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Higami et al., 2006 - Google Patents

On finding don't cares in test sequences for sequential circuits

Higami et al., 2006

Document ID
6410945833741582890
Author
Higami Y
Kajihara S
Pomeranz I
Kobayashi S
Takamatsu Y
Publication year
Publication venue
IEICE transactions on information and systems

External Links

Snippet

Recently there are various requirements for LSI testing, such as test compaction, test compression, low power dissipation or increase of defect coverage. If test sequences contain lots of don't cares (Xs), then their flexibility can be used to meet the above …
Continue reading at search.ieice.org (other versions)

Classifications

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    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
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    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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