US20190310676A1 - Voltage generating circuit for improving stability of bandgap voltage generator - Google Patents
Voltage generating circuit for improving stability of bandgap voltage generator Download PDFInfo
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- US20190310676A1 US20190310676A1 US16/029,648 US201816029648A US2019310676A1 US 20190310676 A1 US20190310676 A1 US 20190310676A1 US 201816029648 A US201816029648 A US 201816029648A US 2019310676 A1 US2019310676 A1 US 2019310676A1
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- 230000005669 field effect Effects 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
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- 230000008901 benefit Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is DC
- G05F1/468—Regulating voltage or current wherein the variable actually regulated by the final control device is DC characterised by reference voltage circuitry, e.g. soft start, remote shutdown
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
- G05F3/242—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
- G05F3/262—Current mirrors using field-effect transistors only
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/0045—Converters combining the concepts of switch-mode regulation and linear regulation, e.g. linear pre-regulator to switching converter, linear and switching converter in parallel, same converter or same transistor operating either in linear or switching mode
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/36—Means for starting or stopping converters
Definitions
- the invention relates to a voltage generating circuit, and particularly relates to a voltage generating circuit, which can effectively adjust a voltage value of a bias voltage outputted by a bandgap voltage generator.
- the bandgap voltage generator In the conventional bandgap voltage generator, it is common to compare the voltage of the positive input end and the negative input end by using an operational amplifier, to generate a bias voltage. In addition, the bandgap voltage generator generates the bandgap current according to the bias voltage. It should be noted that, in the process of activating the bandgap voltage generator, if the voltage values on the positive input end and the negative input end of the operational amplifier are too low, the differential input circuit in the operational amplifier is thus shut, and the operational amplifier thus fails to provide an effective or normal bias voltage. Therefore, how to effectively adjust the voltage value of the bias voltage, and thus to improve the stability of the bandgap voltage generator is an important issue for people skilled in the art.
- the invention provides a voltage generating circuit.
- a voltage value of a bias voltage output by an operational amplifier is adjusted, and the stability and accuracy of a bandgap voltage generator are thus improved.
- the voltage generating circuit of the invention includes the bandgap voltage generator and the start-up circuit.
- the bandgap voltage generator has a first operational amplifier.
- the first operational amplifier receives a first voltage and a second voltage, and generates the bias voltage by comparing the first voltage and the second voltage, wherein the bandgap voltage generator generates a bandgap current according to the bias voltage, and generates an output voltage according to the bandgap current.
- the start-up circuit includes a comparison circuit and a voltage regulator.
- the comparison circuit compares the first voltage or the second voltage with a reference voltage to generate a first comparison result, and generates a first current according to the first comparison result, wherein the reference voltage is generated according to the first current.
- the voltage regulator is coupled to the comparison circuit and the bandgap voltage generator, generates a second current according to the first current, and compares the second current with the reference current to generate a second comparison result, and adjusts a voltage value of the bias voltage according to the second comparison result.
- the voltage generating circuit of the invention by using the voltage regulator in the start-up circuit, lowers the voltage value of the bias voltage output by the operational amplifier, and thus enhances the circuit value of the bandgap current.
- the voltage generating circuit of the invention enhances the voltage value of the positive input end and the negative input end of the operational amplifier, to further improve the stability and the accuracy of the bandgap voltage generator.
- FIG. 1 is a circuit diagram of a voltage generating circuit according to an embodiment of the invention.
- FIG. 2 is a circuit diagram of a voltage generating circuit according to another embodiment of the invention.
- FIG. 3 illustrates a circuit diagram of the reference current source according to the embodiments of FIG. 1 and FIG. 2 of the invention.
- FIG. 1 is a circuit diagram of a voltage generating circuit according to an embodiment of the invention.
- a voltage generating circuit 100 includes a bandgap voltage generator 110 and a start-up circuit 120 , wherein the bandgap voltage generator 110 includes an operational amplifier OP 1 , transistors M 1 -M 5 and resistors R 1 -R 4 .
- the start-up circuit 120 includes a comparison circuit 130 and a voltage regulator 140 .
- a negative input end of the operational amplifier OP 1 receives a voltage V 1 .
- a positive input end of the operational amplifier OP 1 receives a voltage V 2 .
- the operational amplifier OP 1 generates a bias voltage VB according to the comparison of the voltage V 1 and the voltage V 2 .
- the bandgap voltage generator 110 generates bandgap currents IBG 1 -IBG 3 and an output voltage Vout according to the bias voltage VB.
- a first end of the transistor M 1 (for example, a source end) is coupled to a power voltage end VDD.
- a second end of the transistor M 1 (for example, a drain end) is coupled to the negative input end the operational amplifier OP 1 .
- a control end of the transistor M 1 (for example, a gate end) is controlled by the bias voltage VB.
- a first end of the transistor M 2 (for example, a source end) is coupled to the power voltage end VDD.
- a second end of the transistor M 2 (for example, a drain end) is coupled to the positive input end of the operational amplifier OP 1 .
- a control end of the transistor M 2 (for example, a gate end) is controlled by the bias voltage VB.
- a first end of the transistor M 3 (for example, a source end) is coupled to the power voltage end VDD.
- a second end of the transistor M 3 receives the output voltage Vout.
- a control end of the transistor M 3 (for example, a gate end) is controlled by the bias voltage VB.
- a first end of the transistor M 4 (for example, an emitter end) is coupled to the negative input end of the operational amplifier OP 1 .
- a second end (for example, a collector end) and a control end (for example, a base end) of the transistor M 4 are both coupled to a reference ground end GND.
- the resistor R 1 is coupled between the negative input end of the operational amplifier OP 1 and the reference ground end GND.
- a first end of the resistor R 2 is coupled to the positive input end of the operational amplifier OP 1 .
- the resistor R 3 is coupled between the positive input end of the operational amplifier OP 1 and the reference ground end GND.
- the resistor R 4 is coupled between the drain end of the transistor M 3 and the reference ground end GND.
- a first end of the transistor M 5 (for example, an emitter end) is coupled to a second end of the resistor R 2 .
- a second end (for example, a collector end) and a control end (for example, a base end) of the transistor M 5 are both coupled to the reference ground end GND.
- the transistors M 1 -M 3 may be P-type metal-oxide-semiconductor field-effect transistors (MOSFETs).
- the transistors M 4 -M 5 may be PNP-type bipolar junction transistors (BJTs).
- BJTs bipolar junction transistors
- the transistor M 1 and the transistor M 2 of the embodiment generate the corresponding bandgap current IBG 1 and the bandgap current IBG 2 according to the bias voltage VB.
- the transistor M 4 generates the voltage V 1 according to the bandgap current IBG 1 which flows through the transistor M 4 .
- the transistor M 5 and the resistor R 2 generate the voltage V 2 according to the bandgap current IBG 2 which flows through the transistor M 5 .
- the operational amplifier OP 1 generates the bias voltage VB according to the different value between the voltage V 1 and the voltage V 2 .
- the comparison circuit 130 of the embodiment includes an operational amplifier OP 2 , a transistor M 6 and a transistor M 7 .
- a negative input end of the operational amplifier OP 2 in the comparison circuit 130 is coupled to the negative input end of the operational amplifier OP 1 to receive the voltage V 1 .
- a positive input end of the operational amplifier OP 2 receives a reference voltage Vref.
- the operational amplifier OP 2 compares the voltage V 1 and the reference voltage Vref to generate a comparison result CP 1 .
- a first end of the transistor M 6 (for example, a source end) is coupled to the power voltage end VDD.
- a second end of the transistor M 6 (for example, a drain end) is coupled to the positive input end of the operational amplifier OP 2 .
- a control end of the transistor M 6 (for example, a gate end) receives the comparison result CP 1 , wherein the transistor M 6 of the embodiment generates a current I 1 according to the comparison result CP 1 .
- the transistor M 7 is serial connected between the positive input end of the operational amplifier OP 2 and the reference ground end GND.
- the transistor M 7 receives the current I 1 provided by the transistor M 6 to generate the reference voltage Vref, wherein the transistor M 7 is a load LD in the comparison circuit 130 .
- the load LD is constructed by coupling a transistor of diode connection.
- a voltage regulator 140 includes transistors M 8 -M 9 , a reference current source Iref and a buffer A 1 . Specifically, the voltage regulator 140 is coupled between the comparison circuit 130 and the bandgap voltage generator 110 . In addition, in the voltage regulator 140 , a first end of the transistor M 8 (for example, a source end) is coupled to the power voltage end VDD. A control end of the transistor M 8 (for example, a gate end) is coupled to the output end of the operational amplifier OP 2 to receive the comparison result CP 1 . A first end of the transistor M 9 (for example, a source end) is coupled to the reference ground end GND. A second end of the transistor M 9 (for example, a drain end) receives the bias voltage VB.
- the reference current source Iref is coupled between a second end of the transistor M 8 (for example, a drain end) and the reference ground end GND to generate the reference current IR 1 .
- the reference current source Iref is used to draw the reference current IR 1 from the drain end of the transistor M 8 .
- the buffer A 1 is coupled between the second end of the transistor M 8 and a control end of the transistor M 9 (for example, a gate end), wherein the aforementioned buffer A 1 may be a Schmitt trigger inverter, familiar to people skilled in the art.
- the transistors M 6 and M 8 -M 9 may be metal-oxide semiconductor field-effect transistors, and the transistor M 7 may be a bipolar junction transistor. However, the embodiment of the invention is not limited thereto.
- an aspect ratio of channel sizes of the transistor M 6 and the transistor M 8 may be designed to be the same, such that the current I 1 flowing through the transistor M 6 and the current I 2 flowing through the transistor M 8 are substantially the same.
- the aspect ratio of the channel sizes of the transistor M 6 and the transistor M 8 may be designed to be certain ratio, and a current value of the current I 1 and the current I 2 has certain ratio.
- the input end of the buffer A 1 of the embodiment receives the current difference of the current I 2 and the reference current IR 1 .
- the buffer A 1 generates a comparison result CP 2 according to the current difference.
- the voltage regulator 140 adjusts the voltage value of the bias voltage VB according to the comparison result CP 2 generated by the buffer A 1 . For example, if a current value of the reference current IR 1 is greater than that of the current I 2 , the buffer A 1 provides the comparison result CP 2 to conduct the transistor M 8 . Meanwhile, the voltage regulator 140 reduces the voltage value of the bias voltage VB according to the comparison result CP 2 , and thus increases the bandgap current IBG and the bandgap current IBG 2 provided by the transistor M 1 and the transistor M 2 .
- the buffer A 1 provides the comparison result CP 2 so as to disconnect the transistor M 8 .
- the transistor M 1 and the transistor M 2 generate the corresponding bandgap current IBG 1 and the bandgap current IBG 2 according to the bias voltage VB.
- the voltage generating circuit 100 reduces the voltage value of the bias voltage VB output by the operational amplifier OP 1 by using the voltage regulator 140 in the start-up circuit 120 , such that the current values of the bandgap currents IBG 1 and IBG 2 are increased at the same time.
- the voltage V 1 of the negative input end and the voltage V 2 of the positive input end of the operational amplifier OP 1 are increased accordingly.
- the start-up failure led by low voltage of the voltage V 1 and the voltage V 2 is not occurred, and a stability and an accuracy of the bandgap voltage generator 110 are thus improved.
- FIG. 2 is a circuit diagram of a voltage generating circuit according to another embodiment of the invention.
- a voltage generating circuit 200 includes a bandgap voltage generator 210 and a start-up circuit 220 , wherein the start-up circuit 220 includes a comparison circuit 230 and a voltage regulator 240 .
- the voltage generating circuit 200 is substantially the same as the voltage generating circuit 100 , wherein the same or similar elements use the same or similar reference numerals. The difference is that, in FIG. 2 , the negative input end of the operational amplifier OP 2 is coupled to the emitter end of the transistor M 5 to receive the voltage V 2 . In addition, the positive input end of the operational amplifier OP 2 receives the reference voltage Vref similarly.
- the operational amplifier OP 2 compares the voltage V 2 and the reference voltage Vref to generate the comparison result CP 1 . It should be noted that the related details of the embodiment of the voltage generating circuit 200 of the embodiment are the same or similar to the voltage generating circuit 100 of the previous embodiment. Explanations for the same technical contents will not be repeated in the following embodiments.
- FIG. 3 illustrates a circuit diagram of the reference current source according to the embodiments of FIG. 1 and FIG. 2 of the invention.
- a reference current source 300 includes transistors Q 1 -Q 9 and a resistor R 5 , wherein the transistor Q 8 and the transistor Q 9 form a current mirror circuit 310 .
- the a end of the transistor Q 1 (for example, a source end) is coupled to the power voltage end VDD.
- a control end of the transistor Q 1 (for example, a gate end) is coupled to a node P 1 .
- the transistor Q 1 generates a current I 3 from the second end of the transistor Q 1 (for example, a drain end) according a voltage on the node P 1 .
- a first end of the transistor Q 2 (for example, a source end) is coupled to the power voltage end VDD.
- a control end of the transistor Q 2 (for example, a gate end) is coupled to the node P 1 .
- a first end of the transistor Q 3 (for example, a source end) is coupled to the power voltage end VDD.
- a second end (for example, a drain end) and a control end (for example, a gate end) of the transistor Q 3 are coupled to the node P 1 .
- a first send of the transistor Q 4 (for example, a source end) is coupled to reference ground end GND.
- a second end (for example, a drain end) and a control end (for example, a gate end) of the transistor Q 4 are both coupled to the drain end of the transistor Q 2 .
- a second end of the transistor Q 5 (for example, a drain end) is coupled to the drain end of the transistor Q 3 .
- a control end of the transistor Q 5 (for example, a gate end) is coupled to a control end of the transistor Q 4 .
- the resistor R 5 is coupled between a first end of the transistor Q 5 (for example, a source end) and the reference ground end GND.
- a second end (for example, a gate end) and a control end (for example, a drain end) of the transistor Q 6 are coupled to the node P 1 .
- a first end of the transistor Q 7 (for example, a source end) is coupled to the drain end of the transistor Q 2 .
- a second end of the transistor Q 7 (for example, a drain end) is coupled to a first end of the transistor Q 6 (for example, a source end).
- a control end of the transistor Q 7 (for example, a gate end) is coupled to the node P 1 .
- a first end of the transistor Q 8 (for example, a source end) is coupled to the reference ground end GND.
- a second end of the transistor Q 8 (for example, a drain end) is coupled to the drain end of the transistor Q 1 to receive the current I 3 .
- a first end of the transistor Q 9 (for example, a source end) is coupled to the reference ground end GND.
- a second end (for example, a drain end) and a control end (for example, a gate end) of the transistor Q 9 are both coupled to a control end of the transistor Q 8 (for example, a gate end).
- the current mirror circuit 310 of the embodiment generates the reference current IR 1 according to the current I 3 , wherein the aforementioned current mirror circuit 310 may be a current source current familiar to people skilled in the art.
- the transistors Q 1 -Q 3 may be P-type metal-oxide-semiconductor field-effect transistors.
- the transistors Q 4 -Q 9 may be N-type metal-oxide-semiconductor field-effect transistors.
- the embodiment of the invention is not limited thereto.
- the reference current source 300 merely provides an exemplary embodiment of the reference current source of the embodiment of the invention. People skilled in the art may apply other kinds of current source circuit, which has constant-gm familiar to people skilled in the art, to the reference current source of the embodiment. No specific limitation is applied.
- the voltage generating circuit of the invention by the voltage regulator in the start-up circuit, enhances the current value of the bandgap current by reducing the current value of the bias voltage during the activating process.
- the voltage generating circuit of the invention enhances the voltage value on the positive input end and the negative input end of the operational amplifier, to ensure the stability and accuracy of the bandgap voltage generator in the voltage generating circuit.
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Abstract
Description
- This application claims the priority benefit of Taiwan application serial no. 107112327, filed on Apr. 10, 2018. The entirety of the above-mentioned patent application is hereby incorporated by reference herein and made a part of this specification.
- The invention relates to a voltage generating circuit, and particularly relates to a voltage generating circuit, which can effectively adjust a voltage value of a bias voltage outputted by a bandgap voltage generator.
- In the conventional bandgap voltage generator, it is common to compare the voltage of the positive input end and the negative input end by using an operational amplifier, to generate a bias voltage. In addition, the bandgap voltage generator generates the bandgap current according to the bias voltage. It should be noted that, in the process of activating the bandgap voltage generator, if the voltage values on the positive input end and the negative input end of the operational amplifier are too low, the differential input circuit in the operational amplifier is thus shut, and the operational amplifier thus fails to provide an effective or normal bias voltage. Therefore, how to effectively adjust the voltage value of the bias voltage, and thus to improve the stability of the bandgap voltage generator is an important issue for people skilled in the art.
- The invention provides a voltage generating circuit. By using a voltage regulator in a start-up circuit, a voltage value of a bias voltage output by an operational amplifier is adjusted, and the stability and accuracy of a bandgap voltage generator are thus improved.
- The voltage generating circuit of the invention includes the bandgap voltage generator and the start-up circuit. The bandgap voltage generator has a first operational amplifier. The first operational amplifier receives a first voltage and a second voltage, and generates the bias voltage by comparing the first voltage and the second voltage, wherein the bandgap voltage generator generates a bandgap current according to the bias voltage, and generates an output voltage according to the bandgap current. The start-up circuit includes a comparison circuit and a voltage regulator. The comparison circuit compares the first voltage or the second voltage with a reference voltage to generate a first comparison result, and generates a first current according to the first comparison result, wherein the reference voltage is generated according to the first current. The voltage regulator is coupled to the comparison circuit and the bandgap voltage generator, generates a second current according to the first current, and compares the second current with the reference current to generate a second comparison result, and adjusts a voltage value of the bias voltage according to the second comparison result.
- In view of the above, the voltage generating circuit of the invention, by using the voltage regulator in the start-up circuit, lowers the voltage value of the bias voltage output by the operational amplifier, and thus enhances the circuit value of the bandgap current. As such, the voltage generating circuit of the invention enhances the voltage value of the positive input end and the negative input end of the operational amplifier, to further improve the stability and the accuracy of the bandgap voltage generator.
- To provide a further understanding of the aforementioned and other features and advantages of the disclosure, exemplary embodiments, together with the reference drawings, are described in detail below.
-
FIG. 1 is a circuit diagram of a voltage generating circuit according to an embodiment of the invention. -
FIG. 2 is a circuit diagram of a voltage generating circuit according to another embodiment of the invention. -
FIG. 3 illustrates a circuit diagram of the reference current source according to the embodiments ofFIG. 1 andFIG. 2 of the invention. -
FIG. 1 is a circuit diagram of a voltage generating circuit according to an embodiment of the invention. Avoltage generating circuit 100 includes abandgap voltage generator 110 and a start-up circuit 120, wherein thebandgap voltage generator 110 includes an operational amplifier OP1, transistors M1-M5 and resistors R1-R4. In addition, the start-up circuit 120 includes acomparison circuit 130 and avoltage regulator 140. Specifically, in thebandgap voltage generator 110, a negative input end of the operational amplifier OP1 receives a voltage V1. A positive input end of the operational amplifier OP1 receives a voltage V2. In addition, the operational amplifier OP1 generates a bias voltage VB according to the comparison of the voltage V1 and the voltage V2. Besides, thebandgap voltage generator 110 generates bandgap currents IBG1-IBG3 and an output voltage Vout according to the bias voltage VB. - In the embodiment, a first end of the transistor M1 (for example, a source end) is coupled to a power voltage end VDD. A second end of the transistor M1 (for example, a drain end) is coupled to the negative input end the operational amplifier OP1. A control end of the transistor M1 (for example, a gate end) is controlled by the bias voltage VB. A first end of the transistor M2 (for example, a source end) is coupled to the power voltage end VDD. A second end of the transistor M2 (for example, a drain end) is coupled to the positive input end of the operational amplifier OP1. A control end of the transistor M2 (for example, a gate end) is controlled by the bias voltage VB. A first end of the transistor M3 (for example, a source end) is coupled to the power voltage end VDD. A second end of the transistor M3 (for example, a drain end) receives the output voltage Vout. A control end of the transistor M3 (for example, a gate end) is controlled by the bias voltage VB. A first end of the transistor M4 (for example, an emitter end) is coupled to the negative input end of the operational amplifier OP1. A second end (for example, a collector end) and a control end (for example, a base end) of the transistor M4 are both coupled to a reference ground end GND.
- On the other hand, the resistor R1 is coupled between the negative input end of the operational amplifier OP1 and the reference ground end GND. A first end of the resistor R2 is coupled to the positive input end of the operational amplifier OP1. The resistor R3 is coupled between the positive input end of the operational amplifier OP1 and the reference ground end GND. The resistor R4 is coupled between the drain end of the transistor M3 and the reference ground end GND. A first end of the transistor M5 (for example, an emitter end) is coupled to a second end of the resistor R2. A second end (for example, a collector end) and a control end (for example, a base end) of the transistor M5 are both coupled to the reference ground end GND.
- Notably, in the embodiment, the transistors M1-M3 may be P-type metal-oxide-semiconductor field-effect transistors (MOSFETs). The transistors M4-M5 may be PNP-type bipolar junction transistors (BJTs). However, the embodiment of the invention is not limited thereto.
- It should be noted that the transistor M1 and the transistor M2 of the embodiment generate the corresponding bandgap current IBG1 and the bandgap current IBG2 according to the bias voltage VB. As such, the transistor M4 generates the voltage V1 according to the bandgap current IBG1 which flows through the transistor M4. The transistor M5 and the resistor R2 generate the voltage V2 according to the bandgap current IBG2 which flows through the transistor M5. The operational amplifier OP1 generates the bias voltage VB according to the different value between the voltage V1 and the voltage V2.
- On the other hand, the
comparison circuit 130 of the embodiment includes an operational amplifier OP2, a transistor M6 and a transistor M7. Specifically, in the embodiment, a negative input end of the operational amplifier OP2 in thecomparison circuit 130 is coupled to the negative input end of the operational amplifier OP1 to receive the voltage V1. In addition, a positive input end of the operational amplifier OP2 receives a reference voltage Vref. As such, the operational amplifier OP2 compares the voltage V1 and the reference voltage Vref to generate a comparison result CP1. - On the other hand, a first end of the transistor M6 (for example, a source end) is coupled to the power voltage end VDD. A second end of the transistor M6 (for example, a drain end) is coupled to the positive input end of the operational amplifier OP2. A control end of the transistor M6 (for example, a gate end) receives the comparison result CP1, wherein the transistor M6 of the embodiment generates a current I1 according to the comparison result CP1. Moreover, the transistor M7 is serial connected between the positive input end of the operational amplifier OP2 and the reference ground end GND. In addition, the transistor M7 receives the current I1 provided by the transistor M6 to generate the reference voltage Vref, wherein the transistor M7 is a load LD in the
comparison circuit 130. Also, the load LD is constructed by coupling a transistor of diode connection. - In the embodiment, a
voltage regulator 140 includes transistors M8-M9, a reference current source Iref and a buffer A1. Specifically, thevoltage regulator 140 is coupled between thecomparison circuit 130 and thebandgap voltage generator 110. In addition, in thevoltage regulator 140, a first end of the transistor M8 (for example, a source end) is coupled to the power voltage end VDD. A control end of the transistor M8 (for example, a gate end) is coupled to the output end of the operational amplifier OP2 to receive the comparison result CP1. A first end of the transistor M9 (for example, a source end) is coupled to the reference ground end GND. A second end of the transistor M9 (for example, a drain end) receives the bias voltage VB. Besides, the reference current source Iref is coupled between a second end of the transistor M8 (for example, a drain end) and the reference ground end GND to generate the reference current IR1. The reference current source Iref is used to draw the reference current IR1 from the drain end of the transistor M8. The buffer A1 is coupled between the second end of the transistor M8 and a control end of the transistor M9 (for example, a gate end), wherein the aforementioned buffer A1 may be a Schmitt trigger inverter, familiar to people skilled in the art. The transistors M6 and M8-M9 may be metal-oxide semiconductor field-effect transistors, and the transistor M7 may be a bipolar junction transistor. However, the embodiment of the invention is not limited thereto. - In detail, in the embodiment, an aspect ratio of channel sizes of the transistor M6 and the transistor M8 may be designed to be the same, such that the current I1 flowing through the transistor M6 and the current I2 flowing through the transistor M8 are substantially the same. Or, the aspect ratio of the channel sizes of the transistor M6 and the transistor M8 may be designed to be certain ratio, and a current value of the current I1 and the current I2 has certain ratio. It should be noted that, the input end of the buffer A1 of the embodiment receives the current difference of the current I2 and the reference current IR1. In addition, the buffer A1 generates a comparison result CP2 according to the current difference. Furthermore, when the
voltage generating circuit 100 is operated in a start-up time interval, thevoltage regulator 140 adjusts the voltage value of the bias voltage VB according to the comparison result CP2 generated by the buffer A1. For example, if a current value of the reference current IR1 is greater than that of the current I2, the buffer A1 provides the comparison result CP2 to conduct the transistor M8. Meanwhile, thevoltage regulator 140 reduces the voltage value of the bias voltage VB according to the comparison result CP2, and thus increases the bandgap current IBG and the bandgap current IBG2 provided by the transistor M1 and the transistor M2. Contrarily, in a stable operation period after the start-up time interval, if the current value of the reference current IR1 is smaller than that of the current I2, the buffer A1 provides the comparison result CP2 so as to disconnect the transistor M8. At the same time, the transistor M1 and the transistor M2 generate the corresponding bandgap current IBG1 and the bandgap current IBG2 according to the bias voltage VB. - According to the above, in the embodiment, the
voltage generating circuit 100 reduces the voltage value of the bias voltage VB output by the operational amplifier OP1 by using thevoltage regulator 140 in the start-upcircuit 120, such that the current values of the bandgap currents IBG1 and IBG2 are increased at the same time. As such, the voltage V1 of the negative input end and the voltage V2 of the positive input end of the operational amplifier OP1 are increased accordingly. The start-up failure led by low voltage of the voltage V1 and the voltage V2 is not occurred, and a stability and an accuracy of thebandgap voltage generator 110 are thus improved. -
FIG. 2 is a circuit diagram of a voltage generating circuit according to another embodiment of the invention. Avoltage generating circuit 200 includes abandgap voltage generator 210 and a start-upcircuit 220, wherein the start-upcircuit 220 includes acomparison circuit 230 and avoltage regulator 240. It should be noted that, in the embodiment, thevoltage generating circuit 200 is substantially the same as thevoltage generating circuit 100, wherein the same or similar elements use the same or similar reference numerals. The difference is that, inFIG. 2 , the negative input end of the operational amplifier OP2 is coupled to the emitter end of the transistor M5 to receive the voltage V2. In addition, the positive input end of the operational amplifier OP2 receives the reference voltage Vref similarly. As such, the operational amplifier OP2 compares the voltage V2 and the reference voltage Vref to generate the comparison result CP1. It should be noted that the related details of the embodiment of thevoltage generating circuit 200 of the embodiment are the same or similar to thevoltage generating circuit 100 of the previous embodiment. Explanations for the same technical contents will not be repeated in the following embodiments. -
FIG. 3 illustrates a circuit diagram of the reference current source according to the embodiments ofFIG. 1 andFIG. 2 of the invention. In the embodiment, a referencecurrent source 300 includes transistors Q1-Q9 and a resistor R5, wherein the transistor Q8 and the transistor Q9 form acurrent mirror circuit 310. Specifically, in the referencecurrent source 300, the a end of the transistor Q1 (for example, a source end) is coupled to the power voltage end VDD. A control end of the transistor Q1 (for example, a gate end) is coupled to a node P1. In addition, the transistor Q1 generates a current I3 from the second end of the transistor Q1 (for example, a drain end) according a voltage on the node P1. A first end of the transistor Q2 (for example, a source end) is coupled to the power voltage end VDD. A control end of the transistor Q2 (for example, a gate end) is coupled to the node P1. A first end of the transistor Q3 (for example, a source end) is coupled to the power voltage end VDD. A second end (for example, a drain end) and a control end (for example, a gate end) of the transistor Q3 are coupled to the node P1. A first send of the transistor Q4 (for example, a source end) is coupled to reference ground end GND. A second end (for example, a drain end) and a control end (for example, a gate end) of the transistor Q4 are both coupled to the drain end of the transistor Q2. A second end of the transistor Q5 (for example, a drain end) is coupled to the drain end of the transistor Q3. A control end of the transistor Q5 (for example, a gate end) is coupled to a control end of the transistor Q4. Besides, the resistor R5 is coupled between a first end of the transistor Q5 (for example, a source end) and the reference ground end GND. A second end (for example, a gate end) and a control end (for example, a drain end) of the transistor Q6 are coupled to the node P1. A first end of the transistor Q7 (for example, a source end) is coupled to the drain end of the transistor Q2. A second end of the transistor Q7 (for example, a drain end) is coupled to a first end of the transistor Q6 (for example, a source end). A control end of the transistor Q7 (for example, a gate end) is coupled to the node P1. - On the other hand, in the
current mirror circuit 310, a first end of the transistor Q8 (for example, a source end) is coupled to the reference ground end GND. A second end of the transistor Q8 (for example, a drain end) is coupled to the drain end of the transistor Q1 to receive the current I3. A first end of the transistor Q9 (for example, a source end) is coupled to the reference ground end GND. A second end (for example, a drain end) and a control end (for example, a gate end) of the transistor Q9 are both coupled to a control end of the transistor Q8 (for example, a gate end). It should be noted that thecurrent mirror circuit 310 of the embodiment generates the reference current IR1 according to the current I3, wherein the aforementionedcurrent mirror circuit 310 may be a current source current familiar to people skilled in the art. - However, the embodiment of the invention is not limited thereto.
- In addition, in the embodiment, the transistors Q1-Q3 may be P-type metal-oxide-semiconductor field-effect transistors. The transistors Q4-Q9 may be N-type metal-oxide-semiconductor field-effect transistors. However, the embodiment of the invention is not limited thereto.
- Surely, the reference
current source 300 merely provides an exemplary embodiment of the reference current source of the embodiment of the invention. People skilled in the art may apply other kinds of current source circuit, which has constant-gm familiar to people skilled in the art, to the reference current source of the embodiment. No specific limitation is applied. - In summary of the above, the voltage generating circuit of the invention, by the voltage regulator in the start-up circuit, enhances the current value of the bandgap current by reducing the current value of the bias voltage during the activating process. As such, the voltage generating circuit of the invention enhances the voltage value on the positive input end and the negative input end of the operational amplifier, to ensure the stability and accuracy of the bandgap voltage generator in the voltage generating circuit.
- Although the invention is disclosed as the embodiments above, the embodiments are not meant to limit the invention. Any person skilled in the art may make slight modifications and variations without departing from the spirit and scope of the invention. Therefore, the protection scope of the invention shall be defined by the claims attached below.
Claims (11)
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TW107112327A TWI720305B (en) | 2018-04-10 | 2018-04-10 | Voltage generating circuit |
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TW107112327A | 2018-04-10 |
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US12242295B2 (en) * | 2021-09-07 | 2025-03-04 | Caes Systems Llc | Biasing circuit providing bias voltages based transistor threshold voltages |
CN114489210B (en) * | 2022-01-13 | 2023-05-26 | 深圳市汇顶科技股份有限公司 | Voltage generator, circuit, chip and electronic device |
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CN110362149A (en) | 2019-10-22 |
TW201944192A (en) | 2019-11-16 |
TWI720305B (en) | 2021-03-01 |
US10423188B1 (en) | 2019-09-24 |
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