US8116409B1 - Method and apparatus for SerDes jitter tolerance improvement - Google Patents
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- US8116409B1 US8116409B1 US12/361,436 US36143609A US8116409B1 US 8116409 B1 US8116409 B1 US 8116409B1 US 36143609 A US36143609 A US 36143609A US 8116409 B1 US8116409 B1 US 8116409B1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L25/00—Baseband systems
- H04L25/38—Synchronous or start-stop systems, e.g. for Baudot code
- H04L25/40—Transmitting circuits; Receiving circuits
- H04L25/49—Transmitting circuits; Receiving circuits using code conversion at the transmitter; using predistortion; using insertion of idle bits for obtaining a desired frequency spectrum; using three or more amplitude levels ; Baseband coding techniques specific to data transmission systems
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L7/00—Arrangements for synchronising receiver with transmitter
- H04L7/02—Speed or phase control by the received code signals, the signals containing no special synchronisation information
- H04L7/033—Speed or phase control by the received code signals, the signals containing no special synchronisation information using the transitions of the received signal to control the phase of the synchronising-signal-generating means, e.g. using a phase-locked loop
- H04L7/0337—Selecting between two or more discretely delayed clocks or selecting between two or more discretely delayed received code signals
Definitions
- the invention generally relates to electronics, and in particular, to non-return-to-zero (NRZ) serializer-deserializer (SerDes) communication devices.
- NRZ non-return-to-zero
- SerDes serializer-deserializer
- jitter In SerDes communication, one of the primary design considerations is the tolerance of the receiver to jitter. This jitter can take many forms: random with Gaussian distribution, bounded uncorrelated, bounded correlated, sinusoidal, duty cycle distortion, etc.
- a receiver that is more tolerant to jitter has a great advantage as the SerDes link can then operate over greater distances and/or over poorer channels.
- Equalization can be performed in the analog domain, or in the digital domain following sampling of the received signal with an Analog-to-Digital Converter (ADC). Equalization can be linear or non-linear in nature. Using equalization, data correlated impairments are reduced, providing more tolerance to jitter. Examples can be found in, for example, U.S. Pat. Nos. 6,088,415; 5,452,333; and 6,765,975.
- ISI Inter-Symbol Interference
- DDJ Data Dependent Jitter
- ISI is the result of a low-pass frequency response of the transmission channel medium. That is, the low frequency portion of the transmitted waveform is more easily passed, while the higher frequency portion of the transmitted waveform tends to be attenuated in amplitude.
- the impact on the transmitted “eye” of the signal is well known. Typically, horizontal and vertical opening of the “eye” becomes smaller with increasing levels of ISI.
- FIG. 1 illustrates two different exemplary eye diagrams. Both diagrams show eight different signal path trajectories, corresponding to the eight possible combinations of three sequential binary digits: 000, 001, 010, 011, 100, 101, 110, 111.
- the first eye diagram depicts an ideal case, in which the eye is maximally open in both the vertical and horizontal direction. In this case, there is no ISI and the eight different trajectories are hard to differentiate.
- the second eye diagram depicts the case in which significant ISI has distorted the signal and the eight different signal trajectories are clearly visible. Also, in both eye diagrams, the eye opening is shown by a diamond. Clearly, the eye opening in the ideal case is larger.
- the timing of the data decision moment can be offset from ideal by as much as one-half the baud period before a data decision error is made.
- the amount of offset from ideal that can be tolerated is less than one-half of a baud period. This reduction results in a reduction of the jitter tolerance.
- FIG. 2 and FIG. 3 illustrate the operation of a conventional asynchronous SerDes receiver. Numerous variations exist for this basic structure; however, this basic structure will serve to illustrate the problem at hand.
- the receiver samples the received NRZ waveform multiple times per baud period using a 1-bit ADC (that is, a “slicer”) 202 .
- the sampling rate provided by the sample clock is approximately equal to an integer multiple of the baud rate.
- N consecutive samples are collected and output by the SIPO (Serial In, Parallel Out) block 204 at a correspondingly lower rate.
- a lower rate clock signal is also provided by a divide by N block 210 , which divides the sample clock by N.
- the Sample Selection block 206 selects and outputs the 1-bit sample corresponding to the center of the baud period and the sample offset from this sample by 1 ⁇ 2 of the baud period.
- the first 1-bit sample is the recovered NRZ data bit.
- the second 1-bit sample helps with timing recovery, for example, when using the Gardner algorithm.
- the Timing Control block 208 which implements the Gardner algorithm or other suitable timing recovery technique, is responsible for determining the correct timing and communicating to the Sample Selection block 206 which samples to select. Due to the asynchronous nature of the receiver, it is possible that some sample groups do not contain a data sample while other sample groups contain two data samples. These are issues familiar to those knowledgeable in the art and do not need to be discussed in detail.
- FIG. 3 illustrates the signal sampling process and the selection of the Data sample and the additional sample for timing control purposes.
- samples of the received waveform are taken at a frequency that is 8 times the approximate baud rate. That is, there are approximately 8 samples per baud.
- a “1” is output by the slicer 202 ( FIG. 2 ).
- a “0” is output by the slicer 202 .
- Eight consecutive samples are grouped by the SIPO block 204 . Of these eight samples, one sample is identified to be the timing sample 220 ( FIG. 2 ) and one sample is identified to be the data sample 222 ( FIG. 2 ).
- the selection of the data sample 222 is very simple and is sensitive to the problem with isolated pulses described earlier.
- the invention described herein improves the recovery of the data by exploiting the additional signal samples surrounding the Data Sample.
- Disclosed techniques improve the jitter tolerance of a SerDes receiver for links that suffer from various sources of Deterministic Jitter (DJ), including Duty Cycle Distortion (DCD), and Inter-Symbol Interference (ISI).
- DJ Deterministic Jitter
- DCD Duty Cycle Distortion
- ISI Inter-Symbol Interference
- the improvement in jitter tolerance is achieved by detecting the presence of isolated pulses (for example, a “1” pulse preceded and followed by “0” pulses, or a “0” pulse preceded and followed by a “1” pulse). Very often, these isolated pulses have a narrow pulse width and, under severe jitter conditions, the isolated pulse may not align with the baud sample point, thus the pulse is missed and a data decoding error occurs. By detecting the presence of these isolated pulses and determining the most likely baud period to which they belong, jitter tolerance can be improved for many channel conditions.
- isolated pulses for example, a “1” pulse preceded and followed by “0” pulses, or a “0” pulse preceded and followed by a “1” pulse.
- One advantage of the technique is that implementation does not require complex equalization of the received signal and is very simple to implement.
- an isolated pulse is defined as the received waveform occurring when a single bit of a given polarity is preceded and followed by one or more bits of opposite polarity. Examples of such bit patterns containing isolated pulses are: 010, 101, 00100, 1101011, etc. Note that the pattern 001100 does not contain an isolated pulse as defined herein.
- each sample needs only to be a 1-bit sample as provided by a simple slicer.
- timing recovery and data recovery are performed in the digital domain, these requirements are satisfied.
- the disclosed technique provides a simple and easy to implement upgrade of the basic receiver.
- the disclosed technique is referred to as the Isolated Pulse Detector (IPD). Jitter tolerance is always a critical concern for SerDes devices.
- the Isolated Pulse Detector is a simple to implement technique that can provide a significant improvement in jitter tolerance with a minimal amount of digital circuitry. The simplicity of the technique means that the additional circuit area and power consumption are kept relatively small while providing significant improvement in jitter tolerance in many SerDes applications.
- FIG. 1 illustrates two different exemplary eye diagrams.
- FIG. 2 illustrates a conventional asynchronous SerDes receiver.
- FIG. 3 illustrates the operation of a conventional asynchronous SerDes receiver.
- FIG. 4 illustrates an asynchronous SerDes receiver according to an embodiment of the invention.
- FIG. 5 is a flowchart that generally illustrates a process that detects an isolated pulse and adjusts the value of a data sample in response to the detection.
- FIG. 6 illustrates the operation of one embodiment of the SerDes receiver.
- FIG. 7 illustrates an embodiment of an Isolated Pulse Detector.
- FIG. 4 illustrates the receiver of FIG. 2 as modified to incorporate an Isolated Pulse Detector 402 .
- the slicer 202 both samples and slices the received signal 406 .
- samples 404 of the received signal 406 are collected into groups of N signal samples 408 using the 1:N SIPO block 204 .
- the parameter N defines the approximate number of samples made per baud interval.
- a data sample 222 is selected per N signal samples 408 , but occasionally, a data sample 222 will not be selected from a group of N signal samples 408 , and occasionally, two data samples 222 will be selected from a group of N signal samples 408 , depending on the asynchronous relationship between the local sample clock 410 and the baud rate of the received signal 406 .
- an Isolated Pulse occurs when two consecutive data samples 222 have the same value and there exist at least a threshold number of samples 404 between the samples selected as the two data samples 222 that have opposite value to the two data samples 221 .
- the value of this threshold can be as low as 1.
- the threshold is set to 1, the IPD 402 will be able to detect very narrow pulses, at the expense of being more susceptible to noise. In the presence of noise, there is a finite probability that a single sample will have opposite value even when an isolated pulse is not present. Using larger values for the threshold will typically reduce sensitivity to noise, but will typically also make it more difficult to detect very narrow pulses.
- FIG. 5 is a flowchart that generally illustrates a process for detection of an isolated pulse. It will be appreciated by the skilled practitioner that the illustrated process can be modified in a variety of ways. For example, in another embodiment, various portions of the illustrated process can be combined, can be rearranged in an alternate sequence, can be removed, or the like.
- sample data has already been collected and that, preliminarily, values for “raw” data samples have been identified for the current baud interval and the previous baud interval.
- Raw data samples correspond to the previous data sample 604 ( FIG. 6 ) and to the current data sample 606 ( FIG. 6 ) before possible correction by disclosed techniques.
- the process starts at a decision block 502 to determine whether the current raw data sample of the current baud interval has the same value as the previous raw data sample of the previous baud interval. If the raw data samples do not have the same raw values, the process proceeds to return 504 to the start of the process to analyze data for the next baud interval, and no modification of the raw data samples occurs. In a real-time system, the process may wait for additional data to be collected. In a system with stored data, the next set of data may be retrieved.
- the process proceeds from the decision block 502 to a decision block 506 to determine if an isolated pulse exists between the raw data samples.
- the process counts the number of samples between the data samples that have the opposite value to the value of the data samples, and then compares the count to a threshold.
- the value for the threshold can be one or more. An appropriate threshold value to use will be readily determined by one of ordinary skill in the art. If the count is less than the threshold, the process proceeds to return 504 to the start of the process to analyze data for the next baud interval, and no modification of the raw data samples occurs. If the count is greater than or equal to the threshold, the process proceeds from the decision block 506 to the decision block 508 .
- the process determines whether or not the isolated pulse is closer to the current data sample 606 ( FIG. 6 ) or to the previous data sample 604 ( FIG. 6 ). For example, the process can determine an average distance for the isolated pulse from the samples of the current data sample 606 and the previous data sample 604 . Other techniques, such as a count of the space, if any, between the isolated pulse and the previous data sample 604 and between the isolated pulse and the current data sample 606 , can be used.
- the value of the previous data sample 604 is changed 510 and the value of the current data sample 606 is left unchanged.
- the value of the current data sample 606 is changed 512 and the value of the previous data sample is left unchanged.
- the process can arbitrarily change the value of one and not the other. In one embodiment, the process changes 514 the value of the previous data sample 604 when the isolated pulse has a “0” value and changes the value of the current data sample 606 when the isolated pulse has a “1” value. Other choices can apply to the equidistant case.
- the process then returns 504 from the states 510 , 512 , 514 to the start of the process to analyze data for the next baud interval.
- FIG. 6 illustrates an example of the detection of an isolated pulse.
- an isolated pulse 602 is present, but due to timing error, both the previous data sample 604 and the current data sample 606 have a value of “0”. Between these two samples 604 , 606 , there are a total of 6 samples that have a value of “1”. If the count of 6 exceeds a defined threshold, then an Isolated Pulse 602 is deemed to have been detected. Further examination of the opposite-valued samples 602 reveals that they 602 are closer to the previous data sample 604 than they 602 are to the current data sample 606 . Therefore, the slicer-determined value of the previous data sample 604 is over-written with a “1”. Thus, an isolated pulse is detected, despite the timing error.
- FIG. 7 illustrates a detailed implementation of an isolated pulse detector (IPD) 402 , which is consistent with an embodiment of the logic flowchart described earlier in connection with FIG. 5 and uses a threshold value of 1.
- the IPD 402 is provided with blocks of 9 samples D[8:0].
- Sample D0 is the baud aligned raw sample of the previous baud, also known as the previous data sample 604 ( FIG. 6 ).
- Sample D8 is the baud aligned raw sample of the current baud or current data sample 606 ( FIG. 6 ), and D1 to D7 are the 7 raw samples between the two baud aligned samples D0 604 , D8 606 .
- the illustrated system has 8 samples per baud, but can be readily modified by one of ordinary skill in the art to support other sampling rates.
- the sample selection block 206 ( FIG. 4 ) provides the sample data to the IPD 402 .
- the illustrated embodiment uses a threshold value of 1 for detection of an isolated pulse.
- Equation P0 indicates a logical OR
- ⁇ indicates a logical AND
- ” indicates logical inversion.
- the presence of an isolated pulse is detected using Boolean logic 702 as expressed in equations P0 and P1.
- Equation P0 is true when there is a false anywhere between D1 and D7, inclusive, and both D0 and D8 are true, so that Equation P0 detects an isolated “low” pulse.
- Equation P1 is true when there is a true anywhere between D1 and D7, inclusive, and both D0 and D8 are false, so that Equation P1 detects an isolated “high” pulse.
- the output s of a count circuit 706 is true when the number of ones in data bits D1 to D3 is higher than the number of ones in data bits D5 to D7 and is false otherwise, and is used to determine whether the detected pulse should be assigned to the previous or current baud interval.
- the output “IP_Bit” is the output of Equation P1 and is the actual value of the detected isolated pulse, when such a pulse is detected (Equation P1 or Equation P0 being true).
- Boolean logic 708 , 710 generate outputs FP and FC.
- the output FP “Force Previous” (Equation FP) and the output “Force Current” (Equation FC) indicate to which baud symbol the value of the isolated pulse is being assigned.
- the illustrated IPD 402 assigns the detected isolated pulse to the previous data sample when the isolated pulse has a “0” value and to the current data sample when the isolated pulse has a “1” value.
- the Isolated Pulse Detector 402 was described in a context in which the raw samples 404 of the received signal 406 were collected into groups of N signal samples 408 in which N is the number of samples taken per baud period.
- the Isolated Pulse Detector 402 thus operated at a rate approximately equal to the baud rate of the received signal. For very high SerDes data rates, clocking the digital circuitry at the baud rate can become challenging.
- the architecture of the basic asynchronous receiver and the Isolated Pulse Detector enhancement can be extended to process multiple baud periods of samples simultaneously or in parallel.
- the sampling rate is approximately 12 times the baud rate (that is, approximately 12 samples per baud period).
- the samples can be collected in groups of 96 samples representing 8 baud periods of data.
- the digital circuitry is expanded to simultaneously extract 8 Data Samples using parallel circuitry. This parallel circuitry will also contain multiple copies of the Isolated Pulse Detector. Although the size of the paralleled digital circuitry will increase, the clock rate for the circuitry will similarly decrease, which typically makes the circuit more practical to implement for high-speed signals.
- the sampling process was represented by a single slicer 202 .
- a circuit can use 12 slicers with each slicer clocked at about the baud rate instead of a single slicer being clocked at about 12 times the baud rate.
- the illustrated Isolated Pulse Detector 402 uses a threshold value for the number of opposite valued samples that had to be detected before asserting the presence of an isolated pulse.
- a lower threshold value allows for the detection of narrower pulses, but at the expense of greater sensitivity to false detection in the presence of noise.
- There are other techniques that can be used to condition the samples to reduce noise sensitivity For example, the raw data can be conditioned with a simple 3-tap majority filter prior to processing with the above-described circuitry. This filter can effectively remove all occurrences of a single sample noise glitch and greatly improve the tolerance of the Isolated Pulse Detector 402 to noise.
- the 3-tap majority filter can be implemented in a variety of locations prior to the input of the Isolated Pulse Detector 402 , such as at the output of the slicer 202 to filter samples 404 , at the output of the SIPO 204 , or at the output of the sample selection block 206 .
- the majority filter is used applied to the samples 404 and a threshold value of 1 is then applied to the filtered samples for the isolated pulse detector 402 .
- the digital circuitry described herein is implemented in CMOS using synthesizable register transfer level (RTL) constructs.
- RTL register transfer level
- Instantiation in CMOS provides for a low power implementation.
- Use of synthesizable RTL constructs allows for easy re-use and porting of the design to other applications and silicon processes.
- circuitry and techniques can be implemented in a variety of technologies including FPGAs, CPLDs, discrete components, etc., including technologies that are not based on CMOS, including CML if extremely high speed operation is desired.
- circuitry and techniques are easily implemented using custom design techniques such as full custom CMOS design and layout instead of synthesizable RTL.
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Abstract
Description
P0=[(D1∩D2∩ . . . ∩D7)∩D0∩D8] (Eq. 1)
P1=[(D1UD2∪ . . . ∪D7)∩ D0∩ D8] (Eq. 2)
FP=[(s∩P1)∪( s∩P0)] (Eq. 3)
FC=[(s∩P0)∪( s∩P1)] (Eq. 4)
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10523235B2 (en) | 2015-06-30 | 2019-12-31 | Sanechips Technology Co., Ltd. | Transmission checking method, node, system and computer storage medium |
US11496282B1 (en) * | 2021-06-04 | 2022-11-08 | Kandou Labs, S.A. | Horizontal centering of sampling point using vertical vernier |
US11563605B2 (en) | 2021-04-07 | 2023-01-24 | Kandou Labs SA | Horizontal centering of sampling point using multiple vertical voltage measurements |
US11646861B2 (en) | 2021-09-24 | 2023-05-09 | International Business Machines Corporation | Low-latency, high-availability and high-speed SerDes interface having multiple synchronization modes |
US11722341B2 (en) | 2021-04-14 | 2023-08-08 | Kandou Labs SA | Continuous time linear equalization and bandwidth adaptation using peak detector |
US11907074B2 (en) | 2021-09-24 | 2024-02-20 | International Business Machines Corporation | Low-latency deserializer having fine granularity and defective-lane compensation |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4736391A (en) | 1986-07-22 | 1988-04-05 | General Electric Company | Threshold control with data receiver |
US5452333A (en) | 1992-06-19 | 1995-09-19 | Advanced Micro Devices, Inc. | Digital jitter correction method and signal preconditioner |
US5761254A (en) | 1996-01-31 | 1998-06-02 | Advanced Micro Devices, Inc. | Digital architecture for recovering NRZ/NRZI data |
US6088415A (en) | 1998-02-23 | 2000-07-11 | National Semiconductor Corporation | Apparatus and method to adaptively equalize duty cycle distortion |
US20040062336A1 (en) | 2001-02-16 | 2004-04-01 | Fujitsu Limited. | Timing extraction circuit for use in optical receiver that uses clock of frequency equal to one half of data transmission rate, and duty cycle deviation handling circuit for use in optical transmitter and receiver |
US6765975B2 (en) | 2000-12-19 | 2004-07-20 | Intel Corporation | Method and apparatus for a tracking data receiver compensating for deterministic jitter |
US20060039513A1 (en) * | 2004-08-17 | 2006-02-23 | Ruey-Bin Sheen | Clock and data recovery systems and methods |
US20060203939A1 (en) | 2005-03-11 | 2006-09-14 | Realtek Semiconductor Corporation | Method and apparatus for correcting duty cycle distortion |
US7298807B2 (en) | 2003-02-11 | 2007-11-20 | Rambus Inc. | Circuit, apparatus and method for adjusting a duty-cycle of a clock signal in response to incoming serial data |
US20070297548A1 (en) | 2006-06-21 | 2007-12-27 | Nobunari Tsukamoto | Data processing apparatus |
-
2009
- 2009-01-28 US US12/361,436 patent/US8116409B1/en active Active
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4736391A (en) | 1986-07-22 | 1988-04-05 | General Electric Company | Threshold control with data receiver |
US5452333A (en) | 1992-06-19 | 1995-09-19 | Advanced Micro Devices, Inc. | Digital jitter correction method and signal preconditioner |
US5761254A (en) | 1996-01-31 | 1998-06-02 | Advanced Micro Devices, Inc. | Digital architecture for recovering NRZ/NRZI data |
US6088415A (en) | 1998-02-23 | 2000-07-11 | National Semiconductor Corporation | Apparatus and method to adaptively equalize duty cycle distortion |
US6765975B2 (en) | 2000-12-19 | 2004-07-20 | Intel Corporation | Method and apparatus for a tracking data receiver compensating for deterministic jitter |
US20040062336A1 (en) | 2001-02-16 | 2004-04-01 | Fujitsu Limited. | Timing extraction circuit for use in optical receiver that uses clock of frequency equal to one half of data transmission rate, and duty cycle deviation handling circuit for use in optical transmitter and receiver |
US7298807B2 (en) | 2003-02-11 | 2007-11-20 | Rambus Inc. | Circuit, apparatus and method for adjusting a duty-cycle of a clock signal in response to incoming serial data |
US20060039513A1 (en) * | 2004-08-17 | 2006-02-23 | Ruey-Bin Sheen | Clock and data recovery systems and methods |
US20060203939A1 (en) | 2005-03-11 | 2006-09-14 | Realtek Semiconductor Corporation | Method and apparatus for correcting duty cycle distortion |
US20070297548A1 (en) | 2006-06-21 | 2007-12-27 | Nobunari Tsukamoto | Data processing apparatus |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10523235B2 (en) | 2015-06-30 | 2019-12-31 | Sanechips Technology Co., Ltd. | Transmission checking method, node, system and computer storage medium |
US11563605B2 (en) | 2021-04-07 | 2023-01-24 | Kandou Labs SA | Horizontal centering of sampling point using multiple vertical voltage measurements |
US12074735B2 (en) | 2021-04-07 | 2024-08-27 | Kandou Labs SA | Horizontal centering of sampling point using multiple vertical voltage |
US11722341B2 (en) | 2021-04-14 | 2023-08-08 | Kandou Labs SA | Continuous time linear equalization and bandwidth adaptation using peak detector |
US11496282B1 (en) * | 2021-06-04 | 2022-11-08 | Kandou Labs, S.A. | Horizontal centering of sampling point using vertical vernier |
US11736265B2 (en) | 2021-06-04 | 2023-08-22 | Kandou Labs SA | Horizontal centering of sampling point using vertical vernier |
US11646861B2 (en) | 2021-09-24 | 2023-05-09 | International Business Machines Corporation | Low-latency, high-availability and high-speed SerDes interface having multiple synchronization modes |
US11907074B2 (en) | 2021-09-24 | 2024-02-20 | International Business Machines Corporation | Low-latency deserializer having fine granularity and defective-lane compensation |
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