Mitra et al., 2017 - Google Patents
An FPGA-based phase measurement systemMitra et al., 2017
View PDF- Document ID
 - 7825548166219211250
 - Author
 - Mitra J
 - Nayak T
 - Publication year
 - Publication venue
 - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
 
External Links
Snippet
Phase measurement is required in electronic applications where a synchronous relationship  between the signals needs to be preserved. Traditional electronic systems used for time  measurement are designed using a classical mixed-signal approach. With the advent of … 
    - 238000005259 measurement 0 title abstract description 42
 
Classifications
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- H—ELECTRICITY
 - H03—BASIC ELECTRONIC CIRCUITRY
 - H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
 - H03L7/00—Automatic control of frequency or phase; Synchronisation
 - H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
 - H03L7/08—Details of the phase-locked loop
 
 - 
        
- G—PHYSICS
 - G06—COMPUTING; CALCULATING; COUNTING
 - G06F—ELECTRICAL DIGITAL DATA PROCESSING
 - G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
 - G06F7/60—Methods or arrangements for performing computations using a digital non-denominational number representation, i.e. number representation without radix; Computing devices using combinations of denominational and non-denominational quantity representations, e.g. using difunction pulse trains, STEELE computers, phase computers
 - G06F7/68—Methods or arrangements for performing computations using a digital non-denominational number representation, i.e. number representation without radix; Computing devices using combinations of denominational and non-denominational quantity representations, e.g. using difunction pulse trains, STEELE computers, phase computers using pulse rate multipliers or dividers pulse rate multipliers or dividers per se
 
 - 
        
- G—PHYSICS
 - G06—COMPUTING; CALCULATING; COUNTING
 - G06F—ELECTRICAL DIGITAL DATA PROCESSING
 - G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
 - G06F7/58—Random or pseudo-random number generators
 
 - 
        
- H—ELECTRICITY
 - H03—BASIC ELECTRONIC CIRCUITRY
 - H03K—PULSE TECHNIQUE
 - H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
 - H03K3/84—Generating pulses having a predetermined statistical distribution of a parameter, e.g. random pulse generators
 
 - 
        
- H—ELECTRICITY
 - H03—BASIC ELECTRONIC CIRCUITRY
 - H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
 - H03M1/00—Analogue/digital conversion; Digital/analogue conversion
 - H03M1/12—Analogue/digital converters
 - H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
 - H03M1/1245—Details of sampling arrangements or methods
 - H03M1/1265—Non-uniform sampling
 - H03M1/128—Non-uniform sampling at random intervals, e.g. digital alias free signal processing [DASP]
 
 - 
        
- G—PHYSICS
 - G06—COMPUTING; CALCULATING; COUNTING
 - G06F—ELECTRICAL DIGITAL DATA PROCESSING
 - G06F1/00—Details of data-processing equipment not covered by groups G06F3/00 - G06F13/00, e.g. cooling, packaging or power supply specially adapted for computer application
 
 - 
        
- G—PHYSICS
 - G01—MEASURING; TESTING
 - G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
 - G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
 
 - 
        
- G—PHYSICS
 - G01—MEASURING; TESTING
 - G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
 - G01R21/00—Arrangements for measuring electric power or power factor
 
 - 
        
- G—PHYSICS
 - G01—MEASURING; TESTING
 - G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
 - G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
 - G01R31/28—Testing of electronic circuits, e.g. by signal tracer
 
 - 
        
- G—PHYSICS
 - G01—MEASURING; TESTING
 - G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
 - G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
 - G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
 
 
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