Kim et al., 2004 - Google Patents

Corrections of the NIST statistical test suite for randomness

Kim et al., 2004

Document ID: 4471093757188070108
Author: Kim S; Umeno K; Hasegawa A
Publication year: 2004
Publication venue: arXiv preprint nlin/0401040

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It is well known that the NIST statistical test suite was used for the evaluation of AES candidate algorithms. We have found that the test setting of Discrete Fourier Transform test and Lempel-Ziv test of this test suite are wrong. We give four corrections of mistakes in the …

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238000000528 statistical test 0 title abstract description 29

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