Showing 1–2 of 2 results for author: Pacholski, C
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Ion irradiation-induced sinking of Ag nanocubes into substrates
Authors:
Shiva Choupanian,
Wolfhard Moeller,
Martin Seyring,
Claudia Pacholski,
Elke Wendler,
Andreas Undisz,
Carsten Ronning
Abstract:
Ion irradiation can cause burrowing of nanoparticles in substrates, strongly depending on the material properties and irradiation parameters. In this study, we demonstrate that the sinking process can be accomplished with ion irradiation of cube-shaped Ag nanoparticles on top of silicon; how ion channeling affects the sinking rate; and underline the importance of the amorphous state of the substra…
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Ion irradiation can cause burrowing of nanoparticles in substrates, strongly depending on the material properties and irradiation parameters. In this study, we demonstrate that the sinking process can be accomplished with ion irradiation of cube-shaped Ag nanoparticles on top of silicon; how ion channeling affects the sinking rate; and underline the importance of the amorphous state of the substrate upon ion irradiation. Based on our experimental findings, the sinking process is described as being driven by capillary forces enabled by ion-induced plastic flow of the substrate.
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Submitted 30 May, 2023;
originally announced May 2023.
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Enhanced sputter yields on ion irradiated Au nano particles: energy and size dependence
Authors:
Henry Holland-Moritz,
Sebastian Scheeler,
Christoph Stanglmair,
Claudia Pacholski,
Carsten Ronning
Abstract:
Hexagonally arranged Au nano particles (NPs) exhibiting a broad size distribution ranging from 30 nm to 80 nm with a Gaussian shape were deposited on Si substrates and irradiated with Ar+ and Ga+ ions with various energies from 20 to 350 keV and 1 to 30 keV, respectively. The size and energy dependence of the sputter yield were measured using high resolution scanning electron microscopy image anal…
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Hexagonally arranged Au nano particles (NPs) exhibiting a broad size distribution ranging from 30 nm to 80 nm with a Gaussian shape were deposited on Si substrates and irradiated with Ar+ and Ga+ ions with various energies from 20 to 350 keV and 1 to 30 keV, respectively. The size and energy dependence of the sputter yield were measured using high resolution scanning electron microscopy image analysis. These results were compared to simulation results obtained by iradina, a Monte Carlo (MC) code, which takes the specifics of the nano geometry into account. The experimental obtained sputter yields are significantly higher compared to the calculated simulation results for both bulk and the nano geometry. The difference can be clearly attributed to thermally driven effects, which significantly influence the measured sputter yields.
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Submitted 5 May, 2015;
originally announced May 2015.