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CA2001666A1 - Systeme et methode d'inspection du polyethylene dans le domaine du rayonnement infrarouge proche - Google Patents

Systeme et methode d'inspection du polyethylene dans le domaine du rayonnement infrarouge proche

Info

Publication number
CA2001666A1
CA2001666A1 CA2001666A CA2001666A CA2001666A1 CA 2001666 A1 CA2001666 A1 CA 2001666A1 CA 2001666 A CA2001666 A CA 2001666A CA 2001666 A CA2001666 A CA 2001666A CA 2001666 A1 CA2001666 A1 CA 2001666A1
Authority
CA
Canada
Prior art keywords
sample
polyethylene
near infrared
defect
natural
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2001666A
Other languages
English (en)
Other versions
CA2001666C (fr
Inventor
Marcos German Ortiz
Marsha Spalding Stix
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
American Telephone and Telegraph Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Telephone and Telegraph Co Inc filed Critical American Telephone and Telegraph Co Inc
Publication of CA2001666A1 publication Critical patent/CA2001666A1/fr
Application granted granted Critical
Publication of CA2001666C publication Critical patent/CA2001666C/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Organic Insulating Materials (AREA)
CA002001666A 1988-12-13 1989-10-27 Systeme et methode d'inspection du polyethylene dans le domaine du rayonnement infrarouge proche Expired - Lifetime CA2001666C (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/283,650 US4988875A (en) 1988-12-13 1988-12-13 Near infrared polyethylene inspection system and method
US283,650 1988-12-13

Publications (2)

Publication Number Publication Date
CA2001666A1 true CA2001666A1 (fr) 1990-06-13
CA2001666C CA2001666C (fr) 1994-12-13

Family

ID=23087000

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002001666A Expired - Lifetime CA2001666C (fr) 1988-12-13 1989-10-27 Systeme et methode d'inspection du polyethylene dans le domaine du rayonnement infrarouge proche

Country Status (6)

Country Link
US (1) US4988875A (fr)
EP (1) EP0373796A3 (fr)
JP (1) JPH0692942B2 (fr)
KR (1) KR960003194B1 (fr)
AU (1) AU613253B2 (fr)
CA (1) CA2001666C (fr)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1240980B (it) * 1990-09-10 1993-12-27 Sip Apparecchiatura per la misura e il controllo dell'eccentricita' dello strato di rivestimento colorato di fibre ottiche.
US5256886A (en) * 1991-04-30 1993-10-26 E. I. Du Pont De Nemours And Company Apparatus for optically detecting contamination in particles of low optical-loss material
US5241184A (en) * 1991-09-26 1993-08-31 Electric Power Research Institute Apparatus and method for quantizing remaining lifetime of transmission cable insulation
US5345081A (en) * 1992-09-10 1994-09-06 Penetect, Inc. Pit detector and method
FR2696006B1 (fr) * 1992-09-21 1995-04-28 Alcatel Cable Dispositif de contrôle de qualité d'un gainage du type polyéthylène.
US5383135A (en) * 1992-12-31 1995-01-17 Zellweger Uster, Inc. Acquisition, measurement and control of thin webs on in-process textile materials
US5444265A (en) * 1993-02-23 1995-08-22 Lsi Logic Corporation Method and apparatus for detecting defective semiconductor wafers during fabrication thereof
DE19507643C1 (de) * 1995-03-04 1996-07-25 Rockwool Mineralwolle Verfahren zum Unschädlichmachen von in einem Mineralwollevlies befindlichen heißen Einschlüssen und Vorrichtung zur Durchführung des Verfahrens
US5943126A (en) * 1997-03-11 1999-08-24 Lucent Technologies Inc. Method and apparatus for detecting surface qualities on an optical fiber
US5880825A (en) * 1997-03-11 1999-03-09 Lucent Technologies Inc. Method and apparatus for detecting defects in an optical fiber
US6301380B1 (en) * 1997-09-12 2001-10-09 Philip Morris Incorporated Fold inspection device for transparent overwrap film
AUPP298698A0 (en) * 1998-04-17 1998-05-07 Crc For Intelligent Manufacturing Systems & Technologies Ltd Fault detection apparatus
US6661502B1 (en) 1999-10-28 2003-12-09 Fitel Usa Corp. Method and apparatus for measuring the diameter and/or eccentricity of a coating layer of a coated optical fiber
DE19955135C2 (de) * 1999-11-17 2001-10-18 Der Gruene Punkt Duales Syst Vorrichtung zum Bestimmen der Materialsorte bei Folien aus Kunststoff als Bestandteil einer Wertstoffsortieranlage
US20020033943A1 (en) * 2000-09-19 2002-03-21 Horst Clauberg Device and method for the optical inspection, assessment, and control of colored plastic articles and/or container contents
US20030118230A1 (en) * 2001-12-22 2003-06-26 Haoshi Song Coiled tubing inspection system using image pattern recognition
US6677591B1 (en) 2002-01-30 2004-01-13 Ciena Corporation Method and system for inspecting optical devices
WO2003076953A2 (fr) * 2002-03-06 2003-09-18 Bpw, Inc. Procede de controle d'etat electrique pour polymeres
US20040026622A1 (en) * 2002-08-06 2004-02-12 Dimarzio Don System and method for imaging of coated substrates
US7164146B2 (en) * 2004-10-22 2007-01-16 Northrop Grumman Corporation System for detecting structural defects and features utilizing blackbody self-illumination
US20080111074A1 (en) * 2004-10-22 2008-05-15 Northrop Grumman Corporation Method for infrared imaging of substrates through coatings
US7462809B2 (en) * 2004-10-22 2008-12-09 Northrop Grumman Corporation Spectral filter system for infrared imaging of substrates through coatings
WO2006110842A2 (fr) * 2005-04-12 2006-10-19 X-Rite, Incorporated Systemes et procedes permettant de mesurer une zone de meme couleur sur un objet
WO2006115007A1 (fr) 2005-04-21 2006-11-02 Sumitomo Electric Industries, Ltd. Dispositif d’inspection de fil supraconducteur et procede d’inspection
US8766192B2 (en) * 2010-11-01 2014-07-01 Asm Assembly Automation Ltd Method for inspecting a photovoltaic substrate
US9665932B2 (en) * 2013-09-03 2017-05-30 Thales Transport & Security, Inc. Camera based cable inspection system
WO2016018343A1 (fr) * 2014-07-31 2016-02-04 Halliburton Energy Services, Inc. Autodiagnostic de câbles lisses composites
US11333613B2 (en) * 2015-04-07 2022-05-17 The Boeing Company Apparatus and methods of inspecting a wire segment
FI129412B (en) * 2018-04-13 2022-01-31 Maillefer Sa Arrangement and procedure for detecting faults in a cable surface
ES2847236B2 (es) 2020-01-11 2022-04-20 Quandum Aerospace S L Sistema de posicionamiento de camaras y luces para inspeccion de mangueras empleadas en el repostaje aereo y procedimiento de inspeccion
US12198438B2 (en) * 2022-08-03 2025-01-14 Industrial Video Solutions Inc. Systems and methods for monitoring and controlling industrial processes
US12169400B2 (en) 2022-08-03 2024-12-17 Industrial Video Solutions Inc. Systems and methods for monitoring and controlling industrial processes
US20240255932A1 (en) * 2022-08-03 2024-08-01 Industrial Video Solutions Inc. Systems and methods for monitoring and controlling industrial processes
US12130249B2 (en) 2022-08-03 2024-10-29 Industrial Video Solutions Inc. Systems and methods for monitoring and controlling industrial processes

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH452229A (de) * 1965-06-18 1968-05-31 Siemens Ag Kabelprüfverfahren
US3870884A (en) * 1973-08-24 1975-03-11 Infra Systems Inc Apparatus for negating effect of scattered signals upon accuracy of dual-beam infrared measurements
US4139306A (en) * 1977-02-07 1979-02-13 General Electric Company Television inspection system
US4208126A (en) * 1978-05-24 1980-06-17 Electric Power Research Institute, Inc. System for detecting foreign particles or voids in electrical cable insulation and method
US4302108A (en) * 1979-01-29 1981-11-24 Polaroid Corporation Detection of subsurface defects by reflection interference
US4363966A (en) * 1980-09-22 1982-12-14 Electric Power Research Institute, Inc. Detection system for distinguishing between voids and foreign particles in materials and method
CH653459A5 (de) * 1981-04-16 1985-12-31 Landis & Gyr Ag Dokument mit einem sicherheitsfaden und verfahren zur echtheitspruefung desselben.
US4692799A (en) * 1982-04-05 1987-09-08 Showa Electric Wire & Cable Co., Ltd. Automatic inspection system for detecting foreign matter
US4764681A (en) * 1987-06-04 1988-08-16 Owens-Illinois Televison Products Inc. Method of and apparatus for electrooptical inspection of articles

Also Published As

Publication number Publication date
JPH02223849A (ja) 1990-09-06
KR960003194B1 (ko) 1996-03-06
AU4585989A (en) 1990-07-05
CA2001666C (fr) 1994-12-13
EP0373796A3 (fr) 1991-05-22
KR900010384A (ko) 1990-07-07
JPH0692942B2 (ja) 1994-11-16
EP0373796A2 (fr) 1990-06-20
AU613253B2 (en) 1991-07-25
US4988875A (en) 1991-01-29

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Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed
MKEC Expiry (correction)

Effective date: 20121202

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