodiments of the method 70 of FIG. 7 can be formed with any one of the features or embodiments as were described above in connection with the embodiments of FIGS. 1 to 6 .
- the method 80 comprises providing a leadframe comprising a plurality of leadfingers ( 81 ), providing a magnetic sensor chip ( 82 ), and molding a material composition of a polymer and magnetic or magnetizable particles on or around at least one of the leadfingers ( 83 ).
- the method further comprises covering those of the leadfingers on or around which the material composition is to be molded, with an electrically insulating layer.
- the covering with an electrically insulating layer is performed by depositing, in particular galvanically depositing, a zinc-oxide layer or a chromium-oxide layer or oxidizing the leadfingers.
- the method further comprises molding the material composition to a shape of a cube or cuboid or to a shape deviating from a shape of a cube or cuboid insofar as in a surface adjacent to the magnetic sensor chip a depression is formed.
- the depression may comprise a rectangular or a triangular cross-section.
- the magnetic sensor chip is attached to an end face of at least one of the leadfingers.
- FIG. 8 Further embodiments of the method of FIG. 8 can be formed with any feature or embodiment as described above in connection with FIG. 7 .
- FIGS. 9A-9D there are shown schematic top view and side view representations for illustrating a method for fabricating a magnetic sensor device.
- FIG. 9A shows a top view representation of a major leadframe 100 which is sub-divided into six sections each containing a single leadframe 90 intended to become one magnetic sensor device.
- the single leadframes 90 are formed identical and comprise electrical wires 91 .
- On respective end portions of the electrical wires 91 a magnetic sensor chip 93 is attached.
- the magnetic sensor chip 93 can be in the form of a completely processed and packaged magnetic sensor chip.
- the magnetic sensor chip 93 can have the form of a PSSO packaged device.
- the single leadframes 90 are mounted within the major leadframe 100 in such a way that the electrical wires 91 are each divided into two parts, wherein one part, which is designated with the reference number 91 a (hatched), is provided with an insulation layer and the other part, which is designated with reference number 91 b , is left untreated.
- the insulation layer can be fabricated as described above, in particular by galvanically plating a zinc-oxide or a chromium-oxide layer.
- FIG. 9B shows the same arrangement after compression molding of a material composition 92 , in particular an epoxy coated magnet material, essentially onto the portions 91 a of each one of the single leadframes 90 .
- the material composition 92 comprises magnetizable particles embedded therein which are intended to be magnetized in a later step of the fabrication method.
- the compression molding can be performed by any standard process known by the skilled person.
- FIG. 9C shows a representation of the major leadframe 100 as shown in FIG. 9B after bending down the end portions of the single leadframes 90 together with the magnetic sensor chips 93 being carried by those end portions. Details of this process are shown in further detail in FIGS. 10A-10C .
- FIG. 10A shows a side view onto one row of single leadframes 90 of FIG. 9B .
- FIG. 10B shows the arrangement by additionally illustrating the direction of bending of the leadframe end portions by a broken curved arrow.
- FIG. 10C shows the arrangement after bending the leadframe end portions so that they come to rest on an upper surface of the magnet 92 . Following the step as shown in FIG.
- the major leadframe 100 may be divided into two halves each containing three single leadframes 90 and each one of the halves are dipped into a resin bath in order to encapsulate the magnetic sensor chips 93 with an encapsulation material consisting of an epoxy resin. Thereafter, the encapsulation material is exposed to UV radiation in order to be cured.
- an external magnetic field is applied in order to magnetize the magnetizable particles embedded in the material composition 92 .
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Abstract
Description
Claims (15)
Priority Applications (3)
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CN2012104345721A CN103090891A (en) | 2011-11-04 | 2012-11-02 | Magnetic Sensor Device And A Method For Fabricating The Same |
DE102012110488.3A DE102012110488B4 (en) | 2011-11-04 | 2012-11-02 | Magnetic sensor component and method for its production |
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US13/289,735 US9201123B2 (en) | 2011-11-04 | 2011-11-04 | Magnetic sensor device and a method for fabricating the same |
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Citations (39)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4743786A (en) | 1984-11-20 | 1988-05-10 | Kabushiki Kaisha Sg | Rotational position detection device |
US4899104A (en) * | 1986-11-18 | 1990-02-06 | Erich Luther | Adapter for a printed circuit board testing device |
US4945634A (en) | 1988-08-31 | 1990-08-07 | Murata Mfg. Co., Ltd. | Assembly packaging method for sensor elements |
JPH0366612A (en) | 1989-08-04 | 1991-03-22 | Sato Seiyaku Kk | Ointment in mouth |
US5210493A (en) | 1992-02-27 | 1993-05-11 | General Motors Corporation | Method for embedding wires within a powder metal core and sensor assembly produced by such a method |
US5508611A (en) * | 1994-04-25 | 1996-04-16 | General Motors Corporation | Ultrathin magnetoresistive sensor package |
US5581179A (en) * | 1995-05-31 | 1996-12-03 | Allegro Microsystems, Inc. | Hall-effect ferrous-article-proximity sensor assembly |
JPH0979865A (en) | 1995-09-11 | 1997-03-28 | Denso Corp | Magnetic detecting sensor |
US5963028A (en) * | 1997-08-19 | 1999-10-05 | Allegro Microsystems, Inc. | Package for a magnetic field sensing device |
US6175229B1 (en) * | 1999-03-09 | 2001-01-16 | Eaton Corporation | Electrical current sensing apparatus |
US6505513B1 (en) | 1999-01-21 | 2003-01-14 | Koninklijke Philips Electronics N.V. | Arrangement for measuring rotational velocity |
US20030183954A1 (en) * | 2002-03-15 | 2003-10-02 | Wolf Ronald J. | Magnetic resin composition and method of processing |
US20040080046A1 (en) | 2002-10-29 | 2004-04-29 | Lee Choon Kuan | Semiconductor package having multi-layer leadframe and method of fabrication |
US6933716B2 (en) * | 2003-11-25 | 2005-08-23 | Wolff Controls Corporation | Minimized cross-section sensor package |
CN1737503A (en) | 2004-08-19 | 2006-02-22 | 株式会社电装 | Magnetic sensor device having components mounted on magnet |
US20070018642A1 (en) * | 2003-03-03 | 2007-01-25 | Denso Corporation | Magnetic sensor |
US20070075705A1 (en) * | 2005-09-30 | 2007-04-05 | Denso Corporation | Detector having sensor chip and biasing magnet |
US20070120555A1 (en) * | 2005-11-28 | 2007-05-31 | Denso Corporation | Magnetic sensor |
US20070145972A1 (en) | 2005-06-15 | 2007-06-28 | Albert Auburger | Integrated magnetic sensor component |
US20070164734A1 (en) * | 2006-01-18 | 2007-07-19 | Alps Electric Co., Ltd. | GMR angle sensor for vehicles |
US20070188277A1 (en) | 2004-03-03 | 2007-08-16 | Bsh Bosch Und Siemens Hausgerate Gmbh | Linear drive device provided with an armature body having a magnet carrier |
US20070205094A1 (en) * | 2004-03-31 | 2007-09-06 | Federico Pavan | Method And Apparatus For Producing A Metal Wire Coated With A Layer Of Metal Alloy |
US20070241423A1 (en) | 2006-04-14 | 2007-10-18 | Taylor William P | Methods and apparatus for integrated circuit having multiple dies with at least one on chip capacitor |
US20070247144A1 (en) * | 2004-11-02 | 2007-10-25 | Denso Corporation | Rotation detecting device |
US20090065912A1 (en) | 2006-05-10 | 2009-03-12 | Infineon Technologies Ag | Semiconductor Package and Method of Assembling a Semiconductor Package |
US20090096441A1 (en) * | 2007-10-10 | 2009-04-16 | Jtekt Corporation | Sensor-equipped rolling bearing apparatus |
US20090140724A1 (en) * | 2007-11-21 | 2009-06-04 | Micronas Gmbh | Magnetic Field Sensor Assembly |
US20090140725A1 (en) | 2007-12-04 | 2009-06-04 | Infineon Technologies Ag | Integrated circuit including sensor having injection molded magnetic material |
US20090243595A1 (en) | 2008-03-27 | 2009-10-01 | Horst Theuss | Sensor module with mold encapsulation for applying a bias magnetic field |
CN101617243A (en) | 2007-02-19 | 2009-12-30 | Nxp股份有限公司 | Sensor package |
CN101656242A (en) | 2004-09-10 | 2010-02-24 | 雅马哈株式会社 | Lead frame for physical quantity sensor, and manufacturing method therefor |
CN101681894A (en) | 2007-03-29 | 2010-03-24 | 阿莱戈微系统公司 | The multi-stage molding method and apparatus that is used for ic package |
US20100201356A1 (en) * | 2009-02-11 | 2010-08-12 | Infineon Technologies Ag | Sensor |
US20110127998A1 (en) | 2009-11-30 | 2011-06-02 | Infineon Technologies Ag | Gmr sensor within molded magnetic material employing non-magnetic spacer |
US20110133732A1 (en) | 2009-12-03 | 2011-06-09 | Allegro Microsystems, Inc. | Methods and apparatus for enhanced frequency response of magnetic sensors |
US20110209894A1 (en) | 2010-02-26 | 2011-09-01 | United States Of America As Represented By The Administrator Of The National Aeronautics | Electrically Conductive Composite Material |
US20120038352A1 (en) | 2010-08-16 | 2012-02-16 | Klaus Elian | Sensor Package and Method of Manufacturing Thereof |
US20120086444A1 (en) | 2010-10-08 | 2012-04-12 | Allegro Microsystems, Inc | Apparatus and Method for Reducing a Transient Signal in a Magnetic Field Sensor |
US8357566B2 (en) * | 2006-08-25 | 2013-01-22 | Micron Technology, Inc. | Pre-encapsulated lead frames for microelectronic device packages, and associated methods |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09166612A (en) * | 1995-12-18 | 1997-06-24 | Nissan Motor Co Ltd | Magnetic sensor |
-
2011
- 2011-11-04 US US13/289,735 patent/US9201123B2/en active Active
-
2012
- 2012-11-02 CN CN2012104345721A patent/CN103090891A/en active Pending
- 2012-11-02 DE DE102012110488.3A patent/DE102012110488B4/en not_active Expired - Fee Related
Patent Citations (47)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4743786A (en) | 1984-11-20 | 1988-05-10 | Kabushiki Kaisha Sg | Rotational position detection device |
US4899104A (en) * | 1986-11-18 | 1990-02-06 | Erich Luther | Adapter for a printed circuit board testing device |
US4945634A (en) | 1988-08-31 | 1990-08-07 | Murata Mfg. Co., Ltd. | Assembly packaging method for sensor elements |
JPH0366612A (en) | 1989-08-04 | 1991-03-22 | Sato Seiyaku Kk | Ointment in mouth |
US5210493A (en) | 1992-02-27 | 1993-05-11 | General Motors Corporation | Method for embedding wires within a powder metal core and sensor assembly produced by such a method |
US5508611A (en) * | 1994-04-25 | 1996-04-16 | General Motors Corporation | Ultrathin magnetoresistive sensor package |
US5581179A (en) * | 1995-05-31 | 1996-12-03 | Allegro Microsystems, Inc. | Hall-effect ferrous-article-proximity sensor assembly |
JPH0979865A (en) | 1995-09-11 | 1997-03-28 | Denso Corp | Magnetic detecting sensor |
US5963028A (en) * | 1997-08-19 | 1999-10-05 | Allegro Microsystems, Inc. | Package for a magnetic field sensing device |
US6505513B1 (en) | 1999-01-21 | 2003-01-14 | Koninklijke Philips Electronics N.V. | Arrangement for measuring rotational velocity |
US6175229B1 (en) * | 1999-03-09 | 2001-01-16 | Eaton Corporation | Electrical current sensing apparatus |
US20030183954A1 (en) * | 2002-03-15 | 2003-10-02 | Wolf Ronald J. | Magnetic resin composition and method of processing |
US20040080046A1 (en) | 2002-10-29 | 2004-04-29 | Lee Choon Kuan | Semiconductor package having multi-layer leadframe and method of fabrication |
US20070018642A1 (en) * | 2003-03-03 | 2007-01-25 | Denso Corporation | Magnetic sensor |
US6933716B2 (en) * | 2003-11-25 | 2005-08-23 | Wolff Controls Corporation | Minimized cross-section sensor package |
US20070188277A1 (en) | 2004-03-03 | 2007-08-16 | Bsh Bosch Und Siemens Hausgerate Gmbh | Linear drive device provided with an armature body having a magnet carrier |
US20070205094A1 (en) * | 2004-03-31 | 2007-09-06 | Federico Pavan | Method And Apparatus For Producing A Metal Wire Coated With A Layer Of Metal Alloy |
US20060038560A1 (en) | 2004-08-19 | 2006-02-23 | Denso Corporation | Magnetic sensor device having components mounted on magnet |
CN1737503A (en) | 2004-08-19 | 2006-02-22 | 株式会社电装 | Magnetic sensor device having components mounted on magnet |
US20080061768A1 (en) * | 2004-08-19 | 2008-03-13 | Denso Corporation | Magnetic sensor device having components mounted on magnet |
CN101656242A (en) | 2004-09-10 | 2010-02-24 | 雅马哈株式会社 | Lead frame for physical quantity sensor, and manufacturing method therefor |
US20070247144A1 (en) * | 2004-11-02 | 2007-10-25 | Denso Corporation | Rotation detecting device |
US20070145972A1 (en) | 2005-06-15 | 2007-06-28 | Albert Auburger | Integrated magnetic sensor component |
US7385394B2 (en) * | 2005-06-15 | 2008-06-10 | Infineon Technologies Ag | Integrated magnetic sensor component |
US20070075705A1 (en) * | 2005-09-30 | 2007-04-05 | Denso Corporation | Detector having sensor chip and biasing magnet |
US20070120555A1 (en) * | 2005-11-28 | 2007-05-31 | Denso Corporation | Magnetic sensor |
US20070164734A1 (en) * | 2006-01-18 | 2007-07-19 | Alps Electric Co., Ltd. | GMR angle sensor for vehicles |
US20070241423A1 (en) | 2006-04-14 | 2007-10-18 | Taylor William P | Methods and apparatus for integrated circuit having multiple dies with at least one on chip capacitor |
US20090065912A1 (en) | 2006-05-10 | 2009-03-12 | Infineon Technologies Ag | Semiconductor Package and Method of Assembling a Semiconductor Package |
US20130127027A1 (en) * | 2006-08-25 | 2013-05-23 | Micron Technology, Inc. | Pre-encapsulated lead frames for microelectronic device packages, and associated methods |
US8357566B2 (en) * | 2006-08-25 | 2013-01-22 | Micron Technology, Inc. | Pre-encapsulated lead frames for microelectronic device packages, and associated methods |
CN101617243A (en) | 2007-02-19 | 2009-12-30 | Nxp股份有限公司 | Sensor package |
US20100117171A1 (en) | 2007-02-19 | 2010-05-13 | Nxp, B.V. | Sensor package |
US20100330708A1 (en) | 2007-03-29 | 2010-12-30 | Allegro Microsystems, Inc. | Methods for multi-stage molding of integrated circuit package |
CN101681894A (en) | 2007-03-29 | 2010-03-24 | 阿莱戈微系统公司 | The multi-stage molding method and apparatus that is used for ic package |
US20090096441A1 (en) * | 2007-10-10 | 2009-04-16 | Jtekt Corporation | Sensor-equipped rolling bearing apparatus |
US20090140724A1 (en) * | 2007-11-21 | 2009-06-04 | Micronas Gmbh | Magnetic Field Sensor Assembly |
DE102008058895A1 (en) | 2007-12-04 | 2009-06-25 | Infineon Technologies Ag | Integrated circuit comprising a sensor with injection molded magnetic material |
US20090140725A1 (en) | 2007-12-04 | 2009-06-04 | Infineon Technologies Ag | Integrated circuit including sensor having injection molded magnetic material |
DE102009013510A1 (en) | 2008-03-27 | 2009-10-08 | Infineon Technologies Ag | Sensor module with cast encapsulation for applying a bias magnetic field |
US20090243595A1 (en) | 2008-03-27 | 2009-10-01 | Horst Theuss | Sensor module with mold encapsulation for applying a bias magnetic field |
US20100201356A1 (en) * | 2009-02-11 | 2010-08-12 | Infineon Technologies Ag | Sensor |
US20110127998A1 (en) | 2009-11-30 | 2011-06-02 | Infineon Technologies Ag | Gmr sensor within molded magnetic material employing non-magnetic spacer |
US20110133732A1 (en) | 2009-12-03 | 2011-06-09 | Allegro Microsystems, Inc. | Methods and apparatus for enhanced frequency response of magnetic sensors |
US20110209894A1 (en) | 2010-02-26 | 2011-09-01 | United States Of America As Represented By The Administrator Of The National Aeronautics | Electrically Conductive Composite Material |
US20120038352A1 (en) | 2010-08-16 | 2012-02-16 | Klaus Elian | Sensor Package and Method of Manufacturing Thereof |
US20120086444A1 (en) | 2010-10-08 | 2012-04-12 | Allegro Microsystems, Inc | Apparatus and Method for Reducing a Transient Signal in a Magnetic Field Sensor |
Non-Patent Citations (1)
Title |
---|
Hung, Y.C., et al., "Effects of Additives on the Orientation and Strength of Plastic Ferrite Magnet," IEEE Transactions on Magnetics, Sep. 1989, pp. 3287-3289, vol. 25, No. 5. |
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US10254103B2 (en) | 2013-07-19 | 2019-04-09 | Allegro Microsystems, Llc | Arrangements for magnetic field sensors that act as tooth detectors |
US9810519B2 (en) | 2013-07-19 | 2017-11-07 | Allegro Microsystems, Llc | Arrangements for magnetic field sensors that act as tooth detectors |
US10145908B2 (en) | 2013-07-19 | 2018-12-04 | Allegro Microsystems, Llc | Method and apparatus for magnetic sensor producing a changing magnetic field |
US20150187623A1 (en) * | 2013-12-31 | 2015-07-02 | Sensata Technologies (Changzhou) Co., Ltd. | Positioning frame structure |
US9564351B2 (en) * | 2013-12-31 | 2017-02-07 | Sensata Technologies, Inc. | Positioning frame structure |
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US20130113475A1 (en) | 2013-05-09 |
DE102012110488B4 (en) | 2018-02-22 |
CN103090891A (en) | 2013-05-08 |
DE102012110488A1 (en) | 2013-05-08 |
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