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"Commercial-off-the-shelf algan/gan hemt device reliability study after ..."

Brian S. Poling et al. (2017)

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DOI: 10.1016/J.MICROREL.2016.09.017

access: closed

type: Journal Article

metadata version: 2024-11-13

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  - https://dblp.org/rec/journals/mr/PolingVBJM17
Brian S. Poling, Glen David Via, Ken D. Bole, E. E. Johnson, J. M. McDermott:
Commercial-off-the-shelf algan/gan hemt device reliability study after exposure to heavy ion radiation. Microelectron. Reliab. 68: 13-20 (2017)

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