FI20031658L - Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti - Google Patents

Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti Download PDF

Info

Publication number: FI20031658L
Authority: FI; Finland
Prior art keywords: mass spectrometry; examining samples; examining; samples; spectrometry
Prior art date: 2003-11-14

Application number

FI20031658A

Other languages

English (en)

Swedish (sv)

Other versions

FI20031658A0 (fi

FI119747B (fi

Inventor

Risto Kostiainen

Samuli Franssila

Tapio Kotiaho

Seppo Marttila

Original Assignee

Licentia Oy

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2003-11-14

Filing date

2003-11-14

Publication date

2005-05-15

2003-11-14 Application filed by Licentia Oy filed Critical Licentia Oy

2003-11-14 Priority to FI20031658A priority Critical patent/FI119747B/fi

2003-11-14 Publication of FI20031658A0 publication Critical patent/FI20031658A0/fi

2004-11-15 Priority to CA002545368A priority patent/CA2545368A1/en

2004-11-15 Priority to JP2006538878A priority patent/JP4767864B2/ja

2004-11-15 Priority to US10/579,225 priority patent/US7863559B2/en

2004-11-15 Priority to PCT/FI2004/000683 priority patent/WO2005047848A2/en

2004-11-15 Priority to EP04798292A priority patent/EP1683179A2/en

2005-05-15 Publication of FI20031658L publication Critical patent/FI20031658L/fi

2009-02-27 Application granted granted Critical

2009-02-27 Publication of FI119747B publication Critical patent/FI119747B/fi

Links

238000004949 mass spectrometry Methods 0.000 title 1
238000000034 method Methods 0.000 title 1

Classifications

- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
- H01J49/0018—Microminiaturised spectrometers, e.g. chip-integrated devices, Micro-Electro-Mechanical Systems [MEMS]
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/60—Construction of the column
- G01N30/6095—Micromachined or nanomachined, e.g. micro- or nanosize
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph

Landscapes

Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Physics & Mathematics (AREA)
Engineering & Computer Science (AREA)
Plasma & Fusion (AREA)
Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Electron Tubes For Measurement (AREA)

FI20031658A 2003-11-14 2003-11-14 Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti FI119747B (fi)

Priority Applications (6)

Application Number	Priority Date	Filing Date	Title
FI20031658A FI119747B (fi)	2003-11-14	2003-11-14	Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti
CA002545368A CA2545368A1 (en)	2003-11-14	2004-11-15	Method and apparatus for mass spectrometric analysis
JP2006538878A JP4767864B2 (ja)	2003-11-14	2004-11-15	質量分析方法と装置
US10/579,225 US7863559B2 (en)	2003-11-14	2004-11-15	Method and apparatus for mass spectrometric analysis
PCT/FI2004/000683 WO2005047848A2 (en)	2003-11-14	2004-11-15	Method and apparatus for mass spectrometric analysis
EP04798292A EP1683179A2 (en)	2003-11-14	2004-11-15	Method and apparatus for mass spectrometric analysis

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
FI20031658A FI119747B (fi)	2003-11-14	2003-11-14	Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti
FI20031658		2003-11-14

Publications (3)

Publication Number	Publication Date
FI20031658A0 FI20031658A0 (fi)	2003-11-14
FI20031658L true FI20031658L (fi)	2005-05-15
FI119747B FI119747B (fi)	2009-02-27

Family

ID=29558629

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
FI20031658A FI119747B (fi)	2003-11-14	2003-11-14	Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti

Country Status (6)

Country	Link
US (1)	US7863559B2 (fi)
EP (1)	EP1683179A2 (fi)
JP (1)	JP4767864B2 (fi)
CA (1)	CA2545368A1 (fi)
FI (1)	FI119747B (fi)
WO (1)	WO2005047848A2 (fi)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE102007052500A1 (de)	2007-11-02	2009-06-04	Helmholtz Zentrum München Deutsches Forschungszentrum Für Gesundheit Und Umwelt (Gmbh)	Verfahren und Vorrichtung für den Nachweis von mindestens einer Zielsubstanz
US8716655B2 (en) *	2009-07-02	2014-05-06	Tricorntech Corporation	Integrated ion separation spectrometer
JP5995643B2 (ja) *	2012-10-11	2016-09-21	ヒューマン・メタボローム・テクノロジーズ株式会社	酸性化合物の検出方法
JP6526641B2 (ja) *	2013-06-21	2019-06-05	スミスズディテクションモントリオールインコーポレイティド	被覆したコロナイオン化源のための方法及び装置
EP3109612A1 (en) *	2015-06-26	2016-12-28	Nina Wojtas	Mems deposition trap for vacuum transducer protection
US11162972B2 (en) *	2018-05-23	2021-11-02	University Of Central Florida Research Foundation, Inc.	Resonant MEMS piezoelectric sensor
JP6922961B2 (ja) *	2018-10-18	2021-08-18	株式会社村田製作所	回転運動検出用微小電気機械デバイス
WO2021111887A1 (ja) *	2019-12-06	2021-06-10	ソニーグループ株式会社	力覚センサモジュール
US20230024038A1 (en) *	2020-02-28	2023-01-26	Georgetown University	Apparatus and methods for detection and quantification of elements in molecules
DE102020214695B4 (de) *	2020-11-23	2022-06-09	Micro-Sensys Gmbh	Vorrichtung zur Ermittlung eines Füllstands einer Flüssigkeit in einem Behälter
CN113311096B (zh) *	2021-06-28	2024-12-06	中国科学院上海微系统与信息技术研究所	氦离子化检测器及其制备方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPH065228B2 (ja) *	1983-12-13	1994-01-19	株式会社日立製作所	大気圧イオン化式試料導入装置
JP2633974B2 (ja) *	1990-04-18	1997-07-23	株式会社日立製作所	試料のイオン化および質量分析のための装置
US5259254A (en)	1991-09-25	1993-11-09	Cetac Technologies, Inc.	Sample introduction system for inductively coupled plasma and other gas-phase, or particle, detectors utilizing ultrasonic nebulization, and method of use
US5750988A (en)	1994-07-11	1998-05-12	Hewlett-Packard Company	Orthogonal ion sampling for APCI mass spectrometry
CN1312473C (zh)	1998-09-17	2007-04-25	阿德文生物科学公司	液相色谱系统
EP1155435A4 (en) *	1999-01-08	2004-08-11	Univ Northeastern	ELECTRO-PNEUMATIC DISTRIBUTOR FOR MULTIPLEX ANALYTICAL MICROSYSTEM DEVICES
US6690004B2 (en) *	1999-07-21	2004-02-10	The Charles Stark Draper Laboratory, Inc.	Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry
JP3618262B2 (ja) *	1999-10-13	2005-02-09	株式会社日立製作所	質量分析計及びそのイオン源
US6610978B2 (en) *	2001-03-27	2003-08-26	Agilent Technologies, Inc.	Integrated sample preparation, separation and introduction microdevice for inductively coupled plasma mass spectrometry
US6649908B2 (en) *	2001-09-20	2003-11-18	Agilent Technologies, Inc.	Multiplexing capillary array for atmospheric pressure ionization-mass spectrometry
GB2391694B (en) *	2002-08-01	2006-03-01	Microsaic Systems Ltd	Monolithic micro-engineered mass spectrometer
US7417225B2 (en) *	2002-09-25	2008-08-26	Thermo Finnigan Llc	Apparatus and method for adjustment of ion separation resolution in FAIMS
US7057170B2 (en) *	2004-03-12	2006-06-06	Northrop Grumman Corporation	Compact ion gauge using micromachining and MISOC devices
GB2422951B (en) *	2005-02-07	2010-07-28	Microsaic Systems Ltd	Integrated analytical device

2003
- 2003-11-14 FI FI20031658A patent/FI119747B/fi not_active IP Right Cessation
2004
- 2004-11-15 EP EP04798292A patent/EP1683179A2/en not_active Withdrawn
- 2004-11-15 US US10/579,225 patent/US7863559B2/en not_active Expired - Fee Related
- 2004-11-15 JP JP2006538878A patent/JP4767864B2/ja not_active Expired - Fee Related
- 2004-11-15 WO PCT/FI2004/000683 patent/WO2005047848A2/en active Application Filing
- 2004-11-15 CA CA002545368A patent/CA2545368A1/en not_active Abandoned

Also Published As

Publication number	Publication date
US7863559B2 (en)	2011-01-04
FI20031658A0 (fi)	2003-11-14
JP4767864B2 (ja)	2011-09-07
JP2007511755A (ja)	2007-05-10
CA2545368A1 (en)	2005-05-26
EP1683179A2 (en)	2006-07-26
WO2005047848A3 (en)	2005-08-18
FI119747B (fi)	2009-02-27
WO2005047848A2 (en)	2005-05-26
US20090108193A1 (en)	2009-04-30

Legal Events

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Title

Description

2009-02-27

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