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US20110061906A1 - Printed circuit board and fabrication method thereof - Google Patents

Printed circuit board and fabrication method thereof Download PDF

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Publication number
US20110061906A1
US20110061906A1 US12/654,433 US65443309A US2011061906A1 US 20110061906 A1 US20110061906 A1 US 20110061906A1 US 65443309 A US65443309 A US 65443309A US 2011061906 A1 US2011061906 A1 US 2011061906A1
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US
United States
Prior art keywords
thermal expansion
expansion coefficient
conductive layer
base member
insulation base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US12/654,433
Inventor
Min Jung Cho
Mi Sun Hwang
Jae Joon Lee
Myung Sam Kang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electro Mechanics Co Ltd
Original Assignee
Samsung Electro Mechanics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electro Mechanics Co Ltd filed Critical Samsung Electro Mechanics Co Ltd
Assigned to SAMSUNG ELECTRO-MECHANICS CO., LTD. reassignment SAMSUNG ELECTRO-MECHANICS CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CHO, MIN JUNG, HWANG, MI SUN, KANG, MYUNG SAM, LEE, JAE JOON
Publication of US20110061906A1 publication Critical patent/US20110061906A1/en
Abandoned legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/05Insulated conductive substrates, e.g. insulated metal substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0271Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03Conductive materials
    • H05K2201/0332Structure of the conductor
    • H05K2201/0335Layered conductors or foils
    • H05K2201/0338Layered conductor, e.g. layered metal substrate, layered finish layer or layered thin film adhesion layer
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/06Thermal details
    • H05K2201/068Thermal details wherein the coefficient of thermal expansion is important
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09009Substrate related
    • H05K2201/09136Means for correcting warpage
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621Components characterised by their electrical contacts
    • H05K2201/10674Flip chip
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/007Manufacture or processing of a substrate for a printed circuit board supported by a temporary or sacrificial carrier
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • H05K3/4682Manufacture of core-less build-up multilayer circuits on a temporary carrier or on a metal foil

Definitions

  • the present invention relates to a printed circuit board and a fabrication method thereof and, more particularly, to a printed circuit board having an anti-warping unit to thereby improve a processing rate and productivity, and a fabrication method thereof.
  • the reduction in the thickness of the substrate highlights the importance of controlling warping in the semiconductor package substrate.
  • Semiconductor package substrate warping in the implementation of soldering greatly affects a processing rate and productivity.
  • the semiconductor package substrate warping causes solder balls to fail to be formed on a solder ball pad of the semiconductor substrate during the soldering process or the solder balls formed on a semiconductor element and the semiconductor package substrate to fail to be properly bonded when the semiconductor element is mounted, possibly resulting in a problematic state in which the semiconductor element and the semiconductor package substrate are not electrically connected.
  • the related art semiconductor package substrate generally includes a package area including a semiconductor element mounting part and an outer layer circuit pattern and a dummy area surrounding the package area.
  • the related art semiconductor package substrate improves warping by adjusting the thickness of the outer layer circuit pattern of the package area or the thickness of the solder resist layer of the dummy area such that overall balance within the semiconductor package substrate is maintained.
  • An aspect of the present invention provides a printed circuit board (PCB) having an anti-warping unit to improve a processing rate and productivity, and a fabrication method thereof.
  • PCB printed circuit board
  • a printed circuit board including: a dual-layered circuit pattern formed with a desired pattern on at least one of upper and lower surfaces of an insulation base member (i.e., an insulation substrate) and having metal layers each having a different thermal expansion coefficient; and an insulating layer formed on the insulation base member to cover the circuit pattern.
  • an insulation base member i.e., an insulation substrate
  • metal layers each having a different thermal expansion coefficient
  • the circuit pattern may be provided on the upper surface of the insulation base member and include a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • the circuit pattern may be provided on the upper surface of the insulation base member and include a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • the circuit pattern may be provided on both of the upper and lower surfaces of the insulation base member, and the circuit pattern provided on the upper surface of the insulation base member may include a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient, and the circuit pattern provided on the lower surface of the insulation base member may include a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • the circuit pattern may be provided on both of the upper and lower surfaces of the insulation base member, and the circuit pattern provided on the upper surface of the insulation base member may include a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient, and the circuit pattern provided on the lower surface of the insulation base member may include a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • the first conductive layer may be made of invar or nickel, and the second conductive layer may be made of copper or a copper alloy.
  • the insulating layer may be a solder resist patterned to expose the circuit pattern.
  • the PCB may further include a through hole formed to penetrate the insulation base member or at least one surface of the insulating layer.
  • a method for fabricating a printed circuit board including: forming a dual-layered circuit pattern with a desired pattern on at least one of upper and lower surfaces of an insulation base member and having metal layers each having a different thermal expansion coefficient; and forming an insulating layer on the insulation base member to cover the circuit pattern.
  • the circuit pattern may be provided on the upper surface of the insulation base member and include a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • the circuit pattern may be provided on the upper surface of the insulation base member and include a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • the circuit pattern may be provided on both of the upper and lower surfaces of the insulation base member, and the circuit pattern provided on the upper surface of the insulation base member may include a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient, and the circuit pattern provided on the lower surface of the insulation base member may include second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • the circuit pattern may be provided on both of the upper and lower surfaces of the insulation base member, and the circuit pattern provided on the upper surface of the insulation base member may include a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient, and the circuit pattern provided on the lower surface of the insulation base member may include a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • the first conductive layer may be made of invar or nickel, and the second conductive layer may be made of copper or a copper alloy.
  • the insulating layer may be a solder resist patterned to expose the circuit pattern.
  • the method may further include: forming a through hole penetrating the insulation base member or at least one surface of the insulating layer.
  • FIGS. 1 a and 1 b are schematic sectional views showing printed circuit boards (PCBs) with circuit patterns according to a first exemplary embodiment of the present invention
  • FIGS. 2 a and 2 b are schematic sectional views showing printed circuit boards (PCBs) with circuit patterns according to a second exemplary embodiment of the present invention
  • FIG. 3 is a schematic sectional view showing a printed circuit board (PCB) with circuit patterns according to a third exemplary embodiment of the present invention
  • FIGS. 4 a to 4 e are sectional views sequentially showing the process of forming the PCB according to the first exemplary embodiment of the present invention.
  • FIGS. 5 a to 5 p are sectional views sequentially showing the process of forming the PCB according to the third exemplary embodiment of the present invention.
  • PCB printed circuit board
  • FIGS. 1 a and 1 b are schematic sectional views showing printed circuit boards (PCBs) with circuit patterns according to a first exemplary embodiment of the present invention.
  • PCBs printed circuit boards
  • FIGS. 1 a and 1 b are schematic sectional views showing printed circuit boards (PCBs) with circuit patterns according to a first exemplary embodiment of the present invention.
  • PCBs printed circuit boards
  • FIGS. 1 a and 1 b are schematic sectional views showing printed circuit boards (PCBs) with circuit patterns according to a first exemplary embodiment of the present invention.
  • PCBs printed circuit boards
  • PCBs 100 A and 100 B include dual-layered circuit patterns 102 A and 102 B formed so as to have a desired pattern on upper and lower surfaces of an insulation base member 101 and having metal layers each having a different thermal expansion coefficient, and an insulating layer 105 formed on the insulation base member 101 to cover the circuit patterns 102 A and 102 B.
  • the PCB 100 A is used as an upper substrate of a package on package (POP) substrate.
  • the circuit pattern 102 A is provided on both the upper and lower surfaces of the insulation base member 101 .
  • the circuit pattern 102 A provided on the upper surface of the insulation base member 101 includes a second conductive layer 102 b formed on the insulation base member 101 and having a second thermal expansion coefficient and a first conductive layer 102 a formed on the second conductive layer 102 b and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient
  • the circuit pattern 102 A provided on the lower surface of the insulation base member 101 includes a first conductive layer 102 a formed on the insulation base member 101 and having a first thermal expansion coefficient and a second conductive layer 102 b formed on the first conductive layer 102 a and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • the PCB 100 B is used as a lower substrate of a package on package (POP) substrate.
  • the circuit pattern 102 B is provided on both the upper and lower surfaces of the insulation base member 101 .
  • the circuit pattern 102 B provided on the upper surface of the insulation base member 101 includes a first conductive layer 102 a formed on the insulation base member 101 and having a first thermal expansion coefficient and a second conductive layer 102 b formed on the first conductive layer 102 a and having a second thermal expansion coefficient greater than the first thermal expansion coefficient
  • the circuit pattern 102 A provided on the lower surface of the insulation base member 101 includes a second conductive layer 102 b formed on the insulation base member 101 and having a second thermal expansion coefficient and a first conductive layer 102 a formed on the second conductive layer 102 b and having a first thermal expansion coefficient smaller than the first thermal expansion coefficient.
  • the circuit patterns 102 A and 102 B according to the first exemplary embodiment of the present invention may be formed of any metal so long as it has properties allowing it to constitute the first conductive layer 102 a having the first thermal expansion coefficient or the second conductive layer 102 b having the second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • the circuit patterns 102 A and 102 B according to the first exemplary embodiment of the present invention may include the first conductive layer 102 a made of invar or nickel (Ni) having a small thermal expansion coefficient, and the second conductive layer 102 b made of copper or a copper alloy having a thermal expansion coefficient greater than that of invar or nickel.
  • the PCBs used for fabricating a semiconductor package are exposed to a high heat during each fabrication process, the PCBs tend to be warped (bent) upwards (i.e., having a smiling shape when viewed from the side) or warped down (i.e., having a crying shape when viewed from the side).
  • the PCB mounted on the upper package substrate demonstrates behavior wherein it is warped in a smiling shape at room temperature and warped in a crying shape at a high temperature.
  • the PCB mounted on the lower package substrate demonstrates behavior wherein it is warped in a crying shape at room temperature and warped in a smiling shape at a high temperature.
  • the PCB mounted on the upper package substrate is configured to have the circuit pattern formed of a metal having a small thermal expansion coefficient and a metal having a large thermal expansion coefficient, which are installed such that the former (i.e., the metal having a small thermal expansion coefficient) is positioned as the surface on which a semiconductor device is to be mounted
  • the PCB mounted on the lower package substrate is configured to have the circuit pattern formed of a metal having a large thermal expansion coefficient and a metal having a small thermal expansion coefficient, which are positioned such that the former (i.e., metal having a large thermal expansion coefficient) is positioned as the surface on which the semiconductor device is to be mounted, whereby stress generated due to the warping behaviors in the different directions is canceled out to maintain the PCBs in a horizontal state, and accordingly, the warping phenomenon of the PCBs can be significantly reduced.
  • the insulating layers 105 are formed on the insulation base member 101 and have openings O and P exposing the circuit patterns 102 A and 102 B so as to be bonded with solder balls.
  • the insulating layers 105 may be formed as a patterned solder resist.
  • a gold-plated layer 107 is formed in each of the openings O and P for a connection with a semiconductor element or solder balls.
  • a nickel layer 106 is thinly plated and the gold-plated layer 107 is formed on the nickel layer 106 .
  • FIGS. 2 a and 2 b are schematic sectional views showing PCBs with circuit patterns according to a second exemplary embodiment of the present invention.
  • the PCBs 200 A and 200 B according to the second exemplary embodiment of the present invention is a four-layered PCB with circuit patterns.
  • the PCB 200 A includes dual-layered circuit patterns 202 A and 206 A formed to have a desired pattern on upper and lower surfaces of an insulation base member 201 and having metal layers each having a different thermal expansion coefficient, and insulating layers 205 and 207 formed on the insulation base member 201 to cover the circuit patterns 202 A and 206 A.
  • the circuit pattern 206 A and the insulating layers 207 are formed on the insulating layer 205 which is not patterned.
  • the PCB 200 A is used as an upper substrate of a package on package (POP) substrate.
  • the circuit patterns 202 A and 206 A are provided with a desired pattern on both the upper and lower surfaces of the insulation base member 201 .
  • the circuit patterns 202 A and 206 A provided on the upper surface of the insulation base member 201 include second conductive layers 202 b and 206 b formed on the insulation base member 201 and having a second thermal expansion coefficient and first conductive layers 202 a and 206 a formed on the second conductive layers 202 b and 206 b and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient
  • the circuit patterns 202 A and 206 A provided on the lower surface of the insulation base member 201 include first conductive layers 202 a and 206 a formed on the insulation base member 201 and having a first thermal expansion coefficient and second conductive layers 202 b and 206 b formed on the first conductive layers 202 a and 206 a and having a second thermal expansion coefficient greater than the first thermal
  • the insulating layers 207 have openings O and P exposing the circuit patterns 206 A so as to be bonded with solder balls.
  • the insulating layers 207 may be formed as a patterned solder resist.
  • a gold-plated layer 209 is formed in each of the openings O and P for a connection with a semiconductor element or solder balls.
  • a nickel layer 208 is thinly plated and the gold-plated layer 209 is formed on the nickel layer 208 .
  • the PCB 200 B is used as a lower substrate of the package on package (POP) substrate.
  • the circuit patterns 202 B and 206 B are provided with a desired pattern on both the upper and lower surfaces of the insulation base member 201 .
  • the circuit patterns 202 B and 206 B provided on the upper surface of the insulation base member 201 include first conductive layers 202 a and 206 a formed on the insulation base member 201 and having a first thermal expansion coefficient and second conductive layers 202 b and 206 b formed on the first conductive layers 202 a and 206 a and having a second thermal expansion coefficient greater than the first thermal expansion coefficient, and the circuit patterns 202 B and 206 B provided on the lower surface of the insulation base member 201 include second conductive layers 202 b and 206 b formed on the insulation base member 201 and having a second thermal expansion coefficient and first conductive layers 202 a and 206 a formed on the second conductive layers 202 b and 206 b and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • the insulating layers 207 have openings O and P exposing the circuit patterns 206 A so as to be bonded with solder balls.
  • the insulating layers 207 may be formed as patterned solder resists.
  • a gold-plated layer 209 is formed in each of the openings O and P for a connection with a semiconductor element or solder balls.
  • a nickel layer 208 is thinly plated and the gold-plated layer 209 is formed on the nickel layer 208 .
  • the PCBs for fabricating a semiconductor package are exposed to a high heat during each fabrication process, the PCBs tend to be warped (bent) up (i.e., having a smiling shape when viewed from the side) or warped down (i.e., having a crying shape when viewed from the side).
  • the PCB mounted on the upper package substrate demonstrates behavior wherein it is warped in a smiling shape at room temperature and warped in a crying shape at a high temperature.
  • the PCB mounted on the lower package substrate demonstrates behavior wherein it is warped in a crying shape at room temperature and warped in a smiling shape at a high temperature.
  • the PCB mounted on the upper package substrate is configured to have the circuit pattern formed of a metal having a small thermal expansion coefficient and a metal having a large thermal expansion coefficient, which are installed such that the former (i.e., the metal having a small thermal expansion coefficient) is positioned on the surface on which a semiconductor device is to be mounted
  • the PCB mounted on the lower package substrate is configured to have the circuit pattern formed of a metal having a large thermal expansion coefficient and a metal having a small thermal expansion coefficient, which are positioned such that the former (i.e., metal having a large thermal expansion coefficient) is positioned on the surface on which the semiconductor device is to be mounted, whereby stress generated due to the warping behaviors in the different directions is canceled out to maintain the PCBs in a horizontal state, and accordingly, the warping phenomenon of the PCBs can be significantly reduced.
  • FIG. 3 is a schematic sectional view showing a printed circuit board (PCB) with circuit patterns according to a third exemplary embodiment of the present invention.
  • the PCB according to the third exemplary embodiment of the present invention is a four-layered PCB with circuit patterns.
  • the PCB 300 according to the third exemplary embodiment of the present invention is configured such that circuit patterns are formed only on one side of insulation base members, rather than formed on both sides of the insulation base members.
  • the PCB 300 includes dual-layered circuit patterns 304 A, 307 A, and 310 A with metal layers each having a different thermal expansion coefficient and insulation base members 306 , 309 , 311 , and 314 covering the circuit patterns 304 A, 307 A, and 310 A.
  • the PCB 300 is used as a lower substrate of the package on package (POP) substrate.
  • the circuit patterns 304 A, 307 A, and 310 A are provided on the insulating layer 303 or on the insulation base members 306 , 309 , and 311 , and include second conductive layers having a second thermal expansion coefficient formed on the insulation base members 306 , 309 , and 311 and first conductive layers having a first thermal expansion coefficient formed on the second conductive layers.
  • the second and first conductive layers may be formed conversely.
  • the insulating layers 303 and 314 constituting the uppermost layers, have openings O and P, and a gold-plated layer 316 is formed in each of the openings O and P for a connection with solder balls.
  • a nickel layer 315 is thinly plated and the gold-plated layer 316 is formed on the nickel layer 316 .
  • two-storied (dual) metal layers 102 A′ ( 102 a ′ and 102 b ′) each having a different thermal expansion coefficient are formed.
  • a solder resist 103 ′ is formed on the two-storied metal layers 102 A′ ( 102 a ′ and 102 b ′) each having a different thermal expansion coefficient.
  • the solder resist 103 ′ is exposed and developed to form a solder resist pattern 103 having a desired pattern.
  • the two-storied metal layers 102 A′ ( 102 a ′ and 102 b ′) each having a different thermal expansion coefficient are etched to form the circuit pattern 102 A, on the upper portion of the insulation base member 101 , including the second conductive layer 102 b having the second thermal expansion coefficient formed on the insulation base member 101 and the first conductive layer 102 a formed on the second conductive layer 102 b and having the first thermal expansion coefficient smaller than the second thermal expansion coefficient, and the circuit pattern 102 A, on the lower portion of the insulation base member 101 , including the first conductive layer 102 a having the first thermal expansion coefficient formed on the insulation base member 101 and the second conductive layer 102 b formed on the first conductive layer 102 a and having the second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • the solder resist 105 is formed on the circuit pattern 102 A.
  • the solder resist 105 has openings O and P.
  • a gold-plated layer 107 is formed in each of the openings O and P for a connection with a semiconductor element or solder balls.
  • the nickel layer 106 is thinly plated and the gold-plated layer 107 is formed on the nickel layer 106 .
  • two-storied metal layers 304 A′ ( 304 a ′ and 304 b ′), each having a different thermal expansion coefficient, are formed on a carrier 301 with a copper layer 302 and a solder resist 303 ′ sequentially stacked thereon.
  • a solder resist 305 ′ is coated on the two-storied metal layer 304 A′ ( 304 a ′ an 304 b ′), each having a different thermal expansion coefficient, to form a solder resist pattern 305 having a desired pattern as shown in FIG. 5 b.
  • the two-storied metal layers 305 A′ ( 304 a ′ and 304 b ′), each having a different thermal expansion coefficient, are etched to form the circuit pattern 304 A made up of a second conductive layer 304 b formed on the carrier 301 and having a second thermal expansion coefficient and a first conductive layer 304 a formed on the second conductive layer 304 b and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • the solder resist pattern 305 is removed.
  • the insulating layer 306 (e.g., a pre-preg) is formed on the circuit pattern 304 A, and two-storied metal layers 307 A′ ( 307 a ′ and 307 b ′), each having a different thermal expansion coefficient, are then formed on the insulating layer 306 .
  • a solder resist 308 ′ is coated on the two-storied metal layers 307 A′ ( 307 a ′ and 307 b ′), each having a different thermal expansion coefficient, to form a solder resist pattern 308 having a desired pattern.
  • the two-storied metal layers 307 A′ ( 307 a ′ and 307 b ′), each having a different thermal expansion coefficient, are etched to form the circuit pattern 307 A made up of the second conductive layer 307 b formed on the insulating layer 306 and having the second thermal expansion coefficient and the first conductive layer 307 a formed on the second conductive layer 307 b and having the first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • the insulating layer 309 (e.g., a pre-preg) is formed on the circuit pattern 307 A, and two-storied metal layers 310 A′ ( 310 a ′ and 310 b ′), each having a different thermal expansion coefficient, are coated on the insulating layer 309 to form a solder resist pattern 311 having a desired pattern as shown in FIG. 5 h.
  • the two-storied metal layers 310 A′ ( 310 a ′ and 310 b ′), each having a different thermal expansion coefficient, are etched to form the circuit pattern 310 A made up of the second conductive layer 310 b formed on the insulating layer 309 and having the second thermal expansion coefficient and the first conductive layer 310 a formed on the second conductive layer 310 b and having the first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • the solder resist pattern 311 is removed.
  • the insulating layer 311 (e.g., a pre-preg) is formed on the circuit pattern 310 A, a metal layer 312 ′ and a solder resist 313 ′ are coated on the insulating layer 311 as shown in FIG. 5 k , and a solder resist pattern 313 having a desired pattern is then formed as shown in FIG. 51 .
  • the metal layer 312 ′ is etched to form a metal layer 312 , which is then connected with an external element.
  • a solder resist 314 ′ is coated on the metal layer 312 to form a solder resist pattern 314 having a desired pattern as shown in FIG. 5 n.
  • solder resist 303 ′ is patterned to form a solder resist pattern 303 having a desired pattern, which is then connected with an external element.
  • the solder resists 303 and 314 have the openings O and P, and a gold-plated layer 316 is formed in each of the openings O and P for a connection with solder balls. Also, in order to enhance adhesive properties with gold, preferably, the nickel layer 315 is thinly plated and the gold-plated layer 316 is formed on the nickel layer 315 .
  • the PCBs for fabricating a semiconductor package are exposed to a high heat during each fabrication process, the PCBs tend to be warped (bent) up (i.e., having a smiling shape when viewed from the side) or warped down (i.e., having a crying shape when viewed from the side).
  • the PCB mounted on the upper package substrate demonstrates behavior wherein it is warped in a smiling shape at room temperature and warped in a crying shape at a high temperature.
  • the PCB mounted on the lower package substrate demonstrates behavior wherein it is warped in a crying shape at room temperature and warped in a smiling shape at a high temperature.
  • the PCB mounted on the upper package substrate is configured to have the circuit pattern formed of a metal having a small thermal expansion coefficient and a metal having a large thermal expansion coefficient, which are installed such that the former (i.e., the metal having a small thermal expansion coefficient) comes on the surface on which a semiconductor device is to be mounted
  • the PCB mounted on the lower package substrate is configured to have the circuit pattern formed of a metal having a large thermal expansion coefficient and a metal having a small thermal expansion coefficient, which are positioned such that the former (i.e., metal having a large thermal expansion coefficient) is positioned on the surface on which the semiconductor device is to be mounted, whereby stress generated due to the warping behaviors in the different directions is canceled out to maintain the PCBs in a horizontal state, and accordingly, the warping phenomenon of the PCBs can be significantly reduced.
  • the PCB may further include a through hole formed to penetrate the insulation base member or at least one side of the insulating layer.
  • the processing rate and productivity can be improved.
  • the presence of the anti-warping unit disposed within the PCB according to the exemplary embodiments of the present invention leads to an improvement of the assembling characteristics, a processing time and cost can be accordingly reduced.
  • the PCB includes an anti-warping unit, a processing rate and productivity can be improved.
  • the assembling characteristics can be improved by having the anti-warping unit within the PCB, a processing time as well as a processing cost can be reduced.

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

A printed circuit board (PCB) and a fabrication method thereof are disclosed. The PCB includes: a dual-layered circuit pattern formed with a desired pattern on at least one of upper and lower surfaces of an insulation base member (i.e., an insulation substrate) and having metal layers each having a different thermal expansion coefficient; and an insulating layer formed on the insulation base member to cover the circuit pattern. Because the PCB includes an anti-warping unit, a processing rate and productivity can be improved.

Description

    CROSS-REFERENCE TO RELATED APPLICATIONS
  • This application claims the priority of Korean Patent Application No. 10-2009-0087148 filed on Sep. 15, 2009, in the Korean Intellectual Property Office, the disclosure of which is incorporated herein by reference.
  • BACKGROUND OF THE INVENTION
  • 1. Field of the Invention
  • The present invention relates to a printed circuit board and a fabrication method thereof and, more particularly, to a printed circuit board having an anti-warping unit to thereby improve a processing rate and productivity, and a fabrication method thereof.
  • 2. Description of the Related Art
  • Recently, substrate assemblers and manufacturers have turned much attention to an ultra-high mounting technique in line with a semiconductor package substrate which is increasingly lighter, thinner, shorter and smaller.
  • In particular, with respect to a soldering process performed for electrically bonding (or electrically joining) the semiconductor package substrate and a main board, the reduction in the thickness of the substrate highlights the importance of controlling warping in the semiconductor package substrate.
  • Semiconductor package substrate warping in the implementation of soldering greatly affects a processing rate and productivity.
  • In addition, the semiconductor package substrate warping causes solder balls to fail to be formed on a solder ball pad of the semiconductor substrate during the soldering process or the solder balls formed on a semiconductor element and the semiconductor package substrate to fail to be properly bonded when the semiconductor element is mounted, possibly resulting in a problematic state in which the semiconductor element and the semiconductor package substrate are not electrically connected.
  • The related art semiconductor package substrate generally includes a package area including a semiconductor element mounting part and an outer layer circuit pattern and a dummy area surrounding the package area.
  • The related art semiconductor package substrate improves warping by adjusting the thickness of the outer layer circuit pattern of the package area or the thickness of the solder resist layer of the dummy area such that overall balance within the semiconductor package substrate is maintained.
  • However, as the thickness of a copper clad laminate used as an inner layer core is reduced, the degree warping generation in the related art semiconductor package substrate increases, so it is difficult to improve the warping of the semiconductor package substrate by simply adjusting the thickness of the outer layer circuit pattern of the package area or the thickness of the solder resist layer of the dummy area.
  • SUMMARY OF THE INVENTION
  • An aspect of the present invention provides a printed circuit board (PCB) having an anti-warping unit to improve a processing rate and productivity, and a fabrication method thereof.
  • According to an aspect of the present invention, there is provided a printed circuit board (PCB) including: a dual-layered circuit pattern formed with a desired pattern on at least one of upper and lower surfaces of an insulation base member (i.e., an insulation substrate) and having metal layers each having a different thermal expansion coefficient; and an insulating layer formed on the insulation base member to cover the circuit pattern.
  • The circuit pattern may be provided on the upper surface of the insulation base member and include a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • The circuit pattern may be provided on the upper surface of the insulation base member and include a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • The circuit pattern may be provided on both of the upper and lower surfaces of the insulation base member, and the circuit pattern provided on the upper surface of the insulation base member may include a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient, and the circuit pattern provided on the lower surface of the insulation base member may include a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • The circuit pattern may be provided on both of the upper and lower surfaces of the insulation base member, and the circuit pattern provided on the upper surface of the insulation base member may include a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient, and the circuit pattern provided on the lower surface of the insulation base member may include a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • The first conductive layer may be made of invar or nickel, and the second conductive layer may be made of copper or a copper alloy.
  • The insulating layer may be a solder resist patterned to expose the circuit pattern.
  • The PCB may further include a through hole formed to penetrate the insulation base member or at least one surface of the insulating layer.
  • According to another aspect of the present invention, there is provided a method for fabricating a printed circuit board (PCB), including: forming a dual-layered circuit pattern with a desired pattern on at least one of upper and lower surfaces of an insulation base member and having metal layers each having a different thermal expansion coefficient; and forming an insulating layer on the insulation base member to cover the circuit pattern.
  • The circuit pattern may be provided on the upper surface of the insulation base member and include a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • The circuit pattern may be provided on the upper surface of the insulation base member and include a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • The circuit pattern may be provided on both of the upper and lower surfaces of the insulation base member, and the circuit pattern provided on the upper surface of the insulation base member may include a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient, and the circuit pattern provided on the lower surface of the insulation base member may include second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • The circuit pattern may be provided on both of the upper and lower surfaces of the insulation base member, and the circuit pattern provided on the upper surface of the insulation base member may include a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient, and the circuit pattern provided on the lower surface of the insulation base member may include a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • The first conductive layer may be made of invar or nickel, and the second conductive layer may be made of copper or a copper alloy.
  • The insulating layer may be a solder resist patterned to expose the circuit pattern.
  • The method may further include: forming a through hole penetrating the insulation base member or at least one surface of the insulating layer.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • The above and other aspects, features and other advantages of the present invention will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings, in which:
  • FIGS. 1 a and 1 b are schematic sectional views showing printed circuit boards (PCBs) with circuit patterns according to a first exemplary embodiment of the present invention;
  • FIGS. 2 a and 2 b are schematic sectional views showing printed circuit boards (PCBs) with circuit patterns according to a second exemplary embodiment of the present invention;
  • FIG. 3 is a schematic sectional view showing a printed circuit board (PCB) with circuit patterns according to a third exemplary embodiment of the present invention;
  • FIGS. 4 a to 4 e are sectional views sequentially showing the process of forming the PCB according to the first exemplary embodiment of the present invention; and
  • FIGS. 5 a to 5 p are sectional views sequentially showing the process of forming the PCB according to the third exemplary embodiment of the present invention.
  • DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
  • Exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. The invention may, however, be embodied in many different forms and should not be construed as being limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. In the drawings, the shapes and dimensions may be exaggerated for clarity, and the same reference numerals will be used throughout to designate the same or like components.
  • A printed circuit board (PCB) according to exemplary embodiments of the present invention will now be described with reference to FIGS. 1 to 3.
  • FIGS. 1 a and 1 b are schematic sectional views showing printed circuit boards (PCBs) with circuit patterns according to a first exemplary embodiment of the present invention. In the following description, a dual-layered PCB having circuit patterns will be taken as an example of the PCB according to the first exemplary embodiment of the present invention.
  • With reference to FIGS. 1 a and 1 b, PCBs 100A and 100B according to the first exemplary embodiment of the present invention, respectively, include dual- layered circuit patterns 102A and 102B formed so as to have a desired pattern on upper and lower surfaces of an insulation base member 101 and having metal layers each having a different thermal expansion coefficient, and an insulating layer 105 formed on the insulation base member 101 to cover the circuit patterns 102A and 102B.
  • Here, the PCB 100A is used as an upper substrate of a package on package (POP) substrate. The circuit pattern 102A is provided on both the upper and lower surfaces of the insulation base member 101. The circuit pattern 102A provided on the upper surface of the insulation base member 101 includes a second conductive layer 102 b formed on the insulation base member 101 and having a second thermal expansion coefficient and a first conductive layer 102 a formed on the second conductive layer 102 b and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient, and the circuit pattern 102A provided on the lower surface of the insulation base member 101 includes a first conductive layer 102 a formed on the insulation base member 101 and having a first thermal expansion coefficient and a second conductive layer 102 b formed on the first conductive layer 102 a and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • With reference to FIG. 1 b, the PCB 100B is used as a lower substrate of a package on package (POP) substrate. The circuit pattern 102B is provided on both the upper and lower surfaces of the insulation base member 101. The circuit pattern 102B provided on the upper surface of the insulation base member 101 includes a first conductive layer 102 a formed on the insulation base member 101 and having a first thermal expansion coefficient and a second conductive layer 102 b formed on the first conductive layer 102 a and having a second thermal expansion coefficient greater than the first thermal expansion coefficient, and the circuit pattern 102A provided on the lower surface of the insulation base member 101 includes a second conductive layer 102 b formed on the insulation base member 101 and having a second thermal expansion coefficient and a first conductive layer 102 a formed on the second conductive layer 102 b and having a first thermal expansion coefficient smaller than the first thermal expansion coefficient.
  • The circuit patterns 102A and 102B according to the first exemplary embodiment of the present invention may be formed of any metal so long as it has properties allowing it to constitute the first conductive layer 102 a having the first thermal expansion coefficient or the second conductive layer 102 b having the second thermal expansion coefficient greater than the first thermal expansion coefficient. For example, the circuit patterns 102A and 102B according to the first exemplary embodiment of the present invention may include the first conductive layer 102 a made of invar or nickel (Ni) having a small thermal expansion coefficient, and the second conductive layer 102 b made of copper or a copper alloy having a thermal expansion coefficient greater than that of invar or nickel.
  • In general, as the PCBs used for fabricating a semiconductor package are exposed to a high heat during each fabrication process, the PCBs tend to be warped (bent) upwards (i.e., having a smiling shape when viewed from the side) or warped down (i.e., having a crying shape when viewed from the side).
  • In detail, the PCB mounted on the upper package substrate demonstrates behavior wherein it is warped in a smiling shape at room temperature and warped in a crying shape at a high temperature. In contrast to the behavior of the upper package substrate, the PCB mounted on the lower package substrate demonstrates behavior wherein it is warped in a crying shape at room temperature and warped in a smiling shape at a high temperature.
  • Thus, in order to prevent the PCBs from being warped while they undergo a high temperature process or a reflow process during the semiconductor package fabrication process, the PCB mounted on the upper package substrate is configured to have the circuit pattern formed of a metal having a small thermal expansion coefficient and a metal having a large thermal expansion coefficient, which are installed such that the former (i.e., the metal having a small thermal expansion coefficient) is positioned as the surface on which a semiconductor device is to be mounted, and conversely, the PCB mounted on the lower package substrate is configured to have the circuit pattern formed of a metal having a large thermal expansion coefficient and a metal having a small thermal expansion coefficient, which are positioned such that the former (i.e., metal having a large thermal expansion coefficient) is positioned as the surface on which the semiconductor device is to be mounted, whereby stress generated due to the warping behaviors in the different directions is canceled out to maintain the PCBs in a horizontal state, and accordingly, the warping phenomenon of the PCBs can be significantly reduced.
  • Here, the insulating layers 105 are formed on the insulation base member 101 and have openings O and P exposing the circuit patterns 102A and 102B so as to be bonded with solder balls. The insulating layers 105 may be formed as a patterned solder resist. Here, a gold-plated layer 107 is formed in each of the openings O and P for a connection with a semiconductor element or solder balls. Also, in order to enhance adhesive properties with gold, preferably, a nickel layer 106 is thinly plated and the gold-plated layer 107 is formed on the nickel layer 106.
  • FIGS. 2 a and 2 b are schematic sectional views showing PCBs with circuit patterns according to a second exemplary embodiment of the present invention. The PCBs 200A and 200B according to the second exemplary embodiment of the present invention is a four-layered PCB with circuit patterns.
  • With reference to FIG. 2 a, the PCB 200A according to the second exemplary embodiment of the present invention includes dual-layered circuit patterns 202A and 206A formed to have a desired pattern on upper and lower surfaces of an insulation base member 201 and having metal layers each having a different thermal expansion coefficient, and insulating layers 205 and 207 formed on the insulation base member 201 to cover the circuit patterns 202A and 206A.
  • Unlike the first exemplary embodiment, the circuit pattern 206A and the insulating layers 207 are formed on the insulating layer 205 which is not patterned.
  • Here, the PCB 200A is used as an upper substrate of a package on package (POP) substrate. The circuit patterns 202A and 206A are provided with a desired pattern on both the upper and lower surfaces of the insulation base member 201. The circuit patterns 202A and 206A provided on the upper surface of the insulation base member 201 include second conductive layers 202 b and 206 b formed on the insulation base member 201 and having a second thermal expansion coefficient and first conductive layers 202 a and 206 a formed on the second conductive layers 202 b and 206 b and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient, and the circuit patterns 202A and 206A provided on the lower surface of the insulation base member 201 include first conductive layers 202 a and 206 a formed on the insulation base member 201 and having a first thermal expansion coefficient and second conductive layers 202 b and 206 b formed on the first conductive layers 202 a and 206 a and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • Like those of the first exemplary embodiment, the insulating layers 207 have openings O and P exposing the circuit patterns 206A so as to be bonded with solder balls. The insulating layers 207 may be formed as a patterned solder resist. Here, a gold-plated layer 209 is formed in each of the openings O and P for a connection with a semiconductor element or solder balls. Also, in order to enhance adhesive properties with gold, preferably, a nickel layer 208 is thinly plated and the gold-plated layer 209 is formed on the nickel layer 208.
  • With reference to FIG. 2 b, the PCB 200B is used as a lower substrate of the package on package (POP) substrate. The circuit patterns 202B and 206B are provided with a desired pattern on both the upper and lower surfaces of the insulation base member 201. The circuit patterns 202B and 206B provided on the upper surface of the insulation base member 201 include first conductive layers 202 a and 206 a formed on the insulation base member 201 and having a first thermal expansion coefficient and second conductive layers 202 b and 206 b formed on the first conductive layers 202 a and 206 a and having a second thermal expansion coefficient greater than the first thermal expansion coefficient, and the circuit patterns 202B and 206B provided on the lower surface of the insulation base member 201 include second conductive layers 202 b and 206 b formed on the insulation base member 201 and having a second thermal expansion coefficient and first conductive layers 202 a and 206 a formed on the second conductive layers 202 b and 206 b and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • Like those of the first exemplary embodiment, the insulating layers 207 have openings O and P exposing the circuit patterns 206A so as to be bonded with solder balls. The insulating layers 207 may be formed as patterned solder resists. Here, a gold-plated layer 209 is formed in each of the openings O and P for a connection with a semiconductor element or solder balls. Also, in order to enhance adhesive properties with gold, preferably, a nickel layer 208 is thinly plated and the gold-plated layer 209 is formed on the nickel layer 208.
  • In general, as the PCBs for fabricating a semiconductor package are exposed to a high heat during each fabrication process, the PCBs tend to be warped (bent) up (i.e., having a smiling shape when viewed from the side) or warped down (i.e., having a crying shape when viewed from the side).
  • In detail, the PCB mounted on the upper package substrate demonstrates behavior wherein it is warped in a smiling shape at room temperature and warped in a crying shape at a high temperature. In contrast to the behavior of the upper package substrate, the PCB mounted on the lower package substrate demonstrates behavior wherein it is warped in a crying shape at room temperature and warped in a smiling shape at a high temperature.
  • Thus, in order to prevent the PCBs from being warped while they undergo a high temperature process or a reflow process during the semiconductor package fabrication process, the PCB mounted on the upper package substrate is configured to have the circuit pattern formed of a metal having a small thermal expansion coefficient and a metal having a large thermal expansion coefficient, which are installed such that the former (i.e., the metal having a small thermal expansion coefficient) is positioned on the surface on which a semiconductor device is to be mounted, and conversely, the PCB mounted on the lower package substrate is configured to have the circuit pattern formed of a metal having a large thermal expansion coefficient and a metal having a small thermal expansion coefficient, which are positioned such that the former (i.e., metal having a large thermal expansion coefficient) is positioned on the surface on which the semiconductor device is to be mounted, whereby stress generated due to the warping behaviors in the different directions is canceled out to maintain the PCBs in a horizontal state, and accordingly, the warping phenomenon of the PCBs can be significantly reduced.
  • FIG. 3 is a schematic sectional view showing a printed circuit board (PCB) with circuit patterns according to a third exemplary embodiment of the present invention. The PCB according to the third exemplary embodiment of the present invention is a four-layered PCB with circuit patterns.
  • Unlike the four-layered PCB according to the second exemplary embodiment of the present invention, the PCB 300 according to the third exemplary embodiment of the present invention is configured such that circuit patterns are formed only on one side of insulation base members, rather than formed on both sides of the insulation base members.
  • With reference to FIG. 3, in the PCB 300, desired patterns are formed on an insulating layer 303 or on one surface of each of the insulation base members 306, 309, and 311. That is, the PCB 300 includes dual-layered circuit patterns 304A, 307A, and 310A with metal layers each having a different thermal expansion coefficient and insulation base members 306, 309, 311, and 314 covering the circuit patterns 304A, 307A, and 310A.
  • Here, the PCB 300 is used as a lower substrate of the package on package (POP) substrate. The circuit patterns 304A, 307A, and 310A are provided on the insulating layer 303 or on the insulation base members 306, 309, and 311, and include second conductive layers having a second thermal expansion coefficient formed on the insulation base members 306, 309, and 311 and first conductive layers having a first thermal expansion coefficient formed on the second conductive layers. When the PCB 300 is used as a lower substrate of the POP substrate, the second and first conductive layers may be formed conversely.
  • Like those of the former exemplary embodiment, the insulating layers 303 and 314, constituting the uppermost layers, have openings O and P, and a gold-plated layer 316 is formed in each of the openings O and P for a connection with solder balls. Also, in order to enhance adhesive properties with gold, preferably, a nickel layer 315 is thinly plated and the gold-plated layer 316 is formed on the nickel layer 316.
  • The process of forming the PCB according to the first exemplary embodiment of the present invention will now be described with reference to FIGS. 4 a to 4 e.
  • As shown in FIG. 4 a, in order to form desired circuit patterns on the upper and lower surfaces of the insulation base member 101, two-storied (dual) metal layers 102A′ (102 a′ and 102 b′) each having a different thermal expansion coefficient are formed.
  • Next, as shown in FIG. 4 b, a solder resist 103′ is formed on the two-storied metal layers 102A′ (102 a′ and 102 b′) each having a different thermal expansion coefficient.
  • Then, as shown in FIG. 4 c, the solder resist 103′ is exposed and developed to form a solder resist pattern 103 having a desired pattern. Thereafter, as shown in FIG. 4 d, the two-storied metal layers 102A′ (102 a′ and 102 b′) each having a different thermal expansion coefficient are etched to form the circuit pattern 102A, on the upper portion of the insulation base member 101, including the second conductive layer 102 b having the second thermal expansion coefficient formed on the insulation base member 101 and the first conductive layer 102 a formed on the second conductive layer 102 b and having the first thermal expansion coefficient smaller than the second thermal expansion coefficient, and the circuit pattern 102A, on the lower portion of the insulation base member 101, including the first conductive layer 102 a having the first thermal expansion coefficient formed on the insulation base member 101 and the second conductive layer 102 b formed on the first conductive layer 102 a and having the second thermal expansion coefficient greater than the first thermal expansion coefficient.
  • Subsequently, as shown in FIG. 4 e, the solder resist 105 is formed on the circuit pattern 102A. The solder resist 105 has openings O and P. A gold-plated layer 107 is formed in each of the openings O and P for a connection with a semiconductor element or solder balls. Also, in order to enhance adhesive properties with gold, preferably, the nickel layer 106 is thinly plated and the gold-plated layer 107 is formed on the nickel layer 106.
  • The process of forming the PCB according to the third exemplary embodiment of the present invention will now be described with reference to FIGS. 5 a to 5 p.
  • As shown in FIG. 5 a, first, two-storied metal layers 304A′ (304 a′ and 304 b′), each having a different thermal expansion coefficient, are formed on a carrier 301 with a copper layer 302 and a solder resist 303′ sequentially stacked thereon. Next, a solder resist 305′ is coated on the two-storied metal layer 304A′ (304 a′ an 304 b′), each having a different thermal expansion coefficient, to form a solder resist pattern 305 having a desired pattern as shown in FIG. 5 b.
  • And then, as shown in FIG. 5 c, the two-storied metal layers 305A′ (304 a′ and 304 b′), each having a different thermal expansion coefficient, are etched to form the circuit pattern 304A made up of a second conductive layer 304 b formed on the carrier 301 and having a second thermal expansion coefficient and a first conductive layer 304 a formed on the second conductive layer 304 b and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient. Thereafter, the solder resist pattern 305 is removed.
  • Subsequently, as shown in FIG. 5 d, the insulating layer 306 (e.g., a pre-preg) is formed on the circuit pattern 304A, and two-storied metal layers 307A′ (307 a′ and 307 b′), each having a different thermal expansion coefficient, are then formed on the insulating layer 306. Then, a solder resist 308′ is coated on the two-storied metal layers 307A′ (307 a′ and 307 b′), each having a different thermal expansion coefficient, to form a solder resist pattern 308 having a desired pattern.
  • Thereafter, as shown in FIG. 5 f, the two-storied metal layers 307A′ (307 a′ and 307 b′), each having a different thermal expansion coefficient, are etched to form the circuit pattern 307A made up of the second conductive layer 307 b formed on the insulating layer 306 and having the second thermal expansion coefficient and the first conductive layer 307 a formed on the second conductive layer 307 b and having the first thermal expansion coefficient smaller than the second thermal expansion coefficient.
  • As shown in FIG. 5 g, the insulating layer 309 (e.g., a pre-preg) is formed on the circuit pattern 307A, and two-storied metal layers 310A′ (310 a′ and 310 b′), each having a different thermal expansion coefficient, are coated on the insulating layer 309 to form a solder resist pattern 311 having a desired pattern as shown in FIG. 5 h.
  • And then, as shown in FIG. 5 i, the two-storied metal layers 310A′ (310 a′ and 310 b′), each having a different thermal expansion coefficient, are etched to form the circuit pattern 310A made up of the second conductive layer 310 b formed on the insulating layer 309 and having the second thermal expansion coefficient and the first conductive layer 310 a formed on the second conductive layer 310 b and having the first thermal expansion coefficient smaller than the second thermal expansion coefficient. Thereafter, the solder resist pattern 311 is removed.
  • Next, as shown in FIG. 5 j, the insulating layer 311 (e.g., a pre-preg) is formed on the circuit pattern 310A, a metal layer 312′ and a solder resist 313′ are coated on the insulating layer 311 as shown in FIG. 5 k, and a solder resist pattern 313 having a desired pattern is then formed as shown in FIG. 51.
  • Then, as shown in FIG. 5 m, the metal layer 312′ is etched to form a metal layer 312, which is then connected with an external element. Next, a solder resist 314′ is coated on the metal layer 312 to form a solder resist pattern 314 having a desired pattern as shown in FIG. 5 n.
  • Thereafter, as shown in FIG. 5 o, the carrier 301 and the copper layer 302 are removed, the solder resist 303′ is patterned to form a solder resist pattern 303 having a desired pattern, which is then connected with an external element.
  • The solder resists 303 and 314 have the openings O and P, and a gold-plated layer 316 is formed in each of the openings O and P for a connection with solder balls. Also, in order to enhance adhesive properties with gold, preferably, the nickel layer 315 is thinly plated and the gold-plated layer 316 is formed on the nickel layer 315.
  • In general, as the PCBs for fabricating a semiconductor package are exposed to a high heat during each fabrication process, the PCBs tend to be warped (bent) up (i.e., having a smiling shape when viewed from the side) or warped down (i.e., having a crying shape when viewed from the side).
  • In detail, the PCB mounted on the upper package substrate demonstrates behavior wherein it is warped in a smiling shape at room temperature and warped in a crying shape at a high temperature. In contrast to the behavior of the upper package substrate, the PCB mounted on the lower package substrate demonstrates behavior wherein it is warped in a crying shape at room temperature and warped in a smiling shape at a high temperature.
  • Thus, in order to prevent the PCBs from being warped while they undergo a high temperature process or a reflow process during the semiconductor package fabrication process, the PCB mounted on the upper package substrate is configured to have the circuit pattern formed of a metal having a small thermal expansion coefficient and a metal having a large thermal expansion coefficient, which are installed such that the former (i.e., the metal having a small thermal expansion coefficient) comes on the surface on which a semiconductor device is to be mounted, and conversely, the PCB mounted on the lower package substrate is configured to have the circuit pattern formed of a metal having a large thermal expansion coefficient and a metal having a small thermal expansion coefficient, which are positioned such that the former (i.e., metal having a large thermal expansion coefficient) is positioned on the surface on which the semiconductor device is to be mounted, whereby stress generated due to the warping behaviors in the different directions is canceled out to maintain the PCBs in a horizontal state, and accordingly, the warping phenomenon of the PCBs can be significantly reduced.
  • In the entire exemplary embodiments, the PCB may further include a through hole formed to penetrate the insulation base member or at least one side of the insulating layer.
  • As described above, because the PCB according to the exemplary embodiments of the present invention has the anti-warping unit, the processing rate and productivity can be improved.
  • Also, because the presence of the anti-warping unit disposed within the PCB according to the exemplary embodiments of the present invention leads to an improvement of the assembling characteristics, a processing time and cost can be accordingly reduced.
  • As set forth above, according to exemplary embodiments of the invention, because the PCB includes an anti-warping unit, a processing rate and productivity can be improved.
  • Also, because the assembling characteristics can be improved by having the anti-warping unit within the PCB, a processing time as well as a processing cost can be reduced.
  • While the present invention has been shown and described in connection with the exemplary embodiments, it will be apparent to those skilled in the art that modifications and variations can be made without departing from the spirit and scope of the invention as defined by the appended claims.

Claims (16)

1. A printed circuit board (PCB) comprising:
a dual-layered circuit pattern formed of a desired pattern on at least one of upper and lower surfaces of an insulation base member (i.e., an insulation substrate) and having metal layers each having a different thermal expansion coefficient; and
an insulating layer formed on the insulation base member to cover the circuit pattern.
2. The printed circuit board of claim 1, wherein the circuit pattern is provided on the upper surface of the insulation base member and includes a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
3. The printed circuit board of claim 1, wherein the circuit pattern is provided on the upper surface of the insulation base member and includes a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
4. The printed circuit board of claim 1, wherein the circuit pattern is provided on both of the upper and lower surfaces of the insulation base member, and the circuit pattern provided on the upper surface of the insulation base member comprises a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient, and the circuit pattern provided on the lower surface of the insulation base member comprises a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
5. The printed circuit board of claim 1, wherein the circuit pattern is provided on both of the upper and lower surfaces of the insulation base member, and the circuit pattern provided on the upper surface of the insulation base member comprises a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient, and the circuit pattern provided on the lower surface of the insulation base member comprises a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
6. The printed circuit board of claim 1, wherein the first conductive layer is made of invar or nickel, and the second conductive layer is made of copper or a copper alloy.
7. The printed circuit board of claim 1, wherein the insulating layer is solder resist patterned to expose the circuit pattern.
8. The printed circuit board of claim 1, further comprising:
a through hole formed to penetrate the insulation base member or at least one surface of the insulating layer.
9. A method for fabricating a printed circuit board (PCB), the method comprising:
forming a dual-layered circuit pattern with a desired pattern on at least one of upper and lower surfaces of an insulation base member and having metal layers each having a different thermal expansion coefficient; and
forming an insulating layer on the insulation base member to cover the circuit pattern.
10. The method of claim 9, wherein the circuit pattern is provided on the upper surface of the insulation base member and comprises a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
11. The method of claim 9, wherein the circuit pattern is provided on the upper surface of the insulation base member and includes a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
12. The method of claim 9, wherein the circuit pattern is provided on both of the upper and lower surfaces of the insulation base member, and the circuit pattern provided on the upper surface of the insulation base member includes a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient, and the circuit pattern provided on the lower surface of the insulation base member comprises a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient.
13. The method of claim 9, wherein the circuit pattern is provided on both of the upper and lower surfaces of the insulation base member, and the circuit pattern provided on the upper surface of the insulation base member comprises a second conductive layer formed on the insulation base member and having a second thermal expansion coefficient and a first conductive layer formed on the second conductive layer and having a first thermal expansion coefficient smaller than the second thermal expansion coefficient, and the circuit pattern provided on the lower surface of the insulation base member comprises a first conductive layer formed on the insulation base member and having a first thermal expansion coefficient and a second conductive layer formed on the first conductive layer and having a second thermal expansion coefficient greater than the first thermal expansion coefficient.
14. The method of claim 9, wherein the first conductive layer is made of invar or nickel, and the second conductive layer is made of copper or a copper alloy.
15. The method of claim 9, wherein the insulating layer is formed of solder resist patterned to expose the circuit pattern.
16. The method of claim 9, further comprising:
forming a through hole penetrating the insulation base member or at least one surface of the insulating layer.
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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8883016B2 (en) 2010-01-07 2014-11-11 Samsung Electro-Mechanics Co., Ltd. Carrier for manufacturing printed circuit board, method of manufacturing the same and method of manufacturing printed circuit board using the same
US20150282314A1 (en) * 2014-03-31 2015-10-01 Ibiden Co., Ltd. Method for manufacturing printed wiring board with conductive post and printed wiring board with conductive post
US9543255B2 (en) 2014-12-02 2017-01-10 International Business Machines Corporation Reduced-warpage laminate structure
FR3061989A1 (en) * 2017-01-18 2018-07-20 Safran METHOD FOR MANUFACTURING ADDITIVE MANUFACTURING ELECTRONIC POWER MODULE, SUBSTRATE AND MODULE THEREFOR
JP2019029637A (en) * 2017-07-28 2019-02-21 サムソン エレクトロ−メカニックス カンパニーリミテッド. Printed circuit board
US11147851B2 (en) * 2016-12-05 2021-10-19 Safran Method of fabricating an electronic power module by additive manufacturing, and associated substrate and module
US20230005817A1 (en) * 2021-07-01 2023-01-05 Changxin Memory Technologies. Inc. Method of manufacturing a semiconductor device and a semiconductor device

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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WO2023101442A1 (en) * 2021-11-30 2023-06-08 엘지이노텍 주식회사 Semiconductor package

Citations (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5536908A (en) * 1993-01-05 1996-07-16 Schlumberger Technology Corporation Lead-free printed circuit assembly
US6015482A (en) * 1997-12-18 2000-01-18 Circuit Research Corp. Printed circuit manufacturing process using tin-nickel plating
US6175152B1 (en) * 1998-06-25 2001-01-16 Citizen Watch Co., Ltd. Semiconductor device
US6217987B1 (en) * 1996-11-20 2001-04-17 Ibiden Co. Ltd. Solder resist composition and printed circuit boards
US6258449B1 (en) * 1998-06-09 2001-07-10 Nitto Denko Corporation Low-thermal expansion circuit board and multilayer circuit board
US6358630B1 (en) * 1997-06-04 2002-03-19 Ibiden Co., Ltd. Soldering member for printed wiring boards
US20020112885A1 (en) * 1999-02-10 2002-08-22 Sinichi Hotta Printed circuit board and method for manufacturing same
US6441486B1 (en) * 2001-03-19 2002-08-27 Texas Instruments Incorporated BGA substrate via structure
US20030089521A1 (en) * 2001-11-13 2003-05-15 Lg Electronics Inc. Bonding pad(s) for a printed circuit board and a method for forming bonding pad(s)
US20030113955A1 (en) * 2001-12-18 2003-06-19 Lg Electronics Inc. Method for fabricating semiconductor package and semiconductor package
US20030132025A1 (en) * 1996-12-19 2003-07-17 Ibiden Co., Ltd. Printed circuit boards and method of producing the same
US20030188886A1 (en) * 2002-04-09 2003-10-09 International Business Machines Corporation Printed wiring board with conformally plated circuit traces
US20040150080A1 (en) * 2002-12-30 2004-08-05 Jong-Jin Lee Package substrate for electrolytic leadless plating and manufacturing method thereof
US20040194303A1 (en) * 2003-04-02 2004-10-07 Samsung Electro-Mechanics Co., Ltd. Method of fabricating multi-layered printed circuit board
US20040227239A1 (en) * 2003-03-18 2004-11-18 Ngk Spark Plug Co., Ltd. Wiring board
US6879041B2 (en) * 2002-04-17 2005-04-12 Renesas Technology Corp. Semiconductor device with joint structure having lead-free solder layer over nickel layer
US20050102831A1 (en) * 2003-11-18 2005-05-19 Hajime Saiki Process for manufacturing a wiring substrate
US6915566B2 (en) * 1999-03-01 2005-07-12 Texas Instruments Incorporated Method of fabricating flexible circuits for integrated circuit interconnections
US20050230835A1 (en) * 2004-04-20 2005-10-20 Shinko Electric Industries Co., Ltd. Semiconductor device
US20050241954A1 (en) * 2004-05-03 2005-11-03 Samsung Electro-Mechanics Co., Ltd. Electrolytic gold plating method of printed circuit board
US20050253284A1 (en) * 2004-05-12 2005-11-17 Siliconware Precision Industries Co., Ltd. Semiconductor package and method for fabricating the same
US20060060558A1 (en) * 2004-09-21 2006-03-23 Samsung Electro-Mechanics Co., Ltd. Method of fabricating package substrate using electroless nickel plating
US20060289203A1 (en) * 2003-05-19 2006-12-28 Dai Nippon Printing Co., Ltd. Double-sided wiring board, double sided wiring board manufacturing method, and multilayer wiring board
US20070289127A1 (en) * 2006-04-20 2007-12-20 Amitec- Advanced Multilayer Interconnect Technologies Ltd Coreless cavity substrates for chip packaging and their fabrication
US20080289864A1 (en) * 1998-09-28 2008-11-27 Ibiden Co., Ltd Printed wiring board and method for producing the same
US20090174045A1 (en) * 2008-01-03 2009-07-09 International Business Machines Corporation Bump Pad Metallurgy Employing An Electrolytic Cu / Electorlytic Ni / Electrolytic Cu Stack
US20100059785A1 (en) * 2008-09-05 2010-03-11 Advanced Optoelectronic Technology Inc. Light emitting device and method of fabricating the same
US20100065322A1 (en) * 2008-09-12 2010-03-18 Shinko Electric Industries Co., Ltd. Wiring board and method of manufacturing the same
US7692103B2 (en) * 2003-11-18 2010-04-06 Ngk Spark Plug Co., Ltd. Wiring substrate and manufacturing process of the same

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL137026A (en) * 1998-11-18 2004-02-19 Daiwa Kk Method of manufacturing multilayer wiring boards

Patent Citations (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5536908A (en) * 1993-01-05 1996-07-16 Schlumberger Technology Corporation Lead-free printed circuit assembly
US6217987B1 (en) * 1996-11-20 2001-04-17 Ibiden Co. Ltd. Solder resist composition and printed circuit boards
US20070062729A1 (en) * 1996-12-19 2007-03-22 Ibiden Co., Ltd. Printed wiring board and method for manufacturing the same
US20070056767A1 (en) * 1996-12-19 2007-03-15 Ibiden Co., Ltd. Printed wiring board and method for manufacturing the same
US20070056924A1 (en) * 1996-12-19 2007-03-15 Ibiden Co., Ltd. Printed wiring board and method for manufacturing the same
US20060032668A1 (en) * 1996-12-19 2006-02-16 Ibiden Co., Ltd. Printed circuit boards and method of producing the same
US20070051694A1 (en) * 1996-12-19 2007-03-08 Ibiden Co., Ltd. Printed wiring board and method for manufacturing the same
US20030132025A1 (en) * 1996-12-19 2003-07-17 Ibiden Co., Ltd. Printed circuit boards and method of producing the same
US20070062728A1 (en) * 1996-12-19 2007-03-22 Ibiden Co., Ltd. Printed wiring board and method for manufacturing the same
US20070062724A1 (en) * 1996-12-19 2007-03-22 Ibiden Co., Ltd. Printed wiring board and method for manufacturing the same
US6358630B1 (en) * 1997-06-04 2002-03-19 Ibiden Co., Ltd. Soldering member for printed wiring boards
US6015482A (en) * 1997-12-18 2000-01-18 Circuit Research Corp. Printed circuit manufacturing process using tin-nickel plating
US6258449B1 (en) * 1998-06-09 2001-07-10 Nitto Denko Corporation Low-thermal expansion circuit board and multilayer circuit board
US6175152B1 (en) * 1998-06-25 2001-01-16 Citizen Watch Co., Ltd. Semiconductor device
US20080289864A1 (en) * 1998-09-28 2008-11-27 Ibiden Co., Ltd Printed wiring board and method for producing the same
US20020112885A1 (en) * 1999-02-10 2002-08-22 Sinichi Hotta Printed circuit board and method for manufacturing same
US6915566B2 (en) * 1999-03-01 2005-07-12 Texas Instruments Incorporated Method of fabricating flexible circuits for integrated circuit interconnections
US6441486B1 (en) * 2001-03-19 2002-08-27 Texas Instruments Incorporated BGA substrate via structure
US6989606B2 (en) * 2001-03-19 2006-01-24 Texas Instruments Incorporated BGA substrate via structure
US20040200726A1 (en) * 2001-11-13 2004-10-14 Lg Electronics Inc. Method for forming bonding pads
US20030089521A1 (en) * 2001-11-13 2003-05-15 Lg Electronics Inc. Bonding pad(s) for a printed circuit board and a method for forming bonding pad(s)
US20040135246A1 (en) * 2001-12-18 2004-07-15 Lg Electronics Inc. Method for fabricating semiconductor package and semiconductor package
US20030113955A1 (en) * 2001-12-18 2003-06-19 Lg Electronics Inc. Method for fabricating semiconductor package and semiconductor package
US20030188886A1 (en) * 2002-04-09 2003-10-09 International Business Machines Corporation Printed wiring board with conformally plated circuit traces
US6879041B2 (en) * 2002-04-17 2005-04-12 Renesas Technology Corp. Semiconductor device with joint structure having lead-free solder layer over nickel layer
US20040150080A1 (en) * 2002-12-30 2004-08-05 Jong-Jin Lee Package substrate for electrolytic leadless plating and manufacturing method thereof
US20040227239A1 (en) * 2003-03-18 2004-11-18 Ngk Spark Plug Co., Ltd. Wiring board
US20040194303A1 (en) * 2003-04-02 2004-10-07 Samsung Electro-Mechanics Co., Ltd. Method of fabricating multi-layered printed circuit board
US20060289203A1 (en) * 2003-05-19 2006-12-28 Dai Nippon Printing Co., Ltd. Double-sided wiring board, double sided wiring board manufacturing method, and multilayer wiring board
US20050102831A1 (en) * 2003-11-18 2005-05-19 Hajime Saiki Process for manufacturing a wiring substrate
US7692103B2 (en) * 2003-11-18 2010-04-06 Ngk Spark Plug Co., Ltd. Wiring substrate and manufacturing process of the same
US20050230835A1 (en) * 2004-04-20 2005-10-20 Shinko Electric Industries Co., Ltd. Semiconductor device
US20050241954A1 (en) * 2004-05-03 2005-11-03 Samsung Electro-Mechanics Co., Ltd. Electrolytic gold plating method of printed circuit board
US20050253284A1 (en) * 2004-05-12 2005-11-17 Siliconware Precision Industries Co., Ltd. Semiconductor package and method for fabricating the same
US20080160678A1 (en) * 2004-05-12 2008-07-03 Siliconware Precision Industries Co., Ltd. Method for fabricating semiconductor package
US20060060558A1 (en) * 2004-09-21 2006-03-23 Samsung Electro-Mechanics Co., Ltd. Method of fabricating package substrate using electroless nickel plating
US20070289127A1 (en) * 2006-04-20 2007-12-20 Amitec- Advanced Multilayer Interconnect Technologies Ltd Coreless cavity substrates for chip packaging and their fabrication
US20090174045A1 (en) * 2008-01-03 2009-07-09 International Business Machines Corporation Bump Pad Metallurgy Employing An Electrolytic Cu / Electorlytic Ni / Electrolytic Cu Stack
US20100059785A1 (en) * 2008-09-05 2010-03-11 Advanced Optoelectronic Technology Inc. Light emitting device and method of fabricating the same
US20100065322A1 (en) * 2008-09-12 2010-03-18 Shinko Electric Industries Co., Ltd. Wiring board and method of manufacturing the same

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8883016B2 (en) 2010-01-07 2014-11-11 Samsung Electro-Mechanics Co., Ltd. Carrier for manufacturing printed circuit board, method of manufacturing the same and method of manufacturing printed circuit board using the same
US20150282314A1 (en) * 2014-03-31 2015-10-01 Ibiden Co., Ltd. Method for manufacturing printed wiring board with conductive post and printed wiring board with conductive post
US9713267B2 (en) * 2014-03-31 2017-07-18 Ibiden Co., Ltd. Method for manufacturing printed wiring board with conductive post and printed wiring board with conductive post
US10685919B2 (en) 2014-12-02 2020-06-16 International Business Machines Corporation Reduced-warpage laminate structure
US9543255B2 (en) 2014-12-02 2017-01-10 International Business Machines Corporation Reduced-warpage laminate structure
US9613915B2 (en) * 2014-12-02 2017-04-04 International Business Machines Corporation Reduced-warpage laminate structure
US11147851B2 (en) * 2016-12-05 2021-10-19 Safran Method of fabricating an electronic power module by additive manufacturing, and associated substrate and module
WO2018134495A1 (en) * 2017-01-18 2018-07-26 Safran Process for manufacturing a power electronic module by additive manufacturing, associated module and substrate
FR3061989A1 (en) * 2017-01-18 2018-07-20 Safran METHOD FOR MANUFACTURING ADDITIVE MANUFACTURING ELECTRONIC POWER MODULE, SUBSTRATE AND MODULE THEREFOR
US20220000965A1 (en) * 2017-01-18 2022-01-06 Safran Method of fabricating an electronic power module by additive manufacturing, and associated substrate and module
US11594475B2 (en) * 2017-01-18 2023-02-28 Safran Method of fabricating an electronic power module by additive manufacturing, and associated substrate and module
JP2019029637A (en) * 2017-07-28 2019-02-21 サムソン エレクトロ−メカニックス カンパニーリミテッド. Printed circuit board
JP7073602B2 (en) 2017-07-28 2022-05-24 サムソン エレクトロ-メカニックス カンパニーリミテッド. Printed circuit board
US20230005817A1 (en) * 2021-07-01 2023-01-05 Changxin Memory Technologies. Inc. Method of manufacturing a semiconductor device and a semiconductor device
US12094804B2 (en) * 2021-07-01 2024-09-17 Changxin Memory Technologies, Inc. Method of manufacturing a semiconductor device and a semiconductor device

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