BibTeX record conf/itc/BiewengaHJL99

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@inproceedings{DBLP:conf/itc/BiewengaHJL99,
  author       = {Alex S. Biewenga and
                  Henk D. L. Hollmann and
                  Frans G. M. de Jong and
                  Maurice Lousberg},
  title        = {Static component interconnect test technology {(SCITT)} a new technology
                  for assembly testing},
  booktitle    = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
                  NJ, USA, 27-30 September 1999},
  pages        = {439--448},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/TEST.1999.805766},
  doi          = {10.1109/TEST.1999.805766},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BiewengaHJL99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}