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US6653047B2 - Photoresist monomers containing fluorine-substituted benzylcarboxylate and photoresist polymers comprising the same - Google Patents

Photoresist monomers containing fluorine-substituted benzylcarboxylate and photoresist polymers comprising the same Download PDF

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US6653047B2
US6653047B2 US10/107,650 US10765002A US6653047B2 US 6653047 B2 US6653047 B2 US 6653047B2 US 10765002 A US10765002 A US 10765002A US 6653047 B2 US6653047 B2 US 6653047B2
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photoresist
group
alkyl
formula
mol
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US20030017412A1 (en
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Geun Su Lee
Jae Chang Jung
Ki Soo Shin
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SK Hynix Inc
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Hynix Semiconductor Inc
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
    • G03F7/0395—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having a backbone with alicyclic moieties
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/0046—Photosensitive materials with perfluoro compounds, e.g. for dry lithography
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
    • Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
    • Y10S430/1055—Radiation sensitive composition or product or process of making
    • Y10S430/106—Binder containing

Definitions

  • Novel photoresist monomers, polymers thereof and photoresist compositions containing the same are disclosed.
  • photoresist polymers suitable for a photolithography process using DUV (deep ultraviolet) light source, such as VUV (157 nm) in fabricating a minute circuit for a highly integrated semiconductor device, photoresist compositions containing the same, and preparing process therefor are disclosed.
  • a photoresist for an ArF and VUV should have low absorbency at 193 nm and 157 nm wavelengths, excellent etching resistance and adhesiveness on a substrate, and should be easily developable in a commercially available developing solution, such as aqueous tetramethylammonium hydroxide (TMAH) solution of 2.38 wt % or 2.6 wt %.
  • TMAH tetramethylammonium hydroxide
  • Photoresist monomers containing a benzylcarboxylate substituted with fluorine are disclosed.
  • Photoresist polymers containing the above photoresist monomers are also disclosed.
  • Photoresist compositions containing the photoresist polymers described above and processes for forming a photoresist patterns are also disclosed.
  • FIG. 1 is a VUV spectrum for the photoresist compositions of the present invention.
  • FIG. 2 is a photograph showing a pattern obtained in Example 5.
  • FIG. 3 is a photograph showing a pattern obtained in Example 6.
  • FIG. 4 is a photograph showing a pattern obtained in Example 7.
  • FIG. 5 is a photograph showing a pattern obtained in Example 8.
  • Photoresist monomers containing benzylcarboxylate substituted with fluorine having high etching resistance are represented by the following Formula 1.
  • R 1 is substituted or unsubstituted linear or branched (C 1 -C 10 ) alkylene or substituted or unsubstituted linear or branched (C 1 -C 10 ) alkylene containing an ether group (O);
  • X 1 and X 2 individually represent CH 2 , CH 2 CH 2 or O;
  • l is 0 or 1;
  • m is an integer ranging from 1 to 5.
  • One preferable example of the monomer represented by Formula 1 is 2,6-difluoro-1-methyl-5-norbornene-2-carboxylate.
  • Photoresist copolymers comprise repeating units comprising the monomer represented by above Formula 1.
  • the polymer may further comprise the monomer represented by the following Formula 2.
  • Y 1 and Y 2 individually represent H or halogen; Z is O, N—R or N—O—R; R is H, (C 1 -C 10 ) alkyl or alkyl group substituted with halogen.
  • polymer may further comprise at least one monomer represented by the following Formula 3 and Formula 4.
  • R 2 is (C 1 -C 20 ) alkyl, perfluoroalkyl or alkyl partially substituted with fluorine; and n is 0 or 1.
  • o is an integer ranging from 1 to 5.
  • photoresist polymer examples include repeating unit of the following Formula 5.
  • R 1 is substituted or unsubstituted linear or branched (C 1 -C 10 ) alkylene or substituted or unsubstituted linear or branched (C 1 -C 10 ) alkylene containing ether group (—O—);
  • X 1 and X 2 individually represent CH 2 , CH 2 CH 2 or O;
  • Y 1 and Y 2 individually represent H or halogen;
  • Z is O, N—R or N—O—R;
  • R is H, (C 1 -C 10 ) alkyl or alkyl group substituted with halogen;
  • R 2 is (C 1 -C 20 ) alkyl, perfluoroalkyl or alkyl partially substituted with fluorine;
  • l and n individually represent 0 or 1;
  • m and o are an integer ranging from 1 to 5;
  • a:b:c:d is 10-50 mol %:10-50 mol %:0-40 mol %:0-40
  • R 2 individually play a role as acid labile protecting group.
  • the acid labile protecting group is the one that can be released by acid, which prevent the compound from dissolving in an alkaline developing solution.
  • Some of conventional acid labile protecting group is bounded to polymer, the dissolution of photoresist material by alkaline developing solution is inhibited, while, in case that the acid labile protecting group is released by acid generated by light exposure, the photoresist material can be dissolved in developing solution.
  • any groups that can serve such a role may be used; the groups include what are disclosed in U.S. Pat. No. 5,212,043 (May 18, 1993), WO 97/33198 (Sep. 12, 1997), WO 96/37526 (Nov.
  • repeating unit of Formula 5 include;
  • Polymer of the present invention can be prepared by additional polymerization of the comonomers.
  • the polymers of the present invention are prepared by the process comprising:
  • the above polymerization may be performed by bulk or solution polymerization.
  • the step (a) is preferably carried out in conventional organic solvent such as tetrahydrofuran, cyclohexanone, cyclopentanone, dimethylformamide, dimethylsulfoxide, dioxane, benzene, toluene, xylene, propylene glycol methyl ether acetate and mixtures thereof.
  • organic solvent such as tetrahydrofuran, cyclohexanone, cyclopentanone, dimethylformamide, dimethylsulfoxide, dioxane, benzene, toluene, xylene, propylene glycol methyl ether acetate and mixtures thereof.
  • the polymerization initiators of the step (b) can be any conventional one, for example, 2,2′-azobisisobutyronitrile(AIBN), benzoylperoxide, acetylperoxide, laurylperoxide, tert-butylhydroperoxide, tert-butylperoxide or di-tert-butylperoxide.
  • AIBN 2,2′-azobisisobutyronitrile
  • polymerization of the step (b) is carried out under an inert gas.
  • the polymers are subject to crystallization and/or purification by using petroleum ether, hexane, alcohols (methanol, ethanol, isopropanol and the like), water and mixtures thereof.
  • Photoresist composition comprise; i) a photoresist polymer described above; (ii) a photoacid generator; and (iii) an organic solvent.
  • photoacid generators which is able to generate acids by light, can be used in photoresist composition of present invention.
  • Conventional photoacid generators are disclosed in U.S. Pat. No. 5,212,043 (May 18, 1993), WO 97/33198 (Sep. 12, 1997), WO 96/37526 (Nov. 28, 1996), EP 0 794 458 (Sep. 10, 1997), EP 0 789 278 (Aug. 13, 1997), U.S. Pat. No. 5,750,680 (May 12, 1998), U.S. Pat. No. 6,051,678 (Apr. 18, 2000), GB 2,345,286 A (Jul. 5, 2000) and U.S. Pat. No. 6,132,926 (Oct. 17, 2000).
  • Preferred photoacid generators have relatively low absorbance in the wavelength of 157 nm and 193 nm. More preferred photoacid generator include sulfide or onium type compound. Specifically, photoacid generators are selected from the group consisting of phthalimidotrifluoromethane sulfonate, dinitrobenzyltosylate, n-decyl disulfone and naphthylimido trifluoromethane sulfonate.
  • the photoacid generator can further comprise a compound selected from the group consisting of diphenyliodide hexafluorophosphate, diphenyliodide hexafluoroarsenate, diphenyliodide hexafluoroantimonate, diphenyl-p-methoxyphenylsulfonium triflate, diphenyl-p-toluenylsulfonium triflate, diphenyl-p-isobutylphenylsulfonium triflate, triphenylsulfonium hexafluoroarsenate, triphenylsulfonium hexafluoroantimonate, triphenylsulfonium triflate and dibutylnaphthylsulfonium triflate.
  • the photoacid generator is used in an amount ranging from about 0.05 to about 10 wt % of the photoresist polymer employed.
  • Organic solvent can be any of known solvent disclosed in U.S. Pat. No. 5,212,043 (May 18, 1993), WO 97/33198 (Sep. 12, 1997), WO 96/37526 (Nov. 28, 1996), EP 0 794 458 (Sep. 10, 1997), EP 0 789 278 (Aug. 13, 1997), U.S. Pat. No. 5,750,680 (May 12, 1998), U.S. Pat. No. 6,051,678 (Apr. 18, 2000), GB 2,345,286 A (Jul. 5, 2000) and U.S. Pat. No. 6,132,926 (Oct. 17, 2000)
  • Preferable organic solvents include methyl 3-methoxy propionate, ethyl 3-ethoxypropionate, propyleneglycol methyl ether acetate, cyclohexanone, 2-heptanone, ethyl lactate, diethyleneglycol diethyl ether or mixture thereof.
  • the amount of organic solvent ranges from about 500 to about 2000 wt % of the photoresist polymer to coat the photoresist in a wanted thickness. It has been found that when the amount of organic solvent is about 1000 wt % of the photoresist polymer, a photoresist layer having about 0.25 ⁇ m of thickness can be obtained.
  • the photoresist compositions containing repeating units have low absorbency and excellent etching resistance at 157 nm wavelength.
  • the absorbency of the photoresist compositions when coated with 2500 ⁇ thickness is 0.25 at 157 nm wavelength, which is about one-half of the absorbency of the general photoresist (see FIG. 1 ).
  • the former photoresist can been pattered at 157 nm wavelength, when coated with below a range of 600-700 ⁇ thickness. But the photoresist compositions of the present invention can be patterned when coated with over 1200 ⁇ thickness.
  • the photoresist compositions are obtained the photoresist pattern having excellent etching resistance and profile.
  • a process for forming a photoresist pattern comprises:
  • the process for forming the photoresist pattern can further include a soft baking step which is performed before the step (b) and/or a post baking step which is performed after the step (b).
  • the soft and post baking steps are performed at the temperature ranging from about 70 to about 200° C.
  • Exemplary light source which are useful for forming the photoresist pattern include KrF, ArF, E-beam, VUV, EUV, X-ray or ion beam.
  • the photoresist composition thus prepared was spin-coated on silicon wafer to form a photoresist film, and soft-baked in an oven or hot plate of about 130° C. for about 90 seconds. After baking, the photoresist was exposed to light using a KrF laser exposer, and then post-baked at about 130° C. for about 90 seconds. When the post-baking was completed, it was developed in 2.38 wt % aqueous TMAH solution for about 40 seconds, to obtain 0.13 ⁇ m L/S pattern (see FIG. 2 ).
  • the photoresist composition thus prepared was spin-coated on silicon wafer to form a photoresist film, and soft-baked in an oven or hot plate of about 130° C. for about 90 seconds. After baking, the photoresist was exposed to light using a KrF laser exposer, and then post-baked at about 130° C. for about 90 seconds. When the post-baking was completed, it was developed in 2.38 wt % aqueous TMAH solution for about 40 seconds, to obtain 0.12 ⁇ m L/S pattern (see FIG. 3 ).
  • the photoresist composition thus prepared was spin-coated on silicon wafer to form a photoresist film, and soft-baked in an oven or hot plate of about 130° C. for about 90 seconds. After baking, the photoresist was exposed to light using a KrF laser exposer, and then post-baked at about 130° C. for about 90 seconds. When the post-baking was completed, it was developed in 2.38 wt % aqueous TMAH solution for about 40 seconds, to obtain 0.13 ⁇ m L/S pattern (see FIG. 4 ).
  • the photoresist composition thus prepared was spin-coated on silicon wafer to form a photoresist film, and soft-baked in an oven or hot plate of about 130° C. for about 90 seconds. After baking, the photoresist was exposed to light using a KrF laser exposer, and then post-baked at about 130° C. for about 90 seconds. When the post-baking was completed, it was developed in 2.38 wt % aqueous TMAH solution for about 40 seconds, to obtain 0.13 ⁇ m L/S pattern (see FIG. 5 ).
  • the photoresist pattern using the photoresist compositions of the present invention can be formed with excellent durability, etching resistance, reproducibility and resolution.
  • the photoresist compositions can be used to form an ultrafine pattern of DRAM over 4 G and 16 G as well as DRAM below 1 G.
  • the photoresist polymer comprising fluorine has high light transmittance at a low wavelength, and thus is suitable for VUV.

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Materials For Photolithography (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

Photoresist monomers, photoresist polymers prepared therefrom, and photoresist compositions using the polymers are disclosed. More specifically, photoresist polymers comprising a photoresist monomer containing fluorine-substituted benzylcarboxylate represented by Formula 1, and a composition comprising the polymer are disclosed. The photoresist composition has excellent etching resistance, heat resistance and adhesiveness, and can be developed in aqueous tetramethylammonium hydroxide (TMAH) solution. And, the present photoresist composition is suitable to form a fine pattern using deep ultraviolet light source such as VUV (157 nm), since the composition has low light absorbance at 193 nm and 157 nm wavelength.
Figure US06653047-20031125-C00001
wherein, X1, X2, R1, l and m are defined in the specification.

Description

BACKGROUND
1. Technical Field
Novel photoresist monomers, polymers thereof and photoresist compositions containing the same are disclosed. In particular, photoresist polymers suitable for a photolithography process using DUV (deep ultraviolet) light source, such as VUV (157 nm) in fabricating a minute circuit for a highly integrated semiconductor device, photoresist compositions containing the same, and preparing process therefor are disclosed.
2. Description of the Related Art
A photoresist for an ArF and VUV (vacuum ultraviolet) should have low absorbency at 193 nm and 157 nm wavelengths, excellent etching resistance and adhesiveness on a substrate, and should be easily developable in a commercially available developing solution, such as aqueous tetramethylammonium hydroxide (TMAH) solution of 2.38 wt % or 2.6 wt %.
Much research has been conducted on resins having the high transparency at 248 nm and 193 nm wavelengths, and etching resistance similar to Novolac resins. However, most of the resists are not suitable for VUV due to their high absorbency at 157 nm wavelength. Other research on photoresists containing fluorine and silicon has been conducted to solve the above problem. However, most polyethylene or polyacrylate polymers containing fluorine have weak etching resistance, low solubility in an aqueous TMAH solutions and poor adhesiveness to the silicon wafer. In addition, these photoresists are difficult to mass-produce and are expensive.
SUMMARY OF THE DISCLOSURE
Photoresist monomers containing a benzylcarboxylate substituted with fluorine are disclosed.
Photoresist polymers containing the above photoresist monomers are also disclosed.
Photoresist compositions containing the photoresist polymers described above and processes for forming a photoresist patterns are also disclosed.
Semiconductor elements produced using the photoresist compositions described above are also disclosed.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a VUV spectrum for the photoresist compositions of the present invention.
FIG. 2 is a photograph showing a pattern obtained in Example 5.
FIG. 3 is a photograph showing a pattern obtained in Example 6.
FIG. 4 is a photograph showing a pattern obtained in Example 7.
FIG. 5 is a photograph showing a pattern obtained in Example 8.
DETAILED DESCRIPTION OF THE PRESENTLY PREFERRED EMBODIMENTS
Photoresist monomers containing benzylcarboxylate substituted with fluorine having high etching resistance are represented by the following Formula 1.
Figure US06653047-20031125-C00002
wherein, R1 is substituted or unsubstituted linear or branched (C1-C10) alkylene or substituted or unsubstituted linear or branched (C1-C10) alkylene containing an ether group (O); X1 and X2 individually represent CH2, CH2CH2 or O; l is 0 or 1; and m is an integer ranging from 1 to 5.
One preferable example of the monomer represented by Formula 1 is 2,6-difluoro-1-methyl-5-norbornene-2-carboxylate.
Photoresist copolymers comprise repeating units comprising the monomer represented by above Formula 1.
The polymer may further comprise the monomer represented by the following Formula 2.
Figure US06653047-20031125-C00003
wherein, Y1 and Y2 individually represent H or halogen; Z is O, N—R or N—O—R; R is H, (C1-C10) alkyl or alkyl group substituted with halogen.
In addition, the polymer may further comprise at least one monomer represented by the following Formula 3 and Formula 4.
Figure US06653047-20031125-C00004
wherein, R2 is (C1-C20) alkyl, perfluoroalkyl or alkyl partially substituted with fluorine; and n is 0 or 1.
Figure US06653047-20031125-C00005
wherein, o is an integer ranging from 1 to 5.
Preferable examples of the photoresist polymer include repeating unit of the following Formula 5.
Figure US06653047-20031125-C00006
wherein R1 is substituted or unsubstituted linear or branched (C1-C10) alkylene or substituted or unsubstituted linear or branched (C1-C10) alkylene containing ether group (—O—); X1 and X2 individually represent CH2, CH2CH2 or O; Y1 and Y2 individually represent H or halogen; Z is O, N—R or N—O—R; R is H, (C1-C10) alkyl or alkyl group substituted with halogen; R2 is (C1-C20) alkyl, perfluoroalkyl or alkyl partially substituted with fluorine; l and n individually represent 0 or 1; m and o are an integer ranging from 1 to 5; a:b:c:d is 10-50 mol %:10-50 mol %:0-40 mol %:0-40 mol %.
In the above Formula 5, wherein
Figure US06653047-20031125-C00007
and R2 individually play a role as acid labile protecting group.
The acid labile protecting group is the one that can be released by acid, which prevent the compound from dissolving in an alkaline developing solution. Some of conventional acid labile protecting group is bounded to polymer, the dissolution of photoresist material by alkaline developing solution is inhibited, while, in case that the acid labile protecting group is released by acid generated by light exposure, the photoresist material can be dissolved in developing solution. As the acid labile protecting group, any groups that can serve such a role may be used; the groups include what are disclosed in U.S. Pat. No. 5,212,043 (May 18, 1993), WO 97/33198 (Sep. 12, 1997), WO 96/37526 (Nov. 28, 1996), EP 0 794 458 (Sep. 10, 1997), EP 0 789 278 (Aug. 13, 1997), U.S. Pat. No. 5,750,680 (May 12, 1998), U.S. Pat. No. 6,051,678 (Apr. 18, 2000), GB 2,345,286 A (Jul. 5, 2000) and U.S. Pat. No. 6,132,926 (Oct. 17, 2000).
Preferable examples of the repeating unit of Formula 5 include;
poly(maleic anhydride/4-fluorostyrene/2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate);
poly(N-methylmaleimide/hexafluorobutyl-5-norbornene-2-carboxylate/2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate);
poly(N-t-butoxymaleimide/2,6-difluorostyrene/2,6-difluoro-1-methylbenzyl-5-norbornene-carboxylate); and
poly(N-methylmaleimide/2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate).
Polymer of the present invention can be prepared by additional polymerization of the comonomers.
In one particularly preferred method, the polymers of the present invention are prepared by the process comprising:
(a) admixing (i) a compound of Formula 1, (ii) a compound of Formula 2, and optionally (iii) at least one compound selected from the group consisting of Formula 3 and Formula 4; and
(b) adding a polymerization initiator into the resultant to obtain the repeating unit of described above Formula 5.
The above polymerization may be performed by bulk or solution polymerization.
When solution polymerization is performed, the step (a) is preferably carried out in conventional organic solvent such as tetrahydrofuran, cyclohexanone, cyclopentanone, dimethylformamide, dimethylsulfoxide, dioxane, benzene, toluene, xylene, propylene glycol methyl ether acetate and mixtures thereof.
In addition, the polymerization initiators of the step (b) can be any conventional one, for example, 2,2′-azobisisobutyronitrile(AIBN), benzoylperoxide, acetylperoxide, laurylperoxide, tert-butylhydroperoxide, tert-butylperoxide or di-tert-butylperoxide.
Preferably, polymerization of the step (b) is carried out under an inert gas.
After polymerization, the polymers are subject to crystallization and/or purification by using petroleum ether, hexane, alcohols (methanol, ethanol, isopropanol and the like), water and mixtures thereof.
Photoresist composition comprise; i) a photoresist polymer described above; (ii) a photoacid generator; and (iii) an organic solvent.
Any of known photoacid generators, which is able to generate acids by light, can be used in photoresist composition of present invention. Conventional photoacid generators are disclosed in U.S. Pat. No. 5,212,043 (May 18, 1993), WO 97/33198 (Sep. 12, 1997), WO 96/37526 (Nov. 28, 1996), EP 0 794 458 (Sep. 10, 1997), EP 0 789 278 (Aug. 13, 1997), U.S. Pat. No. 5,750,680 (May 12, 1998), U.S. Pat. No. 6,051,678 (Apr. 18, 2000), GB 2,345,286 A (Jul. 5, 2000) and U.S. Pat. No. 6,132,926 (Oct. 17, 2000).
Preferred photoacid generators have relatively low absorbance in the wavelength of 157 nm and 193 nm. More preferred photoacid generator include sulfide or onium type compound. Specifically, photoacid generators are selected from the group consisting of phthalimidotrifluoromethane sulfonate, dinitrobenzyltosylate, n-decyl disulfone and naphthylimido trifluoromethane sulfonate.
The photoacid generator can further comprise a compound selected from the group consisting of diphenyliodide hexafluorophosphate, diphenyliodide hexafluoroarsenate, diphenyliodide hexafluoroantimonate, diphenyl-p-methoxyphenylsulfonium triflate, diphenyl-p-toluenylsulfonium triflate, diphenyl-p-isobutylphenylsulfonium triflate, triphenylsulfonium hexafluoroarsenate, triphenylsulfonium hexafluoroantimonate, triphenylsulfonium triflate and dibutylnaphthylsulfonium triflate.
The photoacid generator is used in an amount ranging from about 0.05 to about 10 wt % of the photoresist polymer employed.
It has been found that when the photoacid generator is used in the amount less than 0.05 wt %, it lowers photosensitivity of the photoresist composition, and when the photoacid generator is used in the amount of greater than about 10 wt %, it results in poor pattern formation due to its high absorption of DUV.
Organic solvent can be any of known solvent disclosed in U.S. Pat. No. 5,212,043 (May 18, 1993), WO 97/33198 (Sep. 12, 1997), WO 96/37526 (Nov. 28, 1996), EP 0 794 458 (Sep. 10, 1997), EP 0 789 278 (Aug. 13, 1997), U.S. Pat. No. 5,750,680 (May 12, 1998), U.S. Pat. No. 6,051,678 (Apr. 18, 2000), GB 2,345,286 A (Jul. 5, 2000) and U.S. Pat. No. 6,132,926 (Oct. 17, 2000)
Preferable organic solvents include methyl 3-methoxy propionate, ethyl 3-ethoxypropionate, propyleneglycol methyl ether acetate, cyclohexanone, 2-heptanone, ethyl lactate, diethyleneglycol diethyl ether or mixture thereof.
The amount of organic solvent ranges from about 500 to about 2000 wt % of the photoresist polymer to coat the photoresist in a wanted thickness. It has been found that when the amount of organic solvent is about 1000 wt % of the photoresist polymer, a photoresist layer having about 0.25 μm of thickness can be obtained.
The photoresist compositions containing repeating units have low absorbency and excellent etching resistance at 157 nm wavelength. The absorbency of the photoresist compositions when coated with 2500 Å thickness is 0.25 at 157 nm wavelength, which is about one-half of the absorbency of the general photoresist (see FIG. 1).
The former photoresist can been pattered at 157 nm wavelength, when coated with below a range of 600-700 Å thickness. But the photoresist compositions of the present invention can be patterned when coated with over 1200 Å thickness.
The photoresist compositions are obtained the photoresist pattern having excellent etching resistance and profile.
A process for forming a photoresist pattern comprises:
(a) coating the photoresist composition described above on a substrate to form a photoresist film;
(b) exposing the photoresist film to light; and
(c) developing the photoresist film to form a photoresist pattern.
The process for forming the photoresist pattern can further include a soft baking step which is performed before the step (b) and/or a post baking step which is performed after the step (b). Preferably, the soft and post baking steps are performed at the temperature ranging from about 70 to about 200° C.
Exemplary light source which are useful for forming the photoresist pattern include KrF, ArF, E-beam, VUV, EUV, X-ray or ion beam.
I. Preparation of Photoresist Polymers
EXAMPLE 1 Synthesis of poly(maleic anhydride/4-fluorostyrene/2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate)
To 20 mL of tetrahydrofuran was added 50 mmole of maleic anhydride, 10 mmole of 4-fluorostyrene, 80 mmole of 2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate and 0.5 g of AIBN, and the resulting solution was reacted at about 65° C. for about 10 hours.
Thereafter, a polymer was precipitated in petroleum ether solution, filtered and dried in vacuo to obtain title compound (yield: 55%).
EXAMPLE 2 Synthesis of poly(N-methylmaleimide/hexafluorobutyl-5-norbornene-2-carboxylate/2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate)
To 20 mL of tetrahydrofuran was added 50 mmole of N-methylmaleimide, 10 mmole of hexafluorobutyl-5-norbornene-2-carboxylate, 40 mmole of 2,6-difluoro-1-methylbenzylacrylate and 0.3 g of AIBN, and the resulting solution was reacted at about 65° C. for about 12 hours.
Thereafter, a polymer was precipitated in petroleum ether solution and filtered, thereby obtaining the polymer (yield: 51%).
EXAMPLE 3 Synthesis of poly(N-t-butoxymaleimide/2,6-difluorostyrene/2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate)
To 20 mL of tetrahydrofuran was added 50 mmole of N-t-butoxymaleimide, 10 mmole of 2,6-difluorostyrene, 50 mmole of 2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate and 0.5 g of AIBN, and the resulting solution was reacted at about 65° C. for about 12 hours.
Thereafter, a polymer was obtained in water/methanol solution and a polymer was precipitated in petroleum ether solution for 5 min, and filtered to obtain title compound (yield: 55%).
EXAMPLE 4 Synthesis of poly(N-methylmaleimide/2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate)
To 20 mL of tetrahydrofuran was added 50 mmole of N-methylmaleimide, 50 mmole of 2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate and 0.50 g of AIBN, and the resulting solution was reacted at about 65° C. for about 12 hours.
Thereafter, a polymer was precipitated in water/methanol solution, filtered and dried in vacuo to obtain title compound (yield: 46%).
II. Preparation of Photoresist Composition and Formation of Patterns
EXAMPLE 5
To 20 g of propylene glycol methyl ether acetate (PGMEA) was added 2 g of the polymer of Example 1, 0.024 g of phthalimidotrifluoromethane sulfonate, and 0.06 g of triphenylsulfonium triflate. The resulting solution was filtered through 0.20 μm filter to obtain a photoresist composition.
The photoresist composition thus prepared was spin-coated on silicon wafer to form a photoresist film, and soft-baked in an oven or hot plate of about 130° C. for about 90 seconds. After baking, the photoresist was exposed to light using a KrF laser exposer, and then post-baked at about 130° C. for about 90 seconds. When the post-baking was completed, it was developed in 2.38 wt % aqueous TMAH solution for about 40 seconds, to obtain 0.13 μm L/S pattern (see FIG. 2).
EXAMPLE 6
To 20 g of propylene glycol methyl ether acetate (PGMEA) was added 2 g of the polymer of Example 2, 0.024 g of phthalimidotrifluoromethane sulfonate, and 0.06 g of triphenylsulfonium triflate. The resulting solution was filtered through 0.20 μm filter to obtain a photoresist composition.
The photoresist composition thus prepared was spin-coated on silicon wafer to form a photoresist film, and soft-baked in an oven or hot plate of about 130° C. for about 90 seconds. After baking, the photoresist was exposed to light using a KrF laser exposer, and then post-baked at about 130° C. for about 90 seconds. When the post-baking was completed, it was developed in 2.38 wt % aqueous TMAH solution for about 40 seconds, to obtain 0.12 μm L/S pattern (see FIG. 3).
EXAMPLE 7
To 20 g of propylene glycol methyl ether acetate (PGMEA) was added 2 g of the polymer of Example 3, 0.024 g of phthalimidotrifluoromethane sulfonate, and 0.06 g of triphenylsulfonium triflate. The resulting solution was filtered through 0.20 μm filter to obtain a photoresist composition.
The photoresist composition thus prepared was spin-coated on silicon wafer to form a photoresist film, and soft-baked in an oven or hot plate of about 130° C. for about 90 seconds. After baking, the photoresist was exposed to light using a KrF laser exposer, and then post-baked at about 130° C. for about 90 seconds. When the post-baking was completed, it was developed in 2.38 wt % aqueous TMAH solution for about 40 seconds, to obtain 0.13 μm L/S pattern (see FIG. 4).
EXAMPLE 8
To 20 g of propylene glycol methyl ether acetate (PGMEA) was added 2 g of the polymer of Example 4, 0.024 g of phthalimidotrifluoromethane sulfonate, and 0.06 g of triphenylsulfonium triflate. The resulting solution was filtered through 0.20 μm filter to obtain a photoresist composition.
The photoresist composition thus prepared was spin-coated on silicon wafer to form a photoresist film, and soft-baked in an oven or hot plate of about 130° C. for about 90 seconds. After baking, the photoresist was exposed to light using a KrF laser exposer, and then post-baked at about 130° C. for about 90 seconds. When the post-baking was completed, it was developed in 2.38 wt % aqueous TMAH solution for about 40 seconds, to obtain 0.13 μm L/S pattern (see FIG. 5).
As discussed earlier, the photoresist pattern using the photoresist compositions of the present invention can be formed with excellent durability, etching resistance, reproducibility and resolution. In addition, the photoresist compositions can be used to form an ultrafine pattern of DRAM over 4 G and 16 G as well as DRAM below 1 G. Moreover, the photoresist polymer comprising fluorine has high light transmittance at a low wavelength, and thus is suitable for VUV.

Claims (21)

What is claimed:
1. A photoresist monomer represented by following Formula 1:
Figure US06653047-20031125-C00008
wherein, R1 is (C1-C10) alkylene or (C1-C10) alkylene containing an ether group (—O—); X1 and X2 are individually selected from the group consisting of CH2, CH2CH2 and O; l is 0 or 1; and m is an integer ranging from 1 to 5.
2. The photoresist monomer according to claim 1, wherein the compound of Formula 1 is 2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate.
3. A photoresist polymer comprising the photoresist monomer of claim 1.
4. The photoresist polymer according to claim 3, further comprising the co-monomer of the following Formula 2:
Figure US06653047-20031125-C00009
wherein Y1 and Y2 individually represent H or halogen; Z is O, N—R or N—O—R; R is selected from the group consisting of H, (C1-C10) alkyl and (C1-C10) alkyl group substituted with halogen.
5. The photoresist polymer according to claim 3, further comprising at least one monomer selected from the group consisting of following Formula 3 and Formula 4:
Figure US06653047-20031125-C00010
wherein, R2 is selected from the group consisting of (C1-C20) alkyl, perfluoroalkyl and an alkyl partially substituted with fluorine; n is 0 or 1; and o is an integer ranging from 1 to 5.
6. A photoresist polymer comprising a repeating unit of the following Formula 5:
Figure US06653047-20031125-C00011
wherein, R1 is (C1-C10) alkylene and (C1-C10) alkylene containing ether group (—O—) ; X1 and X2 are individually selected from the group consisting of CH2, CH2CH2 and O; Y1 and Y2 individually represent H or halogen; Z is O, N—R or N—O—R; R is selected from the group consisting of H, (C1-C10) alkyl and an alkyl group substituted with halogen; R2 is selected from the group consisting of (C1-C20) alkyl, perfluoroalkyl and alkyl partially substituted with fluorine; l and n individually represent 0 or 1; m and o are integers ranging from 1 to 5; and the ratio a:b:c:d falls within the ranges 10-50 mol %:10-50 mol %:0-40 mol %:0-40 mol %.
7. The photoresist polymer according to claim 6, wherein the repeating unit is selected from the group consisting of:
poly(maleic anhydride/4-fluorostyrene/2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate);
poly(N-methylmaleimide/hexafluorobutyl-5-norbornene-2-carboxylate/2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate);
poly(N-t-butoxymaleimide/2,6-difluorostyrene/2,6-difluoro-1-methylbenzyl-5-norbornene-carboxylate); and
poly(N-methylmaleimide/2,6-difluoro-1-methylbenzyl-5-norbornene-2-carboxylate).
8. A process for preparing a photoresist polymer comprising:
(a) admixing (i) a compound of Formula 1, (ii) a compound of Formula 2, and optionally (iii) at least one compound selected from the group consisting of Formula 3 and Formula 4; and
(b) adding a polymerization initiator into the resultant to obtain repeating unit of Formula 5:
Figure US06653047-20031125-C00012
wherein, R1 is (C1-C10) alkylene or (C1-C10) alkylene containing an ether group (—O—); X1 and X2 are individually selected from the group consisting of CH2, CH2CH2 and O; Y1 and Y2 individually represent H or halogen; Z is O, N—R or N—O—R; R is selected from the group consisting of H, (C1-C10) alkyl and alkyl group substituted with halogen; R2 is selected from the group consisting of (C1-C20)) alkyl, perfluoroalkyl and alkyl partially substituted with fluorine; l and n individually represent 0 or 1; m and o are an integer ranging from 1 to 5; and the ratio a:b:c:d falls within the ranges 10-50 mol %:10-50 mol %:0-40 mol %:0-40 mol %.
9. A process for preparing a photoresist polymer according to claim 8, wherein the step (a) is carried out in a polymerization solvent selected from the group consisting of tetrahydrofuran, cyclohexanone, cyclopentanone, dimethylformamide, dimethylsulfoxide, dioxane, benzene, toluene, xylene, propylene glycol methyl ether acetate and mixtures thereof.
10. A process for preparing a photoresist polymer according to claim 8, wherein the polymerization initiator is selected from the group consisting of 2,2′-azobisisobutyronitrile (AIBN), benzoylperoxide, acetylperoxide, laurylperoxide, tert-butylhydroperoxide, tert-butylperoxide and di-tert-butylperoxide.
11. A photoresist composition comprising:
(i) the photoresist polymer of claim 3;
(ii) an organic solvent; and
(iii) a photoacid generator.
12. The photoresist composition according to claim 11, wherein the photoacid generator is selected from the group consisting of phthalimidotrifluoromethane sulfonate, dinitrobenzyl tosylate, n-decyl disulfone and naphthyl imidotrifluoro methanesulfonate.
13. The photoresist composition according to claim 12, wherein the photoacid generator further comprises one or more compound(s) selected from the group consisting of diphenyl iodide hexafluorophosphate, diphenyliodide hexafluoroarsenate, diphenyliodide hexafluoroantimonate, diphenyl-p-methoxyphenylsulfonium triflate, diphenyl-p-toluenylsulfonium triflate, diphenyl-p-isobutylphenylsulfonium triflate, triphenylsulfonium hexafluoroarsenate, triphenylsulfonium hexafluoroantimonate, triphenylsulfonium triflate and dibutylnaphthylsulfonium triflate.
14. The photoresist composition according to claim 11, wherein the photoacid generator is used in an amount ranging from about 0.05 to about 10 wt % of the photoresist polymer.
15. The photoresist composition according to claim 11, wherein the organic solvent is selected from the group consisting of diethyleneglycol diethyl ether, ethyl 3-ethoxypropionate, methyl 3-methoxypropionate, cyclohexanone, propyleneglycol methyl ether acetate, 2-heptanone, ethyl lactate, cyclopentanone and mixtures thereof.
16. The photoresist composition according to claim 11, wherein the organic solvent is used in an amount ranging from about 500 to about 2000 wt % of said photoresist polymer.
17. A process for forming of a photoresist pattern comprising:
(a) coating the photoresist composition of claim 11 on a substrate to form a photoresist film;
(b) exposing the photoresist film to light; and
(c) developing the photoresist film to form a photoresist pattern.
18. The process according to claim 17, further comprising a soft baking step before step (b) and/or a post baking step after step (b).
19. The process according to claim 18, wherein the soft and post baking steps are individually performed at the temperature ranging from about 70 to about 200° C.
20. The process according to claim 17, wherein the source of light is selected from the group consisting of KrF, ArF, E-beam, VUV, EUV, X-ray and ion beam.
21. A semiconductor element manufactured according to the process of claim 17.
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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030022101A1 (en) * 2001-06-29 2003-01-30 Lee Geun Su Photoresist monomers, polymers thereof and photoresist compositions containing the same
US20040077180A1 (en) * 2002-08-29 2004-04-22 Michael Sebald Process and control device for the planarization of a semiconductor sample
US20060275695A1 (en) * 2005-06-02 2006-12-07 Hynix Semiconductor Inc. Polymer for immersion lithography, photoresist composition containing the same, method of manufacturing a semiconductor device, and semiconductor device
US20070224551A1 (en) * 2006-03-22 2007-09-27 Quanta Display Inc. Method of fabricating photoresist thinner
US20080153300A1 (en) * 2006-12-20 2008-06-26 Hynix Semiconductor Inc. Method for forming fine pattern of semiconductor device
US9625816B2 (en) 2014-11-27 2017-04-18 Samsung Electronics Co., Ltd. Methods of forming patterns using photoresist polymers

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100346229C (en) * 2002-09-30 2007-10-31 日本瑞翁株式会社 Radiation-sensitive resin composition, patterned resin film, method for formation of the film, and use thereof
KR100733230B1 (en) * 2005-06-02 2007-06-27 주식회사 하이닉스반도체 Photoacid generator for immersion lithography and photoresist composition containing same
KR100732300B1 (en) * 2005-06-02 2007-06-25 주식회사 하이닉스반도체 Photoresist polymers for immersion lithography and photoresist compositions containing them
TW200714620A (en) * 2005-08-30 2007-04-16 Zeon Corp Cycloolefin addition polymer, its composite and molding, and optical material

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0463810A (en) * 1990-07-03 1992-02-28 Kuraray Co Ltd Acrylic-norbornene copolymer and its production method
US5674947A (en) * 1994-08-16 1997-10-07 Mitsui Toatsu Chemicals, Inc. Method for preparing modified resins and their applications
US20010014427A1 (en) * 1996-12-19 2001-08-16 Japan Synthetic Rubber Co., Ltd. Radiation sensitive resin composition
US20020015912A1 (en) * 2000-06-15 2002-02-07 Roh Chi Hyeong Photoresist monomers, polymers thereof and photoresist compositions containing the same

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4307663B2 (en) * 1998-12-16 2009-08-05 東京応化工業株式会社 Positive resist composition, polymer used therefor, and resist pattern forming method
KR100520167B1 (en) * 1999-02-04 2005-10-10 주식회사 하이닉스반도체 Novel photoresist monomers, polymers thereof, and photoresist composition containing the same
JP3680920B2 (en) * 1999-02-25 2005-08-10 信越化学工業株式会社 Novel ester compound, polymer compound, resist material, and pattern forming method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0463810A (en) * 1990-07-03 1992-02-28 Kuraray Co Ltd Acrylic-norbornene copolymer and its production method
US5674947A (en) * 1994-08-16 1997-10-07 Mitsui Toatsu Chemicals, Inc. Method for preparing modified resins and their applications
US20010014427A1 (en) * 1996-12-19 2001-08-16 Japan Synthetic Rubber Co., Ltd. Radiation sensitive resin composition
US20020015912A1 (en) * 2000-06-15 2002-02-07 Roh Chi Hyeong Photoresist monomers, polymers thereof and photoresist compositions containing the same

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Chemical Abstract DN 117:49447 for JP 040638, Feb. 1992. *

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030022101A1 (en) * 2001-06-29 2003-01-30 Lee Geun Su Photoresist monomers, polymers thereof and photoresist compositions containing the same
US6849375B2 (en) 2001-06-29 2005-02-01 Hynix Semiconductor Inc. Photoresist monomers, polymers thereof and photoresist compositions containing the same
US20040077180A1 (en) * 2002-08-29 2004-04-22 Michael Sebald Process and control device for the planarization of a semiconductor sample
US20060275695A1 (en) * 2005-06-02 2006-12-07 Hynix Semiconductor Inc. Polymer for immersion lithography, photoresist composition containing the same, method of manufacturing a semiconductor device, and semiconductor device
US7534548B2 (en) 2005-06-02 2009-05-19 Hynix Semiconductor Inc. Polymer for immersion lithography and photoresist composition
US7838201B2 (en) 2005-06-02 2010-11-23 Hynix Semiconductor Inc. Method for manufacturing a semiconductor device
US20070224551A1 (en) * 2006-03-22 2007-09-27 Quanta Display Inc. Method of fabricating photoresist thinner
US20080153300A1 (en) * 2006-12-20 2008-06-26 Hynix Semiconductor Inc. Method for forming fine pattern of semiconductor device
US9625816B2 (en) 2014-11-27 2017-04-18 Samsung Electronics Co., Ltd. Methods of forming patterns using photoresist polymers
US9810982B2 (en) 2014-11-27 2017-11-07 Samsung Electronics Co., Ltd. Photoresist polymers and photoresist compositions

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